CN111326382B - 一种电容耦合等离子体刻蚀设备 - Google Patents

一种电容耦合等离子体刻蚀设备 Download PDF

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CN111326382B
CN111326382B CN201811544972.1A CN201811544972A CN111326382B CN 111326382 B CN111326382 B CN 111326382B CN 201811544972 A CN201811544972 A CN 201811544972A CN 111326382 B CN111326382 B CN 111326382B
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conductive
ring
cavity
lower electrode
radio frequency
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CN111326382A (zh
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黄允文
倪图强
梁洁
赵金龙
吴磊
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Advanced Micro Fabrication Equipment Inc Shanghai
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Advanced Micro Fabrication Equipment Inc Shanghai
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Priority to TW108146036A priority patent/TWI802774B/zh
Priority to KR1020190168183A priority patent/KR102195749B1/ko
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Abstract

本发明提供一种电容耦合等离子体刻蚀设备,下电极固定于导电支撑杆的下端,在导电支撑杆的下端固定有可伸缩导电部,该可伸缩导电部沿导电支撑杆的轴向伸缩,同时,通过电连接部将可伸缩导电部的下端与射频匹配器输出端之间的电连接起来,这样,可以通过可伸缩导电部的伸缩来控制下电极的高度,从而,使得上下极板之间的间距可调。同时,在下电极的外侧,还设置有内导电环,该内导电环通过可伸缩导电部与腔体电连接,该内导电环下电极与腔体内的射频返回路径之间形成屏蔽,避免移动过程中下电极射频场引起射频回路的不稳定,从而实现极板间距的可调的同时,兼顾射频回路的稳定性。

Description

一种电容耦合等离子体刻蚀设备
技术领域
本发明涉及半导体加工设备领域,特别涉及一种电容耦合等离子体刻蚀设备。
背景技术
电容耦合等离子体处理设备,是借助于射频耦合放电产生等离子体,进而利用等离子体进行沉积、刻蚀等加工工艺,其中,产生等离子体的电极之间的极板间距是重要的参数,尤其是在等离子体刻蚀设备中,随着加工工艺的要求不断提高,需要在不同的极板间距下完成不同的刻蚀步骤。然而,由于电极作为射频回路中的一部分,当下电极移动时,会导致射频信号的不稳定性,要实现极板间距的可调,需要同时兼顾射频回路的稳定性。
发明内容
有鉴于此,本发明的目的在于提供一种电容耦合等离子体刻蚀设备,实现极板间距可调,同时兼顾射频回路的稳定性。。
为实现上述目的,本发明有如下技术方案:
一种电容耦合等离子体刻蚀设备,包括:
腔体,所述腔体包括侧壁以及底壁,所述底壁具有开口;
