CN112146788A - Thermal resistance verification system and method - Google Patents

Thermal resistance verification system and method Download PDF

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Publication number
CN112146788A
CN112146788A CN202011037274.XA CN202011037274A CN112146788A CN 112146788 A CN112146788 A CN 112146788A CN 202011037274 A CN202011037274 A CN 202011037274A CN 112146788 A CN112146788 A CN 112146788A
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constant temperature
thermal resistor
thermal resistance
verification
arm
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陈克武
米保军
郑建忠
胡明
李建东
张达
撖伟
黄晟
周永椗
刘长风
程坤
许伟
朱杰
陈锐
许嘉欣
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SGIS Songshan Co Ltd
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SGIS Songshan Co Ltd
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    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Abstract

The embodiment of the application provides a thermal resistance verification system and a method, wherein the system comprises: the transfer mechanism, the first constant temperature tank, the second constant temperature tank and the cleaning tank are arranged in the first constant temperature tank; the transfer mechanism includes: the first lifting platform and the first rotating platform are arranged on the first lifting platform, a first rotating arm is arranged on the first rotating platform, a first placing frame is arranged on the first rotating arm, and the first placing frame is used for installing a thermal resistor; the transfer mechanism is used for inserting the target thermal resistor arranged in the first placing frame into the first constant temperature bath for thermal resistor verification through the first lifting table, the first rotating table and the first rotating arm; the transfer mechanism is also used for transferring the target thermal resistor from the first constant temperature bath to the cleaning bath for cleaning when the target thermal resistor completes the thermal resistor verification process in the first constant temperature bath; and the transfer mechanism is also used for transferring the target thermal resistor from the cleaning tank to the second constant temperature tank for thermal resistor verification when the target thermal resistor cleaning is finished. Therefore, the thermal resistance verification efficiency can be improved.

Description

热电阻检定系统和方法Thermal resistance verification system and method

技术领域technical field

本申请涉及热电阻检定技术领域,具体而言,涉及一种热电阻检定系统和方法。The present application relates to the technical field of thermal resistance verification, and in particular, to a thermal resistance verification system and method.

背景技术Background technique

热电阻检定系统是用于对热电阻进行检定的一套设备,通常包括计算机、测试仪表、标准热电阻、扫描开关、控温装置、恒温槽等。传统热电阻检定过程依据《工业铂、铜热电阻》中的检定要求进行检定。Thermal resistance verification system is a set of equipment used to verify thermal resistance, usually including computer, test instrument, standard thermal resistance, scanning switch, temperature control device, constant temperature bath, etc. The traditional thermal resistance verification process is verified according to the verification requirements in "Industrial Platinum and Copper Thermal Resistance".

根据《JJG229-2010工业铂、铜热电阻》中给出的检定规程,热电阻的检定点包括0℃和100℃。According to the verification procedures given in "JJG229-2010 Industrial Platinum and Copper Thermal Resistance", the verification points of thermal resistance include 0°C and 100°C.

0℃的温场一般是由具有0℃的恒温水槽提供,100℃的温场一般是由具有100℃的恒温油槽提供。The temperature field of 0°C is generally provided by a constant temperature water tank with 0°C, and the temperature field of 100°C is generally provided by a constant temperature oil tank with 100°C.

在现有的检定过程中,为了提升检定效率,通常考虑在单个恒温槽处实现数据采集过程的自动化,例如通过恒温槽附近的一些智能化测试仪表将检定结果传输给计算机进行处理,从而减少人为数据处理过程。In the existing verification process, in order to improve the verification efficiency, it is usually considered to realize the automation of the data acquisition process at a single constant temperature tank. For example, some intelligent test instruments near the constant temperature tank transmit the verification results to the computer for processing, thereby reducing human effort. data processing process.

但是,对于数据处理过程以外的热电阻处理过程仍然依赖于人为操作,因此,热电阻检定效率较低。However, the thermal resistance processing process other than the data processing process still relies on human operation, so the thermal resistance verification efficiency is low.

发明内容SUMMARY OF THE INVENTION

本申请的目的在于提供一种热电阻检定系统和方法,能够改善现有的热电阻检定效率较低的问题。The purpose of the present application is to provide a thermal resistance verification system and method, which can improve the existing problem of low thermal resistance verification efficiency.

第一方面,本发明实施例提供一种热电阻检定系统,包括:转移机构、第一恒温槽、第二恒温槽以及清洗槽;In a first aspect, an embodiment of the present invention provides a thermal resistance verification system, including: a transfer mechanism, a first constant temperature tank, a second constant temperature tank, and a cleaning tank;

所述转移机构包括:第一升降台以及安装在所述第一升降台上的第一旋转台,所述第一旋转台上安装有第一旋转臂,所述第一旋转臂上安装有第一放置架,所述第一放置架用于安装热电阻;The transfer mechanism includes: a first lift table and a first rotary table mounted on the first lift table, a first rotary arm is mounted on the first rotary table, and a first rotary arm is mounted on the first rotary arm. a placement rack, the first placement rack is used to install the thermal resistance;

所述转移机构,用于通过所述第一升降台、所述第一旋转台和所述第一旋转臂,将所述第一放置架中安装的目标热电阻插入至所述第一恒温槽进行热电阻检定;The transfer mechanism is used for inserting the target thermal resistance installed in the first placing rack into the first constant temperature bath through the first lifting table, the first rotating table and the first rotating arm Carry out thermal resistance verification;

所述转移机构,还用于在所述目标热电阻完成所述第一恒温槽中的热电阻检定过程时,将所述目标热电阻从所述第一恒温槽处转移至所述清洗槽进行清洗;The transfer mechanism is also used to transfer the target thermal resistance from the first constant temperature tank to the cleaning tank when the target thermal resistance completes the thermal resistance verification process in the first constant temperature tank. cleaning;

所述转移机构,还用于在所述目标热电阻清洗结束时,将所述目标热电阻从所述清洗槽处转移至所述第二恒温槽进行热电阻检定。The transfer mechanism is further configured to transfer the target thermal resistance from the cleaning tank to the second constant temperature tank for thermal resistance verification when the target thermal resistance is cleaned.

在上述的热电阻检定系统中,可以通过转移机构实现目标热电阻在整个热电阻检定过程中的温场切换,可实现热电阻的快速转移,并且可以在温场切换过程中将目标热电阻转移至清洗槽进行清洗,有利于实现高效可靠的热电阻检定,有利于提升热电阻检定效率。In the above thermal resistance verification system, the temperature field switching of the target thermal resistance in the entire thermal resistance verification process can be realized through the transfer mechanism, the rapid transfer of the thermal resistance can be realized, and the target thermal resistance can be transferred during the temperature field switching process. Cleaning in the cleaning tank is conducive to the realization of efficient and reliable thermal resistance verification, and is conducive to improving the thermal resistance verification efficiency.

在可选的实施方式中,所述第一旋转臂包括旋转连接盘、主臂以及副臂;所述主臂安装于所述旋转连接盘上;所述副臂安装于所述主臂上;所述第一放置架安装于所述副臂上;所述主臂,用于围绕所述旋转连接盘转动;所述副臂,用于在所述主臂的延伸方向上进行往返移动,以使所述第一放置架能够将所述目标热电阻带动到指定位置,所述指定位置包括所述第一恒温槽、所述第二恒温槽和所述清洗槽的上方。In an optional embodiment, the first rotating arm includes a rotating connecting plate, a main arm and a sub-arm; the main arm is mounted on the rotating connecting plate; the sub-arm is mounted on the main arm; The first placement rack is mounted on the auxiliary arm; the main arm is used for rotating around the rotating connecting plate; the auxiliary arm is used for reciprocating movement in the extension direction of the main arm to The first placing rack can drive the target thermal resistance to a designated position, and the designated position includes the upper part of the first constant temperature bath, the second constant temperature bath and the cleaning bath.

通过上述实现方式,基于主臂、副臂的配合可以将第一放置架上的目标热电阻移动至指定位置,可以在热电阻检定过程中实现对于目标热电阻的快速转移。Through the above implementation manner, based on the cooperation of the main arm and the auxiliary arm, the target thermal resistance on the first placement frame can be moved to a designated position, and the rapid transfer of the target thermal resistance can be realized during the thermal resistance verification process.

在可选的实施方式中,所述副臂上设置有吹扫气接口和连接孔,所述第一放置架上设置有中空连接柱和热电阻放置孔;所述第一放置架通过所述中空连接柱插入至所述连接孔,以将所述第一放置架和所述副臂连接;所述热电阻放置孔用于安装所述目标热电阻;所述转移机构用于将外部气源引入所述吹扫气接口、所述连接孔、所述中空连接柱和所述热电阻放置孔形成的气道,以通过气流对所述热电阻放置孔中的所述目标热电阻进行吹扫清洁。In an optional embodiment, the jib is provided with a purge gas interface and a connection hole, and the first placement rack is provided with a hollow connection column and a thermal resistance placement hole; the first placement rack passes through the The hollow connection column is inserted into the connection hole to connect the first placement frame and the auxiliary arm; the thermal resistance placement hole is used for installing the target thermal resistance; the transfer mechanism is used for the external air source Introduce the air channel formed by the purge gas interface, the connection hole, the hollow connection column and the thermal resistance placement hole, so as to purge the target thermal resistance in the thermal resistance placement hole by air flow clean.

通过上述实现方式,可以对目标热电阻进行吹扫清洁,有利于降低介质污染概率,有利于提升检定可靠性。Through the above implementation manner, the target thermal resistance can be purged and cleaned, which is beneficial to reduce the probability of medium contamination and to improve the reliability of verification.

在可选的实施方式中,所述副臂上设置有伸缩杆和旋转器;在所述旋转器的转动作用下,所述副臂能够转动至与所述主臂平行或垂直;所述伸缩杆用于以所述旋转器所在位置作为参照位置进行伸缩运动,所述副臂用于通过所述伸缩杆的伸缩运动带动所述第一放置架进行移动。In an optional embodiment, a telescopic rod and a rotator are arranged on the auxiliary arm; under the rotation of the rotator, the auxiliary arm can be rotated to be parallel or perpendicular to the main arm; The rod is used to perform telescopic motion with the position of the rotator as a reference position, and the auxiliary arm is used to drive the first placement rack to move through the telescopic motion of the telescopic rod.

通过上述实现方式,安装在主臂上的副臂可以转动,并且可以伸缩,以此有利于实现对于目标热电阻的多方位转移需求,通过可以转动、伸缩的副臂可以避免在热电阻转移过程中出现碰撞冲突。Through the above-mentioned implementation manner, the jib mounted on the main arm can be rotated and can be extended and retracted, which is conducive to realizing the multi-directional transfer requirements for the target thermal resistance. Collision conflict occurs.

在可选的实施方式中,所述第一恒温槽与所述第二恒温槽是以不同的恒温介质提供温场的恒温槽;所述第一恒温槽与所述第二恒温槽上均设置有与所述第一放置架匹配的检定孔;所述第一放置架中安装的所述目标热电阻用于插入所述检定孔进行热电阻检定;所述第一恒温槽是恒温水槽,所述第二恒温槽是恒温油槽;或,所述第一恒温槽是恒温油槽,所述第二恒温槽是恒温水槽。In an optional embodiment, the first constant temperature bath and the second constant temperature bath are constant temperature baths that provide a temperature field with different constant temperature media; both the first constant temperature bath and the second constant temperature bath are provided with There is a verification hole matched with the first placement rack; the target thermal resistance installed in the first placement rack is used to insert the verification hole for thermal resistance verification; the first constant temperature tank is a constant temperature water tank, so The second constant temperature tank is a constant temperature oil tank; or, the first constant temperature tank is a constant temperature oil tank, and the second constant temperature tank is a constant temperature water tank.

在可选的实施方式中,所述转移机构还包括:第二升降台以及安装在所述第二升降台上的第二旋转台;所述第二旋转台上安装有第二旋转臂,所述第二旋转臂上安装有第二放置架,所述第二放置架用于安装热电阻;所述转移机构,还用于通过所述第二升降台、所述第二旋转台、所述第二旋转臂和所述第二放置架,将所述第二放置架中安装的目标热电阻转移至所述第一恒温槽、所述清洗槽或所述第二恒温槽,用以同时实现多个热电阻的温场切换与热电阻检定。In an optional embodiment, the transfer mechanism further includes: a second lifting platform and a second rotating platform mounted on the second lifting platform; a second rotating arm is mounted on the second rotating platform, so A second placement rack is installed on the second rotating arm, and the second placement rack is used for installing thermal resistance; the transfer mechanism is also used to pass the second lifting platform, the second rotating platform, the The second rotating arm and the second placing rack transfer the target thermal resistance installed in the second placing rack to the first constant temperature bath, the cleaning bath or the second constant temperature bath, so as to simultaneously realize Temperature field switching and thermal resistance verification of multiple thermal resistances.

