CN110596502A - Surge generation testing device and method based on microcontroller - Google Patents
Surge generation testing device and method based on microcontroller Download PDFInfo
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- CN110596502A CN110596502A CN201910988086.6A CN201910988086A CN110596502A CN 110596502 A CN110596502 A CN 110596502A CN 201910988086 A CN201910988086 A CN 201910988086A CN 110596502 A CN110596502 A CN 110596502A
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- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 238000000034 method Methods 0.000 title description 5
- 230000008878 coupling Effects 0.000 claims abstract description 27
- 238000010168 coupling process Methods 0.000 claims abstract description 27
- 238000005859 coupling reaction Methods 0.000 claims abstract description 27
- 230000003993 interaction Effects 0.000 claims abstract description 11
- 238000002955 isolation Methods 0.000 claims abstract description 7
- 239000003990 capacitor Substances 0.000 claims description 72
- 230000005669 field effect Effects 0.000 claims description 51
- 239000013078 crystal Substances 0.000 claims description 11
- 229910052715 tantalum Inorganic materials 0.000 claims description 6
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 6
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- 230000009286 beneficial effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16528—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values using digital techniques or performing arithmetic operations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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Abstract
The invention discloses a surge generation testing device and a testing method based on a microcontroller, wherein the device comprises a microcontroller circuit consisting of a reset circuit, a clock circuit, a filter circuit and the microcontroller; comprises a micro-control system power supply circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit and a man-machine interaction circuit, wherein the man-machine interaction circuit comprises a mode selection key and a trigger key; the invention meets the requirement of carrying out instant voltage surge resistance test on electric equipment, has the characteristics of compact circuit structure, simple system operation, low cost, high cost performance and good stability, and solves the problems of complex structure, high design cost and complex programming of the existing surge test system. Can meet the test requirements of the undervoltage surge (9V/50 mS/1S, 6V/50 mS/1S) and the overvoltage surge (80V/50mS/1S, 100V/50 mS/1S).
Description
Technical Field
The invention relates to a device for testing voltage surge resistance of electric equipment, in particular to a microcontroller-based surge generation testing device and a testing method.
Background
Surges are also known as surges, and as the name suggests, are transient under-or over-voltages that exceed the normal operating voltage, and variations in certain characteristics from a controlled steady-state value caused by self-regulation of the power system and corrective action of the regulator. The national military standard GJB181-86 requires voltage surge resistance test on electric equipment, and when the electric equipment is subjected to surge voltage, the equipment can normally work or does not have faults, so the surge generating device is particularly urgent to test the electric equipment for instantaneous undervoltage or overvoltage. In the prior art, a testing device mainly comprises a programming pulse sequence and high-level pattern analysis software, and is complex in structure, high in design cost and complex in programming.
Disclosure of Invention
In view of the prior art and the problems thereof, the present invention provides a surge generation testing device and a testing method based on a microcontroller. The device has the advantages of compact circuit structure, simple system operation, high cost performance and good stability, can meet the application requirements, and solves the problems of complex structure, high design cost and complex programming of the existing surge testing system.
The technical scheme adopted by the invention is as follows: the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
The microcontroller adopts an ATmega8 chip N2, a pin 6 of the chip N2 is connected with a pin 4 of an external active crystal oscillator G1, a pin 7 is connected with a pin 3 of an active crystal oscillator G1 through a capacitor C10, and a pin 2 of the active crystal oscillator G1 is grounded; the man-machine interaction circuit comprises a trigger key and a mode selection key, and the connection relationship of the trigger key circuit is as follows: the positive input end of the diode D2 is connected with the capacitor C19, the inductor L4, the capacitor C20 and the resistor R42 and is also connected with the PD3 port of the chip N2, and the other ends of the capacitor C19 and the capacitor C20 are grounded; the forward output end of the diode D2 is connected with one end of a single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the forward input end of a diode D1 is connected with a capacitor C17, an inductor L3 and a capacitor C16, a resistor R43 is connected with a PD2 port of a chip N2, the other ends of the capacitor C16 and the capacitor C17 are grounded, the forward output end of a diode D1 is connected with one end of a single-pole double-throw switch S2, the common end of the single-pole double-throw switch S2 is connected with one end of the resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded; the mode selection key circuit connection relationship is as follows: the PB0 port, the PB1 port and the PB2 interface of the chip N2 are respectively connected with the 6 pin, the 5 pin and the 4 pin of the dial switch JP2, the 1 pin, the 2 pin and the 3 pin of the dial switch JP2 are respectively connected with a resistor R31, a resistor R30 and a resistor R29, and the other ends of the resistor R31, the resistor R30 and the resistor R29 are grounded; the PB0 port, the PB1 port and the PB2 port of the chip N2 are further connected with a resistor R32, a resistor R33 and a resistor R34, and the other ends of the resistor R32, the resistor R33 and the resistor R34 are connected with VCC; the PB3 port of the chip N2 is connected with the 4 pin of the connector J1, the PB4 port is connected with the 1 pin of the connector J1, the PB5 port is connected with the 3 pin of the connector J1, the 5 pin of the connector J1 is connected with one end of the toggle switch S1, and the other end of the toggle switch S1 and the 6 pin of the connector J1 are respectively grounded; the pin 20 of the chip N2 is grounded through a capacitor C22.
The micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5; pins 1 and 8 of the chip N1 are connected with two ends of the capacitor C4, meanwhile, the pin 8 is connected with one end of the inductor L1 and the cathode of the diode D8, and the anode of the diode D8 is grounded; the other end of the inductor L1 is connected with the 4 pins of the chip N1 through a resistor R3 and then is grounded through a resistor R4; meanwhile, the other end of the inductor L1 is connected with the anode of the diode D9, the cathode of the diode D9 is connected with the anode of the light-emitting diode LED1 through the resistor R5, the cathode of the diode D9 is connected with the anode of the tantalum capacitor C6, and the cathode of the tantalum capacitor C6 is connected with the cathode of the light-emitting diode LED1 and then grounded.
The first photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N3, and the connection relationship is as follows: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; the 3 pins and the 4 pins are respectively connected with the forward output end and the input end of a voltage regulator tube VD8, meanwhile, the forward input end of the voltage regulator tube VD8 is connected with a resistor R15 and a capacitor C21 in parallel, one end of the resistor R16 is connected with a capacitor C21, and the other end of the resistor R16 is grounded.
The connection relationship of the undervoltage surge generating circuit is as follows: the positive input end of the voltage-stabilizing tube VD8 is also respectively connected with the resistor R17, the grid electrode of the field-effect tube Q4, the resistor R35 and the grid electrode of the field-effect tube Q2; the drains of the field effect transistor Q4 and the field effect transistor Q2 are connected with the positive input end of the diode D3; a resistor R36 and a resistor R37 are respectively connected between the grid electrodes and the source electrodes of the field effect transistors Q4 and Q2; the source electrodes of the field-effect tube Q4 and the field-effect tube Q2 are connected with the positive output end of the voltage-regulator tube VD 8; the positive output end of the voltage-stabilizing tube VD8 is also connected with the input end of power voltage + Vin; the forward output ends of the diode D3 and the diode D4 are connected with a + Vout end, the forward input end of the diode D4 is connected with a 6V/9V undervoltage input end, the undervoltage input end is also connected with a resistor R18 and the forward input end of the light-emitting diode LED2, and the forward output end of the light-emitting diode LED2 is grounded.
The second photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N4, and the connection relationship is as follows: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; the 3 pins and the 4 pins are respectively connected with the forward output end and the input end of a voltage regulator tube VD10, meanwhile, the forward input end of the voltage regulator tube VD10 is connected with a resistor R20 and a capacitor C22 in parallel, one end of the resistor R21 is connected with a capacitor C22, and the other end of the resistor R21 is grounded.
The overvoltage surge generating circuit of the invention has the following connection relationship: the forward output end of the voltage-stabilizing tube VD10 is also respectively connected with a resistor R22, a grid electrode of a field-effect tube Q1, a resistor R36 and a grid electrode of a field-effect tube Q3; the drains of the field effect transistor Q1 and the field effect transistor Q3 are connected with the positive input end of the diode D5; a resistor R38 and a resistor R39 are respectively connected between the grid and the source of the field effect transistor Q1 and the field effect transistor Q3; the source electrodes of the field-effect tube Q1 and the field-effect tube Q3 are connected with the positive output end of the voltage-regulator tube VD 10; the positive output end of the voltage-stabilizing tube VD10 is also connected with an 80V/100V overvoltage input end; the forward output ends of the diode D5 and the diode D6 are connected with a + Vout end, the forward input end of the diode D6 is connected with a power supply voltage input end + Vin, the overvoltage input end is further connected with a resistor R23 and the forward input end of the light-emitting diode LED3, and the forward output end of the light-emitting diode LED3 is grounded.
The invention relates to a testing method of a surge generation testing device based on a microcontroller, which is characterized by comprising the following steps: the test method comprises the following steps:
(1) and correctly connecting the surge generation testing device according to the testing requirement.
(2) And setting the corresponding button of the surge generation testing device panel according to the testing requirement.
(3) Under the premise of correct setting, sequentially turning on an AC/DC power supply for normal operation, an AC/DC power supply for undervoltage surge operation or an AC/DC power supply for overvoltage surge operation, and observing an indicator lamp on a panel; when the AC/DC power supply for normal work is turned on, the lamp is controlled to be lightened; when the AC/DC power supply for the undervoltage surge work or the AC/DC power supply for the overvoltage surge work is turned on, the corresponding undervoltage surge work pilot lamp or the corresponding overvoltage surge work pilot lamp is turned on.
(4) Connecting the tested module of the electric equipment, enabling the gear of the toggle switch K to be connected, pressing the undervoltage surge working switch or the overvoltage surge working switch once according to requirements, and carrying out corresponding single surge test; and comparing the level change of the second channel of the oscilloscope with the corresponding specification of the electrical performance index of the tested module of the electric equipment to judge whether the tested module of the electric equipment meets the requirement required to be met.
(5) And after the test is finished, the gear of the toggle switch K is switched off, the tested module is taken down, and the test is finished.
(6) Repeating the step (4) and the step (5) for the tested modules of the electric equipment with the same test requirements; otherwise, the surge generation testing device updates the setting after the next step is finished.
(7) After the test is finished, the gear of the toggle switch K is turned off, the button A, B, C, D, E is bounced in sequence, the AC/DC power supply for undervoltage surge work or the AC/DC power supply for overvoltage surge work and the AC/DC power supply for normal work are closed in sequence, and the surge generation test device is taken down.
The micro-control system power supply circuit is used for providing a stable power supply for the micro-controller module; the microcontroller circuit responds to the panel instruction and accurately transmits the instruction to the under-voltage and over-voltage surge generating module; the man-machine interaction circuit is used for setting an under/over voltage surge test mode, initiating a surge action request, and completing operations such as surge mode selection, surge action triggering and the like on the panel; the weak strong current isolation circuit is connected with the microcontroller and is used for isolating weak current from strong current; the under-voltage surge generating circuit and the overvoltage surge generating circuit are connected with the weak strong current isolating circuit and used for generating actual surge actions.
The invention has the beneficial effects that: the invention meets the requirement of carrying out instant voltage surge resistance test on electric equipment, has the characteristics of compact circuit structure, simple system operation, low cost, high cost performance and good stability, and solves the problems of complex structure, high design cost and complex programming of the existing surge test system. Can meet the test requirements of the undervoltage surge (9V/50 mS/1S, 6V/50 mS/1S) and the overvoltage surge (80V/50mS/1S, 100V/50 mS/1S).
Drawings
FIG. 1 is a schematic block diagram of a microcontroller-based surge generation testing device according to the present invention;
FIG. 2 is a schematic diagram of a power supply circuit of the micro-control system of FIG. 1;
FIG. 3 is a schematic diagram of the microcontroller circuit and human-computer interaction circuit of FIG. 1;
FIG. 4 is a schematic diagram of a first photoelectric coupling circuit and an under-voltage surge generating circuit in FIG. 1;
FIG. 5 is a schematic diagram of a second optocoupler circuit and an overvoltage surge generating circuit in FIG. 1;
FIG. 6 is a schematic diagram of the undervoltage test connection of the surge generation testing device based on the microcontroller according to the present invention;
FIG. 7 is a schematic diagram of an overvoltage test connection of the microcontroller-based surge generation testing apparatus of the present invention;
fig. 8 is a schematic diagram of a microcontroller-based surge generation testing device panel of the present invention.
Detailed Description
The invention is further illustrated by the following figures and examples.
As shown in fig. 1, the apparatus includes a microcontroller circuit composed of a reset circuit, a clock circuit, a filter circuit, and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
As shown in fig. 2, the micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5; pins 1 and 8 of the chip N1 are connected with two ends of the capacitor C4, meanwhile, the pin 8 is connected with one end of the inductor L1 and the cathode of the diode D8, and the anode of the diode D8 is grounded; the other end of the inductor L1 is connected with the 4 pins of the chip N1 through a resistor R3 and then is grounded through a resistor R4; meanwhile, the other end of the inductor L1 is connected with the anode of the diode D9, the cathode of the diode D9 is connected with the anode of the light-emitting diode LED1 through the resistor R5, the cathode of the diode D9 is connected with the anode of the tantalum capacitor C6, and the cathode of the tantalum capacitor C6 is connected with the cathode of the light-emitting diode LED1 and then grounded.
The micro-control system power supply circuit uses a BUCK type integrated control chip MAX5035B with the input end capable of bearing 76V input voltage to perform voltage stabilization processing, so that the micro-control system power supply circuit has extremely strong input end voltage adaptability; the diode D7 is arranged to enable the power supply circuit to have reverse connection prevention capability, so that the probability of damaging the surge generation testing device due to misoperation is reduced. The chip N1 outputs stable 5V voltage, and provides reliable drive for the micro control system.
As shown in fig. 3, the microcontroller adopts an ATmega8 chip N2, pin 6 of the chip N2 is connected with pin 4 of an external active crystal oscillator G1, pin 7 is connected with pin 3 of an active crystal oscillator G1 through a capacitor C10, and pin 2 of the active crystal oscillator G1 is grounded; the man-machine interaction circuit comprises a trigger key and a mode selection key, and the connection relationship of the trigger key circuit is as follows: the positive input end of the diode D2 is connected with the capacitor C19, the inductor L4, the capacitor C20 and the resistor R42 and is also connected with the PD3 port of the chip N2, and the other ends of the capacitor C19 and the capacitor C20 are grounded; the forward output end of the diode D2 is connected with one end of a single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the forward input end of a diode D1 is connected with a capacitor C17, an inductor L3 and a capacitor C16, a resistor R43 is connected with a PD2 port of a chip N2, the other ends of the capacitor C16 and the capacitor C17 are grounded, the forward output end of a diode D1 is connected with one end of a single-pole double-throw switch S2, the common end of the single-pole double-throw switch S2 is connected with one end of the resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded; the mode selection key circuit connection relationship is as follows: the PB0 port, the PB1 port and the PB2 interface of the chip N2 are respectively connected with the 6 pin, the 5 pin and the 4 pin of the dial switch JP2, the 1 pin, the 2 pin and the 3 pin of the dial switch JP2 are respectively connected with a resistor R31, a resistor R30 and a resistor R29, and the other ends of the resistor R31, the resistor R30 and the resistor R29 are grounded; the PB0 port, the PB1 port and the PB2 port of the chip N2 are further connected with a resistor R32, a resistor R33 and a resistor R34, and the other ends of the resistor R32, the resistor R33 and the resistor R34 are connected with VCC; the PB3 port of the chip N2 is connected with the 4 pin of the connector J1, the PB4 port is connected with the 1 pin of the connector J1, the PB5 port is connected with the 3 pin of the connector J1, the 5 pin of the connector J1 is connected with one end of the toggle switch S1, and the other end of the toggle switch S1 and the 6 pin of the connector J1 are respectively grounded; the pin 20 of the chip N2 is grounded through a capacitor C22.
The microcontroller circuit is a minimum system consisting of an ATmega8 chip and peripheral reset and anti-interference circuits, a system clock is provided by an external active crystal oscillator, the frequency of the system clock is ensured to be stable, and an accurate time reference is provided for a timer in the microcontroller so as to accurately control the time of surge; the man-machine interaction panel consists of a dial switch JP2, a single-pole double-throw switch S2 and a single-pole double-throw switch S3. The method comprises the steps that a needed surge generation mode can be selected through a dial switch JP2, after a tester sets the needed mode, a microcontroller identifies and enters a waiting mode after identification is finished, when a single-pole double-throw switch S2 or a single-pole double-throw switch S3 initiates a surge action request, the microcontroller enters a response mode from the waiting mode, the initiated surge action request is sent to an under-voltage surge generation circuit and an over-voltage surge generation circuit, an external active crystal oscillator is used for providing an accurate time reference for an internal timer to accurately control the surge generation time, and after the timing time is finished, the microcontroller returns to the waiting mode to wait for the next surge action request.
An ATmega8 microcontroller is selected, is a very special microcontroller, integrates a memory with larger capacity and abundant and powerful hardware interface circuits inside a chip, and has all the performances and characteristics of an AVR high-grade microcontroller MEGE series. Meanwhile, because the small pin package is adopted, the price is low, and due to the in-system programmable characteristic of the ATmega8 microcontroller, the design and development of the embedded system of the microcontroller can be carried out without purchasing expensive simulators and programmers, and the problems of complex structure, high design cost and complex programming of the existing surge testing system are solved.
As shown in fig. 4, the first photocoupler circuit adopts AQY212EHA photocoupler N3, and the connection relationship is: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD8, meanwhile, the forward input end of the voltage regulator tube VD8 is connected with a resistor R15 and a capacitor C21 in parallel, one end of the resistor R16 is connected with a capacitor C21, and the other end of the resistor R16 is grounded; the connection relationship of the undervoltage surge generating circuit is as follows: the positive input end of the voltage-stabilizing tube VD8 is also respectively connected with the resistor R17, the grid electrode of the field-effect tube Q4, the resistor R35 and the grid electrode of the field-effect tube Q2; the drains of the field effect transistor Q4 and the field effect transistor Q2 are connected with the positive input end of the diode D3; a resistor R36 and a resistor R37 are respectively connected between the grid electrodes and the source electrodes of the field effect transistors Q4 and Q2; the source electrodes of the field-effect tube Q4 and the field-effect tube Q2 are connected with the positive output end of the voltage-regulator tube VD 8; the positive output end of the voltage-stabilizing tube VD8 is also connected with the input end of power voltage + Vin; the forward output ends of the diode D3 and the diode D4 are connected with a + Vout end, the forward input end of the diode D4 is connected with a 6V/9V undervoltage input end, the undervoltage input end is also connected with a resistor R18 and the forward input end of the light-emitting diode LED2, and the forward output end of the light-emitting diode LED2 is grounded.
Photoelectric coupling circuit I and under-voltage surge generating circuit theory of operation: when the single-pole double-throw switch S2 initiates a surge action request, a falling edge from high level to low level is generated at the PD2 port of the chip N2 of the microcontroller circuit ATmega8, the chip N2 enters a response mode from a waiting mode after receiving the falling edge, a driving pin 1 of a photoelectric coupler N3 connected with the PC4 port of the chip N2 is set to high level (5V), a light emitting diode in the photoelectric coupler is conducted and emits light through current, the current is conducted after the light is irradiated, the gate-source voltage Vgs of a field effect tube Q2 and a field effect tube Q4 is 0, the field effect tube is cut off, Vout is changed from + Vin to 6V/9V, and under-voltage surge action occurs.
As shown in fig. 5, the second photocoupler circuit adopts AQY212EHA photocoupler N4, and the connection relationship is: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD10, meanwhile, the forward input end of the voltage regulator tube VD10 is connected with a resistor R20 and a capacitor C22 in parallel, one end of the resistor R21 is connected with a capacitor C22, and the other end of the resistor R21 is grounded; the overvoltage surge generating circuit has the following connection relationship: the forward output end of the voltage regulator VD10 is also respectively connected with the resistor R22, the grid of the field effect transistor Q1, the resistor R36 and the grid of the field effect transistor Q3; the drains of the field effect transistor Q1 and the field effect transistor Q3 are connected with the positive input end of the diode D5; a resistor R38 and a resistor R39 are respectively connected between the grid and the source of the field effect transistor Q1 and the field effect transistor Q3; the source electrodes of the field-effect tube Q1 and the field-effect tube Q3 are connected with the positive output end of the voltage-regulator tube VD 10; the positive output end of the voltage-stabilizing tube VD10 is also connected with an 80V/100V overvoltage input end; the forward output ends of the diode D5 and the diode D6 are connected with a + Vout end, the forward input end of the diode D6 is connected with a power supply voltage input end + Vin, the overvoltage input end is further connected with a resistor R23 and the forward input end of the light-emitting diode LED3, and the forward output end of the light-emitting diode LED3 is grounded.
Photoelectric coupling circuit II and overvoltage surge generating circuit theory of operation: when the single-pole double-throw switch S3 initiates a surge action request, a falling edge from high level to low level is generated at the PD3 port of the microcontroller chip N2, the main chip N2 enters a response mode from a waiting mode after receiving the falling edge, a driving pin 1 of a photoelectric coupler N4 connected with the PC0 port of the chip N2 is set to be at high level (5V), a light emitting diode in the photoelectric coupler is conducted, emits light through current, generates current conduction after being illuminated, the gate-source voltage Vgs of the field effect transistor Q1 and the field effect transistor Q3 is 0, the field effect transistor is cut off, Vout + Vin is changed into 80V/100V, and overvoltage surge action occurs.
The weak strong current isolation circuit can accurately transmit the action of the micro-control system to the under-voltage and over-voltage surge generating circuit, simultaneously realize the isolation of weak current and strong current, and effectively eliminate the interference of voltage and current mutation of the strong current part on the micro-control system when the surge occurs; the under-voltage surge generating circuit and the over-voltage surge generating circuit adopt the combination of electronic switches, and the surge action is realized by controlling the enabling end of the electronic switches through a micro-control system.
The testing method of the surge generation testing device based on the microcontroller comprises the following steps:
(1) and correctly connecting the surge generation testing device according to the testing requirement, as shown in fig. 6 and 7.
(2) And setting the corresponding button of the panel of the surge generation testing device according to the testing requirement, as shown in fig. 8.
(3) Under the premise of correct setting, sequentially turning on an AC/DC power supply for normal operation, an AC/DC power supply for undervoltage surge operation or an AC/DC power supply for overvoltage surge operation, and observing an indicator lamp on a panel; when the AC/DC power supply for normal work is turned on, the lamp is controlled to be lightened; when the AC/DC power supply for the under-voltage surge operation or the AC/DC power supply for the overvoltage surge operation is turned on, the corresponding under-voltage surge operation pre-indicating lamp or the overvoltage surge operation pre-indicating lamp is turned on, as shown in fig. 8.
(4) Connecting the tested module of the electric equipment, enabling the gear of the toggle switch K to be connected, pressing the undervoltage surge working switch or the overvoltage surge working switch once according to requirements, and carrying out corresponding single surge test; and comparing the level change of the second channel of the oscilloscope with the corresponding specification of the electrical performance index of the tested module of the electric equipment to judge whether the tested module of the electric equipment meets the requirement required to be met.
(5) And after the test is finished, the gear of the toggle switch K is switched off, the tested module is taken down, and the test is finished.
(6) Repeating the step (4) and the step (5) for the tested modules of the electric equipment with the same test requirements; otherwise, the surge generation testing device updates the setting after the next step is finished.
(7) After the test is finished, the gear of the toggle switch K is turned off, the button A, B, C, D, E is bounced in sequence, the AC/DC power supply for undervoltage surge work or the AC/DC power supply for overvoltage surge work and the AC/DC power supply for normal work are closed in sequence, and the surge generation test device is taken down.
As shown in fig. 8, the meaning and specific setting method represented by the buttons are as follows:
the button A is pressed to represent that the micro-control unit for carrying out undervoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".
The button B is pressed to represent that the micro-control unit for carrying out overvoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".
The combined application of the button C, D, E can realize the setting of under-voltage surge and over-voltage surge test modes;
it is provided here that a button lift represents a "1" and a button press represents a "0". The specific setup method is shown in the following table:
Claims (6)
1. the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
2. A microcontroller-based surge generation test device according to claim 1, wherein: the microcontroller adopts an ATmega8 chip N2, a pin 6 of the chip N2 is connected with a pin 4 of an external active crystal oscillator G1, a pin 7 is connected with a pin 3 of an active crystal oscillator G1 through a capacitor C10, and a pin 2 of the active crystal oscillator G1 is grounded; the man-machine interaction circuit comprises a trigger key and a mode selection key, and the connection relationship of the trigger key circuit is as follows: the positive input end of the diode D2 is connected with the capacitor C19, the inductor L4, the capacitor C20 and the resistor R42 and is also connected with the PD3 port of the chip N2, and the other ends of the capacitor C19 and the capacitor C20 are grounded; the forward output end of the diode D2 is connected with one end of a single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the forward input end of a diode D1 is connected with a capacitor C17, an inductor L3 and a capacitor C16, a resistor R43 is connected with a PD2 port of a chip N2, the other ends of the capacitor C16 and the capacitor C17 are grounded, the forward output end of a diode D1 is connected with one end of a single-pole double-throw switch S2, the common end of the single-pole double-throw switch S2 is connected with one end of the resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded; the mode selection key circuit connection relationship is as follows: the PB0 port, the PB1 port and the PB2 interface of the chip N2 are respectively connected with the 6 pin, the 5 pin and the 4 pin of the dial switch JP2, the 1 pin, the 2 pin and the 3 pin of the dial switch JP2 are respectively connected with a resistor R31, a resistor R30 and a resistor R29, and the other ends of the resistor R31, the resistor R30 and the resistor R29 are grounded; the PB0 port, the PB1 port and the PB2 port of the chip N2 are further connected with a resistor R32, a resistor R33 and a resistor R34, and the other ends of the resistor R32, the resistor R33 and the resistor R34 are connected with VCC; the PB3 port of the chip N2 is connected with the 4 pin of the connector J1, the PB4 port is connected with the 1 pin of the connector J1, the PB5 port is connected with the 3 pin of the connector J1, the 5 pin of the connector J1 is connected with one end of the toggle switch S1, and the other end of the toggle switch S1 and the 6 pin of the connector J1 are respectively grounded; the pin 20 of the chip N2 is grounded through a capacitor C22.
3. A microcontroller-based surge generation test device according to claim 1, wherein:
the micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5; pins 1 and 8 of the chip N1 are connected with two ends of the capacitor C4, meanwhile, the pin 8 is connected with one end of the inductor L1 and the cathode of the diode D8, and the anode of the diode D8 is grounded; the other end of the inductor L1 is connected with the 4 pins of the chip N1 through a resistor R3 and then is grounded through a resistor R4; meanwhile, the other end of the inductor L1 is connected with the anode of the diode D9, the cathode of the diode D9 is connected with the anode of the light-emitting diode LED1 through the resistor R5, the cathode of the diode D9 is connected with the anode of the tantalum capacitor C6, and the cathode of the tantalum capacitor C6 is connected with the cathode of the light-emitting diode LED1 and then grounded.
4. A microcontroller-based surge generation test device according to claim 1 or claim 2, wherein: the first photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N3, and the connection relation is as follows: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD8, meanwhile, the forward input end of the voltage regulator tube VD8 is connected with a resistor R15 and a capacitor C21 in parallel, one end of the resistor R16 is connected with a capacitor C21, and the other end of the resistor R16 is grounded;
the connection relationship of the undervoltage surge generating circuit is as follows: the positive input end of the voltage-stabilizing tube VD8 is also respectively connected with the resistor R17, the grid electrode of the field-effect tube Q4, the resistor R35 and the grid electrode of the field-effect tube Q2; the drains of the field effect transistor Q4 and the field effect transistor Q2 are connected with the positive input end of the diode D3; a resistor R36 and a resistor R37 are respectively connected between the grid electrodes and the source electrodes of the field effect transistors Q4 and Q2; the source electrodes of the field-effect tube Q4 and the field-effect tube Q2 are connected with the positive output end of the voltage-regulator tube VD 8; the positive output end of the voltage-stabilizing tube VD8 is also connected with the input end of power voltage + Vin; the forward output ends of the diode D3 and the diode D4 are connected with a + Vout end, the forward input end of the diode D4 is connected with a 6V/9V undervoltage input end, the undervoltage input end is also connected with a resistor R18 and the forward input end of the light-emitting diode LED2, and the forward output end of the light-emitting diode LED2 is grounded.
5. A microcontroller-based surge generation test device according to claim 1 or claim 2, wherein: the second photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N4, and the connection relation is as follows: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD10, meanwhile, the forward input end of the voltage regulator tube VD10 is connected with a resistor R20 and a capacitor C22 in parallel, one end of the resistor R21 is connected with a capacitor C22, and the other end of the resistor R21 is grounded;
the overvoltage surge generating circuit has the following connection relationship: the forward output end of the voltage-stabilizing tube VD10 is also respectively connected with a resistor R22, a grid electrode of a field-effect tube Q1, a resistor R36 and a grid electrode of a field-effect tube Q3; the drains of the field effect transistor Q1 and the field effect transistor Q3 are connected with the positive input end of the diode D5; a resistor R38 and a resistor R39 are respectively connected between the grid and the source of the field effect transistor Q1 and the field effect transistor Q3; the source electrodes of the field-effect tube Q1 and the field-effect tube Q3 are connected with the positive output end of the voltage-regulator tube VD 10; the positive output end of the voltage-stabilizing tube VD10 is also connected with an 80V/100V overvoltage input end; the forward output ends of the diode D5 and the diode D6 are connected with a + Vout end, the forward input end of the diode D6 is connected with a power supply voltage input end + Vin, the overvoltage input end is further connected with a resistor R23 and the forward input end of the light-emitting diode LED3, and the forward output end of the light-emitting diode LED3 is grounded.
6. A testing method of a surge generation testing device based on a microcontroller is characterized in that: the test method comprises the following steps:
(1) correctly connecting a surge generation testing device according to the testing requirement;
(2) setting a corresponding button of a panel of the surge generation testing device according to the testing requirement;
(3) under the premise of correct setting, sequentially turning on an AC/DC power supply for normal operation, an AC/DC power supply for undervoltage surge operation or an AC/DC power supply for overvoltage surge operation, and observing an indicator lamp on a panel; when the AC/DC power supply for normal work is turned on, the lamp is controlled to be lightened; when the AC/DC power supply for the undervoltage surge work or the AC/DC power supply for the overvoltage surge work is turned on, the corresponding undervoltage surge work pre-indicating lamp or the corresponding overvoltage surge work pre-indicating lamp is turned on;
(4) connecting the tested module of the electric equipment, enabling the gear of the toggle switch K to be connected, pressing the undervoltage surge working switch or the overvoltage surge working switch once according to requirements, and carrying out corresponding single surge test; comparing the level change of the second channel of the oscilloscope with the corresponding rule of the electrical performance index of the tested module of the electric equipment to judge whether the tested module of the electric equipment meets the requirement required to be met;
(5) after the test is finished, the gear of the toggle switch K is turned off, the tested module of the electric equipment is taken down, and the test is finished;
(6) repeating the step (4) and the step (5) for the tested modules of the electric equipment with the same test requirements; otherwise, after the surge generation testing device finishes the next step, the setting is updated;
(7) after the test is finished, the gear of the toggle switch K is turned off, the button A, B, C, D, E is bounced in sequence, the AC/DC power supply for undervoltage surge work or the AC/DC power supply for overvoltage surge work and the AC/DC power supply for normal work are closed in sequence, and the surge generation test device is taken down.
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