CN111610190B - 家用电器外观检查装置 - Google Patents
家用电器外观检查装置 Download PDFInfo
- Publication number
- CN111610190B CN111610190B CN201910878711.1A CN201910878711A CN111610190B CN 111610190 B CN111610190 B CN 111610190B CN 201910878711 A CN201910878711 A CN 201910878711A CN 111610190 B CN111610190 B CN 111610190B
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- 238000007689 inspection Methods 0.000 title claims abstract description 401
- 238000011179 visual inspection Methods 0.000 claims abstract description 103
- 230000002950 deficient Effects 0.000 claims abstract description 36
- 230000000007 visual effect Effects 0.000 claims description 44
- 238000005286 illumination Methods 0.000 claims description 27
- 239000002184 metal Substances 0.000 claims description 18
- 238000003825 pressing Methods 0.000 claims 1
- 239000000047 product Substances 0.000 description 55
- 230000007547 defect Effects 0.000 description 24
- 238000010586 diagram Methods 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 12
- 238000000034 method Methods 0.000 description 11
- 230000008569 process Effects 0.000 description 11
- 238000005259 measurement Methods 0.000 description 10
- 239000003973 paint Substances 0.000 description 8
- 206010047571 Visual impairment Diseases 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 238000012546 transfer Methods 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 238000005406 washing Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- -1 stains Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/845—Objects on a conveyor
- G01N2021/8455—Objects on a conveyor and using position detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/04—Batch operation; multisample devices
- G01N2201/0438—Linear motion, sequential
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/103—Scanning by mechanical motion of stage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/11—Monitoring and controlling the scan
- G01N2201/117—Indexed, memorised or programmed scan
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Artificial Intelligence (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020190022358A KR102121142B1 (ko) | 2019-02-26 | 2019-02-26 | 가전제품 외관 검사 장치 |
| KR10-2019-0022358 | 2019-02-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111610190A CN111610190A (zh) | 2020-09-01 |
| CN111610190B true CN111610190B (zh) | 2023-11-14 |
Family
ID=71087032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910878711.1A Active CN111610190B (zh) | 2019-02-26 | 2019-09-18 | 家用电器外观检查装置 |
Country Status (3)
| Country | Link |
|---|---|
| KR (1) | KR102121142B1 (fr) |
| CN (1) | CN111610190B (fr) |
| WO (1) | WO2020175752A1 (fr) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112557401B (zh) * | 2020-12-01 | 2023-03-14 | 北京先见科技有限公司 | 一种线阵扫描视觉检测设备 |
| KR102321444B1 (ko) * | 2021-04-29 | 2021-11-04 | (주)티에이치엔 | 와이어링 제품 검사 지원 장치 |
| CN113588555A (zh) * | 2021-07-30 | 2021-11-02 | 青岛海尔工业智能研究院有限公司 | 产品内饰件检测系统 |
| KR20240030907A (ko) | 2022-08-29 | 2024-03-07 | (주)휴넷가이아 | 머신비전 기반 피검사체 표면 결함 자동 검출 시스템 |
| JP7486715B1 (ja) | 2023-01-27 | 2024-05-20 | ダイトロン株式会社 | 外観検査装置及び外観検査方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53144220A (en) * | 1977-05-23 | 1978-12-15 | Hitachi Ltd | Automatic adjuster for color purity of color television |
| US7570794B2 (en) * | 2005-09-02 | 2009-08-04 | Gm Global Technology Operations, Inc. | System and method for evaluating a machined surface of a cast metal component |
| KR101303050B1 (ko) * | 2009-07-15 | 2013-09-04 | 주식회사 포스코 | 표면 검사 장치 및 이를 이용한 표면 검사 방법 |
| JP6246942B2 (ja) * | 2014-09-10 | 2017-12-13 | ヤマハ発動機株式会社 | 外観検査装置および基板検査装置 |
| WO2016121878A1 (fr) * | 2015-01-29 | 2016-08-04 | 株式会社デクシス | Dispositif d'inspection d'aspect optique et système d'inspection d'aspect optique l'utilisant |
| KR101611822B1 (ko) * | 2015-12-18 | 2016-04-12 | (주)이엠시스템 | 외관 검사장치 |
| KR101772673B1 (ko) * | 2017-05-13 | 2017-08-29 | 주식회사 에이피에스 | 멀티 광학 모듈 비전 검사 시스템 |
| CN108672318B (zh) * | 2018-04-17 | 2020-06-16 | 江苏理工学院 | 一种基于机器视觉的外观检测装置 |
-
2019
- 2019-02-26 KR KR1020190022358A patent/KR102121142B1/ko active IP Right Grant
- 2019-08-13 WO PCT/KR2019/010264 patent/WO2020175752A1/fr active Application Filing
- 2019-09-18 CN CN201910878711.1A patent/CN111610190B/zh active Active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020175752A1 (fr) | 2020-09-03 |
| KR102121142B1 (ko) | 2020-06-10 |
| CN111610190A (zh) | 2020-09-01 |
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| GR01 | Patent grant |