通过上述实现方式,可以实现多个热电阻的温场切换与热电阻检定,可以提升检定效率。Through the above implementation manner, the temperature field switching of multiple thermal resistances and the thermal resistance verification can be realized, and the verification efficiency can be improved.

在可选的实施方式中,在所述第一旋转臂和所述第二旋转臂进行热电阻转移时,所述第一升降台与所述第二升降台的升降高度不同。In an optional embodiment, when the first rotating arm and the second rotating arm perform thermal resistance transfer, the lifting heights of the first lifting platform and the second lifting platform are different.

通过上述实现方式,有利于避免在热电阻转移过程中出现碰撞冲突。Through the above implementation manner, it is beneficial to avoid collision and conflict during the thermal resistance transfer process.

第二方面,本发明实施例提供一种热电阻检定方法,应用于前述第一方面所述的热电阻检定系统,所述热电阻检定系统包括转移机构,所述方法包括:In a second aspect, an embodiment of the present invention provides a thermal resistance verification method, which is applied to the thermal resistance verification system described in the first aspect. The thermal resistance verification system includes a transfer mechanism, and the method includes:

在所述转移机构中的第一放置架上被放入接线完成的目标热电阻时,控制所述转移机构中的第一升降台上升;When the target thermal resistance that has been wired is placed on the first placement rack in the transfer mechanism, control the first lift table in the transfer mechanism to rise;

在所述第一升降台上升至设定的第一高度时,控制所述转移机构中的第一旋转台和第一旋转臂进行配合移动,以通过所述第一旋转臂上安装的所述第一放置架将所述目标热电阻靠近所述第一恒温槽;When the first lifting platform rises to a set first height, the first rotating platform and the first rotating arm in the transfer mechanism are controlled to move in coordination, so as to pass the first rotating arm mounted on the first rotating arm. The first placing rack places the target thermal resistance close to the first thermostatic bath;

通过所述转移机构将所述目标热电阻插入所述第一恒温槽进行热电阻检定;Insert the target thermal resistance into the first thermostatic bath through the transfer mechanism to perform thermal resistance verification;

在确定所述目标热电阻完成所述第一恒温槽中的热电阻检定过程时,通过所述转移机构带动所述目标热电阻移动,以使所述目标热电阻从所述第一恒温槽处转移至清洗槽处进行清洗;When it is determined that the target thermal resistance has completed the thermal resistance verification process in the first constant temperature bath, the transfer mechanism drives the target thermal resistance to move, so that the target thermal resistance is moved from the first constant temperature bath. Transfer to the cleaning tank for cleaning;

在确定所述目标热电阻清洗结束时,通过所述转移机构带动所述目标热电阻移动,以使所述目标热电阻从所述清洗槽处转移至所述第二恒温槽进行热电阻检定。When it is determined that the cleaning of the target thermal resistance is completed, the transfer mechanism drives the target thermal resistance to move, so that the target thermal resistance is transferred from the cleaning tank to the second constant temperature tank for thermal resistance verification.

通过上述方法,可以实现对于目标热电阻的高效检定,通过转移机构可以快速实现目标热电阻在整个热电阻检定过程中的温场切换,可实现热电阻的快速转移,并且可以在温场切换过程中将目标热电阻转移至清洗槽进行清洗,有利于实现高效可靠的热电阻检定,有利于提升热电阻检定效率。Through the above method, the high-efficiency verification of the target thermal resistance can be achieved, and the temperature field switching of the target thermal resistance in the entire thermal resistance verification process can be quickly realized through the transfer mechanism, and the rapid transfer of the thermal resistance can be realized. Transfer the target thermal resistance to the cleaning tank for cleaning, which is conducive to the realization of efficient and reliable thermal resistance verification, and is conducive to improving the thermal resistance verification efficiency.

在可选的实施方式中,所述第一旋转臂包括主臂和副臂,控制所述转移机构中的第一旋转台和第一旋转臂进行配合移动,以通过所述第一旋转臂上安装的第一放置架将所述目标热电阻靠近所述第一恒温槽的实现过程,包括:In an optional embodiment, the first rotating arm includes a main arm and a secondary arm, and the first rotating table and the first rotating arm in the transfer mechanism are controlled to move cooperatively, so as to pass the first rotating arm on the first rotating arm. The realization process of placing the target thermal resistance close to the first thermostatic bath by the installed first placing rack includes:

控制所述副臂转动至与所述主臂平行;controlling the auxiliary arm to rotate to be parallel with the main arm;

通过所述第一旋转台带动所述主臂转动,以及控制所述副臂沿着所述主臂的延伸方向移动,以使所述副臂的转动中心移动至所述第一恒温槽上方;The main arm is driven to rotate by the first rotary table, and the auxiliary arm is controlled to move along the extension direction of the main arm, so that the rotation center of the auxiliary arm is moved above the first thermostatic bath;

控制所述副臂转动,以使所述副臂上安装的所述第一放置架移动至所述第一恒温槽上方,并且所述第一放置架上安装的所述目标热电阻与所述第一恒温槽上设置的检定孔处于同一轴线上。Controlling the rotation of the jib, so that the first placing frame installed on the jib moves to the top of the first thermostatic bath, and the target thermal resistance installed on the first placing frame is connected to the The verification holes set on the first constant temperature bath are on the same axis.

通过上述实现方式,可以快速将第一放置架上安装的目标热电阻移动至与第一恒温槽匹配的位置,有利于快速实现该热电阻在第一恒温槽处的热电阻检定过程。Through the above implementation manner, the target thermal resistance installed on the first placement rack can be quickly moved to a position matching the first thermostatic bath, which is beneficial to quickly realize the thermal resistance verification process of the thermal resistance at the first constant temperature bath.

在可选的实施方式中,所述副臂包括伸缩杆,所述通过所述转移机构将所述目标热电阻插入所述第一恒温槽进行热电阻检定,包括:In an optional embodiment, the auxiliary arm includes a telescopic rod, and the target thermal resistance is inserted into the first constant temperature tank by the transfer mechanism to perform thermal resistance verification, including:

在所述第一放置架上安装的所述目标热电阻与所述第一恒温槽上设置的检定孔处于同一轴线时,控制所述第一升降台下降和/或控制所述伸缩杆移动,以使所述第一放置架靠近所述第一恒温槽,并将所述目标热电阻插入至所述第一恒温槽中的指定深度;When the target thermal resistance installed on the first placement rack and the verification hole set on the first constant temperature bath are on the same axis, the first lifting platform is controlled to descend and/or the telescopic rod is controlled to move, so that the first placement rack is close to the first thermostatic bath, and the target thermal resistance is inserted into the first thermostatic bath to a specified depth;

通过所述热电阻检定系统中的控温装置将所述第一恒温槽的温度控制在设定的检定温度;The temperature of the first constant temperature bath is controlled at the set verification temperature by the temperature control device in the thermal resistance verification system;

在检测到所述目标热电阻达到热平衡后,控制所述伸缩杆移动,以将所述目标热电阻朝向所述第一恒温槽继续伸入指定距离,并在所述目标热电阻再次达到热平衡时,读取得到所述目标热电阻在所述第一恒温槽中进行热电阻检定的检定结果。After it is detected that the target thermal resistance reaches thermal equilibrium, the telescopic rod is controlled to move so as to extend the target thermal resistance towards the first constant temperature bath for a specified distance, and when the target thermal resistance reaches thermal equilibrium again , and read to obtain the verification result of the thermal resistance verification of the target thermal resistance in the first constant temperature bath.

通过上述实现方式,有利于快速完成第一放置架上的目标热电阻在第一恒温槽处的热电阻检定过程,可提升检测精确度。Through the above implementation manner, it is beneficial to quickly complete the thermal resistance verification process of the target thermal resistance on the first placing rack at the first constant temperature bath, and the detection accuracy can be improved.

在可选的实施方式中,所述方法还包括:In an optional embodiment, the method further includes:

在读取得到所述目标热电阻在所述第一恒温槽中进行热电阻检定的检定结果时,确定所述目标热电阻完成所述第一恒温槽中的热电阻检定过程;When the verification result of the thermal resistance verification performed by the target thermal resistance in the first constant temperature bath is obtained, it is determined that the target thermal resistance has completed the thermal resistance verification process in the first constant temperature bath;

所述在确定所述目标热电阻完成所述第一恒温槽中的热电阻检定过程时,通过所述转移机构带动所述目标热电阻移动,以使所述目标热电阻从所述第一恒温槽处转移至清洗槽处进行清洗,包括:When it is determined that the target thermal resistance has completed the thermal resistance verification process in the first constant temperature bath, the target thermal resistance is driven to move by the transfer mechanism, so that the target thermal resistance is changed from the first constant temperature The tank is transferred to the cleaning tank for cleaning, including:

控制所述第一升降台和/或所述伸缩杆移动,以使所述目标热电阻远离所述第一恒温槽;controlling the movement of the first lifting platform and/or the telescopic rod, so as to keep the target thermal resistance away from the first constant temperature bath;

控制所述副臂转动至与所述主臂平行,并控制所述主臂转动至所述清洗槽上方,以使所述目标热电阻靠近所述清洗槽;Controlling the auxiliary arm to rotate to be parallel with the main arm, and controlling the main arm to rotate above the cleaning tank, so that the target thermal resistance is close to the cleaning tank;

控制所述第一升降台和/或所述伸缩杆移动,以使所述目标热电阻进入所述清洗槽;controlling the movement of the first lifting platform and/or the telescopic rod, so that the target thermal resistance enters the cleaning tank;

控制所述清洗槽对所述目标热电阻进行清洗。The cleaning tank is controlled to clean the target thermal resistance.

通过上述实现方式,可以在第一放置架上的目标热电阻完成第一恒温槽处的热电阻检定过程时,快速对该目标热电阻进行清洗,可降低介质污染对于检定过程的影响。Through the above implementation manner, when the target thermal resistance on the first placement rack completes the thermal resistance verification process at the first constant temperature tank, the target thermal resistance can be quickly cleaned, which can reduce the influence of medium pollution on the verification process.

在可选的实施方式中,所述第一旋转臂上设置有吹扫气接口和连接孔,所述第一放置架上设置有中空连接柱和热电阻放置孔,所述第一放置架和所述第一旋转臂之间通过所述中空连接柱和所述连接孔进行连接,所述方法还包括:In an optional embodiment, the first rotating arm is provided with a purge gas interface and a connection hole, the first placement rack is provided with a hollow connection column and a thermal resistance placement hole, and the first placement rack and The first rotating arms are connected through the hollow connecting column and the connecting hole, and the method further includes:

在确定所述目标热电阻清洗结束时,通过所述吹扫气接口、所述连接孔、所述中空连接柱和所述热电阻放置孔形成的气道,对所述热电阻放置孔中的所述目标热电阻进行吹扫清洁。When it is determined that the cleaning of the target thermal resistance is completed, through the air channel formed by the purge gas interface, the connecting hole, the hollow connecting column and the thermal resistance placing hole, the air passages in the thermal resistance placing hole are cleaned. The target thermal resistance is purged and cleaned.

通过上述实现方式,可降低介质污染概率。Through the above implementation manner, the probability of medium contamination can be reduced.

