CN111208411A - Multi-channel low-resistance test system - Google Patents
Multi-channel low-resistance test system Download PDFInfo
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- CN111208411A CN111208411A CN202010046155.4A CN202010046155A CN111208411A CN 111208411 A CN111208411 A CN 111208411A CN 202010046155 A CN202010046155 A CN 202010046155A CN 111208411 A CN111208411 A CN 111208411A
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- pcb
- test
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- data acquisition
- acquisition unit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
The invention relates to the technical field of PCB testing, in particular to a multi-channel low-resistance testing system which is suitable for the detection process of the resistance value of a PCB (printed circuit board) channel resistor and comprises a data acquisition unit for acquiring the resistance data of the PCB channel resistor, a testing unit for detecting the data acquisition unit, an upper computer connected with the testing unit and a current source for providing electric power support; the upper computer is suitable for sending a test instruction for detecting the data acquisition unit to the test unit, and the test unit sends a corresponding test signal to the data acquisition unit according to the test instruction; the upper computer is also suitable for receiving detection data which are obtained by the testing unit and fed back by the data acquisition unit, and is used for monitoring the PCB on line; the automatic control principle is adopted, the problems of interference, instability and the like which possibly occur in the manual measurement process are solved, and the PCB which is placed in an environment test box and is subjected to high-low temperature impact test can be monitored on line for a long time, so that the resistance change condition of a PCB channel under different environments can be observed conveniently.
Description
Technical Field
The invention relates to the technical field of PCB testing, in particular to a multi-channel low-resistance testing system.
Background
Pcb (printed Circuit board), which is called printed Circuit board in chinese, is an important electronic component, is a support for electronic components, and is a carrier for electrical connection of electronic components. It is called a "printed" circuit board because it is made using electronic printing.
In the multi-channel low resistance test of the PCB, the resistance is low and the test precision is high. In the prior art, manual testing is mostly adopted, however, technical problems of interference, instability and the like can occur in the manual measuring process, and the online monitoring test state is also lacked.
Disclosure of Invention
The present invention is directed to solving the above problems.
In order to achieve the purpose, the invention provides the following technical scheme:
the multi-channel low-resistance test system is suitable for the resistance value detection process of the PCB access resistor and comprises a data acquisition unit for acquiring PCB access resistor data, a test unit for detecting the data acquisition unit, an upper computer connected with the test unit and a current source for providing power support;
the upper computer is suitable for sending a test instruction for detecting the data acquisition unit to the test unit, and the test unit sends a corresponding test signal to the data acquisition unit according to the test instruction;
the upper computer is also suitable for receiving detection data which are obtained by the testing unit and fed back by the data acquisition unit, and is used for monitoring the PCB on line;
the test unit comprises a PCB control unit, a plurality of measurement channels controlled by the PCB control unit and a temperature probe connected with the data acquisition unit; the PCB control unit, the data acquisition unit and the current source are communicated with the upper computer through a communication bus.
As an aspect of the present invention, the upper computer is adapted to control each measurement channel through the PCB control unit; when the resistance is ultrahigh or open-circuit, PCB isolation is performed.
As an aspect of the present invention, the data acquisition unit further includes a voltage measurement unit adapted to perform voltage detection on the PCB path resistance.
As an aspect of the present invention, the system further includes a UPS independent power supply, where the UPS independent power supply provides power support for the power consuming components of the system, and is used to maintain normal operation of the system after the system is powered off.
As an aspect of the invention, the test unit controls the addition of the current source current to the PCB through a temperature test.
As one scheme of the invention, when the tested temperature is instantly raised to a high temperature, the current source adds corresponding current to the PCB.
As an aspect of the invention, the temperature probe can move synchronously with the PCB to be measured, so that the temperature probe can directly measure the actual temperature in the temperature groove.
The invention has the beneficial effects that: the testing mode of the system adopts an automatic control principle, overcomes the technical problems of interference, instability and the like which possibly occur in the manual measuring process, and can also carry out long-term on-line monitoring on the PCB which is placed in the environmental test chamber and is used for carrying out high and low temperature impact tests, thereby conveniently observing the resistance change condition of the PCB passage under different environments.
Drawings
FIG. 1 is a schematic diagram of the system of the present invention;
fig. 2 is a graph showing a relationship between a resistance value of a PCB via resistor and a current according to an embodiment of the present invention.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
In the multi-channel low-resistance test system provided by the invention, the technical problems of interference, instability and the like which possibly occur in the manual measurement process are overcome aiming at the requirements of low resistance and high test precision in the PCB channel resistance test, and the multi-channel low-resistance test system is a perfect solution for the PCB multi-channel low-resistance test. The system not only can well replace manual operation at ordinary times, but also can carry out long-term on-line monitoring on the PCB which is placed in the environmental test chamber and is used for carrying out high-low temperature impact test, thereby conveniently observing the resistance change condition of the PCB passage under different environments.
The multi-channel low-resistance test system provided by the invention can be understood to be applicable to the resistance value detection process of the PCB access resistor.
Referring to fig. 1, the system includes a data acquisition unit for acquiring PCB path resistance data, a test unit for detecting the data acquisition unit, an upper computer connected to the test unit, and a current source for providing power support.
In this embodiment, the upper computer is adapted to send a test instruction for detecting the data acquisition unit to the test unit, and the test unit sends a corresponding test signal to the data acquisition unit according to the test instruction; the upper computer is also suitable for receiving detection data which are obtained by the testing unit and fed back by the data acquisition unit, and is used for monitoring the PCB on line; the test unit comprises a PCB control unit, a plurality of measurement channels controlled by the PCB control unit and a temperature probe connected with the data acquisition unit; the PCB control unit, the data acquisition unit and the current source are communicated with the upper computer through a communication bus.
In this embodiment, the number of test channels: 200 CH; channel expansion cardinality: 50 CH; current output range of current source: 0.1 mA-3A, and the specific numerical value can be adjusted according to the actual condition; current source measurement resolution: 0.01 mA; resistance measurement range: 10 mu omega-100 omega; resistance minimum resolution: 1 μ Ω.
In an alternative embodiment of the present invention, the upper computer is adapted to control each measurement channel through the PCB control unit; when the resistance is ultrahigh or open-circuit, PCB isolation is carried out; and ensuring normal test of other PCBs; so as to ensure the continuous experiment or the safety of the sample.
The data acquisition unit also comprises a voltage measurement unit which is suitable for carrying out voltage detection on the resistance of the PCB channel.
In order to prevent the system from suddenly powering off when the system works, and the system is in failure.
In one embodiment, the system is added with a UPS independent power supply, which provides power support for the system power consuming components, and is used for maintaining normal system operation after the system is powered off, for example, after the system is powered off during system operation, the UPS power supply maintains the system operation for 5-8 minutes after the system is powered off.
In one embodiment, the test unit controls the current source to add current to the PCB through a temperature test, and when the temperature to be tested is instantly raised to a high temperature, the current source adds corresponding current to the PCB.
In one embodiment, the temperature probe can move synchronously with the PCB to be measured, so that the temperature probe can directly measure the actual temperature in the temperature groove.
In the above embodiment of the present invention, the resistance values of the high temperature region and the low temperature region are always tested, and only the data is recorded in the high temperature region, but also the data measured in the full temperature region can be recorded.
In a specific embodiment, the test wire selected in the above examples is preferably a teflon-clad silver-plated wire, which has a temperature resistance range of: the high-temperature-resistant steel can bear a large current of 3A when working for a long time at a temperature of between 70 ℃ below zero and 250 ℃.
It should be noted that the temperature range of the high-temperature section mentioned in the embodiment of the present invention is 150 to 200 ℃, wherein 150 ℃ is the maximum resistance value, and 200 ℃ is the minimum resistance value; the temperature range of the low-temperature section is-65-25 ℃, wherein-65 ℃ is the maximum value of the resistance, and 25 ℃ is the minimum value of the resistance.
In a specific implementation process, the upper computer can be a computer, and the system further comprises a communication module: a configuration for the system communication port; a storage unit: for storing the detection data; a server for establishing data transmission with the storage unit and the upper computer; and a display unit for displaying the data detected by the system.
Referring to fig. 2, a graph of a relationship between a resistance value of a PCB via resistor and a current according to an embodiment of the present invention is shown.
It can be seen that when the current is added in the range of 0.2mA to 5mA, the resistance of the corresponding resistor is 100 Ω, when the current is added in the range of 5mA to 50mA, the resistance of the corresponding resistor is 5 Ω, and in this process, the resistance of the corresponding resistor changes to 5 Ω instantly when the current exceeds 5mA, when the current is added in the range of 50mA to 3A, the resistance of the corresponding resistor decreases linearly from 5 Ω to 0.1 Ω, when the current is added to 3A, the resistance of the corresponding resistor decreases to 10 μ Ω instantly, and the measurement range of the visible resistor is 10 μ Ω to 100 Ω.
Through test experiments, the resistance measurement precision of the system is as follows: 10m Ω or less: within +/-5%; 2 Ω or more: within + -2%.
It is understood that those skilled in the art can make equivalents according to the technical solutions and concepts of the present invention, and all the equivalents without inventive equivalents should fall within the scope of the present disclosure. The invention can be used in the field of fingerprint detection, and can also be used in the application needing to detect other small signals.
Claims (7)
1. The multi-channel low-resistance test system is suitable for the resistance value detection process of the PCB access resistor and is characterized by comprising a data acquisition unit for acquiring PCB access resistor data, a test unit for detecting the data acquisition unit, an upper computer connected with the test unit and a current source for providing electric power support;
the upper computer is suitable for sending a test instruction for detecting the data acquisition unit to the test unit, and the test unit sends a corresponding test signal to the data acquisition unit according to the test instruction;
the upper computer is also suitable for receiving detection data which are obtained by the testing unit and fed back by the data acquisition unit, and is used for monitoring the PCB on line;
the test unit comprises a PCB control unit, a plurality of measurement channels controlled by the PCB control unit and a temperature probe connected with the data acquisition unit; the PCB control unit, the data acquisition unit and the current source are communicated with the upper computer through a communication bus.
2. The multi-channel low resistance test system of claim 1, wherein: the upper computer is suitable for controlling each measuring channel through the PCB control unit; when the resistance is ultrahigh or open-circuit, PCB isolation is performed.
3. The multi-channel low resistance test system of claim 1, wherein: the data acquisition unit also comprises a voltage measurement unit which is suitable for carrying out voltage detection on the resistance of the PCB channel.
4. The multi-channel low resistance test system of claim 1, wherein: the UPS independent power supply provides power support for the system power consumption element and is used for maintaining normal operation of the system after the system is powered off.
5. The multi-channel low resistance test system of claim 1, wherein: the test unit controls the current of the current source to be added to the PCB through temperature test.
6. The multi-channel low resistance test system of claim 5, wherein: when the tested temperature is instantly raised to a high temperature, the current source adds corresponding current to the PCB.
7. The multi-channel low resistance test system of claim 1, wherein: the temperature probe can move synchronously with the PCB to be measured, so that the temperature probe can directly measure the actual temperature in the temperature groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202010046155.4A CN111208411A (en) | 2020-01-16 | 2020-01-16 | Multi-channel low-resistance test system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010046155.4A CN111208411A (en) | 2020-01-16 | 2020-01-16 | Multi-channel low-resistance test system |
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| CN111208411A true CN111208411A (en) | 2020-05-29 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858786A (en) * | 2020-12-31 | 2021-05-28 | 广州鲁邦通物联网科技有限公司 | Modular resistance voltage measuring device and method |
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|---|---|---|---|---|
| US4408157A (en) * | 1981-05-04 | 1983-10-04 | Associated Research, Inc. | Resistance measuring arrangement |
| JPH08288051A (en) * | 1995-04-10 | 1996-11-01 | Mazda Motor Corp | Resistance detection method for heating body, device therefor and current carrying device for the body |
| CN201562016U (en) * | 2009-06-23 | 2010-08-25 | 哈尔滨理工大学 | Explosion-preventing resistance measuring instrument |
| CN204903654U (en) * | 2015-07-06 | 2015-12-23 | 北京市汇聚电动汽车科技发展有限公司 | Electric automobile is resistance measurement device a little on line |
| CN105301521A (en) * | 2015-11-27 | 2016-02-03 | 云南电网有限责任公司电力科学研究院 | Direct current load test device and test method |
| CN105372499A (en) * | 2015-11-25 | 2016-03-02 | 亿和精密工业（苏州）有限公司 | Micro-resistance measurement equipment and measurement method |
| CN205301431U (en) * | 2015-11-25 | 2016-06-08 | 亿和精密工业（苏州）有限公司 | Little resistance measurement equipment |
| CN108957112A (en) * | 2018-07-04 | 2018-12-07 | 南京中认南信检测技术有限公司 | Photovoltaic module current continuity monitor |
| CN208672715U (en) * | 2018-08-16 | 2019-03-29 | 南京民盛电子仪器有限公司 | A kind of Estimate of Resistance for DC Low Resistance monitoring system that multichannel is tested simultaneously |
-
2020
- 2020-01-16 CN CN202010046155.4A patent/CN111208411A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4408157A (en) * | 1981-05-04 | 1983-10-04 | Associated Research, Inc. | Resistance measuring arrangement |
| JPH08288051A (en) * | 1995-04-10 | 1996-11-01 | Mazda Motor Corp | Resistance detection method for heating body, device therefor and current carrying device for the body |
| CN201562016U (en) * | 2009-06-23 | 2010-08-25 | 哈尔滨理工大学 | Explosion-preventing resistance measuring instrument |
| CN204903654U (en) * | 2015-07-06 | 2015-12-23 | 北京市汇聚电动汽车科技发展有限公司 | Electric automobile is resistance measurement device a little on line |
| CN105372499A (en) * | 2015-11-25 | 2016-03-02 | 亿和精密工业（苏州）有限公司 | Micro-resistance measurement equipment and measurement method |
| CN205301431U (en) * | 2015-11-25 | 2016-06-08 | 亿和精密工业（苏州）有限公司 | Little resistance measurement equipment |
| CN105301521A (en) * | 2015-11-27 | 2016-02-03 | 云南电网有限责任公司电力科学研究院 | Direct current load test device and test method |
| CN108957112A (en) * | 2018-07-04 | 2018-12-07 | 南京中认南信检测技术有限公司 | Photovoltaic module current continuity monitor |
| CN208672715U (en) * | 2018-08-16 | 2019-03-29 | 南京民盛电子仪器有限公司 | A kind of Estimate of Resistance for DC Low Resistance monitoring system that multichannel is tested simultaneously |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858786A (en) * | 2020-12-31 | 2021-05-28 | 广州鲁邦通物联网科技有限公司 | Modular resistance voltage measuring device and method |
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