CN103454534B - Surge test system and method for testing thereof - Google Patents
Surge test system and method for testing thereof Download PDFInfo
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- CN103454534B CN103454534B CN201310411043.4A CN201310411043A CN103454534B CN 103454534 B CN103454534 B CN 103454534B CN 201310411043 A CN201310411043 A CN 201310411043A CN 103454534 B CN103454534 B CN 103454534B
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- 238000012360 testing method Methods 0.000 title claims abstract description 129
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- 230000005856 abnormality Effects 0.000 claims description 8
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- 238000006243 chemical reaction Methods 0.000 claims 1
- 239000000523 sample Substances 0.000 description 43
- 238000007619 statistical method Methods 0.000 description 7
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Abstract
The invention discloses a kind of surge test system and method for testing thereof.This surge test system includes providing high pressure and the voltage x current generation circuit of big electric current for test sample, controls the Programmable Logic Controller of voltage x current generation circuit charge or discharge, and test sample carries out magnitude of voltage and current value collection the oscillograph shown.This surge test system also includes processor and memorizer, and processor is connected with Programmable Logic Controller, and processor is connected with oscillograph, and processor is connected with memorizer.Processor sends operational order to Programmable Logic Controller, Programmable Logic Controller receives operational order and sends corresponding instruction control voltage x current generation circuit charge or discharge, test sample is tested or interrupt test by voltage x current generation circuit charge or discharge, test sample is carried out oscillograph current value and magnitude of voltage is acquired and shows, processor accesses oscillograph, obtain current value and magnitude of voltage, and current value and magnitude of voltage are stored to memorizer.
Description
Technical field
The present invention relates to electrical test apparatus technical field, particularly to a kind of surge test system and survey thereof
Method for testing.
Background technology
Surge test is by producing one group of high-tension current impact sample meeting corresponding testing standard,
By parameters such as oscillograph the test residual voltage of sample, electric currents, come really finally according to the parameter collected
Whether this sample fixed meets set standard.
Current surge test equipment, the general mode using graphic control panel and Programmable Logic Controller to combine.
These equipment cannot carry out electronics preservation to the historical test data collected, and more cannot unite data
Meter is analyzed and derives form.
Summary of the invention
Present invention is primarily targeted at a kind of surge test system of offer, it is intended to make the survey of sample
Examination data are preserved, and carry out the data of test statistical analysis and derive form.
To achieve these goals, the present invention provides a kind of surge test system, carries including for test sample
For high pressure and the voltage x current generation circuit of big electric current, control the charging of described voltage x current generation circuit or put
The Programmable Logic Controller of electricity, and described test sample is carried out magnitude of voltage and current value collection and shows
Oscillograph；Also include that processor and memorizer, described processor are connected with Programmable Logic Controller, described place
Reason device is connected with described oscillograph, and described processor is connected with described memorizer；
Described processor sends operational order and receives to described Programmable Logic Controller, described Programmable Logic Controller
Described operational order also sends corresponding instruction extremely described current/voltage generation circuit, and described voltage x current is sent out
Described test sample is tested or interrupt test by raw circuit according to the instruction received, described oscillograph
Current value and magnitude of voltage to described test sample are acquired and show further, and described processor accesses
Described oscillograph, obtains described current value and magnitude of voltage, and stores described current value and magnitude of voltage to institute
State in memorizer.
Preferably, surge test system also includes for connecting described processor and described Programmable Logic Controller
Serial ports controller, described serial ports controller input is connected with described processor, outfan with described can
Programmable controller connects.
Preferably, surge test system also include for by the current value of described voltage x current generation circuit and
Magnitude of voltage feeds back to the D/A converting circuit of described Programmable Logic Controller, the input of described D/A converting circuit
End is connected with described voltage x current generation circuit, and the outfan of described D/A converting circuit is able to programme with described
Controller connects.
Preferably, surge test system also includes relay, and the control end of described relay is compiled with described
Range controller connects, and the outfan of described relay is connected with described voltage x current generation circuit.
Preferably, described processor is connected with described oscillograph by RJ45 interface or USB interface.
Preferably, surge test system also includes for showing magnitude of voltage, the electric current that described processor obtains
Value and the display of abnormal prompt, described display is connected with described processor.
Preferably, surge test system also includes the current value for gathering described test sample and magnitude of voltage
Acquisition Circuit, the voltage and current of described Acquisition Circuit is detected and shows by described oscillograph.
The present invention also provides for the method for testing of a kind of surge test system, and this method of testing comprises the following steps:
A, processor read the voltage parameter of Programmable Logic Controller, by the voltage of described Programmable Logic Controller
Parameter judges whether voltage x current generation circuit exists exception；If existing abnormal, then perform step B, if
There is not exception, then perform step C；
B, described processor prompting abnormality, processes abnormal, then repeats step A；
C, described processor send operational order to described Programmable Logic Controller, described Programmable Logic Controller root
Control described voltage x current generation circuit according to described operational order test sample is tested；
Described test sample is carried out current value for D, described oscillograph and magnitude of voltage is acquired；
E, described processor access oscillograph and obtain described current value and the voltage that described oscillograph collects
Value；
The described current value got and magnitude of voltage are preserved to memorizer by F, described processor.
Preferably, performing to initialize before described step A described oscillograph and described serial ports controller
Parameter.
Preferably, when performing described step C, described D/A converting circuit is by voltage x current generation circuit
Magnitude of voltage and current value feed back to described Programmable Logic Controller, when described processor send operational order extremely
During described Programmable Logic Controller, described magnitude of voltage and current value are stored by described Programmable Logic Controller,
Described processor accesses described Programmable Logic Controller, obtains magnitude of voltage and current value and stores to described storage
In device.
The present invention controls Programmable Logic Controller by processor, and then controls voltage x current generation circuit to test
The test mode of sample.Oscillograph is for gathering and show residual voltage value and the current value of test sample.
Processor is again by accessing oscillograph, and then obtains residual voltage value and the current value of test sample, and will
Residual voltage value and current value store to memorizer.The present invention can permanently store the test of test sample
Data, the convenient user of data of this storage carries out statistical analysis to the test data of test sample.This
Invention overcome surge test equipment of the prior art can not store historical data and to cause user to be difficult to right
The test data of test sample carry out the defect of statistical analysis.
Accompanying drawing explanation
Fig. 1 is the module diagram of surge test system one embodiment of the present invention；
Fig. 2 is the schematic flow sheet of method of testing one embodiment of surge test system of the present invention.
The realization of the object of the invention, functional characteristics and advantage will in conjunction with the embodiments, do referring to the drawings further
Explanation.
Detailed description of the invention
Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not used to limit
Determine the present invention.
The present invention provides surge test system.
With reference to the module diagram that Fig. 1, Fig. 1 are surge test system one embodiment of the present invention.The present embodiment
, there is electricity including providing the voltage x current of high pressure and big electric current for test sample in the surge test system provided
Road 1, controls the Programmable Logic Controller 2 of voltage x current generation circuit 1 charge or discharge, and to test specimens
Product carry out magnitude of voltage and current value collection the oscillograph 3 shown.Surge test system also includes processor 4
With memorizer 5, processor 4 is connected with Programmable Logic Controller 2, and processor 4 is connected with oscillograph 3, place
Reason device 4 is connected with memorizer 5.Processor 4 sends operational order to Programmable Logic Controller 2, programmable control
Device 2 processed receives operational order and sends corresponding instruction control voltage x current generation circuit 1 charge or discharge,
Test sample is tested or interrupt test by voltage x current generation circuit 1 charge or discharge, oscillograph 3
Test sample carrying out current value and magnitude of voltage is acquired and shows, processor 4 accesses oscillograph 3,
Obtain current value and magnitude of voltage, and current value and magnitude of voltage are stored to memorizer 5.
Surge test is mainly and whether user is produced mortality after analog equipment is struck by lightning and endanger, the most residual
Stay voltage excessive or electric current is excessive.Surge test system produces high pressure and big electric current, and to test sample
Carry out high pressure and high-current test.
