CN210982637U - Surge generation testing device based on microcontroller - Google Patents
Surge generation testing device based on microcontroller Download PDFInfo
- Publication number
- CN210982637U CN210982637U CN201921743725.4U CN201921743725U CN210982637U CN 210982637 U CN210982637 U CN 210982637U CN 201921743725 U CN201921743725 U CN 201921743725U CN 210982637 U CN210982637 U CN 210982637U
- Authority
- CN
- China
- Prior art keywords
- circuit
- resistor
- capacitor
- pin
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses a surge generation testing device and a testing method based on a microcontroller, wherein the device comprises a microcontroller circuit consisting of a reset circuit, a clock circuit, a filter circuit and a microcontroller; comprises a micro-control system power supply circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit and a man-machine interaction circuit, wherein the man-machine interaction circuit comprises a mode selection key and a trigger key; the utility model discloses satisfied and carried out withstand voltage surge test requirement in the twinkling of an eye to consumer, had circuit structure compactness, system operation is simple, characteristics with low costs, sexual valence relative altitude, that stability is good, and it is complicated to have solved current surge test system structure, and the design cost is high, the complicated problem of programming. Can meet the test requirements of the undervoltage surge (9V/50 mS/1S, 6V/50 mS/1S) and the overvoltage surge (80V/50mS/1S, 100V/50 mS/1S).
Description
Technical Field
The utility model relates to a test device that consumer withstood voltage surge, more specifically relate to a test device takes place for surge based on microcontroller.
Background
Surges are also known as surges, and as the name suggests, are transient under-or over-voltages that exceed the normal operating voltage, and variations in certain characteristics from a controlled steady-state value caused by self-regulation of the power system and corrective action of the regulator. The national military standard GJB181-86 requires voltage surge resistance test on electric equipment, and when the electric equipment is subjected to surge voltage, the equipment can normally work or does not have faults, so the surge generating device is particularly urgent to test the electric equipment for instantaneous undervoltage or overvoltage. In the prior art, a testing device mainly comprises a programming pulse sequence and high-level pattern analysis software, and is complex in structure, high in design cost and complex in programming.
Disclosure of Invention
In view of the prior art situation and the problems that exist, the utility model provides a testing arrangement takes place for surge based on microcontroller. The device has the advantages of compact circuit structure, simple system operation, high cost performance and good stability, can meet the application requirements, and solves the problems of complex structure, high design cost and complex programming of the existing surge testing system.
The utility model adopts the technical proposal that: the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
The utility model discloses a microcontroller adopts ATmega chip N, chip N 'S6 feet connect the 4 feet of outside active crystal oscillator G, 7 feet pass through electric capacity C and connect active crystal oscillator G' S3 feet, active crystal oscillator G 'S2 feet ground connection, man-machine interaction circuit includes trigger button and mode selection button, trigger button circuit connection is that diode D forward input end connects electric capacity C, inductance 4, electric capacity C, resistance R, and the PD port of chip N links to each other, electric capacity C and electric capacity C' S other end ground connection, diode D 'S forward output end connects the one end of single-pole double-throw switch S, single-pole double-throw switch S public end connecting resistance R' S one end, resistance R other end connects VCC, single-pole double-throw switch S other end ground connection, diode D 'S forward input end connects electric capacity C, inductance 3, electric capacity C, resistance R links to chip N' S PD port, electric capacity C and electric capacity C 'S other end ground connection, diode D' S forward output end connects the one end of single-pole double-throw switch S, single-pole double-throw switch S 'S one end connecting resistance PB, single-pole double-throw switch S' S other end connecting resistance R, single-pole double-throw switch S 'S connecting resistance R' S one end connecting resistance R, single-pole double-throw switch 'S connecting resistance R' S one end connecting resistance R 'S, single-pole double-throw switch PB' S connecting resistance R 'S one end ground connection, single-pole double-throw switch' S, single-pole double-throw switch 'S pin' S connecting resistance R 'S, resistance R' S connecting resistance R 'S, resistance R' S single-pole double-pole.
The utility model discloses a micro-control system power supply circuit adopts MAX5035 DC-DC chip N, the circuit connection relation is that chip N's 7 feet are connected electric capacity C, electric capacity C's one end and diode D's negative pole, diode D's positive pole is micro-control system power supply circuit's input, electric capacity C's other end connect the back ground connection, chip N's 7 feet are connected with 5 feet through resistance R simultaneously, then through resistance R ground connection, chip N's 3 feet and 6 feet are connected the back ground connection, simultaneously 6 feet are connected with 2 feet through electric capacity C again, chip N's 1 feet and 8 feet are connected electric capacity C's both ends, 8 feet are connected inductor 1's one end and diode D's negative pole simultaneously, diode D's positive pole ground connection, inductor 1's the other end is connected with chip N's 4 feet through resistance R, then through resistance R ground connection again, inductor 1's the other end is connected with diode D's positive pole simultaneously, diode D's negative pole is connected with light emitting diode ED's positive pole again through resistance R, diode D's negative pole is connected with tantalum capacitance C's negative pole simultaneously.
First optoelectronic coupling circuit adopt AQY212EHA optoelectronic coupler N3, the relation of connection is: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; the 3 pins and the 4 pins are respectively connected with the forward output end and the input end of a voltage regulator tube VD8, meanwhile, the forward input end of the voltage regulator tube VD8 is connected with a resistor R15 and a capacitor C21 in parallel, one end of the resistor R16 is connected with a capacitor C21, and the other end of the resistor R16 is grounded.
The connection relationship of the undervoltage surge generating circuit of the utility model is that the forward input end of a voltage regulator tube VD8 is respectively connected with a resistor R17, a grid electrode of a field effect tube Q4, a resistor R35 and a grid electrode of a field effect tube Q2, the drain electrodes of the field effect tube Q4 and the field effect tube Q2 are connected with the forward input end of a diode D3, a resistor R36 and a resistor R37 are respectively connected between the grid electrode and the source electrode of the field effect tube Q4 and the Q2, the source electrodes of the field effect tube Q4 and the field effect tube Q2 are connected with the forward output end of the voltage regulator tube 58VD 23, the forward output end of the voltage regulator tube VD8 is also connected with the input end + Vin of the power voltage, the forward output ends of the diode D3 and the diode D4 are connected with the + Vout end, the forward input end of the diode D4 is connected with the 6V/9V undervoltage input end, the forward input end of the undervoltage input end is also connected with.
The second optoelectronic coupling circuit adopt AQY212EHA optoelectronic coupler N4, the connection is: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; the 3 pins and the 4 pins are respectively connected with the forward output end and the input end of a voltage regulator tube VD10, meanwhile, the forward input end of the voltage regulator tube VD10 is connected with a resistor R20 and a capacitor C22 in parallel, one end of the resistor R21 is connected with a capacitor C22, and the other end of the resistor R21 is grounded.
The overvoltage surge generating circuit of the utility model is characterized in that the forward output end of a voltage regulator tube VD10 is respectively connected with a resistor R22, a grid electrode of a field effect tube Q1, a resistor R36 and a grid electrode of a field effect tube Q3, drain electrodes of the field effect tube Q1 and a field effect tube Q3 are connected with the forward input end of a diode D5, the grid electrodes and source electrodes of the field effect tube Q1 and a field effect tube Q3 are respectively connected with a resistor R38 and a resistor R39, source electrodes of the field effect tube Q1 and a field effect tube Q3 are connected with the forward output end of the voltage regulator tube VD10, the forward output end of the voltage regulator tube VD10 is further connected with an 80V/100V overvoltage input end, the forward output ends of a diode D5 and a diode D6 are connected with a + Vout end, the input end of the diode D6 is connected with a forward voltage input end + Vin, the overvoltage input end is further connected with the forward input ends of a resistor R9 and a.
The micro-control system power supply circuit is used for providing a stable power supply for the micro-controller module; the microcontroller circuit responds to the panel instruction and accurately transmits the instruction to the under-voltage and over-voltage surge generating module; the man-machine interaction circuit is used for setting an under/over voltage surge test mode, initiating a surge action request, and completing operations such as surge mode selection, surge action triggering and the like on the panel; the weak strong current isolation circuit is connected with the microcontroller and is used for isolating weak current from strong current; the under-voltage surge generating circuit and the overvoltage surge generating circuit are connected with the weak strong current isolating circuit and used for generating actual surge actions.
The utility model has the advantages that: the utility model discloses satisfied and carried out withstand voltage surge test requirement in the twinkling of an eye to consumer, had circuit structure compactness, system operation is simple, characteristics with low costs, sexual valence relative altitude, that stability is good, and it is complicated to have solved current surge test system structure, and the design cost is high, the complicated problem of programming. Can meet the test requirements of the undervoltage surge (9V/50 mS/1S, 6V/50 mS/1S) and the overvoltage surge (80V/50mS/1S, 100V/50 mS/1S).
Drawings
Fig. 1 is a schematic block diagram of the surge generation testing device based on the microcontroller;
FIG. 2 is a schematic diagram of a power supply circuit of the micro-control system of FIG. 1;
FIG. 3 is a schematic diagram of the microcontroller circuit and human-computer interaction circuit of FIG. 1;
FIG. 4 is a schematic diagram of a first photoelectric coupling circuit and an under-voltage surge generating circuit in FIG. 1;
FIG. 5 is a schematic diagram of a second optocoupler circuit and an overvoltage surge generating circuit in FIG. 1;
fig. 6 is a schematic diagram of the under-voltage test connection of the surge generation testing device based on the microcontroller;
fig. 7 is a schematic diagram of overvoltage test connection of the surge generation testing device based on the microcontroller according to the present invention;
fig. 8 is a schematic diagram of the surge generation testing device panel based on the microcontroller.
Detailed Description
The present invention will be further explained with reference to the drawings and examples.
As shown in fig. 1, the apparatus includes a microcontroller circuit composed of a reset circuit, a clock circuit, a filter circuit, and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
As shown in FIG. 2, the micro-control system power supply circuit adopts a MAX5035 DC-DC chip N, and the circuit connection relationship is that a pin 7 of the chip N is connected with one end of a capacitor C, a capacitor C and a cathode of a diode D, the anode of the diode D is the input end of the micro-control system power supply circuit, the other ends of the capacitor C, the capacitor C and the capacitor C are connected and then grounded, the pin 7 of the chip N is connected with a pin 5 through a resistor R and then grounded through a resistor R, a pin 3 and a pin 6 of the chip N are connected and then grounded, the pin 6 is connected with a pin 2 through a capacitor C, a pin 1 and a pin 8 of the chip N are connected with two ends of the capacitor C, the pin 8 is connected with one end of an inductor 1 and the cathode of the diode D, the anode of the diode D is grounded, the other end of the inductor 1 is connected with a pin 4 of the chip N through a resistor R and then grounded through a resistor R, the other end of the inductor 1 is connected with the anode of the diode D, the cathode of the diode D is connected with the anode of the light-emitting diode ED through a resistor R, and the cathode of.
The micro-control system power supply circuit uses a BUCK type integrated control chip MAX5035B with the input end capable of bearing 76V input voltage to perform voltage stabilization processing, so that the micro-control system power supply circuit has extremely strong input end voltage adaptability; the diode D7 is arranged to enable the power supply circuit to have reverse connection prevention capability, so that the probability of damaging the surge generation testing device due to misoperation is reduced. The chip N1 outputs stable 5V voltage, and provides reliable drive for the micro control system.
As shown in the figure 3, the microcontroller adopts an ATmega chip N, a pin 6 of the chip N is connected with a pin 4 of an external active crystal oscillator G, a pin 7 of the chip N is connected with a pin 3 of the active crystal oscillator G through a capacitor C, a pin 2 of the active crystal oscillator G is grounded, a man-machine interaction circuit comprises a trigger button and a mode selection button, the trigger button circuit is connected with a mode selection button, the forward input end of a diode D is connected with the capacitor C, an inductor 4, the capacitor C and a resistor R and is connected with a PD port of the chip N, the other ends of the capacitor C and the capacitor C are grounded, the forward output end of the diode D is connected with one end of a single-pole double-throw switch S, the common end of the single-pole double-throw switch S is connected with one end of a resistor R, the other end of the resistor R is connected with VCC, the other end of the single-pole double-throw switch S is grounded, the forward input end of the diode D is connected with the capacitor C, the resistor R is connected with the PD port of the chip N, the other ends of the capacitor C and the capacitor C are connected with a switch PB port of a single-pole double-throw switch S, the ground, the switch PB is connected with a switch P, the resistor R, the other end of the single-pole double-throw switch P is connected with a switch J, the switch J is connected with the switch J, the switch J is connected with the switch J, the pin R5, the pin R and the pin R5, the pin J connector J.
The microcontroller circuit is a minimum system consisting of an ATmega8 chip and peripheral reset and anti-interference circuits, a system clock is provided by an external active crystal oscillator, the frequency of the system clock is ensured to be stable, and an accurate time reference is provided for a timer in the microcontroller so as to accurately control the time of surge; the man-machine interaction panel consists of a dial switch JP2, a single-pole double-throw switch S2 and a single-pole double-throw switch S3. The method comprises the steps that a needed surge generation mode can be selected through a dial switch JP2, after a tester sets the needed mode, a microcontroller identifies and enters a waiting mode after identification is finished, when a single-pole double-throw switch S2 or a single-pole double-throw switch S3 initiates a surge action request, the microcontroller enters a response mode from the waiting mode, the initiated surge action request is sent to an under-voltage surge generation circuit and an over-voltage surge generation circuit, an external active crystal oscillator is used for providing an accurate time reference for an internal timer to accurately control the surge generation time, and after the timing time is finished, the microcontroller returns to the waiting mode to wait for the next surge action request.
An ATmega8 microcontroller is selected, is a very special microcontroller, integrates a memory with larger capacity and abundant and powerful hardware interface circuits inside a chip, and has all the performances and characteristics of an AVR high-grade microcontroller MEGE series. Meanwhile, because the small pin package is adopted, the price is low, and due to the in-system programmable characteristic of the ATmega8 microcontroller, the design and development of the embedded system of the microcontroller can be carried out without purchasing expensive simulators and programmers, and the problems of complex structure, high design cost and complex programming of the existing surge testing system are solved.
As shown in figure 4, a first photoelectric coupling circuit adopts a 212EHA photoelectric coupler N, the connection relationship is that a PC port of a chip N is connected with a pin 1 of the photoelectric coupler N, a pin 2 of the photoelectric coupler N is grounded through a resistor R, pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD, meanwhile, the forward input end of the voltage regulator tube VD is connected with the resistor R and the capacitor C in parallel, one end of the resistor R is connected with the capacitor C, and the other end of the resistor R is grounded, an undervoltage surge generating circuit is connected with the forward input end of the voltage regulator tube VD, the forward input end of the voltage regulator tube VD is also respectively connected with the resistor R, a grid electrode of the field effect tube Q, a grid electrode of the resistor R and a grid electrode of the field effect tube Q, drain electrodes of the field effect tube Q and the field effect tube Q are connected with the forward input end of a diode D, the grid electrodes and source electrodes of the field effect tubes Q are respectively connected with the resistor R and the resistor R, source electrodes of the field effect tube Q and the forward output end of the field effect tube VD is connected with a forward input end of a power supply voltage Vin, a forward diode D, a forward diode Vo.
Photoelectric coupling circuit I and under-voltage surge generating circuit theory of operation: when the single-pole double-throw switch S2 initiates a surge action request, a falling edge from high level to low level is generated at the PD2 port of the chip N2 of the microcontroller circuit ATmega8, the chip N2 enters a response mode from a waiting mode after receiving the falling edge, a driving pin 1 of a photoelectric coupler N3 connected with the PC4 port of the chip N2 is set to high level (5V), a light emitting diode in the photoelectric coupler is conducted and emits light through current, the current is conducted after the light is irradiated, the gate-source voltage Vgs of a field effect tube Q2 and a field effect tube Q4 is 0, the field effect tube is cut off, Vout is changed from + Vin to 6V/9V, and under-voltage surge action occurs.
As shown in figure 5, a second photoelectric coupling circuit adopts a 212EHA photoelectric coupler N, the connection relationship is that a PC port of a chip N is connected with a pin 1 of the photoelectric coupler N, a pin 2 of the photoelectric coupler N is grounded through a resistor R, pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD, meanwhile, the forward input end of the voltage regulator tube VD is connected with the resistor R and a capacitor C in parallel, one end of the resistor R is connected with the capacitor C, and the other end of the resistor R is grounded, the overvoltage surge generating circuit is connected with the forward output end of the voltage regulator tube VD, the positive output end of the voltage regulator tube VD is also respectively connected with the resistor R, a grid electrode of the field effect tube Q, the resistor R and a grid electrode of the field effect tube Q, drain electrodes of the field effect tube Q and the field effect tube Q are connected with the forward input end of a diode D, the resistor R and the source electrodes of the field effect tube Q are respectively connected with the resistor R and the source electrode, the forward output end of the field effect tube Q is connected with a forward output end of an overvoltage diode D, the forward input end of the light-emitting diode ED, and the forward output end of the light-emitting diode D are also connected with.
Photoelectric coupling circuit II and overvoltage surge generating circuit theory of operation: when the single-pole double-throw switch S3 initiates a surge action request, a falling edge from high level to low level is generated at the PD3 port of the microcontroller chip N2, the main chip N2 enters a response mode from a waiting mode after receiving the falling edge, a driving pin 1 of a photoelectric coupler N4 connected with the PC0 port of the chip N2 is set to be at high level (5V), a light emitting diode in the photoelectric coupler is conducted, emits light through current, generates current conduction after being illuminated, the gate-source voltage Vgs of the field effect transistor Q1 and the field effect transistor Q3 is 0, the field effect transistor is cut off, Vout + Vin is changed into 80V/100V, and overvoltage surge action occurs.
The weak strong current isolation circuit can accurately transmit the action of the micro-control system to the under-voltage and over-voltage surge generating circuit, simultaneously realize the isolation of weak current and strong current, and effectively eliminate the interference of voltage and current mutation of the strong current part on the micro-control system when the surge occurs; the under-voltage surge generating circuit and the over-voltage surge generating circuit adopt the combination of electronic switches, and the surge action is realized by controlling the enabling end of the electronic switches through a micro-control system.
The testing method of the surge generation testing device based on the microcontroller comprises the following steps:
(1) and correctly connecting the surge generation testing device according to the testing requirement, as shown in fig. 6 and 7.
(2) And setting the corresponding button of the panel of the surge generation testing device according to the testing requirement, as shown in fig. 8.
(3) Under the premise of correct setting, sequentially turning on an AC/DC power supply for normal operation, an AC/DC power supply for undervoltage surge operation or an AC/DC power supply for overvoltage surge operation, and observing an indicator lamp on a panel; when the AC/DC power supply for normal work is turned on, the lamp is controlled to be lightened; when the AC/DC power supply for the under-voltage surge operation or the AC/DC power supply for the overvoltage surge operation is turned on, the corresponding under-voltage surge operation pre-indicating lamp or the overvoltage surge operation pre-indicating lamp is turned on, as shown in fig. 8.
(4) Connecting the tested module of the electric equipment, enabling the gear of the toggle switch K to be connected, pressing the undervoltage surge working switch or the overvoltage surge working switch once according to requirements, and carrying out corresponding single surge test; and comparing the level change of the second channel of the oscilloscope with the corresponding specification of the electrical performance index of the tested module of the electric equipment to judge whether the tested module of the electric equipment meets the requirement required to be met.
(5) And after the test is finished, the gear of the toggle switch K is switched off, the tested module is taken down, and the test is finished.
(6) Repeating the step (4) and the step (5) for the tested modules of the electric equipment with the same test requirements; otherwise, the surge generation testing device updates the setting after the next step is finished.
(7) After the test is finished, the gear of the toggle switch K is turned off, the button A, B, C, D, E is bounced in sequence, the AC/DC power supply for undervoltage surge work or the AC/DC power supply for overvoltage surge work and the AC/DC power supply for normal work are closed in sequence, and the surge generation test device is taken down.
As shown in fig. 8, the meaning and specific setting method represented by the buttons are as follows:
the button A is pressed to represent that the micro-control unit for carrying out undervoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".
The button B is pressed to represent that the micro-control unit for carrying out overvoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".
The combined application of the button C, D, E can realize the setting of under-voltage surge and over-voltage surge test modes;
it is provided here that a button lift represents a "1" and a button press represents a "0". The specific setup method is shown in the following table:
Claims (5)
1. the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit consisting of an under voltage surge generating circuit and an over voltage surge generating circuit, and a man-machine interaction circuit consisting of a mode selection key and a trigger key; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the first photoelectric coupling circuit and the second photoelectric coupling circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are connected with the microcontroller.
2. The surge generation testing device based on the microcontroller is characterized in that the microcontroller adopts an ATmega chip N, a pin 6 of the chip N is connected with a pin 4 of an external active crystal oscillator G, a pin 7 is connected with a pin 3 of the active crystal oscillator G through a capacitor C, a pin 2 of the active crystal oscillator G is grounded, the man-machine interaction circuit comprises a trigger key and a mode selection key, the trigger key circuit is connected with a switch, the forward input end of a diode D is connected with the capacitor C, an inductor 4, the capacitor C and a resistor R and is connected with the PD port of the chip N, the other ends of the capacitor C and the capacitor C are grounded, the forward output end of the diode D is connected with one end of a single-pole double-throw switch S, the common end of the single-pole double-throw switch S is connected with one end of a resistor R, the other end of the resistor R is connected with VCC, the other end of the single-pole double-throw switch S is grounded, the forward input end of the diode D is connected with the capacitor C, the inductor C and the resistor PB port of the single-pole double-throw switch S, the other end of the single-pole double-throw switch S is connected with a ground, the switch PB port of the chip N, the single-pole double-throw switch S is connected with a switch PB port of the capacitor C, the other end of the capacitor C, the capacitor C is connected with a switch PB port of the capacitor C, the resistor R is connected with the resistor J, the switch J is connected with the switch J, the switch.
3. A microcontroller-based surge generation test device according to claim 1, wherein:
the micro-control system power supply circuit adopts an MAX5035 DC-DC chip N, and the circuit connection relationship is that a pin 7 of the chip N is connected with one end of a capacitor C, a capacitor C and the negative electrode of a diode D, the positive electrode of the diode D is the input end of the micro-control system power supply circuit, the other ends of the capacitor C, the capacitor C and the capacitor C are connected and then grounded, the pin 7 of the chip N is connected with a pin 5 through a resistor R and then grounded through a resistor R, a pin 3 and a pin 6 of the chip N are connected and then grounded, the pin 6 is connected with a pin 2 through the capacitor C, a pin 1 and a pin 8 of the chip N are connected with two ends of the capacitor C, the pin 8 is connected with one end of an inductor 1 and the negative electrode of the diode D, the positive electrode of the diode D is grounded, the other end of the inductor 1 is connected with a pin 4 of the chip N through the resistor R and then grounded, the other end of the inductor 1 is connected with the positive electrode of the diode D, the negative electrode of the diode D is connected with the positive electrode of a tantalum through the resistor R and then grounded.
4. A microcontroller-based surge generation test device according to claim 1 or claim 2, wherein: the first photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N3, and the connection relation is as follows: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD8, meanwhile, the forward input end of the voltage regulator tube VD8 is connected with a resistor R15 and a capacitor C21 in parallel, one end of the resistor R16 is connected with a capacitor C21, and the other end of the resistor R16 is grounded;
the undervoltage surge generating circuit is characterized in that a forward input end of a voltage regulator tube VD8 is further connected with a grid of a resistor R17 and a grid of a field effect tube Q4, a resistor R35 and a grid of a field effect tube Q2 respectively, drains of the field effect tube Q4 and a field effect tube Q2 are connected with a forward input end of a diode D3, grids and sources of the field effect tubes Q4 and Q2 are connected with a resistor R36 and a resistor R37 respectively, sources of the field effect tube Q4 and a field effect tube Q2 are connected with a forward output end of the voltage regulator tube VD8, a forward output end of the voltage regulator tube 58VD 24 is further connected with an input end + Vin of power supply voltage, a forward output end of the diode D3 and a forward output end of the diode D4 are connected with a + Vout end, a forward input end of the diode D4 is connected with a 6V/9V undervoltage input end, a forward input end of the undervoltage input end is further connected with a resistor R6862.
5. A microcontroller-based surge generation test device according to claim 1 or claim 2, wherein: the second photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N4, and the connection relation is as follows: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; pins 3 and 4 are respectively connected with a forward output end and an input end of a voltage regulator tube VD10, meanwhile, the forward input end of the voltage regulator tube VD10 is connected with a resistor R20 and a capacitor C22 in parallel, one end of the resistor R21 is connected with a capacitor C22, and the other end of the resistor R21 is grounded;
the overvoltage surge generating circuit is connected in a manner that a forward output end of a voltage regulator tube VD10 is further connected with a grid electrode of a resistor R22 and a grid electrode of a field effect tube Q1, a resistor R36 and a grid electrode of a field effect tube Q3 respectively, drain electrodes of the field effect tube Q1 and a field effect tube Q3 are connected with a forward input end of a diode D5, a resistor R38 and a resistor R39 are connected between grid electrodes and source electrodes of the field effect tube Q1 and a field effect tube Q3 respectively, source electrodes of the field effect tube Q1 and a field effect tube Q3 are connected with a forward output end of the voltage regulator tube VD 58VD 23, the forward output end of the voltage regulator tube VD10 is further connected with an 80V/100V overvoltage input end, the forward output ends of the diode D5 and a diode D6 are connected with a positive Vout end, an input end of the diode D6 is connected with a power supply voltage input end + Vin, the overvoltage input end is further connected with a forward input end of.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921743725.4U CN210982637U (en) | 2019-10-17 | 2019-10-17 | Surge generation testing device based on microcontroller |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921743725.4U CN210982637U (en) | 2019-10-17 | 2019-10-17 | Surge generation testing device based on microcontroller |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210982637U true CN210982637U (en) | 2020-07-10 |
Family
ID=71415607
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921743725.4U Active CN210982637U (en) | 2019-10-17 | 2019-10-17 | Surge generation testing device based on microcontroller |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210982637U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596502A (en) * | 2019-10-17 | 2019-12-20 | 天津通广集团振海科技有限公司 | Surge generation testing device and method based on microcontroller |
-
2019
- 2019-10-17 CN CN201921743725.4U patent/CN210982637U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110596502A (en) * | 2019-10-17 | 2019-12-20 | 天津通广集团振海科技有限公司 | Surge generation testing device and method based on microcontroller |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP1530817B1 (en) | Power supply unit | |
| CN210982637U (en) | Surge generation testing device based on microcontroller | |
| CN210167120U (en) | Test system for bias of supply voltage of SSD (solid State drive) hard disk | |
| CN216387779U (en) | Surge generation testing device based on microcontroller | |
| CN102612209A (en) | Recoverable protective circuit of boosting LED (light emitting diode) driving power supply and design method of recoverable protective circuit | |
| CN209946309U (en) | IGBT drive test circuit | |
| CN204989447U (en) | Novel hand -held type thunderbolt counter tester | |
| CN110596502A (en) | Surge generation testing device and method based on microcontroller | |
| CN207234379U (en) | A kind of controllable outer power supply short-circuit protection circuit of charger | |
| CN116316412A (en) | Protection control circuit and switching power supply | |
| CN214335169U (en) | Dynamic response generating device based on microcontroller | |
| CN213689911U (en) | Automatic detection device for on-off of ignition channel | |
| CN116979819A (en) | Power supply circuit of synchronous rectifier, power supply device and power supply equipment | |
| CN212724731U (en) | Photovoltaic intelligence terminal box Flash test circuit | |
| CN209748245U (en) | Solar charger control circuit and solar charger | |
| CN108173238B (en) | Breaker and short-circuit protection method | |
| CN103841711B (en) | A kind of LED emergence lighting lamp and drive circuit thereof | |
| CN221380778U (en) | Power supply switching protection circuit and power supply system | |
| CN219576681U (en) | Zero-power consumption charging circuit | |
| CN210803702U (en) | Equipment for automatically calibrating multiple multifunctional electric energy meters | |
| CN218301225U (en) | Power panel card device for online monitoring system | |
| CN221151363U (en) | Communication module circuit, power-down reporting system and equipment | |
| CN203734520U (en) | Starting circuit of switching power supply and switching power supply | |
| CN220020140U (en) | Low-cost ultralow standby control circuit | |
| CN219018798U (en) | Multi-functional switching device that opens of wide voltage |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |