CN109374134A - Superfast time resolution transient state reflectance spectrum imaging system - Google Patents
Superfast time resolution transient state reflectance spectrum imaging system Download PDFInfo
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- CN109374134A CN109374134A CN201811280427.6A CN201811280427A CN109374134A CN 109374134 A CN109374134 A CN 109374134A CN 201811280427 A CN201811280427 A CN 201811280427A CN 109374134 A CN109374134 A CN 109374134A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 38
- 238000000985 reflectance spectrum Methods 0.000 title claims abstract description 34
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- 230000003287 optical effect Effects 0.000 claims abstract description 70
- 238000012545 processing Methods 0.000 claims abstract description 34
- 238000000034 method Methods 0.000 claims abstract description 19
- 238000002310 reflectometry Methods 0.000 claims abstract description 16
- 230000008569 process Effects 0.000 claims abstract description 14
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- 229910001634 calcium fluoride Inorganic materials 0.000 claims description 5
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
Abstract
The embodiment of the invention provides a kind of Superfast time resolution transient state reflectance spectrum imaging systems, process of frequency multiplication is carried out to the first pulse laser by pump light optical path and obtains the pump light of preset wavelength, it detects light optical path and delay disposal is carried out to the second pulse laser, and generate continuous white light as detection light；After pump light and detection light successively irradiate sample to be imaged, the reflected light signal that detection light generates is received by spectrometer detection optical path and is transmitted to processing unit, the analysis of reflected light signal can be handled according to processing unit, determine the transient state reflectivity of sample to be imaged.The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention, multi-wavelength detection can be achieved, investigative range is expanded within the scope of white-light spectrum, for understanding under different frequency detection light irradiation, the variation of the transient state reflectivity of sample to be imaged and changing rule provide extremely advantageous help, and then can consider to influence the material internal dynamics problem of sample to be imaged from many aspects.
Description
Technical field
The present embodiments relate to technical field of ultrafast laser, more particularly, to Superfast time resolution transient state reflected light
Spectrum imaging system.
Background technique
Currently, ultrafast spectroscopic technology is the important means for studying substance excitation process.Generation, the migration of photoexcitation carrier
And compound dynamic process is often on picosecond magnitude, traditional static observation mode can not capture in sample
Dynamic variation.Femto-second laser pulse technology is because that can motivate substance to generate ultrafast nonequilibrium state, so as to utilize pump probe
Spectrum in the time domain studies electronics, lattice and Spin dynamics etc. respectively, has nowadays been widely used in semiconductor neck
Domain.
However, due to the complicated correlation of its internal electron, phonon, spin etc., showing to be permitted for strong associated material
Mostly unique physical property, such as high-temperature superconductor, charge density wave, metal-insulator phase transition.These unique physical properties produce
Raw Physical Mechanism, is always the research hotspot and difficult point in condensed state physics field instantly, especially high-temperature superconductor mechanism, until
The present can not still be studied clear.In research before, charge density wave material has been observed directly using Superfast time resolution method
In amplitude and phonon modes, Electron Electron coupling and transient response of the Electron-phonon coupling on time-domain spectroscopy；
Realize transient isolation body-metal phase change in charge density wave material.
But a kind of Superfast time resolution transient state reflectance spectrum imaging system is not occurred at present, it is partly led with being directed to
Low energy phonon and Electron-phonon coupling in the good bulk material of the reflecting properties such as body, superconductor and topological insulator are made
With being furtherd investigate, therefore, now it is badly in need of providing a kind of for the good bulk material progress of the reflecting properties such as high-temperature superconductor
The Superfast time resolution transient state reflectance spectrum imaging system of research.
Summary of the invention
In order to overcome the problems referred above or at least be partially solved the above problem, the embodiment of the invention provides it is a kind of ultrafast when
Between resolved transient reflectance spectrum imaging system.
A kind of Superfast time resolution transient state reflectance spectrum imaging system provided in an embodiment of the present invention, comprising: femtosecond laser
Light source, beam splitting unit, pump light optical path, detection light optical path, spectrometer detection optical path and processing unit；Wherein,
The femtosecond laser light source is for generating femtosecond pulse；
The beam splitting unit is used to the femtosecond pulse being divided into the first pulse laser and the second pulse laser；
The pump light optical path is used to carry out process of frequency multiplication to first pulse laser, to obtain the pumping of preset wavelength
Light；
The detection light optical path is used to carry out delay disposal to second pulse laser, and based on the institute after delay disposal
It states the second pulse laser and generates continuous white light, using the continuous white light as detection light；
After the pump light vertical irradiation sample to be imaged, the sample to be imaged is irradiated with predetermined angle by the detection light
The same position of product；
The spectrometer detection optical path irradiates the reflected light obtained after the sample to be imaged for receiving the detection light
Signal, and the reflected light signal is transmitted to processing unit；
The processing unit is used to be based on the reflected light signal, determines the transient state reflectivity of the sample to be imaged.
A kind of Superfast time resolution transient state reflectance spectrum imaging system provided in an embodiment of the present invention, comprising: femtosecond laser
Light source, beam splitting unit, pump light optical path, detection light optical path, spectrometer detection optical path and processing unit.Pass through pump light optical path pair
First pulse laser carries out process of frequency multiplication and obtains the pump light of preset wavelength, and detection light optical path postpones the second pulse laser
Processing, and continuous white light is generated based on the second pulse laser after delay disposal, using continuous white light as detection light；Pump light and
After detection light successively irradiates sample to be imaged, the reflected light signal that detection light generates is received and is transmitted to by spectrometer detection optical path
Processing unit can handle the analysis of reflected light signal according to processing unit, determine the transient state reflectivity of sample to be imaged.
The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention is, it can be achieved that multi-wavelength detection, will detect
Range expands within the scope of white-light spectrum, for understanding under different frequency detection light irradiation, the transient state reflectivity of sample to be imaged
Variation and changing rule provide extremely advantageous help, and then can consider to influence in the material of sample to be imaged from many aspects
Portion's dynamics problem.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is this hair
Bright some embodiments for those of ordinary skill in the art without creative efforts, can be with root
Other attached drawings are obtained according to these attached drawings.
Fig. 1 is a kind of structural representation of Superfast time resolution transient state reflectance spectrum imaging system provided in an embodiment of the present invention
Figure；
Fig. 2 is a kind of complete structure of Superfast time resolution transient state reflectance spectrum imaging system provided in an embodiment of the present invention
Schematic diagram.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art
Every other embodiment obtained without creative efforts, shall fall within the protection scope of the present invention.
In the description of the embodiment of the present invention, it should be noted that term " center ", "upper", "lower", "left", "right",
The orientation or positional relationship of the instructions such as "vertical", "horizontal", "inner", "outside" is to be based on the orientation or positional relationship shown in the drawings,
It is merely for convenience of the description embodiment of the present invention and simplifies description, rather than the device or element of indication or suggestion meaning must have
There is specific orientation, be constructed and operated in a specific orientation, therefore should not be understood as the limitation to the embodiment of the present invention.In addition,
Term " first ", " second ", " third " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance.
In the description of the embodiment of the present invention, it should be noted that unless otherwise clearly defined and limited, term " peace
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection；It can be mechanical connection, be also possible to be electrically connected；Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, above-mentioned art can be understood with concrete condition
The concrete meaning of language in embodiments of the present invention.
As shown in Figure 1, one embodiment of the invention provides a kind of Superfast time resolution transient state reflectance spectrum imaging system, packet
It includes: femtosecond laser light source 1, beam splitting unit 2, pump light optical path 3, detection light optical path 4, spectrometer detection optical path 5 and processing unit
6.Wherein, femtosecond laser light source 1 is for generating femtosecond pulse；Beam splitting unit 2 is used to femtosecond pulse being divided into first
Pulse laser and the second pulse laser；Pump light optical path 3 is used to carry out process of frequency multiplication to the first pulse laser, to obtain default wave
Long pump light；It detects light optical path 4 to be used to carry out delay disposal to the second pulse laser, and based on the second arteries and veins after delay disposal
Impulse light generates continuous white light, using continuous white light as detection light.
In Fig. 1, after pump light vertical irradiation sample 7 to be imaged, sample 7 to be imaged is irradiated with predetermined angle by detection light
Same position.Spectrometer detection optical path 5 irradiates the reflected light signal obtained after sample 7 to be imaged for receiving detection light, and will
Reflected light signal is transmitted to processing unit 6；Processing unit 6 is used to be based on reflected light signal, determines that the transient state of sample to be imaged is anti-
Penetrate rate.
Specifically, femtosecond pulse is generated using femtosecond laser light source 1 in the embodiment of the present invention, can specifically uses titanium
Jewel fs-laser system generates, and the frequency of obtained femtosecond pulse can be 1KHz, and pulsewidth can be 35fs, and wavelength can
Think 800nm.
The femtosecond pulse that femtosecond laser light source 1 generates passes through beam splitting unit 2, generates the first pulse laser and the second arteries and veins
Impulse light, wherein the first pulse laser is used to generate the pump light of preset wavelength, the second pulse laser is for generating detection light.It produces
The method of the pump light of raw preset wavelength can be with are as follows: makes the first pulse laser by pump light optical path 3, passes through pump light optical path 3
Process of frequency multiplication is carried out to the first pulse laser, the pump light of preset wavelength can be obtained.Process of frequency multiplication is to swash the first pulse
The wavelength of light halves.What needs to be explained here is that in the embodiment of the present invention pump light of preset wavelength can be used for irradiate at
Decent 7 surface of product, excites sample 7 to be imaged, and 7 inside property of sample to be imaged is made to change, and generates photoexcitation carrier.This
In preset wavelength be specifically as follows 400nm, 800nm etc., as long as can treat Imaged samples 7 generate excitation generate light excitation carry
Stream.The femtosecond pulse for being 800nm for example, by using Ti:Sapphire laser fs-laser system generation wavelength, by beam splitting unit
The wavelength of 2 the first obtained pulse lasers and the second pulse laser is 800nm, is swashed by pump light optical path 3 to the first pulse
After light carries out process of frequency multiplication, the pump light that preset wavelength is 400nm can be obtained.
The method for generating detection light can be with are as follows: makes the second pulse laser by detection light optical path 4, passes through detection light optical path 4
Delay disposal is carried out to the second pulse laser, and continuous white light is generated based on the second pulse laser after delay disposal, can be incited somebody to action
Continuous white light is as detection light.Here the purpose for carrying out delay disposal be the detection optical retardation that makes in pump light irradiation at
Decent product 7.That is, just treating detection light after needing that pump light is first made to irradiate sample generation excitation carrier to be imaged
Imaged samples are irradiated.In order to increase the investigative range of detection light, can be produced by the second pulse laser after delay disposal
Raw continuous white light can expand to investigative range within the scope of white-light spectrum using continuous white light as detection light, for understanding not
Same frequency detects under light irradiation, and the variation of the transient state reflectivity of sample to be imaged and changing rule provide extremely advantageous help,
And then it can consider to influence the material internal dynamics problem of sample to be imaged from many aspects.
The sample to be imaged used in the embodiment of the present invention is specifically as follows and partly leads for reflexive good bulk material
The strong associated material such as body, superconductor or topological insulator.
After pump light and detection light are successively radiated at the same position of sample to be imaged, connect by spectrometer detection optical path
It receives detection light and irradiates the reflected light signal obtained after sample to be imaged, and reflected light signal is transmitted to processing unit；Processing is single
Member is based on reflected light signal, determines the transient state reflectivity of sample to be imaged.Due to only spectrometer being needed to visit in the embodiment of the present invention
The reflected light signal that optical path receives detection light is surveyed, successfully to divide the reflected light signal of pump light and the reflected light signal of detection light
From, make pump light vertical irradiation on sample to be imaged, detection light be radiated on sample to be imaged with predetermined angle.Due to the two
The angle being radiated on sample to be imaged is different, and the angle of corresponding reflected light signal is also different, can successfully realize separation.This
Predetermined angle in inventive embodiments is non-zero-degree, can be specifically configured as needed, as long as can be by the reflection of pump light
The reflected light signal of optical signal and detection light is successfully separated.
In embodiments of the present invention, the pump light that pump light optical path obtains focuses to the spot diameter one on sample to be imaged
As focus to the spot diameter on sample to be imaged for the obtained detection light of detection light optical path twice, area is then in four times and closes
System, by the way that the spot center of the hot spot and pump light that detect light to be set as being completely coincident, so that since pumping light stimulus is waited for into
Signal intensity caused by decent product can be detected completely light and be detected.
In embodiments of the present invention, even if two concentric circles hot spots are not accomplished to be completely coincident, as long as allowing the hot spot of pump light
The hot spot for covering all detection light, will not thus lose the signal of measurement.
After processing unit receives reflected light signal, using the first pulse laser without process of frequency multiplication as reference signal,
The reflected light signal for treating Imaged samples based on light filed and labview software is analyzed and processed, and determines sample to be imaged
The ultra-fast dynamics process of carrier in product, obtains the transient state reflectivity of sample to be imaged.Processing unit in the embodiment of the present invention
It is specifically as follows computer.
The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention, comprising: femtosecond laser light
Source, beam splitting unit, pump light optical path, detection light optical path, spectrometer detection optical path and processing unit.By pump light optical path to
One pulse laser carries out process of frequency multiplication and obtains the pump light of preset wavelength, and detection light optical path carries out at delay the second pulse laser
Reason, and continuous white light is generated based on the second pulse laser after delay disposal, using continuous white light as detection light；Pump light and spy
After survey light successively irradiates sample to be imaged, the reflected light signal that detection light generates is received by spectrometer detection optical path and is transmitted to place
Unit is managed, the analysis of reflected light signal can be handled according to processing unit, determine the transient state reflectivity of sample to be imaged.This
The Superfast time resolution transient state reflectance spectrum imaging system provided in inventive embodiments is, it can be achieved that multi-wavelength detection, will detect model
It encloses and expands within the scope of white-light spectrum, for understanding under different frequency detection light irradiation, the transient state reflectivity of sample to be imaged
Variation and changing rule provide extremely advantageous help, and then can consider to influence the material internal of sample to be imaged from many aspects
Dynamics problem.
As shown in Fig. 2, on the basis of the above embodiments, the Superfast time resolution transient state provided in the embodiment of the present invention is anti-
Penetrate spectrum imaging system, the pump light optical path specifically includes: the wave plate 32 of optical chopper 31, λ/2, the first reflecting mirror 33, times
Frequency crystal 34 and the first condenser lens 35.Wherein, the first pulse laser successively passes through the wave plate of optical chopper 31, λ/2 32, first
Reflecting mirror 33 and frequency-doubling crystal 34, obtain the pump light.First condenser lens 35 makes meeting for assembling pump light
Pump light vertical irradiation sample to be imaged after poly-.
It specifically, can be before the first pulse laser be by optical chopper 31, by the first pulse in the embodiment of the present invention
Laser is input to processing unit as reference signal.Optical chopper 31 is used to carry out optical modulation to the first pulse laser, with
Change the frequency of the first pulse laser, to play the role of pulse switch.Such as the optical chopper in the embodiment of the present invention
31 use the frequency of 500Hz to carry out optical modulation, modulated first pulse laser to frequency for the first pulse laser of 1KHz
Frequency become 500Hz.
The wave plate of λ/2 32 can be used for being adjusted to by the polarization state of modulated first pulse laser, by the wave plate of λ/2
32 the first pulse laser reflexes on frequency-doubling crystal 34 through the first reflecting mirror 33, passes through 34 pairs of frequency-doubling crystal the first incident arteries and veins
Impulse light carries out process of frequency multiplication, obtains pump light.Wherein, the spot diameter of pump light is 0.3-0.6mm, preferably,
0.4mm may be selected.Frequency-doubling crystal 34 is specifically as follows BBO Crystal (i.e. bbo crystal).First reflecting mirror 33 is high reflection
Mirror.
After obtaining pump light, pump light is assembled by the first condenser lens 35, and the pump light after assembling is made to hang down
Sample 7 to be imaged is directly irradiated, excites sample 7 to be imaged that 7 inside property of sample to be imaged is caused to change, light excitation is generated and carries
Stream.
