CN111076846B - Test method and test system for body temperature probe - Google Patents
Test method and test system for body temperature probe Download PDFInfo
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- CN111076846B CN111076846B CN201911276221.0A CN201911276221A CN111076846B CN 111076846 B CN111076846 B CN 111076846B CN 201911276221 A CN201911276221 A CN 201911276221A CN 111076846 B CN111076846 B CN 111076846B
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- G01K15/00—Testing or calibrating of thermometers
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Abstract
The invention discloses a test method and a test system for a body temperature probe, wherein the test method comprises the following steps: respectively acquiring and judging the temperature accuracy sensitivity, the long-term stability and the temperature response sensitivity of a sample to be tested by adopting a testing system; the test system comprises a test platform and a temperature adjusting device, wherein the temperature adjusting device is used for providing test condition temperatures required by a sample to be tested, the test platform is used for arranging the sample to be tested in the temperature adjusting device and acquiring a detection result, and the temperature adjusting device comprises an environment temperature adjusting module and a test temperature adjusting module. Compared with the prior art, its beneficial effect lies in: the invention particularly provides a quality test monitoring method for a body temperature probe, ensures the quality of the body temperature probe, standardizes the test method for the body temperature probe and establishes a quality monitoring unified standard in the field of the body temperature probe; the provided test system is specially used for testing the body temperature probe so as to ensure the accuracy and quality stability of the body temperature probe.
Description
Technical Field
The invention relates to the technical field of body temperature probe testing devices, in particular to a testing method and a testing system for a body temperature probe.
Background
The thermometer is a maximum thermometer, also known as a medical thermometer, and known in the areas of Guangdong and hong Kong as a heat probe, which records the maximum temperature that the thermometer has measured. The most traditional thermometer is a glass thermometer, the working substance of which is mercury, and the thermometer has the characteristics of accurate indication value and high stability, and also has the advantages of low price and no need of an external power supply. With the development of scientific technology, many types of new thermometers have appeared. The electronic thermometer displays the body temperature in a digital form by utilizing the determined relation between physical parameters (such as resistance, voltage, current and the like) of certain substances and the ambient temperature, and has clear reading and convenient carrying. The electronic thermometer consists of a temperature sensor, a liquid crystal display, a button cell, an application specific integrated circuit and other electronic components, can quickly and accurately measure the body temperature of a human body, and has the advantages of convenient reading, short measurement time, high measurement precision, memory and buzzing prompt compared with the traditional mercury glass thermometer. The temperature sensor is a body temperature probe, is a core structure of the type of the clinical thermometer, and directly influences the accuracy of the indicating value.
The body temperature probe belongs to a medical instrument and is widely applied in clinic, so the accuracy of the body temperature probe is particularly important. Therefore, the state also issues a product standard YY0785-2010 'requirement on the performance of clinical thermometer continuous measurement' in 2010, the implementation of the standard is realized, the industry development of the continuous measurement electronic thermometer can be well guided and standardized, and the test is required to be carried out according to the standard YY0785-2010 before the product is sold on the market in order to ensure that the product performance of the body temperature probe meets the requirement. However, at present, no test system and standard test method specially used for the body temperature probe exist, and no uniform standard exists in the industry for quality control of the body temperature probe.
Disclosure of Invention
The invention aims to overcome at least one defect (deficiency) of the prior art, provides a test method for a body temperature probe, and particularly provides a quality test monitoring method for the body temperature probe, which ensures the quality of the body temperature probe, standardizes the test method for the body temperature probe and establishes a quality monitoring unified standard in the field of the body temperature probe.
Another object of the present invention is to provide a test system for a body temperature probe, which is specially used for testing the body temperature probe to ensure the accuracy and quality stability of the body temperature probe.
The technical scheme adopted by the invention is as follows:
a testing method for a body temperature probe, the testing method comprising: respectively acquiring and judging the temperature accuracy sensitivity, the long-term stability and the temperature response sensitivity of a sample to be tested by adopting a test system; the test system comprises a test platform and a temperature adjusting device, wherein the temperature adjusting device is used for providing test condition temperature required by a sample to be tested, the test platform is used for placing the sample to be tested in the temperature adjusting device and obtaining a detection result, and the temperature adjusting device comprises an environment temperature adjusting module and a test temperature adjusting module;
the method for judging the temperature accuracy and the sensitivity comprises the following steps: the sample to be tested is placed in the test temperature adjusting module, and the temperature of the sample to be tested is raised to 40-50 ℃ from 20-30 ℃ at equal intervals by adjusting and controlling the test temperature adjusting moduleExtracting m points in the temperature interval as test points to obtain the temperature T of the test points0Resistance value R of lower sample to be measured1The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer1Corresponding temperature value T1If the temperature value T is1At T0Within the range of +/-delta T, the temperature accuracy and the sensitivity of the sample to be detected are qualified, otherwise, the temperature accuracy and the sensitivity of the sample to be detected are unqualified;
the method for judging the long-term stability comprises the following steps: firstly, exposing a sample to be tested in the environment temperature adjusting module with the temperature of 50-60 ℃ for 250-350 h, then placing the sample to be tested in the testing temperature adjusting module, raising the temperature of the testing temperature adjusting module from 20-30 ℃ to 40-50 ℃ at equal intervals by adjusting and controlling the testing temperature adjusting module, testing the temperature accuracy and sensitivity of the sample to be tested, if the temperature accuracy and sensitivity of the sample to be tested is qualified under the condition, the long-term stability of the sample to be tested is qualified, otherwise, the long-term stability of the sample to be tested is unqualified;
the method for judging the temperature response sensitivity comprises the following steps: firstly, a sample to be tested is exposed in the environment temperature adjusting module with the temperature of 20-26 ℃, then the sample to be tested is placed in the constant temperature condition of the testing temperature adjusting module with the temperature of 40-48 ℃, and after waiting for delta T time, the sample is subjected to constant temperature T01Under the condition, n times of resistance value tests are carried out on the sample to be tested to obtain constant temperature T01Resistance value R of sample to be tested under the condition2The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer2Corresponding temperature value T2If the temperature value T is2At T01And within the range of +/-delta T, the temperature response sensitivity of the sample to be detected is qualified, otherwise, the temperature response sensitivity of the sample to be detected is unqualified.
When using a thermometer to test body temperature, the main performance requirements of our body temperature probe are: whether the temperature measurement is accurate or not can be accurately measured after the thermometer is used for a period of time, and the sensitivity is reflected by the test result after the temperature is switched and tested. According to the technical scheme, the quality test monitoring method for the body temperature probe is specifically provided by acquiring and judging the temperature accuracy sensitivity, the long-term stability and the temperature response sensitivity of the sample to be tested, the quality of the body temperature probe can be ensured, the test method of the body temperature probe is standardized, the quality monitoring unified standard in the field of the body temperature probe is established, and the quality judgment of the body temperature probe is more accurate.
Furthermore, in the method for judging the accuracy and the sensitivity of the temperature, the temperature rise interval of the test temperature adjusting module is regulated to be 0.05-0.1 ℃. In practical application, in order to ensure the accuracy of measurement, the temperature rise interval is considered to be reasonable within the range of 0.05-0.1 ℃.
Further, m and n are both 5-20. The larger the m and n are, the higher the requirements on temperature accuracy and sensitivity and temperature response sensitivity are, but the overlarge is not beneficial to actual operation, the too small can cause that the test accuracy cannot be guaranteed, and the comprehensive analysis is 5-20 most reasonable.
Further, the range of delta T is 0.1-0.3 ℃. The smaller the Delta T value is, the higher the precision requirement on measurement judgment is, and the larger the Delta T value is, the relative requirement is low, and appropriate parameters can be selected according to actual conditions in use.
Further, in the method for determining temperature response sensitivity, Δ t ranges from 130s to 170 s. Preferably, Δ t can be 150 directly. Regarding the sensitivity of temperature response, two aspects are actually considered, on one hand, the function of temperature measurement (within 150 s) is required to be completed by the body temperature probe within a limited time, and if the measurement time is too long, the expected purpose of monitoring the patient cannot be achieved; on the other hand, the temperature measurement accuracy of the body temperature probe needs to be ensured while the body temperature probe is required to quickly complete the temperature measurement, and if the temperature deviation is too large, the body temperature probe does not have significance even if the body temperature probe is pinched for a short time to complete the temperature measurement, so that the setting of delta t needs to be reasonable in the invention.
Further, the test platform further comprises an external power supply device, the test method further comprises the step of obtaining and judging the maximum energy dissipation property of the sample to be tested, and the judgment method of the maximum energy dissipation property comprises the following steps:
connecting a sample to be tested with the external power supply device, placing the sample to be tested in the test temperature adjusting module, controlling the test temperature adjusting module to keep the temperature of the test temperature adjusting module constant at 37 +/-0.2 ℃, inputting decreasing power supply voltage and current to the sample to be tested by controlling the external power supply device, respectively collecting the voltage U and the current I of the sample to be tested in each state, and converting a corresponding resistance value R3Calculating power P, and converting the resistance value R by looking up the relation table of resistance value and temperature value of the sample to be tested given by manufacturer3Corresponding temperature value T3And then linear fitting is carried out to obtain a relation curve of power and temperature: y is Ax + B, wherein y represents a power value and x represents a temperature value; when the variation value of x is equal to TwAnd if the variation value of the corresponding y is larger than the power supply energy consumption value given by the manufacturer, the maximum energy dissipation of the sample to be detected is qualified, otherwise, the maximum energy dissipation of the sample to be detected is unqualified.
The maximum energy dissipation is also another important parameter of the quality performance of the thermometer, and the invention also provides a method for detecting and judging the performance, thereby further standardizing and perfecting the quality monitoring of the body temperature probe.
Further, TwThe range of (A) is 0.01-0.03 ℃. Preferably, TwThe relation between X and Y in the power versus temperature curve can be chosen to be 0.02 c directly, which means that when we provide power Y to the temperature probe, we will influence the temperature X of the body temperature probe. For example, when the variation of X is equal to 0.02, the variation of Y is equal to 0.06mW, which means that when the power supplied to the body temperature probe is 0.06mW, the temperature rise of the body temperature probe will be affected by 0.02 ℃, therefore, in the judgment standard, the variation value of Y must be greater than the power consumption value given by the manufacturer, otherwise the measurement result of the body temperature probe will be affected. T iswThe smaller the value of (A), the smaller the power consumption of the body temperature probe is required to be, and the stricter the temperature change of the body temperature probe is.
Another objective of the present invention is to provide a testing system corresponding to the testing method for body temperature probe, wherein the testing system includes a testing platform and a temperature adjusting device; the test platform comprises a single chip microcomputer system and a test module, the test module is used for placing a sample to be tested in the temperature adjusting device and obtaining a detection value, and the single chip microcomputer is used for obtaining and analyzing a detection result and simultaneously controlling the test module and the temperature adjusting device; temperature regulation apparatus includes ambient temperature adjusting module and test temperature adjusting module, ambient temperature adjusting module is used for providing the required ambient temperature of the appearance that awaits measuring, test temperature adjusting module is used for providing the required test temperature of the appearance that awaits measuring.
Specifically, the test temperature adjusting module can be a rapid temperature adjusting water bath, and the water bath is used as a test temperature adjusting device, so that the test temperature adjusting module has the advantages of energy conservation, environmental protection and low cost; the environment temperature adjusting device can be a high-low temperature environment testing box, so that the sample to be tested has a temperature switching space, and the environment temperature adjusting device is matched with the rapid temperature adjusting water bath tank to simulate the use process of the sample to be tested and obtain a testing result.
Furthermore, the test module comprises a voltage and current detection device connected with the single chip microcomputer system, the voltage and current detection device is used for obtaining the current voltage and current value of the sample to be tested, so that the current resistance value of the sample to be tested can be obtained through direct conversion while the voltage and current value is obtained, the setting is simple, the use is convenient, and the data acquisition is complete.
Furthermore, the test platform further comprises an external power supply device connected with the single chip microcomputer system, and the external power supply device is used for providing external power supply voltage and current for the sample to be tested.
Furthermore, the test system also comprises a display system connected with the single chip microcomputer system, and the display system is used for displaying the detection result. Specifically, the display system may be a computer.
Compared with the prior art, the invention has the beneficial effects that:
the invention provides a test method for a body temperature probe, which is characterized in that the test system is used for respectively obtaining the temperature accuracy sensitivity, the long-term stability, the temperature response sensitivity and the maximum energy dissipation of a sample to be tested so as to judge the performance of the body temperature probe of the sample to be tested; in addition, the invention provides a test system for the body temperature probe, which is specially used for testing the body temperature probe so as to ensure the accuracy and the quality stability of the body temperature probe.
Drawings
FIG. 1 is a schematic diagram of the system of the present invention.
Detailed Description
The drawings are only for purposes of illustration and are not to be construed as limiting the invention. For a better understanding of the following embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product; it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
Examples
As shown in fig. 1, the present embodiment provides a test system for a body temperature probe, which comprises a test platform 10 and a temperature adjustment device 20; the test platform 10 comprises a single chip microcomputer system 12 and a test module 11, wherein the test module 11 is used for placing a sample to be tested in the temperature adjusting device 20 and obtaining a detection value, the single chip microcomputer is used for obtaining and analyzing a detection result, and meanwhile, the test module 11 and the temperature adjusting device 20 are controlled; temperature regulation apparatus 20 includes ambient temperature regulation module 21 and test temperature regulation module 22, ambient temperature regulation module 21 is used for providing the required ambient temperature of the appearance that awaits measuring, test temperature regulation module 22 is used for providing the required test temperature of the appearance that awaits measuring.
Specifically, the test temperature adjusting module 22 is a rapid temperature adjusting water bath, and the environment temperature adjusting device 20 is a high and low temperature environment test box, which is used to simulate the use process of the sample to be tested in cooperation with the rapid temperature adjusting water bath to obtain the test result.
Further, the test module 11 includes a voltage and current detection device connected to the single chip microcomputer system 12, where the voltage and current detection device is used to obtain the current voltage and current value of the sample to be tested, and when the resistance value needs to be known, the current voltage and current value is directly converted into the current resistance value of the sample to be tested.
Further, the test platform 10 further includes an external power supply device 13 connected to the single chip microcomputer system 12, and the external power supply device 13 is configured to provide an external power supply voltage and current for the sample to be tested.
Further, the test system further comprises a display system 30 connected with the single chip microcomputer system 12, and the display system 30 is used for displaying the detection result. Specifically, the display system 30 may be a computer.
The test method corresponding to the test system for the body temperature probe comprises the following steps: respectively acquiring and judging the temperature accuracy sensitivity, the long-term stability and the temperature response sensitivity of a sample to be tested by a test system;
the method for judging the temperature accuracy and the sensitivity comprises the following steps: placing the sample to be tested in a rapid temperature-regulating water bath, regulating and controlling the rapid temperature-regulating water bath through a singlechip system 12 to enable the temperature of the rapid temperature-regulating water bath to rise from 25 ℃ to 45 ℃ every 0.1 ℃, extracting 6 points in the temperature interval as test points, and obtaining the temperature T of the test points0Resistance value R of lower sample to be measured1The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer1Corresponding temperature value T1If the temperature value T is1At T0If the temperature accuracy and the sensitivity of the sample to be detected are within +/-0.1, the temperature accuracy and the sensitivity of the sample to be detected are qualified, otherwise, the temperature accuracy and the sensitivity of the sample to be detected are unqualified;
the method for judging the long-term stability comprises the following steps: firstly, exposing a sample to be tested in the environment temperature adjusting module 21 with the temperature of 55 ℃ for 288h, then placing the sample to be tested in the test temperature adjusting module 22, and adjusting and controlling the test temperature adjusting module 22 to enable the temperature of the sample to be tested to rise from 25 ℃ to 45 ℃ every 0.1 ℃, so as to test the temperature accuracy and sensitivity of the sample, wherein if the temperature accuracy and sensitivity of the sample under the condition is qualified, the long-term stability of the sample to be tested is qualified, otherwise, the long-term stability of the sample to be tested is unqualified;
the method for judging the temperature response sensitivity comprises the following steps: first exposing the sample to be tested to said ambient temperature regulation at a temperature of 23 ℃In the module 21, the sample to be tested is placed in the constant temperature condition of the test temperature adjusting module 22 with the temperature of 44 ℃, and after waiting for 150s, the sample is kept at the constant temperature T01Under the condition, n times of resistance value tests are carried out on the sample to be tested to obtain constant temperature T01Resistance value R of sample to be tested under the condition2The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer2Corresponding temperature value T2If the temperature value T is2At T01And if the temperature response sensitivity of the sample to be detected is within +/-0.1, the temperature response sensitivity of the sample to be detected is qualified, otherwise, the temperature response sensitivity of the sample to be detected is unqualified.
Further, the test platform 10 further includes an external power supply device 13, and the test method further includes obtaining and determining a maximum energy dissipation property of the sample to be tested, where the determination method of the maximum energy dissipation property is:
connecting a sample to be tested with the external power supply device 13, placing the sample to be tested in the test temperature adjusting module 22, controlling the test temperature adjusting module 22 to keep the temperature of the test temperature adjusting module 22 constant at 37 +/-0.2 ℃, inputting decreasing power supply voltage and current to the sample to be tested by controlling the external power supply device 13, respectively collecting the voltage U and the current I of the sample to be tested in each state, and converting a corresponding resistance value R3Calculating power P, and converting the resistance value R by looking up the relation table of resistance value and temperature value of the sample to be tested given by manufacturer3Corresponding temperature value T3And then linear fitting is carried out to obtain a relation curve of power and temperature: y is Ax + B, wherein y represents a power value and x represents a temperature value; and when the variation value of x is 0.02, the variation value of y is larger than the energy consumption value of the sample to be detected given by the manufacturer, the maximum energy dissipation property of the sample to be detected is qualified, otherwise, the maximum energy dissipation property of the sample to be detected is unqualified.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the technical solutions of the present invention, and are not intended to limit the specific embodiments of the present invention. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention claims should be included in the protection scope of the present invention claims.
Claims (10)
1. A testing method for a body temperature probe, the testing method comprising: respectively acquiring and judging the temperature accuracy sensitivity, the long-term stability and the temperature response sensitivity of a sample to be tested by adopting a test system; the test system comprises a test platform and a temperature adjusting device, wherein the temperature adjusting device is used for providing test condition temperature required by a sample to be tested, the test platform is used for placing the sample to be tested in the temperature adjusting device and obtaining a detection result, and the temperature adjusting device comprises an environment temperature adjusting module and a test temperature adjusting module;
the method for judging the temperature accuracy and the sensitivity comprises the following steps: placing a sample to be tested in the test temperature adjusting module, raising the temperature of the sample to be tested from 20-30 ℃ to 40-50 ℃ at equal intervals by adjusting and controlling the test temperature adjusting module, extracting m points in the temperature interval as test points, and obtaining the temperature T of the test points0Resistance value R of lower sample to be measured1The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer1Corresponding temperature value T1If the temperature value T is1At T0Within the range of +/-delta T, the temperature accuracy and the sensitivity of the sample to be detected are qualified, otherwise, the temperature accuracy and the sensitivity of the sample to be detected are unqualified;
the method for judging the long-term stability comprises the following steps: firstly, exposing a sample to be tested in the environment temperature adjusting module with the temperature of 50-60 ℃ for 250-350 h, then placing the sample to be tested in the testing temperature adjusting module, raising the temperature of the testing temperature adjusting module from 20-30 ℃ to 40-50 ℃ at equal intervals by adjusting and controlling the testing temperature adjusting module, testing the temperature accuracy and sensitivity of the sample to be tested, if the temperature accuracy and sensitivity of the sample to be tested is qualified under the condition, the long-term stability of the sample to be tested is qualified, otherwise, the long-term stability of the sample to be tested is unqualified;
the method for judging the temperature response sensitivity comprises the following steps: firstly, a sample to be tested is exposed in the environment temperature adjusting module with the temperature of 20-26 ℃, then the sample to be tested is placed in the constant temperature condition of the testing temperature adjusting module with the temperature of 40-48 ℃, and the likeAfter a time delta T, at a constant temperature T01Under the condition, n times of resistance value tests are carried out on the sample to be tested to obtain constant temperature T01Resistance value R of sample to be tested under the condition2The resistance value R is converted by looking up a relation table of the resistance value and the temperature value of the sample to be tested given by a manufacturer2Corresponding temperature value T2If the temperature value T is2At T01And within the range of +/-delta T, the temperature response sensitivity of the sample to be detected is qualified, otherwise, the temperature response sensitivity of the sample to be detected is unqualified.
2. The method as claimed in claim 1, wherein the temperature rise interval of the test temperature adjusting module is controlled to be 0.05-0.1 ℃ in the method for determining the accuracy and sensitivity of the temperature.
3. The method as claimed in claim 1, wherein m and n are in the range of 5-20.
4. A test method for a body temperature probe according to claim 1, wherein Δ T is in the range of 0.1-0.3 ℃.
5. The method as claimed in claim 1, wherein the range of Δ t is 130 s-170 s for the method of determining the temperature response sensitivity.
6. The test method for the body temperature probe according to any one of claims 1 to 5, wherein the test platform further comprises an external power supply device, the test method further comprises the step of obtaining and judging the maximum energy dissipation of the sample to be tested, and the judgment method for the maximum energy dissipation is as follows:
connecting a sample to be tested with the external power supply device, placing the sample to be tested in the test temperature adjusting module, controlling the test temperature adjusting module to keep the temperature of the test temperature adjusting module constant at 37 +/-0.2 ℃, and controlling the external power supplyThe source device inputs the decreasing power voltage and current to the sample to be measured, respectively collects the voltage U and current I of the sample to be measured in each state, and converts the corresponding resistance value R3Calculating power P, and converting the resistance value R by looking up the relation table of resistance value and temperature value of the sample to be tested given by manufacturer3Corresponding temperature value T3And then linear fitting is carried out to obtain a relation curve of power and temperature: y is Ax + B, wherein y represents a power value and x represents a temperature value; when the variation value of x is equal to TwIf the variation value of the corresponding y is larger than the energy consumption value of the sample to be detected given by the manufacturer, the maximum energy dissipation property of the sample to be detected is qualified, otherwise, the maximum energy dissipation property of the sample to be detected is unqualified.
7. A test method for a body temperature probe according to claim 6, wherein T is TwThe range of (A) is 0.01-0.03 ℃.
8. The test system corresponding to the test method for the body temperature probe according to the claims 1-5, wherein the test system comprises a test platform and a temperature adjusting device; the test platform comprises a single chip microcomputer system and a test module, the test module is used for placing a sample to be tested in the temperature adjusting device and obtaining a detection value, and the single chip microcomputer is used for obtaining and analyzing a detection result and simultaneously controlling the test module and the temperature adjusting device; temperature regulation apparatus includes ambient temperature adjusting module and test temperature adjusting module, ambient temperature adjusting module is used for providing the required ambient temperature of the appearance that awaits measuring, test temperature adjusting module is used for providing the required test temperature of the appearance that awaits measuring.
9. The system of claim 8, wherein the test platform further comprises an external power supply device connected to the single chip system, the external power supply device being configured to provide an external power supply voltage and current to the sample to be tested.
10. The system of claim 8, further comprising a display system connected to the single-chip microcomputer system, wherein the display system is configured to display the test results.
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| CN202018348U (en) * | 2010-09-09 | 2011-10-26 | 北京凌天世纪自动化技术有限公司 | Temperature sensor comprehensive verification bench |
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