CN111786854A - Network card testing method and device, electronic equipment and readable storage medium - Google Patents
Network card testing method and device, electronic equipment and readable storage medium Download PDFInfo
- Publication number
- CN111786854A CN111786854A CN202010623636.7A CN202010623636A CN111786854A CN 111786854 A CN111786854 A CN 111786854A CN 202010623636 A CN202010623636 A CN 202010623636A CN 111786854 A CN111786854 A CN 111786854A
- Authority
- CN
- China
- Prior art keywords
- test
- item
- network card
- tested
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Abstract
The application provides a network card testing method, a network card testing device, electronic equipment and a readable storage medium, and relates to the technical field of communication. The method comprises the following steps: determining a plurality of test items aiming at the network card to be tested; determining a project testing order for the plurality of test projects; sequentially testing the test items of the network card to be tested according to the item test sequence to obtain corresponding test results; and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence. According to the scheme, whether the test of the next test item is continuously carried out on the network card to be tested can be determined according to the test result obtained after the test of the previous test item in the test process, and the test flow of the network card is standardized, so that the problem that the network card is comprehensively tested to test useless work in the prior art can be solved, and the waste of test time is effectively reduced.
Description
Technical Field
The present application relates to the field of communications technologies, and in particular, to a network card testing method, an apparatus, an electronic device, and a readable storage medium.
Background
The network card is a network component working on a link layer, is an interface for connecting a computer and a transmission medium in a local area network, not only can embody physical connection and electric signal matching with the transmission medium of the local area network, but also relates to signal sending and receiving and the like. Therefore, the network card is very important for communication between devices, and in order to ensure that the network card can work normally, the network card can be tested in advance.
In the prior art, the network card is generally tested according to the set test content, the test mode is inflexible, and is likely to perform some useless tests, which wastes test time.
Disclosure of Invention
An object of the embodiments of the present application is to provide a network card testing method, an apparatus, an electronic device, and a readable storage medium, so as to solve the problem in the prior art that testing time is wasted when some useless tests are performed.
In a first aspect, an embodiment of the present application provides a network card testing method, where the method includes: determining a plurality of test items aiming at the network card to be tested; determining a project testing order for the plurality of test projects; sequentially testing the test items of the network card to be tested according to the item test sequence to obtain corresponding test results; and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
In the implementation process, the project test sequence of a plurality of test projects is determined firstly, then the network card to be tested is tested in sequence according to the project test sequence, and finally whether the test of the next test project is continued on the network card to be tested can be determined according to the test result obtained after the test of the previous test project.
Optionally, the determining a project testing order for the plurality of test projects comprises:
acquiring a priority identifier of each test item;
determining an item testing order for the plurality of test items based on the priority identification for each test item.
In the implementation, the item testing order of the plurality of test items can be determined quickly based on the priority identification.
Optionally, the obtaining the priority identifier of each test item includes:
determining the importance of each test item;
and generating a priority identifier corresponding to each test item according to the importance.
In the implementation process, the priority identification of each test item is generated according to the importance of each test item, so that a plurality of test items can be tested according to the importance.
Optionally, the determining a project testing order for the plurality of test projects comprises:
determining a dependency relationship between the plurality of test items;
determining a project testing order for the plurality of test projects based on the dependencies.
In the implementation process, the item test sequence is determined based on the dependency relationship, so that the internal dependency relationship of a plurality of test items can be mined, and the test of the network card to be tested according to the item test sequence can effectively reduce the test useless work.
Optionally, the determining the dependency relationship between the plurality of test items includes:
determining a dependency identifier of each test item;
and determining the dependency relationship among the plurality of test items according to the incidence relationship among the dependency identifiers of each test item.
In the implementation process, the dependency relationship among the multiple test items can be quickly determined through the association relationship among the dependency identifiers.
Optionally, the plurality of test items include at least one of a signal consistency test item, a power integrity test item, a compatibility test item, a performance test item, and a stress test item.
Optionally, after obtaining the corresponding test result, the method further includes:
and generating a test report according to the test result, and outputting the test report, thereby providing test data of the network card to be tested for a tester, and providing data reference for the test of a subsequent network card.
In a second aspect, an embodiment of the present application provides a network card testing apparatus, where the apparatus includes:
the test item determining module is used for determining a plurality of test items aiming at the network card to be tested;
a project testing order determination module for determining a project testing order for the plurality of test projects;
the test module is used for sequentially testing the test items of the network card to be tested according to the item test sequence to obtain a corresponding test result;
and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
Optionally, the item test order determining module is specifically configured to obtain a priority identifier of each test item; determining an item testing order for the plurality of test items based on the priority identification for each test item.
Optionally, the item test order determining module is specifically configured to determine the importance of each test item; and generating a priority identifier corresponding to each test item according to the importance.
Optionally, the item test order determining module is specifically configured to determine a dependency relationship between the plurality of test items; determining a project testing order for the plurality of test projects based on the dependencies.
Optionally, the item test order determining module is specifically configured to determine a dependency identifier of each test item; and determining the dependency relationship among the plurality of test items according to the incidence relationship among the dependency identifiers of each test item.
Optionally, the plurality of test items include at least one of a signal consistency test item, a power integrity test item, a compatibility test item, a performance test item, and a stress test item.
Optionally, the apparatus further comprises:
and the test report output module is used for generating a test report according to the test result and outputting the test report.
In a third aspect, an embodiment of the present application provides an electronic device, including a processor and a memory, where the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the steps in the method as provided in the first aspect are executed.
In a fourth aspect, embodiments of the present application provide a readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, performs the steps in the method as provided in the first aspect.
Additional features and advantages of the present application will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the embodiments of the present application. The objectives and other advantages of the application may be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments of the present application will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and that those skilled in the art can also obtain other related drawings based on the drawings without inventive efforts.
