CN110970315A - Test piece and test contactor composed of same - Google Patents
Test piece and test contactor composed of same Download PDFInfo
- Publication number
- CN110970315A CN110970315A CN201910749956.4A CN201910749956A CN110970315A CN 110970315 A CN110970315 A CN 110970315A CN 201910749956 A CN201910749956 A CN 201910749956A CN 110970315 A CN110970315 A CN 110970315A
- Authority
- CN
- China
- Prior art keywords
- test
- guide body
- test piece
- head
- arc elastic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A test strip, characterized in that: the test device comprises a guide body, a test piece head, an arc elastic area, a mounting bracket and a test board contact surface, wherein the guide body (1) and the test piece head (2) are arranged above the guide body (1); the guide body (1) is provided with an arc elastic area (3), the arc elastic area (3) is provided with a mounting bracket (4), and the mounting bracket (4) is provided with a test board contact surface (5). The invention has simple structure and low cost, and the continuous elastic force generated by the arc elastic area of the test piece when the invention is contacted with the product pin causes the test contact surface on the test piece head to be contacted with the pin, thereby greatly reducing the problem of contact failure of the test piece and the product pin, improving the accuracy of the test result of the product, improving the qualification rate of the product and being suitable for popularization and use.
Description
Technical Field
The present invention relates to a mechanical structure for semiconductor product testing, and more particularly to a test contactor comprised thereof.
Background
Before the manufacturing process of the semiconductor product is completed, a final Test stage is required to be performed, the final Test is to Test each product by using a matching combination of a Test machine (Tester), a Handler (Handler), a Test Board (DUT Board) and a Test Contactor (Test Contactor), a Test line of a Test machine is connected to a line on the Test Board, the line on the Test Board is connected to one end of a Test piece of the Test Contactor, and the other end of the Test piece is directly contacted with a pin of the semiconductor product, so that the product is tested. Burrs are easily generated on the contact surfaces of the pins and the test pieces in the manufacturing process, and meanwhile irregular surfaces are easily generated on the contact surfaces of the pins, so that the contact failure of the test pieces and the pins is easily caused, products are judged to be unqualified by mistake, the qualification rate of the products is reduced, and the products are greatly wasted.
Disclosure of Invention
One objective of the present invention is to provide a test strip for solving the problem of contact failure between the test strip and the product pins in the conventional semiconductor product testing process. The invention also provides a test contactor consisting of the test strip.
The purpose of the invention is realized by the following technical scheme:
a test piece comprises a guide body, a test piece head, an arc-shaped elastic area, a mounting bracket and a test board contact surface, wherein the guide body and the test piece head are arranged above the guide body; the guide body is provided with an arc elastic area, the arc elastic area is provided with a mounting bracket, and the mounting bracket is provided with a contact surface of the test board.
Furthermore, a test piece head contact surface is arranged on the test piece head.
A test contactor comprises a test contact piece substrate, wherein at least one test piece is arranged on the test contact piece substrate, and the test piece comprises a guide body arranged on the test contact piece substrate and a test piece head arranged above the guide body; the guide body is provided with an arc elastic area, the arc elastic area is provided with a mounting bracket, and the mounting bracket is provided with a contact surface of the test board.
Compared with the prior art, the invention has the following advantages and beneficial effects:
(1) the invention has simple structure and low cost, when in use, the testing head of the testing sheet is contacted with the product pin for testing, the guide body provides support for the testing head, and the arc elastic area provides continuous pressure for the testing head and the product pin, so that the testing head is contacted with the product pin under the elastic pressure, thereby greatly reducing the problem of contact failure of the testing sheet and the product pin, improving the accuracy of the product testing result and improving the qualification rate of the product.
(2) The testing chip head is provided with the testing chip head contact surface, the testing chip head is contacted with the product pins through the testing chip head contact surface during testing, the arc elastic area can increase the contact pressure of the testing chip head and the product pins, and the accuracy of the product testing result can be improved.
(3) The test contactor comprises a test contact piece substrate, wherein at least one test piece is arranged on the test contact piece substrate, so that a plurality of test contact heads are adopted to be in contact with product pins and test.
Drawings
FIG. 1 is a schematic view of the overall structure of the test strip of the present invention.
Fig. 2 is a schematic view of the overall structure of the test contactor of the present invention.
Wherein, the names corresponding to the reference numbers in the drawings are:
the test device comprises a guide body, a test piece head, a 3-arc elastic region, a 4-mounting support, a 5-test board contact surface, a 6-test piece head contact surface and a 7-test contact piece substrate.
Detailed Description
The present invention will be described in further detail with reference to the following examples:
example 1
A test piece comprises a guide body 1, a test piece head 2, an arc-shaped elastic area 3, a mounting bracket 4 and a test board contact surface 5, wherein the guide body 1 and the test piece head 2 are arranged above the guide body 1; the guide body is provided with an arc elastic area 3, the arc elastic area 3 is provided with a mounting bracket 4, and the mounting bracket is provided with a contact surface 5 of the test board.
The testing sheet is used for being in contact with the product pins and pressing down to enable the arc-shaped elastic area of the testing sheet to deform for testing, and continuous elastic force generated by the arc-shaped elastic area of the testing sheet when the testing sheet is in contact with the product pins enables the testing contact surface on the testing sheet head to be in contact with the pins, so that the problem of contact failure of the testing sheet and the product pins is greatly reduced, the accuracy of product testing results is improved, and the qualification rate of products is improved.
Example 2
As shown in fig. 2, the test contactor of the present invention comprises a test contact piece substrate 7, and at least one test piece as described in example 1 is provided on the test contact piece substrate 7. The mounting bracket 4 of the test strip is fixed on the test contact strip substrate 7.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (3)
1. A test strip, characterized in that: the test device comprises a guide body, a test piece head, an arc elastic area, a mounting bracket and a test board contact surface, wherein the guide body (1) and the test piece head (2) are arranged above the guide body (1); the guide body (1) is provided with an arc elastic area (3), the arc elastic area (3) is provided with a mounting bracket (4), and the mounting bracket (4) is provided with a test board contact surface (5).
2. A test strip according to claim 1, wherein: the test head (2) is provided with a test head contact surface (6).
3. A test contactor comprising a test contact piece substrate (7), characterized in that: the test contact piece substrate (7) is provided with at least one test piece, and the test piece comprises a guide body (1) and a test piece head (2), wherein the guide body (1) is arranged on the test contact piece substrate (7), and the test piece head (2) is arranged above the guide body (1); be equipped with arc elastic zone (3) on the direction body (1), be equipped with installing support (4) on arc elastic zone (3), be equipped with on installing support (4) and survey test panel contact surface (5), installing support (4) are installed on test contact piece base plate (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910749956.4A CN110970315A (en) | 2019-08-14 | 2019-08-14 | Test piece and test contactor composed of same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910749956.4A CN110970315A (en) | 2019-08-14 | 2019-08-14 | Test piece and test contactor composed of same |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110970315A true CN110970315A (en) | 2020-04-07 |
Family
ID=70028442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910749956.4A Pending CN110970315A (en) | 2019-08-14 | 2019-08-14 | Test piece and test contactor composed of same |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110970315A (en) |
-
2019
- 2019-08-14 CN CN201910749956.4A patent/CN110970315A/en active Pending
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200407 |