在可选的实施方式中,所述转移机构还包括:第二升降台、第二旋转台、第二旋转臂和第二放置架,所述第二旋转台安装在所述第二升降台上,所述第二旋转臂安装在所述第二旋转台上,所述第二放置架安装在所述第二旋转台上,所述方法还包括:In an optional embodiment, the transfer mechanism further includes: a second lifting platform, a second rotating platform, a second rotating arm and a second placing rack, the second rotating platform being mounted on the second lifting platform , the second rotating arm is mounted on the second rotating table, the second placing frame is mounted on the second rotating table, and the method further includes:

在所述第二放置架上被放入接线完成的目标热电阻时,控制所述第二升降台上升;When the target thermal resistance that has been wired is placed on the second placing rack, the second lifting platform is controlled to rise;

在所述第二升降台上升至设定的第二高度时,控制所述第二旋转台和第二旋转臂进行配合移动,以通过所述第二旋转臂上安装的所述第二放置架将目标热电阻转移至所述第二恒温槽处;When the second lifting platform rises to a set second height, the second rotating platform and the second rotating arm are controlled to move in coordination, so as to pass the second placing frame installed on the second rotating arm transferring the target thermal resistance to the second thermostatic bath;

对所述第二放置架中安装的目标热电阻进行热电阻检定;Carry out thermal resistance verification on the target thermal resistance installed in the second placing rack;

在确定所述第二放置架中的目标热电阻完成在所述第二恒温槽处的热电阻检定过程时,通过所述第二升降台、所述第二旋转台、所述第二旋转臂和所述第二放置架进行配合移动,以将所述第二放置架中安装的目标热电阻从所述第二恒温槽处转移至所述清洗槽处进行清洗;When it is determined that the target thermal resistance in the second placing rack completes the thermal resistance verification process at the second constant temperature bath, the second lifting platform, the second rotating platform, and the second rotating arm are used Move in coordination with the second placing rack to transfer the target thermal resistance installed in the second placing rack from the second constant temperature bath to the cleaning bath for cleaning;

在确定所述第二放置架中的目标热电阻完成清洗过程时,通过所述第二升降台、所述第二旋转台、所述第二旋转臂和所述第二放置架进行配合移动,以将所述第二放置架中安装的目标热电阻从所述清洗槽处转移至所述第一恒温槽处进行热电阻检定。When it is determined that the target thermal resistance in the second placing rack has completed the cleaning process, the second lifting table, the second rotating table, the second rotating arm and the second placing rack are used for coordinated movement, The thermal resistance test is performed by transferring the target thermal resistance installed in the second placing rack from the cleaning tank to the first constant temperature tank.

通过上述实现方式,有利于通过与第一旋转臂、第二旋转臂关联的结构实现对于不同热电阻的同时检定,有利于提升检定效率。Through the above implementation manner, it is beneficial to realize the simultaneous verification of different thermal resistances through the structure associated with the first rotating arm and the second rotating arm, and is beneficial to improve the verification efficiency.

附图说明Description of drawings

为了更清楚地说明本申请实施例的技术方案,下面将对本申请实施例中所需要使用的附图作简单地介绍,应当理解,以下附图仅示出了本申请的某些实施例,因此不应被看作是对范围的限定,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他相关的附图。In order to explain the technical solutions of the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, therefore It should not be regarded as a limitation of the scope. For those of ordinary skill in the art, other related drawings can also be obtained from these drawings without any creative effort.

图1为本申请实施例提供的一种热电阻检定系统的示意图。FIG. 1 is a schematic diagram of a thermal resistance verification system provided by an embodiment of the present application.

图2为本申请实施例提供的一种转移机构的示意图。FIG. 2 is a schematic diagram of a transfer mechanism according to an embodiment of the present application.

图3为本申请实施例提供的一个实例中的热电阻放置架的示意图。FIG. 3 is a schematic diagram of a thermal resistance placing rack in an example provided by an embodiment of the present application.

图4为本申请实施例提供的一个实例中的第一升降台的示意图。FIG. 4 is a schematic diagram of a first lifting platform in an example provided by an embodiment of the present application.

图5为本申请实施例提供的一个实例中的第一旋转台的示意图。FIG. 5 is a schematic diagram of a first rotary table in an example provided by an embodiment of the present application.

图6为本申请实施例提供的一个实例中的第一旋转臂的示意图。FIG. 6 is a schematic diagram of a first rotating arm in an example provided by an embodiment of the present application.

图7为本申请实施例提供的一个实例中的第一恒温槽的示意图。FIG. 7 is a schematic diagram of a first constant temperature bath in an example provided by the embodiments of the present application.

图8为本申请实施例提供的一个实例中的清洗槽的示意图。FIG. 8 is a schematic diagram of a cleaning tank in an example provided by the embodiments of the present application.

图9为本申请实施例提供的一种热电阻检定方法的流程图。FIG. 9 is a flowchart of a thermal resistance verification method provided by an embodiment of the present application.

图10为本申请实施例提供的一种热电阻检定方法的部分流程图。FIG. 10 is a partial flowchart of a thermal resistance verification method provided by an embodiment of the present application.

附图标记:100-转移机构;200-第一恒温槽;300-第二恒温槽;400-清洗槽;500-工作台;A-第一执行装置;B-第二执行装置;110a-第一升降台;110b-第二升降台;120a-第一旋转台;120b-第二旋转台;130a-第一旋转臂;130b-第二旋转臂;140-热电阻放置架;111-底座;112-外壳;113-升降柱;114-升降连接盘;121-支座;122-旋转盘;131-旋转连接盘;132-主臂;133-副臂;201-槽体;202-检定孔;203-控温装置;401-壳体;402-清洗容器。Reference numerals: 100-transfer mechanism; 200-first thermostatic bath; 300-second thermostatic bath; 400-cleaning bath; 500-table; A-first actuator; B-second actuator; 110a-th A lifting platform; 110b-second lifting platform; 120a-first rotating platform; 120b-second rotating platform; 130a-first rotating arm; 130b-second rotating arm; 140-thermal resistance placing frame; 111-base; 112-shell; 113-lifting column; 114-lifting connection plate; 121-support; 122-rotating plate; 131-rotating connection plate; 132-main arm; 133-auxiliary arm; 201-trough body; ; 203 - temperature control device; 401 - shell; 402 - cleaning container.

具体实施方式Detailed ways

下面将结合本申请实施例中的附图,对本申请实施例中的技术方案进行描述。The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application.

在现有的检定过程中,如果要实现待检的热电阻在不同温场下的热电阻检定,需要将待检的热电阻在恒温水槽和恒温油槽这两个恒温槽之间进行切换检定。在切换前,需要先拆去热电阻的连接线,然后对热电阻进行必要的清洗,在清洗结束后,将热电阻拿到下一个检定的恒温槽处并重新对热电阻进行接线连接,然后再对接线完成的热电阻进行检定。涉及温场切换、清洗、切换后的接线这些操作时,操作过程依赖于人工实现,因此处理效率较低。In the existing verification process, if the thermal resistance verification of the thermal resistance to be tested under different temperature fields is to be realized, the thermal resistance to be tested needs to be switched between two constant temperature baths, namely, a constant temperature water tank and a constant temperature oil tank. Before switching, it is necessary to remove the connecting wire of the thermal resistance, and then carry out necessary cleaning of the thermal resistance. After cleaning, take the thermal resistance to the next calibration constant temperature bath and reconnect the thermal resistance, and then Then verify the thermal resistance after the wiring is completed. When it comes to operations such as temperature field switching, cleaning, and wiring after switching, the operation process relies on manual implementation, so the processing efficiency is low.

有鉴于此,发明人提出以下实施例予以改善,通过本申请实施例提供的热电阻检定系统和方法,可以实现对于热电阻的高效、精确检定,能够快速实现温场切换,快速实现热电阻转移,整个转移切换过程可实现自动化处理,减少人为干预环节,在对热电阻进行检定、转移时,无需重复进行接线、拆线。在热电阻检定系统包括第一旋转臂和第二旋转臂的情况下,有利于实现对多个热电阻的同时检定。In view of this, the inventor proposes the following embodiments for improvement. Through the thermal resistance verification system and method provided in the embodiments of the present application, efficient and accurate verification of thermal resistance can be realized, temperature field switching can be quickly realized, and thermal resistance transfer can be quickly realized. , The entire transfer and switching process can be automated, reducing human intervention, and there is no need to repeat wiring and disconnection when verifying and transferring the thermal resistance. In the case that the thermal resistance verification system includes the first rotating arm and the second rotating arm, it is advantageous to realize the simultaneous verification of multiple thermal resistances.

请参阅图1,图1为本申请实施例提供的一种热电阻检定系统的示意图。Please refer to FIG. 1 , which is a schematic diagram of a thermal resistance verification system provided by an embodiment of the present application.

如图1所示,该热电阻检定系统包括:转移机构100、第一恒温槽200、第二恒温槽300以及清洗槽400。As shown in FIG. 1 , the thermal resistance verification system includes: a transfer mechanism 100 , a first constant temperature bath 200 , a second constant temperature bath 300 and a cleaning bath 400 .

第一恒温槽200与第二恒温槽300用于提供热电阻检定所需的恒定温场(例如0摄氏度和100摄氏度的温场)。The first constant temperature bath 200 and the second constant temperature bath 300 are used to provide a constant temperature field (eg, a temperature field of 0 degrees Celsius and 100 degrees Celsius) required for thermal resistance verification.

本申请实施例中,第一恒温槽200与第二恒温槽300是以不同的恒温介质提供温场的恒温槽。例如,第一恒温槽200是恒温水槽,第二恒温槽300是恒温油槽,或,第一恒温槽200是恒温油槽,第二恒温槽300是恒温水槽。In the embodiment of the present application, the first constant temperature bath 200 and the second constant temperature bath 300 are constant temperature baths that provide a temperature field with different constant temperature media. For example, the first constant temperature tank 200 is a constant temperature water tank and the second constant temperature tank 300 is a constant temperature oil tank, or the first constant temperature tank 200 is a constant temperature oil tank and the second constant temperature tank 300 is a constant temperature water tank.

在本申请实施例中,该转移机构100可以包括两套执行装置,该两套执行装置可分别记为第一执行装置A和第二执行装置B。该两套执行装置的结构类似,工作原理相同,在后续描述中,将以第一执行装置为例进行介绍。In this embodiment of the present application, the transfer mechanism 100 may include two sets of execution devices, and the two sets of execution devices may be denoted as a first execution device A and a second execution device B, respectively. The two sets of execution devices have similar structures and the same working principles. In the subsequent description, the first execution device will be used as an example for introduction.

在本申请实施例中,所有热电阻可以在工作台500处进行接线、拆线,转移机构100可将完成接线的目标热电阻通过第一执行装置或第二执行装置进行热电阻转移,第一执行装置、第二执行装置均可单独完成对于一组待检热电阻在整个热电阻检定过程中的转移过程。在采用转移机构100进行热电阻转移的过程中,无需在恒温槽、清洗槽400处对目标热电阻进行接线、拆线。In the embodiment of the present application, all the thermal resistances can be wired and disconnected at the workbench 500, and the transfer mechanism 100 can transfer the thermal resistance of the target thermal resistance that has been wired through the first execution device or the second execution device. Both the executing device and the second executing device can independently complete the transfer process for a group of thermal resistances to be tested in the entire thermal resistance verification process. In the process of using the transfer mechanism 100 to transfer the thermal resistance, it is not necessary to wire and disconnect the target thermal resistance at the constant temperature bath and the cleaning bath 400 .

当两套执行装置同时工作时,可对多组待检热电阻进行同时检定,例如,在第一执行装置将一组热电阻移动至第一恒温槽200处进行检定时,第二执行装置可将另一组热电阻移动至第二恒温槽300处进行检定,两套执行装置可分别独立工作,实现双槽双控(群控)检定。When two sets of actuators work at the same time, multiple sets of thermal resistances to be tested can be tested simultaneously. For example, when the first actuator moves a set of thermal resistances to the first thermostatic bath 200 for verification, the second actuator can Move the other group of thermal resistances to the second constant temperature tank 300 for verification, and the two sets of execution devices can work independently to realize the verification of dual tanks and dual controls (group control).

如图2所示,该转移机构100中的第一执行装置可包括:第一升降台110a、第一旋转台120a、第一旋转臂130a和第一放置架。与第一执行装置类似,该转移机构100中的第二执行装置可包括第二升降台110b、第二旋转台120b、第二旋转臂130b和第二放置架。As shown in FIG. 2 , the first execution device in the transfer mechanism 100 may include: a first lifting platform 110a, a first rotating platform 120a, a first rotating arm 130a and a first placing frame. Similar to the first executing device, the second executing device in the transfer mechanism 100 may include a second lifting platform 110b, a second rotating platform 120b, a second rotating arm 130b and a second placing frame.

第一放置架和第二放置架均为热电阻放置架140(如图3所示),均可用于安装或放置目标热电阻。Both the first placement rack and the second placement rack are thermal resistance placement racks 140 (as shown in FIG. 3 ), both of which can be used to install or place a target thermal resistor.

第一执行装置、第二执行装置均可用于对目标热电阻进行转移,实现温场切换。在本申请实施例中,安装、放置在热电阻放置架140上的热电阻是已经完成接线的热电阻。Both the first execution device and the second execution device can be used to transfer the target thermal resistance to realize temperature field switching. In the embodiment of the present application, the thermal resistance installed and placed on the thermal resistance placing rack 140 is the thermal resistance that has been wired.

目标热电阻可以是一组热电阻,目标热电阻可包括标准热电阻和待检热电阻。The target thermal resistance can be a group of thermal resistances, and the target thermal resistance can include standard thermal resistances and to-be-detected thermal resistances.

在具体应用中,热电阻检定系统还可以包括测量系统,测量系统可包括计算机、扫描开关、控温装置203等与数据采集、数据处理有关的设备,控温装置203用于调控各个恒温槽的温度。扫描开关可以在检定过程中对与标准热电阻和待检热电阻有关的多路数据进行采集和转发,还可通过专用的测量仪表和通讯接口,将检定过程中得到的数据发送给计算机,以供计算机对这些数据进行处理和分析。在本申请中将不对具体的测量系统进行限定。In a specific application, the thermal resistance verification system may also include a measurement system. The measurement system may include a computer, a scanning switch, a temperature control device 203 and other equipment related to data acquisition and data processing. The temperature control device 203 is used to regulate the temperature. The scanning switch can collect and forward the multi-channel data related to the standard thermal resistance and the thermal resistance to be tested during the verification process, and can also send the data obtained in the verification process to the computer through the special measuring instrument and communication interface to For computer processing and analysis of these data. A specific measurement system will not be limited in this application.

下面将以转移机构100中的第一执行装置为例对热电阻检定系统进行详细介绍。The thermal resistance verification system will be described in detail below by taking the first execution device in the transfer mechanism 100 as an example.

如图2所示,该第一旋转台120a安装在第一升降台110a上。第一旋转臂130a安装在第一旋转台120a上。第一放置架安装在第一旋转臂130a上。As shown in FIG. 2 , the first rotating table 120a is installed on the first lifting table 110a. The first rotating arm 130a is mounted on the first rotating table 120a. The first placing frame is mounted on the first rotating arm 130a.

该转移机构100,用于通过第一升降台110a、第一旋转台120a和第一旋转臂130a,将第一放置架中安装的目标热电阻插入至第一恒温槽200进行热电阻检定。The transfer mechanism 100 is used for inserting the target thermal resistance installed in the first placing rack into the first constant temperature bath 200 through the first lifting table 110a, the first rotating table 120a and the first rotating arm 130a for thermal resistance verification.

该转移机构100还用于:在目标热电阻完成第一恒温槽200中的热电阻检定过程时,将目标热电阻从第一恒温槽200处转移至清洗槽400进行清洗。The transfer mechanism 100 is also used for transferring the target thermal resistance from the first constant temperature tank 200 to the cleaning tank 400 for cleaning when the target thermal resistance completes the thermal resistance verification process in the first constant temperature tank 200 .

该转移机构100还用于:在目标热电阻清洗结束时,将目标热电阻从清洗槽400处转移至第二恒温槽300进行热电阻检定。The transfer mechanism 100 is also used for: when the cleaning of the target thermal resistance is completed, the target thermal resistance is transferred from the cleaning tank 400 to the second constant temperature tank 300 for thermal resistance verification.

通过上述的热电阻检定系统,可以通过转移机构100实现目标热电阻在整个热电阻检定过程中的温场切换,可实现热电阻的快速转移,并且可以在温场切换过程中将目标热电阻转移至清洗槽400进行清洗,有利于实现高效可靠的热电阻检定,有利于提升热电阻检定效率。Through the above thermal resistance verification system, the temperature field switching of the target thermal resistance in the whole thermal resistance verification process can be realized through the transfer mechanism 100, the rapid transfer of the thermal resistance can be realized, and the target thermal resistance can be transferred during the temperature field switching process. Cleaning in the cleaning tank 400 is conducive to realizing efficient and reliable thermal resistance verification, and is conducive to improving the thermal resistance verification efficiency.

如图4所示,第一升降台110a可包括:底座111、外壳112、升降柱113、升降连接盘114和升降控制器(图未示)。As shown in FIG. 4 , the first lifting platform 110a may include: a base 111 , a housing 112 , a lifting column 113 , a lifting connecting plate 114 and a lifting controller (not shown).

通过底座111可将第一升降台110a固定在指定平面上(例如地面上)。通过外壳112可以对升降柱113进行包裹保护。通过升降控制器可以控制第一升降台110a的升降高度,即,可以改变第一升降台110a的承载面的位置。The first lifting platform 110a can be fixed on a designated plane (eg, on the ground) through the base 111 . The lifting column 113 can be wrapped and protected by the casing 112 . The lifting height of the first lifting platform 110a can be controlled by the lifting controller, that is, the position of the bearing surface of the first lifting platform 110a can be changed.

升降连接盘114设置在升降柱113顶端,用于安装第一旋转台120a。The lift connecting plate 114 is arranged at the top of the lift column 113 and is used for installing the first rotary table 120a.

第二升降台110b与第一升降台110a结构类似,区别仅在于:在进行热电阻转移时,第二升降台110b可以具有与第一升降台110a不同的升降高度。The structure of the second lifting platform 110b is similar to that of the first lifting platform 110a, and the only difference is that when the thermal resistance is transferred, the second lifting platform 110b may have a different lifting height from that of the first lifting platform 110a.

在一个实例中,第一升降台110a的最大上升位置和第二升降台110b的最大上升位置在不同的水平面上,第一升降台110a的最低承载面和第二升级台的最低承载面可以在不同水平面上。可以理解的是,除了通过设备本身的设置高度来限制升降高度以外,还可以通过相应的升降控制器对升降台的升降高度进行设置。In one example, the maximum lifting position of the first lifting platform 110a and the maximum lifting position of the second lifting platform 110b are on different horizontal planes, and the lowest bearing surface of the first lifting platform 110a and the lowest bearing surface of the second lifting platform may be at different levels. on different levels. It can be understood that, in addition to limiting the lifting height by the setting height of the device itself, the lifting height of the lifting platform can also be set by a corresponding lifting controller.

如图5所示,第一旋转台120a可包括:旋转盘122、旋转控制器(图未示)和支座121。第二旋转台120b的结构与第一旋转台120a相同。As shown in FIG. 5 , the first rotary table 120 a may include: a rotary disk 122 , a rotary controller (not shown) and a support 121 . The structure of the second rotary table 120b is the same as that of the first rotary table 120a.

其中,第一旋转台120a可通过支座121与第一升降台110a中的升降连接盘114连接,以此实现第一旋转台120a和第一升降台110a之间的连接。第一旋转台120a可通过旋转盘122与第一旋转臂130a连接。通过旋转控制器可控制该第一旋转台120a转动,以此可带动第一旋转台120a上的第一旋转臂130a围绕该第一旋转台120a进行转动。Wherein, the first rotating table 120a can be connected with the lifting connecting plate 114 in the first lifting table 110a through the support 121, so as to realize the connection between the first rotating table 120a and the first lifting table 110a. The first rotating table 120a may be connected with the first rotating arm 130a through the rotating disk 122 . The rotation of the first rotating table 120a can be controlled by the rotation controller, thereby driving the first rotating arm 130a on the first rotating table 120a to rotate around the first rotating table 120a.

如图6所示第一旋转臂130a可包括:旋转连接盘131、主臂132以及副臂133。第二旋转臂130b的结构与第一旋转臂130a相同。As shown in FIG. 6 , the first rotating arm 130 a may include: a rotating connecting plate 131 , a main arm 132 and a sub-arm 133 . The structure of the second rotating arm 130b is the same as that of the first rotating arm 130a.

其中,第一旋转臂130a的旋转连接盘131安装于第一旋转台120a上。该旋转连接盘131与第一旋转台120a中的旋转盘122连接。Wherein, the rotating connection plate 131 of the first rotating arm 130a is mounted on the first rotating table 120a. The rotary connection disk 131 is connected to the rotary disk 122 in the first rotary table 120a.

主臂132安装于该旋转连接盘131上。副臂133安装于主臂132上。第一放置架安装于该副臂133上。The main arm 132 is mounted on the rotating connection plate 131 . The auxiliary arm 133 is mounted on the main arm 132 . The first placement frame is mounted on the auxiliary arm 133 .

其中,该主臂132用于围绕该旋转连接盘131转动。Wherein, the main arm 132 is used to rotate around the rotating connection plate 131 .

该副臂133用于在该主臂132的延伸方向上进行往返移动,以使第一放置架能够将目标热电阻带动到指定位置。指定位置可包括第一恒温槽200、第二恒温槽300和清洗槽400的上方。The auxiliary arm 133 is used for reciprocating movement in the extending direction of the main arm 132 , so that the first placing frame can drive the target thermal resistance to a designated position. The designated position may include above the first constant temperature bath 200 , the second constant temperature bath 300 and the cleaning bath 400 .

基于上述主臂132、副臂133之间的配合可以将热电阻放置架140上的目标热电阻移动至指定位置,可以在热电阻检定过程中实现对于目标热电阻的快速转移。Based on the cooperation between the main arm 132 and the auxiliary arm 133, the target thermal resistance on the thermal resistance placing frame 140 can be moved to a specified position, and the rapid transfer of the target thermal resistance can be realized during the thermal resistance verification process.

在本申请实施例中,副臂133上设置有伸缩杆和旋转器。In the embodiment of the present application, the auxiliary arm 133 is provided with a telescopic rod and a rotator.

该旋转器所在的位置可作为副臂133的旋转中心,该旋转器可沿着主臂132的延伸方向进行往返移动。该旋转器可以转动。The position of the rotator can be used as the rotation center of the auxiliary arm 133 , and the rotator can move back and forth along the extension direction of the main arm 132 . The spinner can be turned.

在该旋转器的转动作用下,副臂133能够进行转动,例如副臂133可以转动至与主臂132平行或垂直,可以理解的是,除了0度与90度以外,副臂133与主臂132之间的夹角还可以是其他角度。Under the rotating action of the rotator, the auxiliary arm 133 can be rotated. For example, the auxiliary arm 133 can be rotated to be parallel or perpendicular to the main arm 132. It can be understood that, except for 0 degrees and 90 degrees, the auxiliary arm 133 and the main arm The included angle between 132 may also be other angles.

伸缩杆用于以旋转器所在位置作为参照位置进行伸缩运动,副臂133用于通过伸缩杆的伸缩运动带动热电阻放置架140(例如第一放置架)进行移动。The telescopic rod is used to perform telescopic motion with the position of the rotator as a reference position, and the auxiliary arm 133 is used to drive the thermal resistance placing rack 140 (eg, the first placing rack) to move through the telescopic motion of the telescopic rod.

作为一种实现方式,伸缩杆可以从旋转器中伸出或缩进旋转器,通过伸缩杆的伸出或缩进改变目标热电阻的位置。As an implementation manner, the telescopic rod can be extended or retracted from the rotator, and the position of the target thermal resistance can be changed through the extension or retraction of the telescopic rod.

作为另一种实现方式,伸缩杆可以穿过旋转器以靠近或远离恒温槽的方向移动,以此实现伸缩运动,从而带动目标热电阻发生位置变化,在该实现方式下,伸缩杆的固有长度可以保持不变。As another implementation, the telescopic rod can be moved through the rotator in the direction of approaching or away from the thermostatic bath, so as to realize the telescopic movement, thereby driving the position of the target thermal resistance to change. In this implementation, the inherent length of the telescopic rod can remain unchanged.

基于上述实现方式,安装在主臂132上的副臂133可以转动,并且可以伸缩,以此有利于实现对于目标热电阻的多方位转移需求,通过可以转动、伸缩的副臂133可以避免在热电阻转移过程中出现碰撞冲突。Based on the above implementation manner, the auxiliary arm 133 installed on the main arm 132 can be rotated and can be extended and retracted, so as to facilitate the realization of the multi-directional transfer requirements for the target thermal resistance. Collision conflict occurs during resistance transfer.

可选地,可以为副臂133设置专用于对副臂133进行运动控制的控制器,用于控制副臂133在主臂132上的运动状态,还用于控制副臂133的转动、伸缩杆的运动。Optionally, a controller dedicated to controlling the movement of the auxiliary arm 133 may be provided for the auxiliary arm 133 to control the movement state of the auxiliary arm 133 on the main arm 132 , and also to control the rotation of the auxiliary arm 133 and the telescopic rod. exercise.

