CN212301770U - Elevator detection subsystem response time test system - Google Patents
Elevator detection subsystem response time test system Download PDFInfo
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- CN212301770U CN212301770U CN202021655534.5U CN202021655534U CN212301770U CN 212301770 U CN212301770 U CN 212301770U CN 202021655534 U CN202021655534 U CN 202021655534U CN 212301770 U CN212301770 U CN 212301770U
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Abstract
The utility model discloses a response time testing system of an elevator detection subsystem, which comprises an industrial personal computer, an acquisition card, an on-off circuit, a detection circuit, a first power supply and a second power supply; the industrial personal computer is electrically connected with the acquisition card; the on-off circuit is electrically connected with the acquisition card, the first power supply and the detection subsystem board; the first power supply is electrically connected with the detection subsystem board; the detection circuit is electrically connected with the acquisition card, the second power supply and the detection subsystem board; the second power supply is electrically connected with the detection subsystem board. The utility model discloses simple structure, reduce cost realizes the automated inspection function simultaneously, and the automatic test result that generates improves measurement quality and efficiency.
Description
Technical Field
The utility model relates to an elevator safety inspection's research field, in particular to elevator detects subsystem response time test system.
Background
The elevator is in a dangerous state when being opened and is easy to cause safety accidents. In view of this, the modification No. 1 of the national standard GB 7588 and 2003 Elevator manufacturing and installation safety Specification published in 7 months of 2015 makes a request for the protection device for the accidental movement of the car.
The car accidental movement protection device is used for preventing the elevator from moving or stopping the movement within a specified range when any element of a driving main machine or a driving control system fails to cause the car to move away from a landing accidentally under the condition that landing doors are not locked and the car doors are not closed, and the elevator puts higher requirements on the reliability of a brake. Therefore, the shearing and extrusion accidents caused by the accidental operation of the elevator under the condition that the landing door and the car door are not closed can be prevented and reduced.
The car accidental movement protection device comprises a detection subsystem for detecting the car accidents, a braking subsystem for braking the car to move accidentally and a self-monitoring subsystem for monitoring the normal work of the braking subsystem. According to the test requirements of TSG T7007-2016 elevator type test rule on the detection subsystem: simulating the accidental movement of the lift car, enabling the detection sensor to send out a detection signal, observing whether the action sequence and the action output condition of the circuit are correct or not, and carrying out 10 times of tests; and recording the response time of the detection subsystem by using a time recording instrument, namely the time difference between the time when the detection subsystem sends a braking signal and the time when the detection sensor sends a detection signal.
The action response time of the detection subsystem comprises the following parts: the response time of the sensor, the response time of the subsystem board, and the response time of the contactor controlling the braking circuit are detected. The detection sensor and the contactor are standard products, response time tests can be directly referred to after the response time tests, and a type test mechanism mainly completes the response time tests of the detection subsystem board.
At present, a type test mechanism inputs on-off signals of a detection subsystem board through a plurality of mechanical switches, detects off signals of the detection subsystem board through an oscilloscope, and obtains response time of the detection subsystem board by arranging a marked line on a display board of the oscilloscope.
The current test system and method mainly have the following problems: 1. the mechanical switch is required to be manually operated during each test, and operation errors are easily caused during operation due to more switches; 2. marking lines are required to be manually set on an oscilloscope for each test result, and the reading of the response time is completed; 3. each test picture needs to be captured on the oscilloscope and stored in the USB flash disk. In general, the existing testing method has the disadvantages of complicated process, complex operation, easy error and incapability of ensuring the measuring efficiency and quality.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a main aim at overcomes prior art's shortcoming and not enough, provides an elevator detection subsystem response time test system, realizes the automated inspection function, and the automatic test result that generates improves measurement quality and efficiency.
The purpose of the utility model is realized through the following technical scheme:
a system for testing response time of an elevator detection subsystem is characterized by comprising an industrial personal computer, a collection card, an on-off circuit, a detection circuit, a first power supply and a second power supply; the industrial personal computer is electrically connected with the acquisition card; the acquisition card, the on-off circuit and the first power supply are electrically connected to the elevator detection subsystem board in sequence; the on-off circuit is electrically connected with the elevator detection subsystem board; the acquisition card, the detection circuit and the second power supply are electrically connected to the elevator detection subsystem board in sequence; the detection circuit is electrically connected with the elevator detection subsystem board.
Further, the on-off circuit comprises K on-off sub-circuits; the first on-off sub-circuit comprises a first resistor and a first optical coupler; one end of the input end of the first optical coupler is connected to a digital I/O port of the acquisition card through a first resistor, the other end of the input end of the first optical coupler is electrically connected with the ground port of the acquisition card, one end of the output end of the first optical coupler is electrically connected with a negative electrode of a first power supply, and the other end of the output end of the first optical coupler is electrically connected with the elevator detection subsystem board.
Further, the detection circuit comprises a full-wave rectification circuit, a second resistor, a capacitor and a third resistor; one end of the input end of the full-wave rectifying circuit is electrically connected with a second power supply zero line, the other end of the input end of the full-wave rectifying circuit is connected with the elevator detection subsystem board, one end of the output end of the full-wave rectifying circuit is connected with one end of a second resistor, and the other end of the output end of the full-wave rectifying circuit is electrically connected with a capacitor to a third resistor; the other end of the second resistor is electrically connected with the capacitor to the third resistor.
Furthermore, the high-voltage end of the third resistor is connected with an analog interface of the acquisition card.
Further, the first power supply positive electrode is electrically connected with the elevator detection subsystem board.
Further, the second power supply positive electrode or the live wire is electrically connected with the elevator detection subsystem board.
The working principle of the utility model is as follows:
the method comprises the following steps:
s1, under the condition of power failure, according to the circuit diagram of the detection subsystem board, the interface of the detection subsystem board is accessed to the corresponding ports of the test system and the power supply;
s2, starting a test system and a power supply, and initializing the test system;
s3, selecting the corresponding model of the detection subsystem board, reading the data in the detection subsystem database by the test system, obtaining the test data, and carrying out automatic test; the detection subsystem database is established by adopting LabVIEW programming through an industrial personal computer;
s4, the test system draws the level signal of the digital I/O interface electrically connected with the on-off sub-circuit and the voltage signal of the analog interface electrically connected with the detection circuit 4 on the same curve chart, and obtains the response time of the detection sub-system by calculating the time difference from the low level signal appearing on the digital I/O port to the time when the voltage signal of the analog interface returns to zero basically; processing and storing the test data, and generating a test result and a test curve after 10 tests are circularly completed;
and S5, reading the test result and the test curve to finish the test.
Compared with the prior art, the utility model, following advantage and beneficial effect have:
1. the test system of the utility model has simple structure, can finish the automatic detection of the detection subsystem board by transferring the data of the database, has quick whole test process, can directly read and use the test result, and greatly improves the efficiency of measurement;
2. the utility model discloses can improve measurement quality, software automatic processing measuring result, the reliability of measuring precision promotes greatly.
Drawings
Fig. 1 is a schematic diagram of a system for testing response time of an elevator detection subsystem according to the present invention;
fig. 2 is an on-off circuit schematic diagram of the response time testing system of the elevator detection subsystem according to the present invention;
fig. 3 is a schematic diagram of a detection circuit of a response time testing system of an elevator detection subsystem according to the present invention;
in the figure, 1-an industrial personal computer, 2-an acquisition card, 3-an on-off circuit, 4-a detection circuit, 5-a first power supply, 6-a second power supply, 301-a resistor, 302-an optical coupler, 401-a full-wave rectifying circuit, 402-a second resistor, 403-a capacitor and 404-a third resistor.
Detailed Description
The present invention will be described in further detail with reference to the following examples and drawings, but the present invention is not limited thereto.
Example (b):
in this embodiment, the input ports of the testing subsystem board mainly include 24 power input ports, an upper leveling switch, a lower leveling switch, and a microcomputer relay input port. The output port is two interfaces controlled by the input port, and when the input port is completely conducted, the two output interfaces are conducted; when any one of the input ports is disconnected, the two output ports are disconnected.
The motion process of the detection subsystem board when the lift car moves accidentally is simulated, the input interfaces of the detection subsystem board are all in a conduction state under the normal state of opening the door in advance or leveling and leveling, the output interfaces are conducted, and the elevator door lock loop is in short circuit. When the elevator moves accidentally, the upper leveling switch or the lower leveling switch is switched off, and the output interface is switched off. And the time difference from the disconnection of the upper leveling switch or the lower leveling switch to the disconnection of the output interface is the response time of the detection subsystem board.
