CN112948189B - Margin test method, margin test system and related device - Google Patents
Margin test method, margin test system and related device Download PDFInfo
- Publication number
- CN112948189B CN112948189B CN202110211313.1A CN202110211313A CN112948189B CN 112948189 B CN112948189 B CN 112948189B CN 202110211313 A CN202110211313 A CN 202110211313A CN 112948189 B CN112948189 B CN 112948189B
- Authority
- CN
- China
- Prior art keywords
- test
- testing
- tested
- item
- margin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The application provides a margin testing method, wherein a power distribution device is respectively connected with a control device and a device to be tested, and the margin testing method comprises the following steps: receiving a test request; confirming the test sequence and the test times of the test items corresponding to the test request, and carrying out margin test according to the test sequence and the test times; judging whether the test times are met; if yes, collecting a test result; if not, restarting the equipment to be tested by using the power distribution device and continuing margin testing. The method and the device for testing the power failure of the device to be tested can ensure the power failure of the device to be tested in the restarting process, so that the parameter setting in the cache of the device to be tested is eliminated, the influence on the testing result caused by the fact that the cache is not eliminated when the DC Reset is adopted is avoided, and the testing precision is effectively improved. The application also provides a margin test system, a computer readable storage medium and an electronic device, which have the beneficial effects.
Description
Technical Field
The present disclosure relates to the field of computer testing, and in particular, to a margin testing method, a margin testing system, and a related device.
Background
In the margin test process aiming at the equipment, once the cyclic test is involved, a tester is required to wait for the detection software to finish the next test for a long time, and if the automated test is to be achieved, the test equipment needs to be restarted. If the control calculator directly executes the restart of the object to be tested into the DC Reset, after the test is finished, the cache in the device to be tested can keep the parameter setting in the last test process and influence the test result of the next test. Therefore, the DC Reset may cause the test tool to fail or affect the test result for executing a plurality of test tools, resulting in the failure of the margin test or the insufficient accuracy of the margin test, which is not favorable for the execution of the margin test.
Disclosure of Invention
The application aims to provide a margin test method, a margin test system, a computer readable storage medium and electronic equipment, wherein the restarting of the equipment to be tested is controlled through a power distribution device, and the influence of a cache device on the precision of the margin test can be effectively reduced.
In order to solve the technical problem, the present application provides a margin testing method, in which a power distribution device is respectively connected to a control device and a device to be tested, and the specific technical scheme is as follows:
receiving a test request;
confirming the test sequence and the test times of the test items corresponding to the test request, and carrying out margin test according to the test sequence and the test times;
judging whether the test times are met;
if so, collecting a test result;
if not, restarting the equipment to be tested by using the power distribution device and continuing margin testing.
Optionally, the determining the test sequence and the test times of the test items corresponding to the test request includes:
confirming a test item corresponding to the test request;
and determining the test sequence and the test times of the equipment to be tested corresponding to each test item according to the item category of the test item.
Optionally, determining, according to the item category of the test item, a test sequence and a test frequency of each test item corresponding to the device to be tested includes:
determining the item test importance sequence of each test item;
and determining the test sequence and the test times of the equipment to be tested on each test item according to the item test importance sequence.
Optionally, determining, according to the item category of the test item, the test sequence and the test times of each test item corresponding to the device under test includes:
and calling a preset computer program or a preset script to determine the test sequence and the test times of the equipment to be tested corresponding to each test item according to the item category of the test item.
Optionally, the restarting and continuing the margin test on the device under test by using the power distribution apparatus includes:
calling a power distribution software configuration restarting instruction in the control equipment; the restart instruction comprises equipment information and restart time of the equipment to be tested;
and restarting the equipment to be tested according to the restarting time by utilizing the power distribution device according to the restarting instruction.
The application also provides a margin test system, and the power distribution device keeps being connected with controlgear and equipment to be tested respectively, the system includes:
the receiving module is used for receiving the test request;
the testing module is used for confirming the testing sequence and the testing times of the testing items corresponding to the testing request and carrying out margin testing according to the testing sequence and the testing times;
the test frequency judging module is used for judging whether the test frequency is met;
the result collecting module is used for collecting the test result when the judgment result of the test frequency judging module is yes;
and the restarting module is used for restarting the equipment to be tested by utilizing the power distribution device and continuing margin testing when the judgment result of the testing frequency judgment module is negative.
