CN220252133U - Integrated testing device - Google Patents
Integrated testing device Download PDFInfo
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- CN220252133U CN220252133U CN202321324074.1U CN202321324074U CN220252133U CN 220252133 U CN220252133 U CN 220252133U CN 202321324074 U CN202321324074 U CN 202321324074U CN 220252133 U CN220252133 U CN 220252133U
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- 238000012360 testing method Methods 0.000 title claims abstract description 91
- 238000005259 measurement Methods 0.000 claims description 23
- 238000004891 communication Methods 0.000 claims description 16
- 230000001105 regulatory effect Effects 0.000 claims description 15
- 230000001276 controlling effect Effects 0.000 claims description 13
- 238000002847 impedance measurement Methods 0.000 claims description 7
- 230000002457 bidirectional effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 13
- 238000010586 diagram Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
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Abstract
The utility model discloses an integrated testing device, wherein a measuring module is used for testing the impedance of a component to be tested and controlling the on-off of a surge instrument, a programmable power supply and the component to be tested; according to the utility model, the surge instrument is controlled to be gated to any component to be tested in a gating mode to provide surge voltage for any component to be tested, and is gated to any component to be tested to measure the impedance of any component to be tested, so that the wiring operation is not required frequently in the testing process, the testing efficiency is effectively improved, the labor cost is reduced, and the measured leakage current and impedance are fed back and stored in the measuring module, so that the collection and arrangement of the measured leakage current and impedance are not required manually, and the test report can be generated in real time.
Description
Technical Field
The utility model relates to the technical field of intelligent terminal parameter testing, in particular to an integrated testing device.
Background
With the increase of the functions of the intelligent terminal, the functions to be tested are increased. However, in the prior art, most of tests on various functions of the intelligent terminal are manually performed based on manual tests, which wastes time and labor. According to the existing measurement mode, the following describes the current measurement steps:
the existing measurement is carried out according to the following steps that firstly, the resistance value of a component to be measured of an intelligent terminal is manually measured, then the component is connected to a surge meter, surge test voltage is started to be applied, then the resistance value and leakage current of the intelligent terminal after the surge voltage is applied are measured by using the resistor meter and a program-controlled power supply, whether the test flow of the voltage is finished is judged, and step voltage is provided according to the following judgment criteria after the completion: taking 6V as a starting point of stepping, stepping by 1V to 14V, stepping by 5V after being larger than 14V until the voltage is measured and the voltage is required to be measured (few special test cases are used, and stepping by 10V after being larger than 14V).
The above test method has the following drawbacks:
1. the existing measurement mode also mainly depends on manual testing, and a great deal of time is consumed for replacing a test signal line of the intelligent terminal;
2. the existing measurement mode needs to manually judge whether the test case is qualified or not, but subjective judgment is unreliable;
3. the existing measurement mode needs to manually sort and record test data, and a great deal of time is consumed for collecting and sorting the test data;
4. the existing measurement mode has excessive test pins, manual measurement steps are complicated, and equipment damage or test errors are easily caused by wiring errors.
Therefore, an integrated testing device is needed to solve the above-mentioned problems.
Disclosure of Invention
The utility model aims to provide an integrated testing device, which controls a surge meter to gate to any component to be tested in a gating mode to provide surge voltage for any component to be tested, and gates to any component to be tested to measure impedance of any component to be tested, so that wiring operation is not required frequently in a testing process, testing efficiency is effectively improved, labor cost is reduced, leakage current and impedance obtained through measurement are fed back and stored in a measuring module, collection and arrangement are not required manually, a testing report is convenient to generate in real time, abnormal data is fed back and warned in real time in the testing process after a typical value is confirmed, feedback efficiency is greatly improved, and yield is greatly improved.
In order to achieve the above object, the present utility model discloses an integrated testing device, which is suitable for performing impedance testing and leakage testing on an intelligent terminal, wherein the intelligent terminal comprises a plurality of components to be tested, and the integrated testing device comprises:
the surge instrument is electrically connected with the intelligent terminal and is used for providing surge voltage for the component to be tested;
the program-controlled power supply is electrically connected with the intelligent terminal and is used for providing reference voltage for the component to be tested and measuring leakage current of the component to be tested;
the measuring module is electrically connected with the intelligent terminal, the surge instrument and the programmable power supply respectively and is used for testing the impedance of the component to be tested and controlling the on-off of the surge instrument, the programmable power supply and the component to be tested.
Preferably, the intelligent terminal comprises a plurality of components to be tested;
the measuring module is used for controlling gating to any component to be measured and simultaneously controlling the surge instrument and the programmable power supply to gate to the same component to be measured.
Preferably, the measurement module comprises a control unit and an upper computer, wherein the control unit is respectively and electrically connected with the intelligent terminal, the surge instrument and the programmable power supply, and the upper computer is respectively and communicatively connected with the control unit and the programmable power supply;
the control unit is used for controlling gating to any component to be tested, testing the impedance of the component to be tested and controlling the surge instrument and the programmable power supply to be gated to the same component to be tested;
the upper computer is used for sending a second control instruction to the control unit and receiving the impedance of the component to be tested, which is measured by the control unit, and is also used for sending a first control instruction to the programmable power supply and receiving the leakage current of the component to be tested, which is measured by the programmable power supply.
Preferably, the control unit includes an impedance measurement unit for obtaining an impedance of the component to be measured, where the impedance measurement unit includes a regulated power supply, a first resistor R0, a second resistor R1, and a gate switch, and the impedance of the component to be measured is set to be a resistor RX to be measured, where the regulated power supply selectively forms a loop with the first resistor R0 and the resistor RX to be measured or forms a loop with the first resistor R0, the resistor RX to be measured, and the second resistor R1 through the gate switch.
Preferably, the gate switch is a bidirectional gate switch, the gate switch has a first contact, a second contact and a third contact, the first contact is selectively electrically connected with the second contact or the third contact, the second end of the regulated power supply is electrically connected with the first contact, one end of the first resistor R0 is electrically connected with the first end of the regulated power supply, the other end of the first resistor R0 is electrically connected with the second contact through the resistor RX to be tested, one end of the second resistor R1 is electrically connected with the third contact, and the other end of the second resistor R1 is electrically connected between the resistor RX to be tested and the second contact.
Preferably, the control unit further comprises a potentiometer for measuring the potential difference of the first resistor R0.
Preferably, communication protocols between the upper computer and the programmable power supply, between the upper computer and the control unit, between the control unit and the intelligent terminal, between the programmable power supply and the intelligent terminal, and between the surge meter and the intelligent terminal all support Modbus communication protocols and/or TCP/IP communication protocols.
Preferably, the control unit has a plurality of control ports, each control port corresponds to one component to be tested, and each control port is electrically connected to the corresponding component to be tested through a signal line.
Preferably, the surge meter may start from a preset starting voltage and provide a surge voltage in a preset step size until the surge voltage reaches a preset cut-off voltage.
Preferably, the component to be tested comprises a SIM card communication component, a headset component and a power supply component.
Compared with the prior art, the measuring module is used for issuing a first control instruction to the programmable power supply and receiving the leakage current of any component to be measured, which is obtained by measuring the programmable power supply, and is used for controlling the gating of the surge meter to any component to be measured so as to provide surge voltage for any component to be measured, and is also used for gating to any component to be measured so as to measure the impedance of any component to be measured, on one hand, the measuring module controls the gating of the surge meter to any component to be measured so as to provide surge voltage for any component to be measured and to gate to any component to be measured so as to measure the impedance of any component to be measured in a gating manner, so that the frequent wiring operation in the testing process is not needed, the testing efficiency is effectively improved, and the labor cost is reduced; on the other hand, the leakage current and the impedance obtained by measurement are fed back and stored in the measurement module, manual collection and arrangement are not needed, a test report is conveniently and immediately generated, and after a typical value is confirmed, the device is suitable for immediately feeding back and alarming abnormal data in the test process, so that the feedback efficiency is greatly improved, and the yield is greatly improved.
Drawings
FIG. 1 is a block diagram of an integrated test apparatus of the present utility model;
FIG. 2 is a block diagram of the measurement module of the present utility model;
FIG. 3 is a block diagram of the architecture of the intelligent terminal of the present utility model;
FIG. 4 is a task creation and task execution process of the integrated test device of the present utility model;
fig. 5 is a use case execution logic process of the surge automation test process of the integrated test device of the present utility model.
Detailed Description
In order to describe the technical content, the constructional features, the achieved objects and effects of the present utility model in detail, the following description is made in connection with the embodiments and the accompanying drawings.
Referring to fig. 1-3, the integrated testing device of the present embodiment is suitable for performing impedance testing and leakage testing on an intelligent terminal 200, where the intelligent terminal 200 includes a plurality of components 201 to be tested, and the intelligent terminal 200 is specifically a mobile terminal such as a mobile phone or a tablet computer, and the components 201 to be tested include a SIM card communication component, a headset component, and a power supply component, and for the same intelligent terminal 200, the integrated testing device of the present embodiment may perform impedance testing and leakage testing on the SIM card communication component, the headset component, and the power supply component of the intelligent terminal 200, respectively. Of course, in other preferred manners, the component 201 to be tested may be other types of modules.
The integrated testing device comprises a programmable power supply 10, a surge meter 20 and a measuring module 30, wherein the surge meter 20 is electrically connected with an intelligent terminal 200, and the surge meter 20 is used for selectively providing surge voltage for any component to be tested. Preferably, the surge meter 20 can start from a preset starting voltage and provide a surge voltage with a preset step size until the surge voltage reaches a preset cut-off voltage, so as to satisfy the impedance test and the leakage test of the component 201 to be tested within a certain voltage range.
The programmable power supply 10 is electrically connected to the intelligent terminal 200, and the programmable power supply 10 is used for providing a reference voltage required by a test for the component 201 to be tested and selectively measuring the leakage current of any component 201 to be tested.
The measurement module 30 is electrically connected to the intelligent terminal 200, the programmable power supply 10 and the surge meter 20, and the measurement module 30 is configured to issue a first control instruction to the programmable power supply 10 and receive a leakage current of any component 201 to be measured obtained by measuring the programmable power supply 10, and is configured to control the surge meter 20 to gate to any component 201 to provide a surge voltage for any component 201 to be measured, and is also configured to gate to any component 201 to be measured to measure an impedance of any component 201 to be measured. That is, the measurement module 30 can obtain the impedance of the component 201 to be tested, and can control the surge meter 20 to provide the surge current for the component to be tested to perform the impedance test, control the programmable power supply 10 to provide the reference voltage for the component 201 to be tested, and test the leakage current of the component 201 to be tested.
It can be understood that the first control command is an execution command of the measurement module 30 to control the programmable power source 10, and the programmable power source 10 gates to any component 201 to be tested according to the first control command to measure the leakage current of any component 201 to be tested.
Preferably, the measurement module 30 includes an upper computer 31 and a control unit 32, wherein the upper computer 31 is respectively connected to the programmable power supply 10 and the control unit 32 in a communication manner, and the upper computer 31 is configured to send a first control instruction to the programmable power supply 10 and receive a leakage current of any component 201 to be measured, which is measured by the programmable power supply 10.
The control unit 32 is used for gating to any component 201 to be tested to measure the impedance of any component 201 to be tested. That is, the control unit 32 controls gating and testing with any component 201 to be tested in the smart terminal 200.
The upper computer 31 is further configured to send a second control instruction to the control unit 32 and receive the impedance of any component 201 to be tested measured by the control unit 32.
It can be understood that the second control command is an execution command of the upper computer 31 for controlling the control unit 32, and the control unit 32 gates to any component 201 to be tested according to the second control command to perform impedance measurement on any component 201 to be tested. The upper computer 31 here may be a computer or a processor having a logic operation capability and a storage capability.
Preferably, the control unit 32 includes an impedance measurement unit 321 for obtaining the impedance of the component 201 to be tested, the impedance measurement unit 321 includes a regulated power supply 3211, a first resistor R0, a second resistor R1 and a gate switch 3212, and the impedance of any component 201 to be tested is set as a resistor RX to be tested, where the regulated power supply 3211 selectively forms a loop with the first resistor R0 and the resistor RX to be tested or forms a loop with the first resistor R0, the resistor RX to be tested and the second resistor R1 through the gate switch 3212. It can be understood that, the resistor RX to be measured is the overall impedance of the corresponding component 201 to be measured, and the overall impedance of the component 201 to be measured is herein virtual as the resistor RX to be measured, so as to be conveniently shown by a specific circuit diagram. The regulated power supply 3211 provides a regulated voltage to reduce measurement errors due to voltage instability.
Preferably, the gating switch 3212 is a bidirectional gating switch 3212, the gating switch 3212 has a first contact 32121, a second contact 32122 and a third contact 32123, the first contact 32121 is selectively electrically connected to the second contact 32122 or the third contact 32123, a second end of the regulated power supply 3211 is electrically connected to the first contact 32121, one end of the first resistor R0 is electrically connected to the first end of the regulated power supply 3211, the other end is electrically connected to the second contact 32122 through the resistor RX to be tested, one end of the second resistor R1 is electrically connected to the third contact 32123, and the other end is electrically connected between the resistor RX to be tested and the second contact 32122. Whether the second resistor R1 is connected or not is gated by the bidirectional gating switch 3212.
Preferably, the first resistor R0 is a kiloohm resistor, and the second resistor R1 is a mega ohm resistor.
