CN111796178A - Elevator detection subsystem response time testing system and method - Google Patents
Elevator detection subsystem response time testing system and method Download PDFInfo
- Publication number
- CN111796178A CN111796178A CN202010800378.5A CN202010800378A CN111796178A CN 111796178 A CN111796178 A CN 111796178A CN 202010800378 A CN202010800378 A CN 202010800378A CN 111796178 A CN111796178 A CN 111796178A
- Authority
- CN
- China
- Prior art keywords
- detection subsystem
- electrically connected
- circuit
- power supply
- response time
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 119
- 238000012360 testing method Methods 0.000 title claims abstract description 90
- 230000004044 response Effects 0.000 title claims abstract description 40
- 238000000034 method Methods 0.000 title claims description 15
- 230000003287 optical effect Effects 0.000 claims description 15
- 239000003990 capacitor Substances 0.000 claims description 13
- 238000010586 diagram Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 6
- 230000008569 process Effects 0.000 description 5
- 230000009471 action Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 230000026676 system process Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2829—Testing of circuits in sensor or actuator systems
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Maintenance And Inspection Apparatuses For Elevators (AREA)
- Indicating And Signalling Devices For Elevators (AREA)
Abstract
The invention discloses a system for testing the response time of an elevator detection subsystem, which comprises an industrial personal computer, a collection card, an on-off circuit, a detection circuit, a first power supply and a second power supply, wherein the industrial personal computer is connected with the collection card; the industrial personal computer is electrically connected with the acquisition card; the on-off circuit is electrically connected with the acquisition card, the first power supply and the detection subsystem board; the first power supply is electrically connected with the detection subsystem board; the detection circuit is electrically connected with the acquisition card, the second power supply and the detection subsystem board; the second power supply is electrically connected with the detection subsystem board. The invention has simple structure, reduces cost, realizes automatic detection function, automatically generates test result and improves measurement quality and efficiency.
Description
Technical Field
The invention relates to the research field of elevator safety detection, in particular to a system and a method for testing response time of an elevator detection subsystem.
Background
The elevator is in a dangerous state when being opened and is easy to cause safety accidents. In view of this, the modification No. 1 of the national standard GB 7588 and 2003 Elevator manufacturing and installation safety Specification published in 7 months of 2015 makes a request for the protection device for the accidental movement of the car.
The car accidental movement protection device is used for preventing the elevator from moving or stopping the movement within a specified range when any element of a driving main machine or a driving control system fails to cause the car to move away from a landing accidentally under the condition that landing doors are not locked and the car doors are not closed, and the elevator puts higher requirements on the reliability of a brake. Therefore, the shearing and extrusion accidents caused by the accidental operation of the elevator under the condition that the landing door and the car door are not closed can be prevented and reduced.
The car accidental movement protection device comprises a detection subsystem for detecting the car accidents, a braking subsystem for braking the car to move accidentally and a self-monitoring subsystem for monitoring the normal work of the braking subsystem. According to the test requirements of TSG T7007-2016 elevator type test rule on the detection subsystem: simulating the accidental movement of the lift car, enabling the detection sensor to send out a detection signal, observing whether the action sequence and the action output condition of the circuit are correct or not, and carrying out 10 times of tests; and recording the response time of the detection subsystem by using a time recording instrument, namely the time difference between the time when the detection subsystem sends a braking signal and the time when the detection sensor sends a detection signal.
The action response time of the detection subsystem comprises the following parts: the response time of the sensor, the response time of the subsystem board, and the response time of the contactor controlling the braking circuit are detected. The detection sensor and the contactor are standard products, response time tests can be directly referred to after the response time tests, and a type test mechanism mainly completes the response time tests of the detection subsystem board.
At present, a type test mechanism inputs on-off signals of a detection subsystem board through a plurality of mechanical switches, detects off signals of the detection subsystem board through an oscilloscope, and obtains response time of the detection subsystem board by arranging a marked line on a display board of the oscilloscope.
