CN216387779U

CN216387779U - Surge generation testing device based on microcontroller

Info

Publication number: CN216387779U
Application number: CN202121604758.8U
Authority: CN
Inventors: 王蕊; 王晓静; 殷洁
Original assignee: Tianjin Tongguang Group Zhenhai Technology Co ltd
Current assignee: Tianjin Tongguang Group Zhenhai Technology Co ltd
Priority date: 2021-11-25
Filing date: 2021-11-25
Publication date: 2022-04-26
Anticipated expiration: 2031-11-25

Abstract

The utility model discloses a surge generation testing device based on a microcontroller, which comprises a microcontroller circuit, a reset circuit, a clock circuit, a filter circuit and a microcontroller, wherein the microcontroller circuit is composed of a reset circuit, a clock circuit, a filter circuit and a microcontroller; comprises a micro-control system power supply circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the device comprises an under/over voltage surge generating circuit and a man-machine interaction circuit, wherein the man-machine interaction circuit comprises a mode selection key and a trigger key; comprises a dynamic display circuit composed of eight segments of common cathode nixie tubes; the utility model meets the requirement of carrying out instant voltage surge resistance test on electric equipment, has the characteristics of compact circuit structure, simple system operation, low cost, high cost performance and good stability, and solves the problems of complex structure, high design cost and complex programming of the existing surge test system. The testing requirements of undervoltage surge and overvoltage surge can be met.

Description

Surge generation testing device based on microcontroller

Technical Field

The utility model relates to a device for testing voltage surge resistance of electric equipment, in particular to a microcontroller-based surge generation testing device.

Background

Chinese patent publication No. CN201910988086.6 discloses a surge generation testing device and method based on a microcontroller. The device consists of a micro-control system power supply module, a microcontroller module, a man-machine interaction module, a weak strong current isolation module and under-voltage and over-voltage surge generation modules, and meets the requirement of instantaneous voltage surge resistance testing on electric equipment. However, according to the GJB181-86 aircraft power supply characteristics and the requirements on electrical equipment, a tested module needs to test the voltage surge resistance for five times at the same interval time, and in order to meet the national and military standard requirements, the conventional testing device needs to repeatedly press an under/over voltage surge operating switch for five times, but the device does not control the voltage surge resistance time interval and the actual voltage surge resistance testing times, is not beneficial to the control of the product performance and the improvement of the production line efficiency, and cannot intuitively reflect the current operating mode of the testing device.

Disclosure of Invention

The utility model aims to solve the problems that the existing surge generation testing device has voltage surge resistant time interval and the actual voltage surge resistant testing times are not controlled, and particularly provides an improved surge generation testing device based on a microcontroller.

The technical scheme adopted by the utility model is as follows: the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the under/over voltage surge generating circuit comprises an under/over voltage surge generating circuit and an over voltage surge generating circuit; the system comprises a man-machine interaction circuit consisting of a mode selection key and a trigger key; comprises a dynamic display circuit composed of eight segments of common cathode nixie tubes; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the dynamic display circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are respectively connected with the microcontroller.

The microcontroller adopts an ATmega8 chip N2, and pins 3 and 5 of the chip N2 are grounded; the 4 pins are connected with the capacitor C13 and the capacitor C14 and then grounded; the pin 6 of the chip N2 is connected with the pin 4 of the external active crystal oscillator G1, the pin 7 is connected with the pin 3 of the active crystal oscillator G1 through the capacitor C10, and the pin 2 of the active crystal oscillator G1 is grounded.

The trigger key circuit connection relation is as follows: the anode of the diode D2 is connected with one end of a capacitor C19 and one end of an inductor L4, the other end of the inductor L4 is connected with one end of a capacitor C20, and is connected with the PD3 port of the chip N2 through a resistor R42, and the other ends of the capacitor C19 and the capacitor C20 are grounded after being connected; the cathode of the diode D2 is connected with one end of the single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the anode of the diode D1 is connected with one end of a capacitor C17 and one end of an inductor L3, the other end of the inductor L3 is connected with one end of a capacitor C16 and one end of a resistor R43, the other end of the resistor R43 is connected with the PD2 port of the chip N2, and the other ends of the capacitor C16 and the capacitor C17 are grounded after being connected; the cathode of the diode D1 is connected with the common terminal of the single-pole double-throw switch S2, one end of the single-pole double-throw switch S2 is connected with one end of the resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded.

