CN112213975B - Microcontroller total dose irradiation failure unit experiment judgment system and method - Google Patents
Microcontroller total dose irradiation failure unit experiment judgment system and method Download PDFInfo
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- CN112213975B CN112213975B CN202010985912.4A CN202010985912A CN112213975B CN 112213975 B CN112213975 B CN 112213975B CN 202010985912 A CN202010985912 A CN 202010985912A CN 112213975 B CN112213975 B CN 112213975B
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- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
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- G—PHYSICS
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- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/21—Pc I-O input output
- G05B2219/21137—Analog to digital conversion, ADC, DAC
Abstract
The invention relates to a microcontroller total dose irradiation failure unit experiment judgment system and a method, wherein the experiment judgment system comprises a tested microcontroller, a data acquisition unit, a communication and power supply unit, an upper computer, a collimation positioning irradiation unit, a following dosimeter and a shielding body; the method for judging the experiment adopts the microcontrollers of the same type and batch to be divided into three groups of experimental samples to carry out single variable control experiment. The total dose irradiation failure unit experiment judgment system and method for the microcontroller can distinguish the internal failure unit of the microcontroller by controlling a single experiment variable, determine the irradiation sensitive part of the microcontroller and make up for the defects of the traditional function verification method.
Description
Technical Field
The invention belongs to the technical field of electronic device irradiation effect research, and particularly relates to a microcontroller total dose irradiation failure unit experiment judgment system and method.
Background
When the semiconductor electronic device is applied to an ionizing radiation environment, electron-hole pairs generated by ionizing radiation energy deposition in the semiconductor electronic device can generate a series of physical processes such as compounding, transporting and capturing, and finally generate 3 different irradiation effects such as a single event effect, a transient dose rate effect, a total dose effect and the like; among them, the total dose effect of a Microcontroller (MCU) is one of the main concerns in the field of nuclear power and nuclear technology. As a programmable large-scale integrated chip, the microcontroller has rich functions and a complex internal structure, and the change of the electrical parameters of the internal structure is difficult to be reflected completely through limited external pins when the microcontroller is irradiated by radiation; therefore, a function verification method is usually required to be used for carrying out a total dose effect experiment of the microcontroller so as to research the radiation resistance and the radiation failure mode of the microcontroller, and a basis is provided for radiation hardening resistance and failure management in practical application of the microcontroller.
The basic idea of the function verification method is that the tested micro-controller continuously runs a pre-loading program with a specific function in the irradiation experiment process, and the irradiation damage of the tested sample is judged by detecting whether the pre-loading program runs normally in real time. The results of the current experimental study show that: with the increase of the total dose of the irradiated light, the phenomena of power consumption current increase, internal memory dislocation and the like (at the moment, the function of the preloading program still normally operates) can occur after the microcontroller reaches a certain threshold dose until the function fails and the test system can not acquire the running state of the preloading program any more; however, the functional failure of the microcontroller is usually a sudden change process, and the functional verification method can only judge whether the microcontroller fails macroscopically, and cannot acquire more detailed information to distinguish the internal functional unit causing the failure.
Disclosure of Invention
Aiming at the defects of the existing function checking method, the invention provides a microcontroller total dose irradiation failure unit experiment judgment system and method.
In order to achieve the above purposes, the invention adopts the technical scheme that: the experimental judgment system comprises a tested micro controller, a data acquisition unit, a communication and power supply unit, an upper computer, a collimation and positioning irradiation unit, a following dosimeter and a shielding body;
the tested micro controller preloads a function verification program, encodes the output quantity or state quantity of the on-chip memory and the analog-to-digital converter and then sends the encoded data to a data acquisition unit, and the sent encoded data is used as functional state judgment source data;
the data acquisition unit has a multi-channel digital and analog signal acquisition function, acquires encoded data output by the tested micro controller and analog signals output by the appointed pins in real time, and transmits the encoded data and the analog signals to the upper computer for analysis through the communication unit;
a passive detector with small volume is adopted for the following dosimeter and is closely arranged to a tested micro controller to measure the accumulated irradiated dosage;
the shield is arranged between the microprocessor to be tested and the data acquisition unit;
the collimation positioning irradiation unit adopts a shielding collimation hole structure and is arranged between the microprocessor to be measured and the irradiation source, and a first collimation hole is arranged at the position, corresponding to the microprocessor, on the collimation positioning irradiation unit;
and a second collimation hole is arranged at the position, corresponding to the follow dosimeter, of the collimation positioning irradiation unit.
Further, the shield employs a lead equivalent thickness of greater than 4 cm.
Further, the lead equivalent thickness of the shielding portion of the collimated positioning irradiation unit is more than 4 cm.
Further, the first collimating hole is the same size as the second collimating hole.
Further, when the microcontroller is initialized, the pulse signal of the internal clock source passes through the appointed output pin through the configuration register, and the on-chip digital-to-analog converter is instructed to output an orthogonal pseudo-random signal with fixed frequency to the appointed output pin; after initialization is complete, the output of the clock signal and the quadrature pseudorandom signal will no longer be affected by the preload program operating state.
The invention also provides an experiment judgment method performed by the microcontroller total dose irradiation failure unit experiment judgment system, wherein the experiment judgment method adopts the microcontrollers with the same type and batch to be divided into three groups of experimental samples to perform a single variable control experiment, and the specific method comprises the following steps:
step (1), a first group of irradiation experiments are carried out under the condition that a collimation positioning irradiation unit is not provided, the mean value D1 of the functional failure dose and the variance delta 1 of the mean value D1 of the functional failure dose of a first group of samples are obtained, and whether a clock source and a DAC signal output by a designated pin are normal or not is sequentially analyzed after the functional failure;
if the clock source signal is abnormal, the internal clock can be judged to be invalid; under the condition that the clock source signal is normal, if the orthogonal pseudo-random signal output by the DAC is normal, the failure of the on-chip communication unit can be judged; if the clock is normal and the DAC output is abnormal, judging that the functional units except the clock and the communication are invalid, and replacing the sample to perform collimation positioning irradiation;
step (2), carrying out collimation positioning irradiation on the in-chip storage areas of the second group of samples to obtain a functional failure dose mean value D2 and a variance delta 2 of the second group of samples, and adopting delta 1+ delta 2 as a judgment factor to eliminate the influence of the dispersibility of the failure dose; if D2 is not more than D1+ delta 1+ delta 2, the on-chip memory cell is judged to be failed;
performing collimation positioning irradiation on the inner core area of the third group of samples to obtain the mean value D3 and the variance delta 3 of the functional failure dose of the third group of samples, and adopting delta 1+ delta 3 as a judgment factor; if D3 is not more than D1+ delta 1+ delta 3, the kernel unit is judged to be failed;
and (4) if the conditions are not met, judging that other units of the microcontroller fail.
The invention has the beneficial technical effects that:
on the basis of the method for verifying the total dose effect function of the microcontroller, the invention combines the collimation and positioning irradiation of the internal unit and the measurement of specific electrical parameters to judge the functional states of key modules such as an internal clock, communication, a kernel, an on-chip memory and the like when the microcontroller fails to irradiate.
Based on the experimental conditions and the experimental judgment method provided by the invention, the internal failure unit of the microcontroller can be distinguished by controlling a single experimental variable, the irradiation sensitive part of the microcontroller is determined, and the defects of the traditional function verification method are overcome.
Drawings
FIG. 1 is a schematic diagram of the microcontroller total dose irradiation failure unit experiment determination system of the present invention;
FIG. 2 is a flow chart of an experimental decision method for a total dose irradiation failure unit of the microcontroller according to the present invention;
in the figure:
1-a micro-controller under test; 2-a data acquisition unit; 3-a communication and power supply unit; 4-an upper computer; 5-collimation positioning irradiation unit; 6-follow dosimeter; 7-a shield; 8-a first collimating aperture; 9-second collimation holes.
Detailed Description
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings.
As shown in fig. 1, the microcontroller total dose irradiation failure unit experiment determination system mainly comprises a measured microcontroller 1, a data acquisition unit 2, a communication and power supply unit 3, an upper computer 4, a collimation and positioning irradiation unit 5, a following dosimeter 6 and a shielding body 7.
The micro controller 1 to be tested preloads a function verification program, encodes output quantity or state quantity of functional units such as an on-chip memory, an analog-to-digital converter (ADC) and the like, and then sends the encoded data to a data acquisition unit, and the sent encoded data is used as functional state judgment source data. In addition, when the microcontroller is initialized, the pulse signal of the internal clock source passes through the appointed output pin through the configuration register, and the on-chip digital-to-analog converter (DAC) is instructed to output an orthogonal pseudo-random signal with fixed frequency to the appointed output pin; after initialization is complete, the output of the clock signal and the quadrature pseudorandom signal will no longer be affected by the preload program operating state. The data acquisition unit 2 has a multichannel digital and analog signal acquisition function, acquires encoded data output by the tested micro controller and analog signals output by the appointed pins in real time, and transmits the encoded data and the analog signals to the upper computer for analysis through the communication unit. The follower dosimeter 6 employs a small volume passive probe, placed in close proximity to the measured microcontroller to measure its cumulative exposure dose. The shield 7 is placed between the microprocessor 1 under test and the data acquisition unit 2, using a lead equivalent thickness (in the case of a thickness greater than 4 cm)60Shielding effect more than 10 times under Co irradiation condition) to avoid irradiation damage of the data acquisition unit 2. The collimation positioning irradiation unit 5 is provided with a first collimation hole 8, is arranged between the microprocessor to be measured and the irradiation source, and accurately positions and irradiates the local area of the microprocessor by using the collimated irradiation field; the lead equivalent thickness of the shielding part is more than 4cm and a second collimating aperture 9 of the same size is designed at the position following the dosimeter 6 to accurately measure the cumulative irradiated dose of the localized irradiated area.
Based on the above experimental determination system, the experimental determination flow of the internal failure unit of the micro controller under test is shown in fig. 2:
the same type and batch of microcontrollers are divided into three groups of experimental samples to carry out single variable control experiments. Firstly, a first group of irradiation experiments are carried out under the condition of no collimation positioning irradiation unit, the mean value D1 of the functional failure dose and the variance delta 1 of the mean value are obtained, and whether a clock source and a DAC signal output by a designated pin are normal or not is sequentially analyzed after the functional failure. If the clock source signal is abnormal, the internal clock can be judged to be invalid; under the condition that the clock source signal is normal, if the orthogonal pseudo-random signal output by the DAC is normal, the failure of the on-chip communication unit can be judged; if the clock is normal and the DAC output is abnormal, judging that the functional units except the clock and the communication are invalid, and replacing the sample to perform collimation and positioning irradiation. Secondly, carrying out collimation positioning irradiation on the in-chip storage area of the second group of samples to obtain a functional failure dose mean value D2 and a variance delta 2 of the second group of samples, and adopting delta 1+ delta 2 as a judgment factor to eliminate the influence of the failure dose dispersity; if D2 is less than or equal to D1+ delta 1+ delta 2, the on-chip memory cell is judged to be failed. Finally, carrying out collimation positioning irradiation on the inner core area of the third group of samples to obtain the mean value D3 of the functional failure dose and the variance delta 3 of the mean value D3 of the functional failure dose of the third group of samples, and adopting delta 1+ delta 3 as a judgment factor; if D3 is less than or equal to D1+ delta 1+ delta 3, the kernel unit is judged to be failed. If none of the above conditions are met, it may be determined that the other unit of the microcontroller is malfunctioning.
The above-described embodiments are merely illustrative of the present invention, which may be embodied in other specific forms or in other specific forms without departing from the spirit or essential characteristics thereof. The described embodiments are, therefore, to be considered in all respects as illustrative and not restrictive. The scope of the invention should be indicated by the appended claims, and any changes that are equivalent to the intent and scope of the claims should be construed to be included therein.
Claims (5)
1. A microcontroller total dose irradiation failure unit experiment judgment system is characterized by comprising a tested microcontroller, a data acquisition unit, a communication and power supply unit, an upper computer, a collimation positioning irradiation unit, a following dosimeter and a shielding body;
the tested micro controller preloads a function verification program, encodes the output quantity or state quantity of the on-chip memory and the analog-to-digital converter and then sends the encoded data to a data acquisition unit, and the sent encoded data is used as functional state judgment source data;
the data acquisition unit has a multi-channel digital and analog signal acquisition function, acquires encoded data output by the tested micro controller and analog signals output by the appointed pins in real time, and transmits the encoded data and the analog signals to the upper computer for analysis through the communication unit;
a passive detector with small volume is adopted for the following dosimeter and is closely arranged to a tested micro controller to measure the accumulated irradiated dosage;
the shield is arranged between the microprocessor to be tested and the data acquisition unit;
the collimation positioning irradiation unit adopts a shielding collimation hole structure and is arranged between the microprocessor to be measured and the irradiation source, and a first collimation hole is arranged at the position, corresponding to the microprocessor, on the collimation positioning irradiation unit;
a second collimation hole is formed in the position, corresponding to the position of the follow dosimeter, of the collimation positioning irradiation unit;
when the microcontroller is initialized, the pulse signal of the internal clock source passes through the appointed output pin through the configuration register, and the digital-to-analog converter in the chip is instructed to output an orthogonal pseudo-random signal with fixed frequency to the appointed output pin; after initialization is complete, the output of the clock signal and the quadrature pseudorandom signal will no longer be affected by the preload program operating state.
2. The microcontroller total dose exposure failure unit experiment determination system of claim 1, wherein the shield employs a lead equivalent thickness greater than 4 cm.
3. A microcontroller total dose irradiance failure unit experimental decision system as claimed in claim 1 wherein the lead equivalent thickness of the shielded portion of the collimated positioning irradiance unit is greater than 4 cm.
4. The microcontroller total dose exposure failure unit experiment determination system of claim 1, wherein the first collimating aperture and the second collimating aperture are the same size.
5. An experimental judgment method performed by using the microcontroller total dose irradiation failure unit experimental judgment system as claimed in claim 1, wherein the experimental judgment method adopts the same type and batch of microcontrollers to divide three groups of experimental samples to perform single variable control experiments, and comprises the following steps:
step (1), a first group of irradiation experiments are carried out under the condition that a collimation positioning irradiation unit is not provided, the mean value D1 of the functional failure dose and the variance delta 1 of the mean value D1 of the functional failure dose of a first group of samples are obtained, and whether a clock source and a DAC signal output by a designated pin are normal or not is sequentially analyzed after the functional failure;
if the clock source signal is abnormal, the internal clock can be judged to be invalid; under the condition that the clock source signal is normal, if the orthogonal pseudo-random signal output by the DAC is normal, the failure of the on-chip communication unit can be judged; if the clock is normal and the DAC output is abnormal, judging that the functional units except the clock and the communication are invalid, and replacing the sample to perform collimation positioning irradiation;
step (2), carrying out collimation positioning irradiation on the in-chip storage areas of the second group of samples to obtain a functional failure dose mean value D2 and a variance delta 2 of the second group of samples, and adopting delta 1+ delta 2 as a judgment factor to eliminate the influence of the dispersibility of the failure dose; if D2 is not more than D1+ delta 1+ delta 2, the on-chip memory cell is judged to be failed;
performing collimation positioning irradiation on the inner core area of the third group of samples to obtain the mean value D3 and the variance delta 3 of the functional failure dose of the third group of samples, and adopting delta 1+ delta 3 as a judgment factor; if D3 is not more than D1+ delta 1+ delta 3, the kernel unit is judged to be failed;
and (4) if the conditions are not met, judging that other units of the microcontroller fail.
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