The current test system and method mainly have the following problems: 1. the mechanical switch is required to be manually operated during each test, and operation errors are easily caused during operation due to more switches; 2. marking lines are required to be manually set on an oscilloscope for each test result, and the reading of the response time is completed; 3. each test picture needs to be captured on the oscilloscope and stored in the USB flash disk. In general, the existing testing method has the disadvantages of complicated process, complex operation, easy error and incapability of ensuring the measuring efficiency and quality.
Disclosure of Invention
The invention mainly aims to overcome the defects and shortcomings of the prior art and provide a response time testing system of an elevator detection subsystem, which realizes an automatic detection function, automatically generates a test result and improves the measurement quality and efficiency.
Another object of the present invention is to provide a method for testing the response time of an elevator detection subsystem.
The purpose of the invention is realized by the following technical scheme:
a system for testing response time of an elevator detection subsystem is characterized by comprising an industrial personal computer, a collection card, an on-off circuit, a detection circuit, a first power supply and a second power supply; the industrial personal computer is electrically connected with the acquisition card; the acquisition card, the on-off circuit and the first power supply are electrically connected to the elevator detection subsystem board in sequence; the on-off circuit is electrically connected with the elevator detection subsystem board; the acquisition card, the detection circuit and the second power supply are electrically connected to the elevator detection subsystem board in sequence; the detection circuit is electrically connected with the elevator detection subsystem board.
Further, the on-off circuit comprises K on-off sub-circuits; the first on-off sub-circuit comprises a first resistor and a first optical coupler; one end of the input end of the first optical coupler is connected to a digital I/O port of the acquisition card through a first resistor, the other end of the input end of the first optical coupler is electrically connected with the ground port of the acquisition card, one end of the output end of the first optical coupler is electrically connected with a negative electrode of a first power supply, and the other end of the output end of the first optical coupler is electrically connected with the elevator detection subsystem board.
Further, the detection circuit comprises a full-wave rectification circuit, a second resistor, a capacitor and a third resistor; one end of the input end of the full-wave rectifying circuit is electrically connected with a second power supply zero line, the other end of the input end of the full-wave rectifying circuit is connected with the elevator detection subsystem board, one end of the output end of the full-wave rectifying circuit is connected with one end of a second resistor, and the other end of the output end of the full-wave rectifying circuit is electrically connected with a capacitor to a third resistor; the other end of the second resistor is electrically connected with the capacitor to the third resistor.
Furthermore, the high-voltage end of the third resistor is connected with an analog interface of the acquisition card.
Further, the first power supply positive electrode is electrically connected with the elevator detection subsystem board.
Further, the second power supply positive electrode or the live wire is electrically connected with the elevator detection subsystem board.
The other purpose of the invention is realized by the following technical scheme:
a method for testing the response time of an elevator detection subsystem is realized by adopting a system for testing the response time of the elevator detection subsystem, and comprises the following steps:
s1, under the condition of power failure, according to the circuit diagram of the detection subsystem board, the interface of the detection subsystem board is accessed to the corresponding ports of the test system and the power supply;
s2, starting a test system and a power supply, and initializing the test system;
s3, selecting the corresponding model of the detection subsystem board, reading the data in the database by the test system, obtaining the test data, and carrying out automatic test;
s4, the test system draws the level signal of the digital I/O interface electrically connected with the on-off sub-circuit and the voltage signal of the analog interface electrically connected with the detection circuit 4 on the same curve chart, and obtains the response time of the detection sub-system by calculating the time difference from the low level signal appearing on the digital I/O port to the time when the voltage signal of the analog interface returns to zero basically; processing and storing the test data, and generating a test result and a test curve after completing L tests circularly;
and S5, reading the test result and the test curve to finish the test.
Further, the database is a detection subsystem database and is established by adopting LabVIEW programming through an industrial personal computer.
Further, L is more than or equal to 10.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. the test system has a simple structure, can finish the automatic detection of the detection subsystem board by calling the database data, has a quick whole test process, can directly read and use the test result, and greatly improves the measurement efficiency;
2. the invention can improve the measurement quality, the software automatically processes the measurement result, and the reliability of the measurement precision is greatly improved.
Drawings
FIG. 1 is a schematic diagram of an elevator detection subsystem response time testing system according to the present invention;
FIG. 2 is a schematic diagram of an on-off circuit of a response time testing system of an elevator detection subsystem according to the present invention;
FIG. 3 is a schematic diagram of a detection circuit of a response time testing system of an elevator detection subsystem according to the present invention;
fig. 4 is a flow chart of a method for testing response time of an elevator detection subsystem according to the present invention.
In the figure, 1-an industrial personal computer, 2-an acquisition card, 3-an on-off circuit, 4-a detection circuit, 5-a first power supply, 6-a second power supply, 301-a resistor, 302-an optical coupler, 401-a full-wave rectifying circuit, 402-a second resistor, 403-a capacitor and 404-a third resistor.
Detailed Description
The present invention will be described in further detail with reference to examples and drawings, but the present invention is not limited thereto.
Example (b):
in this embodiment, the input ports of the testing subsystem board mainly include 24 power input ports, an upper leveling switch, a lower leveling switch, and a microcomputer relay input port. The output port is two interfaces controlled by the input port, and when the input port is completely conducted, the two output interfaces are conducted; when any one of the input ports is disconnected, the two output ports are disconnected.
The motion process of the detection subsystem board when the lift car moves accidentally is simulated, the input interfaces of the detection subsystem board are all in a conduction state under the normal state of opening the door in advance or leveling and leveling, the output interfaces are conducted, and the elevator door lock loop is in short circuit. When the elevator moves accidentally, the upper leveling switch or the lower leveling switch is switched off, and the output interface is switched off. And the time difference from the disconnection of the upper leveling switch or the lower leveling switch to the disconnection of the output interface is the response time of the detection subsystem board.
A system for testing the response time of an elevator detection subsystem is shown in figure 1 and comprises an industrial personal computer 1, a collection card 2, an on-off circuit 3, a detection circuit 4, a first power supply 5 and a second power supply 6; the acquisition card 2 adopts a PCI-6221 type data acquisition card developed by American National Instruments (NI), and the industrial personal computer 1 is electrically connected with the acquisition card 2; the acquisition card 2, the on-off circuit 3 and the first power supply 5 are electrically connected to the elevator detection subsystem board in sequence, and the first power supply 5 is a 24V direct-current output power supply; the on-off circuit 3 is electrically connected with the elevator detection subsystem board; the acquisition card 2, the detection circuit 4 and the second power supply 6 are electrically connected to the elevator detection subsystem board in sequence, and the second power supply 6 is an AC110V output power supply; the detection circuit 4 is electrically connected with the elevator detection subsystem board.
The on-off circuit 3 comprises 5 same on-off sub-circuits; the first on-off sub-circuit comprises a first resistor 301 and a first optocoupler 302, and a schematic diagram of the on-off circuit 3 is shown in fig. 2; the first optical coupler 302 is an optical coupler of TLP127 model of Toshiba, Japan, one end of the input end of the first optical coupler is connected to the digital I/O port of the acquisition card 2 through the first resistor 301, the other end of the input end is electrically connected to the ground port of the acquisition card 2, and the acquisition card 2 has five different digital I/O ports; the output voltage of the digital I/O port of the acquisition card 2 is in two states of 0V or 5V, and the resistance value of the first resistor 301 is 150 omega; one end of the output end of the first optocoupler 302 is electrically connected with the cathode of the first power supply 5, and the anode of the first power supply 5 is electrically connected with the elevator detection subsystem board; the other end of the output end is electrically connected to an input port of the elevator detection subsystem board; when the digital I/O port of the acquisition card 2 outputs 0V low voltage, the output end of the first optical coupler 302 is in a cut-off state, and the analog detection sensor is in a cut-off state at the moment. When the I/O port outputs 5V high voltage, the output end of the first optocoupler 302 is in a conducting state, and the conducting state of the sensor is simulated and detected at the moment.
The detection circuit 4 comprises a full-wave rectification circuit 401, a second resistor 402, a capacitor 403 and a third resistor 404, and the schematic diagram of the detection circuit is shown in fig. 3; the full-wave rectifying circuit 401 selects a rectifying circuit of KBL02 model, and the second power supply 6 is a 110V alternating current power supply. One end of the input end of the full-wave rectifying circuit 401 is electrically connected with a zero line of a second power supply 6, and the other end of the input end of the full-wave rectifying circuit is connected with an elevator detection subsystem board; the live wire of the second power supply 6 is electrically connected with the elevator detection subsystem board; one end of the second resistor 402 is connected to one end of the output end of the full-wave rectification circuit 401, and the other end of the second resistor 402 is electrically connected to the capacitor 403 and the third resistor 404; the other end of the output end of the full-wave rectifying circuit 401 is electrically connected with a capacitor 403 and a third resistor 404; the capacitance of the capacitor 403 is 5 muF, the resistance of the third resistor 404 is 30 omega, the discharge time constant of the capacitor 403 is 0.15ms, and the test requirement can be met by comparing the response time of the detection subsystem board for tens of milliseconds. The resistance of the second resistor 402 is 400 Ω, and the maximum voltage of the full-wave rectified output is 110V × 1.2 — 132V. The high voltage end of the third resistor 404 is connected with the analog interface of the acquisition card 2.
From the above parameters, the voltage peak input to the analog interface of the acquisition card 2 is:
and the maximum voltage value of the analog interface of the acquisition card 2 is 10V, so that the requirement is met. When the output port of the detection subsystem board is not open, the voltage of the third resistor 404 will not return to zero due to the function of the capacitor 403, and therefore, the on/off of the output port can be determined by determining whether the voltage on the third resistor 404 is zero.
The industrial personal computer 1 adopts LabVIEW programming and establishes a detection subsystem database. LabVIEW programmed software is adopted to control the output of the digital I/O port, so that the on-off of the input signal of the detection subsystem board is controlled. Meanwhile, the on-off of the output port of the subsystem board is monitored and detected through the analog interface. The response time of the detection subsystem board is obtained by calculating the time difference between sending a disconnection signal to the input port and detecting the disconnection of the output port. The principle and the circuit structure of the detection subsystem boards of various manufacturers are approximately similar, so that the test process of the commonly used detection subsystem board can be programmed into a database, and all detection can be automatically completed by software.
A method for testing response time of an elevator detection subsystem is disclosed, as shown in figure 4, according to a circuit diagram of a detection subsystem board, a detection subsystem board interface is accessed to corresponding ports of a test system and a power supply; starting a test system, selecting a corresponding model of a detection subsystem board in software, reading data in a database by the system, and carrying out automatic test; the system processes and stores the test data, and generates a test result and a test curve after 10 tests are completed circularly.
Further, the method comprises the following steps:
s1, under the condition of power failure, according to the circuit diagram of the detection subsystem board, the interface of the detection subsystem board is accessed to the corresponding ports of the test system and the power supply;
s2, starting a test system and a power supply, and initializing the system;
s3, selecting the corresponding model of the detection subsystem in the software, and starting to test;
s4, after the system automatically completes 10 times of cycle tests, generating a test result and a test curve;
and S5, reading the test result and the test curve to finish the test.
The above embodiments are preferred embodiments of the present invention, but the present invention is not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention should be construed as equivalents thereof, and all such changes, modifications, substitutions, combinations, and simplifications are intended to be included in the scope of the present invention.
Claims (9)
1. A system for testing response time of an elevator detection subsystem is characterized by comprising an industrial personal computer, a collection card, an on-off circuit, a detection circuit, a first power supply and a second power supply; the industrial personal computer is electrically connected with the acquisition card; the acquisition card, the on-off circuit and the first power supply are electrically connected to the elevator detection subsystem board in sequence; the on-off circuit is electrically connected with the elevator detection subsystem board; the acquisition card, the detection circuit and the second power supply are electrically connected to the elevator detection subsystem board in sequence; the detection circuit is electrically connected with the elevator detection subsystem board.
2. The elevator detection subsystem response time testing system of claim 1, wherein said on-off circuit comprises K on-off sub-circuits; the first on-off sub-circuit comprises a first resistor and a first optical coupler; one end of the input end of the first optical coupler is connected to a digital I/O port of the acquisition card through a first resistor, the other end of the input end of the first optical coupler is electrically connected with the ground port of the acquisition card, one end of the output end of the first optical coupler is electrically connected with a negative electrode of a first power supply, and the other end of the output end of the first optical coupler is electrically connected with the elevator detection subsystem board.
3. The elevator detection subsystem response time test system of claim 1, wherein said detection circuit comprises a full wave rectifier circuit, a second resistor, a capacitor, a third resistor; one end of the input end of the full-wave rectifying circuit is electrically connected with a second power supply zero line, the other end of the input end of the full-wave rectifying circuit is connected with the elevator detection subsystem board, one end of the output end of the full-wave rectifying circuit is connected with one end of a second resistor, and the other end of the output end of the full-wave rectifying circuit is electrically connected with a capacitor to a third resistor; the other end of the second resistor is electrically connected with the capacitor to the third resistor.
4. The elevator detection subsystem response time testing system of claim 3, wherein said third resistive high voltage terminal is connected to an acquisition card analog interface.
5. The elevator detection subsystem response time testing system of claim 1, wherein the first power supply positive electrode is electrically connected to the elevator detection subsystem board.
6. The elevator detection subsystem response time testing system of claim 1, wherein the second positive power supply or hot line is electrically connected to the elevator detection subsystem board.
7. An elevator detection subsystem response time testing method is realized by adopting the elevator detection subsystem response time testing system of any one of claims 1-6, and is characterized by comprising the following steps:
s1, under the condition of power failure, according to the circuit diagram of the detection subsystem board, the interface of the detection subsystem board is accessed to the corresponding ports of the test system and the power supply;
s2, starting a test system and a power supply, and initializing the test system;
s3, selecting the corresponding model of the detection subsystem board, reading the data in the database by the test system, obtaining the test data, and carrying out automatic test;
s4, the test system draws the level signal of the digital I/O interface electrically connected with the on-off sub-circuit and the voltage signal of the analog interface electrically connected with the detection circuit on the same curve chart, and obtains the response time of the detection sub-system by calculating the time difference from the low level signal appearing on the digital I/O port to the time when the voltage signal of the analog interface returns to zero basically; processing and storing the test data, and generating a test result and a test curve after completing L tests circularly;
and S5, reading the test result and the test curve to finish the test.
8. The method for testing the response time of the elevator detection subsystem according to claim 7, wherein the database is a detection subsystem database and is established by an industrial personal computer by adopting LabVIEW programming.
9. The elevator detection subsystem response time testing method of claim 7, wherein L ≧ 10.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010800378.5A CN111796178A (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time testing system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010800378.5A CN111796178A (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time testing system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111796178A true CN111796178A (en) | 2020-10-20 |
Family
ID=72833957
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010800378.5A Pending CN111796178A (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time testing system and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111796178A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202710692U (en) * | 2012-06-04 | 2013-01-30 | 苏州路之遥科技股份有限公司 | Single-phase alternating current load connection and disconnection detection circuit |
| CN106115400A (en) * | 2016-08-01 | 2016-11-16 | 上海盛蒂斯自动化设备股份有限公司 | Intelligent elevator safety detecting system and detection method |
| EP3192760A1 (en) * | 2016-01-13 | 2017-07-19 | Kone Corporation | Method for testing operation of an elevator and elevator |
| CN208182404U (en) * | 2018-04-18 | 2018-12-04 | 广州广日电梯工业有限公司 | A kind of detection device of elevator brake braking response time |
| CN110065861A (en) * | 2018-01-24 | 2019-07-30 | 日立楼宇技术（广州）有限公司 | Detection method, device, equipment and the storage medium of accidental movement of elevator cage |
| CN210795416U (en) * | 2018-01-25 | 2020-06-19 | 上海市特种设备监督检验技术研究院 | Elevator brake braking response time detection device |
| CN212301770U (en) * | 2020-08-11 | 2021-01-05 | 广东省特种设备检测研究院 | Elevator detection subsystem response time test system |
-
2020
- 2020-08-11 CN CN202010800378.5A patent/CN111796178A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202710692U (en) * | 2012-06-04 | 2013-01-30 | 苏州路之遥科技股份有限公司 | Single-phase alternating current load connection and disconnection detection circuit |
| EP3192760A1 (en) * | 2016-01-13 | 2017-07-19 | Kone Corporation | Method for testing operation of an elevator and elevator |
| CN106115400A (en) * | 2016-08-01 | 2016-11-16 | 上海盛蒂斯自动化设备股份有限公司 | Intelligent elevator safety detecting system and detection method |
| CN110065861A (en) * | 2018-01-24 | 2019-07-30 | 日立楼宇技术（广州）有限公司 | Detection method, device, equipment and the storage medium of accidental movement of elevator cage |
| CN210795416U (en) * | 2018-01-25 | 2020-06-19 | 上海市特种设备监督检验技术研究院 | Elevator brake braking response time detection device |
| CN208182404U (en) * | 2018-04-18 | 2018-12-04 | 广州广日电梯工业有限公司 | A kind of detection device of elevator brake braking response time |
| CN212301770U (en) * | 2020-08-11 | 2021-01-05 | 广东省特种设备检测研究院 | Elevator detection subsystem response time test system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105717406B (en) | Automatic data bus line integrity verification device | |
| US11404223B2 (en) | Method and device for diagnosing wear of an electrical switching unit, and electrical unit comprising such a device | |
| CN106610460A (en) | Vehicle cable automatic detection device and method | |
| CN105751519B (en) | The safety control system and control method of 3D printer | |
| CN212301770U (en) | Elevator detection subsystem response time test system | |
| CN105738797A (en) | Mainboard testing assembly and testing method | |
| CN112255562B (en) | System and method for testing performance of direct-current power supply board card | |
| EP3652549A1 (en) | Ground fault detection of ups battery | |
| CN111908283A (en) | Response time detection device and method for elevator car accidental movement protection device | |
| CN117970175A (en) | Plug connector detection system and detection method | |
| CN111796178A (en) | Elevator detection subsystem response time testing system and method | |
| CN111874771A (en) | Elevator car accidental movement protection device testing system and method | |
| CN212356115U (en) | Response time detection device for elevator car accidental movement protection device | |
| CN103018163A (en) | Fault detection method and fault detection device | |
| CN102288894B (en) | Method and device for testing functional circuit of touch screen of motherboard | |
| TW201412027A (en) | Matrix testing method and system and voltage clock control method | |
| CN216670128U (en) | Device for testing entrance guard module | |
| CN102445651A (en) | Device for testing touch screen functional circuit on circuit board | |
| CN212356116U (en) | Elevator car accidental movement protection device test system | |
| EP0493504A1 (en) | Input/output module having a combination input/output point. | |
| CN210347864U (en) | Automatic checking device for key characteristics of nuclear-grade commercial item relay | |
| CN112461114A (en) | Detection device of inductive sensor, automobile and automobile body height detection method of automobile | |
| CN110609226A (en) | DC contactor pull-in release time detection circuit and method | |
| US7030794B2 (en) | System, method, and software for testing electrical devices | |
| CN220252133U (en) | Integrated testing device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |