CN208432695U - A kind of high temperature ageing test macro - Google Patents
A kind of high temperature ageing test macro Download PDFInfo
- Publication number
- CN208432695U CN208432695U CN201821125851.9U CN201821125851U CN208432695U CN 208432695 U CN208432695 U CN 208432695U CN 201821125851 U CN201821125851 U CN 201821125851U CN 208432695 U CN208432695 U CN 208432695U
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- test
- aging room
- temperature aging
- switching device
- measured piece
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Abstract
The utility model provides a kind of high temperature ageing test macro, belongs to degradation testing technique field.The system includes high-temperature aging room and the test device outside the high-temperature aging room, and the high-temperature aging room side wall is equipped with electric connector, and the electric connector is electrically connected with measured piece and connection wiring harness respectively;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room, and the switching device is used to each measured piece being connected to test device;The test device control connects the switching device.The utility model can carry out high-temperature process to multiple measured pieces simultaneously in high-temperature aging room, then measured piece is flexibly switched by switching device, test device is set to scan all connection wiring harnesses within a very short time, test result is completely tested and saved to the function of each measured piece, energy consumption can be effectively reduced, improve testing efficiency.
Description
Technical field
The utility model relates to a kind of high temperature ageing test macros, belong to degradation testing technique field.
Background technique
Electronic product can all carry out high temperature ageing test before factory, can filter out therein do not conform to by burn-in test
Lattice product avoid rejected product from flowing into client's hand.
Traditional ageing testing method mostly uses following two mode: (1) by after measured piece high-temperature storage, from burn-in chamber
Middle taking-up, and tested immediately;(2) test equipment and measured piece are all put into burn-in chamber, a measured piece configures one
Test equipment carries out real-time testing.But above two method all comes with some shortcomings: in method (1), measured piece high-temperature storage
Afterwards, temperature is higher, and measured piece of taking may burn operator;In method (2), test equipment is put into burn-in chamber, for a long time
Hot operation is likely to result in test equipment damage.
Publication No. is 103823171 A of CN, entitled " a kind of integrated circuit high temperature aging testing system and high temperature
The patent application document of ageing testing method " discloses a kind of integrated circuit high temperature aging testing system, including host computer, survey
Instrument and mechanical arm are tried, the tester master control borad of the system is located at outside high temperature ageing device, for controlling high temperature ageing device pair
It is put into measured piece therein to be tested, and outputs test result to host computer, taken out and be tested using mechanical arm after the completion of test
Part.This system obviates artificial pickups the case where operator is surprisingly burned easily occurs, and by setting tester master control borad
It sets outside high temperature ageing device, prevents its hot operation from damaging;But it when the system carries out burn-in test, can only once survey
A measured piece is tried, energy consumption is high, testing efficiency is low.
Utility model content
The purpose of the utility model is to provide a kind of high temperature ageing test macros, carry out burn-in test at present to solve
When, the low problem of energy consumption height, testing efficiency.
To achieve the above object, the utility model provides a kind of high temperature ageing test macro, including high-temperature aging room and position
Test device outside the high-temperature aging room, the high-temperature aging room side wall are equipped with electric connector, the electric connector
It is electrically connected respectively with measured piece and connection wiring harness;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room
It connects, the switching device is used to each measured piece being connected to test device;The test device control connects the switching device.
As a kind of improvement to above-mentioned high temperature ageing test macro, the switching device is by least two relay groups
At each relay connects test device connection wiring harness corresponding with its.
The beneficial effects of the utility model are: high-temperature process can be carried out to multiple measured pieces simultaneously in high-temperature aging room,
Then measured piece is flexibly switched by switching device, test device is allow to scan all connection wiring harnesses within a very short time, it is right
Test result is completely tested and saved to the function of each measured piece, and energy consumption can be effectively reduced, improve testing efficiency.
Detailed description of the invention
Fig. 1 is a kind of high temperature ageing test system structure schematic diagram of the utility model.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and specifically
The present invention will be further described in detail for embodiment.
Fig. 1 is a kind of high temperature ageing test system structure schematic diagram of the utility model, as shown in the figure: a kind of high temperature ageing survey
Test system, switching device, test device including high-temperature aging room and outside high-temperature aging room;The test device control
Connect the switching device.
High-temperature aging room side wall is equipped with n electric connector, is equipped with n relay inside switching device;High-temperature aging room
N interior measured piece is electrically connected with corresponding electric connector, and each electric connector passes through connection wiring harness and corresponding relay electricity
Connection, each relay are electrically connected with test device, n >=2.
In the present embodiment, electric connector high temperature resistant.
When high temperature ageing is tested, high-temperature aging room carries out high-temperature process to multiple measured pieces simultaneously;Then, switching device exists
Under test device control, the switch by being closed corresponding relay accesses different measured pieces every time;Test device quickly scans
All connection wiring harnesses completely test the function of each measured piece and save test result.
The utility model can carry out high-temperature process to multiple measured pieces simultaneously in high-temperature aging room, then pass through switching dress
Flexibly switching measured piece is set, so that test device is scanned all connection wiring harnesses within a very short time, to the function of each measured piece
It can be carried out and completely test and save test result, energy consumption can be effectively reduced, improve testing efficiency.
Be presented above the utility model relates to specific embodiment, but the utility model is not limited to described reality
Apply mode.Under the thinking that the utility model provides, to above-mentioned by the way of being readily apparent that those skilled in the art
Technological means in embodiment is converted, is replaced, is modified, and play the role of and the utility model in relevant art hand
The purpose of utility model that section is essentially identical, realizes is also essentially identical, and the technical solution formed in this way is carried out to above-described embodiment
What fine tuning was formed, this technical solution is still fallen in the protection scope of the utility model.
Claims (2)
1. a kind of high temperature ageing test macro, the test device including high-temperature aging room and outside the high-temperature aging room,
It is characterized by: the high-temperature aging room side wall be equipped with electric connector, the electric connector respectively with measured piece and connecting line
Beam electrical connection;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room, and the switching device is used for will
Each measured piece is connected to test device;The test device control connects the switching device.
2. high temperature ageing test macro according to claim 1, it is characterised in that: the switching device by least two after
Electric appliance composition, each relay connect test device connection wiring harness corresponding with its.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201821125851.9U CN208432695U (en) | 2018-07-16 | 2018-07-16 | A kind of high temperature ageing test macro |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201821125851.9U CN208432695U (en) | 2018-07-16 | 2018-07-16 | A kind of high temperature ageing test macro |
Publications (1)
Publication Number | Publication Date |
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CN208432695U true CN208432695U (en) | 2019-01-25 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201821125851.9U Expired - Fee Related CN208432695U (en) | 2018-07-16 | 2018-07-16 | A kind of high temperature ageing test macro |
Country Status (1)
Country | Link |
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CN (1) | CN208432695U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109870620A (en) * | 2019-02-25 | 2019-06-11 | 浙江极智通信科技股份有限公司 | The high and low temperature test method and system of communication equipment with network interface |
CN110850337A (en) * | 2019-10-24 | 2020-02-28 | 广州市槿泓电子有限公司 | Multi-wire-bundle testing system, method, device and storage medium |
-
2018
- 2018-07-16 CN CN201821125851.9U patent/CN208432695U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109870620A (en) * | 2019-02-25 | 2019-06-11 | 浙江极智通信科技股份有限公司 | The high and low temperature test method and system of communication equipment with network interface |
CN110850337A (en) * | 2019-10-24 | 2020-02-28 | 广州市槿泓电子有限公司 | Multi-wire-bundle testing system, method, device and storage medium |
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190125 Termination date: 20210716 |
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CF01 | Termination of patent right due to non-payment of annual fee |