Fig. 1 is a schematic structural diagram of an electronic device for executing a network card testing method according to an embodiment of the present disclosure;
fig. 2 is a flowchart of a network card testing method according to an embodiment of the present application;
fig. 3 is a block diagram of a network card testing apparatus according to an embodiment of the present disclosure.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
The embodiment of the application provides a network card testing method, which comprises the steps of determining a project testing sequence of a plurality of testing projects, testing a network card to be tested in sequence according to the project testing sequence, and determining whether to continue testing the network card to be tested in a next testing project according to a testing result obtained after testing the previous testing project.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an electronic device for executing a network card testing method according to an embodiment of the present application, where the electronic device may include: at least one processor 110, such as a CPU, at least one communication interface 120, at least one memory 130, and at least one communication bus 140. Wherein the communication bus 140 is used for realizing direct connection communication of these components. The communication interface 120 of the device in the embodiment of the present application is used for performing signaling or data communication with other node devices. The memory 130 may be a high-speed RAM memory or a non-volatile memory (non-volatile memory), such as at least one disk memory. Memory 130 may optionally be at least one memory device located remotely from the aforementioned processor. The memory 130 stores computer readable instructions, and when the computer readable instructions are executed by the processor 110, the electronic device executes the method shown in fig. 2, for example, the memory 130 may be configured to store a plurality of test items for a network card to be tested, and when the processor 110 tests the network card, the memory 130 may obtain the plurality of test items, then sequentially test the network card according to a corresponding test sequence, and obtain a test result, where the test result may be used to store in the memory 130.
It will be appreciated that the configuration shown in fig. 1 is merely illustrative and that the electronic device may also include more or fewer components than shown in fig. 1 or have a different configuration than shown in fig. 1. The components shown in fig. 1 may be implemented in hardware, software, or a combination thereof.
Referring to fig. 2, fig. 2 is a flowchart of a network card testing method according to an embodiment of the present application, where the method includes the following steps:
step S110: and determining a plurality of test items aiming at the network card to be tested.
In order to test multi-aspect information of the network card to be tested and ensure that the network card to be tested can normally run when being matched with a corresponding terminal for use, the network card to be tested is tested by a plurality of test items in the embodiment of the application.
In a specific implementation process, the plurality of test items may include a performance test, a compatibility test, a pressure test, a packet loss rate test, and the like. Of course, in practical application, the test items for the network card may also be set according to actual requirements, for example, corresponding test items may be added or deleted appropriately according to actual situations.
The plurality of test items may be input into the electronic device by the user according to the test requirements, and when the electronic device tests the network card to be tested, the plurality of test items input by the user may be obtained. If the test items corresponding to the different network cards are different, the different test items can be input for the different network cards, so that the test items corresponding to the network cards can be stored in the electronic equipment in advance, and when the electronic equipment tests the network cards to be tested, the electronic equipment can search and obtain a plurality of test items corresponding to the network cards to be tested. For example, the electronic device may pre-store the corresponding relationship between the identification information of each network card and the corresponding test item, so that when the electronic device tests the network card to be tested, the electronic device may first obtain the identification information of the network card to be tested, and then search for the test item corresponding to the network card to be tested according to the identification information of the network card to be tested, so as to obtain a plurality of test items corresponding to the network card to be tested. Or, if the test items for all the network cards are the same, the electronic device may also store a plurality of test items for all the network cards, and after the electronic device receives a test instruction for testing the network card to be tested, the electronic device automatically acquires the plurality of test items, and then tests the network card to be tested.
In the test of the network card, generally, in order to improve the test efficiency, a plurality of network cards are tested simultaneously, in this case, the plurality of network cards need to be respectively configured with corresponding terminals used in combination with the network cards, and then a corresponding test tool or test program needs to be configured on each terminal, so that the test burden of a tester is increased. Therefore, in order to avoid this situation, the electronic device may be used as a terminal used in combination with the network card to be tested, the network card to be tested may be any one of the network cards to be tested, since some information in the terminal used in combination with the network card is the same, therefore, before testing the network card to be tested, the electronic device can be configured correspondingly, so that the electronic device can realize the relevant functions of the terminal matched with the network card to be tested, when the network card to be tested is changed, the related configuration of the electronic equipment is correspondingly changed, so that the testing of a plurality of network cards can be realized only by installing a set of testing tool or testing program in the electronic equipment, and because the terminals matched with the network cards are likely to have similar functions, therefore, when the configuration of the electronic equipment is changed, the change is small, and the test burden of a tester is reduced.
The terminal used in combination with the network card may be understood as a device that needs the network card to communicate, such as a computer, a switch, and the like, that is, the electronic device described in this application may be a computer, a switch, and the like.
Step S120: a project testing order for the plurality of test projects is determined.
After obtaining the plurality of test items, in order to reduce the waste of test time and improve the test efficiency of the network card, the item test sequence of the plurality of test items may be predetermined before the test is performed in the present application, so as to standardize the test flow of the network card.
In a specific implementation process, determining a project testing sequence of a plurality of test projects may have a plurality of implementation manners, where one implementation manner may be: the method includes setting a project testing sequence according to importance of testing projects, for example, in some cases, performance testing of the network card may be the most important, and compatibility testing of the network card may not be so important, so in this case, the project testing sequence may be to perform the performance testing on the network card to be tested first, and then perform the compatibility testing on the network card.
In some cases, if the performance test of the network card is unqualified, it is likely that the compatibility test of the network card is not qualified, so that it is meaningless to perform the compatibility test on the network card after the performance test of the network card is unqualified, and the network card is sequentially tested according to the item test sequence, so that some test useless work can be avoided, and the waste of test time is reduced.
Therefore, in some embodiments, after obtaining the plurality of test items, the electronic device may analyze the importance of the plurality of test items, and then sort the plurality of test items according to the importance, thereby obtaining the item test order of the plurality of test items. Certainly, the user may also sort the plurality of test items according to the importance requirements of the terminal corresponding to the network card to be tested, for example, for a certain network card to be tested, the terminal corresponding to the network card to be tested has a large compatibility requirement and a small performance requirement, and in this case, the corresponding item test sequence may first perform the compatibility test on the network card to be tested, and then perform the performance test on the network card to be tested.
It should be understood that if all the network cards have the same corresponding test items, the test sequence of the corresponding items may be the same or different for different network cards. If the test items corresponding to different network cards are different, the test sequences of the items corresponding to the network cards may be the same (in this case, the test sequences of the items corresponding to the same test items are the same when some test items are the same) or different.
Step S130: and sequentially testing the test items of the network card to be tested according to the item test sequence to obtain a corresponding test result.
After the project test sequence of a plurality of test projects is determined, the network card to be tested can be tested in sequence according to the test project sequence, if the project test sequence is to perform performance test first and then perform compatibility test, when the network card to be tested is tested, the performance test is performed on the network card to be tested first and then the compatibility test is performed.
The test result may be understood as a test result obtained after the test of each test item is completed on the network card to be tested, and the test result may include test data generated by the network card to be tested in the process of testing each test item, and a test result obtained by analyzing the test data, such as a test pass or a test fail. Of course, the test result may also include other information, and the electronic device may acquire the required information according to the actual requirement and output the information as the test result.
It can be understood that after each test is performed on the network card to be tested, a test result corresponding to each test item is obtained, and then whether to perform a test on a next test item on the network card to be tested can be determined according to a test result corresponding to a test item arranged in the previous test item in the test sequence of the items. The test items and the next test items in the item test sequence that are ranked in the previous order can be understood as two adjacent test items in the item visual test sequence, and if the performance test is ranked at the first position in the item test sequence and the compatibility test is ranked at the second position in the item test sequence, the performance test is called the previous test item, and the compatibility test is called the next test item. Therefore, the performance of the network card to be tested is tested according to the project test sequence, a corresponding test result is obtained after the test is finished, and then whether the compatibility test of the network card to be tested is continued or not can be determined according to the test result.
For example, if the performance test is performed on the network card to be tested and the obtained test result includes that the performance test is not qualified, the compatibility test of the network card to be tested is not needed, but the performance of the network card to be tested can be analyzed again to find out the reason of the unqualified performance test, and then corresponding measures can be taken to optimize the network card to be tested, so that the test time can be saved and the test efficiency can be improved.
Certainly, a corresponding rule may also be set by itself according to an actual requirement to determine whether to continue the test of the next test item on the network card to be tested, for example, in some embodiments, if the test result of the previous test item is qualified, the test of the next test item on the network card to be tested may continue; or, if the previous test item and the next test item are not correlated with each other, the network card to be tested may continue to be tested for the next test item when the test result of the previous test item is unqualified, so that the corresponding rule may be flexibly set according to the actual situation, so that after the electronic device obtains the test result corresponding to a certain test item, the electronic device may first determine the relationship between the test item and the next test item, and then determine whether to continue to test the network card to be tested for the next test item.
That is, after the electronic device obtains the item test sequence, each test item sequenced in the item test sequence can be marked according to actual requirements, and the mark is used for determining whether to continue to test the next test item for the network card to be tested after the test result of each test item is obtained. For example, if the first test item is a performance test, the second test item is a compatibility test, the third test item is a power supply test, if the test result corresponding to the performance test is set to be unqualified, the compatibility test on the network card to be tested is stopped, the performance test item is marked correspondingly, if the test result corresponding to the compatibility test is set to be unqualified, the power supply test on the network card to be tested is continued, the compatibility test item can be marked correspondingly, and the requirement settings can be input by a user in the electronic device or determined by the electronic device based on the incidence relation among the test items. Therefore, the electronic equipment can determine whether to continue testing the next test item of the network card to be tested after obtaining the test result corresponding to the previous test item based on the marks.
In the implementation process, the project test sequence of a plurality of test projects is determined firstly, then the network card to be tested is tested in sequence according to the project test sequence, and finally whether the test of the next test project is continued on the network card to be tested can be determined according to the test result obtained after the test of the previous test project.
In one embodiment, when determining the item testing order of the plurality of test items in step S120, the following method may be used: the priority identification of each test item is obtained, and then the item test sequence of the plurality of test items is determined based on the priority identification of each test item.
For example, a user may set a priority identifier for each test item according to the importance of the test item, and the electronic device may generate a corresponding relationship between the item identifier of each test item and the corresponding priority identifier after obtaining the priority identifier of each test item input by the user, so that when determining the item test order of a plurality of test items, the electronic device may obtain the priority identifier of each test item according to the item identifier of each test item, and then determine the item test order of the plurality of test items based on the priority identifiers. For example, the priority flag is 1, which indicates that the corresponding test item is the first test item, the priority flag is 2, which indicates that the corresponding test item is the second test item, and thus, the test items may be sequentially sorted according to the priority flag.
Or the electronic device may also determine the importance of each test item, generate a priority identifier corresponding to each test item according to the importance of each test item, and sort the plurality of test items according to the corresponding priority identifiers to obtain an item test order. For example, a user may input the importance of each test item in the electronic device, and then the electronic device generates the priority identifier of each test item according to the importance, for example, the electronic device may compare the importance of each test item, and then generate the priority identifier of the most important test item as the highest priority, such as 1, and according to this way, the priority identifiers of each test item may be sequentially generated according to the importance.
It should be noted that the expression of the priority identifier may be not only in a numerical form, but also in an alphabetical form, such as a, b, c … …, etc., and the description of the expression of the priority identifier is merely an example, and the specific expression is not particularly limited in this application.
In the implementation process, the electronic device can conveniently and quickly determine the item test sequence of the plurality of test items based on the priority identification.
As another implementation manner, the manner of determining the item test order of the plurality of test items in step S120 may also be: the method comprises the steps of determining a dependency relationship among a plurality of test items, and then determining a test sequence of the plurality of test items based on the dependency relationship.
The dependency relationship between the plurality of test items may be preset, for example, a user may preset a corresponding dependency relationship for the plurality of test items, and then store the dependency relationship in the electronic device. The dependency relationship may refer to a necessary relationship among the test items, for example, if the performance test of the network card to be tested is not qualified, it is likely that the compatibility test of the network card to be tested is also not qualified, in this case, the compatibility test depends on the performance test, and the compatibility test has a dependency relationship with the performance test. For another example, if the compatibility test fails, the pressure test may fail, in which case the pressure test depends on the compatibility test, and the compatibility test has a dependency relationship with the pressure test. Thus, a certain dependency relationship can be formed among the test items, and then a test sequence of the test items can be generated based on the dependency relationship, in the above example, the performance test in the test sequence of the items is the first test item, the compatibility test is the second test item, and the pressure test is the third test item.
