CN112130771A - Storage control method and device for test chamber, electronic equipment and storage medium - Google Patents
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Abstract
The invention provides a storage control method and device of a test box, electronic equipment and a storage medium, which are characterized in that the size information of the used storage space of the test is obtained; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change; therefore, the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
Description
Technical Field
The invention relates to the technical field of environmental tests, in particular to a storage control method and device of a test chamber, electronic equipment and a storage medium.
Background
In environmental testing of a product, a test box is typically used for testing, and test data is stored in a memory of the test box. The storage space of the memory of the test chamber is limited, and when the storage space is used up, the data recorded first is automatically deleted in a first-in first-out mode generally so as to ensure that the subsequently collected test data can be recorded.
General proof box, before environmental test begins, usually need the artifical sampling frequency who sets up the test data, to the experiment that duration is long, if the sampling frequency sets up too big, can lead to storage space not enough, because the proof box can delete the data of first record with the mode of first-in first-out automatically, can lead to this experimental anterior segment test data of this time to lose totally to make the test data record incomplete.
Disclosure of Invention
In view of the foregoing disadvantages of the prior art, an object of the embodiments of the present application is to provide a storage control method and apparatus for a test box, an electronic device, and a storage medium, which can screen acquired data when a storage space is insufficient due to an excessively large sampling frequency, so as to avoid incomplete test data records.
In a first aspect, an embodiment of the present application provides a storage control method for a test chamber, which is used for the test chamber, and includes the steps of:
A1. obtaining the size information of the used storage space of the test;
A2. judging whether the size of the used storage space exceeds a preset first threshold value or not;
A3. if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test;
A4. and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change.
In the storage control method of the test chamber, step a3 includes:
calculating the size of the storage space required by each unit of test time according to the size of the used storage space and the test time;
calculating the size of the storage space required by the residual test time according to the size of the storage space required by each unit of test time;
judging whether the size of the storage space required by the residual test time exceeds the size of the residual storage space;
and if the size of the storage space required by the residual test time exceeds the size of the residual storage space, judging that the residual storage space is not enough to store the data of the residual test, and otherwise, judging that the residual storage space is enough to store the data of the residual test.
In the storage control method of the test box, the screening of the data acquired in the test specifically comprises the following steps:
calculating the change rate between two adjacent data;
determining a flat data section according to the change rate; the gentle data section is a data section of which the data quantity exceeds a preset quantity threshold value and the change rate between any two adjacent data is smaller than a second threshold value;
and deleting the data of the gentle data segment.
In some embodiments, the step of performing a pruning process on the data of the gentle data segment includes:
and deleting all data except the head data and the tail data of the gentle data section.
In other embodiments, the step of performing a pruning process on the data of the flat data segment includes:
deleting one data in the flat data section at preset intervals.
Further, before the data of the gentle data segment is subjected to the deletion processing, the method further includes:
and performing polynomial curve fitting on the gentle data section, and recording a fitting result.
In the storage control method of the test box, when the acquired data in the test is screened, the collected data is screened in a segmented mode from front to back according to a preset period; and after each section of data is screened, judging whether the remaining storage space is enough to store the data of the remaining test, and if the remaining storage space is enough to store the data of the remaining test, stopping screening the subsequent data.
In a second aspect, an embodiment of the present application provides a storage control apparatus for a test chamber, including:
the first acquisition module is used for acquiring the size information of the used storage space of the test;
the first judgment module is used for judging whether the size of the used storage space exceeds a preset first threshold value or not;
the second judgment module is used for judging whether the residual storage space is enough to store the data of the residual test or not when the size of the used storage space exceeds a preset first threshold;
and the screening module is used for screening the collected data in the test when the residual storage space is not enough to store the data of the residual test so as to reduce the data quantity in the time period with gentle parameter change.
In a third aspect, an embodiment of the present application provides an electronic device, which includes a processor and a memory, where the memory stores a computer program, and the processor is configured to execute the steps of the storage control method for a test chamber by calling the computer program stored in the memory.
In a fourth aspect, embodiments of the present application provide a storage medium, on which a computer program is stored, where the computer program runs the steps of the storage control method of the test chamber when being executed by a processor.
Has the advantages that:
according to the storage control method and device of the test box, the electronic equipment and the storage medium, the information of the size of the used storage space of the test is obtained; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change; therefore, the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
Drawings
Fig. 1 is a flowchart of a storage control method for a test chamber according to an embodiment of the present application.
Fig. 2 is a block diagram of a storage control apparatus of a test chamber according to an embodiment of the present application.
Fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. Meanwhile, in the description of the present application, the terms "first", "second", and the like are used only for distinguishing the description, and are not to be construed as indicating or implying relative importance.
Referring to fig. 1, the present application provides a storage control method for a test chamber, which is used for the test chamber (including but not limited to temperature test chamber, humidity test chamber, temperature and humidity test chamber, salt fog test chamber, dust and sand test chamber, aging test chamber, and other environmental test chambers), and includes the steps of:
A1. obtaining the size information of the used storage space of the test;
A2. judging whether the size of the used storage space exceeds a preset first threshold value or not;
A3. if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test;
A4. and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change.
In practical application, when an environmental test is carried out, data acquisition is carried out by using a higher sampling frequency, so that the change condition of parameters when the parameters are changed violently can be recorded better, but the data acquired when the parameters are stable or change slowly is excessive, and a large amount of space is occupied; according to the storage control method of the test box, only the data quantity in the time period with gentle parameter change is reduced by only screening the collected data, so that the change condition of the parameter when the parameter is changed violently can be well recorded, and the occupied space can be reduced; the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
The size of the used storage space in step a1 may be an absolute value or a relative value of the used storage space, where the absolute value refers to the number of bytes occupied, and the relative value refers to the ratio between the used storage space and the total available storage space; thus, in step a2, the first threshold corresponds to an absolute value or a relative value, and the size of the memory space mentioned in the following steps corresponds to an absolute value or a relative value.
Here, the total available memory space may refer to the total memory space of the memory for storing the experiment data, or may be the available memory space allocated to the experiment. In the former case, based on the first-in first-out principle, the storage space of the previous test data may be occupied when the test is performed, and the previous test data may be lost. In the latter case, the data of the test is only stored in the allocated storage space, and the data of the test in the past is not affected.
The first threshold is preferably a relative value, and the size of the first threshold can be set according to actual needs, for example, the first threshold is 80% of the total available storage space, but is not limited thereto.
In some embodiments, step a3 includes:
A301. calculating the size of the storage space required by each unit of test time according to the size of the used storage space and the test time;
A302. calculating the size of the storage space required by the residual test time according to the size of the storage space required by each unit of test time;
A303. judging whether the size of the storage space required by the residual test time exceeds the size of the residual storage space;
A304. and if the size of the storage space required by the residual test time exceeds the size of the residual storage space, judging that the residual storage space is not enough to store the data of the residual test, and otherwise, judging that the residual storage space is enough to store the data of the residual test.
In step a301, the size of the storage space required for each unit of test time can be obtained by dividing the size of the used storage space by the test time; in step a302, subtracting the performed test time from the preset total test time to obtain the remaining test time, and multiplying the size of the storage space required by each unit of test time by the remaining test time to obtain the size of the storage space required by the remaining test time; in step a303, the remaining storage size is equal to the total available storage size minus the used storage size.
Further, in step a4, the screening of the collected data in the test specifically includes:
calculating the change rate between two adjacent data;
determining a flat data section according to the change rate; the gentle data section is a data section of which the data quantity exceeds a preset quantity threshold value and the change rate between any two adjacent data is smaller than a second threshold value;
and deleting the data of the gentle data segment.
The change rate between two adjacent data refers to an absolute value of a ratio of a difference between data at a next moment and data at a previous moment to data at a previous moment, and the preset number threshold and the second threshold may be set according to actual conditions, for example, the preset number threshold is 10, and the second threshold is 10%, and when the change rate between any two adjacent data in a data segment of which the number of data exceeds 10 is less than 10%, the data segment may be regarded as a gentle data segment, but the present invention is not limited thereto. The parameters in the gentle data section change gently, and after the data is subjected to deletion processing to reduce the quantity, the residual data can better reflect the change condition of the parameters.
There are many ways to perform the puncturing process on the data of the gentle data segment.
For example, in the first embodiment, the step of performing the deletion process on the data of the gentle data segment includes:
and deleting all data except the head data and the tail data of the flat data section.
In this embodiment, only the first and last data of the gentle data segment are retained, and the released storage space is large, which is more suitable for the case where the size of the storage space required for the remaining trial time in step a303 exceeds the size of the remaining storage space.
For another example, in the second embodiment, the step of performing the deletion process on the data of the gentle data segment includes:
one data is deleted at every preset interval (hereinafter referred to as a first preset interval) in the gentle data section.
In this embodiment, if the first preset interval is 1, for example, every other data is deleted, but not limited thereto; the data retained by this method is more, and is more suitable for the case where the size of the storage space required for the remaining test time in step a303 exceeds the size of the remaining storage space and is smaller.
Or, for example, in the third embodiment, the step of performing the deletion process on the data of the gentle data segment includes:
one data is retained at every preset interval (hereinafter referred to as a second preset interval) in the gentle data section.
In this embodiment, the second preset interval, for example, 3, is one data per deletion of consecutive three data, but is not limited thereto. This embodiment provides a high flexibility and the user can adjust how much data is retained by setting the specific value of the second preset interval.
The manner of performing the deletion process on the data of the gentle data segment is not limited to this. In step a4, one of the ways may be selected to perform a pruning process on the data of the gentle data segment; a ratio threshold may also be preset, and if the ratio of the size of the storage space required for the remaining test time in step a303 to the size of the remaining storage space exceeds the ratio threshold, the deletion processing is automatically performed according to the first embodiment, otherwise, the deletion processing is performed according to the second embodiment or the third embodiment.
Further, in some preferred embodiments, before performing the deletion processing on the data of the gentle data segment, the method further includes:
and performing polynomial curve fitting on the gentle data section, and recording a fitting result.
In the prior art, there are many methods for fitting polynomial curves to experimental data, and here, no specific method is defined, and a specific fitting method can be selected as required. The user can calculate the approximate value of the deleted data according to the fitted polynomial, and only the coefficients of the polynomial obtained by fitting need to be recorded, so that the occupied space is small, for example, the polynomial obtained by fitting is a cubic polynomial: f (x) = ax3+bx2+ cx + d, only four coefficients a, b, c, d need to be recorded, and the amount of data to be deleted will usually greatly exceed four. The deleted data is stored in another sense by fitting a polynomial curve, so that the information carried by the data is prevented from completely disappearing, and a user can use the data as a reference for data analysis.
In some preferred embodiments, when the data acquired in the test is subjected to screening processing, the acquired data is subjected to screening processing in a segmented manner in a preset period from front to back; and after each section of data screening processing is completed, whether the remaining storage space is enough to store the data of the remaining test is judged (the size of the storage space required by the remaining test time is obtained by multiplying the current remaining test time by the size of the storage space required by each unit test time calculated in the step A301, if the size of the remaining storage space is not smaller than the size of the storage space required by the remaining test time, the remaining storage space is judged to be enough to store the data of the remaining test), and if the remaining storage space is enough to store the data of the remaining test, the subsequent data screening processing is stopped.
The preset period may be a time period or a data size length period; the data amount length period is, for example, 100, and every 100 pieces of data are a piece of processing target. When each pair of data is subjected to screening processing, a certain storage space is released, the released storage space belongs to the remaining storage space, and when the released storage space enables the remaining storage space to be enough for storing the data of the remaining test, the subsequent data does not need to be subjected to screening processing, so that the subsequent data can reflect the change condition of the parameter more truly. It should be noted that, while the collected data is subjected to the screening process, the test chamber is always collecting the data, and when the collected data which is not subjected to the screening process is not enough for one cycle, the screening process is performed after the collected data is enough.
Sometimes, if only the data amount in the time period in which the parameter change is gradual is reduced, the storage space possibly left is still insufficient to store the data of the remaining test, and at this time, the data acquired in the test may be subjected to secondary screening processing in the order from front to back, so as to reduce the data amount in the time period in which the parameter change is not gradual. Therefore, in some embodiments, the storage control method of the test chamber further comprises the steps of:
A5. judging whether the size of the used storage space exceeds a preset third threshold value or not;
A6. if the size of the used storage space exceeds a preset third threshold, judging whether the residual storage space is enough to store the data of the residual test;
A7. and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with non-smooth parameter change.
The third threshold is a preset value larger than the first threshold, and may be an absolute value or a relative value, preferably a relative value, and the size of the third threshold may be set according to actual needs, for example, the third threshold is 95% of the total available storage space, but is not limited thereto.
When the size of the used storage space exceeds the third threshold value and the remaining storage space is still insufficient to store the data of the remaining test, which indicates that the storage space is still insufficient after the data of the gentle data segment is deleted, the data of the non-gentle time segment needs to be deleted.
Wherein, step A7 includes:
determining a non-flat data section according to the time interval of the data in the acquired data; the flat data segment refers to a data segment in which the time interval between any two adjacent data is the same as the sampling period (i.e. the same as the reciprocal of the sampling frequency);
and sequentially deleting the data of each non-flat data segment from front to back until the residual storage space is enough to store the data of the residual test.
Because the data of the gentle data section is subjected to the deletion processing, only the time interval between the data which originally does not belong to the gentle data section in the rest collected data is kept to be the same as the sampling period, and therefore, the non-gentle data section can be determined through the length interval of the time interval.
The way of performing the pruning processing on the data of the non-flat data segment may be: reserving one data at every preset interval (hereinafter referred to as a third preset interval);
it can also be: dividing the non-flat data segment into a plurality of segments, and only keeping the maximum value and the minimum value of each segment; when segmenting, the segmentation can be carried out according to the preset segment number, and also can be carried out according to the preset segment length (namely the data quantity of each segment); for example, when the data are divided equally according to the preset number of segments, assuming that the preset number of segments is N and the number of data in a certain non-flat data segment is N1, the segment length l1= N1/N (rounding up to l 1) may be calculated first, then from front to back, each l1 data is a segment, and if the last remaining number of data is not enough for l1, the data are the last segment; for example, when the segmentation is performed according to the preset segment length l2, each l2 data is a segment from front to back, and if the last remaining amount of data is not enough for l2, the data is the last segment.
Similarly, in some preferred embodiments, before the data of the non-flat data segment is subjected to the pruning processing, a polynomial curve fitting may be performed on the non-flat data segment, and the fitting result may be recorded. The information carried by the data is prevented from completely disappearing, and the data can be used as the reference for data analysis by a user.
In the storage control method of the test box, the information of the size of the used storage space of the test is obtained; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change; therefore, the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
Referring to fig. 2, an embodiment of the present application further provides a storage control device for a test chamber, which is used for the test chamber and includes a first obtaining module 1, a first determining module 2, a second determining module 3, and a screening module 4;
the first obtaining module 1 is used for obtaining the used storage space size information of the test;
the first judging module 2 is configured to judge whether the size of the used storage space exceeds a preset first threshold;
the second judging module 3 is configured to judge whether the remaining storage space is enough to store the data of the remaining test when the size of the used storage space exceeds a preset first threshold;
the screening module 4 is configured to, when the remaining storage space is not enough to store the data of the remaining test, perform screening processing on the data acquired in the test to reduce the data amount in the time period in which the parameter change is gentle.
The size of the used storage space can be an absolute value or a relative value of the used storage space, wherein the absolute value refers to the number of occupied bytes, and the relative value refers to a ratio between the used storage space and the total usable storage space; accordingly, the first threshold corresponds to an absolute value or a relative value, and the size of the storage space mentioned later corresponds to an absolute value or a relative value.
Here, the total available memory space may refer to the total memory space of the memory for storing the experiment data, or may be the available memory space allocated to the experiment.
The first threshold is preferably a relative value, and the size of the first threshold can be set according to actual needs, for example, the first threshold is 80% of the total available storage space, but is not limited thereto.
In some embodiments, the second determination module 3, in determining whether the remaining storage space is sufficient to store the data of the remaining trial,
calculating the size of the storage space required by each unit of test time according to the size of the used storage space and the test time;
calculating the size of the storage space required by the residual test time according to the size of the storage space required by each unit of test time;
judging whether the size of the storage space required by the residual test time exceeds the size of the residual storage space;
and if the size of the storage space required by the residual test time exceeds the size of the residual storage space, judging that the residual storage space is not enough to store the data of the residual test, and otherwise, judging that the residual storage space is enough to store the data of the residual test.
Further, when the screening module 4 screens the collected data in the test,
calculating the change rate between two adjacent data;
determining a flat data section according to the change rate; the gentle data section is a data section of which the data quantity exceeds a preset quantity threshold value and the change rate between any two adjacent data is smaller than a second threshold value;
and deleting the data of the gentle data segment.
There are many ways to perform the puncturing process on the data of the gentle data segment.
In the first embodiment, for example, when the filtering module 4 performs the deletion process on the data of the flat data segment,
and deleting all data except the head data and the tail data of the flat data section.
For another example, in the second embodiment, when the filtering module 4 performs the deletion process on the data of the gentle data segment,
one data is deleted at every preset interval (hereinafter referred to as a first preset interval) in the gentle data section.
Or, for example, in the third embodiment, when the filtering module 4 performs the deletion processing on the data of the flat data segment,
one data is retained at every preset interval (hereinafter referred to as a second preset interval) in the gentle data section.
The manner of performing the deletion process on the data of the gentle data segment is not limited to this. The screening module 4 can select one of the modes to delete the data of the gentle data segment; a ratio threshold may also be preset, and if the ratio of the size of the storage space required by the remaining test time to the size of the remaining storage space exceeds the ratio threshold, the first embodiment is automatically adopted to perform the deletion processing, otherwise, the second embodiment or the third embodiment is adopted to perform the deletion processing.
Further, in some preferred embodiments, before the filtering module 4 performs the deletion processing on the data of the flat data segment, the polynomial curve fitting is also performed on the flat data segment, and the fitting result is recorded.
In some preferred embodiments, when the screening module 4 performs screening processing on the acquired data in the test, the screening processing is performed on the acquired data segments in a preset period from front to back; and after each section of data screening processing is finished, judging whether the remaining storage space is enough to store the data of the remaining test (the size of the storage space required by the remaining test time is obtained by multiplying the current remaining test time by the size of the storage space required by each unit of test time obtained by calculation, if the size of the remaining storage space is not smaller than the size of the storage space required by the remaining test time, judging that the remaining storage space is enough to store the data of the remaining test), and if the remaining storage space is enough to store the data of the remaining test, stopping the screening processing of the subsequent data.
In some embodiments, the storage control apparatus of the test chamber further comprises:
the third judging module is used for judging whether the size of the used storage space exceeds a preset third threshold value or not;
the fourth judging module is used for judging whether the residual storage space is enough to store the data of the residual test or not when the size of the used storage space exceeds a preset third threshold;
and the execution module is used for screening the acquired data in the test when the residual storage space is not enough to store the data of the residual test so as to reduce the data quantity in the time period with non-smooth parameter change.
The third threshold is a preset value larger than the first threshold, and may be an absolute value or a relative value, preferably a relative value, and the size of the third threshold may be set according to actual needs, for example, the third threshold is 95% of the total available storage space, but is not limited thereto.
When the size of the used storage space exceeds the third threshold value and the remaining storage space is still insufficient to store the data of the remaining test, which indicates that the storage space is still insufficient after the data of the gentle data segment is deleted, the data of the non-gentle time segment needs to be deleted.
Wherein, when the execution module carries out screening processing on the collected data in the test to reduce the data quantity in the time period with non-flat parameter change,
determining a non-flat data section according to the time interval of the data in the acquired data; the flat data segment refers to a data segment in which the time interval between any two adjacent data is the same as the sampling period (i.e. the same as the reciprocal of the sampling frequency);
and sequentially deleting the data of each non-flat data segment from front to back until the residual storage space is enough to store the data of the residual test.
Because the data of the gentle data section is subjected to the deletion processing, only the time interval between the data which originally does not belong to the gentle data section in the rest collected data is kept to be the same as the sampling period, and therefore, the non-gentle data section can be determined through the length interval of the time interval.
When the execution module performs deletion processing on the data of the non-flat data segment, one data may be retained at every preset interval (hereinafter referred to as a third preset interval);
the non-flat data segment can also be divided into a plurality of segments, and only the maximum value and the minimum value of each segment are reserved. When segmenting, the segmentation can be carried out according to the preset segment number, and also can be carried out according to the preset segment length (namely the data quantity of each segment); for example, when the data are divided equally according to the preset number of segments, assuming that the preset number of segments is N and the number of data in a certain non-flat data segment is N1, the segment length l1= N1/N (rounding up to l 1) may be calculated first, then from front to back, each l1 data is a segment, and if the last remaining number of data is not enough for l1, the data are the last segment; for example, when the segmentation is performed according to the preset segment length l2, each l2 data is a segment from front to back, and if the last remaining amount of data is not enough for l2, the data is the last segment.
Similarly, in some preferred embodiments, before the execution module performs the pruning processing on the data of the non-flat data segment, the execution module may also perform polynomial curve fitting on the non-flat data segment and record the fitting result. The information carried by the data is prevented from completely disappearing, and the data can be used as the reference for data analysis by a user.
In view of the above, the storage control device of the test chamber obtains the information of the size of the used storage space of the test; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change; therefore, the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
Referring to fig. 3, an electronic device 100 according to an embodiment of the present application further includes a processor 101 and a memory 102, where the memory 102 stores a computer program, and the processor 101 is configured to execute the steps of the storage control method for a test chamber by calling the computer program stored in the memory 102.
The processor 101 is electrically connected to the memory 102. The processor 101 is a control center of the electronic device 100, connects various parts of the entire electronic device using various interfaces and lines, and performs various functions of the electronic device and processes data by running or calling a computer program stored in the memory 102 and calling data stored in the memory 102, thereby performing overall monitoring of the electronic device.
The memory 102 may be used to store computer programs and data. The memory 102 stores computer programs containing instructions executable in the processor. The computer program may constitute various functional modules. The processor 101 executes various functional applications and data processing by calling a computer program stored in the memory 102.
In this embodiment, the processor 101 in the electronic device 100 loads instructions corresponding to one or more processes of the computer program into the memory 102, and the processor 101 runs the computer program stored in the memory 102 according to the following steps, so as to implement various functions: obtaining the size information of the used storage space of the test; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change.
Therefore, the electronic equipment acquires the size information of the used storage space of the test; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change; therefore, the collected data can be screened when the storage space is insufficient due to overlarge sampling frequency setting, and incomplete test data records are avoided.
The embodiment of the application also provides a storage medium, on which a computer program is stored, and the computer program runs the steps of the storage control method of the test box when being executed by a processor, so as to realize the following functions: obtaining the size information of the used storage space of the test; judging whether the size of the used storage space exceeds a preset first threshold value or not; if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test; and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change.
The storage medium may be implemented by any type of volatile or nonvolatile storage device or combination thereof, such as a Static Random Access Memory (SRAM), an Electrically Erasable Programmable Read-Only Memory (EEPROM), an Erasable Programmable Read-Only Memory (EPROM), a Programmable Read-Only Memory (PROM), a Read-Only Memory (ROM), a magnetic Memory, a flash Memory, a magnetic disk, or an optical disk.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, which are substantially the same as the present invention.
Claims (10)
1. A storage control method of a test chamber is used for the test chamber and is characterized by comprising the following steps:
A1. obtaining the size information of the used storage space of the test;
A2. judging whether the size of the used storage space exceeds a preset first threshold value or not;
A3. if the size of the used storage space exceeds a preset first threshold, judging whether the residual storage space is enough to store the data of the residual test;
A4. and if the residual storage space is not enough to store the data of the residual test, screening the acquired data in the test to reduce the data quantity in the time period with smooth parameter change.
2. A storage control method for a test chamber as claimed in claim 1, wherein step a3 includes:
calculating the size of the storage space required by each unit of test time according to the size of the used storage space and the test time;
calculating the size of the storage space required by the residual test time according to the size of the storage space required by each unit of test time;
judging whether the size of the storage space required by the residual test time exceeds the size of the residual storage space;
and if the size of the storage space required by the residual test time exceeds the size of the residual storage space, judging that the residual storage space is not enough to store the data of the residual test, and otherwise, judging that the residual storage space is enough to store the data of the residual test.
3. A storage control method for a test chamber according to claim 1, wherein in the step a4, the step of screening the collected data in the test specifically includes:
calculating the change rate between two adjacent data;
determining a flat data section according to the change rate; the gentle data section is a data section of which the data quantity exceeds a preset quantity threshold value and the change rate between any two adjacent data is smaller than a second threshold value;
and deleting the data of the gentle data segment.
4. A storage control method for a test chamber according to claim 3, wherein the step of performing a deletion process on the data of the gentle data section includes:
and deleting all data except the head data and the tail data of the gentle data section.
5. A storage control method for a test chamber according to claim 3, wherein the step of performing a deletion process on the data of the gentle data section includes:
deleting one data in the flat data section at preset intervals.
6. A storage control method for a test chamber according to claim 3, wherein before the deleting process is performed on the data of the gentle data section, the method further includes:
and performing polynomial curve fitting on the gentle data section, and recording a fitting result.
7. The storage control method of a test chamber according to claim 1, wherein when the data collected in the test is subjected to the screening process, the collected data is subjected to the screening process in segments at a preset period from front to back; and after each section of data is screened, judging whether the remaining storage space is enough to store the data of the remaining test, and if the remaining storage space is enough to store the data of the remaining test, stopping screening the subsequent data.
8. A storage control apparatus for a test chamber, comprising:
the first acquisition module is used for acquiring the size information of the used storage space of the test;
the first judgment module is used for judging whether the size of the used storage space exceeds a preset first threshold value or not;
the second judgment module is used for judging whether the residual storage space is enough to store the data of the residual test or not when the size of the used storage space exceeds a preset first threshold;
and the screening module is used for screening the collected data in the test when the residual storage space is not enough to store the data of the residual test so as to reduce the data quantity in the time period with gentle parameter change.
9. An electronic device, characterized in that it comprises a processor and a memory, in which a computer program is stored, said processor being adapted to carry out the steps of the storage control method of a test chamber according to any one of claims 1 to 7 by calling said computer program stored in said memory.
10. A storage medium on which a computer program is stored, the computer program, when executed by a processor, performing the steps of a storage control method for a test chamber according to any one of claims 1 to 7.
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