Preferably, the control unit 32 further comprises a potentiometer for measuring the potential difference of the first resistor R0.
The magnitude setting of the first resistor R0 and the second resistor R1 is explained below:
let the voltage provided by the regulated power supply 3211 be U, and the voltage difference across the first resistor R0 be U12
Voltage u1=uxr0/(r0+rx) (1) at one end of the first resistor R0;
the voltage u2=ur0/(r0+r1+rx) (2) at the other end of the first resistor R0;
since the impedance of any component 201 to be tested of the intelligent terminal 200 is generally megaohm, the resistance value of the resistor RX to be tested can be obtained by performing the joint calculation of the formula (1) and the formula (2), and the calculation is specifically performed according to the following formula:
RX＝ R1*U2/(U1-U2)-R0 (3)；
considering that the ratio between (U1-U2) and U2 cannot be too small, otherwise the accuracy of the calculated resistance to be measured RX is not accurate enough, the following needs should be met as much as possible:
U1-U2≈0.1*U2(4)；
therefore, the magnitude of the first resistance R0 is set to 10 5 I.e. the first resistor R0 is a kiloohm-level resistor, the magnitude of the second resistor R1 is set to 10 6 I.e. the second resistor R1 is a mega ohm resistor.
Preferably, the communication protocols between the upper computer 31 and the programmable power supply 10, between the upper computer 31 and the control unit 32, between the control unit 32 and the intelligent terminal 200, between the programmable power supply 10 and the intelligent terminal 200, and between the surge meter 20 and the intelligent terminal 200 all support Modbus communication protocols and/or TCP/IP communication protocols to meet the requirements of common communication protocols.
Preferably, the control unit 32 has a plurality of control ports, each control port corresponds to one component 201 to be tested, and each control port is electrically connected to the corresponding component 201 to be tested through a signal line.
It can be understood that after the intelligent terminal 200 is connected to the integrated testing device of the present embodiment, each control port is electrically connected to the corresponding component 201 to be tested through a signal line, and the impedance and leakage current of the component 201 to be tested can be tested in a gating manner, so that frequent wiring is not required in the testing process.
The following describes code logic of the integrated test apparatus of the present embodiment:
referring to fig. 1-5, the overall framework of the code includes creation of tasks and execution of tasks:
firstly, creating a task, inputting specific parameters such as a starting voltage and a highest voltage required to create the task, inputting test data into a database, and completing the task creation.
Secondly, in the execution process of the task, the control state of the integrated testing device, whether the parameters such as the use case to be tested exist or not and the like are detected firstly by reading the use case parameters of the task list in the database; after the inspection is completed, executing the test case, generating a test report according to the test result of the case, and if the test is normal, continuing the next round of test.
The execution of the use case in the task execution is important, and the use case execution logic of the surge automation test process is as follows:
firstly, initializing various interfaces and equipment parameters of equipment, and then communicating with a universal meter to obtain an initial resistance value of any component 201 to be tested; detecting whether an untested voltage resistance exists in a test task to be tested or not, then communicating with a network relay to control on-off of a surge meter 20 and a multimeter switch, after preparation, testing the impedance of any component 201 to be tested of the intelligent terminal 200, comparing the tested impedance with an initial resistance, and if the fluctuation range exceeds 10%, indicating that the circuit board of the component 201 to be tested is damaged, and stopping testing; if the fluctuation range does not exceed the resistance value, judging whether the leakage current is required to be tested, if so, controlling the on-off of a switch of the programmable power supply 10 by communication to acquire the leakage current of the current component 201 to be tested, and if the leakage current of the current component 201 to be tested exceeds 0.250mA, damaging a circuit board and ending the test; if the leakage current of the current component 201 to be tested does not exceed 0.250mA, the next voltage group is tested and judged until the test task is finished.
It should be noted that, when the smart terminal 200 has only one component 201 to be tested, the measurement module 30 of the present embodiment may not involve a portion of the gating function.
Referring to fig. 1 to 5, a measurement module 30 of the present utility model is configured to issue a first control instruction to a programmable power supply 10 and receive a leakage current of any component 201 to be tested, which is measured by the programmable power supply 10, and is configured to control a surge meter 20 to gate to any component 201 to provide a surge voltage for any component 201 to be tested, and also configured to gate to any component 201 to measure an impedance of any component 201 to be tested, on the one hand, it controls the surge meter 20 to gate to any component 201 to provide a surge voltage for any component 201 to be tested and to gate to any component 201 to measure an impedance of any component 201 to be tested by gating, without frequent wiring operations in a testing process, thereby effectively improving testing efficiency and reducing labor cost; on the other hand, the measured leakage current and impedance are fed back and stored in the measurement module 30, manual collection and arrangement are not needed, a test report is generated in real time conveniently, and after a typical value is confirmed, the device is suitable for feeding back and alarming abnormal data in real time in the test process, so that the feedback efficiency is greatly improved, and the yield is greatly improved.
The foregoing description of the preferred embodiments of the present utility model is not intended to limit the scope of the claims, which follow, as defined in the claims.
Claims (10)
1. An integrated testing device suitable for impedance testing and leakage testing of an intelligent terminal, wherein the intelligent terminal comprises a component to be tested, and the integrated testing device comprises:
the surge instrument is electrically connected with the intelligent terminal and is used for providing surge voltage for the component to be tested;
the program-controlled power supply is electrically connected with the intelligent terminal and is used for providing reference voltage for the component to be tested and measuring leakage current of the component to be tested;
the measuring module is electrically connected with the intelligent terminal, the surge instrument and the programmable power supply respectively and is used for testing the impedance of the component to be tested and controlling the on-off of the surge instrument, the programmable power supply and the component to be tested.
2. The integrated testing device of claim 1, wherein the intelligent terminal comprises a plurality of the components under test;
the measuring module is used for controlling gating to any component to be measured and simultaneously controlling the surge instrument and the programmable power supply to gate to the same component to be measured.
3. The integrated testing device of claim 2, wherein the measurement module comprises a control unit and an upper computer, the control unit is respectively and electrically connected with the intelligent terminal, the surge instrument and the programmable power supply, and the upper computer is respectively and communicatively connected with the control unit and the programmable power supply;
the control unit is used for controlling gating to any component to be tested, testing the impedance of the component to be tested and controlling the surge instrument and the programmable power supply to be gated to the same component to be tested;
the upper computer is used for sending a second control instruction to the control unit and receiving the impedance of the component to be tested, which is measured by the control unit, and is also used for sending a first control instruction to the programmable power supply and receiving the leakage current of the component to be tested, which is measured by the programmable power supply.
4. The integrated test device according to claim 3, wherein the control unit includes an impedance measurement unit for obtaining an impedance of the component to be tested, the impedance measurement unit includes a regulated power supply, a first resistor R0, a second resistor R1, and a gate switch, the impedance of the component to be tested is set to be a resistor to be tested RX, and the regulated power supply selectively forms a loop with the first resistor R0 and the resistor to be tested RX or forms a loop with the first resistor R0, the resistor to be tested RX, and the second resistor R1 through the gate switch.
5. The integrated testing device of claim 4, wherein the gate switch is a bidirectional gate switch, the gate switch has a first contact, a second contact and a third contact, the first contact is selectively electrically connected to the second contact or the third contact, the second end of the regulated power supply is electrically connected to the first contact, one end of the first resistor R0 is electrically connected to the first end of the regulated power supply, the other end is electrically connected to the second contact through the resistor RX to be tested, one end of the second resistor R1 is electrically connected to the third contact, and the other end is electrically connected between the resistor RX to be tested and the second contact.
6. The integrated test device of claim 4, wherein the control unit further comprises a potentiometer for measuring a potential difference of the first resistor R0.
7. The integrated testing device of claim 3, wherein communication protocols between the host computer and the programmable power supply, between the host computer and the control unit, between the control unit and the intelligent terminal, between the programmable power supply and the intelligent terminal, and between the surge meter and the intelligent terminal all support Modbus communication protocols and/or TCP/IP communication protocols.
8. The integrated testing device of claim 3, wherein the control unit has a plurality of control ports, each of the control ports corresponds to one component to be tested, and each of the control ports is electrically connected to the corresponding component to be tested through a signal line.
9. The integrated test device of claim 1, wherein the surge meter is configured to provide a surge voltage in a predetermined step from a predetermined starting voltage until the surge voltage reaches a predetermined cutoff voltage.
10. The integrated testing device of claim 1, wherein the components under test comprise a SIM card communication component, a headset component, and a power supply component.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321324074.1U CN220252133U (en) | 2023-05-26 | 2023-05-26 | Integrated testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321324074.1U CN220252133U (en) | 2023-05-26 | 2023-05-26 | Integrated testing device |
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| Publication Number | Publication Date |
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| CN220252133U true CN220252133U (en) | 2023-12-26 |
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| CN202321324074.1U Active CN220252133U (en) | 2023-05-26 | 2023-05-26 | Integrated testing device |
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- 2023-05-26 CN CN202321324074.1U patent/CN220252133U/en active Active
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