CN111391612A - Voltage doubling circuit, fault detection method, air conditioner and readable storage medium - Google Patents

Voltage doubling circuit, fault detection method, air conditioner and readable storage medium Download PDF

Info

Publication number
CN111391612A
CN111391612A CN202010220359.5A CN202010220359A CN111391612A CN 111391612 A CN111391612 A CN 111391612A CN 202010220359 A CN202010220359 A CN 202010220359A CN 111391612 A CN111391612 A CN 111391612A
Authority
CN
China
Prior art keywords
voltage
circuit
sampling
comparator
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010220359.5A
Other languages
Chinese (zh)
Inventor
袁光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Hualing Refrigeration Equipment Co Ltd
Original Assignee
Guangzhou Hualing Refrigeration Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangzhou Hualing Refrigeration Equipment Co Ltd filed Critical Guangzhou Hualing Refrigeration Equipment Co Ltd
Priority to CN202010220359.5A priority Critical patent/CN111391612A/en
Publication of CN111391612A publication Critical patent/CN111391612A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B60VEHICLES IN GENERAL
    • B60HARRANGEMENTS OF HEATING, COOLING, VENTILATING OR OTHER AIR-TREATING DEVICES SPECIALLY ADAPTED FOR PASSENGER OR GOODS SPACES OF VEHICLES
    • B60H1/00Heating, cooling or ventilating [HVAC] devices
    • B60H1/00421Driving arrangements for parts of a vehicle air-conditioning
    • B60H1/00428Driving arrangements for parts of a vehicle air-conditioning electric
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B60VEHICLES IN GENERAL
    • B60HARRANGEMENTS OF HEATING, COOLING, VENTILATING OR OTHER AIR-TREATING DEVICES SPECIALLY ADAPTED FOR PASSENGER OR GOODS SPACES OF VEHICLES
    • B60H1/00Heating, cooling or ventilating [HVAC] devices
    • B60H1/00507Details, e.g. mounting arrangements, desaeration devices
    • B60H1/00585Means for monitoring, testing or servicing the air-conditioning
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/10Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H02M3/145Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
    • H02M3/155Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02TCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
    • Y02T10/00Road transport of goods or passengers
    • Y02T10/80Technologies aiming to reduce greenhouse gasses emissions common to all road transportation technologies
    • Y02T10/88Optimized components or subsystems, e.g. lighting, actively controlled glasses

Abstract

The invention provides a voltage doubling circuit, a fault detection method, an air conditioner and a readable storage medium. Wherein, voltage doubling circuit includes: the circuit comprises a first boost circuit and a second boost circuit which are connected in parallel, wherein the first boost circuit is provided with a first switching tube for modulation, and the second boost circuit is provided with a second switching tube for modulation; the first sampling resistor and the second sampling resistor are respectively connected with the first switching tube and the second switching tube in series so as to respectively determine corresponding first sampling voltage and second sampling voltage; and the comparator component is connected with the first sampling resistor and the second sampling resistor, and is used for comparing the first sampling voltage with the second sampling voltage and determining that a single-path damage fault exists according to a comparison result. According to the technical scheme, the fault detection efficiency and reliability are higher, the reliability and the service life of the switching tube are improved, the detection can be effectively carried out at any time during the operation, and the limitation of load power is avoided.

Description

Voltage doubling circuit, fault detection method, air conditioner and readable storage medium
Technical Field
The invention relates to the technical field of circuits, in particular to a voltage doubling circuit, a fault detection method, an air conditioner and a computer readable storage medium.
Background
The voltage doubling circuit comprises two voltage doubling circuits connected in parallel to ensure the power consumption requirement of the vehicle-mounted air conditioner, and meanwhile, the input current ripple can be effectively reduced due to the adoption of a staggered parallel structure. The voltage stress borne by the switching tube during the turn-off period is only half of the output voltage, so that a low-voltage power switching device can be selected, the switching loss is reduced, and the conversion efficiency of the converter is improved.
If the booster circuit has problems, the air conditioner will be paralyzed immediately, and the difference of the circuit from other booster circuits is that as long as one of the two channels is damaged, the other channel will continue to work, but the voltage stress borne by the other channel is doubled, and the device type selection parameters are designed according to two phases, so that the power is slightly larger and the power device is inevitably burnt. In the production and operation processes, however, the situations of insufficient soldering, vibration desoldering and the like of components and parts are inevitably caused, so that the situation that a certain channel does not work occurs. Therefore, the effective fault detection method is a reliable guarantee for products.
Moreover, any discussion of the prior art throughout the specification is not an admission that the prior art is necessarily known to a person of ordinary skill in the art, and any discussion of the prior art throughout the specification is not an admission that the prior art is necessarily widely known or forms part of common general knowledge in the field.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art or the related art.
Therefore, an object of the present invention is to provide a voltage doubler circuit.
It is another object of the present invention to provide a fault detection method.
Another object of the present invention is to provide an air conditioner.
It is another object of the present invention to provide a computer-readable storage medium.
In order to achieve the above object, according to an embodiment of a first aspect of the present invention, there is provided a voltage doubler circuit including: the circuit comprises a first boost circuit and a second boost circuit which are connected in parallel, wherein the first boost circuit is provided with a first switching tube for modulation, and the second boost circuit is provided with a second switching tube for modulation; the first sampling resistor and the second sampling resistor are respectively connected with the first switching tube and the second switching tube in series so as to respectively determine corresponding first sampling voltage and second sampling voltage; and the comparator component is connected with the first sampling resistor and the second sampling resistor, and is used for comparing the first sampling voltage with the second sampling voltage and determining that a single-path damage fault exists according to a comparison result.
In the technical scheme, the voltage doubling circuit comprises the first sampling resistor and the second sampling resistor, and circuit parameters of the two paths of boost circuits are completely symmetrical, so that the conduction current of each path of boost circuit is obtained, the two conduction currents are compared, detection can be effectively carried out at any time during operation, and limitation of load power is avoided.
Specifically, the PWM driving pulses of the two channels of the boost circuit are identical and are only 180 degrees out of phase (half-cycle time). The current in both channels is thus substantially the same. When one channel is damaged, the current of the channel is zero, the current of the other channel is increased to 2 times, and the current difference between the two channels is huge.
In any of the above technical solutions, preferably, the method further includes: the first voltage division circuit comprises a first voltage division resistor and a second voltage division resistor which are connected in series, the first voltage division circuit is connected with the first sampling resistor in parallel, and a common point between the first voltage division resistor and the second voltage division resistor outputs a first voltage division signal; and the second voltage division circuit comprises a third voltage division resistor and a fourth voltage division resistor which are connected in series, the second voltage division circuit is connected with the second sampling resistor in parallel, and a common point between the third voltage division resistor and the fourth voltage division resistor outputs a second voltage division signal.
In the technical scheme, the first voltage division circuit and the second voltage division circuit are arranged in the voltage doubling circuit, the first voltage division voltage signal and the second voltage division voltage signal are respectively collected, so that the interference of noise signals on the voltage division voltage signals is reduced, the single-path damage is determined according to the comparison result of the voltage division voltage signals, and the reliability and the accuracy of fault detection can be further improved.
In any one of the above technical solutions, preferably, the comparator assembly includes: a positive input end of the first comparator is connected to the second divided voltage signal, a negative input end of the first comparator is connected to the first sampling signal, and an output result of the first comparator is sent to a first data port of a controller; and the positive input end of the second comparator is connected to the first voltage division voltage signal, the negative input end of the second comparator is connected to the second sampling signal, and the output result of the second comparator is sent to a second data port of the controller.
In this embodiment, by providing that the comparator component includes the first comparator and the second comparator, whether the first boost type circuit is damaged or not can be determined according to the first comparator, and similarly, whether the second boost type circuit is damaged or not can be determined according to the second comparator.
In any of the above technical solutions, preferably, the first data port and the second data port are the same port or two independent ports.
In the technical scheme, the first data port and the second data port are arranged to be the same port, so that the interface occupation of the controller can be reduced, or the first data port and the second data port are arranged to be two independent ports, so that the crosstalk between two paths of comparison results can be reduced, and the fact which path of boost circuit has single-path damage can be specifically determined.
In any of the above technical solutions, it is preferable that the comparator further includes a first L C filter circuit connected to the input circuit of the negative input terminal of the first comparator, and/or a second L C filter circuit connected to the input circuit of the positive input terminal of the first comparator, and/or a third L C filter circuit connected to the input circuit of the positive input terminal of the second comparator, and/or a fourth L C filter circuit connected to the input circuit of the negative input terminal of the second comparator, and/or a fifth L C filter circuit connected to the output circuit of the comparator component.
In the technical scheme, the first L C filter circuit, the second L C filter circuit, the third L C filter circuit, the fourth L C filter circuit and the fifth L C filter circuit are arranged in the above manner, so that noise signals and ripple interference in the voltage doubling circuit are reduced.
According to a second aspect of the present invention, there is provided a fault detection method, including: determining a first sampling voltage corresponding to the current of the first switching tube and a second sampling voltage corresponding to the current of the second switching tube; and comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result.
In the technical scheme, by determining a first sampling voltage corresponding to the current of a first switching tube and a second sampling voltage corresponding to the current of a second switching tube, comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result, by setting a voltage doubling circuit comprising a first sampling resistor and a second sampling resistor, because circuit parameters of two paths of voltage boosting type circuits are completely symmetrical, the conducting current of each path of voltage boosting type circuit is obtained, and the two conducting currents are compared, so that the detection can be effectively carried out at any time during the operation period, and the limitation of load power does not exist.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result specifically includes: calculating a voltage difference absolute value between the first sampling voltage and the second sampling voltage; judging whether the absolute value of the pressure difference is greater than or equal to a pressure difference threshold value; and judging that the absolute value of the pressure difference is greater than or equal to the pressure difference threshold value, and determining that the single-circuit damage fault exists.
In the technical scheme, by calculating the absolute value of the pressure difference between the first sampling voltage and the second sampling voltage, and if the absolute value of the pressure difference is judged to be greater than or equal to the pressure difference threshold, the existence of the single-path damage fault is determined, the fluctuation of a fault detection result is reduced, and the reliability and the accuracy of fault detection are improved.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result, further includes: determining a first divided voltage signal of the first sampling voltage pair and/or a second divided voltage signal of the second sampling voltage pair; comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal; determining that the first sampling voltage is less than or equal to the second divided voltage signal, and determining that a single-path damage fault exists in the boost circuit for the first sampling voltage; and determining that the second sampling voltage is less than or equal to the first voltage division voltage signal, and determining that the second sampling voltage has a single-path damage fault for a boost circuit.
In the technical scheme, by comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal, the voltage difference generated at two ends of the sampling resistor when the voltage flows through the respective sampling resistor is large, whether a single circuit is damaged or not can be judged by comparing the voltage difference at two ends of the sampling resistor, and the single circuit damage of the voltage doubling circuit can be detected more accurately.
According to a third aspect of the present invention, there is provided an air conditioner comprising: a voltage doubler circuit; the fault detection device of the voltage doubling circuit is electrically connected with the voltage doubling circuit, and comprises a memory and a processor, wherein the memory is used for storing a computer program, and the processor executes the computer program so as to realize the steps of the fault detection method of the voltage doubling circuit defined by any one of the technical schemes.
According to an aspect of the fourth aspect of the present invention, there is provided a computer-readable storage medium having a computer program stored thereon, the computer program, when executed, implementing the method for detecting a fault of a voltage-doubler circuit as defined in any one of the above aspects.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 shows a schematic diagram of a voltage doubling circuit according to an embodiment of the invention;
FIG. 2 shows a schematic flow diagram of a method of fault detection of a voltage doubling circuit according to an embodiment of the invention;
FIG. 3 shows a schematic flow diagram of a method of fault detection of a voltage doubling circuit according to another embodiment of the invention;
FIG. 4 shows a schematic block diagram of a fault detection arrangement for a voltage doubling circuit according to an embodiment of the present invention;
FIG. 5 illustrates a schematic block diagram of an air conditioner according to an embodiment of the present invention;
FIG. 6 shows a schematic block diagram of a computer-readable storage medium according to an embodiment of the invention.
Detailed Description
In order that the above objects, features and advantages of the present invention can be more clearly understood, a more particular description of the invention will be rendered by reference to the appended drawings. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, however, the present invention may be practiced in other ways than those specifically described herein, and therefore the scope of the present invention is not limited by the specific embodiments disclosed below.
Embodiments of a method and an apparatus for detecting a fault of a voltage doubling circuit, an air conditioner, and a computer readable storage medium according to embodiments of the present invention are specifically described below with reference to fig. 1 to 6.
As shown in fig. 1, a voltage doubling circuit according to an embodiment of the present invention includes: the circuit comprises a first boost circuit and a second boost circuit which are connected in parallel, wherein the first boost circuit is provided with a first switching tube Q1 for modulation, and the second boost circuit is provided with a second switching tube Q2 for modulation; a first sampling resistor Rs1 and a second sampling resistor Rs2, which are respectively connected in series with the first switch tube Q1 and the second switch tube Q2 to respectively determine a corresponding first sampling voltage and a second sampling voltage; and the comparator component is connected to the first sampling resistor Rs1 and the second sampling resistor Rs2 and used for comparing the first sampling voltage with the second sampling voltage and determining that a single-circuit damage fault exists according to the comparison result.
In the technical scheme, the voltage doubling circuit comprises the first sampling resistor Rs1 and the second sampling resistor Rs2, and circuit parameters of the two paths of boost circuits are completely symmetrical, so that the conduction current of each path of boost circuit is obtained, the two conduction currents are compared, detection can be effectively carried out at any time during operation, and limitation of load power is avoided.
Specifically, the PWM driving pulses of the two channels of the boost circuit are identical and are only 180 degrees out of phase (half-cycle time). The current in both channels is thus substantially the same. When one channel is damaged, the current of the channel is zero, the current of the other channel is increased to 2 times, and the current difference between the two channels is huge.
In any of the above technical solutions, preferably, the method further includes: a first voltage dividing circuit including a first voltage dividing resistor R1 and a second voltage dividing resistor R2 connected in series, the first voltage dividing circuit being connected in parallel with the first sampling resistor Rs1, a common point between the first voltage dividing resistor and the second voltage dividing resistor outputting a first voltage dividing signal; and the second voltage division circuit comprises a third voltage division resistor and a fourth voltage division resistor which are connected in series, the second voltage division circuit is connected with the second sampling resistor Rs2 in parallel, and a common point between the third voltage division resistor R3 and the fourth voltage division resistor R4 outputs a second voltage division voltage signal.
In the technical scheme, the first voltage division circuit and the second voltage division circuit are arranged in the voltage doubling circuit, the first voltage division voltage signal and the second voltage division voltage signal are respectively collected, so that the interference of noise signals on the voltage division voltage signals is reduced, the single-path damage is determined according to the comparison result of the voltage division voltage signals, and the reliability and the accuracy of fault detection can be further improved.
In any one of the above technical solutions, preferably, the comparator assembly includes: a first comparator C1, a positive input terminal of the first comparator C1 is connected to the second divided voltage signal, a negative input terminal of the first comparator C1 is connected to the first sampling signal, and an output result of the first comparator C1 is sent to a first data port of the controller MCU; a positive input end of the second comparator C2 is connected to the first voltage division voltage signal, a negative input end of the second comparator C2 is connected to the second sampling signal, and an output result of the second comparator C2 is sent to a second data port of the controller MCU.
In this embodiment, by providing the comparator module including the first comparator C1 and the second comparator C2, it can be determined whether the first boost type circuit is broken according to the first comparator C1, and similarly, it can be determined whether the second boost type circuit is broken according to the second comparator C2.
In any of the above technical solutions, preferably, the first data port and the second data port are the same port or two independent ports.
In the technical scheme, the first data port and the second data port are arranged to be the same port, so that the interface occupation of a controller MCU can be reduced, or the first data port and the second data port are arranged to be two independent ports, the crosstalk between two paths of comparison results can be reduced, and the fact which path of boost circuit has single-path damage can be specifically determined.
In any of the above solutions, it is preferable that the apparatus further includes a first L C filter circuit connected to the input circuit of the negative input terminal of the first comparator C1, and/or a second L C filter circuit connected to the input circuit of the positive input terminal of the first comparator C1, and/or a third L C filter circuit connected to the input circuit of the positive input terminal of the second comparator C2, and/or a fourth L C filter circuit connected to the input circuit of the negative input terminal of the second comparator C2, and/or a fifth L C filter circuit connected to the output circuit of the comparator element.
In the technical scheme, the first L C filter circuit, the second L C filter circuit, the third L C filter circuit, the fourth L C filter circuit and the fifth L C filter circuit are arranged in the above manner, so that noise signals and ripple interference in the voltage doubling circuit are reduced.
The first L C filter circuit includes a first filter resistor R5 and a first filter capacitor C3 shown in fig. 1, the second L C filter circuit includes a second filter resistor R6 and a second filter capacitor C4 shown in fig. 1, the third L C filter circuit includes a third filter resistor R8 and a third filter capacitor C6 shown in fig. 1, the fourth L C filter circuit includes a fourth filter resistor R7 and a fourth filter capacitor C5 shown in fig. 1, and the fifth L C filter circuit includes a fifth filter resistor R9 and a fifth filter capacitor C7 shown in fig. 1.
In addition, the output end of the first comparator C1 is connected with a first unidirectional conduction tube D4, and the output end of the second comparator C2 is connected with a second unidirectional conduction tube D5.
Specifically, the input voltage U of the voltage doubling circuit may be a battery voltage, the voltage doubling circuit outputs to the load end P, and an electrolytic capacitor E is connected between the load end P and a ground line, and the method includes the following four stages:
in stage 1, the first switch tube Q1 and the second switch tube Q2 are both in a conducting state, the first inductor L1 and the second inductor L2 store energy, the current of the two inductors rises linearly, and the load is powered by the electrolytic capacitor E.
Wherein, a first voltage-stabilizing diode DZ1 is provided for the first switch tube, and a second voltage-stabilizing diode DZ2 is provided for the second switch tube.
And in the stage 2, the second switching tube Q2 is turned off, the first switching tube Q1 is kept on, the first inductor L1 continues to store energy, the second inductor L2 is connected with the second voltage-multiplying capacitor C2 in series to supply energy to the load through the fourth diode D4, the first voltage-multiplying capacitor C1 is charged through the first switching tube Q1 and the second diode D2, and the voltage stress borne by the second switching tube Q2 is the difference of Vc1 or Vo-Vc 2.
And (3) stage: the second switch Q2 is turned on, the first switch Q1 remains on, and the operation process is the same as that in stage 1.
And 4, the first switch tube Q1 is turned off, the second switch tube Q2 is kept on, the second inductor L2 continues to store energy, the first inductor L1 is in series connection with the first voltage-multiplying capacitor C1 on one hand, the first switch tube Q1 is turned off, the second switch tube Q2 is kept on, the second inductor L2 continues to store energy, the first inductor L1 is in series connection with the C1 on one hand, the third diode D3 supplies energy to the load on the other hand, the second voltage-multiplying capacitor C2 is charged through the second switch tube Q2 and the first diode D1 on the other hand, and the voltage stress borne by the first switch tube Q1 is the difference of Vc2 or Vo-Vc 1.
At time t4, the first switch Q1 turns on, and enters phase 1 again, and the next switching cycle begins.
The sampling current Iq1 of the first switching tube is collected through a first sampling resistor Rs1, and the sampling current Iq2 of the first switching tube is collected through a second sampling resistor Rs 2.
As shown in fig. 2, a fault detection method of a voltage doubling circuit according to another embodiment of the present invention includes:
step S102, determining a first sampling voltage corresponding to the current of the first switching tube and a second sampling voltage corresponding to the current of the second switching tube; and step S104, comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result.
In the technical scheme, by determining a first sampling voltage corresponding to the current of a first switching tube and a second sampling voltage corresponding to the current of a second switching tube, comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result, by arranging a voltage doubling circuit comprising a first sampling resistor Rs1 and a second sampling resistor Rs2, because circuit parameters of two paths of voltage boosting circuits are completely symmetrical, the conduction current of each path of voltage boosting circuit is obtained, the two conduction currents are compared, detection can be effectively carried out at any time during operation, and limitation of load power does not exist.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result specifically includes: calculating a voltage difference absolute value between the first sampling voltage and the second sampling voltage; judging whether the absolute value of the pressure difference is greater than or equal to a pressure difference threshold value; and judging that the absolute value of the pressure difference is greater than or equal to the pressure difference threshold value, and determining that the single-circuit damage fault exists.
In the technical scheme, by calculating the absolute value of the pressure difference between the first sampling voltage and the second sampling voltage, and if the absolute value of the pressure difference is judged to be greater than or equal to the pressure difference threshold, the existence of the single-path damage fault is determined, the fluctuation of a fault detection result is reduced, and the reliability and the accuracy of fault detection are improved.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result, further includes: determining a first divided voltage signal of the first sampling voltage pair and/or a second divided voltage signal of the second sampling voltage pair; comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal; determining that the first sampling voltage is less than or equal to the second divided voltage signal, and determining that a single-path damage fault exists in the boost circuit for the first sampling voltage; and determining that the second sampling voltage is less than or equal to the first voltage division voltage signal, and determining that the second sampling voltage has a single-path damage fault for a boost circuit.
In the technical scheme, by comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal, the voltage difference generated at two ends of the sampling resistor when the voltage flows through the respective sampling resistor is large, whether a single circuit is damaged or not can be judged by comparing the voltage difference at two ends of the sampling resistor, and the single circuit damage of the voltage doubling circuit can be detected more accurately.
As shown in fig. 1 and 3, a fault detection method of a voltage doubling circuit according to another embodiment of the present invention includes: step S202, judging whether the IO port of the controller MCU is in a high level or not, if so, executing the step S202, and if not, executing the step S204; and step S204, if the single path is damaged, prohibiting the air conditioner from running and prompting.
As shown in fig. 4, the fault detection apparatus 300 of the voltage doubling circuit 402 according to the embodiment of the present invention includes a memory 302 and a processor 304, wherein the memory 302 is used for storing a computer program, and the processor 304 executes the computer program to implement the steps of the fault detection method of the air conditioner 400 as defined in any one of the above technical solutions.
As shown in fig. 5, the air conditioner 400 according to the embodiment of the present invention includes: a voltage doubler circuit 402; a fault detection device 300 of a voltage doubling circuit, the fault detection device 300 of the voltage doubling circuit being electrically connected to the voltage doubling circuit 402, the fault detection device 300 of the voltage doubling circuit comprising a memory for storing a computer program and a processor for executing the computer program to implement the steps of the fault detection method of the voltage doubling circuit as defined in any one of the above claims.
As shown in fig. 6, according to the computer-readable storage medium 500 of the embodiment of the present invention, the computer-readable storage medium has a computer program stored thereon, and when the computer program is executed by the air conditioner 400, the method for detecting the fault of the voltage doubling circuit as defined in any one of the above technical solutions is implemented, and specifically includes the following steps: determining a first sampling voltage corresponding to the current of the first switching tube and a second sampling voltage corresponding to the current of the second switching tube; and comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result.
In the technical scheme, by determining a first sampling voltage corresponding to the current of a first switching tube and a second sampling voltage corresponding to the current of a second switching tube, comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result, by arranging a voltage doubling circuit comprising a first sampling resistor Rs1 and a second sampling resistor Rs2, because circuit parameters of two paths of voltage boosting circuits are completely symmetrical, the conduction current of each path of voltage boosting circuit is obtained, the two conduction currents are compared, detection can be effectively carried out at any time during operation, and limitation of load power does not exist.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result specifically includes: calculating a voltage difference absolute value between the first sampling voltage and the second sampling voltage; judging whether the absolute value of the pressure difference is greater than or equal to a pressure difference threshold value; and judging that the absolute value of the pressure difference is greater than or equal to the pressure difference threshold value, and determining that the single-circuit damage fault exists.
In the technical scheme, by calculating the absolute value of the pressure difference between the first sampling voltage and the second sampling voltage, and if the absolute value of the pressure difference is judged to be greater than or equal to the pressure difference threshold, the existence of the single-path damage fault is determined, the fluctuation of a fault detection result is reduced, and the reliability and the accuracy of fault detection are improved.
In any of the above technical solutions, preferably, the comparing the first sampled voltage and the second sampled voltage, and determining that there is a single-path damage fault according to a comparison result, further includes: determining a first divided voltage signal of the first sampling voltage pair and/or a second divided voltage signal of the second sampling voltage pair; comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal; determining that the first sampling voltage is less than or equal to the second divided voltage signal, and determining that a single-path damage fault exists in the boost circuit for the first sampling voltage; and determining that the second sampling voltage is less than or equal to the first voltage division voltage signal, and determining that the second sampling voltage has a single-path damage fault for a boost circuit.
In the technical scheme, by comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal, the voltage difference generated at two ends of the sampling resistor when the voltage flows through the respective sampling resistor is large, whether a single circuit is damaged or not can be judged by comparing the voltage difference at two ends of the sampling resistor, and the single circuit damage of the voltage doubling circuit can be detected more accurately.
The technical scheme of the invention is described in detail above with reference to the accompanying drawings, and the invention provides a voltage doubling circuit, a fault detection method of the voltage doubling circuit, an apparatus, an air conditioner and a computer readable storage medium, wherein a first sampling voltage corresponding to a current of a first switching tube and a second sampling voltage corresponding to a current of a second switching tube are determined, the first sampling voltage and the second sampling voltage are compared, and it is determined that a single-path fault exists according to a comparison result, and by setting a first sampling resistor Rs1 and a second sampling resistor Rs2 in the voltage doubling circuit, because circuit parameters of two paths of boost circuits are completely symmetrical, a conduction current of each path of boost circuit is obtained, and the two conduction currents are compared, so that the detection can be effectively performed at any time during operation without limitation of load power.
The steps in the method of the invention can be sequentially adjusted, combined and deleted according to actual needs.
The units in the device of the invention can be merged, divided and deleted according to actual needs.
It will be understood by those skilled in the art that all or part of the steps in the methods of the embodiments described above may be implemented by instructions associated with a program, which may be stored in a computer-readable storage medium, where the storage medium includes Read-Only Memory (ROM), Random Access Memory (RAM), Programmable Read-Only Memory (PROM), Erasable Programmable Read-Only Memory (EPROM), One-time Programmable Read-Only Memory (OTPROM), Electrically Erasable Programmable Read-Only Memory (EEPROM), compact disc-Read-Only Memory (CD-ROM), or other Memory, magnetic disk, magnetic tape, or magnetic tape, Or any other medium which can be used to carry or store data and which can be read by a computer.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. A voltage doubling circuit, comprising:
the circuit comprises a first boost circuit and a second boost circuit which are connected in parallel, wherein the first boost circuit is provided with a first switching tube for modulation, and the second boost circuit is provided with a second switching tube for modulation;
the first sampling resistor and the second sampling resistor are respectively connected with the first switching tube and the second switching tube in series so as to respectively determine corresponding first sampling voltage and second sampling voltage;
and the comparator component is connected with the first sampling resistor and the second sampling resistor, and is used for comparing the first sampling voltage with the second sampling voltage and determining that a single-path damage fault exists according to a comparison result.
2. The voltage doubling circuit of claim 1, further comprising:
the first voltage division circuit comprises a first voltage division resistor and a second voltage division resistor which are connected in series, the first voltage division circuit is connected with the first sampling resistor in parallel, and a common point between the first voltage division resistor and the second voltage division resistor outputs a first voltage division signal;
and the second voltage division circuit comprises a third voltage division resistor and a fourth voltage division resistor which are connected in series, the second voltage division circuit is connected with the second sampling resistor in parallel, and a common point between the third voltage division resistor and the fourth voltage division resistor outputs a second voltage division signal.
3. The voltage doubling circuit of claim 2, wherein the comparator component comprises:
a positive input end of the first comparator is connected to the second divided voltage signal, a negative input end of the first comparator is connected to the first sampling signal, and an output result of the first comparator is sent to a first data port of a controller;
and the positive input end of the second comparator is connected to the first voltage division voltage signal, the negative input end of the second comparator is connected to the second sampling signal, and the output result of the second comparator is sent to a second data port of the controller.
4. The voltage doubling circuit of claim 3,
the first data port and the second data port are the same port or two independent ports.
5. The voltage doubling circuit of claim 3, further comprising:
the first L C filter circuit is connected to the input circuit of the negative input end of the first comparator;
and/or a second L C filter circuit, which is connected to the input circuit of the positive input end of the first comparator;
and/or a third L C filter circuit connected to the input circuit of the positive input end of the second comparator;
and/or a fourth L C filter circuit, an input circuit connected to the negative input end of the second comparator;
and/or a fifth L C filter circuit connected to the output circuit of the comparator component.
6. A fault detection method applied to the voltage doubling circuit according to any one of claims 1 to 5, wherein the fault detection method comprises:
determining a first sampling voltage corresponding to the current of the first switching tube and a second sampling voltage corresponding to the current of the second switching tube;
and comparing the first sampling voltage with the second sampling voltage, and determining that a single-path damage fault exists according to a comparison result.
7. The method according to claim 6, wherein comparing the first sampled voltage with the second sampled voltage and determining that a one-way fault exists according to a comparison result specifically includes:
calculating a voltage difference absolute value between the first sampling voltage and the second sampling voltage;
judging whether the absolute value of the pressure difference is greater than or equal to a pressure difference threshold value;
and judging that the absolute value of the pressure difference is greater than or equal to the pressure difference threshold value, and determining that the single-circuit damage fault exists.
8. The method according to claim 6 or 7, wherein the first sampled voltage and the second sampled voltage are compared, and it is determined that a one-way fault exists according to a comparison result, and specifically, the method further includes:
determining a first divided voltage signal of the first sampling voltage pair and/or a second divided voltage signal of the second sampling voltage pair;
comparing the magnitude relation between the first sampling voltage and the second voltage division voltage signal and/or the magnitude relation between the second sampling voltage and the first voltage division voltage signal;
determining that the first sampling voltage is less than or equal to the second divided voltage signal, and determining that a single-path damage fault exists in the boost circuit for the first sampling voltage;
and determining that the second sampling voltage is less than or equal to the first voltage division voltage signal, and determining that the second sampling voltage has a single-path damage fault for a boost circuit.
9. An air conditioner, comprising:
a voltage doubler circuit;
fault detection means connected to the voltage doubling circuit, the fault detection means comprising a memory and a processor, the memory being configured to be able to store a computer program, the computer program being able to implement the steps of the fault detection method according to any one of claims 6 to 8 when executed by the processor.
10. A computer-readable storage medium, having stored thereon a computer program which, when executed, implements the fault detection method of any one of claims 6 to 8.
CN202010220359.5A 2020-03-25 2020-03-25 Voltage doubling circuit, fault detection method, air conditioner and readable storage medium Pending CN111391612A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010220359.5A CN111391612A (en) 2020-03-25 2020-03-25 Voltage doubling circuit, fault detection method, air conditioner and readable storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010220359.5A CN111391612A (en) 2020-03-25 2020-03-25 Voltage doubling circuit, fault detection method, air conditioner and readable storage medium

Publications (1)

Publication Number Publication Date
CN111391612A true CN111391612A (en) 2020-07-10

Family

ID=71425782

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202010220359.5A Pending CN111391612A (en) 2020-03-25 2020-03-25 Voltage doubling circuit, fault detection method, air conditioner and readable storage medium

Country Status (1)

Country Link
CN (1) CN111391612A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114509669A (en) * 2022-04-18 2022-05-17 华邦创科(惠州市)智能科技有限公司 IGBT switch damage detection device and detection method of single-phase intelligent power utilization protector

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102122885A (en) * 2011-03-11 2011-07-13 浙江大学 Method for controlling alternated phase shift PWM (pulse width modulation) wave
CN102629831A (en) * 2012-04-01 2012-08-08 华为技术有限公司 Method, circuit and device for soft switch detection
CN106849828A (en) * 2017-03-27 2017-06-13 北京精密机电控制设备研究所 A kind of MOSFET parallel current-equalizing circuits based on fault diagnosis
CN107210673A (en) * 2015-03-27 2017-09-26 三菱电机株式会社 Increasing apparatus and converter apparatus
CN108702089A (en) * 2016-02-24 2018-10-23 三菱电机株式会社 Converter apparatus
KR102051575B1 (en) * 2018-05-08 2019-12-05 (주)오디에이테크놀로지 Protecting circuit for switching element of DC power supply driving by PWM
CN110832334A (en) * 2017-06-20 2020-02-21 株式会社杰士汤浅国际 Fault diagnosis device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102122885A (en) * 2011-03-11 2011-07-13 浙江大学 Method for controlling alternated phase shift PWM (pulse width modulation) wave
CN102629831A (en) * 2012-04-01 2012-08-08 华为技术有限公司 Method, circuit and device for soft switch detection
CN107210673A (en) * 2015-03-27 2017-09-26 三菱电机株式会社 Increasing apparatus and converter apparatus
CN108702089A (en) * 2016-02-24 2018-10-23 三菱电机株式会社 Converter apparatus
CN106849828A (en) * 2017-03-27 2017-06-13 北京精密机电控制设备研究所 A kind of MOSFET parallel current-equalizing circuits based on fault diagnosis
CN110832334A (en) * 2017-06-20 2020-02-21 株式会社杰士汤浅国际 Fault diagnosis device
KR102051575B1 (en) * 2018-05-08 2019-12-05 (주)오디에이테크놀로지 Protecting circuit for switching element of DC power supply driving by PWM

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114509669A (en) * 2022-04-18 2022-05-17 华邦创科(惠州市)智能科技有限公司 IGBT switch damage detection device and detection method of single-phase intelligent power utilization protector

Similar Documents

Publication Publication Date Title
CN205283422U (en) A control module , switch converter, lighting system and estimator level for switch converter
CN108352787B (en) Flyback converter
US9929654B2 (en) High voltage gain DC/DC power electronic converters
CN102843025B (en) Control circuit, control method, and power supply system for power factor correction (PFC) circuit
CN110971115B (en) Lightning surge protection circuit, method, system, storage medium and electronic device
US11043898B2 (en) Switched tank converter with low voltage stress
US8174849B2 (en) Electric power converter with soft switching for two way power conversion
CN106712503A (en) Quasi-switch boost DC-DC converter employing switching inductor and switching capacitor
CN105191104A (en) Power factor improvement circuit
US20130207626A1 (en) Switching Power Supply Circuit
CN103683919A (en) High-power-factor low-harmonic-distortion constant current circuit and device
CN104660044A (en) Switching circuit and method and device for controlling switching circuit
KR102344735B1 (en) Improvement of Switching Loss in DC-DC Quadratic Boost Converter
CN111404373B (en) Voltage doubling circuit, fault detection method, air conditioner and readable storage medium
CN111391612A (en) Voltage doubling circuit, fault detection method, air conditioner and readable storage medium
CN103647448A (en) Integrated step-down-flyback type high power factor constant current circuit and device
Chandran et al. Design and simulation analysis of modified single switch SEPIC converter for BLDC motor
CN111391609A (en) Fault detection method and device for voltage doubling circuit, air conditioner and readable storage medium
CN109194165B (en) AC-DC power converter
CN203590035U (en) High-power factor low-harmonic distortion constant current circuit and device
CN111917314A (en) Electrolytic capacitor-free high-efficiency converter for inhibiting power ripples and working method thereof
KR101442553B1 (en) Power circuit
CN101309542A (en) Circuit for detecting current zero-crossing of voltage dropping inductor by voltage of the same
CN212435602U (en) Electrolytic capacitor-free high-efficiency converter for inhibiting power ripples
CN216056791U (en) Soft switch control circuit and electric control equipment

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination