CN110850337B - Multi-wire-bundle testing system, method, device and storage medium - Google Patents
Multi-wire-bundle testing system, method, device and storage medium Download PDFInfo
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- CN110850337B CN110850337B CN201911015207.5A CN201911015207A CN110850337B CN 110850337 B CN110850337 B CN 110850337B CN 201911015207 A CN201911015207 A CN 201911015207A CN 110850337 B CN110850337 B CN 110850337B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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Abstract
The invention discloses a multi-wire bundle testing system, a method, a device and a storage medium, wherein the system comprises: the computer equipment is used for storing, decomposing, receiving and analyzing the test files; the test file comprises basic data, production data and product test data; the wire harness testing equipment is used for testing technical parameters of the wire harness; the test boards and/or the test tools are used for connecting the wire harness and the wire harness test equipment; and the computer equipment is connected with the wiring harness test equipment through a communication interface. Computer equipment passes through communication interface with test equipment among this test system and is connected, and test equipment passes through to survey test panel and/or test fixture and pencil is connected to whether the test data to pencil test carry out the analysis and judge test qualified, realize testing a plurality of products or a plurality of test equipment joint test simultaneously, the automatic processing of test data and test result, test equipment's high-usage, the expansibility is good and efficient. The invention can be widely applied to the technical field of wire harness testing.
Description
Technical Field
The invention relates to the technical field of wire harness testing, in particular to a multi-wire harness testing system, method and device and a storage medium.
Background
The wire harness test is to test the wiring parts and the insulating binding materials of the electrical equipment connected in the circuit to find out possible problems, and the parameters to be tested generally comprise the conduction, insulation, voltage resistance, resistance and the like of the wire harness.
The existing wire harness testing equipment is operated by a single machine, and related files required by the wire harness testing equipment are also manually imported; in the testing process, the testing of multiple product parts cannot be carried out simultaneously, so that the utilization rate and the efficiency of the wire harness testing equipment are low; a plurality of wire harness test devices cannot be jointly tested, so that the expansibility is poor; in addition, the test results of the wire harness test equipment cannot be timely saved so as to facilitate subsequent inspection and statistics.
Disclosure of Invention
Embodiments of the present invention provide a multi-wire-bundle testing system, method, apparatus and storage medium. The invention can realize the joint test of simultaneously testing a plurality of products or a plurality of test devices, automatically process the test data and the test result, and has high utilization rate, good expansibility and high efficiency of the test devices.
In a first aspect, an embodiment of the present invention provides a multi-beam testing system, including:
the computer equipment is used for storing, decomposing, receiving and analyzing the test files; the test file comprises basic data, production data and product test data;
the wire harness testing equipment is used for testing technical parameters of the wire harness;
the test boards and/or the test tools are used for connecting the wire harness and the wire harness test equipment;
and the computer equipment is connected with the wiring harness test equipment through a communication interface.
Preferably, the computer device further comprises an ERP system, and the ERP system is configured to generate a scheduling plan of the wiring harness product, and send production data of the wiring harness product to the wiring harness test device according to the scheduling plan.
Preferably, one test board or one test fixture is connected with a plurality of wire harness test devices.
Preferably, the communication interface is an RS232 communication interface.
In a second aspect, an embodiment of the present invention provides a multi-beam testing method, including the following steps:
acquiring basic data and a scheduling plan of a wire harness product;
acquiring production data generated according to basic data and a production scheduling plan of the wire harness product;
sending the production data to a wire harness testing device according to the scheduling plan;
and acquiring product test data of the test equipment, and analyzing whether the product test data is qualified.
Preferably, the production data includes a test drawing of the wire harness product, a binding graph of the test board, and/or a binding graph and connection relation data of the test fixture.
Preferably, the acquiring production data generated according to the basic data and the scheduling plan of the bundle product includes:
acquiring a test drawing generated by the basic data;
and acquiring a wiring diagram of the test board and/or wiring diagram and connection relation data of the test tool generated by the test drawing and the scheduling plan.
In a third aspect, an embodiment of the present invention further provides a multi-beam testing system, including:
the first acquisition module is used for acquiring basic data and a scheduling plan of the wire harness product;
the second acquisition module is used for acquiring production data generated according to basic data and a production scheduling plan of the wire harness product;
the sending module is used for sending the production data to the wire harness testing equipment according to the scheduling plan;
and the analysis module is used for acquiring the product test data of the test equipment and analyzing whether the product test data is qualified or not.
In a fourth aspect, an embodiment of the present invention provides a multi-beam testing apparatus, including:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the multi-beam testing method described above.
In a fifth aspect, embodiments of the present invention provide a storage medium having stored therein processor-executable instructions, which when executed by a processor, are configured to perform the multi-beam testing method described above.
The implementation of the embodiment of the invention has the following beneficial effects: computer equipment passes through communication interface with test equipment in this test system and is connected, test equipment passes through to survey test panel and/or test fixture and pencil is connected, decompose the basic data of storage through computer equipment and obtain production data, and whether the product test data to the pencil test carry out analysis judgement test qualified, realize testing a plurality of products simultaneously or a plurality of test equipment joint test, the automatic processing of test data and test result, test equipment's high-usage, the expansibility is good and efficient.
Drawings
Fig. 1 is a block diagram of a multi-wire bundle testing system according to an embodiment of the present invention;
FIG. 2 is a flow chart of a multi-beam testing method according to an embodiment of the present invention;
FIG. 3 is a block diagram of another multi-harness testing system according to an embodiment of the present invention;
fig. 4 is a block diagram of a multi-harness testing device according to an embodiment of the present invention.
Detailed Description
The invention is described in further detail below with reference to the figures and the specific embodiments. The step numbers in the following embodiments are provided only for convenience of illustration, the order between the steps is not limited at all, and the execution order of each step in the embodiments can be adapted according to the understanding of those skilled in the art.
As shown in fig. 1, an embodiment of the present invention provides a multi-beam testing system, including:
the computer equipment is used for storing, decomposing, receiving and analyzing the test files; the test file comprises basic data, production data and product test data;
the wire harness testing equipment is used for testing technical parameters of the wire harness;
the test boards and/or the test tools are used for connecting the wire harnesses and the wire harness test equipment;
and the computer equipment is connected with the wiring harness testing equipment through a communication interface.
Specifically, the computer device includes a processor and a memory, the memory for storing data, and the processor for processing various data. The basic data comprise drawings of the wiring harness products, the drawings of the wiring harness products cannot be directly used as test drawings of the wiring harness products under general conditions, and the drawings of the wiring harness products need to be decomposed into the test drawings; the production data comprises a test drawing of a wire harness product, a binding graph of a test board and/or a binding graph and connection relation data of a test tool, and also comprises a conduction relation, a conduction impedance, a voltage withstanding value and the like of the wire harness; the product test data includes the harness conduction relationship and the technical parameters measured by the test equipment. The computer equipment is connected with the testing equipment through the communication interface to transmit data, and the computer equipment compares and analyzes the received product testing data with the stored qualified technical parameter range, so that whether the product testing data of the wire harness is qualified is judged.
Computer equipment connects a plurality of test equipment, including test equipment 1, test equipment 2 and test equipment N1, every test equipment connects a plurality of and surveys test panel and/or test fixture, survey test panel or test fixture and connect a plurality of test equipment and a pencil, for example, test equipment 1 connects and surveys test panel 1, survey test panel 2 and survey test panel 3, test equipment 2 connects and surveys test panel 3 and test fixture 1, test equipment N1 connects and surveys test panel N2 and test fixture N3, survey test panel 1 connecting wire harness 1, survey test panel 2 connecting wire harness 2, survey test panel 3 connecting wire harness 3, test fixture 1 connecting wire harness 4, survey test panel N2 connecting wire harness N4, test fixture N3 connecting wire harness N4+ 1.
It should be noted that, when the test requirements or specifications of the test board or the test fixture can be completed in one test device, only one test device needs to be connected; when the test requirements or specifications of the test board or the test tool cannot be completed in one test device, a plurality of test devices can be connected.
The implementation of the embodiment of the invention has the following beneficial effects: computer equipment passes through communication interface with test equipment in this test system and is connected, test equipment passes through to survey test panel and/or test fixture and pencil is connected, decompose the basic data of storage through computer equipment and obtain production data, and whether the product test data to the pencil test carry out analysis judgement test qualified, realize testing a plurality of products simultaneously or a plurality of test equipment joint test, the automatic processing of test data and test result, test equipment's high-usage, the expansibility is good and efficient.
Preferably, the computer device further comprises an ERP system, and the ERP system is configured to generate a scheduling plan of the wiring harness product, and send production data of the wiring harness product to the wiring harness test device according to the scheduling plan.
Specifically, the ERP system is adopted to divide the scheduling plan, so that the operation is convenient and quick, and the data is convenient to call; in the later stage, other processing functions of the computer equipment can be integrated into a processing module of the ERP system, so that the integration level is higher, and the data is more complete.
Preferably, one test board or one test fixture is connected with a plurality of wire harness test devices.
Preferably, the communication interface is an RS232 communication interface.
Particularly, the RS232 communication interface has high universality and convenient use, and is more suitable for popularization and operation of the system.
As shown in fig. 2, an embodiment of the present invention provides a multi-beam testing method, including the following steps:
acquiring basic data and a scheduling plan of a wire harness product;
acquiring production data generated according to basic data and a production scheduling plan of the wire harness product;
sending the production data to a wire harness testing device according to the scheduling plan;
and acquiring product test data of the test equipment, and analyzing whether the product test data is qualified.
Specifically, the basic data of the wire harness product is a drawing of the product, and is generally provided by a customer; the scheduling plan is determined according to time requirements of customers, use of company test equipment and other factors; generating data according to the basic data and the scheduling plan, wherein the production data comprises a test drawing of a wire harness product, a binding graph of a test board and/or a binding graph and connection relation data of a test tool; the test equipment tests according to the received production data and feeds back the product test data to the system; and the system contrasts and analyzes whether the product test data are qualified or not according to the test standard of the product.
Preferably, the acquiring production data generated according to the basic data and the scheduling plan of the bundle product includes:
acquiring a test drawing generated by the basic data;
and acquiring a wiring diagram of the test board and/or a wiring diagram and wiring relation data of the test tool generated by the test drawing and the scheduling plan.
It can be seen that the contents in the above system embodiments are all applicable to the method embodiments, the functions specifically implemented by the method embodiments are the same as those of the above system embodiments, and the beneficial effects achieved by the method embodiments are also the same as those achieved by the above system embodiments.
As shown in fig. 3, another multi-beam testing system according to an embodiment of the present invention includes:
the first acquisition module is used for acquiring basic data and a scheduling plan of the wire harness product;
the second acquisition module is used for acquiring production data generated according to basic data and a production scheduling plan of the wire harness product;
the sending module is used for sending the production data to the wire harness testing equipment according to the scheduling plan;
and the analysis module is used for acquiring the product test data of the test equipment and analyzing whether the product test data is qualified or not.
Preferably, the second obtaining module includes:
a first generation unit configured to acquire a test drawing generated from the basic data;
and the second generation unit is used for acquiring the wiring diagram of the test board and/or the wiring diagram and the wiring relation data of the test tool generated by the test drawing and the scheduling plan.
It can be seen that the contents in the foregoing method embodiments are all applicable to this system embodiment, the functions specifically implemented by this system embodiment are the same as those in the foregoing method embodiment, and the advantageous effects achieved by this system embodiment are also the same as those achieved by the foregoing method embodiment.
As shown in fig. 4, an embodiment of the present invention provides a multi-beam testing apparatus, including:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the multi-beam testing method described above.
It can be seen that the contents in the foregoing method embodiments are all applicable to this apparatus embodiment, the functions specifically implemented by this apparatus embodiment are the same as those in the foregoing method embodiment, and the advantageous effects achieved by this apparatus embodiment are also the same as those achieved by the foregoing method embodiment.
Furthermore, the embodiment of the present invention also provides a storage medium, in which processor-executable instructions are stored, and the processor-executable instructions are used for executing the multi-beam testing method when being executed by a processor. Likewise, the contents of the above method embodiments are all applicable to the present storage medium embodiment, the functions specifically implemented by the present storage medium embodiment are the same as those of the above method embodiments, and the advantageous effects achieved by the present storage medium embodiment are also the same as those achieved by the above method embodiments.
While the preferred embodiments of the present invention have been illustrated and described, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (6)
1. A multi-beam test system, comprising:
the computer equipment is used for storing, decomposing, receiving and analyzing the test files; the test file comprises basic data, production data and product test data; the basic data comprises a drawing of a wire harness product; the production data comprises a test drawing of a wire harness product, a binding graph of a test board and/or a binding graph and connection relation data of a test tool, and the conduction relation, the conduction impedance and the withstand voltage value of the wire harness; the product test data comprises a wiring harness conduction relation and technical parameters measured by test equipment; the computer equipment further comprises an ERP system, wherein the ERP system is used for generating a production scheduling plan of the wiring harness product and sending production data of the wiring harness product to wiring harness testing equipment according to the production scheduling plan;
the wire harness testing equipment is used for testing technical parameters of the wire harness;
the test boards and/or the test tools are used for connecting the wire harness and the wire harness test equipment; one test board or one test tool is connected with a plurality of wire harness test devices;
and the computer equipment is connected with the wiring harness testing equipment through a communication interface.
2. The multi-wiring-beam test system of claim 1, wherein the communication interface is an RS232 communication interface.
3. A multi-beam testing method, comprising the steps of:
acquiring basic data and a scheduling plan of a wire harness product; the scheduling plan is obtained through an ERP system;
acquiring production data generated according to basic data and a production scheduling plan of the wire harness product; the production data comprises a test drawing of a wire harness product, a binding graph of a test board and/or a binding graph and connection relation data of a test tool; the method specifically comprises the following steps: acquiring a test drawing generated by the basic data; acquiring a wiring diagram of a test board and/or a wiring diagram and wiring relation data of a test tool generated by the test drawing and the scheduling plan;
sending the production data to a wire harness testing device according to the scheduling plan; the wire harness test equipment is connected with a wire harness through a test board and/or a test tool, and one test board or one test tool is connected with a plurality of wire harness test equipment;
acquiring product test data of the wire harness test equipment, and analyzing whether the product test data is qualified or not; the product test data includes harness continuity relationships and technical parameters measured by the test equipment.
4. A multi-beam test system, comprising:
the first acquisition module is used for acquiring basic data and a scheduling plan of the wire harness product; the scheduling plan is obtained through an ERP system;
the second acquisition module is used for acquiring production data generated according to basic data and a production scheduling plan of the wire harness product; the production data comprises a test drawing of a wire harness product, a binding graph of a test board and/or a binding graph and connection relation data of a test tool; the method specifically comprises the following steps: acquiring a test drawing generated by the basic data; acquiring a wiring diagram of a test board and/or a wiring diagram and wiring relation data of a test tool generated by the test drawing and the scheduling plan;
the sending module is used for sending the production data to the wire harness testing equipment according to the scheduling plan; the wire harness test equipment is connected with a wire harness through a test board and/or a test tool, and one test board or one test tool is connected with a plurality of wire harness test equipment;
the analysis module is used for acquiring product test data of the wire harness test equipment and analyzing whether the product test data is qualified or not; the product test data includes harness conduction relationships and technical parameters measured by test equipment.
5. A multi-wire-bundle testing apparatus, comprising:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to implement the multi-beam testing method of claim 3.
6. A storage medium having stored therein processor-executable instructions, which when executed by a processor are for performing the multi-wire-bundle testing method of claim 3.
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| CN110850337A (en) | 2020-02-28 |
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Denomination of invention: A multi wire harness testing system, method, device, and storage medium Effective date of registration: 20230410 Granted publication date: 20220927 Pledgee: Industrial and Commercial Bank of China Limited Guangzhou Liwan Branch Pledgor: JINHONG ELECTRONICS CO.,LTD. Registration number: Y2023980037689 |