CN115391110A - Test method of storage device, terminal device and computer readable storage medium - Google Patents
Test method of storage device, terminal device and computer readable storage medium Download PDFInfo
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/22—Microcontrol or microprogram arrangements
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- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/455—Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines
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- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/455—Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines
- G06F9/45533—Hypervisors; Virtual machine monitors
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- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/455—Emulation; Interpretation; Software simulation, e.g. virtualisation or emulation of application or operating system execution engines
- G06F9/45533—Hypervisors; Virtual machine monitors
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Abstract
The application discloses a testing method of storage equipment, terminal equipment and a computer readable storage medium, wherein the method comprises the steps of determining a target use state corresponding to a testing requirement when the virtual host receives the testing requirement; controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program; when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement; and determining the test result of the storage equipment according to the execution result of the test case. The problem of in the actual aging testing process, inefficiency is solved. The efficiency of the aging test of the storage equipment is improved.
Description
Technical Field
The present application relates to the field of storage device testing, and in particular, to a method for testing a storage device, a terminal device, and a computer-readable storage medium.
Background
With the development of science and technology, electronic products such as computers, tablets and mobile phones are more and more popular, and each electronic product needs a storage module to support the operation of equipment. After the storage equipment is produced, the storage system needs to be subjected to aging test, so that whether the performance of the storage equipment reaches the standard or not is determined, and the service life of the storage equipment is ensured.
In the process of aging test of the storage device, because the erasing/writing times of the NAND flash memory particles are limited, when the erasing/writing times of the flash memory particles reach a threshold value, the flash memory particles cannot work normally, and the storage device is damaged. In the actual aging test process of a factory, if the state of the specific equipment needs to be acquired, the equipment needs to be controlled to operate to the state of the specific equipment, and the time consumption is long and the energy consumption is large.
Disclosure of Invention
The embodiment of the application provides a test method of a storage device, a terminal device and a computer readable storage medium, and solves the problem that when the storage device is subjected to an aging test, the storage device needs to be controlled to actually execute an aging program, and the efficiency is low. The efficiency of the aging test of the storage equipment is improved.
The embodiment of the application provides a method for testing storage equipment, which comprises the following steps:
when the virtual host receives a test requirement, determining a target use state corresponding to the test requirement;
controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program;
when the aging state of the virtual storage system is matched with the target using state, executing a test case corresponding to the test requirement;
and determining the test result of the storage equipment according to the execution result of the test case.
Optionally, the step of determining the target usage status corresponding to the test requirement includes:
detecting an aging state of the virtual storage system;
and if the aging state is matched with the target use state, controlling the virtual storage system to execute the test case.
Optionally, the step of controlling the virtual flash memory granule and the virtual micro control unit to execute a preset aging program includes:
controlling the virtual micro-control unit to acquire the aging program stored in the virtual flash memory particles;
and executing the aging program and acquiring the aging state of the virtual storage system in real time.
Optionally, when it is detected that the aging state of the virtual storage system matches the target usage state, the step of executing the test case corresponding to the test requirement includes:
matching the aging state of the virtual storage system acquired in real time with the target use state, and if the aging state of the virtual storage system is consistent with the target use state, executing a test case corresponding to the test requirement;
otherwise, controlling the virtual micro-control unit to continuously execute the aging program.
Optionally, the step of executing the test case corresponding to the test requirement includes:
acquiring an execution condition and test time corresponding to the test case;
adjusting the operating conditions of the virtual storage system according to the execution conditions;
and when the virtual storage system is under the running condition and the running time is equal to the test time, stopping executing the test case.
Optionally, the step of executing the test case corresponding to the test requirement further includes:
if the test of the virtual storage system fails, reporting an error and stopping the test;
and if the virtual storage system finishes executing the test case, acquiring a new test requirement and carrying out the next test.
Optionally, after the step of determining the test result of the storage device according to the execution result of the test case, the method includes:
and storing the test result in association with the virtual storage system.
Optionally, after the step of storing the test result in association with the virtual storage system, the method includes:
receiving a new test requirement, and acquiring the test result according to the new test requirement;
and constructing the target state of the equipment to be tested according to the test result.
In addition, in order to achieve the above object, an embodiment of the present invention further provides a terminal device, which includes a memory, a processor, and a burn-in test program of the storage device, where the processor executes the burn-in test program of the storage device, and implements the method described above.
In addition, to achieve the above object, an embodiment of the present invention further provides a computer-readable storage medium, where a burn-in test program of a storage device is stored on the computer-readable storage medium, and when the burn-in test program of the storage device is executed by a processor, the method is implemented as described above.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
when the virtual host receives a test requirement, determining a target use state corresponding to the test requirement, controlling virtual flash memory particles on a virtual storage system and a virtual micro-control unit to execute a preset aging program, executing a test case corresponding to the test requirement when detecting that the aging state of the virtual storage system is matched with the target use state, and determining a test result of the storage device according to an execution result of the test case. The virtual storage device is used for executing the aging program without controlling the actual storage device to execute the aging action, so that the running speed of the program can be regulated and controlled, and the aging test efficiency is improved.
Drawings
FIG. 1 is a schematic flowchart illustrating a first embodiment of a method for testing a storage device according to the present application;
FIG. 2 is a flowchart illustrating a second embodiment of a method for testing a storage device according to the present application;
FIG. 3 is a flowchart illustrating a third embodiment of a method for testing a storage device according to the present application;
fig. 4 is a schematic terminal structure diagram of a hardware operating environment according to an embodiment of the present application.
Detailed Description
In the actual aging process of the storage device, the storage device needs to be controlled to execute a specific aging program, for example, to determine the state of the storage device after being used for one year, the storage device needs to be controlled to run the aging program for one year, and the efficiency is low. The application is applied to a virtual storage system and a virtual host, wherein the virtual storage system comprises virtual flash memory particles and a virtual control unit. When the virtual host receives a test requirement, determining a target use state corresponding to the test requirement; controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program; when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement; and determining the test result of the storage equipment according to the execution result of the test case. The virtual storage system and the virtual host replace actual storage equipment to execute the aging program, so that the running time of the program can be adjusted, the testing speed is increased, and the testing efficiency is improved.
In order to better understand the above technical solutions, exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
In order to better understand the technical solution, the technical solution will be described in detail with reference to the drawings and the specific embodiments.
Example one
Referring to fig. 1, a method for testing a storage device according to this embodiment includes the following steps:
step S10: when the virtual host receives a test requirement, determining a target use state corresponding to the test requirement;
in this embodiment, the virtual host is equivalent to a control system, and one virtual host can be connected to a plurality of virtual storage systems, so that a plurality of tests can be performed simultaneously. After the test requirements are received, the test requirements are analyzed, and then test instructions corresponding to the test requirements are distributed to the corresponding virtual storage systems. The virtual storage system is provided with virtual flash memory particles and a virtual micro-control unit. The target use state refers to a device state corresponding to the test requirement.
As an optional implementation manner, each virtual storage system has a unique code, and after receiving a test requirement, the test requirement is analyzed to obtain a code, and the virtual storage system corresponding to the code is controlled to age. Because the virtual storage system is reusable, and after one aging test is executed, the virtual storage system still maintains the aging state, so that the next test can be directly continued on the basis of the current aging state. Therefore, it is necessary to detect the current aging state of the virtual storage system corresponding to the code, determine the difference between the current aging state and the target usage state, and adjust the aging procedure according to the difference.
Illustratively, the virtual host resolves the test requirement to be performed on the virtual storage system encoded as L, and requires that the initial aging state of the L virtual storage system is a state of being operated for one year. And controlling the virtual flash memory particles and the virtual micro-control unit to execute the aging program to restore the aging state to the 365-day state when detecting that the current aging state of the L virtual storage system is the state of running for 400 days. The aging program can intelligently adjust whether to recover to a previous state or continue to age according to the difference between the initial aging state and the target use state.
As another optional implementation, when a test requirement is received, the virtual host randomly acquires one virtual storage system and detects a use state of the virtual storage system, and if the detected state is a busy state, acquires the next virtual storage system, and selects the idle virtual storage system to perform a subsequent aging test until the acquired state of the virtual storage system is idle.
Illustratively, the virtual storage system is provided with a reservation function, when a test requirement is received, the corresponding virtual storage system can be reserved according to the test requirement to perform aging test, and the reserved virtual storage system displays the reservation time. When the test requirement is received again, the system can judge whether the reserved virtual storage system is in an idle state or a working state to be about to work according to the time required by the new test requirement, and if the time required by the new test requirement is less than the reservation time of the virtual storage system, the virtual storage system is judged to be in the idle state and can be used.
As yet another alternative, the virtualized memory system has a reset button that may be reset back to an unused state after a burn-in test is performed. If the reset button is started, the virtual storage system can automatically save the current aging state and automatically recover to the unused state after aging each time. The user can select whether to start the reset button according to actual requirements.
For example, if the received test requests are all performed in a relatively short aging state, in order to save the adjustment time of the aging program, a reset button may be turned on, so that the virtual storage device returns to the initial state after performing the aging operation each time, so as to be called next time, thereby improving the test efficiency. The aged state is also stored before returning to the initial state, and the stored aged state can be called up an unlimited number of times. If the same test requirements exist, the stored aging state can be directly called, and the test efficiency is improved.
Step S20: controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program;
in this embodiment, the function of the virtual flash memory granule is the same as that of the real flash memory granule, but the erasing/writing times of the virtual flash memory granule are not limited, so that unlimited times of debugging can be performed without considering the problem that the aging test cannot be performed due to insufficient erasing/writing times of the flash memory granule in the test process. The virtual micro control unit controls the virtual flash memory particles to execute a preset aging program, and the virtual storage device is aged to a target use state.
As an optional embodiment, during the process that the virtual micro-control unit controls the virtual flash memory granule to execute the aging program, the aging state of the virtual storage system is acquired in real time, and the aging state acquired in real time can be stored.
Illustratively, the aging state of the virtual storage system may be set to be saved every hour. If an error occurs in the subsequent aging process, the latest saved aging state can be extracted, and then the aging program is continuously executed, so that the test time is saved. In addition, the aging state of the timing storage can be called for unlimited times and applied to other storage devices, and the test time of other storage devices is prolonged.
As yet another alternative, the amount of data for executing the aging program on the virtual device is smaller than the amount of data for executing the aging program on the real device, and thus the speed of executing the aging program using the virtual device is faster. The same aging program runs for 3 days on real devices, while the time required to run on virtual devices is much less than 3 days. The test time can be greatly saved.
Step S30: when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement;
in this embodiment, the test requirement may include information of the virtual device to be tested, a target use state, a test case, and the like. The test case comprises a test environment, an operation step, test data and expected effect waiting execution information.
As an optional implementation mode, when the aging state of the virtual storage system reaches the target use state corresponding to the test requirement, the execution of the aging program is stopped. And simultaneously, executing the test case corresponding to the test requirement.
Illustratively, the virtual storage system is controlled to execute the test case when the aging state of the virtual storage system matches the target usage state. Acquiring execution conditions and test time corresponding to the test cases, and adjusting the operating conditions of the virtual storage system according to the execution conditions; and when the virtual storage system is under the running condition and the running time is equal to the testing time, stopping executing the test case.
As another optional implementation, if an error occurs in the process of executing the test case by the virtual storage system, resulting in a test failure, an error report message is generated, and a tester is reminded to check the error report message. If the virtual storage system finishes executing the test case, the test is finished, the system is set to be in an idle standby state, and new test requirements can be received.
For example, the test requirement requires a test on a storage device with an aging state of two years, and at this time, the virtual flash memory granules and the virtual micro control unit need to be controlled to execute a preset aging program until the aging state of the virtual storage system is consistent with the target use state, that is, when the aging state of the virtual storage system is reached to two years, the test case corresponding to the test requirement is started to be executed. For example, on a virtual storage system with an aging state of two years, the aging is continued for 30 days, and the wear condition of the virtual storage system is checked. When the 30-day aging program is executed, the current aging state is saved for subsequent calling. And meanwhile, the system is set to be in an idle standby state for calling.
Step S40: and determining the test result of the storage equipment according to the execution result of the test case.
In this embodiment, the execution result of the test case refers to a state of the storage device when the test case is executed in an aging state corresponding to the test requirement until the execution is completed.
As an optional implementation manner, in the process of executing the test case, the process test result of the execution process may be saved in real time, so that when the test is suddenly interrupted, the execution may be directly continued from the latest saved and uninterrupted step.
Illustratively, to save memory space and increase system operating speed, historical process test results may be cleared. For example, the historical process test results may be cleared periodically, or only one or a few of the newly stored historical process test results may be saved.
As another optional implementation, after the execution of one test case is completed, the virtual storage system may receive a new test requirement, obtain the test result in the history storage record according to the new test requirement, and if there is a test result with a consistent target, may directly call the corresponding test result without executing an aging program. And if the test result with the consistent target does not exist, controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program, and then starting the test.
For example, if the expected execution result corresponding to the received new test requirement cannot be matched with the corresponding test result in the storage device, the virtual storage system is controlled to start to execute the aging test. Or the test result closest to the expected execution result can be searched, and the aging test is continued after the closest test result is obtained, so that the test time can be saved, and the test efficiency can be improved.
In this embodiment, a virtual storage system and a virtual host are used to simulate burn-in testing of real storage devices. The virtual memory system comprises a virtual flash memory grain and a virtual micro control unit. When the virtual host receives a test requirement, determining a target use state corresponding to the test requirement; controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program; when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement; and determining the test result of the storage equipment according to the execution result of the test case. The test result can be stored on the storage device so as to be called at any time, and the aging test efficiency of the storage device is improved. The burn-in test is performed faster on the virtual device because the program runs on the virtual device with fewer bytes than it would take to run on the actual device.
Example two
Based on the first embodiment, the other embodiment of the present application is provided.
Referring to fig. 2, the step of executing the test case corresponding to the test requirement includes:
step S31: acquiring execution conditions and test time corresponding to the test cases;
step S32: adjusting the operating conditions of the virtual storage system according to the execution conditions;
step S33: and when the virtual storage system is under the running condition and the running time is equal to the test time, stopping executing the test case.
In this embodiment, the test case includes a test target, a test environment, input data, a test procedure, an expected result, a test script, and the like. The test target refers to a target use state, i.e., a target device and an aging state of the target device. The execution condition refers to the contents of a test environment, input data, test steps, test scripts and the like in the test case. The test time refers to the time required to reach the expected result corresponding to the test case.
As an optional implementation manner, when the virtual storage system is in the target use state, after the execution condition and the test time corresponding to the test case are determined, the virtual storage system is controlled to start testing. And the virtual storage system executes the test script according to the test steps under the test environment specified by the test requirements, and stops executing the test case and stores the test result when an expected result is achieved.
Exemplarily, in a real use scenario, various interferences such as unstable voltage and current always exist when the storage device is tested, so that the real scenario can be simulated in a virtual test, a disturbance is randomly added in the test process, and the change condition of the aging test result is observed. When the test case has a voltage interference, randomly inputting a voltage interference value in the process of executing the test case by the virtual storage system, and observing the difference between the test result after the execution of the test case and the test result without the voltage interference value.
As another optional implementation manner, if the virtual storage system runs the test script under the running condition, and after the test time passes, the expected result corresponding to the test requirement is not yet reached, the test that the expected result is not reached this time is recorded, and meanwhile, the virtual storage system is controlled to continue to execute the erasing/writing action until the expected result is reached.
For example, for a test that does not reach the expected result, the simulation test may be performed a plurality of times again, the reason why the expected result is not reached is checked, and the test script is adjusted. Test programs are optimized, and test efficiency is improved.
In this embodiment, the virtual storage system is tested through the test case, the test case is replicable, and the test script in the test case can run automatically, which improves the efficiency of the aging test on a certain program.
EXAMPLE III
Referring to fig. 3, based on the above embodiment, a further embodiment of the present application is proposed, which includes the following steps:
step S21: controlling the virtual micro-control unit to acquire the aging program stored in the virtual flash memory particles;
step S22: executing the aging program and acquiring the aging state of the virtual storage system in real time;
in this embodiment, in the virtual storage system, when it is detected that the use state of the virtual storage system does not reach the target use state corresponding to the test requirement, the virtual storage system is controlled to execute the aging program, and the aging state of the virtual storage system is obtained in real time and stored.
As an optional implementation manner, after the aging state data of the virtual storage system is acquired, feature extraction may be performed periodically or at a key node of the aging state data, and the aging state data after feature extraction is stored, so that a memory space is saved. Meanwhile, the aging state data after the characteristics are extracted is convenient for other equipment to reconstruct an aging scene according to the characteristics.
Step S34: matching the aging state of the virtual storage system acquired in real time with the target use state, and if the aging state of the virtual storage system is consistent with the target use state, continuing to execute the test case corresponding to the test requirement;
step S35: otherwise, controlling the virtual micro-control unit to continuously execute the aging program.
In this embodiment, the aging state of each frame acquired in real time is matched with the target use state, and when the aging state of each frame is consistent with the target use state, it indicates that the virtual storage system has reached the initial use state corresponding to the test requirement at this time, the execution of the aging program is stopped, and the execution of the test case can be started at the same time.
As an optional implementation manner, in the process of executing the aging program, the execution condition of the program can be monitored in real time, if the execution process of the program is monitored and the key parameter changes, a high-frequency backup is started or a single-step debugging mode is entered, so that the problem that the execution of the aging program needs to be restarted due to test interruption or inaccurate test result caused by abnormal program execution is avoided. In addition, in order to reduce the occupied amount of the memory space and improve the program running speed, the storage records of the abnormal process can be cleared after the abnormality is solved.
Illustratively, the database of the virtual storage system records the normal range and the pre-abnormal value of each key parameter. And when the monitoring program monitors that the key parameters are in the abnormal pre-value in the aging process, starting high-frequency backup or entering a single step debugging mode.
In this embodiment, after the test requirement is received and the target use state corresponding to the test requirement is determined, the target virtual storage system is controlled to execute the aging program, in order to prevent data loss or data abnormality caused by program execution abnormality, execution process data may be saved in real time so as to call the process data, the aging program is continuously executed on the basis of the process data of the program which is normally executed, and the test efficiency is improved.
Example four
In the embodiment of the application, a testing device of a storage device is provided.
Referring to fig. 4, fig. 4 is a schematic terminal structure diagram of a hardware operating environment according to an embodiment of the present application.
As shown in fig. 4, the control terminal may include: a processor 1001, such as a CPU, a network interface 1003, a memory 1004, a communication bus 1002. Wherein a communication bus 1002 is used to enable connective communication between these components. The network interface 1003 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface). The memory 1004 may be a high-speed RAM memory or a non-volatile memory (e.g., a disk memory). The memory 1004 may alternatively be a storage device separate from the processor 1001.
Those skilled in the art will appreciate that the terminal structure shown in fig. 4 is not intended to be limiting and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
As shown in fig. 4, the memory 1004, which is a kind of computer storage medium, may include therein an operating system, a network communication module, and a test program of a storage device.
In the test device hardware configuration of the storage device shown in fig. 4, the processor 1001 may call a test program of the storage device stored in the memory 1004 and perform the following operations:
when the virtual host receives a test requirement, determining a target use state corresponding to the test requirement;
controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program;
when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement;
and determining the test result of the storage equipment according to the execution result of the test case.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
detecting an aging state of the virtual storage system;
and if the aging state is matched with the target use state, controlling the virtual storage system to execute the test case.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
controlling the virtual micro-control unit to acquire the aging program stored in the virtual flash memory particles;
and executing the aging program and acquiring the aging state of the virtual storage system in real time.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
matching the aging state of the virtual storage system acquired in real time with the target use state, and if the aging state of the virtual storage system is consistent with the target use state, executing a test case corresponding to the test requirement;
otherwise, controlling the virtual micro-control unit to continuously execute the aging program.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
acquiring an execution condition and test time corresponding to the test case;
adjusting the operating conditions of the virtual storage system according to the execution conditions;
and when the virtual storage system is under the running condition and the running time is equal to the test time, stopping executing the test case.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
if the test of the virtual storage system fails, reporting an error and stopping the test;
and if the virtual storage system finishes executing the test case, acquiring a new test requirement and carrying out the next test.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
and storing the test result in association with the virtual storage system.
Alternatively, the processor 1001 may call a test program of the storage device stored in the memory 1004, and further perform the following operations:
receiving a new test requirement, and acquiring the test result according to the new test requirement;
and constructing the target state of the equipment to be tested according to the test result.
In addition, in order to achieve the above object, an embodiment of the present invention further provides a terminal device, which includes a memory, a processor, and a test program of a storage device that is stored in the memory and is executable on the processor, where when the processor executes the test program of the storage device, the method for testing the storage device is implemented as described above.
In addition, to achieve the above object, an embodiment of the present invention further provides a computer-readable storage medium, where a test program of a storage device is stored on the computer-readable storage medium, and when the test program of the storage device is executed by a processor, the test method of the storage device as described above is implemented.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and so forth) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It should be noted that in the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application can be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The usage of the words first, second and third, etcetera do not indicate any ordering. These words may be interpreted as names.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A testing method of a storage device is applied to a virtual storage system and a virtual host, wherein the virtual storage system comprises a virtual flash memory grain and a virtual micro control unit, and the method comprises the following steps:
when the virtual host receives a test requirement, determining a target use state corresponding to the test requirement;
controlling the virtual flash memory particles and the virtual micro-control unit to execute a preset aging program;
when the aging state of the virtual storage system is matched with the target use state, executing a test case corresponding to the test requirement;
and determining the test result of the storage equipment according to the execution result of the test case.
2. The method for testing a storage device according to claim 1, wherein the step of determining that the test requirement corresponds to a target usage state comprises:
detecting an initial aging state of the virtual storage system;
determining a gap between the initial aging state and the target usage state, and adjusting the aging program.
3. The method for testing a memory device of claim 1, wherein the step of controlling the virtual flash granule and the virtual micro control unit to execute a preset burn-in procedure comprises:
controlling the virtual micro-control unit to acquire the aging program stored in the virtual flash memory particles;
and executing the aging program and acquiring the aging state of the virtual storage system in real time.
4. The method for testing a storage device according to claim 3, wherein the step of executing the test case corresponding to the test requirement when detecting that the aging state of the virtual storage system matches the target usage state comprises:
matching the aging state of the virtual storage system acquired in real time with the target use state, and if the aging state of the virtual storage system is consistent with the target use state, continuing to execute the test case corresponding to the test requirement;
otherwise, controlling the virtual micro-control unit to continuously execute the aging program.
5. The method for testing a storage device according to claim 1, wherein the step of executing the test case corresponding to the test requirement includes:
acquiring an execution condition and test time corresponding to the test case;
adjusting the operating conditions of the virtual storage system according to the execution conditions;
and when the virtual storage system is under the running condition and the running time is equal to the testing time, stopping executing the test case.
6. The method for testing a storage device according to claim 1, wherein the step of executing the test case corresponding to the test requirement further comprises:
if the test of the virtual storage system fails, reporting an error and stopping the test;
and if the virtual storage system finishes executing the test case, acquiring a new test requirement and carrying out the next test.
7. The method for testing a storage device according to claim 1, wherein after the step of determining the test result of the storage device according to the execution result of the test case, the method comprises:
and storing the test result in association with the virtual storage system.
8. The method for testing a storage device of claim 7, wherein the step of saving the test results in association with the virtual storage system is followed by:
receiving a new test requirement, and acquiring the test result according to the new test requirement;
and constructing the target state of the equipment to be tested according to the test result.
9. A terminal device comprising a memory, a processor, and a storage device burn-in test program stored in the memory and executable on the processor, wherein the processor implements the method of any one of claims 1-8 when executing the storage device burn-in test program.
10. A computer-readable storage medium, wherein a burn-in test program of a storage device is stored on the computer-readable storage medium, and when executed by a processor, the burn-in test program of the storage device implements the method of any one of claims 1-8.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117215860A (en) * | 2023-11-07 | 2023-12-12 | 苏州元脑智能科技有限公司 | Storage device testing method, system, device, storage medium and electronic device |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117215860A (en) * | 2023-11-07 | 2023-12-12 | 苏州元脑智能科技有限公司 | Storage device testing method, system, device, storage medium and electronic device |
| CN117215860B (en) * | 2023-11-07 | 2024-02-20 | 苏州元脑智能科技有限公司 | Storage device testing method, system, device, storage medium and electronic device |
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