CN112020574A - 具有周期性高电压偏压的等离子体增强cvd - Google Patents
具有周期性高电压偏压的等离子体增强cvd Download PDFInfo
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- CN112020574A CN112020574A CN201980028205.1A CN201980028205A CN112020574A CN 112020574 A CN112020574 A CN 112020574A CN 201980028205 A CN201980028205 A CN 201980028205A CN 112020574 A CN112020574 A CN 112020574A
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/515—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using pulsed discharges
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6336—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/24—Deposition of silicon only
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/34—Nitrides
- C23C16/345—Silicon nitride
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/517—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using a combination of discharges covered by two or more of groups C23C16/503 - C23C16/515
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
- H10P14/6902—Inorganic materials composed of carbon, e.g. alpha-C, diamond or hydrogen doped carbon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/965,621 US10840086B2 (en) | 2018-04-27 | 2018-04-27 | Plasma enhanced CVD with periodic high voltage bias |
| US15/965,621 | 2018-04-27 | ||
| PCT/US2019/024430 WO2019209453A1 (en) | 2018-04-27 | 2019-03-27 | Plasma enhanced cvd with periodic high voltage bias |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112020574A true CN112020574A (zh) | 2020-12-01 |
Family
ID=68292808
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980028205.1A Pending CN112020574A (zh) | 2018-04-27 | 2019-03-27 | 具有周期性高电压偏压的等离子体增强cvd |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US10840086B2 (https=) |
| JP (2) | JP7678670B2 (https=) |
| KR (2) | KR20200136048A (https=) |
| CN (1) | CN112020574A (https=) |
| TW (1) | TWI771577B (https=) |
| WO (1) | WO2019209453A1 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11515191B2 (en) * | 2018-10-26 | 2022-11-29 | Applied Materials, Inc. | Graded dimple height pattern on heater for lower backside damage and low chucking voltage |
| TWI718698B (zh) * | 2018-10-29 | 2021-02-11 | 瑞士商巴柏斯特麥克斯合資公司 | 全像箔供給裝置以及燙金印刷機 |
| US12131903B2 (en) * | 2020-08-06 | 2024-10-29 | Applied Materials, Inc. | Pulsed-plasma deposition of thin film layers |
| US12142459B2 (en) * | 2020-09-08 | 2024-11-12 | Applied Materials, Inc. | Single chamber flowable film formation and treatments |
| US11699571B2 (en) | 2020-09-08 | 2023-07-11 | Applied Materials, Inc. | Semiconductor processing chambers for deposition and etch |
| US20220298636A1 (en) * | 2021-03-22 | 2022-09-22 | Applied Materials, Inc. | Methods and apparatus for processing a substrate |
| FR3131433B1 (fr) * | 2021-12-29 | 2023-12-22 | Commissariat Energie Atomique | Procédé d’activation d’une couche exposée |
| JP2023170791A (ja) * | 2022-05-20 | 2023-12-01 | 東京エレクトロン株式会社 | 改質方法及び改質装置 |
| KR102939653B1 (ko) * | 2022-12-09 | 2026-03-13 | 성균관대학교산학협력단 | 고 종횡 비 반도체 구조물의 갭을 채우기 위한 다중 펄스를 이용한 원자층 증착 장치 및 이를 이용한 원자층 증착방법 |
Citations (8)
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| JPH06314660A (ja) * | 1993-03-04 | 1994-11-08 | Mitsubishi Electric Corp | 薄膜形成法及びその装置 |
| US6071797A (en) * | 1995-10-12 | 2000-06-06 | Nec Corporation | Method for forming amorphous carbon thin film by plasma chemical vapor deposition |
| CN101110347A (zh) * | 2006-07-17 | 2008-01-23 | 应用材料公司 | 具有静电卡盘电压反馈控制的双偏置频率等离子体反应器 |
| CN101122015A (zh) * | 2007-09-11 | 2008-02-13 | 东华大学 | 常压等离子体气相沉积制备纳米硅基多孔发光材料的方法 |
| CN101552187A (zh) * | 2008-03-31 | 2009-10-07 | 东京毅力科创株式会社 | 等离子体处理装置和等离子体处理方法 |
| US20130260057A1 (en) * | 2012-04-03 | 2013-10-03 | Novellus Systems, Inc. | Continuous plasma and rf bias to regulate damage in a substrate processing system |
| CN105789040A (zh) * | 2015-01-09 | 2016-07-20 | 应用材料公司 | 用于光刻覆盖改进的半导体应用的栅极叠层材料 |
