CN103454534A - Surge testing system and surge testing method - Google Patents
Surge testing system and surge testing method Download PDFInfo
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- CN103454534A CN103454534A CN2013104110434A CN201310411043A CN103454534A CN 103454534 A CN103454534 A CN 103454534A CN 2013104110434 A CN2013104110434 A CN 2013104110434A CN 201310411043 A CN201310411043 A CN 201310411043A CN 103454534 A CN103454534 A CN 103454534A
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Abstract
The invention discloses a surge testing system and a surge testing method. The surge testing system comprises a voltage and current generation circuit which provides voltage and large currents for test samples, a programmable controller controlling the voltage and current generation circuit to be charged or discharged, and an oscilloscope for collecting and displaying voltage values and current values of the test samples. The surge testing system further comprises a processor and a storage device. The processor is connected with the programmable controller, the processor is connected with the oscilloscope, and the processor is connected with the storage device. The processor sends operation orders to the programmable controller, the programmable controller receives the operation orders and sends corresponding orders to control the voltage and current generation circuit to be charged or discharged, the voltage and current generation circuit is charged or discharged to test the test samples or stop testing, the oscilloscope collects and displays the current values and the voltage values of the test samples, and the processor has access to the oscilloscope so as to obtain the current values and the voltage values and store the current values and the voltage values in the storage device.
Description
Technical field
The present invention relates to the electric test equipment technical field, particularly a kind of surge test system and method for testing thereof.
Background technology
Surge test is to impact sample by producing one group of high-tension current that meets corresponding testing standard, test the parameters such as residual voltage, electric current of sample by oscillograph, and the parameter that last basis collects determines whether this sample meets set standard.
Current surge test equipment, generally adopt the mode of graphic control panel and Programmable Logic Controller combination.These equipment can't carry out the electronics preservation to the historical test data collected, and more can't carry out statistical study and derive form data.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of surge test system, is intended to make the test data of sample to be preserved, and the data of test are carried out statistical study and derived form.
To achieve these goals, the invention provides a kind of surge test system, being included as specimen provides the electric current and voltage circuit for generating of high pressure and large electric current, control the Programmable Logic Controller of described electric current and voltage circuit for generating charge or discharge, and the oscillograph that described specimen is carried out to magnitude of voltage and current value collection demonstration; Also comprise processor and storer, described processor is connected with Programmable Logic Controller, and described processor is connected with described oscillograph, and described processor is connected with described storer;
Described processor transmit operation order is to described Programmable Logic Controller, described Programmable Logic Controller receives described operational order and sends corresponding instruction to described current/voltage circuit for generating, described electric current and voltage circuit for generating is tested or interrupt test described specimen according to the instruction received, described oscillograph gathers also further demonstration to current value and the magnitude of voltage of described specimen, the described oscillograph of described processor access, obtain described current value and magnitude of voltage, and described current value and magnitude of voltage are stored in described storer.
Preferably, the surge test system also comprises that described serial ports controller input end is connected with described processor for connecting the serial ports controller of described processor and described Programmable Logic Controller, and output terminal is connected with described Programmable Logic Controller.
Preferably, the surge test system also comprises the D/A converting circuit that feeds back to described Programmable Logic Controller for the current value by described electric current and voltage circuit for generating and magnitude of voltage, the input end of described D/A converting circuit is connected with described electric current and voltage circuit for generating, and the output terminal of described D/A converting circuit is connected with described Programmable Logic Controller.
Preferably, the surge test system also comprises relay, and the control end of described relay is connected with described Programmable Logic Controller, and the output terminal of described relay is connected with described electric current and voltage circuit for generating.
Preferably, described processor is connected with described oscillograph by RJ45 interface or USB interface.
Preferably, the surge test system also comprises that described display is connected with described processor for showing the display of magnitude of voltage, current value and abnormal prompt that described processor obtains.
Preferably, the surge test system also comprises current value for gathering described specimen and the Acquisition Circuit of magnitude of voltage, and described oscillograph is detected and shows the voltage and current of described Acquisition Circuit.
The present invention also provides a kind of method of testing of surge test system, and this method of testing comprises the following steps:
A, processor read the voltage parameter of Programmable Logic Controller, and the voltage parameter by described Programmable Logic Controller judges whether the electric current and voltage circuit for generating exists extremely; If exist extremely, perform step B, if do not exist extremely, perform step C;
B, described processor prompting abnormality, process extremely, then repeating step A;
C, described processor transmit operation order are to described Programmable Logic Controller, and described Programmable Logic Controller is controlled described electric current and voltage circuit for generating according to described operational order specimen is tested;
D, described specimen is carried out to current value with described oscillograph and magnitude of voltage is gathered;
E, described processor access oscillograph also obtain described current value and the magnitude of voltage that described oscillograph collects;
F, described processor are saved to the described current value and the magnitude of voltage that get in storer.
Preferably, the parameter of the described oscillograph of initialization and described serial ports controller before carrying out described steps A.
Preferably, when carrying out described step C, described D/A converting circuit feeds back to described Programmable Logic Controller by the magnitude of voltage of electric current and voltage circuit for generating and current value, when described processor transmit operation order when the described Programmable Logic Controller, described Programmable Logic Controller is stored described magnitude of voltage and current value, the described Programmable Logic Controller of described processor access, obtain magnitude of voltage and current value and be stored in described storer.
The present invention controls Programmable Logic Controller by processor, and then controls the test mode of electric current and voltage circuit for generating to specimen.Oscillograph is for gathering and show residual voltage value and the current value of specimen.Processor passes through the access oscillograph again, and then obtains residual voltage value and the current value of specimen, and residual voltage value and current value are stored in storer.The present invention can the permanent storage specimen test data, the convenient user of the data of this storage carries out statistical study to the test data of specimen.The present invention has overcome surge test equipment of the prior art can not store historical data and cause the user to be difficult to the test data of specimen is carried out the defect of statistical study.
The accompanying drawing explanation
The module diagram that Fig. 1 is surge test system one embodiment of the present invention;
The schematic flow sheet of method of testing one embodiment that Fig. 2 is surge test system of the present invention.
The realization of the object of the invention, functional characteristics and advantage, in connection with embodiment, are described further with reference to accompanying drawing.
Embodiment
Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
The invention provides the surge test system.
With reference to Fig. 1, the module diagram that Fig. 1 is surge test system one embodiment of the present invention.The surge test system that the present embodiment provides, being included as specimen provides the electric current and voltage circuit for generating 1 of high pressure and large electric current, control the Programmable Logic Controller 2 of electric current and voltage circuit for generating 1 charge or discharge, and the oscillograph 3 that specimen is carried out to magnitude of voltage and current value collection demonstration.The surge test system also comprises processor 4 and storer 5, and processor 4 is connected with Programmable Logic Controller 2, and processor 4 is connected with oscillograph 3, and processor 4 is connected with storer 5.Processor 4 transmit operation orders are to Programmable Logic Controller 2, Programmable Logic Controller 2 receives operational order and sends corresponding instruction controls 1 charge or discharge of electric current and voltage circuit for generating, 1 charge or discharge of electric current and voltage circuit for generating are tested or interrupt test specimen, 3 pairs of specimen of oscillograph carry out current value and magnitude of voltage is gathered and shown, processor 4 access oscillographs 3, obtain current value and magnitude of voltage, and current value and magnitude of voltage are stored in storer 5.
Surge test is mainly whether the user to be produced to mortality harm after analog equipment is struck by lightning, and for example residual voltage is excessive or electric current is excessive.The surge test system produces high pressure and large electric current, and specimen is carried out to high pressure and high-current test.
In the present embodiment, computing machine comprises processor 4 and storer 5.Above-mentioned oscillograph 3 is connected with the processor 4 in computing machine with Programmable Logic Controller 2.At first processor 4 carries out initialization to oscillograph 3 and serial ports controller.And read the state of Programmable Logic Controller 2 whole parameters at serial ports controller 6 by the modbus agreement.It is mainly the magnitude of voltage that reads storage capacitor in the electric current and voltage circuit for generating 1 recorded in Programmable Logic Controller 2.If the magnitude of voltage of the storage capacitor read is non-vanishing, and electric current and voltage circuit for generating 1 does not discharge.Processor 4 will send orders extremely to graphoscope, and graphoscope will point out electric current and voltage circuit for generating 1 not discharge.Simultaneously, processor 4 can also carry out suitable abnormality processing.The mode of abnormality processing has two kinds: the one, and processor 4 sends the abnormality processing order to Programmable Logic Controller 2, and Programmable Logic Controller 2 will be controlled 1 electric discharge of electric current and voltage circuit for generating.The 2nd, manual operation, make 1 electric discharge of electric current and voltage circuit for generating, removes abnormal.After abnormal the releasing, processor 4 will send and start test command to Programmable Logic Controller 2.Programmable Logic Controller 2 will be controlled 1 pair of specimen of electric current and voltage circuit for generating and be tested.After test finishes, oscillograph 3 will obtain residual voltage and the current parameters of specimen, and be shown.Processor 4 is by VISA interface accessing oscillograph 3, obtains the oscillogram of residual voltage, current parameters and demonstration that oscillograph 3 collects, and further is saved in storer 5.It should be noted that storer 5 can also be arranged on database or the database far-end server in processor 4.The user can also derive the test data of specimen from database.Can also from database, derive the Excel form in computing machine, thereby facilitate the user to carry out statistical study to the test data of specimen.
The present invention controls Programmable Logic Controller 2 by processor 4, and then controls the test mode of 1 pair of specimen of electric current and voltage circuit for generating.Oscillograph 3 is for gathering and show residual voltage value and the current value of specimen.Processor 4 passes through access oscillograph 3 again, and then obtains residual voltage value and the current value of specimen, and residual voltage value and current value are stored in storer 5.The present invention can the permanent storage specimen test data, the convenient user of the data of this storage carries out statistical study to the test data of specimen.The present invention has overcome surge test equipment of the prior art can not store historical data and cause the user to be difficult to the test data of specimen is carried out the defect of statistical study.
Further, the surge test system also comprises that serial ports controller 6 input ends are connected with processor 4 for connecting the serial ports controller 6 of processor 4 and Programmable Logic Controller 2, and output terminal is connected with Programmable Logic Controller 2.
In the present embodiment, serial ports controller 6 is mainly realized the two-way communication of processor 4 and Programmable Logic Controller 2.Processor 4 can send a command to Programmable Logic Controller 2 by serial ports controller 6.On the other hand, Programmable Logic Controller 2 also can transfer to processor 4 by data-signal by serial ports controller 6.For example, the parameter signals such as the duration of charging of electric current and voltage circuit for generating 1, discharge time, magnitude of voltage and current value all can transfer to processor 4 by serial ports controller 6.Processor 4 will be stored to the received signal and be shown.
Further, the surge test system also comprises the D/A converting circuit 7 that feeds back to Programmable Logic Controller 2 for the current value by the electric current and voltage circuit for generating and magnitude of voltage, the input end of D/A converting circuit 7 is connected with electric current and voltage circuit for generating 1, and the output terminal of D/A converting circuit 7 is connected with Programmable Logic Controller 2.
In the present embodiment, the duration of charging of electric current and voltage circuit for generating, discharge time, magnitude of voltage and current value will feed back to Programmable Logic Controller 2 by D/A converting circuit 7.Processor 4 obtains the parameter of electric current and voltage circuit for generating 1 and is shown and store by access Programmable Logic Controller 2 again.
Further, the control end of relay K M is connected with Programmable Logic Controller 2, and the output terminal of relay K M is connected with electric current and voltage circuit for generating 1.
In the present embodiment, Programmable Logic Controller 2 is controlled the charging and discharging of electric current and voltage circuit for generating 1 by pilot relay KM.
Further, processor 4 is connected with oscillograph 3 by RJ45 interface or USB interface.
Further, the surge test system also comprises the display 8 for showing magnitude of voltage, current value and abnormal prompt, and display 8 is connected with processor 4.
In the present embodiment, display 8 is connected with processor 4, and the magnitude of voltage of the specimen that processor 4 will obtain from oscillograph 3 and current value are sent to display 8 and are shown.In addition, processor 4 can also be shown the parameter of obtaining electric current and voltage circuit for generating 1 from Programmable Logic Controller 2.If abnormal situation appears in system, also can in display 8, show abnormal.
Further, the surge test system also comprises the Acquisition Circuit 9 for the current value of collecting test sample and magnitude of voltage, and oscillograph 3 detects the voltage and current of Acquisition Circuit 9 and shown.
In the present embodiment, Acquisition Circuit 9 is connected to the power end of specimen, and the specimen of sample circuit after to surge test carried out residual voltage collection and current acquisition.Oscillograph 3 detects Acquisition Circuit 9 by two probes, thereby the residual voltage in specimen and electric current are shown in oscillograph 3.
In conjunction with reference to Fig. 2, the schematic flow sheet of method of testing one embodiment that Fig. 2 is surge test system of the present invention.The present invention also provides a kind of method of testing of surge test system.The method of testing that the present embodiment provides comprises the following steps:
S10, processor 4 read the voltage parameter of Programmable Logic Controller 2, and the voltage parameter by Programmable Logic Controller 2 judges whether electric current and voltage circuit for generating 1 exists extremely; If exist extremely, perform step S20, if do not exist extremely, perform step S30;
S20, processor 4 prompting abnormality, process extremely, then repeating step S10;
S30, processor 4 transmit operation orders are to Programmable Logic Controller 2, and Programmable Logic Controller 2 is controlled 1 pair of specimen of electric current and voltage circuit for generating according to the operational order received and tested;
S40,3 pairs of specimen of oscillograph carry out current value and magnitude of voltage is gathered;
S50, processor 4 access oscillographs 3 also obtain current value and the magnitude of voltage that oscillograph collects;
S60, processor 4 are saved to the current value and the magnitude of voltage that get in storer 5.
In the present embodiment, computing machine comprises processor 4 and storer 5, and oscillograph 3 is connected with computing machine with Programmable Logic Controller 2.At first processor 4 carries out initialization to oscillograph 3 and serial ports controller 6.And read the state of Programmable Logic Controller 2 whole parameters at serial ports controller 6 by the modbus agreement.It is mainly the magnitude of voltage that reads storage capacitor in the electric current and voltage circuit for generating 1 recorded in Programmable Logic Controller 2.If the magnitude of voltage of the storage capacitor read is non-vanishing, and electric current and voltage circuit for generating 1 does not discharge.Processor 4 will send orders extremely to display 8, and display 8 will point out electric current and voltage circuit for generating 1 not discharge.Simultaneously, processor 4 can also carry out suitable abnormality processing.The mode of abnormality processing has two kinds: the one, and processor 4 sends the abnormality processing order to Programmable Logic Controller 2, and Programmable Logic Controller 2 will be controlled 1 electric discharge of electric current and voltage circuit for generating.The 2nd, manual operation, make 1 electric discharge of electric current and voltage circuit for generating, removes abnormal.After abnormal the releasing, processor 4 will send and start test command to Programmable Logic Controller 2.Programmable Logic Controller 2 will be controlled 1 pair of specimen of electric current and voltage circuit for generating and be tested.After test finishes, oscillograph 3 will obtain residual voltage and the current parameters of specimen, and be shown.Processor 4 is by VISA interface accessing oscillograph 3, obtains the oscillogram of residual voltage, current parameters and demonstration that oscillograph 3 collects, and further is saved in storer 5.It should be noted that storer 5 can also be arranged on database or the database far-end server in processor 4.The user can also derive the test data of specimen from database.Can also from database, derive the Excel form in computing machine, thereby facilitate the user to carry out statistical study to the test data of specimen.
When 1 pair of specimen of electric current and voltage circuit for generating is tested, D/A converting circuit 7 feeds back to Programmable Logic Controller 2 by the magnitude of voltage of electric current and voltage circuit for generating 1 and current value, 2 pairs of magnitudes of voltage of Programmable Logic Controller and current value are stored, processor 4 access Programmable Logic Controllers 2, obtain magnitude of voltage and current value and be stored in storer 5.On the other hand, processor 4 is also further analyzed the parameter of obtaining, if find electric current and voltage circuit for generating 1 abnormal, processor 4 will send orders extremely to display 8.Display 8 will show that reminding user is removed extremely extremely.
The foregoing is only the preferred embodiments of the present invention; not thereby limit the scope of the claims of the present invention; every equivalent structure transformation that utilizes instructions of the present invention and accompanying drawing content to do; or directly or indirectly be used in other relevant technical fields, all in like manner be included in scope of patent protection of the present invention.
Claims (10)
1. a surge test system, being included as specimen provides the electric current and voltage circuit for generating of high pressure and large electric current, control the Programmable Logic Controller of described electric current and voltage circuit for generating charge or discharge, and the oscillograph that described specimen is carried out to magnitude of voltage and current value collection demonstration; It is characterized in that, also comprise processor and storer, described processor is connected with Programmable Logic Controller, and described processor is connected with described oscillograph, and described processor is connected with described storer;
Described processor transmit operation order is to described Programmable Logic Controller, described Programmable Logic Controller receives described operational order and sends corresponding instruction to described current/voltage circuit for generating, described electric current and voltage circuit for generating is tested or interrupt test described specimen according to the instruction received, described oscillograph is gathered and is shown current value and the magnitude of voltage of described specimen, the described oscillograph of described processor access, obtain described current value and magnitude of voltage, and described current value and magnitude of voltage are stored in described storer.
2. surge test system as claimed in claim 1, it is characterized in that, also comprise that described serial ports controller input end is connected with described processor for connecting the serial ports controller of described processor and described Programmable Logic Controller, output terminal is connected with described Programmable Logic Controller.
3. surge test system as claimed in claim 1, it is characterized in that, also comprise the D/A converting circuit that feeds back to described Programmable Logic Controller for the current value by described electric current and voltage circuit for generating and magnitude of voltage, the input end of described D/A converting circuit is connected with described electric current and voltage circuit for generating, and the output terminal of described D/A converting circuit is connected with described Programmable Logic Controller.
4. surge test system as claimed in claim 1, is characterized in that, also comprises relay, and the control end of described relay is connected with described Programmable Logic Controller, and the output terminal of described relay is connected with described electric current and voltage circuit for generating.
5. surge test system as claimed in claim 1, is characterized in that, described processor is connected with described oscillograph by RJ45 interface or USB interface.
6. surge test system as claimed in claim 1, is characterized in that, also comprises that described display is connected with described processor for showing the display of magnitude of voltage, current value and abnormal prompt that described processor obtains.
7. as surge test system as described in claim 5 or 6, it is characterized in that, also comprise current value for gathering described specimen and the Acquisition Circuit of magnitude of voltage, described oscillograph is detected and is shown the voltage and current of described Acquisition Circuit.
8. the method for testing of a surge test system, is characterized in that, comprises the following steps:
A, processor read the voltage parameter of Programmable Logic Controller, and the voltage parameter by described Programmable Logic Controller judges whether the electric current and voltage circuit for generating exists extremely; If exist extremely, perform step B, if do not exist extremely, perform step C;
B, described processor prompting abnormality, process extremely, then repeating step A;
C, described processor transmit operation order are to described Programmable Logic Controller, and described Programmable Logic Controller is controlled described electric current and voltage circuit for generating according to described operational order specimen is tested;
D, described specimen is carried out to current value with described oscillograph and magnitude of voltage is gathered;
E, described processor access oscillograph also obtain described current value and the magnitude of voltage that described oscillograph collects;
F, described processor are saved to the described current value and the magnitude of voltage that get in storer.
9. method of testing as claimed in claim 8, is characterized in that, the parameter of the described oscillograph of initialization and described serial ports controller before carrying out described steps A.
10. method of testing as claimed in claim 8, it is characterized in that, when carrying out described step C, described D/A converting circuit feeds back to described Programmable Logic Controller by the magnitude of voltage of electric current and voltage circuit for generating and current value, when described processor transmit operation order when the described Programmable Logic Controller, described Programmable Logic Controller is stored described magnitude of voltage and current value, and the described Programmable Logic Controller of described processor access obtains magnitude of voltage and current value and is stored in described storer.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105184256A (en) * | 2015-09-06 | 2015-12-23 | 华南理工大学 | Surge test equipment-under-test status lamp image pattern recognition method |
| CN105388373A (en) * | 2015-10-29 | 2016-03-09 | 威凯检测技术有限公司 | Surge detection process tested equipment state automatic recording and analyzing system |
| CN107192874A (en) * | 2016-03-15 | 2017-09-22 | 上海普锐马电子有限公司 | A kind of pulse residual voltage measuring system for lightning surge generator |
| CN110596502A (en) * | 2019-10-17 | 2019-12-20 | 天津通广集团振海科技有限公司 | Surge generation testing device and method based on microcontroller |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105184256A (en) * | 2015-09-06 | 2015-12-23 | 华南理工大学 | Surge test equipment-under-test status lamp image pattern recognition method |
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| CN105388373A (en) * | 2015-10-29 | 2016-03-09 | 威凯检测技术有限公司 | Surge detection process tested equipment state automatic recording and analyzing system |
| CN107192874A (en) * | 2016-03-15 | 2017-09-22 | 上海普锐马电子有限公司 | A kind of pulse residual voltage measuring system for lightning surge generator |
| CN110596502A (en) * | 2019-10-17 | 2019-12-20 | 天津通广集团振海科技有限公司 | Surge generation testing device and method based on microcontroller |
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Effective date of registration: 20180511 Address after: 518000 Nanshan District, Shenzhen, Guangdong, Guangdong Province, Nanshan District high street community, Shahe road 1819, Shenzhen Bay science and Technology Park 7 B block east area 506B Patentee after: Shenzhen Kewei Tess Technology Co.,Ltd. Address before: 518000 Shenzhen, Guangdong province Longgang District Buji street, Gan Keng community Gan Li Technology Park 7 Gan Li 6 Road No. 4 Industrial Park, 401A Patentee before: SHENZHEN KOVITEST TECHNOLOGY Co.,Ltd. |
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Granted publication date: 20160810 Termination date: 20210910 |