Optionally, the test module includes:
the confirming unit is used for confirming the test item corresponding to the test request;
and the test unit is used for determining the test sequence and the test times of each test item corresponding to the equipment to be tested according to the item category of the test item.
Optionally, the restart module includes:
the instruction configuration unit is used for calling a power distribution software configuration restarting instruction in the control equipment; the restart instruction comprises equipment information and restart time of the equipment to be tested;
and the restarting unit is used for restarting the equipment to be tested according to the restarting time by utilizing the power distribution device according to the restarting instruction.
The present application also provides a computer-readable storage medium having stored thereon a computer program which, when being executed by a processor, carries out the steps of the method as set forth above.
The present application further provides an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the method described above when calling the computer program in the memory.
The application provides a margin testing method, wherein a power distribution device is respectively connected with a control device and a device to be tested, and the margin testing method comprises the following steps: receiving a test request; confirming the test sequence and the test times of the test items corresponding to the test request, and carrying out margin test according to the test sequence and the test times; judging whether the test times are met; if so, collecting a test result; if not, restarting the equipment to be tested by using the power distribution device and continuing margin testing.
According to the method and the device, the power distribution device is configured between the control equipment and the equipment to be tested, after the test request is received, the power distribution device is controlled by the control equipment to control power supply of the equipment to be tested according to the test request, power failure in the restarting process of the equipment to be tested is ensured, parameter setting in the cache of the equipment to be tested is eliminated, the test result is prevented from being influenced due to the fact that the cache is not eliminated when a DC Reset is adopted, and therefore the test precision is effectively improved.
The application also provides a margin test system, a computer readable storage medium and an electronic device, which have the beneficial effects and are not repeated herein.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flowchart of a margin testing method according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of a testing structure of a margin test provided in an embodiment of the present application;
fig. 3 is a schematic structural diagram of a margin test system according to an embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, fig. 1 is a flowchart of a margin testing method according to an embodiment of the present disclosure.
The margin is a Phase Margin (PM), which is also called phase margin, and is an important index in circuit design, and is mainly used for measuring the stability of a negative feedback system and predicting the overshoot of a step response of a closed loop system.
The application provides a margin testing method, which comprises the following specific technical scheme:
s101: receiving a test request;
in this embodiment, the power distribution device is required to be connected to the control device and the device to be tested, that is, the power distribution device is configured between the control device and the device to be tested, and is used for controlling the power failure of the device to be tested. The specific structure and structure of the power distribution device are not limited, as long as the power distribution device can control the power supply and the power off of the device to be tested according to the instruction of the control device. It should be noted that, it is necessary to ensure the power supply distribution apparatus to absolutely control the power supply of the device under test, which ensures that the power-off process of the device under test is caused by no power supply, thereby ensuring that the buffered data in the device under test is automatically cleared due to no power supply source.
There is no limitation on how the test request is received, and the test request may originate from any electronic device that needs to perform a margin test. Similarly, the specific content of the test request is not limited specifically, and at least the related information of the test items, such as the test sequence and the test times, may also include the test items specific to each test device. That is, the mapping relationship between the devices to be tested and the test items is configured in the test request, and the test items corresponding to each device to be tested can be directly determined according to the test request. Of course, different devices under test may correspond to different test items, that is, it is not required that the test items corresponding to all the devices under test are the same. In addition, even if the test items corresponding to different devices to be tested are the same, the corresponding test sequence can be configured for the different devices to be tested.