| CN106057636A (zh) * | 2015-04-01 | 2016-10-26 | 应用材料公司 | 在3d nand存储设备中用于提高竖直蚀刻性能的膜的等离子体增强化学气相沉积 |
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| DE69017744T2 (de) | 1989-04-27 | 1995-09-14 | Fuji Electric Co Ltd | Gerät und Verfahren zur Bearbeitung einer Halbleitervorrichtung unter Verwendung eines durch Mikrowellen erzeugten Plasmas. |
| JP2623475B2 (ja) * | 1993-10-22 | 1997-06-25 | 日本高周波株式会社 | 対向電極型マイクロ波プラズマ処理装置および処理方法 |
| JP4013271B2 (ja) * | 1997-01-16 | 2007-11-28 | 日新電機株式会社 | 物品表面処理方法及び装置 |
| JP3141827B2 (ja) | 1997-11-20 | 2001-03-07 | 日本電気株式会社 | 半導体装置の製造方法 |
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| US20060194516A1 (en) * | 2005-01-31 | 2006-08-31 | Tokyo Electron Limited | Processing apparatus and processing method |
| US20070031609A1 (en) | 2005-07-29 | 2007-02-08 | Ajay Kumar | Chemical vapor deposition chamber with dual frequency bias and method for manufacturing a photomask using the same |
| US20110236806A1 (en) * | 2010-03-25 | 2011-09-29 | Applied Materials, Inc. | Dc voltage charging of cathode for plasma striking |
| JP2012104382A (ja) | 2010-11-10 | 2012-05-31 | Tokyo Electron Ltd | プラズマ処理装置及びプラズマ処理方法並びにプラズマ処理のバイアス電圧決定方法 |
| US9157730B2 (en) | 2012-10-26 | 2015-10-13 | Applied Materials, Inc. | PECVD process |
| EP2738790A1 (en) * | 2012-11-28 | 2014-06-04 | Abengoa Solar New Technologies, S.A. | Procedure for preparing one single barrier and/or dielectric layer or multilayer on a substrate and device for the implementation thereof |
| KR102064914B1 (ko) * | 2013-03-06 | 2020-01-10 | 삼성전자주식회사 | 식각 공정 장치 및 식각 공정 방법 |
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| US20190088518A1 (en) * | 2017-09-20 | 2019-03-21 | Applied Materials, Inc. | Substrate support with cooled and conducting pins |
-
2018
- 2018-04-27 US US15/965,621 patent/US10840086B2/en active Active
-
2019
- 2019-03-27 KR KR1020207033826A patent/KR20200136048A/ko not_active Ceased
- 2019-03-27 WO PCT/US2019/024430 patent/WO2019209453A1/en not_active Ceased
- 2019-03-27 KR KR1020237040881A patent/KR102849073B1/ko active Active
- 2019-03-27 JP JP2020559532A patent/JP7678670B2/ja active Active
- 2019-03-27 CN CN201980028205.1A patent/CN112020574A/zh active Pending
- 2019-04-02 TW TW108111626A patent/TWI771577B/zh active
-
2020
- 2020-10-14 US US17/070,821 patent/US12094707B2/en active Active
-
2023
- 2023-11-13 JP JP2023193056A patent/JP2024028701A/ja active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06314660A (ja) * | 1993-03-04 | 1994-11-08 | Mitsubishi Electric Corp | 薄膜形成法及びその装置 |
| US6071797A (en) * | 1995-10-12 | 2000-06-06 | Nec Corporation | Method for forming amorphous carbon thin film by plasma chemical vapor deposition |
| CN101110347A (zh) * | 2006-07-17 | 2008-01-23 | 应用材料公司 | 具有静电卡盘电压反馈控制的双偏置频率等离子体反应器 |
| CN101122015A (zh) * | 2007-09-11 | 2008-02-13 | 东华大学 | 常压等离子体气相沉积制备纳米硅基多孔发光材料的方法 |
| CN101552187A (zh) * | 2008-03-31 | 2009-10-07 | 东京毅力科创株式会社 | 等离子体处理装置和等离子体处理方法 |
| US20130260057A1 (en) * | 2012-04-03 | 2013-10-03 | Novellus Systems, Inc. | Continuous plasma and rf bias to regulate damage in a substrate processing system |
| CN105789040A (zh) * | 2015-01-09 | 2016-07-20 | 应用材料公司 | 用于光刻覆盖改进的半导体应用的栅极叠层材料 |
| CN106057636A (zh) * | 2015-04-01 | 2016-10-26 | 应用材料公司 | 在3d nand存储设备中用于提高竖直蚀刻性能的膜的等离子体增强化学气相沉积 |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20200136048A (ko) | 2020-12-04 |
| US10840086B2 (en) | 2020-11-17 |
| KR102849073B1 (ko) | 2025-08-25 |
| KR20230165880A (ko) | 2023-12-05 |
| US20210028012A1 (en) | 2021-01-28 |
| WO2019209453A1 (en) | 2019-10-31 |
| TW201945586A (zh) | 2019-12-01 |
| US12094707B2 (en) | 2024-09-17 |
| US20190333764A1 (en) | 2019-10-31 |
| TWI771577B (zh) | 2022-07-21 |
| JP7678670B2 (ja) | 2025-05-16 |
| JP2024028701A (ja) | 2024-03-05 |
| JP2021522415A (ja) | 2021-08-30 |
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