其中,副臂133上可设置吹扫气接口和连接孔。第一放置架上可设置中空连接柱和热电阻放置孔。中空连接柱的出气口可以与第一放置架上内设的热电阻放置孔连通。Wherein, a purge gas interface and a connection hole may be provided on the auxiliary arm 133 . The first placement rack may be provided with a hollow connecting column and a placement hole for the thermal resistance. The air outlet of the hollow connecting column can be communicated with the thermal resistance placement hole provided in the first placement rack.

热电阻放置孔用于安装目标热电阻。目标热电阻与热电阻放置孔之间可存在用于流过气流的间隙。The RTD placement holes are used to mount the target RTD. There may be a gap between the target RTD and the RTD placement hole for airflow to flow through.

第一放置架可通过中空连接柱插入至副臂133上的连接孔,以将第一放置架和副臂133连接。The first placing frame can be inserted into the connecting hole on the auxiliary arm 133 through the hollow connecting column, so as to connect the first placing frame and the auxiliary arm 133 .

转移机构100用于将外部气源引入该吹扫气接口、连接孔、中空连接柱和热电阻放置孔形成的气道,以通过气流对热电阻放置孔中的目标热电阻进行吹扫清洁。The transfer mechanism 100 is used to introduce an external air source into the air channel formed by the purge gas interface, the connection hole, the hollow connection column and the thermal resistance placement hole, so as to purge and clean the target thermal resistance in the thermal resistance placement hole by air flow.

基于上述实现方式,可以对目标热电阻进行吹扫清洁,有利于降低介质污染概率,有利于提升检定可靠性。Based on the above implementation manner, the target thermal resistance can be purged and cleaned, which is conducive to reducing the probability of medium pollution and improving the verification reliability.

在本申请实施例中,介质污染是指将不同的介质混入同一个恒温槽中。In the embodiments of the present application, media pollution refers to mixing different media into the same thermostatic bath.

可以理解的是,连接孔、中空连接柱的位置可以交换,即连接孔可以设置在第一放置架上,中空连接柱可设置在副臂133上。It can be understood that the positions of the connecting hole and the hollow connecting column can be exchanged, that is, the connecting hole can be arranged on the first placing frame, and the hollow connecting column can be arranged on the auxiliary arm 133 .

在本申请实施例中,每个热电阻放置架140(第一放置架、第二放置架)可包括:盘体以及设置在盘体上的多个热电阻放置孔。该多个热电阻放置孔包括第一放置孔和多个第二放置孔。该多个第二放置孔围绕第一放置孔设置。In the embodiment of the present application, each thermal resistance placement rack 140 (a first placement rack, a second placement rack) may include: a disk body and a plurality of thermal resistance placement holes provided on the disk body. The plurality of thermal resistance placement holes include a first placement hole and a plurality of second placement holes. The plurality of second placement holes are disposed around the first placement holes.

该第一放置孔用于安装作为标准热电阻的目标热电阻,该第二放置孔用于安装作为待检热电阻的目标热电阻。The first placement hole is used for installing the target thermal resistance as a standard thermal resistance, and the second placement hole is used for installing the target thermal resistance as the thermal resistance to be tested.

由于第二执行装置B与第一执行装置A除了升降高度方面的差异以外,其余结构和工作原理相同,因此第二执行装置B中与第二升降台110b、第二旋转台120b、第二旋转臂130b、第二放置架的内容可参考关于第一执行装置A的描述。Since the second actuator B and the first actuator A have the same structure and working principle except for the difference in lifting height, the second actuator B is the same as the second lifting platform 110b, the second rotary table 120b, the second rotary table For the content of the arm 130b and the second placing rack, reference may be made to the description about the first execution device A.

第二旋转台120b安装在第二升降台110b上,第二旋转臂130b安装在第二旋转台120b上,第二放置架安装在第二旋转臂130b上。The second rotating table 120b is mounted on the second lifting table 110b, the second rotating arm 130b is mounted on the second rotating table 120b, and the second placing frame is mounted on the second rotating arm 130b.

上述的转移机构100还用于:通过第二升降台110b、第二旋转台120b、第二旋转臂130b和第二放置架,将第二放置架中安装的目标热电阻转移至第一恒温槽200、清洗槽400或第二恒温槽300,用以同时实现多个热电阻的温场切换与热电阻检定。The above-mentioned transfer mechanism 100 is also used for: transferring the target thermal resistance installed in the second placing frame to the first constant temperature bath through the second lifting table 110b, the second rotating table 120b, the second rotating arm 130b and the second placing frame 200. The cleaning tank 400 or the second constant temperature tank 300 is used to simultaneously realize the temperature field switching and the thermal resistance verification of a plurality of thermal resistances.

其中,同时实现多个热电阻的温场切换与热电阻检定有两层含义。其中一层含义是指,在通过转移机构100进行热电阻转移时,可对同一个放置架上安装的一组(多个)热电阻进行同时检定、同时切换温场。其中一层含义是指,转移机构100可通过与第一旋转臂130a关联的第一执行装置A、与第二旋转臂130b关联的第二执行装置B同时对该两个旋转臂上的两组目标热电阻进行热电阻检定,即,同时实现对不同位置的多个热电阻进行温场切换。Among them, the simultaneous realization of the temperature field switching of multiple thermal resistances and the thermal resistance verification has two meanings. One of the meanings refers to that when the thermal resistance is transferred by the transfer mechanism 100, a group (multiple) of thermal resistances installed on the same placement rack can be checked simultaneously and the temperature field can be switched at the same time. One of its meanings means that the transfer mechanism 100 can simultaneously perform the two sets of the two rotating arms through the first actuator A associated with the first rotary arm 130a and the second actuator B associated with the second rotary arm 130b. The thermal resistance verification is performed on the target thermal resistance, that is, the temperature field switching of multiple thermal resistances in different positions is realized at the same time.

基于上述实现方式,可以实现多个热电阻的温场切换与热电阻检定,可以提升检定效率。Based on the above implementation manner, the temperature field switching of multiple thermal resistances and the thermal resistance verification can be realized, and the verification efficiency can be improved.

作为一种实现方式,在同时采用第一旋转臂130a和第二旋转臂130b进行热电阻转移时,第一升降台110a与第二升降台110b的升降高度不同。例如,在通过第一旋转臂130a将第一放置架中的目标热电阻从第一恒温槽200转移至第二恒温槽300的过程中,或,通过第二旋转臂130b将第二放置架中的目标热电阻从第二恒温槽300转移至第一恒温槽200的过程中,可以控制第一升降台110a和第二升降台110b处于不同的升降高度。As an implementation manner, when the first rotating arm 130a and the second rotating arm 130b are used for thermal resistance transfer at the same time, the lifting heights of the first lifting platform 110a and the second lifting platform 110b are different. For example, in the process of transferring the target thermal resistance in the first placement rack from the first thermostatic bath 200 to the second constant temperature bath 300 by the first rotating arm 130a, or, in the second placement rack by the second rotating arm 130b During the process of transferring the target thermal resistance from the second constant temperature bath 300 to the first constant temperature bath 200, the first lifting platform 110a and the second lifting platform 110b can be controlled to be at different lifting heights.

以此有利于避免在热电阻转移过程中出现碰撞冲突。This is beneficial to avoid collision and conflict during the thermal resistance transfer process.

可选的,关于第一恒温槽200或第二恒温槽300的结构可以参考图7。第一恒温槽200、第二恒温槽300均包括:槽体201以及与前述的热电阻放置孔对应的多个检定孔202。Optionally, for the structure of the first thermostatic bath 200 or the second thermostatic bath 300 , reference may be made to FIG. 7 . The first thermostatic bath 200 and the second thermostatic bath 300 each include a bath body 201 and a plurality of verification holes 202 corresponding to the aforementioned thermal resistance placement holes.

第一恒温槽200和第二恒温槽300还可包括各自的控温装置203和容置在槽体201中的恒温介质。第一恒温槽200和第二恒温槽300上的控温装置203与热电阻检定系统中的主控设备(例如计算机)连接。The first constant temperature tank 200 and the second constant temperature tank 300 may further include respective temperature control devices 203 and a constant temperature medium accommodated in the tank body 201 . The temperature control devices 203 on the first constant temperature bath 200 and the second constant temperature bath 300 are connected to a main control device (eg, a computer) in the thermal resistance verification system.

如图8所示,清洗槽400可以包括:壳体401以及开设在壳体401中的清洗容器402。该清洗容器402中可容纳清洗剂。该清洗槽400与热电阻检定系统中的主控设备(例如计算机等上位机设备)连接,可以在主控设备的控制下开启自动清洗功能,通过流动的清洗剂对进入该清洗槽400的热电阻进行清洗。As shown in FIG. 8 , the cleaning tank 400 may include: a housing 401 and a cleaning container 402 opened in the housing 401 . The cleaning container 402 can contain cleaning agents. The cleaning tank 400 is connected to the main control device (for example, a host computer equipment such as a computer) in the thermal resistance verification system, and the automatic cleaning function can be turned on under the control of the main control device. Resistors are cleaned.

对于通过清洗槽400进行清洗的热电阻,可通过前述的气流清洁方式(基于前述的气道实现)对经过清洗槽400进行清洗的热电阻进行吹扫清洁。For the thermal resistance cleaned through the cleaning tank 400, the thermal resistance cleaned through the cleaning tank 400 can be purged and cleaned by the aforementioned airflow cleaning method (implemented based on the aforementioned air passage).

可选的,清洗槽400可以有两个。示例性地,两个清洗槽400可分别设置在靠近第一恒温槽200、第二恒温槽300的位置。Optionally, there may be two cleaning tanks 400 . Exemplarily, the two cleaning tanks 400 may be disposed at positions close to the first constant temperature tank 200 and the second constant temperature tank 300, respectively.

在一个实例中,第一恒温槽200是提供100摄氏度温场的恒温油槽,第二恒温槽300是提供0摄氏度温场的恒温水槽,恒温油槽、恒温水槽分别设置在转移机构100的两侧,清洗槽400和工作台500分别设置在转移机构100的前方、后方。转移机构100采用两套并列的执行装置对两组热电阻同时进行热电阻检定,两套执行装置中的升降台在不同的升降高度下工作,以使两个升降台上的两个旋转臂在转动过程中不会相互碰撞为准。热电阻检定系统以选定的主控设备与转移机构100中的各个升降台、各个旋转台和各个旋转臂进行通讯。主控设备可向转移机构100中的各个设备组件发送控制指令(包括与升降、转动有关的指令),以使这些转移机构100中的相应组件根据接收到的控制指令执行相应的操作,实现对于热电阻的温场切换、转移、清洗等检定相关过程。In one example, the first constant temperature tank 200 is a constant temperature oil tank that provides a temperature field of 100 degrees Celsius, the second constant temperature tank 300 is a constant temperature water tank that provides a temperature field of 0 degrees Celsius, and the constant temperature oil tank and the constant temperature water tank are respectively arranged on both sides of the transfer mechanism 100, The cleaning tank 400 and the table 500 are respectively provided in front of and behind the transfer mechanism 100 . The transfer mechanism 100 uses two sets of parallel execution devices to perform thermal resistance verification on the two sets of thermal resistances at the same time. During the rotation process, they will not collide with each other. The thermal resistance verification system communicates with each lift table, each rotary table and each rotary arm in the transfer mechanism 100 with the selected main control device. The main control device can send control instructions (including instructions related to lifting and rotation) to each equipment component in the transfer mechanism 100, so that the corresponding components in the transfer mechanism 100 perform corresponding operations according to the received control instructions, so as to realize the Thermal resistance's temperature field switching, transfer, cleaning and other verification related processes.

基于同一发明构思,本申请实施例还提供一种能够应用于前述热电阻检定系统的热电阻检定方法。在执行该方法前,需对热电阻检定系统进行位置校准(包括对转移机构的位置校准),以使热电阻系统中的各个旋转臂能够与升降台配合以将相应热电阻放置架上的热电阻准确伸入选定的恒温槽为准。Based on the same inventive concept, the embodiments of the present application also provide a thermal resistance verification method that can be applied to the aforementioned thermal resistance verification system. Before performing this method, the thermal resistance verification system needs to be calibrated in position (including the position calibration of the transfer mechanism), so that each rotating arm in the thermal resistance system can cooperate with the lifting table to place the thermal resistance on the corresponding thermal resistance rack. The resistance accurately extends into the selected thermostatic bath.

如图9所示,该方法包括:S61-S65。As shown in Figure 9, the method includes: S61-S65.

S61:在转移机构中的第一放置架上被放入接线完成的目标热电阻时,控制转移机构中的第一升降台上升。S61 : When the target thermal resistance that has been wired is placed on the first placing rack in the transfer mechanism, control the first lift table in the transfer mechanism to ascend.

其中,在S61之前,可将转移机构中的第一放置架移动至工作台处,等待第一放置架中被放置热电阻。第一放置架的中心位置可安装作为标准热电阻的目标热电阻,第一放置架上围绕中心位置设置的各个放置孔可安装作为待检热电阻的目标热电阻。在工作人员对第一放置架上的所有需要参与检定的热电阻完成安装和接线后,热电阻检定系统可接收到对于该部分热电阻的启动检定指令,开始执行S61,控制第一升降台上升。Wherein, before S61, the first placement rack in the transfer mechanism may be moved to the worktable, and the thermal resistor may be placed in the first placement rack. A target thermal resistance as a standard thermal resistance can be installed in the center position of the first placement rack, and each placement hole provided around the center position on the first placement rack can be installed as a target thermal resistance as a thermal resistance to be detected. After the staff completes the installation and wiring of all the thermal resistances that need to be verified on the first placement rack, the thermal resistance verification system can receive the start verification command for this part of the thermal resistance, start to execute S61, and control the first lifting platform to rise .

在第一升降台上升时,可带动第一旋转臂以及第一旋转臂上安装的第一放置架上升。When the first lifting platform rises, the first rotating arm and the first placing rack mounted on the first rotating arm can be driven to rise.

S62:在第一升降台上升至设定的第一高度时,控制转移机构中的第一旋转台和第一旋转臂进行配合移动,以通过第一旋转臂上安装的第一放置架将目标热电阻靠近第一恒温槽。S62: When the first lifting platform rises to the set first height, control the first rotating platform and the first rotating arm in the transfer mechanism to cooperate to move, so as to move the target through the first placing frame installed on the first rotating arm The thermal resistance is close to the first constant temperature bath.

其中,在第一升降台上升至设定的第一高度时,可控制第一旋转台带动第一旋转臂转动,并控制第一旋转臂上的主臂、副臂进行配合动作,以使副臂上的第一放置架将该第一放置架上安装的目标热电阻靠近第一恒温槽。Wherein, when the first lifting platform rises to the set first height, the first rotating platform can be controlled to drive the first rotating arm to rotate, and the main arm and the auxiliary arm on the first rotating arm can be controlled to cooperate with each other, so as to make the auxiliary arm rotate. The first placement rack on the arm brings the target thermal resistance mounted on the first placement rack close to the first thermostatic bath.

S63:通过转移机构将目标热电阻插入第一恒温槽进行热电阻检定。S63: Insert the target thermal resistance into the first constant temperature bath through the transfer mechanism to perform thermal resistance verification.

其中,可以通过转移机构中的第一升降台和/或第一旋转臂上的副臂带动第一放置架下降,以将第一放置架中安装的目标热电阻插入第一恒温槽进行热电阻检定。Wherein, the first lifting platform in the transfer mechanism and/or the jib on the first rotating arm can be used to drive the first placing frame to descend, so as to insert the target thermal resistance installed in the first placing frame into the first thermostatic bath for thermal resistance measurement. Check.

S64:在确定目标热电阻完成第一恒温槽中的热电阻检定过程时,通过转移机构带动目标热电阻移动,以使目标热电阻从第一恒温槽处转移至清洗槽处进行清洗。S64: When it is determined that the target thermal resistance has completed the thermal resistance verification process in the first constant temperature tank, the transfer mechanism drives the target thermal resistance to move, so that the target thermal resistance is transferred from the first constant temperature tank to the cleaning tank for cleaning.

其中,在得到目标热电阻在第一恒温槽提供的温场下测得的检定结果时,可视为该目标热电阻完成第一恒温槽中的热电阻检定过程(但此时该目标热电阻还未在第二恒温槽提供的温场下进行热电阻检定)。确定目标热电阻完成第一恒温槽中的热电阻检定过程时,可通过第一旋转臂带动第一放置架移动,以使第一放置架上安装的目标热电阻从第一恒温槽处转移至清洗槽处进行清洗。Wherein, when the verification result measured by the target thermal resistance in the temperature field provided by the first constant temperature bath is obtained, it can be considered that the target thermal resistance has completed the thermal resistance verification process in the first constant temperature bath (but at this time the target thermal resistance Thermal resistance verification has not been performed under the temperature field provided by the second thermostatic bath). When the target thermal resistance is determined and the thermal resistance verification process in the first constant temperature bath is completed, the first placing frame can be driven to move by the first rotating arm, so that the target thermal resistance installed on the first placing frame is transferred from the first constant temperature bath to the first placing frame. Cleaning at the cleaning tank.

S65:在确定目标热电阻清洗结束时,通过转移机构带动目标热电阻移动,以使目标热电阻从清洗槽处转移至第二恒温槽进行热电阻检定。S65: When it is determined that the cleaning of the target thermal resistance is completed, the transfer mechanism drives the target thermal resistance to move, so that the target thermal resistance is transferred from the cleaning tank to the second constant temperature tank for thermal resistance verification.

其中,在确定目标热电阻清洗结束时,通过第一旋转臂带动第一放置架移动,以使第一放置架上安装的目标热电阻从清洗槽处转移至第二恒温槽进行热电阻检定。When it is determined that the cleaning of the target thermal resistance is completed, the first placing frame is driven to move by the first rotating arm, so that the target thermal resistance installed on the first placing frame is transferred from the cleaning tank to the second constant temperature tank for thermal resistance verification.

基于上述S61-S65的方法,可以实现对于目标热电阻的高效检定,通过转移机构可以快速实现目标热电阻在整个热电阻检定过程中的温场切换,可实现热电阻的快速转移,并且可以在温场切换过程中将目标热电阻转移至清洗槽进行清洗,有利于实现高效可靠的热电阻检定,有利于提升热电阻检定效率。Based on the above methods of S61-S65, the efficient verification of the target thermal resistance can be achieved, and the temperature field switching of the target thermal resistance during the entire thermal resistance verification process can be quickly realized through the transfer mechanism, and the rapid transfer of the thermal resistance can be realized. During the temperature field switching process, the target thermal resistance is transferred to the cleaning tank for cleaning, which is conducive to realizing efficient and reliable thermal resistance verification and improving the thermal resistance verification efficiency.

作为S62的一种实现方式,第一旋转臂包括主臂和副臂,S62可包括子步骤S621-S623。As an implementation of S62, the first rotating arm includes a main arm and a sub-arm, and S62 may include sub-steps S621-S623.

S621:控制副臂转动至与主臂平行。S621: Control the auxiliary arm to rotate to be parallel with the main arm.

S622:通过第一旋转台带动主臂转动,以及控制副臂沿着主臂的延伸方向移动,以使副臂的转动中心移动至第一恒温槽上方。S622: The main arm is driven to rotate by the first rotary table, and the auxiliary arm is controlled to move along the extension direction of the main arm, so that the rotation center of the auxiliary arm is moved above the first thermostatic bath.

其中,在第一升降台上升至设定的第一高度时,控制副臂转动至与主臂平行(整个第一旋转臂的延伸方向可以是水平方向),由于热电阻通常比较长,各个升级台的高度差距不大(高度差距不大是为了避免热电阻转移过程中因高度差太大而耗费较多转移时间),在副臂转动至与主臂平行的情况下控制主臂转动,有利于避免主臂转动过程中发生碰撞冲突,例如可避免第一旋转臂上的副臂和第二旋转臂上的副臂在运行过程中出现碰撞。Wherein, when the first lifting platform rises to the set first height, the auxiliary arm is controlled to rotate to be parallel to the main arm (the extension direction of the entire first rotating arm can be horizontal). Since the thermal resistance is usually relatively long, each upgrade The height difference of the stage is not large (the height difference is not large to avoid the transfer time due to the too large height difference during the transfer of the thermal resistance). It is beneficial to avoid collision and conflict during the rotation of the main arm, for example, it can avoid collision between the auxiliary arm on the first rotating arm and the auxiliary arm on the second rotating arm during operation.

其中,关于第一旋转台/主臂的转动角度、副臂在主臂上的移动距离,可根据实际的恒温槽位置确定。例如,在预先为转移机构、各个恒温槽、清洗槽、工作台建立坐标系的情况下,可根据预先确定的各个恒温槽、清洗槽、工作台在该坐标系中的位置,控制转移机构按照设定的执行逻辑进行运动,以此可对目标热电阻以设定的检定处理顺序进行高效检定。The rotation angle of the first rotary table/main arm and the moving distance of the auxiliary arm on the main arm can be determined according to the actual position of the thermostatic bath. For example, when a coordinate system is established for the transfer mechanism, each constant temperature tank, cleaning tank, and worktable in advance, the transfer mechanism can be controlled according to the predetermined positions of each constant temperature tank, cleaning tank, and worktable in the coordinate system. The set execution logic moves, so that the target thermal resistance can be efficiently verified in the set verification processing sequence.

S623:控制副臂转动,以使副臂上安装的第一放置架移动至第一恒温槽上方,并且第一放置架上安装的目标热电阻与第一恒温槽上设置的检定孔处于同一轴线上。S623: Control the rotation of the jib, so that the first placing frame installed on the jib moves to the top of the first constant temperature bath, and the target thermal resistance installed on the first placing frame and the verification hole set on the first constant temperature bath are on the same axis superior.

在以副臂的旋转器作为转动中心的情况下,当旋转器移动至第一恒温槽上方时,可控制副臂转动,以使副臂转动至与第一恒温槽对齐。副臂与第一恒温槽对齐可以是:副臂上的伸缩杆在此时的延伸方向指向第一恒温槽上设置的检定孔。在此情况下,可通过伸缩杆的上下移动和/或第一升降台的升降移动,带动第一放置架上安装的目标热电阻逐渐靠近第一恒温槽上的检定孔。When the rotator of the auxiliary arm is used as the rotation center, when the rotator moves above the first thermostatic bath, the rotation of the auxiliary arm can be controlled to make the auxiliary arm rotate to be aligned with the first thermostatic bath. The alignment of the auxiliary arm with the first constant temperature tank may be that the extension direction of the telescopic rod on the auxiliary arm at this time points to the verification hole provided on the first constant temperature tank. In this case, the up and down movement of the telescopic rod and/or the up and down movement of the first lifting platform can drive the target thermal resistance installed on the first placing frame to gradually approach the verification hole on the first thermostatic bath.

基于S621-S623的实现方式,可以快速将第一放置架上安装的目标热电阻移动至与第一恒温槽匹配的位置,有利于快速实现该热电阻在第一恒温槽处的热电阻检定过程。Based on the implementation of S621-S623, the target thermal resistance installed on the first placement rack can be quickly moved to a position matching the first thermostatic bath, which is beneficial to quickly realize the thermal resistance verification process of the thermal resistance at the first constant temperature bath .

基于上述S62(或S621-S623),上述S63可以包括:S631-S633。Based on the above S62 (or S621-S623), the above S63 may include: S631-S633.

S631:在第一放置架上安装的目标热电阻与第一恒温槽上设置的检定孔处于同一轴线时,控制第一升降台下降和/或控制副臂上的伸缩杆移动,以使第一放置架靠近第一恒温槽,并将目标热电阻插入至第一恒温槽中的指定深度。S631: When the target thermal resistance installed on the first placement rack and the verification hole set on the first thermostatic bath are on the same axis, control the first lifting platform to descend and/or control the telescopic rod on the jib to move, so that the first Place the rack close to the first bath and insert the target RTD to the specified depth in the first bath.

其中,通过升降台的升降运动可以在垂直方向上对热电阻进行较大幅度的移动控制,通过伸缩杆的移动可以在垂直方向上对热电阻进行微调,提升控制精度。Among them, the thermal resistance can be greatly moved in the vertical direction through the lifting motion of the lifting platform, and the thermal resistance can be fine-tuned in the vertical direction through the movement of the telescopic rod to improve the control accuracy.

S632:通过热电阻检定系统中的控温装置将第一恒温槽的温度控制在设定的检定温度。S632: Control the temperature of the first constant temperature bath at the set verification temperature through the temperature control device in the thermal resistance verification system.

以此使得第一恒温槽为目标热电阻的检定过程提供恒定的温场。In this way, the first constant temperature bath provides a constant temperature field for the verification process of the target thermal resistance.

S633:在检测到第一放置架上的目标热电阻达到热平衡后,控制伸缩杆移动,以将该目标热电阻朝向第一恒温槽继续伸入指定距离,并在该目标热电阻再次达到热平衡时,读取得到该目标热电阻在第一恒温槽中进行热电阻检定的检定结果。S633: After detecting that the target thermal resistance on the first placing rack has reached thermal equilibrium, control the telescopic rod to move, so that the target thermal resistance continues to extend into a specified distance toward the first thermostatic bath, and when the target thermal resistance reaches thermal equilibrium again , read and obtain the verification result of the thermal resistance verification of the target thermal resistance in the first constant temperature bath.

上述指定深度的值、检定温度的值、指定距离的值根据热电阻检定要求和检定规范确定。在一个实例中,先通过转移机构将目标热电阻伸入第一恒温槽中的一半介质的深度,然后通过控温装置将第一恒温槽控制在规定的检定温度,在检测到达到热平衡(热平衡可以表现为10分钟以内的温度变化不超过0.02摄氏度)后,控制副臂上的伸缩杆将目标热电阻继续向第一恒温槽插入1厘米,并在检测到再次达到热平衡时,读取检定结果。本申请实施例不对具体的数据采集、读取、分析处理过程进行限定。The value of the specified depth, the value of the verification temperature, and the value of the specified distance are determined according to the thermal resistance verification requirements and verification specifications. In one example, the target thermal resistance is first extended into the first half of the medium in the constant temperature bath by the transfer mechanism, and then the first constant temperature bath is controlled at a specified calibration temperature by the temperature control device. It can be shown that the temperature change within 10 minutes does not exceed 0.02 degrees Celsius), control the telescopic rod on the jib to continue to insert the target thermal resistance into the first thermostatic bath by 1 cm, and read the verification result when it is detected that the thermal equilibrium is reached again. . The embodiments of the present application do not limit the specific data collection, reading, analysis and processing procedures.

通过上述的实现方式,有利于快速完成第一放置架上的目标热电阻在第一恒温槽处的热电阻检定过程,且可以提升检测精确度。Through the above implementation manner, it is beneficial to quickly complete the thermal resistance verification process of the target thermal resistance on the first placing rack at the first constant temperature bath, and the detection accuracy can be improved.

其中,在读取得到目标热电阻在第一恒温槽中进行热电阻检定的检定结果时,确定目标热电阻完成第一恒温槽中的热电阻检定过程。上述S64可包括:S641-S644。Wherein, when the verification result of the thermal resistance verification performed by the target thermal resistance in the first constant temperature bath is obtained, the target thermal resistance is determined to complete the thermal resistance verification process in the first constant temperature bath. The above S64 may include: S641-S644.

S641:控制第一升降台和/或伸缩杆移动,以使目标热电阻远离第一恒温槽。S641: Control the movement of the first lifting platform and/or the telescopic rod to keep the target thermal resistance away from the first constant temperature bath.

S642:控制副臂转动至与主臂平行,并控制主臂转动至清洗槽上方,以使目标热电阻靠近清洗槽。S642: Control the auxiliary arm to rotate to be parallel with the main arm, and control the main arm to rotate above the cleaning tank, so that the target thermal resistance is close to the cleaning tank.

S643:控制第一升降台和/或伸缩杆移动,以使目标热电阻进入清洗槽。S643: Control the movement of the first lifting platform and/or the telescopic rod, so that the target thermal resistance enters the cleaning tank.

S644:控制清洗槽对目标热电阻进行清洗。S644: Control the cleaning tank to clean the target thermal resistance.

以此可以在第一放置架上的目标热电阻完成第一恒温槽处的热电阻检定过程时,快速对该目标热电阻进行清洗,可降低介质污染对于检定过程的影响。In this way, when the target thermal resistance on the first placement rack completes the thermal resistance verification process at the first constant temperature bath, the target thermal resistance can be quickly cleaned, which can reduce the influence of medium pollution on the verification process.

可选的,在第一旋转臂上设置有前述的吹扫气接口和连接孔,第一放置架上设置有前述的中空连接柱和热电阻放置孔的情况下,上述方法还可包括S645:在确定目标热电阻清洗结束时,通过吹扫气接口、连接孔、中空连接柱和热电阻放置孔形成的气道,对热电阻放置孔中的目标热电阻进行吹扫清洁。以此可降低介质污染概率。Optionally, when the first rotating arm is provided with the aforementioned purge gas interface and the connection hole, and the first placement rack is provided with the aforementioned hollow connection column and the thermal resistance placement hole, the above method may further include S645: When it is determined that the cleaning of the target thermal resistance is completed, the target thermal resistance in the thermal resistance placing hole is purged and cleaned through the air channel formed by the purging gas interface, the connecting hole, the hollow connecting column and the thermal resistance placing hole. This reduces the probability of media contamination.

在确定目标热电阻清洗结束时,或执行完S645时,可执行S65。由于目标热电阻在第二恒温槽处的热电阻检定过程与第一恒温槽处的热电阻检定过程原理相同,因此关于S65的细节可参考与S63有关的内容,下面将不再进行赘述。When it is determined that the cleaning of the target thermal resistance is completed, or when S645 is executed, S65 can be executed. Since the thermal resistance verification process of the target thermal resistance at the second constant temperature tank is the same as the thermal resistance verification process at the first constant temperature tank, the details of S65 can refer to the content related to S63, which will not be repeated below.

前述S61-S65的方法可视为通过转移机构中的第一执行装置对一组热电阻在两个恒温槽提供的温场下进行热电阻检定的方法。The aforementioned methods of S61-S65 can be regarded as a method of performing thermal resistance verification on a group of thermal resistors under the temperature fields provided by two constant temperature baths through the first execution device in the transfer mechanism.

基于前述方法及前述结构中与第一执行装置、第二执行结构相关的原理,在转移机构还包括:第二升降台、第二旋转台、第二旋转臂和第二放置架的情况下,如图10所示,上述方法还可包括S66-S70。Based on the foregoing method and the principles related to the first execution device and the second execution structure in the foregoing structure, when the transfer mechanism further includes: a second lifting platform, a second rotating platform, a second rotating arm and a second placing rack, As shown in FIG. 10 , the above method may further include S66-S70.

S66-S70的方法与S61-S65的方法由于可以基于不同的执行装置实现,因此可以并行独立执行,例如S66-S70的方法与S61-S65的方法可同时执行,示例性地,可以同时控制两个升降台进行升降、可同时控制两个旋转臂转动,同时将两个旋转臂对应的目标热电阻分别插入两个恒温槽进行同时检定。Since the methods of S66-S70 and the methods of S61-S65 can be implemented based on different execution devices, they can be executed independently in parallel. For example, the methods of S66-S70 and the methods of S61-S65 can be executed simultaneously. Exemplarily, two methods can be controlled simultaneously. It can control the rotation of two rotating arms at the same time, and at the same time insert the target thermal resistance corresponding to the two rotating arms into two constant temperature baths for simultaneous verification.

S66:在第二放置架上被放入接线完成的目标热电阻时,控制第二升降台上升。S66 : when the target thermal resistance that has been wired is placed on the second placing rack, the second lifting platform is controlled to rise.

S67:在第二升降台上升至设定的第二高度时,控制第二旋转台和第二旋转臂进行配合移动,以通过第二旋转臂上安装的第二放置架将目标热电阻转移至第二恒温槽处。S67: When the second lifting platform rises to the set second height, control the second rotating platform and the second rotating arm to cooperate to move, so as to transfer the target thermal resistance to the second placing frame installed on the second rotating arm. at the second thermostat.

S67:对第二放置架中安装的目标热电阻进行热电阻检定。S67: Perform thermal resistance verification on the target thermal resistance installed in the second placing rack.

S69:在确定第二放置架中的目标热电阻完成在第二恒温槽处的热电阻检定过程时,通过第二升降台、第二旋转台、第二旋转臂和第二放置架进行配合移动,以将第二放置架中安装的目标热电阻从第二恒温槽处转移至清洗槽处进行清洗。S69: When it is determined that the target thermal resistance in the second placing rack has completed the thermal resistance verification process at the second constant temperature bath, the second lifting table, the second rotating table, the second rotating arm and the second placing rack are used for coordinated movement , so as to transfer the target thermal resistance installed in the second placing rack from the second constant temperature bath to the cleaning bath for cleaning.

S70:在确定第二放置架中的目标热电阻完成清洗过程时,通过第二升降台、第二旋转台、第二旋转臂和第二放置架进行配合移动,以将第二放置架中安装的目标热电阻从清洗槽处转移至第一恒温槽处进行热电阻检定。S70: When it is determined that the target thermal resistance in the second placing rack has completed the cleaning process, the second lifting table, the second rotating table, the second rotating arm and the second placing rack are coordinated to move to install the second placing rack in the second placing rack. The target thermal resistance is transferred from the cleaning tank to the first constant temperature tank for thermal resistance verification.

S66-S70的方法可视为通过转移机构中的第二执行装置对另一组热电阻在该两个恒温槽提供的温场下进行热电阻检定的方法。由于转移机构中的第二升降台、第二旋转台、第二旋转臂和第二放置架与转移机构中的第一升降台、第一旋转台、第一旋转臂和第一放置架实施原理相同,因此关于S66-S70的实施细节可以参考前述关于S61-S65的描述,例如在S66-S70的方法中,第二升降台、第二旋转台、第二旋转臂和第二放置架之间的配合移动过程可参照S61-S65的方法。The methods of S66-S70 can be regarded as a method of performing thermal resistance verification on another group of thermal resistors under the temperature field provided by the two constant temperature baths through the second execution device in the transfer mechanism. Due to the implementation principle of the second lifting table, the second rotating table, the second rotating arm and the second placing rack in the transfer mechanism and the first lifting table, the first rotating table, the first rotating arm and the first placing rack in the transfer mechanism The same, so the implementation details of S66-S70 can refer to the foregoing descriptions about S61-S65, for example, in the method of S66-S70, between the second lifting table, the second rotating table, the second rotating arm and the second placing frame For the coordinated movement process, refer to the methods of S61-S65.

基于S66-S70的方法与S61-S65的方法,有利于通过与第一旋转臂、第二旋转臂关联的结构实现对于不同热电阻的同时检定,有利于提升检定效率。Based on the method of S66-S70 and the method of S61-S65, it is beneficial to realize the simultaneous verification of different thermal resistances through the structure associated with the first rotating arm and the second rotating arm, which is beneficial to improve the verification efficiency.

在一个实例中,当目标热电阻完成在一个恒温槽的检定环节后,控制升降台上升以提起目标热电阻,然后控制副臂旋转至水平方向,控制主臂旋转至清洗槽所在位置,再控制升降台下降以将目标热电阻送入清洗槽,进入清洗槽的目标热电阻在清洗槽内进行浸泡清洗或冲洗清洗,清洗结束后,控制升降台上升再次提起目标热电阻,控制副臂对热电阻放置架上的目标热电阻进行吹扫清洁,待目标热电阻上的污物吹扫完毕后(不论先进行的哪个恒温槽处的检定过程,只要恒温槽的介质不同,为了避免介质污染,因此都需要对目热电阻进行清洗、吹扫清洁),控制主臂旋转至另一个恒温槽处按相同的处理逻辑序完成该目标热电阻在另一个温度点的检定过程。In one example, after the target thermal resistance has completed the verification process in a constant temperature bath, the lifting platform is controlled to rise to lift the target thermal resistance, and then the auxiliary arm is controlled to rotate to the horizontal direction, the main arm is controlled to rotate to the position of the cleaning tank, and then controlled The lifting table descends to send the target thermal resistance into the cleaning tank, and the target thermal resistance entering the cleaning tank is soaked or rinsed in the cleaning tank. After cleaning, the lifting table is controlled to rise and the target thermal resistance is lifted again, and the auxiliary arm is controlled to heat the thermal resistance. The target thermal resistance on the resistance placement rack is purged and cleaned, and after the dirt on the target thermal resistance is purged (regardless of which calibration process of the constant temperature bath is performed first, as long as the medium of the constant temperature bath is different, in order to avoid medium pollution, Therefore, it is necessary to clean and purge the target thermal resistance, and control the main arm to rotate to another constant temperature tank to complete the verification process of the target thermal resistance at another temperature point according to the same processing logic sequence.

同一热电阻在规定的两个温度点(0摄氏度、100摄氏度)下均检定完成后,可通过转移机构将完成检定的目标热电阻转移至工作台进行拆线,并取下热电阻放置架上的目标热电阻。After the same thermal resistance has been verified at the specified two temperature points (0 degrees Celsius, 100 degrees Celsius), the target thermal resistance that has completed the verification can be transferred to the workbench through the transfer mechanism for wire removal, and the thermal resistance can be placed on the shelf. target thermal resistance.

为了对各个热电阻进行检定区分,在所有待检的热电阻进行检定前可为这些待检热电阻进行编码,热电阻检定系统中的上位机(主控设备)可经多路数据采集器来采集各热电阻的检定数据并自动对检定结果进行区分判定。In order to verify and distinguish each thermal resistance, the thermal resistances to be tested can be coded before all the thermal resistances to be tested are verified. The verification data of each thermal resistance is collected and the verification results are automatically distinguished and judged.

在本申请所提供的实施例中,应该理解到,以上所描述的实施例仅仅是示意性的,例如,结构、模块、装置的划分,仅仅为一种逻辑功能划分,实际实现时可以有另外的划分方式,又例如,多个单元或组件可以结合或者可以集成到另一个系统。本领域技术人员可以根据实际的需要选择其中的部分或者全部内容来实现本实施例方案的目的。In the embodiments provided in the present application, it should be understood that the above-described embodiments are only illustrative, for example, the division of structures, modules, and devices is only a logical function division, and there may be other divisions in actual implementation. The way of division, for another example, multiple units or components can be combined or can be integrated into another system. Those skilled in the art can select some or all of the contents according to actual needs to achieve the purpose of the solution in this embodiment.

需要说明的是,上述方法的功能如果以软件功能模块的形式实现并作为独立的产品销售或使用时,可以存储在一个计算机可读取存储介质中。基于这样的理解,本申请的技术方案本质上或者说对现有技术做出贡献的部分或者该技术方案的部分可以用软件产品的形式体现出来,该计算机软件产品存储在一个存储介质中,包括若干指令用以使得一台计算机设备执行本申请各个实施例方法的全部或部分步骤。It should be noted that, if the functions of the above method are implemented in the form of software function modules and sold or used as independent products, they may be stored in a computer-readable storage medium. Based on such understanding, the technical solution of the present application can be embodied in the form of a software product in essence, or the part that contributes to the prior art or the part of the technical solution. The computer software product is stored in a storage medium, including Several instructions are used to cause a computer device to perform all or part of the steps of the methods of various embodiments of the present application.

在本文中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。In this document, relational terms such as first and second, etc. are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such existence between these entities or operations. The actual relationship or sequence.

以上仅为本申请的实施例而已,并不用于限制本申请的保护范围,对于本领域的技术人员来说,本申请可以有各种更改和变化。凡在本申请的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本申请的保护范围之内。The above are only examples of the present application, and are not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the protection scope of this application.

Claims (13)

1. A thermal resistance verification system, comprising: the transfer mechanism, the first constant temperature tank, the second constant temperature tank and the cleaning tank are arranged in the first constant temperature tank;
the transfer mechanism includes: the device comprises a first lifting table and a first rotating table arranged on the first lifting table, wherein a first rotating arm is arranged on the first rotating table, a first placing frame is arranged on the first rotating arm, and the first placing frame is used for installing a thermal resistor;
the transfer mechanism is used for inserting the target thermal resistor installed in the first placing frame into the first constant temperature bath for thermal resistor verification through the first lifting table, the first rotating table and the first rotating arm;
the transfer mechanism is further used for transferring the target thermal resistor from the first constant temperature bath to the cleaning bath for cleaning when the target thermal resistor completes the thermal resistor verification process in the first constant temperature bath;
and the transfer mechanism is also used for transferring the target thermal resistor from the cleaning tank to the second constant temperature tank for thermal resistor verification when the target thermal resistor is cleaned.
2. The thermal resistance verification system according to claim 1, wherein the first rotating arm comprises a rotating connection disc, a primary arm, and a secondary arm;
the main arm is arranged on the rotary connecting disc;
the auxiliary arm is arranged on the main arm;
the first placing frame is arranged on the auxiliary arm;
the main arm is used for rotating around the rotating connecting disc;
the auxiliary arm is used for moving back and forth in the extending direction of the main arm, so that the first placing frame can drive the target thermal resistor to a specified position, and the specified position comprises the upper parts of the first constant temperature groove, the second constant temperature groove and the cleaning groove.
3. The thermal resistance verification system according to claim 2, wherein a purge gas interface and a connecting hole are arranged on the auxiliary arm, and a hollow connecting column and a thermal resistance placing hole are arranged on the first placing frame;
the first placing frame is inserted into the connecting hole through the hollow connecting column so as to connect the first placing frame with the auxiliary arm;
the thermal resistor placing hole is used for installing the target thermal resistor;
the transfer mechanism is used for introducing an external air source into the air passage formed by the purge air interface, the connecting hole, the hollow connecting column and the thermal resistor placing hole so as to purge and clean the target thermal resistor in the thermal resistor placing hole through air flow.
4. The thermal resistance verification system according to claim 2, wherein the auxiliary arm is provided with a telescopic rod and a rotator;
under the rotating action of the rotator, the auxiliary arm can rotate to be parallel or vertical to the main arm;
the telescopic rod is used for performing telescopic motion by taking the position of the rotator as a reference position, and the auxiliary arm is used for driving the first placing frame to move through the telescopic motion of the telescopic rod.
5. The thermal resistance verification system according to claim 1, wherein the first constant temperature bath and the second constant temperature bath are constant temperature baths that provide temperature fields with different constant temperature media;
the first constant temperature bath and the second constant temperature bath are both provided with verification holes matched with the first placing rack;
the target thermal resistor arranged in the first placing frame is used for being inserted into the verification hole to conduct thermal resistor verification;
the first constant temperature bath is a constant temperature water bath, and the second constant temperature bath is a constant temperature oil bath;
or, the first constant temperature bath is a constant temperature oil bath, and the second constant temperature bath is a constant temperature water bath.
6. A thermal resistance verification system according to any one of claims 1 to 5,
the transfer mechanism further comprises: the second lifting platform and a second rotating platform arranged on the second lifting platform;
a second rotating arm is mounted on the second rotating table, a second placing frame is mounted on the second rotating arm, and the second placing frame is used for mounting a thermal resistor;
the transfer mechanism is further used for transferring the target thermal resistor mounted in the second placing frame to the first constant temperature bath, the cleaning bath or the second constant temperature bath through the second lifting table, the second rotating arm and the second placing frame so as to simultaneously realize the temperature field switching and the thermal resistor verification of the multiple thermal resistors.
7. A thermal resistance verification system according to claim 6,
when the first rotating arm and the second rotating arm perform thermal resistance transfer, the lifting heights of the first lifting platform and the second lifting platform are different.
8. A method of thermal resistance verification, applied to a thermal resistance verification system as claimed in any one of claims 1 to 7, the thermal resistance verification system comprising a transfer mechanism, the method comprising:
when a target thermal resistor which is finished in wiring is placed on a first placing frame in the transfer mechanism, controlling a first lifting table in the transfer mechanism to ascend;
when the first lifting platform rises to a set first height, a first rotating platform and a first rotating arm in the transfer mechanism are controlled to move in a matching mode, so that the target thermal resistor is close to the first constant temperature bath through a first placing frame arranged on the first rotating arm;
inserting the target thermal resistor into the first constant temperature bath through the transfer mechanism to perform thermal resistor verification;
when the target thermal resistor is determined to finish the thermal resistor verification process in the first constant temperature bath, the transfer mechanism drives the target thermal resistor to move so as to transfer the target thermal resistor from the first constant temperature bath to a cleaning bath for cleaning;
and when the target thermal resistor is determined to be cleaned, driving the target thermal resistor to move through the transfer mechanism, so that the target thermal resistor is transferred from the cleaning tank to the second constant-temperature tank for thermal resistor verification.
9. The method according to claim 8, wherein the first rotating arm comprises a primary arm and a secondary arm, and the implementation process of controlling the first rotating table and the first rotating arm in the transferring mechanism to cooperatively move so as to approach the target thermal resistor to the first thermostatic bath through a first placing frame mounted on the first rotating arm comprises the following steps:
controlling the auxiliary arm to rotate to be parallel to the main arm;
the main arm is driven to rotate through the first rotating platform, and the auxiliary arm is controlled to move along the extending direction of the main arm, so that the rotating center of the auxiliary arm moves to the position above the first constant temperature groove;
the auxiliary arm is controlled to rotate, so that the first placing frame arranged on the auxiliary arm moves to the position above the first constant temperature bath, and the target thermal resistor arranged on the first placing frame and the verification hole arranged on the first constant temperature bath are located on the same axis.
10. The method of claim 9, wherein the secondary arm comprises a telescoping rod, and the inserting the target thermal resistor into the first thermostatic bath via the transfer mechanism for thermal resistance verification comprises:
when the target thermal resistor arranged on the first placing frame and the verification hole arranged on the first constant temperature bath are positioned on the same axis, controlling the first lifting table to descend and/or controlling the telescopic rod to move so as to enable the first placing frame to be close to the first constant temperature bath, and inserting the target thermal resistor to a specified depth in the first constant temperature bath;
controlling the temperature of the first constant temperature bath at a set verification temperature through a temperature control device in the thermal resistance verification system;
and after the target thermal resistor is detected to reach thermal balance, controlling the telescopic rod to move so as to enable the target thermal resistor to continuously extend into the first constant temperature bath for a specified distance, and reading to obtain a verification result of the target thermal resistor for thermal resistor verification in the first constant temperature bath when the target thermal resistor reaches thermal balance again.
11. The method of claim 10, further comprising:
when a verification result that the target thermal resistor is subjected to thermal resistor verification in the first constant temperature bath is obtained through reading, determining that the target thermal resistor completes a thermal resistor verification process in the first constant temperature bath;
when it is determined that the target thermal resistor completes the thermal resistor verification process in the first constant temperature bath, the transfer mechanism drives the target thermal resistor to move so that the target thermal resistor is transferred from the first constant temperature bath to the cleaning bath for cleaning, including:
controlling the first lifting platform and/or the telescopic rod to move so as to enable the target thermal resistor to be far away from the first constant temperature bath;
controlling the auxiliary arm to rotate to be parallel to the main arm and controlling the main arm to rotate to be above the cleaning groove so that the target thermal resistor is close to the cleaning groove;
controlling the first lifting platform and/or the telescopic rod to move so that the target thermal resistor enters the cleaning tank;
and controlling the cleaning tank to clean the target thermal resistor.
12. The method according to claim 8, wherein a purge gas port and a connecting hole are arranged on the first rotating arm, a hollow connecting column and a thermal resistor placing hole are arranged on the first placing frame, the first placing frame and the first rotating arm are connected through the hollow connecting column and the connecting hole, and the method further comprises:
when the target thermal resistor is determined to be cleaned, the target thermal resistor in the thermal resistor placing hole is cleaned in a purging mode through the purging gas interface, the connecting hole, the hollow connecting column and the air passage formed by the thermal resistor placing hole.
13. The method of claim 8, wherein the transfer mechanism further comprises: the method comprises the following steps of installing a second lifting table, a second rotating arm and a second placing frame, wherein the second rotating table is installed on the second lifting table, the second rotating arm is installed on the second rotating table, the second placing frame is installed on the second rotating table, and the method further comprises the following steps:
when the target thermal resistor with the completed wiring is placed on the second placing frame, controlling the second lifting table to ascend;
when the second lifting platform rises to a set second height, the second rotating platform and the second rotating arm are controlled to move in a matching mode, so that the target thermal resistor is transferred to the second constant temperature bath through the second placing frame arranged on the second rotating arm;
carrying out thermal resistance verification on the target thermal resistance arranged in the second placing frame;
when the target thermal resistor in the second placing frame is determined to finish the thermal resistor verification process at the second constant temperature bath, the target thermal resistor installed in the second placing frame is transferred from the second constant temperature bath to the cleaning bath for cleaning through the matching movement of the second lifting table, the second rotating arm and the second placing frame;
when the target thermal resistor in the second placing frame is determined to finish the cleaning process, the target thermal resistor installed in the second placing frame is transferred from the cleaning tank to the first constant-temperature tank for thermal resistor verification through the second lifting table, the second rotating arm and the second placing frame in a matched mode.
CN202011037274.XA 2020-09-28 2020-09-28 Thermal resistance verification system and method Pending CN112146788A (en)

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