CN108169660A - FPGA single particle effect detection data separation method and system under atmospheric neutron - Google Patents
FPGA single particle effect detection data separation method and system under atmospheric neutron Download PDFInfo
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- CN108169660A CN108169660A CN201711368127.9A CN201711368127A CN108169660A CN 108169660 A CN108169660 A CN 108169660A CN 201711368127 A CN201711368127 A CN 201711368127A CN 108169660 A CN108169660 A CN 108169660A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
Abstract
The present invention relates to whether radiation effect fields, more particularly to FPGA single particle effect detection data separation method and system under a kind of atmospheric neutron, it is detected in real time by carrying out atmospheric neutron single particle effect to FPGA device, obtains total crash rate of the FPGA device；Obtain the FPGA device first crash rate as caused by alpha particle；Obtain the FPGA device second crash rate as caused by thermal neutron；FPGA device targeted failure rate as caused by atmospheric neutron is obtained according to total crash rate, first crash rate and second crash rate.This programme can distinguish FPGA device atmospheric neutron single particle effect and measure three kinds of alpha particle in test data, thermal neutron and atmospheric neutron respective contributions of composition in real time, so as to FPGA device single particle effect crash rate caused by obtaining atmospheric neutron, so as to improve the accuracy of the quantitative assessment result of FPGA device atmospheric neutron single particle effect sensibility.
Description
Technical field
The present invention relates to whether radiation effect field, more particularly to FPGA single particle effect under a kind of atmospheric neutron
Detection data differentiating method and system.
Background technology
The various cosmic rays such as galactic cosmic rays, solar cosmic ray enter the neutral atmosphere of the earth, and and air
In nitrogen and oxygen interact, form various radiating particles so that airspace radiation environment is extremely complex.Various
Among radiating particle, since neutron is not charged, penetration power is extremely strong and content in an atmosphere is high, atmospheric neutron enters radio
Single particle effect caused by subsystem becomes the key factor for threatening electronic equipments safety work.
FPGA (Field-Programmable Gate Array), i.e. field programmable gate array, are as special collection
Occur into a kind of semi-custom circuit in circuit field, not only solved the deficiency of custom circuit, but also overcome original compile
The shortcomings that journey device gate circuit number is limited.With the development of science and technology, various electronic equipments to the dependence of FPGA device increasingly
By force, the integrated level of FPGA device itself raising, complexity increase, and cause FPGA device more sensitive to single particle effect.
For the influence that the single particle effect for assessing atmospheric neutron induction generates FPGA device, need to atmospheric neutron list
The sensitivity characteristic of FPGA device under particle effect is analyzed.Currently in order to it is sensitive special that single particle effect is carried out to FPGA device
Property analyzed, can be carried out, i.e., FPGA device is placed under atmospheric conditions by non-Acceleration study, to FPGA array carry out air
Neutron single-particle effect detects in real time.But at present in atmospheric neutron single particle effect real-time detector data, due to detecting environment
Under radiation condition there are a variety of particles, cause to analyze the sensitivity characteristic that FPGA device is directed to atmospheric neutron single particle effect, gained
Accuracy to result is relatively low.
Invention content
Based on this, in order to solve the sensitivity characteristic that analysis FPGA device is directed to atmospheric neutron single particle effect, acquired knot
The problem of accuracy of fruit is relatively low provides FPGA single particle effect detection data separation method and system under a kind of atmospheric neutron.
FPGA single particle effect detection data separation method, includes the following steps under a kind of atmospheric neutron：
Atmospheric neutron single particle effect is carried out to FPGA device to detect in real time, obtains total crash rate of the FPGA device；
Obtain the first crash rate of the FPGA device as caused by alpha particle；
Obtain the second crash rate of the FPGA device as caused by thermal neutron；
It is obtained as caused by atmospheric neutron according to total crash rate, first crash rate and second crash rate
The targeted failure rate of FPGA device.
The step of first crash rate for obtaining the FPGA device as caused by alpha particle in one of the embodiments,
Suddenly include the following steps：
The FPGA device is irradiated by alpha particle radioactive source, obtains Alpha's grain of the FPGA device
Sub- single particle effect cross section parameter；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
First crash rate of device.
The step of first crash rate for obtaining the FPGA device as caused by alpha particle in one of the embodiments,
Suddenly include the following steps：
The FPGA device is irradiated by particle accelerator, obtains the alpha particle simple grain of the FPGA device
Sub- effect cross section parameter, wherein, the particle source of the particle accelerator is alpha particle；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
First crash rate of device.
It is described according to the alpha particle single particle effect cross section parameter and the A Er in one of the embodiments,
The step of first crash rate of the method particle flux acquisition FPGA device, includes the following steps：
The first crash rate of the FPGA device is obtained according to following functional relation：
λ1=σAlpha×FAlpha×109
In formula, λ1For first crash rate, σAlphaFor the alpha particle single particle effect cross section parameter, FAlphaFor
The alpha particle flux.
The step of the second crash rate of acquisition FPGA device as caused by thermal neutron is wrapped in one of the embodiments,
Include following steps：
The FPGA device is irradiated by thermal reactor, obtains the thermal neutron single-particle of the FPGA device
Effect cross section parameter；
Obtain the thermal neutron flux that atmospheric neutron single particle effect detects environment in real time；
The of the FPGA device is obtained according to the thermal neutron single particle effect cross section parameter and the thermal neutron flux
Two crash rates.
It is described in one of the embodiments, to be led to according to the thermal neutron single particle effect cross section parameter and the thermal neutron
The step of second crash rate of the amount acquisition FPGA device, includes the following steps：
The second crash rate of the FPGA device is obtained according to following functional relation：
λ2=σThermal neutron×FThermal neutron×109
In formula, λ2For second crash rate, σThermal neutronFor the thermal neutron single particle effect cross section parameter, FThermal neutronIt is described
Thermal neutron flux.
It is described according to total crash rate, first crash rate and second failure in one of the embodiments,
The step of targeted failure rate of rate acquisition FPGA device as caused by atmospheric neutron, includes the following steps：
The targeted failure rate of the FPGA device is obtained according to following functional relation：
λTarget=λAlways-(λ1+λ2)
In formula, λTargetFor the targeted failure rate, λAlwaysFor total crash rate, λ1For first crash rate, λ2It is described
Second crash rate.
It is big by being carried out to FPGA device according to FPGA single particle effect detection data separation method under above-mentioned atmospheric neutron
Gas neutron single-particle effect detects in real time, obtains total crash rate of the FPGA device；The FPGA device is obtained by Alpha
First crash rate caused by particle；Obtain the FPGA device second crash rate as caused by thermal neutron；According to total failure
Rate, first crash rate and second crash rate obtain FPGA device targeted failure rate as caused by atmospheric neutron.
In this scheme, by obtaining FPGA device first crash rate as caused by alpha particle and thermal neutron and the second failure respectively
Rate, and the targeted failure rate of the FPGA device as caused by atmospheric neutron is obtained according to first crash rate and the second crash rate,
So as to improve the accuracy of the quantitative assessment result of FPGA device atmospheric neutron single particle effect sensibility, it is current to solve China
The problem of FPGA device atmospheric neutron single particle effect evaluation method missing.
FPGA single particle effect detection data separation system under a kind of atmospheric neutron, including with lower module：
Total crash rate acquisition module for carrying out atmospheric neutron single particle effect to FPGA device detects, obtains institute in real time
State the total crash rate of single particle effect of FPGA device；
First crash rate acquisition module, for obtaining the FPGA device first crash rate as caused by alpha particle；
Second crash rate acquisition module, for obtaining the FPGA device second crash rate as caused by thermal neutron；
Targeted failure rate acquisition module, for according to total crash rate, first crash rate and second failure
Rate obtains the targeted failure rate of the FPGA device as caused by atmospheric neutron.
The targeted failure rate acquisition module is according to obtaining following functional relation in one of the embodiments,
The targeted failure rate of FPGA device：
λTarget=λAlways-(λ1+λ2)
In formula, λTargetFor the targeted failure rate, λAlwaysFor total crash rate, λ1For first crash rate, λ2It is described
Second crash rate.
According to FPGA single particle effect detection data separation system under above-mentioned atmospheric neutron, total crash rate acquisition module pair
FPGA device carries out atmospheric neutron single particle effect and detects in real time, obtains total crash rate of the FPGA device；First crash rate
Acquisition module obtains FPGA device first crash rate as caused by alpha particle；Second crash rate acquisition module obtains institute
State FPGA device second crash rate as caused by thermal neutron；Targeted failure rate acquisition module is according to total crash rate, described
One crash rate and second crash rate obtain FPGA device targeted failure rate as caused by atmospheric neutron.In this scheme
In, by obtaining FPGA device first crash rate as caused by alpha particle and thermal neutron and the second crash rate, and root respectively
The targeted failure rate of the FPGA device as caused by atmospheric neutron is obtained according to first crash rate and the second crash rate, so as to improve
It is big to solve the current FPGA device in China for the accuracy of the quantitative assessment result of FPGA device atmospheric neutron single particle effect sensibility
The problem of gas neutron single-particle Effect Evaluation method missing.
A kind of readable storage medium storing program for executing, is stored thereon with executable program, which realizes above-mentioned big when being executed by processor
Under gas neutron the step of FPGA single particle effect detection data separation method.
A kind of computer equipment can be run on a memory and on a processor including memory, processor and storage
Executable program, processor realize FPGA single particle effect detection data separation method under above-mentioned atmospheric neutron when performing program
Step.
Description of the drawings
Fig. 1 is that the flow of FPGA single particle effect detection data separation method one embodiment under atmospheric neutron of the present invention is shown
It is intended to；
Fig. 2 is that the structure of FPGA single particle effect detection data separation system one embodiment under atmospheric neutron of the present invention is shown
It is intended to；
Fig. 3 is that the flow of FPGA single particle effect detection data separation method one embodiment under atmospheric neutron of the present invention is shown
It is intended to.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention more comprehensible, with reference to the accompanying drawings and embodiments, to this
Invention is described in further detail.It should be appreciated that the specific embodiments described herein are only used to explain the present invention,
Do not limit protection scope of the present invention.
It is shown in Figure 1, it is one implementation of FPGA single particle effect detection data separation method under atmospheric neutron of the present invention
The flow diagram of example, FPGA single particle effect detection data separation method includes following step under the atmospheric neutron in the embodiment
Suddenly：
Step S110：Atmospheric neutron single particle effect is carried out to FPGA device to detect in real time, obtains the FPGA device
Total crash rate；
In this step, the atmospheric neutron single particle effect detects in real time, is a kind of to follow JESD89A international standards
Non- acceleration method for real-time measurement is detected in real time by carrying out atmospheric neutron single particle effect to FPGA device, accessed
Crash rate result of the FPGA device in the environment of the real-time detection is the truest, can be the air carried out to FPGA device
The analysis of neutron single-particle effect sensitivity characteristic provides more accurately and reliably data basis.
Specifically, can atmospheric neutron single-particle effect be carried out to the FPGA device by the following method in one embodiment
It should detect：It determines the atmospheric neutron single particle effect detection site of FPGA device, and builds the detection of atmospheric neutron single particle effect
System；The atmospheric neutron single particle effect detecting system may include host computer, FPGA device to be measured；The host computer is to described
FPGA device to be measured sends order, monitors the working condition of the FPGA device to be measured and receives the FPGA device return to be measured
Experimental data.The single-particle inversion situation that the host computer is occurred by recording FPGA device in detection process in real time, can be with
Getting the FPGA device, sub- single particle effect detects total crash rate under environment in real time in an atmosphere.
Optionally, in order to improve the efficiency that atmospheric neutron single particle effect detects in real time, atmospheric neutron flux can be selected
High place carries out atmospheric neutron single particle effect to the FPGA device and detects in real time, such as in height by way of aircraft carrying
Elevational position carries out the atmospheric neutron single particle effect and detects in real time, can also carry out the atmospheric neutron in high latitude area
Single particle effect detects in real time.
Optionally, in order to improve the efficiency that atmospheric neutron single particle effect detects in real time, FPGA array can be built, it is described
FPGA array includes the FPGA device of multiple same models, and the atmospheric neutron single particle effect is carried out to the FPGA array
Detection in real time；Detection is carried out at the same time by the FPGA device to multiple same models, obtained testing result can be equivalent to pair
It is that one FPGA device is detected for a long time as a result, the required detection time that obtains total crash rate can be shortened.
Step S120：Obtain the first crash rate of the FPGA device as caused by alpha particle；
In this step, alpha particle derives from the radioactive material ingredient of FPGA device itself, to the FPGA
The atmospheric neutron single particle effect that device carries out is in real time during detection, and not only the atmospheric neutron in real time in detection environment can touch
Sending out FPGA device described single-particle inversion occurs causes to fail, and alpha particle can also trigger the FPGA device and single-particle occurs
Overturning causes to fail；Therefore, sub- single particle effect detects total crash rate packet under environment to the FPGA device in real time in an atmosphere
The ingredient of first crash rate caused by having contained alpha particle.By obtain the FPGA device as caused by alpha particle first
Crash rate is conducive to improve the accuracy that the targeted failure rate obtains in subsequent step.
The step of first crash rate for obtaining the FPGA device as caused by alpha particle in one of the embodiments,
Suddenly include the following steps：
The FPGA device is irradiated by alpha particle radioactive source, obtains Alpha's grain of the FPGA device
Sub- single particle effect cross section parameter；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
First crash rate of device.
In the present embodiment, it is single to refer to that the FPGA device occurs for the single particle effect cross section parameter of the FPGA device
The area of sensitive area when particle is overturn.Since in the case of variety classes particle incidence, the FPGA device has difference
Single particle effect cross section parameter, therefore the FPGA device can be irradiated by alpha particle radioactive source, realized
The process of FPGA device own material radiation alpha particle is simulated, so that it is determined that the A Er of the FPGA device
Method particle single particle effect section；In conjunction with the alpha particle flux of the FPGA device itself radiation, acquisition can be improved
The accuracy of first crash rate of the FPGA device as caused by alpha particle.
The step of first crash rate for obtaining the FPGA device as caused by alpha particle in one of the embodiments,
Suddenly include the following steps：
The FPGA device is irradiated by particle accelerator, obtains the alpha particle simple grain of the FPGA device
Sub- effect cross section parameter, wherein, the particle source of the particle accelerator is alpha particle；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
First crash rate of device.
In the present embodiment, since the single particle effect cross section parameter of the FPGA device is not only by incoming particle type
Influence, while the influence of the angle, energy when also suffering from the incident FPGA device of the particle.By particle source for Ah
You irradiate the FPGA device particle accelerator of method particle, can simulate the FPGA device own material radiation
During alpha particle, easily change the angle and line fluence of the incident FPGA device of alpha particle, from
And analog result is made to improve the standard for the first crash rate for obtaining the FPGA device as caused by alpha particle closer to truth
True property.
It is described according to the alpha particle single particle effect cross section parameter and the A Er in one of the embodiments,
The step of first crash rate of the method particle flux acquisition FPGA device, includes the following steps：
The first crash rate of the FPGA device is obtained according to following functional relation：
λ1=σAlpha×FAlpha×109
In formula, λ1For first crash rate, σAlphaFor the alpha particle single particle effect cross section parameter, FAlphaFor
The alpha particle flux.
In the present embodiment, it is proposed that a kind of alpha particle single particle effect cross section parameter being used for according to FPGA device
The functional relation of the first crash rate of the FPGA device is obtained with alpha particle flux, improve acquisition described first is lost
The accuracy of efficiency.
Step S130：Obtain the second crash rate of the FPGA device as caused by thermal neutron；
At normal temperatures, if the atomic nucleus of neutron and proton occurs not to be captured after colliding several times, possible transition is heat
Neutron, the thermal neutron can equally cause FPGA device that single-particle inversion occurs so as to fail.In this step to the FPGA devices
During detection, the air is existed simultaneously due to detecting in real time in real time for the atmospheric neutron single particle effect that part carries out in environment
Neutron and the thermal neutron, therefore, sub- single particle effect detects total mistake under environment to the FPGA device in real time in an atmosphere
Efficiency contains the ingredient of the second crash rate caused by thermal neutron.It is lost by obtain the FPGA device as caused by thermal neutron second
Efficiency is conducive to improve the accuracy that the targeted failure rate obtains in subsequent step.
The step of the second crash rate of acquisition FPGA device as caused by thermal neutron is wrapped in one of the embodiments,
Include following steps：
The FPGA device is irradiated by thermal reactor, obtains the thermal neutron single-particle of the FPGA device
Effect cross section parameter；
Obtain the thermal neutron flux that atmospheric neutron single particle effect detects environment in real time；
The of the FPGA device is obtained according to the thermal neutron single particle effect cross section parameter and the thermal neutron flux
Two crash rates.
In the present embodiment, thermal reactor is a kind of can to carry out fission chain reaction under controlled conditions
Device can be stablized, constantly provide thermal neutron.Since in the case of variety classes particle incidence, the FPGA device has
There is different single particle effect cross section parameters, therefore the FPGA device can be irradiated by thermal reactor, it is real
Now the subenvironment of hankering of the real-time detection site of atmospheric neutron single particle effect is simulated, so that it is determined that the FPGA devices
The thermal neutron single particle effect section of part；It is detected in environment in real time in conjunction with the atmospheric neutron single particle effect of the FPGA device
Thermal neutron flux, can improve obtain the FPGA device as caused by thermal neutron the second crash rate accuracy.
It is described in one of the embodiments, to be led to according to the thermal neutron single particle effect cross section parameter and the thermal neutron
The step of second crash rate of the amount acquisition FPGA device, includes the following steps：
The second crash rate of the FPGA device is obtained according to following functional relation：
λ2=σThermal neutron×FThermal neutron×109
In formula, λ2For second crash rate, σThermal neutronFor the thermal neutron single particle effect cross section parameter, FThermal neutronIt is described
Thermal neutron flux.
In the present embodiment, it is proposed that a kind of thermal neutron single particle effect cross section parameter and heat being used for according to FPGA device
Neutron flux obtains the functional relation of the second crash rate of the FPGA device, improves the standard of second crash rate of acquisition
True property.
Specifically, the FPGA device is irradiated described, obtains the correspondence specified particle kind of the FPGA device
During the single particle effect cross section parameter of class, single particle effect on-line testing, test can be carried out to the FPGA device
Range cover all sensitive memory modules of the FPGA device, provided including block storage, configuration memory and programmable logic
Source etc.；For example, it can be analyzed by the configuration memory to the FPGA device and block storage back read data, and monitor
The output function of FPGA configuration circuit carries out the single particle effect on-line testing.