In some embodiments, the dependency relationship between the plurality of test items may also be determined based on the dependency identifier, for example, the electronic device may determine the dependency identifier of each test item first, and then determine the dependency relationship between the plurality of test items according to the association relationship between the dependency identifiers of each test item. As described above, if the performance test of the network card to be tested is not qualified, it is likely that the compatibility test of the network card to be tested is also not qualified, and in this case, the compatibility test depends on the performance test, and the compatibility test has a dependency relationship with the performance test. For such dependency relationship, the electronic device may generate a dependency identifier of each test item, and if the item identifier of the performance test is 1 and the item identifier of the compatibility test is 2, the dependency identifier of the performance test may be expressed as: 1> -2, the dependency identification corresponding to the compatibility test can be 2- >1, which means that the compatibility test depends on the performance test with the item identification 1. If the pressure test depends on the compatibility test, and the item identifier corresponding to the pressure test is 3, the dependent identifier corresponding to the pressure test is 3- > 2. Therefore, the electronic equipment can obtain the dependency identification of each test item, and then can quickly determine the dependency relationship among a plurality of test items according to the association relationship among the dependency identifications.
Of course, the dependency relationship between the test items may also be determined by the electronic device based on multiple tests in advance, for example, different item test sequences may be set, then the network card to be tested is sequentially tested according to the item test sequences, then the dependency relationship between the test items is analyzed based on the test results corresponding to the test items, and then the item test sequence matched with the dependency relationship is selected as the final item test sequence.
It should be noted that the dependency relationship is not absolute, and the dependency relationship between the test items may vary and is not only fixed in different application environments or different test requirements.
In the implementation process, the item test sequence is determined based on the dependency relationship, so that the internal dependency relationship of a plurality of test items can be mined, and the test of the network card to be tested according to the item test sequence can effectively reduce the test useless work.
In addition, it should be noted that the above item testing sequence may not necessarily be determined according to the influence of the previous testing result on the next testing result, for example, in some cases, if the network card is tested first, the testing result of the performance testing is that the testing is not qualified, but then the network card is tested for compatibility, and in this case, the testing result of the performance testing has no influence on the compatibility testing result. However, if the two are tested in parallel, that is, the performance test and the compatibility test are performed on the network card at the same time, the network card may run in a disordered manner (for example, if a certain test is a power-on/off test on the network card, and a certain test is a test after the network card is powered on, the parallel test of the two cannot be realized under the condition), so that a certain influence is caused on the test result, and if the test result is unqualified, a certain time is wasted by checking which test is unqualified, and the test efficiency is low.
Therefore, in this case, the project test sequence of the plurality of test projects may be set in advance according to the requirement, that is, the compatibility test is performed after the performance test is performed, or the performance test is performed after the compatibility test is performed, and then the network card is sequentially tested according to the project test sequence.
In this embodiment of the application, in order to perform an omnidirectional test on the network card to be tested, the plurality of test items may include but are not limited to: at least one of a signal consistency test item, a power integrity test item, a compatibility test item, a performance test item, and a stress test item.
If the item test sequence of the plurality of test items is determined to be: the signal consistency test item, the power integrity test item, the compatibility test item, the performance test item, and the stress test item indicate that the signal consistency test item is the first test item, and of course, the test sequence of the items may be other in an actual situation, for example, the first test item is the power integrity test item.
It can be understood that the first test item may be determined according to an actual situation, in an actual application, the first test items corresponding to different item test sequences are also different, and in the embodiment of the present application, the signal consistency test item is used as the first test item to test the signal quality of the network card first, and if the signal quality of the network card is not qualified, it will not make sense for the test of the subsequent test items.
After the item test sequence of the plurality of test items is determined, the network card to be tested may be sequentially tested according to the item test sequence, and the details of each test item are described below.
The signal consistency test item is used for testing whether the signal quality of the network card to be tested meets a standard, and generally comprises a PCIe link equalization test and an eye pattern test.
The PCIe link equalization test may further include PCIe Gen1/Gen2/Gen3/Gen4 and other interface tests, and a specific test procedure may be approximately: applying a severely degraded signal (i.e. pressure eye diagram) on a signal receiving end to detect whether the receiving end can correctly receive the signal under the condition, wherein the process generally comprises the steps of calibrating the pressure eye diagram, namely quantitatively specifying the degree of degradation of the degraded signal, measuring the degraded signal, then entering a loopback mode, namely, in order to detect whether the receiving end correctly receives the signal, the received signal needs to be looped back to a transmitting end to be detected without moving, then judging the looped signal through an error code meter, and finally carrying out an error code rate test by using a specified code pattern. The detailed testing process can refer to related implementation in the prior art, and is not described in detail here.
The contents of the eye pattern test are mainly power-on time sequence, reset, clock and I2C. The signal test of Flash, JTAG interface, network port and other chip interfaces, etc. can be performed by using corresponding test tools or corresponding test software, and the specific test process can refer to the existing related implementation manner, which is not described in detail herein.
The power integrity test item is used for testing whether the power quality of the network card meets the standard, and the test content generally comprises at least one of a voltage bias test, a power noise interference test, a voltage sequence test, a voltage/current overload test, a power efficiency test, a baud diagram test, a power Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) test and a threshold point test.
The power supply bias test, the power supply noise interference test, the voltage time sequence test and the voltage/current overload test are all used for simulating whether the network card to be tested can normally work under the conditions of limit voltage and current; the power supply efficiency test is used for testing the output conversion efficiency of the power supply current of the network card to be tested; the baud chart test is to check the key parameters of the circuit of the network card to be tested in the frequency domain, such as gain, phase and the like, and judge whether the circuit can oscillate or not; the power MOSFET test is used for testing the MOSFET performance of the network card to be tested, and generally testing the leakage waveform, the gate circuit leakage condition and the like of the network card to be tested; the threshold point test is generally used for testing the threshold voltage and the like of the network card to be tested, and the specific test process may refer to the test process for each test in the prior art, which is not described in detail herein.
The compatibility test item is used for testing whether some abnormal functions exist when the network to be tested is used in combination with various terminals, and generally comprises at least one of an organization test, a heat dissipation test, a startup and shutdown test, an LED lamp color test, a solidified software refreshing test, a PEX test, a PCIe ID information test, a network Wake-on-LAN (WOL) test, a virtualization function SRIOV test, a redundancy function test, a time delay test, a performance test in an iSCSI storage environment and a performance test in an FCoE storage environment.
The mechanism tests whether a mechanism for testing the network card to be tested can be matched with the terminal to be adapted; the heat dissipation test is used for testing whether a server (namely a terminal) of the network card to be tested and the key blank can work stably at the extreme environment temperature; the startup and shutdown test is used for testing whether the network card to be tested can be normally identified in multiple startup and shutdown tests; the LED lamp color test is used for testing whether the LED lamp color of the network card to be tested meets the standard; the solidified software refreshing test is used for refreshing the network card to be tested for multiple times and determining whether the refreshing can be successful each time; the PEX test is used for testing whether the PEX function of the network card to be tested is normal under the environment of IPv4 and IPv 6; the PCIe ID information test is used for testing whether the PCIe ID information of the network card to be tested is correct or not; the network awakening WOL test is used for testing whether the network card to be tested can be awakened to be started up through a WOL function in a power-off state; the virtual function SRIOV test is used for testing whether the virtual function of the network card to be tested is normal or not and whether the created virtual network port can be normally used or not; the redundancy function test is a terminal/binding test and is used for testing whether the redundancy function of the network card to be tested is normal or not and whether the fusion function matched with other network cards and switches is normal or not; the time delay test is used for testing the time delay of the network card to be tested; the performance test in the iSCSI storage environment is used for testing the performance, stability and the like of the network card to be tested in the iSCSI storage environment, and the performance test in the FCoE storage environment is used for testing the performance, stability and the like of the network card to be tested in the FCoE storage environment.
It is understood that, for each of the above compatibility test items, the test may be performed according to a corresponding test method. Taking a redundancy function test as an example, the bonding technology of the network card is a technology for binding a plurality of physical ethernet interfaces into a single virtual interface, increasing data bandwidth and providing failover, the network card bonding can improve the redundancy of the network, ensure the reliability of the network and improve the speed of the network, in order to improve the fault tolerance or throughput of the network, a multi-network card bonding strategy is generally adopted, such as a Teaming technology, which can also be used for realizing the function of link aggregation, and in the actual process, the bonding technology or the Teaming technology can be selected. The specific test process can be as follows: the method comprises the steps of respectively utilizing 2 network cards of a single network card to build different modes of bonding modes 0/1/4/6 and the like, also utilizing 2 network ports of the network cards with different rates to build a bonding mode0, and carrying out function test under each bonding mode, namely, randomly disconnecting a connection on one network port in the bonding to see whether the whole bonding can still normally work and communicate.
The performance test project is mainly used for testing whether the network card to be tested runs abnormally on various mainstream terminals, and generally comprises at least one of an iperf software test, a netperf software test and a packer test.
The iperf software test, the netperf software test and the packer test are all to check the optimal performance of the network card to be tested in a full-load state when the network card to be tested is matched with different servers by using different software or hardware, for example, the iperf software test is to test the network card to be tested by using the iperf software, and the netperf software test is to test the network card to be tested by using the netperf software. In the process of testing the iperf software, network cards of two servers are generally connected in an opposite mode, wherein one server sends data to the other server in a full load mode through the iperf software, and the other server receives the data through the network through the iperf software to determine whether key parameters such as transmission bandwidth and time delay are normal or not. But also for the other two test procedures, which are not described in detail here.
The stress test item mainly tests whether the network card to be tested can stably run for a long time under the condition of full bandwidth load, and mainly comprises but is not limited to: at least one of a power on/off test, a netperf software pressure test and a pressure test of the baler in a preset time period.
The startup and shutdown test is mainly used for testing whether the hardware, firmware and drive of the network card to be tested can be well matched every time the network card is started up through multiple times of shutdown and restart; the netperf software pressure test is used for testing whether the network card to be tested can stably run in a full-load running state for a long time (generally more than 12 hours); the pressure test of the packer in the preset time period can be understood as testing the capacity of the network card to be tested to process the data packet in the preset time period under the full load running state.
The specific test method of each test sub-item in each test item described in the above embodiment may be used to perform a test according to an actual situation, and for brevity of description, the test process of each test sub-item is not described in detail herein.
It should be noted that, after each test sub-item is performed, a test result may be obtained, and after each test item is completed, a test result for a plurality of test sub-items under the test item may be obtained, where the test result includes the test result of each test sub-item. It should be understood that, if the test result corresponding to a certain test item is failed as described above, it means that the test result corresponding to at least one test sub-item in the test item is failed, and the test result corresponding to the test item is passed as described above, it means that the test results corresponding to all the test sub-items in the test item are passed.
For each test sub-item under each test item, if the test processes among the test sub-items are not affected, parallel tests can be performed among the test sub-items. Of course, in order to obtain a more accurate test result, the test sequence of each test sub-item may also be set according to an actual situation, and then the test is performed according to the corresponding test sequence, for example, in the above compatibility test item, the test sequence may be: the test sequence may be determined in a similar manner to the above-described determination of the test sequence of the items of the plurality of test items, and reference may be made to the above-described embodiment of the test sequence of the items, and the description will not be repeated here.
In addition, in an actual situation, a plurality of test sub-items included in each test item may be added or deleted as appropriate according to the actual situation, and the test sub-items included in different network cards may be the same or different.
After the test result corresponding to each test item is obtained, in order to facilitate a tester to visually know the test result of the network card to be tested, or in order to facilitate the test of the subsequent network card to provide reference data, a test report can be generated according to the test result, and the corresponding test report is output.
The test report may be in a form of a document that records related data generated by the network card to be tested in the test process, and the test report may further include a comparison result of the related data with the standard data, and a final test result obtained through a corresponding analysis process, that is, the test result may include test data generated by the network card to be tested in the test process, and a test result (such as a test pass or a test fail) of the network card to be tested in a corresponding test item, which is obtained through analysis, in this way, the electronic device may generate a corresponding test report according to the test result.
That is, in the process of testing the network card to be tested, the electronic device can record and store the test data generated in the process of testing the network card to be tested in real time, then, the test data can be compared with the preset standard data to determine whether the test data of the network card to be tested under a certain test item is matched with the standard data, if not, determining that the network card to be tested is unqualified in the test item, if the test data of the network card to be tested in a certain test item is matched with the standard data, if so, determining that the network card to be tested passes the test under the test item, and embodying the information in the generated test report, therefore, the tester can know the test process and the corresponding test result of the network card to be tested after seeing the test report, and data support is provided for the tester to objectively analyze the test result of the network card to be tested.
Certainly, the electronic device may also generate a corresponding optimization scheme for the part that is not qualified in the test, and the generated test report includes the corresponding optimization scheme, so that a relevant data support may be provided for the optimization of the network card to be tested.
After the electronic equipment obtains the test report again, the test report can be sent to the user terminal of the tester, so that the tester can conveniently watch the data generated in the test process of the network card to be tested and the corresponding test result, and can manually participate in verifying whether the corresponding test process or the test result is correct, so as to further verify the accuracy of the test result.
Referring to fig. 3, fig. 3 is a block diagram of a network card testing apparatus 200 according to an embodiment of the present disclosure, where the apparatus 200 may be a module, a program segment, or a code on an electronic device. It should be understood that the apparatus 200 corresponds to the above-mentioned embodiment of the method of fig. 2, and can perform various steps related to the embodiment of the method of fig. 2, and the specific functions of the apparatus 200 can be referred to the above description, and the detailed description is appropriately omitted here to avoid redundancy.
Optionally, the apparatus 200 comprises:
a test item determining module 210, configured to determine a plurality of test items for the network card to be tested;
a project testing order determination module 220 for determining a project testing order for the plurality of test projects;
the test module 230 is configured to sequentially test the test items of the network card to be tested according to the item test sequence to obtain corresponding test results;
and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
Optionally, the item test order determining module 220 is specifically configured to obtain a priority identifier of each test item; determining an item testing order for the plurality of test items based on the priority identification for each test item.
Optionally, the item test order determining module 220 is specifically configured to determine the importance of each test item; and generating a priority identifier corresponding to each test item according to the importance.
Optionally, the item testing order determining module 220 is specifically configured to determine a dependency relationship between the plurality of test items; determining a project testing order for the plurality of test projects based on the dependencies.
Optionally, the item test order determining module 220 is specifically configured to determine a dependency identifier of each test item; and determining the dependency relationship among the plurality of test items according to the incidence relationship among the dependency identifiers of each test item.
Optionally, the plurality of test items include signal consistency test items, and the signal consistency test items include PCIe link equalization tests and eye pattern tests.
Optionally, the plurality of test items include power integrity test items, and the power integrity test items include at least one of a voltage bias test, a power noise interference test, a voltage timing test, a voltage/current overload test, a power efficiency test, a baud diagram test, a power MOSFET test, and a threshold point test.
Optionally, the plurality of test items include compatibility test items, and the compatibility test items include at least one of mechanism test, heat dissipation test, startup and shutdown test, LED light color test, firmware refreshing test, PEX test, PCIe ID information test, WOL test, SRIOV test, redundancy function test, latency test, performance test in iSCSI storage environment, and performance test in FCoE storage environment.
Optionally, the plurality of test items includes a performance test item, the performance test item including at least one of an iperf software test, a netperf software test, and a baler test.
Optionally, the plurality of test items includes a stress test item, the stress test item including at least one of a power on/off test, a netperf software stress test, and a pressure test of the baler over a preset time period.
Optionally, the apparatus 200 further comprises:
and the test report output module is used for generating a test report according to the test result and outputting the test report.
The embodiment of the present application provides a readable storage medium, and when being executed by a processor, the computer program performs the method process performed by the electronic device in the method embodiment shown in fig. 2.
The present embodiments disclose a computer program product comprising a computer program stored on a non-transitory computer readable storage medium, the computer program comprising program instructions which, when executed by a computer, enable the computer to perform the methods provided by the above-described method embodiments, for example, comprising: determining a plurality of test items aiming at the network card to be tested; determining a project testing order for the plurality of test projects; sequentially testing the test items of the network card to be tested according to the item test sequence to obtain corresponding test results; and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
In summary, the embodiments of the present application provide a network card testing method, apparatus, electronic device, and readable storage medium, where a project testing sequence of a plurality of testing projects is determined first, then the network card to be tested is tested in sequence according to the project testing sequence, and in the testing process, whether to continue testing the network card to be tested for a next testing project can be determined according to a testing result obtained after testing a previous testing project, and in the present scheme, a testing flow of the network card is specified, so that a problem that the network card is tested comprehensively to perform a test useless in the prior art can be avoided, and waste of testing time is effectively reduced.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
In addition, units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
Furthermore, the functional modules in the embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
In this document, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (10)
1. A network card testing method is characterized by comprising the following steps:
determining a plurality of test items aiming at the network card to be tested;
determining a project testing order for the plurality of test projects;
sequentially testing the test items of the network card to be tested according to the item test sequence to obtain corresponding test results;
and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
2. The method of claim 1, wherein said determining an item testing order for said plurality of test items comprises:
acquiring a priority identifier of each test item;
determining an item testing order for the plurality of test items based on the priority identification for each test item.
3. The method of claim 2, wherein obtaining the priority identification of each test item comprises:
determining the importance of each test item;
and generating a priority identifier corresponding to each test item according to the importance.
4. The method of claim 1, wherein said determining an item testing order for said plurality of test items comprises:
determining a dependency relationship between the plurality of test items;
determining a project testing order for the plurality of test projects based on the dependencies.
5. The method of claim 4, wherein determining dependencies between the plurality of test items comprises:
determining a dependency identifier of each test item;
and determining the dependency relationship among the plurality of test items according to the incidence relationship among the dependency identifiers of each test item.
6. The method of claim 1, wherein the plurality of test items comprise at least one of a signal consistency test item, a power integrity test item, a compatibility test item, a performance test item, and a stress test item.
7. The method according to any one of claims 1-6, wherein after obtaining the corresponding test result, further comprising:
and generating a test report according to the test result, and outputting the test report.
8. A network card testing device, characterized in that, the device includes:
the test item determining module is used for determining a plurality of test items aiming at the network card to be tested;
a project testing order determination module for determining a project testing order for the plurality of test projects;
the test module is used for sequentially testing the test items of the network card to be tested according to the item test sequence to obtain a corresponding test result;
and determining whether to continue testing the next test item of the network card to be tested according to the test result corresponding to the test item ranked in the previous item in the item test sequence.
9. An electronic device comprising a processor and a memory, the memory storing computer readable instructions that, when executed by the processor, perform the method of any of claims 1-7.
10. A readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010623636.7A CN111786854B (en) | 2020-06-30 | 2020-06-30 | Network card testing method and device, electronic equipment and readable storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010623636.7A CN111786854B (en) | 2020-06-30 | 2020-06-30 | Network card testing method and device, electronic equipment and readable storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111786854A true CN111786854A (en) | 2020-10-16 |
| CN111786854B CN111786854B (en) | 2022-08-16 |
Family
ID=72760895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010623636.7A Active CN111786854B (en) | 2020-06-30 | 2020-06-30 | Network card testing method and device, electronic equipment and readable storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111786854B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112948189A (en) * | 2021-02-25 | 2021-06-11 | 山东英信计算机技术有限公司 | Margin test method, margin test system and related device |
| CN113406477A (en) * | 2021-06-18 | 2021-09-17 | 广州市诺的电子有限公司 | PCBA test method, system, computer equipment and storage medium |
| CN114740401A (en) * | 2022-03-24 | 2022-07-12 | 深圳市三一联光智能设备股份有限公司 | Novel test method and system |
| CN114779058A (en) * | 2022-06-23 | 2022-07-22 | 联宝(合肥)电子科技有限公司 | Mainboard detection method, device, equipment and medium for dynamically adjusting item measurement proportion |
Citations (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06209356A (en) * | 1993-01-12 | 1994-07-26 | Nippon Telegr & Teleph Corp <Ntt> | Test procedure execution method for communication equipment |
| JP2007304846A (en) * | 2006-05-11 | 2007-11-22 | Hitachi Ltd | Specification creation support method and specification creation support apparatus |
| CN101221502A (en) * | 2008-02-01 | 2008-07-16 | 中国建设银行股份有限公司 | Case design method and device for software test |
| CN101673233A (en) * | 2008-09-12 | 2010-03-17 | 英业达股份有限公司 | Scheduling method of test items and scheduling system thereof |
| CN101917306A (en) * | 2010-08-20 | 2010-12-15 | 北京星网锐捷网络技术有限公司 | Method, system and device for automatic test |
| CN103455396A (en) * | 2013-09-03 | 2013-12-18 | 北京安兔兔科技有限公司 | Test method and test device of hardware performance of electronic equipment |
| US20140013134A1 (en) * | 2009-07-20 | 2014-01-09 | Caringo, Inc. | Adaptive power conservation in storage clusters |
| CN103995763A (en) * | 2014-06-06 | 2014-08-20 | 北京安兔兔科技有限公司 | Electronic device performance test method and device |
| US20140373184A1 (en) * | 2013-06-12 | 2014-12-18 | Lookout, Inc. | Mobile device persistent security mechanism |
| CN104868958A (en) * | 2015-05-07 | 2015-08-26 | 中国人民解放军国防科学技术大学 | Data transmission test method based on time division multiple access spatial dynamic network |
| CN105589874A (en) * | 2014-10-22 | 2016-05-18 | 阿里巴巴集团控股有限公司 | ETL task dependence relationship detecting method and device and ETL tool |
| CN105824746A (en) * | 2015-01-05 | 2016-08-03 | 中国移动（深圳）有限公司 | Method and device for automatically generating test scheduling based on use case dependencies |
| CN106355379A (en) * | 2016-08-26 | 2017-01-25 | 隆鑫通用动力股份有限公司 | Product test method |
| CN107679198A (en) * | 2017-10-10 | 2018-02-09 | 北京奇虎科技有限公司 | The querying method and device of information |
| CN107943702A (en) * | 2017-11-28 | 2018-04-20 | 中标软件有限公司 | Hardware compatibility test method and device |
| CN109117359A (en) * | 2017-06-22 | 2019-01-01 | 深圳市中兴微电子技术有限公司 | Serialize test method and device |
| CN109471706A (en) * | 2018-10-11 | 2019-03-15 | 平安科技（深圳）有限公司 | A kind of response method and system of testing test |
| CN110309057A (en) * | 2019-05-23 | 2019-10-08 | 平安普惠企业管理有限公司 | Process project testing method and relevant device based on automatized script |
| CN110336694A (en) * | 2019-06-17 | 2019-10-15 | 桂林电子科技大学 | 3D NoC test dispatching method based on Petri network and IFA |
| CN110442513A (en) * | 2019-07-08 | 2019-11-12 | 深圳壹账通智能科技有限公司 | Execution method, apparatus, computer equipment and the storage medium of functional test use-case |
-
2020
- 2020-06-30 CN CN202010623636.7A patent/CN111786854B/en active Active
Patent Citations (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06209356A (en) * | 1993-01-12 | 1994-07-26 | Nippon Telegr & Teleph Corp <Ntt> | Test procedure execution method for communication equipment |
| JP2007304846A (en) * | 2006-05-11 | 2007-11-22 | Hitachi Ltd | Specification creation support method and specification creation support apparatus |
| CN101221502A (en) * | 2008-02-01 | 2008-07-16 | 中国建设银行股份有限公司 | Case design method and device for software test |
| CN101673233A (en) * | 2008-09-12 | 2010-03-17 | 英业达股份有限公司 | Scheduling method of test items and scheduling system thereof |
| US20140013134A1 (en) * | 2009-07-20 | 2014-01-09 | Caringo, Inc. | Adaptive power conservation in storage clusters |
| CN101917306A (en) * | 2010-08-20 | 2010-12-15 | 北京星网锐捷网络技术有限公司 | Method, system and device for automatic test |
| US20140373184A1 (en) * | 2013-06-12 | 2014-12-18 | Lookout, Inc. | Mobile device persistent security mechanism |
| CN103455396A (en) * | 2013-09-03 | 2013-12-18 | 北京安兔兔科技有限公司 | Test method and test device of hardware performance of electronic equipment |
| CN103995763A (en) * | 2014-06-06 | 2014-08-20 | 北京安兔兔科技有限公司 | Electronic device performance test method and device |
| CN105589874A (en) * | 2014-10-22 | 2016-05-18 | 阿里巴巴集团控股有限公司 | ETL task dependence relationship detecting method and device and ETL tool |
| CN105824746A (en) * | 2015-01-05 | 2016-08-03 | 中国移动（深圳）有限公司 | Method and device for automatically generating test scheduling based on use case dependencies |
| CN104868958A (en) * | 2015-05-07 | 2015-08-26 | 中国人民解放军国防科学技术大学 | Data transmission test method based on time division multiple access spatial dynamic network |
| CN106355379A (en) * | 2016-08-26 | 2017-01-25 | 隆鑫通用动力股份有限公司 | Product test method |
| CN109117359A (en) * | 2017-06-22 | 2019-01-01 | 深圳市中兴微电子技术有限公司 | Serialize test method and device |
| CN107679198A (en) * | 2017-10-10 | 2018-02-09 | 北京奇虎科技有限公司 | The querying method and device of information |
| CN107943702A (en) * | 2017-11-28 | 2018-04-20 | 中标软件有限公司 | Hardware compatibility test method and device |
| CN109471706A (en) * | 2018-10-11 | 2019-03-15 | 平安科技（深圳）有限公司 | A kind of response method and system of testing test |
| CN110309057A (en) * | 2019-05-23 | 2019-10-08 | 平安普惠企业管理有限公司 | Process project testing method and relevant device based on automatized script |
| CN110336694A (en) * | 2019-06-17 | 2019-10-15 | 桂林电子科技大学 | 3D NoC test dispatching method based on Petri network and IFA |
| CN110442513A (en) * | 2019-07-08 | 2019-11-12 | 深圳壹账通智能科技有限公司 | Execution method, apparatus, computer equipment and the storage medium of functional test use-case |
Non-Patent Citations (4)
| Title |
|---|
| F. R. M. BARNES等: "《Testing Ethernet Networks for the ATLAS》", 《IEEE TRANSACTIONS ON NUCLEAR SCIENCE,》 * |
| 刘永良: "用VB和关系数据库实现数据转储", 《上海工程技术大学学报》 * |
| 张艳梅等: "《集成测试中的类测试顺序生成技术述评》", 《计算机学报》 * |
| 马良荔等: "A Metadata Model Based on Coupling Testing Information to Increase Testability of Component", 《JOURNAL OF DONGHUA UNIVERSITY(ENGLISH EDITION)》 * |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112948189A (en) * | 2021-02-25 | 2021-06-11 | 山东英信计算机技术有限公司 | Margin test method, margin test system and related device |
| CN112948189B (en) * | 2021-02-25 | 2022-12-09 | 山东英信计算机技术有限公司 | Margin test method, margin test system and related device |
| CN113406477A (en) * | 2021-06-18 | 2021-09-17 | 广州市诺的电子有限公司 | PCBA test method, system, computer equipment and storage medium |
| CN114740401A (en) * | 2022-03-24 | 2022-07-12 | 深圳市三一联光智能设备股份有限公司 | Novel test method and system |
| CN114779058A (en) * | 2022-06-23 | 2022-07-22 | 联宝(合肥)电子科技有限公司 | Mainboard detection method, device, equipment and medium for dynamically adjusting item measurement proportion |
| CN114779058B (en) * | 2022-06-23 | 2022-09-23 | 联宝(合肥)电子科技有限公司 | Mainboard detection method, device, equipment and medium for dynamically adjusting item measurement proportion |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111786854B (en) | 2022-08-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111786854B (en) | Network card testing method and device, electronic equipment and readable storage medium | |
| CN111459794B (en) | Communication network testing method, device, computer equipment and storage medium | |
| WO2017000424A1 (en) | Protocol detection method and apparatus | |
| CN103376340B (en) | A kind of keyset, multi-platform serial test system and method | |
| CN106897219B (en) | Method and device for testing stability of mobile terminal system | |
| CN106407059A (en) | Server node testing system and method | |
| CN108459850B (en) | Method, device and system for generating test script | |
| US9529069B2 (en) | Test system for testing electrostatic tester and method thereof | |
| CN103077114A (en) | Automatic testing method based on communication protocol of temperature measuring device | |
| CN111324502A (en) | Batch test system and method thereof | |
| US20170187585A1 (en) | Technologies for validating operations of devices | |
| CN109428778B (en) | Mainboard network connectivity test method and device | |
| GB2514402A (en) | Method and test environment for testing an integrated circuit | |
| CN111505531B (en) | Board card test system | |
| CN109522263B (en) | I2C link monitoring system | |
| CN110988528A (en) | Method, device and system for testing product signal integrity | |
| CN116137603A (en) | Link fault detection method and device, storage medium and electronic device | |
| US7721260B2 (en) | Embedded Test I/O Engine | |
| CN115480975A (en) | Wiring checking method and device | |
| CN114138587B (en) | Method, device and equipment for verifying reliability of server power firmware upgrade | |
| CN109541437A (en) | Integrated circuit and system | |
| CN113687992A (en) | Onboard equipment power-on and power-off test method | |
| CN116382968B (en) | Fault detection method and device for external equipment | |
| CN112034296B (en) | Avionics fault injection system and method | |
| CN112698995B (en) | Serial port information positioning method, device and system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20211011 Address after: Building 36, yard 8, Dongbeiwang West Road, Haidian District, Beijing 100089 Applicant after: Dawning Information Industry (Beijing) Co.,Ltd. Applicant after: ZHONGKE SUGON INFORMATION INDUSTRY CHENGDU Co.,Ltd. Address before: 100000 building 36, yard 8, Dongbeiwang West Road, Haidian District, Beijing Applicant before: Dawning Information Industry (Beijing) Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |