CN111285400B - 一种二维过渡金属硫化物的可控相转变方法 - Google Patents
一种二维过渡金属硫化物的可控相转变方法 Download PDFInfo
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- CN111285400B CN111285400B CN202010099195.5A CN202010099195A CN111285400B CN 111285400 B CN111285400 B CN 111285400B CN 202010099195 A CN202010099195 A CN 202010099195A CN 111285400 B CN111285400 B CN 111285400B
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- 238000000034 method Methods 0.000 claims description 35
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- 229910021389 graphene Inorganic materials 0.000 claims description 24
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 21
- 239000002041 carbon nanotube Substances 0.000 claims description 21
- 229910021392 nanocarbon Inorganic materials 0.000 claims description 21
- 239000000843 powder Substances 0.000 claims description 19
- 238000003825 pressing Methods 0.000 claims description 17
- 238000004093 laser heating Methods 0.000 claims description 13
- 239000004205 dimethyl polysiloxane Substances 0.000 claims description 12
- 235000013870 dimethyl polysiloxane Nutrition 0.000 claims description 12
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 claims description 12
- 238000004987 plasma desorption mass spectroscopy Methods 0.000 claims description 12
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- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 10
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- 229910052786 argon Inorganic materials 0.000 claims description 10
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- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical group CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 5
- 238000000609 electron-beam lithography Methods 0.000 claims description 5
- 238000002156 mixing Methods 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- 238000000206 photolithography Methods 0.000 claims description 5
- 238000006116 polymerization reaction Methods 0.000 claims description 5
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- 150000001787 chalcogens Chemical group 0.000 claims description 4
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- 150000003624 transition metals Chemical group 0.000 claims description 4
- 229910052798 chalcogen Inorganic materials 0.000 claims description 3
- 230000008859 change Effects 0.000 abstract description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 14
- 229910052982 molybdenum disulfide Inorganic materials 0.000 description 13
- 239000000463 material Substances 0.000 description 11
- CWQXQMHSOZUFJS-UHFFFAOYSA-N molybdenum disulfide Chemical compound S=[Mo]=S CWQXQMHSOZUFJS-UHFFFAOYSA-N 0.000 description 11
- 238000002360 preparation method Methods 0.000 description 11
- 238000000151 deposition Methods 0.000 description 9
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 8
- 230000001276 controlling effect Effects 0.000 description 7
- 229910052961 molybdenite Inorganic materials 0.000 description 7
- 239000000377 silicon dioxide Substances 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 6
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- 239000000243 solution Substances 0.000 description 5
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- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 4
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- 239000000126 substance Substances 0.000 description 4
- 229910016021 MoTe2 Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 229910052717 sulfur Inorganic materials 0.000 description 3
- 239000011593 sulfur Substances 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- WCQOLGZNMNEYDX-UHFFFAOYSA-N bis(selanylidene)vanadium Chemical compound [Se]=[V]=[Se] WCQOLGZNMNEYDX-UHFFFAOYSA-N 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 229910052714 tellurium Inorganic materials 0.000 description 2
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910052720 vanadium Inorganic materials 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
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- 238000005260 corrosion Methods 0.000 description 1
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- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
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- 229910010272 inorganic material Inorganic materials 0.000 description 1
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- 239000007788 liquid Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- VUZPPFZMUPKLLV-UHFFFAOYSA-N methane;hydrate Chemical compound C.O VUZPPFZMUPKLLV-UHFFFAOYSA-N 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000001699 photocatalysis Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
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- 238000013341 scale-up Methods 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01G—COMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
- C01G39/00—Compounds of molybdenum
- C01G39/06—Sulfides
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B19/00—Selenium; Tellurium; Compounds thereof
- C01B19/007—Tellurides or selenides of metals
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D11/00—Inks
- C09D11/02—Printing inks
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- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2002/00—Crystal-structural characteristics
- C01P2002/80—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70
- C01P2002/82—Crystal-structural characteristics defined by measured data other than those specified in group C01P2002/70 by IR- or Raman-data
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Wood Science & Technology (AREA)
- Carbon And Carbon Compounds (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
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CN114772560B (zh) * | 2022-04-16 | 2023-04-11 | 江西师范大学 | 室温铁磁二硒化钒纳米颗粒及其制备方法和作为析氧反应电催化剂的应用 |
CN114807848A (zh) * | 2022-04-20 | 2022-07-29 | 南京大学 | 一种大面积二碲化钼的pld制备方法 |
CN114956180B (zh) * | 2022-06-10 | 2023-03-21 | 西安交通大学 | 一种可实现过渡金属硫化物相转变的方法 |
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US10801987B2 (en) * | 2016-07-19 | 2020-10-13 | The Government Of The United States Of America, As Represented By The Secretary Of The Navy | 2H to 1T phase based transition metal dichalcogenide sensor for optical and electronic detection of strong electron donor chemical vapors |
KR101920118B1 (ko) * | 2016-10-11 | 2018-11-20 | 한양대학교 산학협력단 | 준안정상태의 비율이 향상된 전이금속 칼코게나이드 스크롤 제조방법 및 그에 의해 제조된 전이금속 칼코게나이드 스크롤 |
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Effective date of registration: 20210621 Address after: 424400 No.3, Changfu project area, Guiyang Industrial Park, Chenzhou City, Hunan Province Patentee after: HUNAN TEIKYO ENVIRONMENTAL NEW MATERIAL Co.,Ltd. Address before: 410083 Hunan province Changsha Lushan Road No. 932 Patentee before: CENTRAL SOUTH University |
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Address after: 424400 No.3, Changfu project area, Guiyang Industrial Park, Chenzhou City, Hunan Province Patentee after: Hunan Dijing New Materials Co.,Ltd. Country or region after: China Address before: 424400 No.3, Changfu project area, Guiyang Industrial Park, Chenzhou City, Hunan Province Patentee before: HUNAN TEIKYO ENVIRONMENTAL NEW MATERIAL CO.,LTD. Country or region before: China |