CN112053990A - 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 - Google Patents
一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 Download PDFInfo
- Publication number
- CN112053990A CN112053990A CN202010977627.8A CN202010977627A CN112053990A CN 112053990 A CN112053990 A CN 112053990A CN 202010977627 A CN202010977627 A CN 202010977627A CN 112053990 A CN112053990 A CN 112053990A
- Authority
- CN
- China
- Prior art keywords
- lead screw
- connecting piece
- wafer
- nut
- belt wheel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 20
- 239000004065 semiconductor Substances 0.000 title claims abstract description 10
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 235000012431 wafers Nutrition 0.000 title claims description 49
- 230000001360 synchronised effect Effects 0.000 claims abstract description 55
- 230000005540 biological transmission Effects 0.000 claims abstract description 9
- 210000000078 claw Anatomy 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 6
- 239000008358 core component Substances 0.000 abstract description 2
- 230000007704 transition Effects 0.000 abstract 1
- 230000033001 locomotion Effects 0.000 description 8
- 238000005096 rolling process Methods 0.000 description 5
- 230000001174 ascending effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010977627.8A CN112053990A (zh) | 2020-09-17 | 2020-09-17 | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010977627.8A CN112053990A (zh) | 2020-09-17 | 2020-09-17 | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN112053990A true CN112053990A (zh) | 2020-12-08 |
Family
ID=73603030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010977627.8A Pending CN112053990A (zh) | 2020-09-17 | 2020-09-17 | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN112053990A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115394706A (zh) * | 2022-09-27 | 2022-11-25 | 上海微崇半导体设备有限公司 | 一种晶圆装载装置和使用方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10321681A (ja) * | 1997-05-19 | 1998-12-04 | Nec Corp | ウエハプローバ及びテストボードの交換方法 |
KR20080055313A (ko) * | 2006-12-15 | 2008-06-19 | 세크론 주식회사 | 프로브 스테이션 및 이를 이용한 웨이퍼 검사방법 |
CN202330634U (zh) * | 2011-11-24 | 2012-07-11 | 杭州中为光电技术股份有限公司 | 一种用于测试led芯片的运动装置 |
CN103219267A (zh) * | 2013-04-10 | 2013-07-24 | 南京农业大学 | 一种晶圆测试自动传输系统 |
CN212434594U (zh) * | 2020-09-17 | 2021-01-29 | 河北博特半导体设备科技有限公司 | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 |
-
2020
- 2020-09-17 CN CN202010977627.8A patent/CN112053990A/zh active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10321681A (ja) * | 1997-05-19 | 1998-12-04 | Nec Corp | ウエハプローバ及びテストボードの交換方法 |
KR20080055313A (ko) * | 2006-12-15 | 2008-06-19 | 세크론 주식회사 | 프로브 스테이션 및 이를 이용한 웨이퍼 검사방법 |
CN202330634U (zh) * | 2011-11-24 | 2012-07-11 | 杭州中为光电技术股份有限公司 | 一种用于测试led芯片的运动装置 |
CN103219267A (zh) * | 2013-04-10 | 2013-07-24 | 南京农业大学 | 一种晶圆测试自动传输系统 |
CN212434594U (zh) * | 2020-09-17 | 2021-01-29 | 河北博特半导体设备科技有限公司 | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115394706A (zh) * | 2022-09-27 | 2022-11-25 | 上海微崇半导体设备有限公司 | 一种晶圆装载装置和使用方法 |
CN115394706B (zh) * | 2022-09-27 | 2023-06-16 | 上海微崇半导体设备有限公司 | 一种晶圆装载装置和使用方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN212434594U (zh) | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 | |
CN113394158A (zh) | —种单臂三自由度的晶圆传输机械手及使用方法 | |
CN111498407B (zh) | 治具输送装置以及治具输送方法 | |
CN112053990A (zh) | 一种用于半导体芯片生产过程中晶圆自动传输、测试的承片台 | |
CN215789945U (zh) | 带z轴升降功能的旋转夹爪 | |
CN112077365B (zh) | 一种五金材料加工用自动化钻孔设备及其操作方法 | |
CN209868142U (zh) | 一种可切换驱动的多工位扫光装置 | |
CN112247556B (zh) | 一种涡旋压缩机自动装配生产线及装配方法 | |
CN219226253U (zh) | 一种带寻边功能的晶圆取片装置 | |
CN210682355U (zh) | 自动输送生产线 | |
CN211469992U (zh) | 一种移料装置 | |
CN111383968A (zh) | 一种实现晶圆盘升降的固晶机内环模组及其升降方法 | |
CN220578193U (zh) | 一种半导体材料转送料机构 | |
CN109985824A (zh) | 一种led晶片自动分选机用z轴升降台组件 | |
CN213813642U (zh) | 高速磁洗温育测光装置 | |
CN217443181U (zh) | 一种可升降的载物台 | |
CN221184289U (zh) | 一种碗篮异形支架用自动成型及退料装置 | |
CN117457561B (zh) | 一种用于芯片封装的晶圆定位载台 | |
CN216056729U (zh) | 一种电机组装生产线中的旋转装置 | |
CN218039142U (zh) | 一种超薄晶圆对中结构 | |
CN216632473U (zh) | 一种同步换盘旋臂装置 | |
CN220029509U (zh) | 旋转下压一体化结构 | |
CN113029073B (zh) | 一种自动检测及筛选基板的设备及筛选方法 | |
CN220945021U (zh) | 一种半导体超结功率器件用零件定位工装 | |
CN215371635U (zh) | 一种晶圆台旋转机构 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20210224 Address after: 101125 room 1700, 75 Xinhua North Street, Tongzhou District, Beijing Applicant after: BEIJING GUIKE INTELLIGENT TECHNOLOGY Co.,Ltd. Address before: No.1 Hanwang Road, Yanjiao Development Zone, Sanhe City, Langfang City, Hebei Province 065201 Applicant before: Hebei Bote Semiconductor Equipment Technology Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20220623 Address after: 101300 0146, floor 3, building 1, yard 1, Shuangyu South Street, Shunyi District, Beijing Applicant after: Beijing Ketai optical core semiconductor equipment Technology Co.,Ltd. Address before: 101125 room 1700, 75 Xinhua North Street, Tongzhou District, Beijing Applicant before: BEIJING GUIKE INTELLIGENT TECHNOLOGY Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
CB02 | Change of applicant information |
Country or region after: China Address after: 101399 North Wenhuaying Village, Shunyi District, Beijing (No. 1, Shunchuang 2nd Road) Applicant after: Beijing Ruihuayu Semiconductor Equipment Co.,Ltd. Address before: 101300 0146, floor 3, building 1, yard 1, Shuangyu South Street, Shunyi District, Beijing Applicant before: Beijing Ketai optical core semiconductor equipment Technology Co.,Ltd. Country or region before: China |
|
CB02 | Change of applicant information | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20240318 Address after: 528248, No. 16 Guangming Avenue, New Light Source Industrial Base, Shishan Town, Nanhai District, Foshan City, Guangdong Province (Residence application, multiple photos for one address) Applicant after: Foshan Xince Technology Co.,Ltd. Country or region after: China Address before: 101399 North Wenhuaying Village, Shunyi District, Beijing (No. 1, Shunchuang 2nd Road) Applicant before: Beijing Ruihuayu Semiconductor Equipment Co.,Ltd. Country or region before: China |
|
TA01 | Transfer of patent application right |