A system for testing the response time of an elevator detection subsystem is shown in figure 1 and comprises an industrial personal computer 1, a collection card 2, an on-off circuit 3, a detection circuit 4, a first power supply 5 and a second power supply 6; the acquisition card 2 adopts a PCI-6221 type data acquisition card developed by American National Instruments (NI), and the industrial personal computer 1 is electrically connected with the acquisition card 2; the acquisition card 2, the on-off circuit 3 and the first power supply 5 are electrically connected to the elevator detection subsystem board in sequence, and the first power supply 5 is a 24V direct-current output power supply; the on-off circuit 3 is electrically connected with the elevator detection subsystem board; the acquisition card 2, the detection circuit 4 and the second power supply 6 are electrically connected to the elevator detection subsystem board in sequence, and the second power supply 6 is an AC110V output power supply; the detection circuit 4 is electrically connected with the elevator detection subsystem board.
The on-off circuit 3 comprises 5 same on-off sub-circuits; the first on-off sub-circuit comprises a first resistor 301 and a first optocoupler 302, and a schematic diagram of the on-off circuit 3 is shown in fig. 2; the first optical coupler 302 is an optical coupler of TLP127 model of Toshiba, Japan, one end of the input end of the first optical coupler is connected to the digital I/O port of the acquisition card 2 through the first resistor 301, the other end of the input end is electrically connected to the ground port of the acquisition card 2, and the acquisition card 2 has five different digital I/O ports; the output voltage of the digital I/O port of the acquisition card 2 is in two states of 0V or 5V, and the resistance value of the first resistor 301 is 150 omega; one end of the output end of the first optocoupler 302 is electrically connected with the cathode of the first power supply 5, and the anode of the first power supply 5 is electrically connected with the elevator detection subsystem board; the other end of the output end is electrically connected to an input port of the elevator detection subsystem board; when the digital I/O port of the acquisition card 2 outputs 0V low voltage, the output end of the first optical coupler 302 is in a cut-off state, and the analog detection sensor is in a cut-off state at the moment. When the I/O port outputs 5V high voltage, the output end of the first optocoupler 302 is in a conducting state, and the conducting state of the sensor is simulated and detected at the moment.
The detection circuit 4 comprises a full-wave rectification circuit 401, a second resistor 402, a capacitor 403 and a third resistor 404, and the schematic diagram of the detection circuit is shown in fig. 3; the full-wave rectifying circuit 401 selects a rectifying circuit of KBL02 model, and the second power supply 6 is a 110V alternating current power supply. One end of the input end of the full-wave rectifying circuit 401 is electrically connected with a zero line of a second power supply 6, and the other end of the input end of the full-wave rectifying circuit is connected with an elevator detection subsystem board; the live wire of the second power supply 6 is electrically connected with the elevator detection subsystem board; one end of the second resistor 402 is connected to one end of the output end of the full-wave rectification circuit 401, and the other end of the second resistor 402 is electrically connected to the capacitor 403 and the third resistor 404; the other end of the output end of the full-wave rectifying circuit 401 is electrically connected with a capacitor 403 and a third resistor 404; the capacitance of the capacitor 403 is 5 muF, the resistance of the third resistor 404 is 30 omega, the discharge time constant of the capacitor 403 is 0.15ms, and the test requirement can be met by comparing the response time of the detection subsystem board for tens of milliseconds. The resistance of the second resistor 402 is 400 Ω, and the maximum voltage of the full-wave rectified output is 110V × 1.2 — 132V. The high voltage end of the third resistor 404 is connected with the analog interface of the acquisition card 2.
From the above parameters, the voltage peak input to the analog interface of the acquisition card 2 is:
and the maximum voltage value of the analog interface of the acquisition card 2 is 10V, so that the requirement is met. When the output port of the detection subsystem board is not open, the voltage of the third resistor 404 will not return to zero due to the function of the capacitor 403, and therefore, the on/off of the output port can be determined by determining whether the voltage on the third resistor 404 is zero.
The industrial personal computer 1 adopts LabVIEW programming and establishes a detection subsystem database. LabVIEW programmed software is adopted to control the output of the digital I/O port, so that the on-off of the input signal of the detection subsystem board is controlled. Meanwhile, the on-off of the output port of the subsystem board is monitored and detected through the analog interface. The response time of the detection subsystem board is obtained by calculating the time difference between sending a disconnection signal to the input port and detecting the disconnection of the output port. The principle and the circuit structure of the detection subsystem boards of various manufacturers are approximately similar, so that the test process of the commonly used detection subsystem board can be programmed into a database, and all detection can be automatically completed by software.
A test system for response time of an elevator detection subsystem works as follows, according to a circuit diagram of a detection subsystem board, a detection subsystem board interface is accessed to corresponding ports of a test system and a power supply; starting a test system, selecting a corresponding model of a detection subsystem board in software, reading data in a database by the system, and carrying out automatic test; the system processes and stores the test data, and generates a test result and a test curve after 10 tests are completed circularly.
Further, the method comprises the following steps:
s1, under the condition of power failure, according to the circuit diagram of the detection subsystem board, the interface of the detection subsystem board is accessed to the corresponding ports of the test system and the power supply;
s2, starting a test system and a power supply, and initializing the system;
s3, selecting the corresponding model of the detection subsystem in the software, and starting to test;
s4, after the system automatically completes 10 times of cycle tests, generating a test result and a test curve;
and S5, reading the test result and the test curve to finish the test.
The above embodiments are preferred embodiments of the present invention, but the embodiments of the present invention are not limited to the above embodiments, and any other changes, modifications, substitutions, combinations, and simplifications which do not depart from the spirit and principle of the present invention should be equivalent replacement modes, and all are included in the scope of the present invention.
Claims (6)
1. A system for testing response time of an elevator detection subsystem is characterized by comprising an industrial personal computer, a collection card, an on-off circuit, a detection circuit, a first power supply and a second power supply; the industrial personal computer is electrically connected with the acquisition card; the acquisition card, the on-off circuit and the first power supply are electrically connected to the elevator detection subsystem board in sequence; the on-off circuit is electrically connected with the elevator detection subsystem board; the acquisition card, the detection circuit and the second power supply are electrically connected to the elevator detection subsystem board in sequence; the detection circuit is electrically connected with the elevator detection subsystem board.
2. The elevator detection subsystem response time testing system of claim 1, wherein said on-off circuit comprises K on-off sub-circuits; the first on-off sub-circuit comprises a first resistor and a first optical coupler; one end of the input end of the first optical coupler is connected to a digital I/O port of the acquisition card through a first resistor, the other end of the input end of the first optical coupler is electrically connected with the ground port of the acquisition card, one end of the output end of the first optical coupler is electrically connected with a negative electrode of a first power supply, and the other end of the output end of the first optical coupler is electrically connected with the elevator detection subsystem board.
3. The elevator detection subsystem response time test system of claim 1, wherein said detection circuit comprises a full wave rectifier circuit, a second resistor, a capacitor, a third resistor; one end of the input end of the full-wave rectifying circuit is electrically connected with a second power supply zero line, the other end of the input end of the full-wave rectifying circuit is connected with the elevator detection subsystem board, one end of the output end of the full-wave rectifying circuit is connected with one end of a second resistor, and the other end of the output end of the full-wave rectifying circuit is electrically connected with a capacitor to a third resistor; the other end of the second resistor is electrically connected with the capacitor to the third resistor.
4. The elevator detection subsystem response time testing system of claim 3, wherein said third resistive high voltage terminal is connected to an acquisition card analog interface.
5. The elevator detection subsystem response time testing system of claim 1, wherein the first power supply positive electrode is electrically connected to the elevator detection subsystem board.
6. The elevator detection subsystem response time testing system of claim 1, wherein the second positive power supply or hot line is electrically connected to the elevator detection subsystem board.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021655534.5U CN212301770U (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202021655534.5U CN212301770U (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time test system |
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| CN212301770U true CN212301770U (en) | 2021-01-05 |
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| CN202021655534.5U Active CN212301770U (en) | 2020-08-11 | 2020-08-11 | Elevator detection subsystem response time test system |
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