CN111504849A - 透射式黑白密度计的误差校准方法 - Google Patents
透射式黑白密度计的误差校准方法 Download PDFInfo
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- CN111504849A CN111504849A CN202010349115.7A CN202010349115A CN111504849A CN 111504849 A CN111504849 A CN 111504849A CN 202010349115 A CN202010349115 A CN 202010349115A CN 111504849 A CN111504849 A CN 111504849A
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- 230000005540 biological transmission Effects 0.000 title claims abstract description 18
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000001514 detection method Methods 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
- G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
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CN202010349115.7A CN111504849B (zh) | 2020-04-28 | 2020-04-28 | 透射式黑白密度计的误差校准方法 |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1030980A (zh) * | 1987-05-06 | 1989-02-08 | 富士胶片公司 | 密度校正方法及装置 |
US5592290A (en) * | 1993-11-12 | 1997-01-07 | Fuji Photo Film Co., Ltd. | Method for correcting instrumental error of spectroscope of optical analyzer |
CN101017126A (zh) * | 2007-03-01 | 2007-08-15 | 丹东东方测控技术有限公司 | 双探测器在线密度测量方法和在线密度计 |
CN102666104A (zh) * | 2009-10-30 | 2012-09-12 | 惠普发展公司,有限责任合伙企业 | 校准反射密度仪 |
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2020
- 2020-04-28 CN CN202010349115.7A patent/CN111504849B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1030980A (zh) * | 1987-05-06 | 1989-02-08 | 富士胶片公司 | 密度校正方法及装置 |
US5592290A (en) * | 1993-11-12 | 1997-01-07 | Fuji Photo Film Co., Ltd. | Method for correcting instrumental error of spectroscope of optical analyzer |
CN101017126A (zh) * | 2007-03-01 | 2007-08-15 | 丹东东方测控技术有限公司 | 双探测器在线密度测量方法和在线密度计 |
CN102666104A (zh) * | 2009-10-30 | 2012-09-12 | 惠普发展公司,有限责任合伙企业 | 校准反射密度仪 |
Non-Patent Citations (1)
Title |
---|
《计量测试技术手册》编辑委员会: "《计量测试技术手册 第10卷 光学》", 28 February 1997, 中国计量出版社 * |
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Effective date of registration: 20230509 Address after: 272001 No.2-2 Jiejia Road, high tech Zone, Jining City, Shandong Province Applicant after: Jining Luke Testing Technology Co.,Ltd. Applicant after: JINING LUKE TESTING EQUIPMENT Co.,Ltd. Address before: 272001 No.2-2 Jiejia Road, high tech Zone, Jining City, Shandong Province Applicant before: JINING LUKE TESTING EQUIPMENT Co.,Ltd. |
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Inventor after: Yang Shuguo Inventor after: Chen Yali Inventor after: Dong Feng Inventor after: Xu Wenqing Inventor after: Wang Ning Inventor before: Chen Yali Inventor before: Dong Feng Inventor before: Xu Wenqing Inventor before: Wang Ning |