CN111912967A

CN111912967A - Classification and identification method of large-size glass substrate

Info

Publication number: CN111912967A
Application number: CN202010812499.1A
Authority: CN
Inventors: 朱永迁; 侯建伟; 朱猛; 权立振
Original assignee: Bengbu Zhongguangdian Technology Co Ltd
Current assignee: Bengbu Zhongguangdian Technology Co Ltd
Priority date: 2020-08-13
Filing date: 2020-08-13
Publication date: 2020-11-10

Abstract

The invention discloses a classifying and identifying method of a large-size glass substrate, which comprises the following steps: a. establishing a defect classification code table according to the defect types of the glass substrate; b. establishing a plane rectangular coordinate system, and determining the origin of coordinates of the glass to be identified; c. determining an X axis of glass to be marked; d. determining the Y axis of the glass to be marked; e. drawing a glass plane rectangular coordinate graph according to the determined glass coordinate system to be identified; f. judging the defect to be located in the area range of the glass to be identified, and distinguishing the defect by adopting colors, wherein the area range refers to the working surface, the non-working surface or the glass body of the glass to be identified; g. identifying the defect position parallel to the X axis by using coordinates; h. identifying the defect position parallel to the Y axis by using coordinates; i. merging and marking the defect types, the area ranges and the defect coordinates, and establishing a database for storing marking results; the method can be used for quickly, accurately and uniquely identifying the glass defects and is convenient for electronic management.

Description

Classification and identification method of large-size glass substrate

Technical Field

The invention relates to the technical field of glass defect inspection, in particular to a classifying and identifying method for a large-size glass substrate.

Background

The surface inspection of the large-size glass substrate confirms the existence of the defects by using a method combining an inspection machine and manual reinspection, the defects need to be identified, and at present, various methods are used by various families in China to identify the positions of the defects.

Currently, the marking method near the shortest characteristic position of the glass is generally adopted, for example:

1. 500mm from a certain angle at a certain orientation, example: c3 corner 500mm left lower part)

2. 100mm in a certain orientation from a certain edge, example: left short side and right side 100mm

3. At the glass center point mill orientation 700mm, example: the center point is 700mm to the right

The conventional identification method has the following disadvantages:

firstly, the defect position identification has no uniqueness, and the labeling coordinates of the same position are different according to different characteristic positions.

Secondly, the defect position marks are not uniform, and confusion is easy to occur in different procedures.

Thirdly, the defect position identification is not standard, which easily causes the understanding error.

And fourthly, graphical marking and classification marking are not achieved, and a countermeasure is inconvenient.

And fifthly, the electronic file is not convenient to inquire and trace.

Disclosure of Invention

The invention aims to provide a classifying and identifying method for a large-size glass substrate, which can quickly, accurately and uniquely identify glass defects and is convenient for electronic management.

The technical scheme adopted by the invention for solving the technical problems is as follows:

a classifying and marking method for large-size glass substrates comprises the following steps:

a. establishing a defect classification code table according to the defect types of the glass substrate;

b. establishing a plane rectangular coordinate system, and determining the origin of coordinates of the glass to be identified;

c. determining an X axis of glass to be marked;

d. determining the Y axis of the glass to be marked;

e. drawing a glass plane rectangular coordinate graph according to the determined glass coordinate system to be identified;

f. judging the defect to be located in the area range of the glass to be identified, and distinguishing the defect by adopting colors, wherein the area range refers to the working surface, the non-working surface or the glass body of the glass to be identified;

g. identifying the defect position parallel to the X axis by using coordinates;

h. identifying the defect position parallel to the Y axis by using coordinates;

i. and merging and marking the defect types, the area ranges and the defect coordinates, and establishing a database for storing marking results.

Further, the defect types of the step a comprise edge processing defects, surface processing defects, cleaning defects, vitreous body defects, glass surface defects and conventional defects.

Further, the processing defects comprise chipping, cracking, under grinding, over grinding and edge burning.

Further, the surface processing defects comprise unqualified waviness, unqualified roughness, grinding scratches, under grinding, over grinding and grinding liquid residues.

Further, the cleaning defects comprise dirt, wheel marks and water stains.

Further, the vitreous defects include bubbles, stones, PT, striae, and tin penetration.

Further, the glass surface defects comprise scratches, ADG and sucker marks.

Further, the conventional defects include chipping and particle defects.

The defect position identification has uniqueness, is uniform and cannot be confused among different procedures; through defect classification and graphical identification, the identification is easy to understand; in addition, the defects are identified and then stored through a database, so that the defects can be conveniently inquired and traced.

Drawings

The invention is further illustrated with reference to the following figures and examples:

FIG. 1 is a schematic of the present invention.

Detailed Description

As shown in fig. 1, the present invention provides a classifying and marking method for a large-sized glass substrate, comprising the steps of:

the defect types comprise edge processing defects, surface processing defects, cleaning defects, glass body defects, glass surface defects and conventional defects;

the processing defects comprise chipping, cracking, under grinding, over grinding and edge burning;

the surface processing defects comprise unqualified waviness, unqualified roughness, grinding scratch, under grinding, over grinding and grinding fluid residue;

cleaning defects comprise dirt, wheel marks and water stains;

the defects of the vitreous body comprise bubbles, stones, PT, stripes and tin penetration;

the defects of the glass surface comprise scratches, ADG and sucker marks;

conventional defects include debris, particle defects;

the established defect classification code table is shown in table 1:

TABLE 1

according to different glass flow sheet directions, different coordinate systems can be selected to mark the defect position, including but not limited to a first quadrant coordinate, a second quadrant coordinate, a fourth quadrant coordinate and a fourth quadrant coordinate;

in the embodiment, the first quadrant coordinate is adopted, so that the lower left corner of the glass is determined to be the origin of the surface coordinate of the glass;

c. determining an X axis of glass to be marked; preferentially selecting the direction parallel to the long edge of the glass as an X axis, and also selecting the direction parallel to the flow sheet direction as the X axis;

d. determining the Y axis of the glass to be marked; preferentially selecting the direction parallel to the short edge of the glass as a Y axis, and also selecting the direction vertical to the flow sheet as the Y axis;

in the embodiment, the surface A is a working surface, the surface B is a non-working surface, the surface I is in a vitreous body, and the surface A is marked by red, the surface B is marked by blue, and the surface I is marked by purple;

g. identifying the defect position parallel to the X axis by using coordinates; such as defective W-WH A surfaces (X450-1050, Y1880);

h. identifying the defect position parallel to the Y axis by using coordinates; such as defect V-ST B plane (X285, Y975-1800);

for the defects of the similar rectangular area, using diagonal coordinates of the rectangle to mark the area where the defects are located; (X1, Y1: X2, Y2), for example, defect P-NW A face (X1675, Y215: X2450, Y935);

for a circle-like region, the center point coordinates are used, and the diameter identifies the region, such as defect: W-ST B plane (X2100, Y1650, R400) and defect V-ST I plane (X: 700, Y650, R10);

for the defect of a certain edge, coordinate definition can be directly used, and the edges of the C3 corner and the C4 corner in the figure can be marked as X2600 edges;

The foregoing is merely a preferred embodiment of the invention and is not intended to limit the invention in any manner; those skilled in the art can make numerous possible variations and modifications to the present teachings, or modify equivalent embodiments to equivalent variations, without departing from the scope of the present teachings, using the methods and techniques disclosed above. Therefore, any simple modification, equivalent replacement, equivalent change and modification made to the above embodiments according to the technical essence of the present invention are still within the scope of the protection of the technical solution of the present invention.

Claims

1. A classifying and marking method for a large-size glass substrate is characterized by comprising the following steps:

c. determining an X axis of glass to be marked;

d. determining the Y axis of the glass to be marked;

g. identifying the defect position parallel to the X axis by using coordinates;

h. identifying the defect position parallel to the Y axis by using coordinates;

2. The method as claimed in claim 1, wherein the defect types of step a include edge processing defect, surface processing defect, cleaning defect, glass body defect, glass surface defect and general defect.

3. The method as claimed in claim 2, wherein the processing defects include chipping, cracking, under-grinding, over-grinding and edge burning.

4. The method as claimed in claim 2, wherein the surface processing defects include waviness defect, roughness defect, grinding scratch, under grinding, over grinding and grinding fluid residue.

5. The method as claimed in claim 2, wherein the cleaning defects include smudging, wheel marks, and water stains.

6. The method as claimed in claim 2, wherein the glass bulk defect comprises bubble, stone, PT, streak, tin penetration.

7. The method as claimed in claim 2, wherein the glass surface defects include scratches, ADG, suction cup marks.

8. The method as claimed in claim 2, wherein the normal defects include chips and particle defects.