CN105841846A - NTC heat-sensitive chip testing method - Google Patents
NTC heat-sensitive chip testing method Download PDFInfo
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- CN105841846A CN105841846A CN201610362528.2A CN201610362528A CN105841846A CN 105841846 A CN105841846 A CN 105841846A CN 201610362528 A CN201610362528 A CN 201610362528A CN 105841846 A CN105841846 A CN 105841846A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
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Abstract
The invention discloses an NTC heat-sensitive chip testing method, and belongs to the field of electronic component preparation. The NTC heat-sensitive chip testing method comprises the steps of testing to acquire a benchmark product and a limit product in the same batch of products to be tested and calculating to acquire deviation between the benchmark product and the limit product, connecting the benchmark product and the limit product to a thermistor tester at the normal temperature so as to be tested and comparing the benchmark product and the limit product to acquire a percentage deviation value, setting a resistance range of qualified products in the thermistor tester, and carrying out constant temperature treatment on a product to be tested and the benchmark product in a normal temperature environment and connecting the thermistor tester to test, wherein if the resistance of the product to be tested meets the set range, the product to be tested is a qualified product. The method disclosed by the invention converts a test for an NTC heat-sensitive chip in an oil tank/ water tank environment to a test in a normal state environment, requirements for the test environment are low, the NTC heat-sensitive chip is tested directly without loading or unloading a fixture in the testing process, the test process is simplified, the test efficiency is improved, and the test speed is about 8 times of the test speed of an oil tank testing method.
Description
Technical field
The present invention relates to the method for testing of a kind of electronic component, be especially the method for testing of a kind of NTC heat sensitive chip, belong to
In electronic component preparation field.
Background technology
NTC heat sensitive chip/resistor (sensor) has strict requirements to resistance accuracy own.NTC heat sensitive chip/electricity
Resistance device (sensor) resistance is greatly influenced by temperature, and test process is generally to NTC heat sensitive chip/resistor (sensor)
Environmental requirement is higher, is typically all and tests in thermostatic water bath/oil groove, and NTC heat sensitive chip can only be at nonconducting medium
Middle test；Chip is smaller, and test process trouble and efficiency are low.If test in oil, after would testing also
Need chip is carried out.Meanwhile, its test result is also that the resistance taking on resistance meter by manual read is sentenced
The disconnected required precision whether meeting NTC heat sensitive chip/resistor (sensor), erroneous judgement hidden danger is bigger.
Summary of the invention
The technical problem to be solved is to overcome prior art defect, it is provided that a kind of test process is simple, surveys
Examination efficiency and the high NTC heat sensitive chip method of testing of measuring accuracy.
In order to solve above-mentioned technical problem, the method for testing of the NTC heat sensitive chip that the present invention provides, comprise the following steps:
1), in a collection of product to be measured, 1 close product of resistance at arbitrary temperature is found by oil groove/tank method of testing
The product of product specification central value RS, records resistance, as reference product；And under described same temperature, find 1 resistance
Value is close to product specification lower limit or the product of higher limit, and record resistance is RC, as limit product；Calculate the resistance of limit product
Deviation C of value RC and specification central value product RS, C=RC/RS-1；
2), reference product accesses the reference edge of critesistor tester at normal temperatures, limit product accesses critesistor and surveys
Examination instrument is tested, and draws percentage deviation value X；
3) if Product Precision to be measured is ± Y, then in critesistor tester, the resistance accuracy scope of certified products is set
It is set to: X+ (Y-C)-2Y to X+ (Y-C)；
4), by product to be measured and reference product being placed under normal temperature environment and carry out constant temperature process, product to be measured connects temperature-sensitive electricity
The test lead of resistance tester, reference product connects the reference edge of critesistor tester to be tested, if product to be measured resistance
Value meets step 3) Standard resistance range that sets is then certified products.
In the present invention, described step 3) constant temperature processing method is: fan is fixed on the surface of product to be measured, distance
Product to be measured is less than 100cm, continues to product to be measured blowing more than 5min.
In the present invention, including step 5): by step 4) test result contrast with oil groove/tank test result,
Batch testing is carried out after determining accurately.
In the present invention, weight step 1) and 2) test at different temperatures repeatedly, accurate percentage deviation value X.
The beneficial effects of the present invention is: the test of NTC heat sensitive chip is turned by (1), the present invention by oil groove/tank environment
Becoming the test under normal environment, test environment is required low by it, and test process, without upper lower clamp, is directly tested,
Simplifying test process, improve testing efficiency, its test speed is about 8 times of oil groove method of testing；(2)、
The product surveyed can directly circulate entrance subsequent handling, it is not necessary to circulates after being carried out, it is to avoid polluted product again, letter
Change operation；(3), sound a buzzer and automatically judge whether product to be tested meets resistance essence by adjusting test instrunment
Degree requirement, it is to avoid artificial erroneous judgement.
Accompanying drawing explanation
Fig. 1 is that test environment of the present invention arranges schematic diagram.
Detailed description of the invention
Below in conjunction with the accompanying drawings the present invention is described in further detail.
The NTC heat sensitive chip method of testing of the present invention, specifically comprises the following steps that
1, use oil groove method of testing commonly used in the prior art, in batch product product to be measured, find 1 resistance close
The product of this batch of product specification central value RS, records resistance, as reference product；1 resistance is found under same environment
Value is close to this batch of product specification lower limit or the product of the upper limit, and record resistance is RC, as limit product.Calculating limit is produced
Product resistance and deviation C of specification central value RS, C=RC/RS-1.
2, reference product accesses the reference edge of critesistor tester, limit product accesses the test of HG2515 critesistor
The test lead of instrument, selects the sorting of comparison pattern, percentage display mode, draws the percentage between reference product and limit product
Deviation value X.In the present invention, the model of critesistor tester is HG2515 type, and manufacturer is that Shenzhen's Landtek instrument is limited
Company.
If the precision of 3 products to be measured is ± Y, then in critesistor tester, the resistance accuracy scope of certified products is set
It is set to: X+ (Y-C)-2Y to X+ (Y-C).
4, in the front upper place of critesistor tester 2, the surface of product to be measured 4 fixed installation fan 1, fan 1
Apart from product 4 distance to be measured within 100m, the wind direction of fan 1 is downward, as shown in Figure 1；
5, product 4 to be measured connects the test lead 3 of critesistor tester 2, and reference product connects critesistor tester
Reference edge 5, then start fan 1 and dry downwards more than 5min, it is ensured that the temperature of product 4 to be measured and reference product and
Ambient temperature keeps consistent, as shown in Figure 1；
6, start critesistor tester to test, if product resistance to be measured meets setting of critesistor tester scope
Fixed, then critesistor tester is sounded a buzzer, and points out product resistance to be measured qualified.
7, repeated execution of steps 1 to 6 carries out multiple batches of product test, and test product carries out oil groove test again, so
After carry out contrast determine correct after, carry out batch testing.
Illustrate with specific embodiment:
1, survey with in batch 1 close to this batch of product specification central value by oil groove method (oil sump temperature is set to 25 DEG C)
The resistance of the NTC heat sensitive chip of RS (central value is 10k Ω), its resistance is 9.98k Ω, as measuring resistance, i.e. base
Quasi-product；If the actual requirement test scope of this batch of product is R25:10k Ω ± 10%；Then, record in oil groove and connect
The NTC heat sensitive chip resistance RC of nearly one this batch product specification lower limit, its resistance is 9.83k Ω, as limit product；
2, deviation C of limit product resistance and specification central value RS, C=RC/RS-1=9.83/10-1=-0.017 are calculated.
3, measuring resistance accesses the reference edge of critesistor tester, limit product connects the test of critesistor tester
End, selects the sorting of comparison pattern, percentage display mode, compares the percentage deviation drawn between reference product and limit product
Value X, X:-0.015 (percentage is shown as-1.5%).
If the precision of 4 products to be measured is ± 2%, then by the resistance accuracy scope of certified products in critesistor tester
It is set as: X+ (Y-C)-2Y to X+ (Y-C), it may be assumed that-0.015+ (0.02+0.017)-2*0.02 is extremely
-0.015+ (0.02+0.017), final scope is-0.18% to+2.2%.
5, product to be measured connects the test lead of critesistor tester, and reference product connects the benchmark of critesistor tester
End, then starts fan and dries downwards 5min, start critesistor tester and test, if product resistance to be measured symbol sets
Fixed scope-0.18% is to+2.2%, then critesistor tester is sounded a buzzer, and points out product resistance to be measured qualified.
In actual test process, percentage deviation value X between reference product and limit product occurs with variation of ambient temperature
Fluctuation, therefore can repeatedly estimate in test process, determine the percentage deviation between reference product and limit product
Value X, to revise the Standard resistance range of certified products in critesistor tester.
Water can also be used as the oil groove method of testing that it will be appreciated by those skilled in the art that in technical solution of the present invention
Groove method of testing substitutes.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For Yuan, on the premise of without departing from the technology of the present invention principle, it is also possible to make some improvement and modification, these improve
Also protection scope of the present invention is should be regarded as with modification.
Claims (4)
1. the method for testing of a NTC heat sensitive chip, it is characterised in that comprise the following steps:
1), in a collection of product to be measured, 1 close product of resistance at arbitrary temperature is found by oil groove/tank method of testing
The product of product specification central value RS, records resistance, as reference product；And under described same temperature, find 1 resistance
Value is close to product specification lower limit or the product of higher limit, and record resistance is RC, as limit product；Calculate the resistance of limit product
Deviation C of value RC and specification central value product RS, C=RC/RS-1；
2), reference product accesses the reference edge of critesistor tester at normal temperatures, limit product accesses critesistor and surveys
Examination instrument is tested, and draws percentage deviation value X；
3) if Product Precision to be measured is ± Y, then in critesistor tester, the resistance accuracy scope of certified products is set
It is set to: X+ (Y-C)-2Y to X+ (Y-C)；
4), by product to be measured and reference product being placed under normal temperature environment and carry out constant temperature process, product to be measured connects temperature-sensitive electricity
The test lead of resistance tester, reference product connects the reference edge of critesistor tester to be tested, if product to be measured resistance
Value meets step 3) Standard resistance range that sets is then certified products.
The method of testing of NTC heat sensitive chip the most according to claim 1, it is characterised in that described step 3) constant temperature
Processing method is: fan is fixed on the surface of product to be measured, apart from product to be measured less than 100cm, continues to be measured
Product blowing more than 5min.
The method of testing of NTC heat sensitive chip the most according to claim 1 and 2, it is characterised in that include step
5) test result: by step 4) contrasts with oil groove/tank test result, carries out batch testing after determining accurately.
The method of testing of NTC heat sensitive chip the most according to claim 3, it is characterised in that: weight step 1) and
2) test at different temperatures repeatedly, accurate percentage deviation value X.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109701896A (en) * | 2019-03-12 | 2019-05-03 | 孝感华工高理电子有限公司 | The Curie temperature classification method of thermistor, apparatus and system |
| CN110703084A (en) * | 2019-11-08 | 2020-01-17 | 江苏嵘成电器有限公司 | Temperature characteristic detection method of thermosensitive switch |
| CN112146788A (en) * | 2020-09-28 | 2020-12-29 | 广东韶钢松山股份有限公司 | Thermal resistance verification system and method |
| CN117268594A (en) * | 2023-11-21 | 2023-12-22 | 深圳市天龙世纪科技发展有限公司 | Intelligent terminal NTC function test method, system and medium |
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| CN110703084A (en) * | 2019-11-08 | 2020-01-17 | 江苏嵘成电器有限公司 | Temperature characteristic detection method of thermosensitive switch |
| CN112146788A (en) * | 2020-09-28 | 2020-12-29 | 广东韶钢松山股份有限公司 | Thermal resistance verification system and method |
| CN117268594A (en) * | 2023-11-21 | 2023-12-22 | 深圳市天龙世纪科技发展有限公司 | Intelligent terminal NTC function test method, system and medium |
| CN117268594B (en) * | 2023-11-21 | 2024-01-26 | 深圳市天龙世纪科技发展有限公司 | Intelligent terminal NTC function test method, system and medium |
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| CN105841846B (en) | 2018-05-11 |
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Inventor after: Tang Chengping Inventor after: Liu Gang Inventor after: Wang Meifeng Inventor after: Gao Jin Inventor after: Xue Yunfeng Inventor after: Tang Min Inventor after: Wang Jing Inventor before: Tang Chengping Inventor before: Liu Gang Inventor before: Wang Meifeng Inventor before: Gao Jin Inventor before: Xue Yunfeng Inventor before: Tang Min |
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