S102: confirming the test sequence and the test times of the test items corresponding to the test request, and carrying out margin test according to the test sequence and the test times;
in this step, the test items in the test request, the test sequence and the test times of the test items need to be confirmed. It should be noted that the test sequence refers to the test sequence between the test items, and is specific to the same device under test. When performing margin tests among different devices to be tested, the test sequence among the devices to be tested can be preset in the test request, or can be limited according to the test sequence which does not aim at the devices to be tested. Because the margin tests between the devices under test are independent of each other, the test order between the devices under test is not important compared to the test order between the test items. However, those skilled in the art can configure the test request when performing the margin test if there is a requirement for the test sequence between the devices under test, and will not be described in detail herein.
As a preferred implementation manner of this step, the following two processes may be included in the execution of this step:
s1021: confirming a test item corresponding to the test request;
s1022: and determining the test sequence and the test times of the equipment to be tested corresponding to each test item according to the item category of the test item.
The test items contained in the test request are confirmed first, and then the test sequence and the test times of the test items are confirmed according to the item types of the test items. Since different test items may have a certain verification relationship in the execution process, the test sequence may be determined according to the item categories. For example, the AC cycling script may check whether the system for repeatedly turning on and off the computer is correctly started and connected to the system, and the IOMT script is used to check all the IO performance of the CPU chip, and then the AC cycling script may be used to detect the system first, and then the IOMT may be used to check all the IO performance of the CPU chip. The test times of different test items are different according to different test purposes, for example, the test times of the AC cycling script are usually 500-1000 times and are different, one time is five minutes, while the IOMT script needs five testing rounds when performing the margin test, and each round needs five testing times.
In addition, the item test importance sequence of each test item can be determined, so that the test sequence and the test times of the equipment to be tested on each test item can be determined according to the item test importance sequence. In order to facilitate quick determination of the test sequence and the test times of each test item, a preset computer program or a preset script can be called to determine the test sequence and the test times of each test item corresponding to the equipment to be tested according to the item category of the test item, and the test sequence and the test times are quickly determined after the test request is received by configuring the item test importance sequence and the corresponding test times of each test item in the preset computer program or the preset script in advance.
In addition, no matter what kind of test items are, the software or script used by the test items should be matched with the control device and the device to be tested, that is, the language types which can be recognized by the control device and the device to be tested are used. Of course, the type of programming language used by the software or script corresponding to the test item is not limited, and a language such as C + + may be generally used.
The above process is for each device under test. If the test items corresponding to different devices to be tested are different, the corresponding test items of each device to be tested can be determined, and then the above process is performed to determine the test sequence and the test times of the test items.
S103: judging whether the test times are met; if yes, entering S104; if not, entering S105;
s104: collecting a test result;
in the step, after the test times are confirmed to be met, the test result is collected. However, it should be noted that the test times refer to test tests of test items, that is, each time the test times corresponding to a test item is completed, a corresponding test result can be collected, and the test result also belongs to the test item only. Although the margin test includes at least one test item, the corresponding test result can be collected regardless of which test item is ended. Therefore, the number of tests in S103 actually refers to the number of tests per test item. And because the test contents of the test items are different, the test times are different, the time consumed by single test is different, and the ending time of each test item is usually different. Therefore, the step can be executed only after a certain test item meets the corresponding test times.
However, it should be noted that collecting the test result does not necessarily mean the result of the margin test, and it is only possible to see that the margin test is finished after the test times of all the test items included in the test request are met.
S105: and restarting the equipment to be tested by utilizing the power distribution device and continuing margin testing.
If the corresponding test times are not met, the power distribution device can be used for restarting the device to be tested and continuously executing the test. It will be readily appreciated that the restart should be performed before ensuring that the current tests are all completed, i.e., avoiding performing a restart while there are currently still test items executing. When the step is executed, power distribution software in the control equipment can be called to configure a restart instruction, and then the power distribution device is utilized to restart the equipment to be tested according to the restart instruction and the restart time. The restart instruction may include device information of the device under test and a restart time, i.e., device information of the device under test that is determined to need to be restarted, and the restart time, i.e., a time point of the required restart. Thereby performing the restart when the restart time is satisfied. The test time of the test items can be directly obtained in the test process, so that the end time of all the test items in the equipment to be tested can be estimated, and the restart time can be determined according to the estimated end time. That is, the restart instruction may be sent to the power distribution apparatus by the control device in advance, and the power distribution apparatus performs restart of the corresponding device to be tested at the restart time according to the restart instruction.
It is easily understood that, in the above test process described in this embodiment, the test processes of the devices under test are independent of each other and do not affect each other, and at the same time, the maximum number of connectable devices under test is limited by the performance of the control device and the number of interfaces of the power distribution apparatus, and three or more devices may be generally configured, which is not limited herein.
According to the embodiment of the application, the power distribution device is configured between the control equipment and the equipment to be tested, after the test request is received, the power distribution device is controlled by the control equipment to supply power to the equipment to be tested according to the test request, power failure in the restarting process of the equipment to be tested is ensured, parameter setting in the cache of the equipment to be tested is eliminated, the test result is prevented from being influenced due to the fact that the cache is not eliminated when a DC Reset is adopted, and the test precision is effectively improved.
Referring to fig. 2, fig. 2 is a schematic view of a testing structure of a margin test provided by the present application, and in fig. 2, the control device is a computer, which is connected to each device under test on one hand, and is configured to test the device under test according to test software or a test script corresponding to a test item in a test request, and is connected to the power distribution device on the other hand, and is configured to control power supply of each device under test, so as to restart the device under test. The connection relationship between the control device and the device to be tested is required to be a default connection relationship, and is not repeatedly described above. In fig. 2, it is assumed that the test items corresponding to each device under test are the same, but different test sequences are configured for different devices under test, and through the connection manner shown in fig. 2 and the margin test process described in the above embodiment, the margin test can be performed on multiple devices under test at the same time, and the adverse test influence caused by power off of the cache due to DC Reset is solved.
In the following, a margin testing system provided by an embodiment of the present application is introduced, and the margin testing system described below and the margin testing method described above may be referred to correspondingly.
Referring to fig. 3, fig. 3 is a schematic structural diagram of a margin test system according to an embodiment of the present disclosure, and the present disclosure further provides a margin test system, in which a power distribution device is respectively connected to a control device and a device under test, and the system includes:
a receiving module 100, configured to receive a test request;
the test module 200 is configured to confirm a test sequence and test times of a test item corresponding to the test request, and perform a margin test according to the test sequence and the test times;
a test frequency judging module 300, configured to judge whether the test frequency is satisfied;
a result collecting module 400, configured to collect the test result when the determination result of the test frequency determining module is yes;
and the restarting module 500 is used for restarting the equipment to be tested by using the power distribution device and continuing the margin test when the judgment result of the test frequency judgment module is negative.
Based on the above embodiment, as a preferred embodiment, the test module 200 includes:
the confirming unit is used for confirming the test item corresponding to the test request;
and the test unit is used for determining the test sequence and the test times of each test item corresponding to the equipment to be tested according to the item category of the test item.
Based on the above embodiment, as a preferred embodiment, the test unit is a unit for performing the following steps:
determining the item test importance sequence of each test item;
and determining the test sequence and the test times of the equipment to be tested on each test item according to the item test importance sequence.
Based on the above embodiment, as a preferred embodiment, the restart module 500 includes:
the instruction configuration unit is used for calling a power distribution software configuration restarting instruction in the control equipment; the restart instruction comprises equipment information and restart time of the equipment to be tested;
and the restarting unit is used for restarting the equipment to be tested according to the restarting time by utilizing the power distribution device according to the restarting instruction.
The present application also provides a computer readable storage medium having stored thereon a computer program which, when executed, may implement the steps provided by the above-described embodiments. The storage medium may include: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The present application further provides an electronic device, which may include a memory and a processor, where the memory stores a computer program, and when the processor calls the computer program in the memory, the steps provided in the foregoing embodiments may be implemented. Of course, the electronic device may also include various network interfaces, power supplies, and the like.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. For the system provided by the embodiment, the description is relatively simple because the system corresponds to the method provided by the embodiment, and the relevant points can be referred to the method part for description.
The principles and embodiments of the present application are explained herein using specific examples, which are provided only to help understand the method and the core idea of the present application. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising one of 8230; \8230;" 8230; "does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
Claims (8)
1. A margin test method is characterized in that a power distribution device is respectively connected with a control device and a device to be tested, and the method comprises the following steps:
receiving a test request;
confirming the test sequence and the test times of the test items corresponding to the test request, and carrying out margin test according to the test sequence and the test times;
judging whether the test times are met;
if yes, collecting a test result;
if not, restarting the equipment to be tested by using the power distribution device and continuing margin testing;
the restarting and continuing margin testing of the device to be tested by using the power distribution device comprises the following steps:
calling a power distribution software configuration restart instruction in the control equipment; the restart instruction comprises equipment information and restart time of the equipment to be tested;
and restarting the equipment to be tested according to the restarting time by utilizing the power distribution device according to the restarting instruction.
2. The margin testing method of claim 1, wherein confirming the test order and the number of tests of the test items corresponding to the test request comprises:
confirming a test item corresponding to the test request;
and determining the test sequence and the test times of the equipment to be tested corresponding to each test item according to the item category of the test item.
3. The margin testing method of claim 2, wherein determining the testing order and the testing times of the device under test corresponding to each of the test items according to the item category of the test item comprises:
determining the item test importance sequence of each test item;
and determining the test sequence and the test times of the equipment to be tested on each test item according to the item test importance sequence.
4. The margin testing method according to claim 2 or 3, wherein determining the testing sequence and the testing times of each test item corresponding to the device under test according to the item category of the test item comprises:
and calling a preset computer program or a preset script to determine the test sequence and the test times of the equipment to be tested corresponding to each test item according to the item category of the test item.
5. A margin test system is characterized in that a power distribution device is respectively connected with a control device and a device to be tested, and the system comprises:
the receiving module is used for receiving the test request;
the testing module is used for confirming the testing sequence and the testing times of the testing items corresponding to the testing request and carrying out margin testing according to the testing sequence and the testing times;
the test frequency judging module is used for judging whether the test frequency is met;
the result collecting module is used for collecting the test result when the judgment result of the test frequency judging module is yes;
the restarting module is used for restarting the equipment to be tested by utilizing the power distribution device and continuing margin testing when the judgment result of the testing frequency judgment module is negative;
wherein the restart module comprises:
the instruction configuration unit is used for calling a power distribution software configuration restarting instruction in the control equipment; the restart instruction comprises equipment information and restart time of the equipment to be tested;
and the restarting unit is used for restarting the equipment to be tested according to the restarting time by utilizing the power distribution device according to the restarting instruction.
6. The margin testing system of claim 5, wherein the testing module comprises:
the confirming unit is used for confirming the test item corresponding to the test request;
and the test unit is used for determining the test sequence and the test times of each test item corresponding to the equipment to be tested according to the item category of the test item.
7. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the margin testing method according to any one of claims 1-4.
8. An electronic device comprising a memory having a computer program stored therein and a processor that when invoked by the computer program in the memory implements the steps of the margin testing method of any of claims 1-4.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110211313.1A CN112948189B (en) | 2021-02-25 | 2021-02-25 | Margin test method, margin test system and related device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110211313.1A CN112948189B (en) | 2021-02-25 | 2021-02-25 | Margin test method, margin test system and related device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN112948189A CN112948189A (en) | 2021-06-11 |
CN112948189B true CN112948189B (en) | 2022-12-09 |
Family
ID=76246132
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110211313.1A Active CN112948189B (en) | 2021-02-25 | 2021-02-25 | Margin test method, margin test system and related device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN112948189B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113899756B (en) * | 2021-09-09 | 2024-03-22 | 东风柳州汽车有限公司 | High-voltage wire harness grouping test method, device, equipment and storage medium |
TWI800327B (en) * | 2022-03-23 | 2023-04-21 | 慧榮科技股份有限公司 | Data storage system and parameter margin evaluation method |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013061841A (en) * | 2011-09-14 | 2013-04-04 | Fujitsu Ltd | Information processing device and test method for information processing device |
CN107368396A (en) * | 2017-08-22 | 2017-11-21 | 北京计算机技术及应用研究所 | A kind of automatization test system and method towards production domesticization computer |
CN109257249A (en) * | 2018-08-20 | 2019-01-22 | 郑州云海信息技术有限公司 | A kind of network interface card stability test method, apparatus, terminal and storage medium |
CN110413531A (en) * | 2019-08-02 | 2019-11-05 | 深圳忆联信息系统有限公司 | Realize IOMT automatic test approach, device, computer equipment and storage medium |
CN110739964A (en) * | 2018-07-20 | 2020-01-31 | 恩智浦有限公司 | Self-testing phase-locked loops using pseudo-random noise |
CN111786854A (en) * | 2020-06-30 | 2020-10-16 | 曙光信息产业(北京)有限公司 | Network card testing method and device, electronic equipment and readable storage medium |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4705880B2 (en) * | 2006-05-09 | 2011-06-22 | Okiセミコンダクタ株式会社 | Semiconductor integrated circuit and its test method |
-
2021
- 2021-02-25 CN CN202110211313.1A patent/CN112948189B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013061841A (en) * | 2011-09-14 | 2013-04-04 | Fujitsu Ltd | Information processing device and test method for information processing device |
CN107368396A (en) * | 2017-08-22 | 2017-11-21 | 北京计算机技术及应用研究所 | A kind of automatization test system and method towards production domesticization computer |
CN110739964A (en) * | 2018-07-20 | 2020-01-31 | 恩智浦有限公司 | Self-testing phase-locked loops using pseudo-random noise |
CN109257249A (en) * | 2018-08-20 | 2019-01-22 | 郑州云海信息技术有限公司 | A kind of network interface card stability test method, apparatus, terminal and storage medium |
CN110413531A (en) * | 2019-08-02 | 2019-11-05 | 深圳忆联信息系统有限公司 | Realize IOMT automatic test approach, device, computer equipment and storage medium |
CN111786854A (en) * | 2020-06-30 | 2020-10-16 | 曙光信息产业(北京)有限公司 | Network card testing method and device, electronic equipment and readable storage medium |
Also Published As
Publication number | Publication date |
---|---|
CN112948189A (en) | 2021-06-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10748083B2 (en) | Automated tuning of a service configuration | |
CN112948189B (en) | Margin test method, margin test system and related device | |
CN110474896B (en) | Data communication method based on Modbus protocol standard and related equipment | |
CN110502366B (en) | Case execution method, device, equipment and computer readable storage medium | |
CN112052169A (en) | Test management method, system, device and computer readable storage medium | |
CN112269697B (en) | Equipment storage performance testing method, system and related device | |
CN112506751B (en) | Method, device, equipment and medium for contrast test of overall performance of server | |
CN111651350B (en) | Test case processing method, device, equipment and computer readable storage medium | |
CN111124828B (en) | Data processing method, device, equipment and storage medium | |
CN117214507A (en) | Current period detection method, device, equipment and storage medium | |
CN112486811A (en) | Interface test method, device, equipment and medium | |
CN116702668A (en) | Regression testing method and device, electronic equipment and storage medium | |
CN109412880B (en) | Method for testing abnormal starting of train network communication equipment | |
CN116467161A (en) | Application testing method and device, electronic equipment and storage medium | |
CN115391110A (en) | Test method of storage device, terminal device and computer readable storage medium | |
CN114817010A (en) | Python-based Redfish automatic testing method and device | |
CN111506422B (en) | Event analysis method and system | |
CN111090557B (en) | Management method, device and equipment for abnormal bandwidth reduction of PCIE (peripheral component interface express) equipment | |
CN113360389A (en) | Performance test method, device, equipment and storage medium | |
CN113110991A (en) | Page element positioning method and device, storage medium and electronic device | |
CN114157590A (en) | Network card testing method, device and equipment and computer readable storage medium | |
CN111722997B (en) | Abnormality detection method for automated test and computer-readable storage medium | |
CN111679943A (en) | Server test system | |
CN111752782A (en) | Stability testing method, system, device and storage medium | |
CN112165407A (en) | Detection system and method for communication between BMC and power module |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |