CN111380463B - Device and method for testing offset of rotation center - Google Patents
Device and method for testing offset of rotation center Download PDFInfo
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- CN111380463B CN111380463B CN201811620526.4A CN201811620526A CN111380463B CN 111380463 B CN111380463 B CN 111380463B CN 201811620526 A CN201811620526 A CN 201811620526A CN 111380463 B CN111380463 B CN 111380463B
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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Abstract
The utility model provides a rotation center offset testing arrangement, including first locating plate, the second locating plate, first sensor, the second sensor, third sensor and controller, first locating plate and second locating plate set up perpendicularly, first sensor, second sensor and third sensor are all located on the determinand, the distance of first sensor to first locating plate equals with the distance of second sensor to first locating plate, the first locating plate of light beam perpendicular to that first sensor and second sensor emit, the light beam perpendicular to second locating plate that the third sensor emits, first sensor, second sensor and third sensor are connected with the controller respectively. Above-mentioned rotation center offset testing arrangement adopts three sensor to test, need not to make the mark and the range estimation is parallel, has avoided utilizing the great error that the range estimation brought, and does not have the numerical value inaccurate condition that the shake leads to, and data is more accurate. In addition, a test method adopting the test device is also provided.
Description
Technical Field
The invention relates to the technical field of testing devices, in particular to a device and a method for testing offset of a rotation center.
Background
For a rotatable moving device, especially a two-wheel differential robot, whether the rotation center point is shifted or not during rotation is an important performance index. The offset of the rotation center of the double-wheel differential robot in an ideal state is 0, and actually, due to the defects of a mechanical structure, differences in production and assembly, individual differences between motors, imperfect control algorithm and the like, the rotation center of the double-wheel differential robot has a certain offset, and if the offset exceeds a specified range, the motion performance of the double-wheel differential robot is influenced to a certain extent.
The traditional rotation center offset testing method comprises the following steps: marking the positions of the front, rear, left and right edge points of the double-wheel differential robot by using adhesive tapes and the like, establishing a planar rectangular coordinate system, determining the coordinate value of the central point of the planar rectangular coordinate system to be (0,0), then rotating the robot for a whole circle, and marking the front, rear, left and right edge points of the double-wheel differential robot by using the adhesive tapes againPosition, determining coordinate values (x, y) of its center point, and calculating the offset d of the rotation center from the two coordinate values
Meanwhile, the offset direction can be obtained according to the coordinate values, and corresponding correction or qualification judgment can be made according to the offset direction and the offset. In the method, the workload of marking points is large, the error is extremely large, meanwhile, whether the double-wheel differential robot rotates for a whole circle is determined by eye, and if the angle of the difference is too large when the rotation stops, an error conclusion can be obtained.
Disclosure of Invention
Therefore, it is desirable to provide a device and a method for testing the offset of the rotation center with less test error.
The utility model provides a rotation center offset testing arrangement, includes first locating plate, second locating plate, first sensor, second sensor, third sensor and controller, first locating plate with the second locating plate sets up perpendicularly, first sensor the second sensor with the third sensor is all located on the determinand, first sensor extremely the distance of first locating plate with the second sensor extremely the distance of first locating plate equals, first sensor with the light beam perpendicular to that the second sensor jetted out first locating plate, the light beam perpendicular to that the third sensor jetted out the second locating plate, first sensor the second sensor with the third sensor respectively with the controller is connected.
Above-mentioned rotation center offset testing arrangement adopts three sensor to test, need not to do the mark and the range estimation is parallel, has removed the trouble and the inaccuracy of artifical mark from, has avoided utilizing the great error that the range estimation brought, and on the determinand was located to three sensor, there was not the numerical value inaccurate condition that the shake leads to, and data is more accurate, and it is more convenient to test. Therefore, the rotation center offset testing device is simple in structure, convenient to operate, wide in application range, accurate in measured data and small in error.
In one embodiment, the distance measuring device further comprises a display screen, wherein the display screen is connected with the controller and is used for displaying the distance values measured by the first sensor, the second sensor and the third sensor.
In one embodiment, the test fixture further comprises a first positioning seat and a second positioning seat, the first positioning plate is arranged on the test plane through the first positioning seat, and the second positioning plate is arranged on the test plane through the second positioning seat.
In one embodiment, the system further comprises a calculation module for calculating the offset of the center of rotation.
In one embodiment, the calculating module calculates the offset of the rotation center of the object to be measured by the following formula,
wherein, d does the offset of determinand rotation center, an does before the determinand is rotatory the first sensor measuring first sensor extremely distance between the first locating plate, b is before the determinand is rotatory the third sensor measuring third sensor extremely distance between the second locating plate, x is after the n circumference of determinand rotation n first sensor measuring extremely distance between the first locating plate, y is after the n circumference of determinand rotation n third sensor measuring third sensor extremely distance between the second locating plate, wherein, n is the positive integer.
In one embodiment, the first positioning plate and the second positioning plate are both non-transparent plates.
In one embodiment, the controller is a single chip microcomputer.
In one embodiment, the first sensor, the second sensor and the third sensor are all infrared ranging sensors.
A rotation center offset testing method comprises the following steps:
the first sensor, the second sensor and the third sensor are arranged on an object to be measured, the first sensor is used for measuring the distance a from the first sensor to the first reflector, the second sensor is used for measuring the distance a1 from the second sensor to the first reflector, and the third sensor is used for measuring the distance b from the third sensor to the second reflector;
judging whether a and a1 are equal;
when a is not equal to a1, the object to be measured is rotated until a is equal to a1, and the value a and the value b at the moment are read;
when a and a1 are equal, reading the value of a and the value of b at the moment;
rotating the object to be detected by n circles, wherein n is a positive integer;
then, measuring a distance x between the first sensor and the first reflector by using the first sensor, measuring a distance x1 between the second sensor and the first reflector by using the second sensor, and measuring a distance y between the third sensor and the second reflector by using the third sensor;
judging whether x and x1 are equal;
when x is not equal to x1, continuing to rotate the object to be detected until x is equal to x1, and reading the value of x and the value of y at the moment;
when x and x1 are equal, the x and y values at this time are read.
Compared with the prior method for testing the parallel distance and the measuring distance by visual measurement, the method for testing the offset of the rotating center adopts three sensors to test, and has better convenience and accuracy.
In one embodiment, the method further comprises the following steps: calculating the offset of the rotation center, wherein the offset of the rotation center is calculated by adopting the following formula:
The invention has the beneficial effects that: the invention designs a rotation center offset testing device which is simple to operate, wide in application range and accurate in measured data, and a test result can be obtained by only reading a numerical value on a display screen and calculating. The device does not need to be marked and parallel to visual measurement, so that the trouble and inaccuracy of manual marking are avoided, and larger errors caused by visual measurement are avoided. Only the value is read on the display screen.
Drawings
FIG. 1 is a schematic structural diagram of a rotation center offset testing apparatus according to an embodiment;
FIG. 2 is a schematic view of the rotation center offset testing apparatus shown in FIG. 1 and an object to be tested;
FIG. 3 is a schematic structural view of a first positioning plate;
FIG. 4 is a flowchart illustrating a method for testing a rotational center offset according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clear, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. The fixed connection in the present invention includes direct fixed connection and indirect fixed connection.
Referring to fig. 1 and 2, an embodiment of a rotation center offset testing apparatus 100 includes a first positioning plate 10, a second positioning plate 20, a first sensor 30, a second sensor 40, a third sensor 50, and a controller 60, wherein the first positioning plate 10 and the second positioning plate 20 are vertically disposed, the first sensor 30, the second sensor 40, and the third sensor 50 are disposed on an object 200 to be tested, a distance from the first sensor 30 to the first positioning plate 10 is equal to a distance from the second sensor 40 to the first positioning plate 10, light beams emitted from the first sensor 30 and the second sensor 40 are perpendicular to the first positioning plate 10, a light beam emitted from the third sensor 50 is perpendicular to the second positioning plate 20, and the first sensor 30, the second sensor 40, and the third sensor 50 are respectively connected to the controller 60.
Above-mentioned rotation center offset testing arrangement 100 adopts three sensor to test, need not to do the mark and the range estimation is parallel, has removed the trouble and the inaccuracy of artifical mark from, has avoided utilizing the great error that the range estimation brought, and on the determinand 200 was located to the three sensor, there was not the numerical value inaccurate condition that the shake leads to, and data is more accurate, and it is more convenient to test. Therefore, the device 100 for testing the offset of the rotation center has the advantages of simple structure, convenient operation, wide application range and accurate data measurement.
In one embodiment, referring to fig. 3, the device 100 for testing the offset of the rotation center further includes a first positioning seat 90 and a second positioning seat (not shown), the first positioning plate 10 is disposed on the testing plane 95 through the first positioning seat 90, and the second positioning plate 20 is disposed on the testing plane 95 through the second positioning seat. Wherein the test plane 95 may be the ground. The first positioning plate 10 and the second positioning plate 20 are vertically perpendicular to the ground through the first positioning seat 90 and the second positioning seat, respectively.
In one embodiment, the first positioning plate 10 and the second positioning plate 20 are both non-transparent plates.
In one embodiment, the first sensor 30, the second sensor 40, and the third sensor 50 are all infrared ranging sensors. Each sensor is infrared distance measuring sensor, and measurement accuracy is within 1mm, and is more accurate for hand-held tape measure.
In the above rotation center offset testing apparatus 100, the first sensor 30 and the second sensor 40 sense a distance from the first reflector 10 and generate an analog signal, and the third sensor 50 senses a distance from the second reflector 20 and generates an analog signal.
In one embodiment, the controller 60 is a single chip. The first sensor 30, the second sensor 40 and the third sensor 50 are respectively connected with different interfaces of the singlechip. The single chip microcomputer internal AD conversion can convert analog signals measured by the first sensor 30, the second sensor 40 and the third sensor 50 into digital signals.
In one embodiment, the rotational center offset test apparatus 100 further comprises a display screen 70, the display screen 70 being connected to the controller 60. The controller 60 is used to convert the analog signal into a digital signal for display on the display screen 70. The display screen may be an LCD display screen.
Further, the first sensor 30, the second sensor 40 and the third sensor 50 are all disposed on the base bracket 80. The base bracket 80 may be placed on the object 200 to be measured. Further, the base bracket 80 is a right-angle bracket, the first sensor 30 and the second sensor 40 are located on one side of the right-angle bracket, and the third sensor 50 is located on the other side of the right-angle bracket. In this case, the LCD screen may also be disposed on the base bracket 80.
In one embodiment, the rotation center offset testing apparatus 100 further comprises a calculation module for calculating the offset of the rotation center. The calculation of the rotational center offset may be performed by a calculation module or manually. It is understood that the calculation module may be a module separate from the controller, or may be a module belonging to the controller 60.
Further, the offset of the rotation center of the object 200 is calculated by the following formula,
where d is an offset of the rotation center of the object 200, a is a distance between the first sensor 30 and the first positioning plate 10 measured by the first sensor 30 before the object 200 rotates, b is a distance between the third sensor 50 and the second positioning plate 20 measured by the third sensor 50 before the object 200 rotates, x is a distance between the first sensor 30 and the first positioning plate 10 measured by the first sensor 30 after the object 200 rotates n circles, and y is a distance between the third sensor 50 and the second positioning plate 20 measured by the third sensor 50 after the object 200 rotates n circles, where n is a positive integer.
The operation principle of the rotation center offset testing apparatus 100 is as follows:
when the device is used, a measuring end is stably placed on the object to be measured 200, wherein the measuring end comprises a first sensor 30, a second sensor 40, a third sensor 50, a controller 60 and a display screen 70 which are arranged on the right-angle base 80. It is specified that one side of the right-angle base 80 where the first sensor 30 and the second sensor 40 are located is a front side, and the other side of the right-angle base 80 where the third sensor 50 is located is a side.
The edge of the object 200 to be measured is approximately 1 meter away from the first reflector 10 and the second reflector 20, so that the rotated object 200 to be measured is prevented from colliding with the first reflector 10 and the second reflector 20. And the light beams emitted by the three sensors are not blocked, and the positions of the two reflectors are finely adjusted on the premise of ensuring that the two reflectors are mutually perpendicular, so that the infrared light beams of the three sensors irradiate the central position of the reflectors to prevent the rotated object to be measured 200 from exceeding the range of the reflectors.
Then, the object to be measured 200 is rotated left and right to enable the distance values measured by the two sensors in front to be equal, and the distance value is set as a; at this time, the distance value measured by the third sensor on the side is read and is designated as b. Then, the object 200 can be controlled to rotate n full turns, where n is a positive integer, according to the specific requirement. When the two front sensors face the reflector facing the initial position again and the two sensors measure the same value, i.e., they rotate by n × 360 °, the front sensor value is read and set as x, and the value of the third side sensor 50 is set as y.
Before the test, the object to be measured 200 is rotated left and right to make the front of the measuring end parallel to the first reflector 10, so that the distance values measured by the first sensor 30 and the second sensor 40 in front are equal, that is, the distances from the first sensor 30 and the second sensor 40 to the first reflector 10 are equal, and simultaneously, the two infrared light beams are parallel, so that the first reflector 10 is always parallel to the connecting line of the first sensor 30 and the second sensor 40. Thus, it is ensured that after the object 200 rotates one or several times, when the measurement values of the first sensor 30 and the second sensor 40 are kept equal, the object 200 rotates a full circle, that is, n × 360 °. After one full rotation, because the measurement values of the front first sensor 30 and the second sensor 40 are consistent, the change of the front value and the change of the value of the side third sensor 50 are the position change of the intersection point of the perpendicular bisector of the connecting line of the front first sensor 30 and the second sensor 40 and the straight line of the light beam of the side third sensor 50. And because the relative position of the intersection point and the rotation center point is fixed, the change of the intersection point position is the rotation center offset, and the offset direction can be obtained at the same time.
If the rotor rotates for one circle, the offset of the rotation center of one circle is d; if the rotation is n circles, the offset of the rotation center of one circle is d/n. At the same time, the offset direction can also be determined, the magnitude of the x and a values determining whether an offset in the front-back direction occurs, and the magnitude of the y and b values determining whether an offset in the left-right direction occurs. When x > a, the offset occurs in the backward direction, whereas x < a shifts in the forward direction, and if equal, the offset does not occur in the forward and backward directions. And on the same reason, when y > b, the offset occurs to the right, otherwise, y < b is offset to the left, and if the y > b is equal, the offset does not occur in the left and right directions.
In addition, referring to fig. 4, the present invention further provides a method for testing an offset of a rotation center, including the following steps:
s10, the first sensor, the second sensor and the third sensor are all arranged on an object to be measured, the first sensor is adopted to measure the distance a between the first sensor and the first reflector, the second sensor is adopted to measure the distance a1 between the second sensor and the first reflector, and the third sensor is adopted to measure the distance b between the third sensor and the second reflector.
Wherein, the first sensor may be an infrared distance measuring sensor. The second sensor may be an infrared ranging sensor. The third sensor may be an infrared ranging sensor.
The first reflecting plate is a non-transparent plate. The second reflecting plate is a non-transparent plate.
S20, judging whether a is equal to a 1.
And S30, when a is not equal to a1, rotating the object to be measured until a is equal to a1, and reading the value a and the value b.
And S40, when a is equal to a1, reading the a value and the b value at the moment.
And S50, rotating the object to be measured by n circles, wherein n is a positive integer.
n may be a positive integer such as 1,2,3 … …, etc. One circumference, i.e. 360 degrees. In S50, the object 200 rotates n 360 degrees.
And S60, measuring the distance x between the first sensor and the first reflector by using the first sensor, measuring the distance x1 between the second sensor and the first reflector by using the second sensor, and measuring the distance y between the third sensor and the second reflector by using the third sensor.
That is, after the object 200 rotates n circles, the measurement is performed again using the first sensor, the second sensor, and the third sensor.
S70, judging whether x and x1 are equal.
And S80, when x is not equal to x1, continuing to rotate the object to be measured until x is equal to x1, and reading the x value and the y value at the moment.
S90, when x and x1 are equal, reading the x value and y value at the moment.
The rotation center offset amount test method is based on the rotation center offset amount test apparatus 100.
In one embodiment, the method for testing the offset of the rotation center further includes the following steps:
and S95, calculating the offset of the rotation center.
Further, the step of calculating the offset of the center of rotation may be calculated by a calculation module or manually. It is understood that the calculation module may be a module separate from the controller 60 or may be a module belonging to the controller 60.
The offset of the rotation center can be calculated by adopting the following formula:
In the above rotation center offset test method, in S10 and S60, the first sensor 30 and the second sensor 40 sense the distance from the first reflector 10 and generate an analog signal, and the third sensor 50 senses the distance from the second reflector 20 and generates an analog signal. The controller 60 converts the analog signals measured by the first sensor 30, the second sensor 40 and the third sensor 50 into digital signals for display on the display screen 70.
Compared with the prior method for testing the parallel distance and the measuring distance by visual measurement, the method for testing the offset of the rotating center adopts three sensors to test, and has better convenience and accuracy.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (7)
1. A rotation center offset testing device is characterized by comprising a first positioning plate, a second positioning plate, a first sensor, a second sensor, a third sensor and a controller, wherein the first positioning plate and the second positioning plate are vertically arranged, the first sensor, the second sensor and the third sensor are all arranged on an object to be tested, the distance from the first sensor to the first positioning plate is equal to the distance from the second sensor to the first positioning plate, light beams emitted by the first sensor and the second sensor are perpendicular to the first positioning plate, the light beams emitted by the third sensor are perpendicular to the second positioning plate, and the first sensor, the second sensor and the third sensor are respectively connected with the controller;
the device also comprises a calculation module, wherein the calculation module is used for calculating the offset of the rotation center, and the calculation module adopts the following formula to calculate the offset of the rotation center of the object to be measured:
wherein, d does the offset of determinand rotation center, an does before the determinand is rotatory the first sensor measuring first sensor extremely distance between the first locating plate, b is before the determinand is rotatory the third sensor measuring third sensor extremely distance between the second locating plate, x is after the n circumference of determinand rotation n first sensor measuring extremely distance between the first locating plate, y is after the n circumference of determinand rotation n third sensor measuring third sensor extremely distance between the second locating plate, wherein, n is the positive integer.
2. The rotational center offset test apparatus according to claim 1, further comprising a display screen, the display screen being connected to the controller, the display screen being configured to display the distance values measured by the first sensor, the second sensor, and the third sensor.
3. The apparatus according to claim 1, further comprising a first positioning seat and a second positioning seat, wherein the first positioning plate is disposed on the testing plane through the first positioning seat, and the second positioning plate is disposed on the testing plane through the second positioning seat.
4. The apparatus for testing an offset of a center of rotation according to claim 1, wherein the first positioning plate and the second positioning plate are both opaque plates.
5. The apparatus for testing offset of a rotation center of claim 1, wherein the controller is a single chip microcomputer.
6. The rotational center offset test apparatus of claim 1, wherein the first sensor, the second sensor, and the third sensor are infrared distance measuring sensors.
7. A rotation center offset amount test method using the rotation center offset amount test apparatus according to claim 1, characterized by comprising the steps of:
the first sensor, the second sensor and the third sensor are arranged on an object to be measured, the first sensor is used for measuring the distance a from the first sensor to the first reflector, the second sensor is used for measuring the distance a1 from the second sensor to the first reflector, and the third sensor is used for measuring the distance b from the third sensor to the second reflector;
judging whether a and a1 are equal;
when a is not equal to a1, the object to be measured is rotated until a is equal to a1, and the value a and the value b at the moment are read;
when a and a1 are equal, reading the value of a and the value of b at the moment;
rotating the object to be detected by n circles, wherein n is a positive integer;
then, measuring a distance x between the first sensor and the first reflector by using the first sensor, measuring a distance x1 between the second sensor and the first reflector by using the second sensor, and measuring a distance y between the third sensor and the second reflector by using the third sensor;
judging whether x and x1 are equal;
when x is not equal to x1, continuing to rotate the object to be detected until x is equal to x1, and reading the value of x and the value of y at the moment;
when x and x1 are equal, reading the x value and the y value at the moment;
also comprises the following steps: calculating the offset of the rotation center, wherein the offset of the rotation center is calculated by adopting the following formula:
wherein d is the offset of the rotation center of the object to be measured.
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Effective date of registration: 20221128 Address after: Room 1201-16, Shishan Science and Technology Museum, No. 105, Dengwei Road, High tech Zone, Suzhou City, Jiangsu Province, 215000 Patentee after: Suzhou Xinshinuo Semiconductor Equipment Co.,Ltd. Address before: Hunnan New District Jinhui street in Shenyang of Liaoning province 110168 City No. 16 Patentee before: SHENYANG SIASUN ROBOT & AUTOMATION Co.,Ltd. |