设置于腔体内的上电极以及与所述上电极相对设置的基座,所述基座包括一下电极,所述下电极固定于导电支撑杆且位于所述开口之上;
固定于所述导电支撑杆下端的可伸缩导电部,所述可伸缩导电部沿所述导电支撑杆的轴向伸缩;
固定连接于所述可伸缩导电部下端与射频匹配器输出端之间的电连接部,所述射频匹配器的回流端固定于腔体底部;
所述基座还包括固定于所述下电极外侧的绝缘环,以及固定于所述绝缘环外侧的内导电环;
所述腔体内侧具有射频返回路径,所述内导电环与所述射频返回路径之间具有间隙,所述内导电环通过可伸缩密封部与所述腔体底壁固定,使得所述下电极的上表面密闭设置于所述腔体所在的容置空间内,所述可伸缩密封部沿所述导电支撑杆的轴向伸缩;
固定连接于所述内导电环与所述腔体之间的导电条,所述导电条的长度适应于所述可伸缩密封部的伸缩量。
可选地,还包括接地环,所述接地环位于所述腔体底壁上,所述接地环与所述侧壁之间为空腔,所述接地环为所述射频返回路径的一部分。
可选地,还包括位于所述空腔之上的等离子约束环,所述等离子约束环与所述空腔构成排气腔,所述等离子约束环包括导电部件,所述导电部件使得射频电流从所述腔体侧壁经过等离子约束环后进入所述接地环。
可选地,所述导电条固定于所述腔体底壁上,来自于所述接地环的射频电流经过所述导电条后,依次流经所述内导电环的外侧和内侧后,从所述腔体底壁返回所述回流端。
可选地,所述可伸缩导电部为导电波纹管,所述导电波纹管的与所述导电支撑杆的轴心重叠。
可选地,所述可伸缩密封部为密封波纹管。
可选地,所述下电极上设置有静电夹盘,所述绝缘环环绕所述下电极的侧壁,在所述绝缘环上还设置有环绕所述静电夹盘的聚焦环。
可选地,所述射频匹配器的数量为一个或多个,多个射频匹配器具有不同的频率及功率。
可选地,所述导电支撑杆、所述可伸缩导电部以及所述电连接部外还设置有射频屏蔽罩。
可选地,所述电连接部沿包括沿可伸缩导电部的径向方向的横向部,且所述横向部为刚性连接部。
本发明实施例提供的电容耦合等离子体刻蚀设备,下电极固定于导电支撑杆的下端,在导电支撑杆的下端固定有可伸缩导电部,该可伸缩导电部沿导电支撑杆的轴向伸缩,同时,通过电连接部将可伸缩导电部的下端与射频匹配器输出端之间的电连接起来,这样,可以通过可伸缩导电部的伸缩来控制下电极的高度,从而,使得上下极板之间的间距可调。同时,在下电极的外侧,还设置有内导电环,该内导电环通过可伸缩导电部与腔体电连接,该内导电环下电极与腔体内的射频返回路径之间形成屏蔽,避免移动过程中下电极射频场引起射频回路的不稳定,从而实现极板间距的可调的同时,兼顾射频回路的稳定性。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1示出了根据本发明实施例的电容耦合等离子体刻蚀设备的剖面结构示意图。
具体实施方式
为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图对本发明的具体实施方式做详细的说明。
在下面的描述中阐述了很多具体细节以便于充分理解本发明,但是本发明还可以采用其他不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似推广,因此本发明不受下面公开的具体实施例的限制。
在腔体100内设置有上电极102以及与上电极102相对设置的基座10,所述基座10包括下电极105,下电极105固定于导电支撑杆110上,导电支撑杆110下端固定于可伸缩导电部112上,可伸缩导电部112的下端与射频匹配器120的输出端之间连接有电连接部114,射频匹配器120的回路端固定于腔体100底部。
上电极102为设置于腔体100上部的电极,上电极102也被称作喷淋头,通常地,上电极102处于处理腔室外的端面上设置有进气口(图未示出),处于处理腔室内的端面上设置有通气孔103,工艺气体通过进气口进入上电极102,并通过通气孔103输送至处理腔室内。
下电极105依次通过导电支撑杆110、可伸缩导电部112以及电连接部114连接至射频匹配器120的输出端,射频匹配器120与射频电源(图未示出)连接,从而将射频功率提供至下电极105。
在一些的实施例中,下电极105可以连接一个或多个射频匹配器120,例如可以为2个射频匹配器,在连接多个射频匹配器的实施例中,每个射频匹配器可以提供不同于其他射频匹配器的射频频率和功率,以适用于不同加工工艺的需求,在这些实施例中,上电极102可以接地。在另一些实施例中,下电极105可以连接一射频匹配器,上电极可以连接另一射频匹配器,这两个射频匹配器可以提供不同的射频频率和功率。
下电极105同时还可以作为晶片的支撑结构,在下电极内或者下电极之上的绝缘材料层中可以设置有温度控制装置(图未示出),用于为晶片提供合适的温度,温度控制装置可以是焦耳热装置,例如通过电阻实现温度控制,也可以热传导通道,例如通过热传导通道中的冷却剂实现温度控制,温度控制装置可以具有分区排布的方式,使得晶片不同区域温度可以分别进行控制,实现温度控制均匀性的目的。
在下电极105上还可以设置有静电夹盘(ESC,Electrostatic Chuck)107,用于晶片的吸附,静电夹盘107可以设置于绝缘材料层中,绝缘材料例如是陶瓷材料。
在本申请实施例中,下电极105连接射频源,作为射频功率的输出端,上电极102和腔体100可以接地,腔体100、或者腔体以及与腔体电连接的其他一些附件可以作为射频功率的返回路径,具体的,射频功率从射频匹配器120输出端输出,依次经过电连接部114、可伸缩导电部112和导电支撑杆110之后,进入下电极105,工艺气体通过上电极102通入腔体100内之后,在射频功率作用下,在上电极102和下电极105之间的空间,也就是下电极105之上的空间产生等离子体,射频功率通过等离子体经过腔体100内的返回路径返回至射频匹配器的回路端,根据不同的腔体结构以及设计需要,返回路径可以具有不同的设置。
射频匹配器120与射频源(连接),用于输出需要的射频功率,其具有输出端以及回路端,输出端用于输出射频功率,回流端用于接收返回的射频功率。其中,射频匹配器120的回流端固定连接至腔体100的底部,电连接部114的一端固定至射频匹配器120输出端、另一端固定至可伸缩导电部112的下端,电连接部114为导电材料,将射频匹配器120输出的射频功率传送至可伸缩导电部112,进而传送至下电极105。这样,射频匹配器120为固定连接,从而将电连接部114的一端固定,另一端仅随可伸缩导电部112在导电支撑部110的轴向上有移动,轴向上的移动对射频功率分布的影响很小,不会带来射频功率不稳定的不良影响。
在更优的实施例中,如图1所示,所述电连接部114包括沿可伸缩导电部的径向方向的横向部,且该横向部为刚性连接部,也即随着可伸缩导电部112的移动,该横向部不会适应性的位移发生。
在等离子体刻蚀设备的处理腔室为由腔体100以及其他的必要部件围成的密闭空间,以使得晶片可以在处理腔室的真空环境中完成刻蚀加工工艺。在本申请中,在腔体100的顶部会设置上电极102,上电极102可以设置于腔体100内部,通过其他的部件,如上盖板等结构,实现腔体100顶部的密封,上电极102还可以内嵌于腔体100顶部,此处,上电极102的设置仅为示例,本申请对于上电极102的设置方式以及腔体100顶部的密封并不做限定。
在本申请实施例中,腔体100包括侧壁1001以及底壁1002,下电极105位于开口之上,使得导电支撑杆110以及可伸缩导电部112在开口位置能够上下移动。
基座10还包括绝缘环132和内导电环136,绝缘环132固定于下电极105的外侧,内导电环136固定于绝缘环132的外侧,内导电环136外侧为腔体内侧的射频返回路径,内导电环136通过可伸缩密封部140固定于腔体的底壁1002,该可伸缩密封部140沿导电支撑杆110的轴向伸缩,也就是说,与可伸缩导电部112具有相同的伸缩方向。同时,内导电环136通过导电条160连接到腔体上,使得内导电环136与腔体100为相等电势。本申请中,通过内导电环136将下电极105与其外侧的射频返回路径中的射频场隔离开,这样,在下电极105的移动中,内导电环136会随着下电极105一同上下移动,下电极105移动中避免下电极105的射频场会对周围的射频返回路径的射频场产生影响,避免移动过程中下电极射频场引起射频回路的不稳定,实现极板间距的可调的同时,兼顾射频回路的稳定性。
在本申请中,通过可伸缩密封部140将下电极105的上表面密封设置于腔体100所在的容置空间内,该可伸缩密封部140为绝缘材料,例如可以为密封波纹管,即用于密封作用的波纹管,向,此处下电极105的上表面即朝向上电极102的表面。可以理解的是,该可伸缩密封部140可以直接或间接与内导电环136固定,当基座10还包括其他部件时,可伸缩密封部140可以与其他部件配合,从而实现腔体底部的密封,使得下电极105朝向上电极102的表面位于密闭腔室内。在本实施例中,绝缘环132与下电极105固定,内导电环136固定于绝缘环132,进而通过可伸缩密封部140固定于腔体底壁1002上,使得下电极105的上表面密闭设置于腔体100所在的容置空间内,如图1所示,腔体100下部的密闭空间由腔体的侧壁1001、底壁1002、可伸缩密封部140的内壁以及内导电环136的侧壁围成,使得下电极105的上表面105置于腔体100内,而上电极105下表面以及导电支撑杆110、可伸缩导电杆112置于腔体100外,腔体100内将提供真空环境用于刻蚀工艺的进行。
绝缘环132由绝缘材料制成,例如可以为陶瓷材料,将下电极105与内导电环136电性隔离开。
内导电环136为导电材料,通过导电条160连接到腔体底壁1002,导电条160的长度适应于可伸缩密封部140的伸缩量,导电条160可以为柔性的导电材料,例如可以为金属铜,导电条160的长度具有一定的余量,在可伸缩密封部140上下伸缩时,仍可以保证内导电环和腔体二者的良好的电连接状态。
内导电环136外侧为腔体内侧的射频返回路径,该射频返回路径用于射频功率的返回,该射频返回路径可以是腔体侧壁1002来提供,也可以由腔体内的其他部件来提供。在本实施例中,在腔体100内还设置有接地环101,该接地环为导电材料,为射频返回路径的一部分,位于所述内导电环136的外侧,其与内接地环之间具有间隙,内导电环136用于屏蔽下电极与该接地环101之间的射频干扰。该接地环101与腔体100构成空腔103,空腔103可以用于形成排气腔,空腔103上可以设置等离子约束环134,通过等离子约束环134与接地环101、以及腔体101来构成排气腔,同时,等离子约束环134包括有导电部件。其中,接地环101为导电的隔离壁,一方面能够作为射频返回路径,另一方面在横向隔离出排气腔的空间;等离子约束环134为透气结构,使得腔体内多余的等离子体熄灭并使得废气进入排气腔中,通常地,排气腔还设置有气泵,通过气泵将腔室内的废气排除。
在该实施例中,如图1所示,射频电流从腔体侧壁1002经过等离子约束环134之后,进入接地环101,这样,利用腔室内排气腔以及等离子约束环这些必要部件实现射频电流的返回路径,可以有效缩短射频电流的返回路径。在该具体的示例中,该等离子约束环134为叠层结构,由下至上包括下导电层和上电介质材料层,如图1中的虚线所示,从腔体侧壁1002的射频电流沿等离子约束环134的下层导电进入接地环101。
接地环101连接在底壁1002上,导电条160也设置于底壁1002上,这样,如图1中的虚线所示,射频电流从底壁1002经过导电条160后,依次流经内导电环160的外侧和内侧后,从所述腔体底壁1002返回匹配器120的回流端。
此外,下电极105上还可以设置有静电夹盘107,如图1所示,下电极105的中心区域高于边缘区域,中心区域用于晶片的支撑,具有与晶片基本相同的形状和大小,静电夹盘107设置于该中心区域之上,该绝缘环132环绕该边缘区域以及下电极105的边缘、下电极105下部区域,并延伸至可伸缩密封部140的外侧。
进一步地,在绝缘环132上还设置有环绕静电夹盘107的聚焦环(focus ring)130,聚焦环130用于防止电弧放电,该具体的示例中,如图1所示,该聚焦环130靠近静电夹盘107的内壁的上部为扩口的斜切面,聚焦环130靠近静电夹盘107的外缘为凹陷区,该凹陷区可以用于放置边缘环(edge ring)138。
此外,导电支撑杆110、可伸缩导电部112、电连接部11、腔体100都具有射频辐射,他们外部都可以设置有射频屏蔽罩,根据他们之间的连接,可以通过一个或多个射频屏蔽罩实现辐射屏蔽,在该示例中,如图1所示,可以通过腔体100的射频屏蔽罩(图未示出)以及可伸缩导电部112、电连接部11外的射频屏蔽罩150,实现辐射屏蔽。
以上所述仅是本发明的优选实施方式,虽然本发明已以较佳实施例披露如上,然而并非用以限定本发明。任何熟悉本领域的技术人员,在不脱离本发明技术方案范围情况下,都可利用上述揭示的方法和技术内容对本发明技术方案做出许多可能的变动和修饰,或修改为等同变化的等效实施例。因此,凡是未脱离本发明技术方案的内容,依据本发明的技术实质对以上实施例所做的任何的简单修改、等同变化及修饰,均仍属于本发明技术方案保护的范围内。

Claims (9)

1.一种电容耦合等离子体刻蚀设备,其特征在于,包括:
腔体,所述腔体包括侧壁以及底壁,所述底壁具有开口;
设置于腔体内的上电极以及与所述上电极相对设置的基座,所述基座包括一下电极,所述下电极固定于导电支撑杆且位于所述开口之上;
固定于所述导电支撑杆下端的可伸缩导电部,所述可伸缩导电部沿所述导电支撑杆的轴向伸缩;
固定连接于所述可伸缩导电部下端与射频匹配器输出端之间的电连接部,所述射频匹配器的回流端固定于腔体底部;所述电连接部包括沿所述可伸缩导电部的径向方向的横向部,且所述横向部为刚性连接部;
所述基座还包括固定于所述下电极外侧的绝缘环,以及固定于所述绝缘环外侧的内导电环;
所述腔体内侧具有射频返回路径,所述内导电环与所述射频返回路径之间具有间隙,所述内导电环通过可伸缩密封部与所述腔体底壁固定,使得所述下电极的上表面密闭设置于所述腔体所在的容置空间内,所述可伸缩密封部沿所述导电支撑杆的轴向伸缩;
固定连接于所述内导电环与所述腔体之间的导电条,所述导电条的长度适应于所述可伸缩密封部的伸缩量;
所述导电支撑杆、所述可伸缩导电部以及所述电连接部外还设置有射频屏蔽罩。
2.根据权利要求1所述的设备,其特征在于,还包括接地环,所述接地环位于所述腔体底壁上,所述接地环与所述侧壁之间为空腔,所述接地环为所述射频返回路径的一部分。
3.根据权利要求2所述的设备,其特征在于,还包括位于所述空腔之上的等离子约束环,所述等离子约束环与所述空腔构成排气腔,所述等离子约束环包括导电部件,所述导电部件使得射频电流从所述腔体侧壁经过等离子约束环后进入所述接地环。
4.根据权利要求2或3所述的设备,所述导电条固定于所述腔体底壁上,来自于所述接地环的射频电流经过所述导电条后,依次流经所述内导电环的外侧和内侧后,从所述腔体底壁返回所述回流端。
5.根据权利要求1所述的设备,其特征在于,所述可伸缩导电部为导电波纹管,所述导电波纹管的与所述导电支撑杆的轴心重叠。
6.根据权利要求1所述的设备,其特征在于,所述可伸缩密封部为密封波纹管。
7.根据权利要求1所述的设备,其特征在于,所述下电极上设置有静电夹盘,所述绝缘环环绕所述下电极的侧壁,在所述绝缘环上还设置有环绕所述静电夹盘的聚焦环。
8.根据权利要求1所述的设备,其特征在于,所述射频匹配器的数量为一个或多个,多个射频匹配器具有不同的频率及功率。
9.根据权利要求1所述的设备,其特征在于,随着所述可伸缩导电部的移动,所述横向部不发生位移。
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