The mode selection key circuit connection relation is as follows: the PB0 port, the PB1 port and the PB2 port of the chip N2 are respectively connected with a pin 6, a pin 5 and a pin 4 of a working mode selection key JP2, a pin 1, a pin 2 and a pin 3 of the working mode selection key JP2 are respectively connected with one ends of a resistor R31, a resistor R30 and a resistor R29, and the other ends of the resistor R31, the resistor R30 and the resistor R29 are connected with the ground; the PB0 port, the PB1 port and the PB2 port of the chip N2 are further connected with a resistor R32, a resistor R33 and a resistor R34, and the other ends of the resistor R32, the resistor R33 and the resistor R34 are connected with a VCC port of the chip N2; a PB3 port of the chip N2 is connected with a 4 pin of an SPI download port J1, a PB4 port is connected with a 1 pin of an SPI download port J1, a PB5 port is connected with a 3 pin of an SPI download port J1, a 5 pin of the SPI download port J1 is connected with one end of a toggle switch S1, and the other end of the toggle switch S1 and a 6 pin of the SPI download port J1 are respectively grounded; the pin 20 of the chip N2 is grounded through a capacitor C22.

The dynamic display circuit connection relation is as follows: the PD1 port, the PD4 port, the PD5 port, the PD6 port, the PD7 port, the PC1 port, the PC2 port and the PC3 port of the microcontroller chip N2 are respectively and correspondingly connected with one ends of a resistor R44, a resistor R45, a resistor R46, a resistor R47, a resistor R48, a resistor R49, a resistor R50 and a resistor R51, and the other ends of the resistor R44, the resistor R45, the resistor R46, the resistor R47, the resistor R48, the resistor R49, the resistor R50 and the resistor R51 are respectively connected with an a port, a b port, a c port, a d port, an e port, a g port and a dp port of the eight-segment common cathode nixie tube U1, and the GND port of the eight-segment common cathode nixie tube U1 is grounded.

The micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5;

pins

1 and 8 of the chip N1 are connected with two ends of the capacitor C4, meanwhile, the pin 8 is connected with one end of the inductor L1 and the cathode of the diode D8, and the anode of the diode D8 is grounded; the other end of the inductor L1 is connected with the 4 pins of the chip N1 through a resistor R3 and then is grounded through a resistor R4; meanwhile, the other end of the inductor L1 is connected with the anode of the diode D9, the cathode of the diode D9 is connected with the anode of the light-emitting diode LED1 through the resistor R5, the cathode of the diode D9 is connected with the anode of the tantalum capacitor C6, and the cathode of the tantalum capacitor C6 is connected with the cathode of the light-emitting diode LED1 and then grounded.

The first photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N3, and the connection relation is as follows: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; the pin 3 is connected with the pin 1 of a voltage regulator tube VD8, the pin 4 is connected with the pin 3 and the pin 2 of the voltage regulator tube VD8, the pin 3 and the pin 2 of the voltage regulator tube VD8 are connected with one ends of a resistor R15, a capacitor C21 and a resistor R16, the other ends of the resistor R15 and the capacitor C21 are connected with the pin 1 of the voltage regulator tube VD8, and the other end of the resistor R16 is grounded.

The connection relationship of the undervoltage surge generating circuit is as follows: a pin 3 of the voltage-regulator tube VD8 is also connected with one end of a resistor R24, a pin 2 of the voltage-regulator tube VD8 is respectively connected with one end of the resistor R35 and one end of a resistor R17, the drain electrode of the field-effect tube Q2, the drain electrode of the field-effect tube Q4 and the drain electrode of the field-effect tube Q6 are connected with the anode of a diode D3, one end of the resistor R37, one end of the resistor R26 and one end of the resistor R25 are respectively connected between the grid electrode and the source electrode of the field-effect tube Q2, the field-effect tube Q4 and the grid electrode and between the source electrode of the field-effect tube Q6, and are also connected with the other ends of the resistor R35, the resistor R17 and the resistor R24; the source electrodes of the field-effect tube Q2, the field-effect tube Q4 and the field-effect tube Q6 are connected with the other ends of the resistor R37, the resistor R26 and the resistor R25 and are connected to the input end + Vin of power supply voltage; the cathodes of the diode D3 and the diode D4 are connected to the + Vout terminal, the anode of the diode D4 is connected to the 6V/9V undervoltage input terminal, the undervoltage input terminal is also connected to the anode of the LED2 through the resistor R18, and the cathode of the LED2 is grounded.

The second photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N4, and the connection relation is as follows: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; the pin 3 is connected with the pin 1 of a voltage regulator tube VD10, the pin 4 is connected with the pin 3 and the pin 2 of the voltage regulator tube VD10, the pin 3 and the pin 2 of the voltage regulator tube VD10 are connected with one ends of a resistor R20, a capacitor C22 and a resistor R21, the other ends of the resistor R20 and the capacitor C22 are connected with the pin 1 of the voltage regulator tube VD10, and the other end of the resistor R21 is grounded.

The overvoltage surge generating circuit has the following connection relationship: a pin 3 of the voltage-regulator tube VD10 is also connected with one end of a resistor R27, a pin 2 of the voltage-regulator tube VD10 is respectively connected with one end of the resistor R36 and one end of a resistor R22, the drain electrode of the field-effect tube Q3, the drain electrode of the field-effect tube Q1 and the drain electrode of the field-effect tube Q5 are connected with the anode of a diode D5, one end of the resistor R39, one end of the resistor R38 and one end of the resistor R28 are respectively connected between the grid electrode and the source electrode of the field-effect tube Q3, the field-effect tube Q1 and the grid electrode and between the source electrode of the field-effect tube Q5, and are also connected with the other ends of the resistor R36, the resistor R22 and the resistor R27; the source electrodes of the field-effect tube Q3, the field-effect tube Q1 and the field-effect tube Q5 are connected with the other ends of the resistor R39, the resistor R38 and the resistor R28 and are connected to an 80V/100V overvoltage input end; the cathodes of the diode D5 and the diode D6 are connected with the + Vout end, the anode of the diode D6 is connected with the + Vin end, the 80V/100V overvoltage input end is also connected with the anode of the LED3 through the resistor R23, and the cathode of the LED3 is grounded.

The utility model has the beneficial effects that: the utility model meets the requirement of carrying out instant voltage surge resistance test on electric equipment, has the characteristics of compact circuit structure, simple system operation, low cost, high cost performance and good stability, and solves the problems of complex structure, high design cost and complex programming of the existing surge test system. Can meet the test requirements of the undervoltage surge (9V/50 mS/1S, 6V/50 mS/1S) and the overvoltage surge (80V/50mS/1S, 100V/50 mS/1S). By utilizing the programmability in the system of the microcontroller, five times of voltage-resistant surge tests with the same time interval can be output when the surge working switch is pressed once, the problem that the voltage-resistant surge time interval and the actual voltage-resistant surge test frequency cannot be controlled is effectively solved, the maintenance rate of the device is reduced, and the control of the product performance and the improvement of the production line efficiency are more effectively realized.

The utility model adds eight segments of common cathode nixie tubes on the basis of the original circuit, can play a better role in prompting, more clearly and intuitively explains the working mode of the testing device, and meanwhile, the circuit has the advantages of strong driving capability, low power consumption and the like.

Drawings

FIG. 1 is a schematic block diagram of a microcontroller-based surge generation testing device according to the present invention;

FIG. 2 is a schematic diagram of a power supply circuit of the micro-control system of FIG. 1;

FIG. 3 is a schematic diagram of the microcontroller circuit and human-computer interaction circuit of FIG. 1;

FIG. 4 is a schematic diagram of a first photoelectric coupling circuit and an under-voltage surge generating circuit in FIG. 1;

FIG. 5 is a schematic diagram of a second optocoupler circuit and an overvoltage surge generating circuit in FIG. 1;

FIG. 6 is a schematic diagram of the undervoltage test connection of the surge generation testing device based on the microcontroller according to the present invention;

FIG. 7 is a schematic diagram of an overvoltage test connection of the microcontroller-based surge generation testing apparatus of the present invention;

fig. 8 is a schematic diagram of a microcontroller-based surge generation testing device panel of the present invention.

Detailed Description

The utility model is further illustrated by the following figures and examples.

As shown in fig. 1, the apparatus includes a microcontroller circuit composed of a reset circuit, a clock circuit, a filter circuit, and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the under/over voltage surge generating circuit comprises an under/over voltage surge generating circuit and an over voltage surge generating circuit; the system comprises a man-machine interaction circuit consisting of a mode selection key and a trigger key; comprises a dynamic display circuit composed of eight segments of common cathode nixie tubes; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the dynamic display circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are respectively connected with the microcontroller.

The micro-control system power supply circuit is used for providing a stable power supply for the micro-controller module; the microcontroller circuit responds to the panel instruction and accurately transmits the instruction to the under-voltage and over-voltage surge generating module; the man-machine interaction module is used for setting an under/over voltage surge test mode, initiating a surge action request, and finishing operations such as surge mode selection, surge action triggering and the like on the panel; the weak strong current isolation circuit is connected with the microcontroller and is used for isolating weak current from strong current; the under-voltage surge generating circuit and the overvoltage surge generating circuit are connected with the weak strong current isolating circuit and used for generating actual surge actions.

As shown in fig. 2, the micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5;

pins

The micro-control system power supply circuit uses a BUCK type integrated control chip MAX5035B with the input end capable of bearing 76V input voltage to perform voltage stabilization processing, so that the micro-control system power supply circuit has extremely strong input end voltage adaptability; the diode D7 is arranged to enable the power supply circuit to have reverse connection prevention capability, so that the probability of damaging the surge generation testing device due to misoperation is reduced. Chip N1 outputs a stable 5V voltage, providing reliable drive for microcontroller chip N2.

As shown in fig. 3, the microcontroller adopts an ATmega8 chip N2, and pins 3 and 5 of the chip N2 are grounded; the 4 pins are connected with the capacitor C13 and the capacitor C14 and then grounded; the pin 6 of the chip N2 is connected with the pin 4 of the external active crystal oscillator G1, the pin 7 is connected with the pin 3 of the active crystal oscillator G1 through the capacitor C10, and the pin 2 of the active crystal oscillator G1 is grounded.

The connection relationship of the trigger key circuit is as follows: the anode of the diode D2 is connected with one end of a capacitor C19 and one end of an inductor L4, the other end of the inductor L4 is connected with one end of a capacitor C20, and is connected with the PD3 port of the chip N2 through a resistor R42, and the other ends of the capacitor C19 and the capacitor C20 are grounded after being connected; the cathode of the diode D2 is connected with one end of the single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the anode of the diode D1 is connected with one end of a capacitor C17 and one end of an inductor L3, the other end of the inductor L3 is connected with one end of a capacitor C16 and one end of a resistor R43, the other end of the resistor R43 is connected with the PD2 port of the chip N2, and the other ends of the capacitor C16 and the capacitor C17 are grounded after being connected; the cathode of the diode D1 is connected with the common terminal of the single-pole double-throw switch S2, one end of the single-pole double-throw switch S2 is connected with one end of a resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded;

the mode selection key circuit connection relationship is as follows: a PB0 port, a PB1 port and a PB2 port of the chip N2 are respectively connected with a pin 6, a pin 5 and a pin 4 of an operating mode selection key JP2, a pin 1, a pin 2 and a pin 3 of the operating mode selection key JP2 are respectively connected with one ends of a resistor R31, a resistor R30 and a resistor R29, and the other ends of the resistor R31, the resistor R30 and the resistor R29 are connected with the ground; the PB0 port, the PB1 port and the PB2 port of the chip N2 are further connected with a resistor R32, a resistor R33 and a resistor R34, and the other ends of the resistor R32, the resistor R33 and the resistor R34 are connected with a VCC port of the chip N2; a PB3 port of the chip N2 is connected with a 4 pin of an SPI download port J1, a PB4 port is connected with a 1 pin of an SPI download port J1, a PB5 port is connected with a 3 pin of an SPI download port J1, a 5 pin of the SPI download port J1 is connected with one end of a toggle switch S1, and the other end of the toggle switch S1 and a 6 pin of the SPI download port J1 are respectively grounded; the pin 20 of the chip N2 is grounded through a capacitor C22. The SPI download port J1 writes the program code into the microcontroller chip N2 program memory Flash.

The dynamic display circuit connection relation is as follows: the PD1 port, the PD4 port, the PD5 port, the PD6 port, the PD7 port, the PC1 port, the PC2 port, and the PC3 port of the microcontroller chip N2 are respectively and correspondingly connected with one end of a resistor R44, a resistor R45, a resistor R46, a resistor R47, a resistor R48, a resistor R49, a resistor R50, and a resistor R51, and the other end of the resistor R44, the resistor R45, the resistor R46, the resistor R47, the resistor R48, the resistor R49, the resistor R50, and the resistor R51 are respectively connected with the a port, the b port, the c port, the d port, the e port, the f port, the g port, and the dp port of the eight common cathode nixides U1, and the GND port of the eight common cathode nides U1 is grounded.

The microcontroller circuit is a minimum system consisting of an ATmega8 chip and peripheral reset and anti-interference circuits, a system clock is provided by an external active crystal oscillator, the frequency of the system clock is ensured to be stable, and an accurate time reference is provided for a timer in the microcontroller so as to accurately control the time of surge; the man-machine interaction panel consists of a working mode selection key JP2, a single-pole double-throw switch S2 and a single-pole double-throw switch S3. The required surge generation mode can be selected through a working mode selection key JP2, when a tester sets the required mode, a microcontroller chip N2 carries out identification, the microcontroller chip N2 enters a waiting mode after identification is finished, a PD1 port, a PD 4-PD 7 port and a PC 1-PC 3 port of the microcontroller chip N2 are connected with segment codes of eight-segment common cathode nixie tubes U1 through current limiting resistors R44-R51, corresponding dot and dash are lightened to display different digital combinations through output level change of an I/O port, when a single-pole double-throw switch S2 or a single-pole double-throw switch S3 initiates a surge action request, the microcontroller enters a response mode from the waiting mode, the initiated surge action request is sent to an under-voltage surge and over-voltage surge generation circuit, and an external active crystal oscillator is used for providing an accurate time reference for an internal timer to accurately control the generation time, after the timing time is over, the microcontroller returns to the waiting mode to wait for the next surge action request.

An ATmega8 microcontroller is selected, is a very special microcontroller, integrates a memory with larger capacity and abundant and powerful hardware interface circuits inside a chip, and has all the performances and characteristics of an AVR high-grade microcontroller MEGE series. Meanwhile, because the small pin package is adopted, the price is low, and due to the in-system programmable characteristic of the ATmega8 microcontroller, the design and development of the embedded system of the microcontroller can be carried out without purchasing expensive simulators and programmers, and the problems of complex structure, high design cost and complex programming of the existing surge testing system are solved.

As shown in fig. 4, the first photocoupler circuit adopts AQY212EHA photocoupler N3, and the connection relationship is: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; the pin 3 is connected with the pin 1 of a voltage regulator tube VD8, the pin 4 is connected with the pin 3 and the pin 2 of the voltage regulator tube VD8, the pin 3 and the pin 2 of the voltage regulator tube VD8 are connected with one ends of a resistor R15, a capacitor C21 and a resistor R16, the other ends of the resistor R15 and the capacitor C21 are connected with the pin 1 of the voltage regulator tube VD8, and the other end of the resistor R16 is grounded.

The connection relationship of the undervoltage surge generating circuit is as follows: a pin 3 of the voltage regulator tube VD8 is also connected with one end of a resistor R24, a pin 2 of the voltage regulator tube VD8 is respectively connected with one end of the resistor R35 and one end of a resistor R17, the drain electrode of the field effect tube Q2, the drain electrode of the field effect tube Q4 and the drain electrode of the field effect tube Q6 are connected with the anode of a diode D3, one end of the resistor R37, one end of the resistor R26 and one end of the resistor R25 are respectively connected between the grid electrode and the source electrode of the field effect tube Q2, the field effect tube Q4 and the field effect tube Q6, and the other end of the resistor R35, the resistor R17 and the other end of the resistor R24 are also connected; the source electrodes of the field-effect tube Q2, the field-effect tube Q4 and the field-effect tube Q6 are connected with the other ends of the resistor R37, the resistor R26 and the resistor R25 and are connected to the input end + Vin of power supply voltage; the cathodes of the diode D3 and the diode D4 are connected to the + Vout terminal, the anode of the diode D4 is connected to the 6V/9V undervoltage input terminal, the undervoltage input terminal is also connected to the anode of the LED2 through the resistor R18, and the cathode of the LED2 is grounded.

The working principle of the first photoelectric coupling circuit and the undervoltage surge generating circuit is as follows: when the single-pole double-throw switch S2 initiates a surge action request, a falling edge from high level to low level is generated at the PD2 port of the chip N2 of the microcontroller circuit ATmega8, the chip N2 enters a response mode from a waiting mode after receiving the falling edge, the driving pin 1 of the photocoupler N3 connected to the PC4 port of the chip N2 is set to high level (5V), the light emitting diode in the photocoupler is turned on and emits light through current, current is generated after illumination and is turned on, the gate-source voltages Vgs and voltages of the field effect transistors Q2, Q4 and Q6 are 0, the field effect transistors (Q2, Q4 and Q6) are turned off, Vout is changed from + to 6V/9V, and an undervoltage surge action occurs.

As shown in fig. 5, the second photocoupler circuit adopts AQY212EHA photocoupler N4, and the connection relationship is: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; the pin 3 is connected with the pin 1 of a voltage regulator tube VD10, the pin 4 is connected with the pin 3 and the pin 2 of the voltage regulator tube VD10, the pin 3 and the pin 2 of the voltage regulator tube VD10 are connected with one ends of a resistor R20, a capacitor C22 and a resistor R21, the other ends of the resistor R20 and the capacitor C22 are connected with the pin 1 of the voltage regulator tube VD10, and the other end of the resistor R21 is grounded.

The overvoltage surge generating circuit has the following connection relationship: a pin 3 of the voltage regulator tube VD10 is also connected with one end of a resistor R27, a pin 2 of the voltage regulator tube VD10 is respectively connected with one end of the resistor R36 and one end of a resistor R22, the drain electrode of the field effect tube Q3, the drain electrode of the field effect tube Q1 and the drain electrode of the field effect tube Q5 are connected with the anode of a diode D5, one end of the resistor R39, one end of the resistor R38 and one end of the resistor R28 are respectively connected between the grid electrode and the source electrode of the field effect tube Q3, the field effect tube Q1 and the field effect tube Q5, and the other end of the resistor R36, the resistor R22 and the other end of the resistor R27 are also connected; the source electrodes of the field-effect tube Q3, the field-effect tube Q1 and the field-effect tube Q5 are connected with the other ends of the resistor R39, the resistor R38 and the resistor R28 and are connected to an 80V/100V overvoltage input end; the cathodes of the diode D5 and the diode D6 are connected with the + Vout end, the anode of the diode D6 is connected with the + Vin end, the 80V/100V overvoltage input end is also connected with the anode of the LED3 through the resistor R23, and the cathode of the LED3 is grounded.

The working principle of the second photoelectric coupling circuit and the overvoltage surge generating circuit is as follows: when the single-pole double-throw switch S3 initiates a surge action request, a falling edge from high level to low level is generated at the PD3 port of the microcontroller chip N2, the main chip N2 enters a response mode from a waiting mode after receiving the falling edge, the 1 pin of the photoelectric coupler N4 connected to the PC0 port of the chip N2 is driven to be set to low level (0V), the light emitting diode inside the photoelectric coupler N4 is turned off, the gate-source voltage Vgs of the fet Q1, the fet Q3 and the fet Q5 is 12V, the fets (Q1, Q3 and Q5) are turned on, Vout + Vin is changed to 80V/100V, and an overvoltage surge action occurs.

The weak strong current isolation circuit can accurately transmit the action of the micro-control system to the under-voltage and over-voltage surge generating circuit, simultaneously realize the isolation of weak current and strong current, and effectively eliminate the interference of voltage and current mutation of the strong current part on the micro-control system when the surge occurs; the under-voltage surge generating circuit and the over-voltage surge generating circuit adopt the combination of electronic switches, and the surge action is realized by controlling the enabling end of the electronic switches through a microcontroller.

The surge generation testing device based on the microcontroller is adopted for testing and comprises the following steps:

(1) and correctly connecting the surge generation testing device according to the testing requirement, as shown in fig. 6 and 7.

(2) And setting the corresponding button of the panel of the surge generation testing device according to the testing requirement, as shown in fig. 8.

(3) Under the premise of correct setting, sequentially turning on an AC/DC power supply for normal operation, an AC/DC power supply for undervoltage surge operation or an AC/DC power supply for overvoltage surge operation, and observing an indicator lamp on a panel; when the AC/DC power supply for normal work is turned on, the lamp is controlled to be lightened; when the AC/DC power supply for the under-voltage surge work or the AC/DC power supply for the overvoltage surge work is turned on, the corresponding under-voltage surge work pre-indicating lamp or the overvoltage surge work pre-indicating lamp is turned on, meanwhile, the corresponding stippling and drawing of the eight-section common cathode nixie tube U1 displays numbers, when the number displayed by the nixie tube is confirmed to correspond to the corresponding button setting, the step (4) is carried out, and otherwise, the corresponding button setting is checked, as shown in FIG. 8.

(4) Connecting the tested module, enabling the gear of the toggle switch K to be connected, pressing the undervoltage surge working switch or the overvoltage surge working switch once according to requirements, and carrying out five continuous surge tests; and comparing the level change of the second channel of the oscilloscope with the corresponding specification of the electrical performance index of the module to be tested to judge whether the module to be tested meets the requirement required to be met.

(5) And after the test is finished, the gear of the toggle switch K is switched off, the tested module is taken down, and the test is finished.

(6) Repeating the step (4) and the step (5) for the tested modules with the same test requirements; otherwise, the surge generation testing device updates the setting after the next step is finished.

(7) After the test is finished, the gear of the toggle switch K is turned off, the button A, B, C, D, E is bounced in sequence, the AC/DC power supply for undervoltage surge work or the AC/DC power supply for overvoltage surge work and the AC/DC power supply for normal work are closed in sequence, and the surge generation test device is taken down.

As shown in fig. 8, the meaning and specific setting method represented by the buttons are as follows:

the button A is pressed to represent that the micro-control unit for carrying out undervoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".

The button B is pressed to represent that the micro-control unit for carrying out overvoltage surge is effective, otherwise, the micro-control unit is ineffective; the corresponding indicator light is a "control light".

The combined application of the button C, D, E can realize the setting of under-voltage surge and over-voltage surge test modes;

it is provided here that a button lift represents a "1" and a button press represents a "0". The specific setup method is shown in the following table:

Claims

1. the utility model provides a testing arrangement takes place for surge based on microcontroller which characterized in that: the microcontroller circuit comprises a reset circuit, a clock circuit, a filter circuit and a microcontroller; the micro-control system power supply circuit is used for providing a power supply for the micro-controller circuit; the circuit comprises a weak strong current isolation circuit consisting of a first photoelectric coupling circuit and a second photoelectric coupling circuit; the under/over voltage surge generating circuit comprises an under/over voltage surge generating circuit and an over voltage surge generating circuit; the system comprises a man-machine interaction circuit consisting of a mode selection key and a trigger key; comprises a dynamic display circuit composed of eight segments of common cathode nixie tubes; the micro-control system power supply circuit is connected with the microcontroller, the microcontroller is respectively connected with the dynamic display circuit, the first photoelectric coupling circuit and the second photoelectric coupling circuit are respectively connected with the undervoltage surge generating circuit and the overvoltage surge generating circuit, and the mode selection button and the trigger button are respectively connected with the microcontroller.

2. A microcontroller-based surge generation test device according to claim 1, wherein: the microcontroller adopts an ATmega8 chip N2, and pins 3 and 5 of the chip N2 are grounded; the 4 pins are connected with the capacitor C13 and the capacitor C14 and then grounded; the pin 6 of the chip N2 is connected with the pin 4 of the external active crystal oscillator G1, the pin 7 is connected with the pin 3 of the active crystal oscillator G1 through the capacitor C10, and the pin 2 of the active crystal oscillator G1 is grounded;

the trigger key circuit connection relation is as follows: the anode of the diode D2 is connected with one end of a capacitor C19 and one end of an inductor L4, the other end of the inductor L4 is connected with one end of a capacitor C20, and is connected with the PD3 port of the chip N2 through a resistor R42, and the other ends of the capacitor C19 and the capacitor C20 are grounded after being connected; the cathode of the diode D2 is connected with one end of the single-pole double-throw switch S3, the common end of the single-pole double-throw switch S3 is connected with one end of a resistor R6, the other end of the resistor R6 is connected with VCC, and the other end of the single-pole double-throw switch S3 is grounded; the anode of the diode D1 is connected with one end of a capacitor C17 and one end of an inductor L3, the other end of the inductor L3 is connected with one end of a capacitor C16 and one end of a resistor R43, the other end of the resistor R43 is connected with the PD2 port of the chip N2, and the other ends of the capacitor C16 and the capacitor C17 are grounded after being connected; the cathode of the diode D1 is connected with the common terminal of the single-pole double-throw switch S2, one end of the single-pole double-throw switch S2 is connected with one end of a resistor R7, the other end of the resistor R7 is connected with VCC, and the other end of the single-pole double-throw switch S2 is grounded;

3. A microcontroller-based surge generation test device according to claim 2, wherein:

4. A microcontroller-based surge generation test device according to claim 1, wherein:

the micro-control system power supply circuit adopts a MAX5035B DC-DC chip N1, and the circuit connection relationship is as follows: a pin 7 of the chip N1 is connected with one end of the capacitor C3, the capacitor C2, the capacitor C1 and the cathode of the diode D7, and the anode of the diode D7 is the input end of the micro-control system power supply circuit; the other ends of the capacitor C3, the capacitor C2 and the capacitor C1 are connected and then grounded; meanwhile, the pin 7 of the chip N1 is connected with the pin 5 through a resistor R1 and then grounded through a resistor R2; the pin 3 and the pin 6 of the chip N1 are grounded after being connected, and the pin 6 is connected with the pin 2 through a capacitor C5; pins 1 and 8 of the chip N1 are connected with two ends of the capacitor C4, meanwhile, the pin 8 is connected with one end of the inductor L1 and the cathode of the diode D8, and the anode of the diode D8 is grounded; the other end of the inductor L1 is connected with the 4 pins of the chip N1 through a resistor R3 and then is grounded through a resistor R4; meanwhile, the other end of the inductor L1 is connected with the anode of the diode D9, the cathode of the diode D9 is connected with the anode of the light-emitting diode LED1 through the resistor R5, the cathode of the diode D9 is connected with the anode of the tantalum capacitor C6, and the cathode of the tantalum capacitor C6 is connected with the cathode of the light-emitting diode LED1 and then grounded.

5. A microcontroller-based surge generation test device according to claim 2, wherein: the first photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N3, and the connection relation is as follows: the PC4 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N3, and the pin 2 of the photoelectric coupler N3 is grounded through a resistor R14; the pin 3 is connected with the pin 1 of a voltage regulator tube VD8, the pin 4 is connected with the pin 3 and the pin 2 of a voltage regulator tube VD8, the pin 3 and the pin 2 of the voltage regulator tube VD8 are connected with one ends of a resistor R15, a capacitor C21 and a resistor R16, the other ends of the resistor R15 and the capacitor C21 are connected with the pin 1 of the voltage regulator tube VD8, and the other end of the resistor R16 is grounded;

6. A microcontroller-based surge generation test device according to claim 2, wherein: the second photoelectric coupling circuit adopts AQY212EHA photoelectric coupler N4, and the connection relation is as follows: the PC0 port of the chip N2 is connected with the pin 1 of the photoelectric coupler N4, and the pin 2 of the photoelectric coupler N4 is grounded through a resistor R19; the pin 3 is connected with the pin 1 of a voltage regulator tube VD10, the pin 4 is connected with the pin 3 and the pin 2 of a voltage regulator tube VD10, the pin 3 and the pin 2 of the voltage regulator tube VD10 are connected with one ends of a resistor R20, a capacitor C22 and a resistor R21, the other ends of the resistor R20 and the capacitor C22 are connected with the pin 1 of the voltage regulator tube VD10, and the other end of the resistor R21 is grounded;