In the present embodiment, computer includes processor 4 and memorizer 5.Above-mentioned oscillograph 3 and able to programme
Controller 2 is connected with the processor 4 in computer.First oscillograph 3 and serial ports are controlled by processor 4
Device initializes.And it is whole to read Programmable Logic Controller 2 by modbus agreement at serial ports controller 6
The state of parameter.Mainly read in Programmable Logic Controller 2 and the voltage x current generation circuit 1 of record stores up
The magnitude of voltage of energy electric capacity.If the magnitude of voltage of the storage capacitor read is not zero, and voltage x current generation circuit 1
Do not discharge.Processor 4 will send aberrant commands and will be prompted to electricity to computer display, computer display
Current voltage generation circuit 1 does not discharges.Meanwhile, processor 4 can also carry out suitable abnormality processing.Different
The mode often processed has two kinds: one to be that processor 4 sends abnormality processing order to Programmable Logic Controller 2, can
Control voltage x current generation circuit 1 is discharged by programmable controller 2.Two is manual operation so that voltage electricity
Stream occurs circuit 1 to discharge, and releases abnormal.After abnormal releasing, transmission is started test command by processor 4
To Programmable Logic Controller 2.Test sample is entered by Programmable Logic Controller 2 by control voltage x current generation circuit 1
Row test.After test terminates, oscillograph 3 will obtain residual voltage and the current parameters of test sample, and
Show.Processor 4 is by VISA interface accessing oscillograph 3, and it is residual that acquisition oscillograph 3 collects
Stay the oscillogram of voltage, current parameters and display, and preserve further to memorizer 5.Should say
Bright, memorizer 5 can also is that the data base being arranged in processor 4 or data base's remote service
Device.User can also derive the test data of test sample from data base.Can also be from number in computer
According to storehouse is derived Excel form, thus facilitate user that the test data of test sample are carried out statistical analysis.
The present invention controls Programmable Logic Controller 2 by processor 4, and then controls voltage x current generation circuit 1
Test mode to test sample.Oscillograph 3 for gather and show test sample residual voltage value and
Current value.Processor 4 is again by accessing oscillograph 3, and then obtains residual voltage value and the electricity of test sample
Flow valuve, and residual voltage value and current value are stored to memorizer 5.The present invention can permanently store survey
The test data of test agent, the test data of test sample are carried out by the convenient user of data of this storage
Statistical analysis.Instant invention overcomes surge test equipment of the prior art can not store historical data and lead
Family of applying is difficult to that test sample is tested data and carries out the defect of statistical analysis.
Further, surge test system also includes for connecting processor 4 and Programmable Logic Controller 2
Serial ports controller 6, serial ports controller 6 input is connected with processor 4, outfan and Programmable Logic Controller
2 connect.
In the present embodiment, serial ports controller 6 mainly realizes the double of processor 4 and Programmable Logic Controller 2
To communication.Processor 4 can send a command to Programmable Logic Controller 2 by serial ports controller 6.The opposing party
Face, Programmable Logic Controller 2 also can pass through serial ports controller 6 by data signal transmission to processor 4.Such as,
The parameter signals such as charging interval, discharge time, magnitude of voltage and the current value of voltage x current generation circuit 1
All can be transmitted to processor 4 by serial ports controller 6.The signal received will be deposited by processor 4
Store up and show.
Further, surge test system also includes for by the current value of voltage x current generation circuit and electricity
Pressure value feeds back to the D/A converting circuit 7 of Programmable Logic Controller 2, the input of D/A converting circuit 7 and electricity
Current voltage generation circuit 1 connects, and the outfan of D/A converting circuit 7 is connected with Programmable Logic Controller 2.
In the present embodiment, the charging interval of voltage x current generation circuit, discharge time, magnitude of voltage and
Current value will feed back to Programmable Logic Controller 2 by D/A converting circuit 7.Processor 4 again can by access
Programmable controller 2 obtains the parameter of voltage x current generation circuit 1 and carries out showing and storing.
Further, the control end of relay K M is connected with Programmable Logic Controller 2, relay K M
Outfan is connected with voltage x current generation circuit 1.
In the present embodiment, Programmable Logic Controller 2 controls voltage x current send out by controlling relay K M
The charging and discharging of raw circuit 1.
Further, processor 4 is connected with oscillograph 3 by RJ45 interface or USB interface.
Further, surge test system also includes for showing magnitude of voltage, current value and abnormal prompt
Display 8, display 8 is connected with processor 4.
In this example it is shown that device 8 is connected with processor 4, processor 4 will obtain from oscillograph 3
The magnitude of voltage of the test sample taken and current value transmission show to display 8.It addition, processor 4
The parameter obtaining voltage x current generation circuit 1 from Programmable Logic Controller 2 can also be shown.If
There is abnormal situation in system, also can show abnormal in display 8.
Further, surge test system also includes for the current value of collecting test sample and magnitude of voltage
Acquisition Circuit 9, oscillograph 3 detects the voltage and current of Acquisition Circuit 9 and shows.
In the present embodiment, Acquisition Circuit 9 is connected to the power end of test sample, and sample circuit is to surge
Test sample after test carries out residual voltage collection and current acquisition.Oscillograph 3 is by two probe detections
Acquisition Circuit 9, thus the residual voltage in test sample and electric current are shown in oscillograph 3.
Show in conjunction with the flow process with reference to method of testing one embodiment that Fig. 2, Fig. 2 are surge test system of the present invention
It is intended to.The present invention also provides for the method for testing of a kind of surge test system.The test side that the present embodiment provides
Method comprises the following steps:
S10, processor 4 read the voltage parameter of Programmable Logic Controller 2, by Programmable Logic Controller 2
Voltage parameter judges whether voltage x current generation circuit 1 exists exception；If existing abnormal, then perform step
S20, if there is not exception, then performs step S30；
Abnormality pointed out by S20, processor 4, processes abnormal, then repeats step S10；
S30, processor 4 send operational order to Programmable Logic Controller 2, and Programmable Logic Controller 2 is according to connecing
The operational order received controls voltage x current generation circuit 1 and tests test sample；
Test sample is carried out current value for S40, oscillograph 3 and magnitude of voltage is acquired；
S50, processor 4 access oscillograph 3 and obtain current value and the magnitude of voltage that oscillograph collects；
The current value got and magnitude of voltage are preserved to memorizer 5 by S60, processor 4.
In the present embodiment, computer includes processor 4 and memorizer 5, and oscillograph 3 and programmable control
Device 2 processed is connected with computer.First oscillograph 3 and serial ports controller 6 are initialized by processor 4.
And read the state of the whole parameter of Programmable Logic Controller 2 at serial ports controller 6 by modbus agreement.Main
If reading the magnitude of voltage of storage capacitor in the voltage x current generation circuit 1 recorded in Programmable Logic Controller 2.
If the magnitude of voltage of the storage capacitor read is not zero, and voltage x current generation circuit 1 does not discharges.Processor 4
By transmission aberrant commands to display 8, display 8 will be prompted to voltage x current generation circuit 1 and do not discharges.With
Time, processor 4 can also carry out suitable abnormality processing.The mode of abnormality processing has two kinds: one to be place
Reason device 4 sends abnormality processing order and will control voltage x current to Programmable Logic Controller 2, Programmable Logic Controller 2
Circuit 1 is occurred to discharge.Two is manual operation so that voltage x current generation circuit 1 discharges, and releases abnormal.
After abnormal releasing, transmission is started test command to Programmable Logic Controller 2 by processor 4.Programmable Logic Controller
Test sample is tested by 2 by control voltage x current generation circuit 1.After test terminates, oscillograph 3 will
Obtain residual voltage and the current parameters of test sample, and show.Processor 4 is by VISA interface
Access oscillograph 3, obtain the oscillogram of residual voltage, current parameters and display that oscillograph 3 collects,
And preserve further to memorizer 5.It should be noted that, memorizer 5 can also is that and is arranged on process
Data base in device 4 or data base's far-end server.User can also derive test specimens from data base
The test data of product.Computer can also be derived from data base Excel form, thus facilitate user couple
The test data of test sample carry out statistical analysis.
When test sample is tested by voltage x current generation circuit 1, D/A converting circuit 7 is by voltage
The magnitude of voltage of current occuring circuit 1 and current value feed back to Programmable Logic Controller 2, and Programmable Logic Controller 2 is right
Magnitude of voltage and current value store, and processor 4 accesses Programmable Logic Controller 2, obtain magnitude of voltage and electric current
Value also stores to memorizer 5.On the other hand, the parameter obtained is carried out point by processor 4 the most further
Analysis, if finding there is exception in voltage x current generation circuit 1, and processor 4 will send aberrant commands to display
Device 8.Display 8, by abnormal for display, reminds user to carry out abnormal releasing.
The foregoing is only the preferred embodiments of the present invention, not thereby limit the scope of the claims of the present invention,
Every equivalent structure transformation utilizing description of the invention and accompanying drawing content to be made, or directly or indirectly use
In the technical field that other are relevant, the most in like manner it is included in the scope of patent protection of the present invention.
Claims (10)
1. a surge test system, sends out including providing the voltage x current of high pressure and big electric current for test sample
Raw circuit, controls the Programmable Logic Controller of described voltage x current generation circuit charge or discharge, and to institute
State test sample and carry out magnitude of voltage and current value collection the oscillograph shown；It is characterized in that, also include
Processor and memorizer, described processor is connected with Programmable Logic Controller, described processor and described oscillography
Device connects, and described processor is connected with described memorizer；
Described processor sends operational order and receives to described Programmable Logic Controller, described Programmable Logic Controller
Described operational order also sends corresponding instruction extremely described current/voltage generation circuit, and described voltage x current is sent out
Described test sample is tested or interrupt test by raw circuit according to the instruction received, described oscillograph
Current value and magnitude of voltage to described test sample are acquired and show, show described in the access of described processor
Ripple device, obtains described current value and magnitude of voltage, and stores described current value and magnitude of voltage to described storage
In device.
2. surge test system as claimed in claim 1, it is characterised in that also include for connecting described
Processor and the serial ports controller of described Programmable Logic Controller, described serial ports controller input and described place
Reason device connects, and outfan is connected with described Programmable Logic Controller.
3. surge test system as claimed in claim 1, it is characterised in that also include for by described electricity
The current value of current voltage generation circuit and magnitude of voltage feed back to the digital-to-analogue conversion electricity of described Programmable Logic Controller
Road, the input of described D/A converting circuit is connected with described voltage x current generation circuit, and described digital-to-analogue turns
The outfan changing circuit is connected with described Programmable Logic Controller.
4. surge test system as claimed in claim 1, it is characterised in that also include relay, described
The control end of relay is connected with described Programmable Logic Controller, the outfan of described relay and described voltage
Current occuring circuit connects.
5. surge test system as claimed in claim 1, it is characterised in that described processor passes through RJ45
Interface or USB interface are connected with described oscillograph.
6. surge test system as claimed in claim 1, it is characterised in that also include for showing described
The display of magnitude of voltage, current value and abnormal prompt that processor obtains, described display and described process
Device connects.
7. surge test system as described in claim 5 or 6, it is characterised in that also include for gathering
The current value of described test sample and the Acquisition Circuit of magnitude of voltage, described oscillograph is to described Acquisition Circuit
Voltage and current detects and shows.
8. the method for testing of a surge test system as claimed in claim 1, it is characterised in that bag
Include following steps:
A, processor read the voltage parameter of Programmable Logic Controller, by the voltage of described Programmable Logic Controller
Parameter judges whether voltage x current generation circuit exists exception；If existing abnormal, then perform step B, if
There is not exception, then perform step C；
B, described processor prompting abnormality, processes abnormal, then repeats step A；
C, described processor send operational order to described Programmable Logic Controller, described Programmable Logic Controller root
Control described voltage x current generation circuit according to described operational order test sample is tested；
Described test sample is carried out current value for D, described oscillograph and magnitude of voltage is acquired；
E, described processor access oscillograph and obtain described current value and the voltage that described oscillograph collects
Value；
The described current value got and magnitude of voltage are preserved to memorizer by F, described processor.
9. method of testing as claimed in claim 8, it is characterised in that described surge test system is also wrapped
Include the serial ports controller for connecting described processor and described Programmable Logic Controller, described serial ports controller
Input is connected with described processor, and outfan is connected with described Programmable Logic Controller, is performing described step
Described oscillograph and the parameter of described serial ports controller is initialized before rapid A.
10. method of testing as claimed in claim 8, it is characterised in that described surge test system is also
Including for the current value of described voltage x current generation circuit and magnitude of voltage are fed back to described PLC technology
The D/A converting circuit of device, the input of described D/A converting circuit is with described voltage x current generation circuit even
Connecing, the outfan of described D/A converting circuit is connected with described Programmable Logic Controller；Performing described step C
Time, described D/A converting circuit the magnitude of voltage of voltage x current generation circuit and current value are fed back to described can
Programmable controller, when described processor sends operational order to described Programmable Logic Controller, described compiles
Described magnitude of voltage and current value are stored by range controller, and described processor accesses described PLC technology
Device, obtains magnitude of voltage and current value and stores to described memorizer.
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| CN201310411043.4A CN103454534B (en) | 2013-09-10 | 2013-09-10 | Surge test system and method for testing thereof |
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| CN201310411043.4A CN103454534B (en) | 2013-09-10 | 2013-09-10 | Surge test system and method for testing thereof |
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| CN103454534B true CN103454534B (en) | 2016-08-10 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105184256B (en) * | 2015-09-06 | 2018-05-25 | 华南理工大学 | A kind of surge test Device under test status lamp image steganalysis method |
| CN105388373A (en) * | 2015-10-29 | 2016-03-09 | 威凯检测技术有限公司 | Surge detection process tested equipment state automatic recording and analyzing system |
| CN107192874A (en) * | 2016-03-15 | 2017-09-22 | 上海普锐马电子有限公司 | A kind of pulse residual voltage measuring system for lightning surge generator |
| CN110596502A (en) * | 2019-10-17 | 2019-12-20 | 天津通广集团振海科技有限公司 | Surge generation testing device and method based on microcontroller |
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| CN2672665Y (en) * | 2003-12-12 | 2005-01-19 | 杭州雷盾电子设备有限公司 | Detector for thunder and lighting surge |
| CN101629981A (en) * | 2009-05-19 | 2010-01-20 | 武汉大学 | Modularized multiple wave forms impact generator test device |
| CN201804066U (en) * | 2010-10-15 | 2011-04-20 | 北京清网华科技有限公司 | Intelligent detection instrument for surge protector of embedded system |
| CN102043107A (en) * | 2010-11-10 | 2011-05-04 | 株洲南车时代电气股份有限公司 | Cycle surge test device |
| CN102721892A (en) * | 2012-07-03 | 2012-10-10 | 上海凌世电磁技术有限公司 | Test piece failure distinguishing system and test piece failure distinguishing method for lightning surge test |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0625796B2 (en) * | 1989-10-23 | 1994-04-06 | 東京電力株式会社 | Surge measuring device |
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- 2013-09-10 CN CN201310411043.4A patent/CN103454534B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2672665Y (en) * | 2003-12-12 | 2005-01-19 | 杭州雷盾电子设备有限公司 | Detector for thunder and lighting surge |
| CN101629981A (en) * | 2009-05-19 | 2010-01-20 | 武汉大学 | Modularized multiple wave forms impact generator test device |
| CN201804066U (en) * | 2010-10-15 | 2011-04-20 | 北京清网华科技有限公司 | Intelligent detection instrument for surge protector of embedded system |
| CN102043107A (en) * | 2010-11-10 | 2011-05-04 | 株洲南车时代电气股份有限公司 | Cycle surge test device |
| CN102721892A (en) * | 2012-07-03 | 2012-10-10 | 上海凌世电磁技术有限公司 | Test piece failure distinguishing system and test piece failure distinguishing method for lightning surge test |
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Address after: Longgang District Buji street Shenzhen city Guangdong province 518000 Gan Keng community Gan Li Science Park Road No. 7 6 Gan Li Xia Wei Industrial Zone No. 4 Building 401A Applicant after: SHENZHEN KOVITEST TECHNOLOGY Co.,Ltd. Address before: 518000, Guangdong, Nanshan District, Taoyuan Shenzhen street, 1213 cents Xian Road, the crown Honghua District, 2 South District, 4, 4 floor Applicant before: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |
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Free format text: CORRECT: APPLICANT; FROM: SHENZHEN KOVI TEST ELECTRONICS TESTING COMPANY LIMITED TO: SHENZHEN KOVITEST TECHNOLOGY INCORPORATED CO., LTD. |
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Effective date of registration: 20180511 Address after: 518000 Nanshan District, Shenzhen, Guangdong, Guangdong Province, Nanshan District high street community, Shahe road 1819, Shenzhen Bay science and Technology Park 7 B block east area 506B Patentee after: Shenzhen Kewei Tess Technology Co.,Ltd. Address before: 518000 Shenzhen, Guangdong province Longgang District Buji street, Gan Keng community Gan Li Technology Park 7 Gan Li 6 Road No. 4 Industrial Park, 401A Patentee before: SHENZHEN KOVITEST TECHNOLOGY Co.,Ltd. |
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Granted publication date: 20160810 Termination date: 20210910 |