The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention, provides for pump light optical path
A kind of specific structure.
As shown in Fig. 2, on the basis of the above embodiments, the Superfast time resolution transient state provided in the embodiment of the present invention is anti-
Penetrate spectrum imaging system, detection light optical path specifically includes: delay reflection microscope group 41, the second reflecting mirror 42, the second condenser lens 43,
CaF2Sample 44 and tertiary focusing lens 45.Second pulse laser by delay reflection microscope group 41, after obtaining delay disposal the
Two pulse lasers；The second pulse laser after delay disposal successively passes through the second reflecting mirror 42, the second condenser lens 43 and CaF2
Sample 44 obtains continuous white light, using continuous white light as detection light；Tertiary focusing lens 45 are assembled for that will detect light,
And the detection light after assembling is made to irradiate sample to be imaged with predetermined angle.
Specifically, in the embodiment of the present invention, delay reflection microscope group 41 is used to be delayed to the second incident pulse laser
Processing, that is, increase the optical path length of the second pulse laser, the optical path of the second pulse laser made to be longer than the optical path of the first pulse laser,
It is radiated on sample 7 to be imaged so that the detection light finally exported is later than pump light.Second pulse laser is anti-by delay
Microscope group 41 is penetrated, the second pulse laser after obtaining delay disposal；The second pulse laser after delay disposal passes through the second reflecting mirror
42 are reflected, and focus to CaF through the second condenser lens 432On sample 44, pass through the second pulsed laser irradiation CaF2Sample
44, continuous white light is generated, at this time using continuous white light as detection light.Tertiary focusing lens 45 are assembled light is detected, and are made
Detection light after convergence irradiates sample to be imaged with predetermined angle.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
In system, the delay reflection microscope group detected in light optical path is specifically included: the first delay reflecting mirror and the second delay reflecting mirror；It is described
First delay reflecting mirror and the second delay reflecting mirror are mutually perpendicular to.
Specifically, the delay reflection microscope group provided in the embodiment of the present invention can specifically include two or more high reflections
Mirror.It is only illustrated so that delay reflection microscope group includes two high reflection mirrors as an example in the embodiment of the present invention, specifically includes first and prolong
When reflecting mirror and second delay reflecting mirror.First delay reflecting mirror and the second delay reflecting mirror are mutually perpendicular to, the second pulse laser
It is incident on the first delay reflecting mirror with 45 degree of angles, it is anti-with 45 degree of angles to be incident to the second delay after the first delay reflecting mirror reflection
It penetrates on mirror, the opposite direction after the second delay reflecting mirror reflection along the second pulse laser transmission direction is incident to the second reflecting mirror 42
On.
The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention, for delay reflection microscope group
Specific structure provides a kind of feasible scheme.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
In system further include: motorized precision translation stage；Delay reflection microscope group is arranged on motorized precision translation stage.
Specifically, since the effect of delay reflection microscope group is to carry out delay disposal to the second pulse laser, delay is reflected
Microscope group is arranged on motorized precision translation stage, moves with the movement of motorized precision translation stage, then can change prolonging for the second pulse laser
When, i.e. delay time, and then change the optical path length of the second pulse laser, the transient state reflectivity of available sample to be imaged with
The variation of delay.In the embodiment of the present invention, the precision of electricity driving displacement platform is 2 μm, and being converted into temporal resolution is 6.67fs.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
In system further include: stepper motor；
The stepper motor is connect with the motorized precision translation stage and the processing unit respectively；
The processing unit is for controlling the motorized precision translation stage by the stepper motor, to prolong described in adjusting
When reflection microscope group to the delay disposal of second pulse laser.
Specifically, the stepper motor in the embodiment of the present invention is connect with motorized precision translation stage and processing unit respectively.By handling
Unit controls the rotation of stepper motor, and step motor control motorized precision translation stage drives motorized precision translation stage along the second pulse laser
Optical path translation reflects microscope group to the delay disposal of the second pulse laser to adjust to be delayed.
As shown in Fig. 2, on the basis of the above embodiments, the Superfast time resolution transient state provided in the embodiment of the present invention is anti-
Spectrum imaging system is penetrated, spectrometer detection optical path specifically includes: the 4th condenser lens 51 and spectrometer 52.4th condenser lens 51
Spectrometer 52 is focused to for receiving reflected light signal, and by reflected light signal；Spectrometer 52 is for converting reflected light signal
For electric signal and it is transmitted to processing unit 6.
Specifically, it is received after detection light irradiates sample 7 to be imaged and is obtained by the 4th condenser lens 51 in the embodiment of the present invention
The reflected light signal arrived, and reflected light signal is focused on the fibre-optical probe of spectrometer, so that reflected light signal is by spectrometer
It receives, and reflected light signal is converted to by electric signal by spectrometer, be transmitted to 6 pairs of unit for processing of processing unit 6 reflections
Optical signal is analyzed and processed, and obtains the transient state reflectivity of sample to be imaged.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
System, spectrometer detection optical path further include: polarizing film, the polarizing film setting are focused in the sample to be imaged and the described 4th
Between lens；
The polarizing film is used to adjust the angle of polarization of the reflected light signal.
Specifically, polarizing as shown in Fig. 2, be additionally provided with polarizing film 53 in spectrometer detection optical path in the embodiment of the present invention
Piece 53 specifically can be set between sample 7 to be imaged and the 4th condenser lens 51, and polarizing film 53 can change reflected light signal
Polarization direction.It, can be by pump light a small amount of in reflected light signal by by the wave plate of λ/2 32 and 53 synchronously control of polarizing film
Reflected light signal reject, reduce pump light reflected light signal treat Imaged samples transient state reflectivity influence.Probe into pumping
Influence of the variation to the transient state reflectivity of obtained sample to be imaged between light and detection light due to the angle of polarization, when pump light and
It is best to detect polarization effect when the angle of polarization between light differs 90 degree, and then it is spuious to exclude pump light.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
In system further include: cryogenic vacuum subsystem；
The sample to be imaged is arranged in the cryogenic vacuum subsystem.
Specifically, it as shown in Fig. 2, the cryogenic vacuum subsystem 8 in the embodiment of the present invention is also connect with processing unit 6, uses
In control of the realization processing unit 6 to cryogenic vacuum subsystem 8.It is provided in cryogenic vacuum subsystem 8 to be imaged for placing
The sample stage of sample 7, cryogenic thermostat system are set on D translation platform.Temperature range in cryogenic thermostat system can be set to
4~320K, vacuum degree can be set to 10-7mbar.Cryogenic thermostat system is equipped with vacuum glass window and vacuum meter, pumping
The reflected light of light, detection light and detection light after sample to be imaged reflection enters by vacuum glass window and spreads out of low temperature perseverance
Warm system.
On the basis of the above embodiments, the Superfast time resolution transient state reflectance spectrum imaging provided in the embodiment of the present invention
In system, the beam splitting unit of use is specially beam splitter；
Femtosecond pulse is divided into the first pulse laser and the second pulse laser by the splitting ratio of 7:3 by beam splitter.
Specifically, the thickness of the beam splitter used in the embodiment of the present invention can be 1mm, splitting ratio 7:3, that is, generate the
The ratio of one pulse laser and the second pulse laser is 7:3.
The Superfast time resolution transient state reflectance spectrum imaging system provided in the embodiment of the present invention, solves in the prior art
It can not probe under different frequency detection light irradiation, semiconductor, the strong associated material reflectivity such as superconductor or topological insulator
Variation and changing rule, and then cannot consider the problems of to influence strong associated material Internal dynamics from many aspects.
The apparatus embodiments described above are merely exemplary, wherein described, unit can as illustrated by the separation member
It is physically separated with being or may not be, component shown as a unit may or may not be physics list
Member, it can it is in one place, or may be distributed over multiple network units.It can be selected according to the actual needs
In some or all of the modules achieve the purpose of the solution of this embodiment.Those of ordinary skill in the art are not paying creativeness
Labour in the case where, it can understand and implement.
Through the above description of the embodiments, those skilled in the art can be understood that each embodiment can
It realizes by means of software and necessary general hardware platform, naturally it is also possible to pass through hardware.Based on this understanding, on
Stating technical solution, substantially the part that contributes to existing technology can be embodied in the form of software products in other words, should
Computer software product may be stored in a computer readable storage medium, such as ROM/RAM, magnetic disk, CD, including several fingers
It enables and using so that a computer equipment (can be personal computer, server or the network equipment etc.) executes each implementation
Method described in certain parts of example or embodiment.
Finally, it should be noted that the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although
Present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that: it still may be used
To modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features；
And these are modified or replaceed, technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution spirit and
Range.
Claims (10)
1. a kind of Superfast time resolution transient state reflectance spectrum imaging system characterized by comprising femtosecond laser light source, beam splitting
Unit, pump light optical path, detection light optical path, spectrometer detection optical path and processing unit；Wherein,
The femtosecond laser light source is for generating femtosecond pulse；
The beam splitting unit is used to the femtosecond pulse being divided into the first pulse laser and the second pulse laser；
The pump light optical path is used to carry out process of frequency multiplication to first pulse laser, to obtain the pump light of preset wavelength；
The detection light optical path is used to carry out second pulse laser delay disposal, and based on described the after delay disposal
Two pulse lasers generate continuous white light, using the continuous white light as detection light；
After the pump light vertical irradiation sample to be imaged, the sample to be imaged is irradiated with predetermined angle by the detection light
Same position；
The spectrometer detection optical path irradiates the reflected light signal obtained after the sample to be imaged for receiving the detection light,
And the reflected light signal is transmitted to processing unit；
The processing unit is used to be based on the reflected light signal, determines the transient state reflectivity of the sample to be imaged.
2. Superfast time resolution transient state reflectance spectrum imaging system according to claim 1, which is characterized in that the pumping
Light optical path specifically includes: the wave plate of optical chopper, λ/2, the first reflecting mirror, frequency-doubling crystal and the first condenser lens；Wherein,
First pulse laser successively passes through the optical chopper, the wave plate of the λ/2, first reflecting mirror and described times
Frequency crystal obtains the pump light；
First condenser lens makes the pump light vertical irradiation institute after assembling for assembling the pump light
State sample to be imaged.
3. Superfast time resolution transient state reflectance spectrum imaging system according to claim 1, which is characterized in that the detection
Light optical path specifically includes: delay reflection microscope group, the second reflecting mirror, the second condenser lens, CaF2Sample and tertiary focusing lens；
Second pulse laser reflects microscope group, second pulse laser after obtaining delay disposal by the delay；
Second pulse laser after delay disposal successively passes through second reflecting mirror, second condenser lens and described
CaF2Sample obtains the continuous white light, using the continuous white light as detection light；
The tertiary focusing lens make the detection light after assembling with predetermined angle for assembling the detection light
Irradiate the sample to be imaged.
4. Superfast time resolution transient state reflectance spectrum imaging system according to claim 3, which is characterized in that the delay
Reflection microscope group specifically includes: the first delay reflecting mirror and the second delay reflecting mirror；The first delay reflecting mirror and described second
Delay reflecting mirror is mutually perpendicular to.
5. Superfast time resolution transient state reflectance spectrum imaging system according to claim 3, which is characterized in that further include:
Motorized precision translation stage；
The delay reflection microscope group is arranged on the motorized precision translation stage.
6. Superfast time resolution transient state reflectance spectrum imaging system according to claim 5, which is characterized in that further include:
Stepper motor；
The stepper motor is connect with the motorized precision translation stage and the processing unit respectively；
The processing unit is anti-to adjust the delay for being controlled by the stepper motor the motorized precision translation stage
Microscope group is penetrated to the delay disposal of second pulse laser.
7. Superfast time resolution transient state reflectance spectrum imaging system according to claim 1, which is characterized in that the spectrum
Instrument detection optical path specifically includes: the 4th condenser lens and spectrometer；
The reflected light signal is focused to the spectrum for receiving the reflected light signal by the 4th condenser lens
Instrument；
The spectrometer is for being converted to electric signal for the reflected light signal and being transmitted to the processing unit.
8. Superfast time resolution transient state reflectance spectrum imaging system according to claim 7, which is characterized in that the spectrum
Instrument detects optical path further include: polarizing film, the polarizing film are arranged between the sample to be imaged and the 4th condenser lens；
The polarizing film is used to adjust the angle of polarization of the reflected light signal.
9. Superfast time resolution transient state reflectance spectrum imaging system according to claim 1 to 8, feature exist
In, further includes: cryogenic vacuum subsystem；
The sample to be imaged is arranged in the cryogenic vacuum subsystem.
10. Superfast time resolution transient state reflectance spectrum imaging system according to claim 1 to 8, feature exist
In the beam splitting unit is specially beam splitter；
The femtosecond pulse is divided into first pulse laser and second arteries and veins by the splitting ratio of 7:3 by the beam splitter
Impulse light.
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| CN109781632A (en) * | 2019-03-12 | 2019-05-21 | 山东大学 | A kind of dual-beam pump probe two-dimensional spectrum measuring system and its working method |
| CN110908128A (en) * | 2019-11-08 | 2020-03-24 | 中国科学院上海光学精密机械研究所 | Multicolor ultrafast laser generating device |
| CN111103695A (en) * | 2019-11-08 | 2020-05-05 | 中国科学院上海光学精密机械研究所 | Ultrafast laser generating device |
| CN111307756A (en) * | 2019-11-20 | 2020-06-19 | 南京航空航天大学 | Frequency-adjustable ultrafast time resolution transient reflection spectrometer |
| CN111443062A (en) * | 2020-04-26 | 2020-07-24 | 中国科学院西安光学精密机械研究所 | Ultrafast detection device and method for transient refractive index of semiconductor material |
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| CN112229804A (en) * | 2020-09-17 | 2021-01-15 | 中国科学院上海光学精密机械研究所 | Non-coaxial transmission type ultrafast transient absorption system with temperature field regulation and control function and measurement method |
| CN112285036A (en) * | 2019-07-22 | 2021-01-29 | 中国科学院大连化学物理研究所 | Frequency-reducing synchronous ultrafast transient absorption test system |
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| CN109781632A (en) * | 2019-03-12 | 2019-05-21 | 山东大学 | A kind of dual-beam pump probe two-dimensional spectrum measuring system and its working method |
| CN112285036A (en) * | 2019-07-22 | 2021-01-29 | 中国科学院大连化学物理研究所 | Frequency-reducing synchronous ultrafast transient absorption test system |
| CN110908128B (en) * | 2019-11-08 | 2021-09-07 | 中国科学院上海光学精密机械研究所 | Multicolor ultrafast laser generating device |
| CN110908128A (en) * | 2019-11-08 | 2020-03-24 | 中国科学院上海光学精密机械研究所 | Multicolor ultrafast laser generating device |
| CN111103695A (en) * | 2019-11-08 | 2020-05-05 | 中国科学院上海光学精密机械研究所 | Ultrafast laser generating device |
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| CN111999278A (en) * | 2020-07-13 | 2020-11-27 | 北京工业大学 | Ultrafast time resolution transient reflected light, transmitted light and related Raman spectrum imaging system |
| CN111999278B (en) * | 2020-07-13 | 2023-11-03 | 北京工业大学 | Ultrafast time-resolved transient reflected light, transmitted light and related Raman spectrum imaging system |
| CN112229804A (en) * | 2020-09-17 | 2021-01-15 | 中国科学院上海光学精密机械研究所 | Non-coaxial transmission type ultrafast transient absorption system with temperature field regulation and control function and measurement method |
| CN112229804B (en) * | 2020-09-17 | 2021-07-06 | 中国科学院上海光学精密机械研究所 | Non-coaxial transmission type ultrafast transient absorption system with temperature field regulation and control function and measurement method |
| CN112630146A (en) * | 2020-11-26 | 2021-04-09 | 北京交通大学 | Space-time pumping detection control system and method |
| CN113092379A (en) * | 2021-04-16 | 2021-07-09 | 中国科学院长春光学精密机械与物理研究所 | Spatially resolved transient system |
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