CN111289583A - Device and method for testing broadband dielectric property of gel material - Google Patents
Device and method for testing broadband dielectric property of gel material Download PDFInfo
- Publication number
- CN111289583A CN111289583A CN202010102325.6A CN202010102325A CN111289583A CN 111289583 A CN111289583 A CN 111289583A CN 202010102325 A CN202010102325 A CN 202010102325A CN 111289583 A CN111289583 A CN 111289583A
- Authority
- CN
- China
- Prior art keywords
- testing
- standard sample
- electrode
- interdigital electrode
- capacitance value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/221—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance by investigating the dielectric properties
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The invention relates to a testing device and a method for broadband dielectric property of gel materials.A test sample is placed on an upper electrode and a lower electrode of a broadband dielectric spectrometer to obtain a complex relative dielectric constant of a standard sample in a test frequency range; testing the capacitance value of the interdigital electrode under the same frequency on a broadband dielectric spectrum; after a standard sample with known dielectric constant is loaded by using an interdigital electrode, placing the standard sample on a broadband dielectric spectrometer to test the capacitance value under corresponding frequency; and after the complex relative dielectric constant of the standard sample, the capacitance value of the empty interdigital electrode and the standard sample with the known dielectric constant are loaded by the interdigital electrode, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the interdigital electrode capacitance parameter is determined. The device and the method of the invention place the test electrode device filled with the gel in the broadband dielectric spectrum test cavity to realize the broadband dielectric property test of the gel materials.
Description
Technical Field
The invention relates to the field of broadband dielectric characteristic testing, in particular to a device and a method for testing broadband dielectric characteristics of gel materials.
Background
The world energy consumption is continuously increased, the power demand is increasing day by day, and the generation and the development of novel power electronic devices are promoted. The high-voltage high-power device is widely applied to the industries of flexible direct-current transmission, aviation, building and the like, and is a mainstream fully-controlled power switch device. At present, the silicone gel material is often used as an insulating packaging material of a device because of good electrical insulation and chemical stability.
The high-voltage high-power device has the characteristics of high voltage, high frequency and high temperature, and puts higher requirements on the insulating property of the organic silicon gel material. The dielectric property of the organic silicon gel material directly influences the electric field distribution and the insulating property of the device, so that the dielectric property of the obtained organic silicon gel material under wide frequency and wide temperature ranges has important significance on the insulating packaging design of the high-voltage high-power device.
However, the silicone gel material is in a liquid state before curing and is in a special form of a viscous jelly-like solid after curing, so that the test of the broadband dielectric property of the gel material faces a difficult problem. The liquid cell electrode used in the dielectric property test of the common liquid material cannot bear the change process of the gel material from liquid to solid, so the liquid cell electrode is not suitable for the dielectric property test of the gel material; and the gel material can not be made into a fixed shape (such as a square test piece with a certain thickness) and is directly placed between the flat electrodes for carrying out the dielectric property test. Therefore, it is necessary to provide a broadband dielectric characteristic testing method suitable for gel materials to realize broadband dielectric characteristic testing of materials such as silicone gel.
The patent provides a test method of interdigital electrodes and a polytetrafluoroethylene insulation shell matched with a broadband dielectric spectrometer aiming at testing the broadband dielectric characteristics of gel materials, and the capacitance parameters of a test electrode device are determined by combining simulation analysis and experimental calibration, so that the dielectric contribution of the capacitance parameters is eliminated, and the accurate test of the broadband dielectric characteristics of the gel materials is realized. The test result is compared with the parameters of the material product, and the result shows that the test electrode device can obtain better broadband dielectric characteristics of the gel material, and has important significance for guiding and evaluating the insulating and power resisting capability of the power module.
Disclosure of Invention
The invention aims to provide a device and a method for testing the broadband dielectric property of a gel material, so as to realize accurate test of the broadband dielectric property of the gel material.
In order to achieve the purpose, the invention provides the following scheme:
a test device for broadband dielectric characteristics of gel materials, comprising:
the device comprises an electrode testing device, an auxiliary electrode and a broadband dielectric spectrometer;
the electrode testing device is connected with the broadband dielectric spectrometer through the auxiliary electrode.
Optionally, the electrode testing apparatus includes:
the interdigital electrode is positioned in the insulating shell.
Optionally, the insulating housing and the interdigital electrode each include three metal terminals, which are a high voltage terminal, a low voltage terminal, and a ground terminal.
Optionally, the insulating housing is made of polytetrafluoroethylene.
The invention also provides a test method for the broadband dielectric property of the gel material, which comprises the following steps:
placing the test sample between upper and lower electrodes of the broadband dielectric spectrometer to obtain complex relative dielectric constant of the standard sample in the test frequency range, and recording as epsilonc *(ω)；
Testing the capacitance value of the null interdigital electrode under the same frequency on a broadband dielectric spectrum, and marking as Ce *(ω)；
After a standard sample with known dielectric constant is loaded by using interdigital electrodes, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the capacitance value is marked as Cc *(ω)；
And after the complex relative dielectric constant of the standard sample, the capacitance value of the empty interdigital electrode and the standard sample with the known dielectric constant are loaded by the interdigital electrode, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the interdigital electrode capacitance parameter is determined.
Optionally, after the complex relative dielectric constant based on the standard sample, the capacitance value of the null interdigital electrode, and the standard sample with the known dielectric constant are loaded by the interdigital electrode, the interdigital electrode is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency to determine the capacitance parameter of the interdigital electrode by specifically adopting the following formula:
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
the device and the method provided by the invention are directed at a broadband dielectric characteristic testing method of gel materials, the interdigital electrodes are matched with the insulating shell, liquid raw rubber is filled into the interdigital gaps, vacuum degassing is carried out, the raw rubber is cured at a certain temperature, solid viscous jelly-shaped gel is obtained, and the testing electrodes filled with the gel are placed in a broadband dielectric spectrum testing cavity to realize broadband dielectric characteristic testing of the gel materials. The capacitance parameter value of the interdigital electrode is accurately obtained by combining theoretical calculation and experimental calibration, the capacitance compensation parameter is set in the broadband dielectric spectrometer to eliminate the dielectric contribution of the test electrode device, and the reliable test of the broadband dielectric characteristic of the gel material is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
FIG. 1 is a left side view of a device for testing broadband dielectric properties of gel-type materials according to an embodiment of the present invention;
FIG. 2 is a front view of a device for testing broadband dielectric properties of gel-type materials according to an embodiment of the present invention;
FIG. 3 is a top view of a device for testing broadband dielectric properties of gel-type materials according to an embodiment of the present invention;
FIG. 4 is a flowchart of a method for testing broadband dielectric properties of gel-type materials according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a dielectric property testing platform according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a dielectric property testing platform according to an embodiment of the present invention;
FIG. 7 is a graph showing the results of testing the electrode assembly according to the embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a device and a method for testing the broadband dielectric property of a gel material, so as to realize accurate test of the broadband dielectric property of the gel material.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Fig. 1 is a left side view of a testing apparatus for broadband dielectric characteristics of gel materials according to an embodiment of the present invention, fig. 2 is a front view of the testing apparatus for broadband dielectric characteristics of gel materials according to an embodiment of the present invention, fig. 3 is a top view of the testing apparatus for broadband dielectric characteristics of gel materials according to an embodiment of the present invention, as shown in fig. 1 to fig. 3, the testing apparatus includes:
the device comprises an electrode testing device, an auxiliary electrode and a broadband dielectric spectrometer;
the electrode testing device is connected with the broadband dielectric spectrometer through the auxiliary electrode.
Wherein, electrode testing arrangement includes: the device comprises an insulating shell 1 and interdigital electrodes 2, wherein the interdigital electrodes are positioned in the insulating shell. The insulating housing 1 and the interdigital electrode 2 both include three metal terminals 3, which are a high voltage terminal, a low voltage terminal and a ground terminal, respectively, and the arrow directions in fig. 1 and fig. 2 indicate the matching directions of the insulating housing and the interdigital electrode.
According to the invention, the interdigital electrode is selected, so that the problem that the broadband dielectric property test is difficult to realize due to the change of the material state before and after the gel material is cured can be effectively solved. The interdigital electrode is matched with the polytetrafluoroethylene insulating shell, three metal terminals on the polytetrafluoroethylene insulating shell are connected with three metal terminals on the interdigital electrode and respectively comprise a high voltage terminal, a low voltage terminal and a grounding terminal, so that the good connection and ground insulation of the test electrode device are ensured, the test electrode device is connected with the broadband dielectric spectrometer through the upper auxiliary electrode and the lower auxiliary electrode, and the broadband dielectric characteristic test of the gel material is realized.
FIG. 4 is a flow chart of a method for testing the broadband dielectric characteristics of the gel-type material according to an embodiment of the present invention, in which the interdigital electrode itself has dielectric characteristics, and the dielectric contribution thereof can be equivalent to a capacitor (denoted as C) under experimental conditions0) Accurately obtaining the equivalent capacitance parameter value C of the interdigital electrode in a mode of matching theoretical calculation and experimental calibration0And the reliability of the broadband dielectric test result of the silicon gel material is ensured. The theoretical calculation method is based on a conformal mapping theory, a model is established for calculation to obtain a theoretical value of 4pF, further, a standard sample is used for calibrating capacitance parameters of the interdigital electrode, and the calibration principle and the steps are as follows: .
Step 101: placing the test sample between upper and lower electrodes of the broadband dielectric spectrometer to obtain complex relative dielectric constant of the standard sample in the test frequency range, and recording as epsilonc *(ω)。
Step 102: testing the capacitance value of the null interdigital electrode under the same frequency on a broadband dielectric spectrum, and marking as Ce *(ω)。
Step 103: after a standard sample with known dielectric constant is loaded by using interdigital electrodes, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the capacitance value is marked as Cc *(ω)。
Step 104: and after the complex relative dielectric constant of the standard sample, the capacitance value of the empty interdigital electrode and the standard sample with the known dielectric constant are loaded by the interdigital electrode, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the interdigital electrode capacitance parameter is determined.
Wherein epsilonc *(ω) represents the complex relative permittivity, C, of the standard samplee *(ω) represents the capacitance value of the interdigital electrode, Cc *(omega) represents the capacitance value of the standard sample after being loaded by the interdigital electrode, epsilonsu *And (omega) is the complex relative dielectric constant of the interdigital electrode substrate material. Obtaining a capacitance parameter C according to an experimental calibration result0The final value is 4.6pF, which is in accordance with the theoretical calculation value.
The liquid with strong fluidity and the transparent solid state with higher viscosity after curing are not applicable to the liquid pool due to the change of the material state, and the silicon gel material can not be shaped and placed between the flat plate structures, and the interdigital electrode and the insulating shell are matched to bear the liquid crude rubber, and a certain space is provided to ensure that the silicon gel is obtained by curing and molding. The interdigital electrode has dielectric characteristics, and the dielectric contribution thereof is equivalent to a capacitance C0Accurately obtaining the equivalent capacitance parameter value C of the interdigital electrode in a mode of matching theoretical calculation and experimental calibration0Is 4.6pF, and realizes accurate testThe broadband dielectric characteristic of the glue material.
FIG. 5 is a schematic diagram of a dielectric property testing platform according to an embodiment of the present invention, as shown in FIG. 5, an AC voltage U with a frequency of ω/2 π is applied to a test chamber containing a test sample0Under the action of the alternating voltage, alternating current I with the same frequency flows through the test sample0. The voltage and current differ by a phase angle
AC voltage U0AC current I0And the phase angle is determined by the electromagnetic properties and volume of the material itself. Expressed in complex form as follows:
u(t)＝U1cos(ωt)＝Re(U*exp(iωt))
wherein, U*＝U’+iU”，U’＝U1，U”＝0；I*＝I’+iI”,
Thus, the sample impedance is
Z*＝U*/I*
For the interdigital electrode test electrode device filled with the sample, the test principle can be represented by the circuit of fig. 6, in fig. 6, Cp *To test the complex capacitance of the sample, RsiIs the impedance of the evaporating electrode material, the parallel impedance RpiIs the impedance of the sample carrier material, CpiIs the parallel capacitance of the sample carrier material.
Thus, the impedance Z of the samples *And admittance Yp *Is shown as
Further obtaining a sample with a complex relative dielectric constant of
Wherein, C0Namely the capacitance parameter of the interdigital electrode in the invention.
In order to verify the effect of the testing electrode device, the relative dielectric constant (value is 2.7) in the parameters of the organic silicon gel material product for insulated packaging of the IGBT device at the power frequency room temperature is compared with the testing result of the testing electrode device of the invention, and the testing result of the electrode device is shown in fig. 7. The result shows that the accurate test of the dielectric property of the gel material under wide temperature and wide frequency range can be realized by utilizing the test electrode device of the patent.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The principles and embodiments of the present invention have been described herein using specific examples, which are provided only to help understand the method and the core concept of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.
Claims (6)
1. A testing device for broadband dielectric characteristics of gel materials is characterized by comprising:
the device comprises an electrode testing device, an auxiliary electrode and a broadband dielectric spectrometer;
the electrode testing device is connected with the broadband dielectric spectrometer through the auxiliary electrode.
2. The device for testing broadband dielectric characteristics of gel-type materials according to claim 1, wherein the electrode testing device comprises:
the interdigital electrode is positioned in the insulating shell.
3. The device for testing broadband dielectric properties of gel-like materials according to claim 2, wherein the insulating housing and the interdigital electrode each comprise three metal terminals, which are a high voltage terminal, a low voltage terminal and a ground terminal.
4. The device for testing broadband dielectric properties of gel-type materials according to claim 2, wherein the insulating housing is made of teflon.
5. A method for testing broadband dielectric characteristics of gel materials is characterized by comprising the following steps:
placing the test sample between upper and lower electrodes of the broadband dielectric spectrometer to obtain complex relative dielectric constant of the standard sample in the test frequency range, and recording as epsilonc *(ω)；
Testing the capacitance value of the null interdigital electrode under the same frequency on a broadband dielectric spectrum, and marking as Ce *(ω)；
After a standard sample with known dielectric constant is loaded by using interdigital electrodes, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the capacitance value is marked as Cc *(ω)；
And after the complex relative dielectric constant of the standard sample, the capacitance value of the empty interdigital electrode and the standard sample with the known dielectric constant are loaded by the interdigital electrode, the standard sample is placed on a broadband dielectric spectrometer to test the capacitance value under the corresponding frequency, and the interdigital electrode capacitance parameter is determined.
6. The method for testing the broadband dielectric property of the gel material according to claim 5, wherein the following formula is specifically adopted for determining the capacitance parameter of the interdigital electrode based on the complex relative dielectric constant of the standard sample, the capacitance value of the hollow interdigital electrode and the capacitance value of the standard sample with the known dielectric constant, which are loaded by the interdigital electrode and then placed on a broadband dielectric spectrometer for testing the capacitance value at the corresponding frequency:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010102325.6A CN111289583A (en) | 2020-02-19 | 2020-02-19 | Device and method for testing broadband dielectric property of gel material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010102325.6A CN111289583A (en) | 2020-02-19 | 2020-02-19 | Device and method for testing broadband dielectric property of gel material |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111289583A true CN111289583A (en) | 2020-06-16 |
Family
ID=71026846
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010102325.6A Pending CN111289583A (en) | 2020-02-19 | 2020-02-19 | Device and method for testing broadband dielectric property of gel material |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111289583A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111735860A (en) * | 2020-06-18 | 2020-10-02 | 清华大学 | Liquid electrode pool for dielectric spectrum test |
| CN112179383A (en) * | 2020-08-26 | 2021-01-05 | 西安交通大学 | Flexible sensor, preparation method thereof and method for simultaneously measuring rigidity and dielectric constant |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009068864A (en) * | 2007-09-10 | 2009-04-02 | Sony Corp | Transmission line for dielectric measurement, and dielectric measuring device equipped with the transmission line |
| CN101592581A (en) * | 2008-05-29 | 2009-12-02 | 索尼株式会社 | Property measurement apparatus and property measurement method |
| JP4604192B2 (en) * | 2004-03-30 | 2010-12-22 | 国立大学法人広島大学 | Gelling state evaluation apparatus, gel manufacturing apparatus and tofu manufacturing apparatus provided with the same, gel manufacturing method and tofu manufacturing method |
| CN206038591U (en) * | 2016-06-12 | 2017-03-22 | 天津工业大学 | Electricity impedance test box |
| CN107490726A (en) * | 2016-06-12 | 2017-12-19 | 天津工业大学 | A kind of liquid or gel impedance bioelectrical measurement system and its information acquisition method |
| CN108780056A (en) * | 2016-01-15 | 2018-11-09 | 凯斯西储大学 | Dielectric for sample characterization senses |
-
2020
- 2020-02-19 CN CN202010102325.6A patent/CN111289583A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4604192B2 (en) * | 2004-03-30 | 2010-12-22 | 国立大学法人広島大学 | Gelling state evaluation apparatus, gel manufacturing apparatus and tofu manufacturing apparatus provided with the same, gel manufacturing method and tofu manufacturing method |
| JP2009068864A (en) * | 2007-09-10 | 2009-04-02 | Sony Corp | Transmission line for dielectric measurement, and dielectric measuring device equipped with the transmission line |
| CN101592581A (en) * | 2008-05-29 | 2009-12-02 | 索尼株式会社 | Property measurement apparatus and property measurement method |
| CN108780056A (en) * | 2016-01-15 | 2018-11-09 | 凯斯西储大学 | Dielectric for sample characterization senses |
| CN206038591U (en) * | 2016-06-12 | 2017-03-22 | 天津工业大学 | Electricity impedance test box |
| CN107490726A (en) * | 2016-06-12 | 2017-12-19 | 天津工业大学 | A kind of liquid or gel impedance bioelectrical measurement system and its information acquisition method |
Non-Patent Citations (2)
| Title |
|---|
| 叶庆莹: "聚合物取向结构的叉指电容检测方法", 《中国优秀硕士学位论文全文数据库 基础科学辑》 * |
| 王琦编著: "《大学实验化学》", 28 February 2017, 西安电子科技大学出版社 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111735860A (en) * | 2020-06-18 | 2020-10-02 | 清华大学 | Liquid electrode pool for dielectric spectrum test |
| CN112179383A (en) * | 2020-08-26 | 2021-01-05 | 西安交通大学 | Flexible sensor, preparation method thereof and method for simultaneously measuring rigidity and dielectric constant |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Horowitz et al. | High-performance, mechanically compliant silica-based ionogels for electrical energy storage applications | |
| CN111289583A (en) | Device and method for testing broadband dielectric property of gel material | |
| Gardner et al. | Studies on ion-exchange membranes. II. Measurement of the anisotropic conductance of Nafion® | |
| CN106053955B (en) | A kind of low frequency sinusoidal motivates the test method of lower Oil-Paper Insulation relative dielectric constant | |
| CN108519261B (en) | Method for testing dielectric property of semiconductive material based on sandwich structure | |
| Rao et al. | Ultra high dielectric constant epoxy silver composite for embedded capacitor application | |
| CN106226171B (en) | The piezoelectric semiconductor's fracture failure experiment research changed based on polarization direction | |
| Bandara et al. | Analysis of frequency domain dielectric response of pressboard insulation impregnated with different insulating liquids | |
| Xu et al. | Enhanced accuracy in dielectric response material characterization by air reference method | |
| Huang et al. | Structure and circuit modeling of frequency domain polarization characteristics for porous composite material | |
| Masuzaki et al. | Superior high-temperature dielectric properties of dicyclopentadiene resin | |
| CN209356624U (en) | A kind of vacuum equipment for stable state Townsend discharge test | |
| Linde et al. | Comparison of Dielectric Loss Measuring Methods on Epoxy Samples under Harmonic Distorted Voltages | |
| CN115166439A (en) | Three-electrode device for testing dielectric properties of inorganic powder and using method thereof | |
| CN108828493B (en) | Method for eliminating influence of temperature and other phase electric fields on precision of optical voltage transformer | |
| Mugala et al. | Comparing two measurement techniques for high frequency characterization of power cable semiconducting and insulating materials | |
| Zhou et al. | Comment on correction of contact free measurement | |
| Kalytka et al. | Universal installation for studying structural defects in electrical and optical fiber materials | |
| Staesche et al. | Nonlinear conductivity and permittivity spectra of ion conducting glasses | |
| CN111141943A (en) | Broadband voltage transformer suitable for power electronic equipment | |
| Do et al. | Dielectric losses and breakdown in silicone gel | |
| Partridge et al. | Phase separation in thermosetting blends studied by dynamic dielectric analysis | |
| Fukunaga | Dielectrics and electrical insulation for electronics and ICT | |
| Wang et al. | Influence of moisture on dielectric properties of insulation pressboard at microwave band based on micro-strip ring resonant test | |
| Nikolic et al. | Dielectric and thermal properties of self-healing carboxylated nitrile rubber ionically cross-linked with zinc oxide |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200616 |