CN208432695U - A kind of high temperature ageing test macro - Google Patents

A kind of high temperature ageing test macro Download PDF

Info

Publication number
CN208432695U
CN208432695U CN201821125851.9U CN201821125851U CN208432695U CN 208432695 U CN208432695 U CN 208432695U CN 201821125851 U CN201821125851 U CN 201821125851U CN 208432695 U CN208432695 U CN 208432695U
Authority
CN
China
Prior art keywords
test
aging room
temperature aging
switching device
measured piece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201821125851.9U
Other languages
Chinese (zh)
Inventor
顾帅旗
汪世伟
古伟鹏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Henan Senyuan Heavy Industry Co Ltd
Original Assignee
Henan Senyuan Heavy Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Henan Senyuan Heavy Industry Co Ltd filed Critical Henan Senyuan Heavy Industry Co Ltd
Priority to CN201821125851.9U priority Critical patent/CN208432695U/en
Application granted granted Critical
Publication of CN208432695U publication Critical patent/CN208432695U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The utility model provides a kind of high temperature ageing test macro, belongs to degradation testing technique field.The system includes high-temperature aging room and the test device outside the high-temperature aging room, and the high-temperature aging room side wall is equipped with electric connector, and the electric connector is electrically connected with measured piece and connection wiring harness respectively;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room, and the switching device is used to each measured piece being connected to test device;The test device control connects the switching device.The utility model can carry out high-temperature process to multiple measured pieces simultaneously in high-temperature aging room, then measured piece is flexibly switched by switching device, test device is set to scan all connection wiring harnesses within a very short time, test result is completely tested and saved to the function of each measured piece, energy consumption can be effectively reduced, improve testing efficiency.

Description

A kind of high temperature ageing test macro
Technical field
The utility model relates to a kind of high temperature ageing test macros, belong to degradation testing technique field.
Background technique
Electronic product can all carry out high temperature ageing test before factory, can filter out therein do not conform to by burn-in test Lattice product avoid rejected product from flowing into client's hand.
Traditional ageing testing method mostly uses following two mode: (1) by after measured piece high-temperature storage, from burn-in chamber Middle taking-up, and tested immediately;(2) test equipment and measured piece are all put into burn-in chamber, a measured piece configures one Test equipment carries out real-time testing.But above two method all comes with some shortcomings: in method (1), measured piece high-temperature storage Afterwards, temperature is higher, and measured piece of taking may burn operator;In method (2), test equipment is put into burn-in chamber, for a long time Hot operation is likely to result in test equipment damage.
Publication No. is 103823171 A of CN, entitled " a kind of integrated circuit high temperature aging testing system and high temperature The patent application document of ageing testing method " discloses a kind of integrated circuit high temperature aging testing system, including host computer, survey Instrument and mechanical arm are tried, the tester master control borad of the system is located at outside high temperature ageing device, for controlling high temperature ageing device pair It is put into measured piece therein to be tested, and outputs test result to host computer, taken out and be tested using mechanical arm after the completion of test Part.This system obviates artificial pickups the case where operator is surprisingly burned easily occurs, and by setting tester master control borad It sets outside high temperature ageing device, prevents its hot operation from damaging;But it when the system carries out burn-in test, can only once survey A measured piece is tried, energy consumption is high, testing efficiency is low.
Utility model content
The purpose of the utility model is to provide a kind of high temperature ageing test macros, carry out burn-in test at present to solve When, the low problem of energy consumption height, testing efficiency.
To achieve the above object, the utility model provides a kind of high temperature ageing test macro, including high-temperature aging room and position Test device outside the high-temperature aging room, the high-temperature aging room side wall are equipped with electric connector, the electric connector It is electrically connected respectively with measured piece and connection wiring harness;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room It connects, the switching device is used to each measured piece being connected to test device;The test device control connects the switching device.
As a kind of improvement to above-mentioned high temperature ageing test macro, the switching device is by least two relay groups At each relay connects test device connection wiring harness corresponding with its.
The beneficial effects of the utility model are: high-temperature process can be carried out to multiple measured pieces simultaneously in high-temperature aging room, Then measured piece is flexibly switched by switching device, test device is allow to scan all connection wiring harnesses within a very short time, it is right Test result is completely tested and saved to the function of each measured piece, and energy consumption can be effectively reduced, improve testing efficiency.
Detailed description of the invention
Fig. 1 is a kind of high temperature ageing test system structure schematic diagram of the utility model.
Specific embodiment
In order to make the purpose of the utility model, technical solutions and advantages more clearly understood, below in conjunction with attached drawing and specifically The present invention will be further described in detail for embodiment.
Fig. 1 is a kind of high temperature ageing test system structure schematic diagram of the utility model, as shown in the figure: a kind of high temperature ageing survey Test system, switching device, test device including high-temperature aging room and outside high-temperature aging room;The test device control Connect the switching device.
High-temperature aging room side wall is equipped with n electric connector, is equipped with n relay inside switching device;High-temperature aging room N interior measured piece is electrically connected with corresponding electric connector, and each electric connector passes through connection wiring harness and corresponding relay electricity Connection, each relay are electrically connected with test device, n >=2.
In the present embodiment, electric connector high temperature resistant.
When high temperature ageing is tested, high-temperature aging room carries out high-temperature process to multiple measured pieces simultaneously;Then, switching device exists Under test device control, the switch by being closed corresponding relay accesses different measured pieces every time;Test device quickly scans All connection wiring harnesses completely test the function of each measured piece and save test result.
The utility model can carry out high-temperature process to multiple measured pieces simultaneously in high-temperature aging room, then pass through switching dress Flexibly switching measured piece is set, so that test device is scanned all connection wiring harnesses within a very short time, to the function of each measured piece It can be carried out and completely test and save test result, energy consumption can be effectively reduced, improve testing efficiency.
Be presented above the utility model relates to specific embodiment, but the utility model is not limited to described reality Apply mode.Under the thinking that the utility model provides, to above-mentioned by the way of being readily apparent that those skilled in the art Technological means in embodiment is converted, is replaced, is modified, and play the role of and the utility model in relevant art hand The purpose of utility model that section is essentially identical, realizes is also essentially identical, and the technical solution formed in this way is carried out to above-described embodiment What fine tuning was formed, this technical solution is still fallen in the protection scope of the utility model.

Claims (2)

1. a kind of high temperature ageing test macro, the test device including high-temperature aging room and outside the high-temperature aging room, It is characterized by: the high-temperature aging room side wall be equipped with electric connector, the electric connector respectively with measured piece and connecting line Beam electrical connection;The connection wiring harness is electrically connected with the switching device being located at outside high-temperature aging room, and the switching device is used for will Each measured piece is connected to test device;The test device control connects the switching device.
2. high temperature ageing test macro according to claim 1, it is characterised in that: the switching device by least two after Electric appliance composition, each relay connect test device connection wiring harness corresponding with its.
CN201821125851.9U 2018-07-16 2018-07-16 A kind of high temperature ageing test macro Expired - Fee Related CN208432695U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821125851.9U CN208432695U (en) 2018-07-16 2018-07-16 A kind of high temperature ageing test macro

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821125851.9U CN208432695U (en) 2018-07-16 2018-07-16 A kind of high temperature ageing test macro

Publications (1)

Publication Number Publication Date
CN208432695U true CN208432695U (en) 2019-01-25

Family

ID=65100101

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201821125851.9U Expired - Fee Related CN208432695U (en) 2018-07-16 2018-07-16 A kind of high temperature ageing test macro

Country Status (1)

Country Link
CN (1) CN208432695U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109870620A (en) * 2019-02-25 2019-06-11 浙江极智通信科技股份有限公司 The high and low temperature test method and system of communication equipment with network interface
CN110850337A (en) * 2019-10-24 2020-02-28 广州市槿泓电子有限公司 Multi-wire-bundle testing system, method, device and storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109870620A (en) * 2019-02-25 2019-06-11 浙江极智通信科技股份有限公司 The high and low temperature test method and system of communication equipment with network interface
CN110850337A (en) * 2019-10-24 2020-02-28 广州市槿泓电子有限公司 Multi-wire-bundle testing system, method, device and storage medium

Similar Documents

Publication Publication Date Title
CN106597142B (en) A kind of automatic testing equipment of SVG power module
CN208432695U (en) A kind of high temperature ageing test macro
CN103176142B (en) A kind of photovoltaic electric station grid connection adaptive testing method
CN209525407U (en) A kind of camera module abnormal detection circuit, device and camera module tester
CN105301518B (en) A kind of energy source feedback type Test System On Power Aging
CN107544001B (en) The insulating test set of spacecraft thermal test cable
CN103076553A (en) Test device for PCBA (printed circuit board assembly)
CN109782732A (en) A kind of half circuit control device test platform in kind
CN110196381A (en) A kind of cable general purpose automatic test system based on cpci bus
CN205139342U (en) Energy repayment type power aging testing system
CN104360265B (en) Multi-switching relay tester
CN201110878Y (en) Aging test system
CN103869114B (en) Manufacturing technology and device for high-voltage high-power adjustable simulative transformer substation
CN106093772A (en) A kind of electrical switch temperature rise detecting system and method
CN205610081U (en) Medium voltage switchgear
CN204789879U (en) Electrified partial discharge test system of switch cabinet and voltage signal extraction device thereof
CN204556744U (en) The detection platform of a kind of APF of 380V electric pressure
CN207832910U (en) A kind of multistage charging aging equipment
CN103149391B (en) A kind of testing jig
CN206132876U (en) Multi -functional earth -leakage protector testboard
CN109917215A (en) A kind of New-energy electric vehicle charging assembly ageing tester
CN104502752B (en) A kind of integrated form simulates electric power experimental provision
CN205643618U (en) Many functional test seat
CN107846192A (en) A kind of online photovoltaic module inspection test device and method of testing
CN205068020U (en) Low pressure simulation SVG high pressure running state's debug system

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20190125

Termination date: 20210716

CF01 Termination of patent right due to non-payment of annual fee