It can detect whether the FPGA device is sent out in the single particle effect on-line testing in one of the embodiments,
Raw single event function interrupt.Single event function interrupt is a kind of list that digital logic device loses original function under particle bombardment
Particle effect；FPGA device is when occurring single event function interrupt, into abnormal interrupt responsive state so that FPGA device retaking of a year or grade
The mistake that generates of data be more than the mistake that actually generates, can not output program as a result, FPGA device is caused to damage when serious.Cause
This cuts off the power supply of the FPGA array, can be damaged to avoid FPGA device when detecting generation single event function interrupt.It cuts
After the power supply for the FPGA array of breaking, re-execute it is described the FPGA device is irradiated by thermal reactor, obtain
The step of taking the thermal neutron single particle effect cross section parameter of the FPGA device.
It can detect whether the FPGA device is sent out in the single particle effect on-line testing in one of the embodiments,
Raw locking single particle.Locking single particle is a kind of larger single particle effect of harmfulness.When locking single particle occurs, FPGA device
The electric current that inside generates increases suddenly, be easy to cause burning for FPGA device.Therefore when detecting generation locking single particle, institute is cut off
The power supply of FPGA array is stated, can be damaged to avoid FPGA device.After the power supply for cutting off the FPGA array, re-execute described logical
It crosses thermal reactor to irradiate the FPGA device, obtains the thermal neutron single particle effect section ginseng of the FPGA device
Several steps.
Step S140：It is obtained according to total crash rate, first crash rate and second crash rate by air
The targeted failure rate of FPGA device caused by son.
In this step, due to detecting other particles existed simultaneously in environment in addition to atmospheric neutron, institute in real time
It states and FPGA device progress atmospheric neutron single particle effect is detected in real time in the total crash rate got, contain other grains
Crash rate ingredient caused by son.Wherein, in other described particles, from the A Er of itself radioactive material of the FPGA device
Thermal neutron present in method particle and in real time detection environment is affected to total crash rate, therefore according to total mistake
Efficiency, first crash rate and second crash rate can improve the accuracy for obtaining the targeted failure rate.
It is described according to total crash rate, first crash rate and second failure in one of the embodiments,
The step of targeted failure rate of rate acquisition FPGA device as caused by atmospheric neutron, includes the following steps：
The targeted failure rate of the FPGA device is obtained according to following functional relation：
λTarget=λAlways-(λ1+λ2)
In formula, λTargetFor the targeted failure rate, λAlwaysFor total crash rate, λ1For first crash rate, λ2It is described
Second crash rate.
In the present embodiment, according to the functional relation, atmospheric neutron simple grain can be carried out to FPGA device described
Sub- effect is detected in real time in total crash rate of acquisition, and the first crash rate as caused by alpha particle and thermal neutron and second is lost
The ingredient of efficiency is rejected simultaneously, so as to make the targeted failure rate closer in real-time detection as caused by atmospheric neutron it is described
The crash rate of FPGA device.
It is big by being carried out to FPGA device according to FPGA single particle effect detection data separation method under above-mentioned atmospheric neutron
Gas neutron single-particle effect detects in real time, obtains total crash rate of the FPGA device；The FPGA device is obtained by Alpha
First crash rate caused by particle；Obtain the FPGA device second crash rate as caused by thermal neutron；According to total failure
Rate, first crash rate and second crash rate obtain FPGA device targeted failure rate as caused by atmospheric neutron.
In this scheme, by obtaining FPGA device first crash rate as caused by alpha particle and thermal neutron and the second failure respectively
Rate, and the targeted failure rate of the FPGA device as caused by atmospheric neutron is obtained according to first crash rate and the second crash rate,
So as to improve the accuracy of the quantitative assessment result of FPGA device atmospheric neutron single particle effect sensibility, it is current to solve China
The problem of FPGA device atmospheric neutron single particle effect evaluation method missing.
It is shown in Figure 2, it is one implementation of FPGA single particle effect detection data separation system under atmospheric neutron of the present invention
The structure diagram of example, FPGA single particle effect detection data separation system is included with lower die under the atmospheric neutron in the embodiment
Block：
Total crash rate acquisition module 210, for carrying out atmospheric neutron single particle effect to FPGA device detects, obtains in real time
The total crash rate of single particle effect of the FPGA device；
First crash rate acquisition module 220, for obtaining the FPGA device first failure as caused by alpha particle
Rate；
In one of the embodiments, the first crash rate acquisition module 220 by alpha particle radioactive source to described
FPGA device is irradiated, and obtains the alpha particle single particle effect cross section parameter of the FPGA device；Obtain the FPGA
The alpha particle flux of device itself radiation；According to the alpha particle single particle effect cross section parameter and the Alpha
Particle flux obtains the first crash rate of the FPGA device.
In one of the embodiments, the first crash rate acquisition module 220 by particle accelerator to the FPGA device
It is irradiated, obtains the alpha particle single particle effect cross section parameter of the FPGA device, wherein, the particle accelerator
Particle source is alpha particle；Obtain the alpha particle flux of the FPGA device itself radiation；According to Alpha grain
Sub- single particle effect cross section parameter and the alpha particle flux obtain the first crash rate of the FPGA device.
The first crash rate acquisition module 220 is according to obtaining following functional relation in one of the embodiments,
First crash rate of FPGA device：
λ1=σAlpha×FAlpha×109
In formula, λ1For first crash rate, σAlphaFor the alpha particle single particle effect cross section parameter, FAlphaFor
The alpha particle flux.
Second crash rate acquisition module 230, for obtaining the FPGA device second crash rate as caused by thermal neutron；
In one of the embodiments, the second crash rate acquisition module 230 by thermal reactor to the FPGA devices
Part is irradiated, and obtains the thermal neutron single particle effect cross section parameter of the FPGA device；Obtain atmospheric neutron single particle effect
The thermal neutron flux of detection environment in real time；It is obtained according to the thermal neutron single particle effect cross section parameter and the thermal neutron flux
Second crash rate of the FPGA device.
The second crash rate acquisition module 230 is according to obtaining following functional relation in one of the embodiments,
Second crash rate of FPGA device：
λ2=σThermal neutron×FThermal neutron×109
In formula, λ2For second crash rate, σThermal neutronFor the thermal neutron single particle effect cross section parameter, FThermal neutronIt is described
Thermal neutron flux.
Targeted failure rate acquisition module 240, for being lost according to total crash rate, first crash rate and described second
Efficiency obtains the targeted failure rate of the FPGA device as caused by atmospheric neutron.
Targeted failure rate acquisition module 240 is according to obtaining following functional relation in one of the embodiments,
The targeted failure rate of FPGA device：
λTarget=λAlways-(λ1+λ2)
In formula, λTargetFor the targeted failure rate, λAlwaysFor total crash rate, λ1For first crash rate, λ2It is described
Second crash rate.
Under the atmospheric neutron of the present invention under the atmospheric neutron of FPGA single particle effect detection data separation system and the present invention
FPGA single particle effect detection data separation method corresponds, the FPGA single particle effect detection data under above-mentioned atmospheric neutron
The technical characteristic and advantage that the embodiment of differentiating method illustrates are suitable for FPGA single particle effect under atmospheric neutron and examine
In the embodiment of measured data compartment system.
It is shown in Figure 3, it is one implementation of FPGA single particle effect detection data separation method under atmospheric neutron of the present invention
The flow diagram of example, FPGA single particle effect detection data separation method includes following step under the atmospheric neutron in the embodiment
Suddenly：
Step S310：Atmospheric neutron single particle effect is carried out to FPGA device to detect in real time, obtains the FPGA device
Total crash rate (λAlways, unit FIT)；
Step S321：The FPGA device is irradiated by alpha particle radioactive source, to described in irradiation process
FPGA device carries out single particle effect on-line testing, obtains the alpha particle single particle effect cross section parameter of the FPGA device
(σAlpha, unit cm2/device)；
Wherein, the single particle effect type that the single-particle on-line testing carried out to FPGA device is detected includes simple grain
Son overturning, single event function interrupt and locking single particle；When detecting the single-particle inversion of the FPGA device, the range of detection is covered
All sensitive memory modules of the FPGA device are covered, including block storage, configuration memory and programmable logic resource etc.；Inspection
When surveying the single event function interrupt of the FPGA device, the range of detection covers the functional interruption class of institute of the FPGA device
Type；
Step S322：Obtain the alpha particle flux (F of the FPGA device itself radiationAlpha, unit is
particles/cm2/hr)；
Step S323：According to functional relation λ1=σAlpha×FAlpha×109Obtain the first crash rate of the FPGA device
(λ1, unit FIT)；
Step S331：The FPGA device is irradiated by thermal reactor, to the FPGA in irradiation process
Device carries out single particle effect on-line testing, obtains the thermal neutron single particle effect cross section parameter (σ of the FPGA deviceThermal neutron, it is single
Position is cm2/device)；
Wherein, the single particle effect type that the single-particle on-line testing carried out to FPGA device is detected includes simple grain
Son overturning, single event function interrupt and locking single particle；When detecting the single-particle inversion of the FPGA device, the range of detection is covered
All sensitive memory modules of the FPGA device are covered, including block storage, configuration memory and programmable logic resource etc.；Inspection
When surveying the single event function interrupt of the FPGA device, the range of detection covers the functional interruption class of institute of the FPGA device
Type；
Step S332：Obtain the thermal neutron flux (F that atmospheric neutron single particle effect detects environment in real timeThermal neutron, unit is
particles/cm2/hr)；
Step S333：According to functional relation λ2=σThermal neutron×FThermal neutron×109Obtain the second crash rate of the FPGA device
(λ2, unit FIT)；
Step S340：According to functional relation λTarget=λAlways-(λ1+λ2) obtain the targeted failure rate of the FPGA device
(λTarget, unit FIT).
