CN110954566B - 一种使用透射电子显微镜确认晶体手性的方法 - Google Patents

一种使用透射电子显微镜确认晶体手性的方法 Download PDF

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CN110954566B
CN110954566B CN201911309683.8A CN201911309683A CN110954566B CN 110954566 B CN110954566 B CN 110954566B CN 201911309683 A CN201911309683 A CN 201911309683A CN 110954566 B CN110954566 B CN 110954566B
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CN110954566A (zh
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马延航
董卓雅
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ShanghaiTech University
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Abstract

本发明公开了一种使用透射电子显微镜确认晶体手性的方法，其特征在于，首先根据不同手性晶体的对称性确定合适的晶带轴，然后使用球差校正的透射电子显微镜将晶体转至特定的晶带轴，并拍摄沿不同晶带轴方向的系列扫描透射电子显微高分辨图像，结合左右手性结构的图像模拟结果，根据特定晶带轴方向高分辨图像中观测到的、与左右手性结构相关的、不同的原子排列。本发明突破了传统的使用多个晶胞平均信息的衍射方法的局限性，利用球差校正扫描透射电子显微镜高分辨成像，在亚原子分辨率下确认晶体局部区域的左右手性，简便易操作，具有普适性。

Description

一种使用透射电子显微镜确认晶体手性的方法
技术领域
本发明涉及一种使用透射电子显微镜确认晶体手性的方法，属于电子显微学、电子晶体学和手性晶体材料领域。
背景技术
手性在自然界和材料中都非常常见。材料的偏光、压电、催化和分离等性质，都与其手性特征密切相关，尤其是不同手性的药物可能有完全不同的作用效果，因此手性的确认对于材料的设计与合成具有指导性意义。
传统的使用单晶X射线衍射确认手性的方法基于X射线的不规则散射，该方法通常需要质量好且没有缺陷的大尺寸(几十微米级)晶体；也有人报道使用电子衍射确认小尺寸晶体的手性。但衍射是基于多个晶胞的平均信息，无法确认晶体局部区域的手性。因此，发展能够在原子尺度确认晶体局部区域手性的电子显微晶体学新方法非常必要。
发明内容
本发明所要解决的技术问题是：提供一种电子显微晶体学方法，提高确认手性晶体的局部区域左右手性的准确性。
为了解决上述技术问题，本发明提供了一种使用透射电子显微镜确认晶体手性的方法，其特征在于，首先根据不同手性晶体的对称性确定合适的晶带轴，然后使用球差校正的透射电子显微镜将晶体转至特定的晶带轴，并拍摄沿不同晶带轴方向的系列扫描透射电子显微高分辨图像，结合左右手性结构的图像模拟结果，根据特定晶带轴方向高分辨图像中观测到的、与左右手性结构相关的、不同的原子排列。
本发明突破了传统的使用多个晶胞平均信息的衍射方法的局限性，利用球差校正扫描透射电子显微镜高分辨成像，在亚原子分辨率下确认晶体局部区域的左右手性，简便易操作，具有普适性。
附图说明
图1a、b为手性晶体碲沿不同方向的结构模型；
图2为Te晶体沿[100]方向的扫描透射电子显微镜高分辨图像(a)和晶体逆时针旋转至[1-10]方向拍摄到原子分辨的高分辨图像(b)的比较图。
具体实施方式
为使本发明更明显易懂，兹以优选实施例，并配合附图作详细说明如下。
实施例：碲(Te)晶体手性的确认
由图1a、1b可见，不同手性晶体碲的原子排列不同。
先拍摄Te晶体沿[100]方向的扫描透射电子显微镜高分辨图像(如图2a所示)，随后将晶体逆时针旋转至[1-10]方向并拍摄到原子分辨的高分辨图像(如图2b所示)，通过观察[1-10]方向高分辨图像中与特定手性相关的原子排布(沿该晶带轴方向原子列向左弯曲为左手手性，向右弯曲为右手手性)，确认该颗晶体为左手手性。

Claims (1)

1.一种使用透射电子显微镜确认晶体手性的方法，其特征在于，首先根据不同手性晶体的对称性确定合适的晶带轴，然后使用球差校正的透射电子显微镜将晶体转至特定的晶带轴，并拍摄沿不同晶带轴方向的系列扫描透射电子显微高分辨图像，结合左右手性结构的图像模拟结果，根据特定晶带轴方向高分辨图像中观测到的、与左右手性结构相关的、不同的原子排列，利用球差校正扫描透射电子显微镜高分辨成像，在亚原子分辨率下确认晶体局部区域的左右手性。
CN201911309683.8A 2019-12-18 2019-12-18 一种使用透射电子显微镜确认晶体手性的方法 Active CN110954566B (zh)

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