It is big by being carried out to FPGA device according to FPGA single particle effect detection data separation method under above-mentioned atmospheric neutron
Gas neutron single-particle effect detects in real time, obtains total crash rate of the FPGA device；The FPGA device is obtained by Alpha
First crash rate caused by particle；Obtain the FPGA device second crash rate as caused by thermal neutron；According to total failure
Rate, first crash rate and second crash rate obtain FPGA device targeted failure rate as caused by atmospheric neutron.
In this scheme, by obtaining FPGA device first crash rate as caused by alpha particle and thermal neutron and the second failure respectively
Rate, and the targeted failure rate of the FPGA device as caused by atmospheric neutron is obtained according to first crash rate and the second crash rate,
FPGA device atmospheric neutron single particle effect can be distinguished and measure alpha particle in test data, thermal neutron and atmospheric neutron in real time
Three kinds of respective contributions of composition, so as to FPGA device single particle effect crash rate caused by obtaining atmospheric neutron, so as to improve
The accuracy of the quantitative assessment result of FPGA device atmospheric neutron single particle effect sensibility provides basis for system-level evaluation
Data solve the problems, such as the current FPGA device atmospheric neutron single particle effect evaluation method missing in China.
One is also provided according to FPGA single particle effect detection data separation method, the embodiment of the present invention under above-mentioned atmospheric neutron
Kind readable storage medium storing program for executing and a kind of computer equipment.Executable program is stored on readable storage medium storing program for executing, the program is by processor
The step of FPGA single particle effect detection data separation method under above-mentioned atmospheric neutron is realized during execution；Computer equipment includes depositing
Reservoir, processor and storage on a memory and the executable program that can run on a processor, reality when processor performs program
Under existing above-mentioned atmospheric neutron the step of FPGA single particle effect detection data separation method.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, it is all considered to be the range of this specification record.
Embodiment described above only expresses the several embodiments of the present invention, and description is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that those of ordinary skill in the art are come
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
1. a kind of FPGA single particle effect detection data separation method under atmospheric neutron, which is characterized in that include the following steps：
Atmospheric neutron single particle effect is carried out to FPGA device to detect in real time, obtains total crash rate of the FPGA device；
Obtain the first crash rate of the FPGA device as caused by alpha particle；
Obtain the second crash rate of the FPGA device as caused by thermal neutron；
The FPGA devices as caused by atmospheric neutron are obtained according to total crash rate, first crash rate and second crash rate
The targeted failure rate of part.
2. FPGA single particle effect detection data separation method under atmospheric neutron according to claim 1, which is characterized in that
The step of first crash rate of acquisition FPGA device as caused by alpha particle, includes the following steps：
The FPGA device is irradiated by alpha particle radioactive source, obtains the alpha particle list of the FPGA device
Particle effect cross section parameter；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA device is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
The first crash rate.
3. FPGA single particle effect detection data separation method under atmospheric neutron according to claim 1, which is characterized in that
The step of first crash rate of acquisition FPGA device as caused by alpha particle, includes the following steps：
The FPGA device is irradiated by particle accelerator, obtains the alpha particle single-particle effect of the FPGA device
Cross section parameter is answered, wherein, the particle source of the particle accelerator is alpha particle；
Obtain the alpha particle flux of the FPGA device itself radiation；
The FPGA device is obtained according to the alpha particle single particle effect cross section parameter and the alpha particle flux
The first crash rate.
4. FPGA single particle effect detection data separation method, feature exist under the atmospheric neutron according to Claims 2 or 3
In described to obtain the FPGA devices according to the alpha particle single particle effect cross section parameter and the alpha particle flux
The step of first crash rate of part, includes the following steps：
The first crash rate of the FPGA device is obtained according to following functional relation：
λ1=σAlpha×FAlpha×109
In formula, λ1For first crash rate, σAlphaFor the alpha particle single particle effect cross section parameter, FAlphaIt is described
Alpha particle flux.
5. FPGA single particle effect detection data separation method under atmospheric neutron according to claim 1, which is characterized in that
The step of second crash rate of acquisition FPGA device as caused by thermal neutron, includes the following steps：
The FPGA device is irradiated by thermal reactor, obtains the thermal neutron single particle effect of the FPGA device
Cross section parameter；
Obtain the thermal neutron flux that atmospheric neutron single particle effect detects environment in real time；
Obtain the FPGA device according to the thermal neutron single particle effect cross section parameter and the thermal neutron flux second is lost
Efficiency.
6. FPGA single particle effect detection data separation method under atmospheric neutron according to claim 5, which is characterized in that
Second mistake that the FPGA device is obtained according to the thermal neutron single particle effect cross section parameter and the thermal neutron flux
The step of efficiency, includes the following steps：
The second crash rate of the FPGA device is obtained according to following functional relation：
λ2=σThermal neutron×FThermal neutron×109
In formula, λ2For second crash rate, σThermal neutronFor the thermal neutron single particle effect cross section parameter, FThermal neutronHanker to be described
Sub- flux.
7. FPGA single particle effect detection data separation method under atmospheric neutron according to claim 1, which is characterized in that
It is described that the FPGA devices as caused by atmospheric neutron are obtained according to total crash rate, first crash rate and second crash rate
The step of targeted failure rate of part, includes the following steps：
The targeted failure rate of the FPGA device is obtained according to following functional relation：
λTarget=λAlways-(λ1+λ2)
In formula, λTargetFor the targeted failure rate, λAlwaysFor total crash rate, λ1For first crash rate, λ2It is described second
Crash rate.
8. FPGA single particle effect detection data separation system under a kind of atmospheric neutron, which is characterized in that including with lower module：
Total crash rate acquisition module detects for carrying out atmospheric neutron single particle effect to FPGA device, in real time described in acquisition
The total crash rate of single particle effect of FPGA device；
First crash rate acquisition module, for obtaining the FPGA device first crash rate as caused by alpha particle；
Second crash rate acquisition module, for obtaining the FPGA device second crash rate as caused by thermal neutron；
Targeted failure rate acquisition module, for being obtained according to total crash rate, first crash rate and second crash rate
Take the targeted failure rate of the FPGA device as caused by atmospheric neutron.
9. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the program is held by processor
The step of FPGA single particle effect detection data separation method under any one of claim 1-7 atmospheric neutrons is realized during row.
10. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, which is characterized in that the processor is realized when performing described program under any one of claim 1-7 atmospheric neutrons
The step of FPGA single particle effect detection data separation method.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109214049A (en) * | 2018-07-27 | 2019-01-15 | 北京圣涛平试验工程技术研究院有限责任公司 | A kind of method and device in acquisition device neutron single-particle effect section |
| CN109696590A (en) * | 2018-11-14 | 2019-04-30 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | A kind of electronic device soft error rate appraisal procedure and device |
| CN110988969A (en) * | 2019-11-07 | 2020-04-10 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Atmospheric neutron radiation test method, system and device |
| CN111123062A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Test method for simulating single particle effect test based on femtosecond pulse laser |
| CN111929559A (en) * | 2020-07-02 | 2020-11-13 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Failure rate evaluation method and device of power device caused by atmospheric neutrons |
| IT202200000833A1 (en) | 2022-01-19 | 2023-07-19 | Istituto Naz Fisica Nucleare | Hadron fluence measurement method with a Field Programmable Gate Array (FPGA) device |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103810368A (en) * | 2012-11-15 | 2014-05-21 | 北京圣涛平试验工程技术研究院有限责任公司 | Reliability prediction method |
| CN105718713A (en) * | 2015-08-31 | 2016-06-29 | 北京圣涛平试验工程技术研究院有限责任公司 | Reliability analysis method of space radiation environment |
| CN105740596A (en) * | 2015-08-31 | 2016-07-06 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for analyzing atmospheric neutron single event effect of aviation electronic system |
-
2017
- 2017-12-18 CN CN201711368127.9A patent/CN108169660B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103810368A (en) * | 2012-11-15 | 2014-05-21 | 北京圣涛平试验工程技术研究院有限责任公司 | Reliability prediction method |
| CN105718713A (en) * | 2015-08-31 | 2016-06-29 | 北京圣涛平试验工程技术研究院有限责任公司 | Reliability analysis method of space radiation environment |
| CN105740596A (en) * | 2015-08-31 | 2016-07-06 | 北京圣涛平试验工程技术研究院有限责任公司 | Method and system for analyzing atmospheric neutron single event effect of aviation electronic system |
Non-Patent Citations (1)
| Title |
|---|
| 美高森美公司: "单粒子翻转与医疗器件", 《世界电子元器件》 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109214049A (en) * | 2018-07-27 | 2019-01-15 | 北京圣涛平试验工程技术研究院有限责任公司 | A kind of method and device in acquisition device neutron single-particle effect section |
| CN109696590A (en) * | 2018-11-14 | 2019-04-30 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | A kind of electronic device soft error rate appraisal procedure and device |
| CN109696590B (en) * | 2018-11-14 | 2020-12-29 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Method and device for evaluating soft error rate of electronic device |
| CN110988969A (en) * | 2019-11-07 | 2020-04-10 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Atmospheric neutron radiation test method, system and device |
| CN111123062A (en) * | 2019-12-26 | 2020-05-08 | 兰州空间技术物理研究所 | Test method for simulating single particle effect test based on femtosecond pulse laser |
| CN111929559A (en) * | 2020-07-02 | 2020-11-13 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Failure rate evaluation method and device of power device caused by atmospheric neutrons |
| IT202200000833A1 (en) | 2022-01-19 | 2023-07-19 | Istituto Naz Fisica Nucleare | Hadron fluence measurement method with a Field Programmable Gate Array (FPGA) device |
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