CN110488045B

CN110488045B - Anti-falling probe loading equipment

Info

Publication number: CN110488045B
Application number: CN201910860701.5A
Authority: CN
Inventors: 谢阳
Original assignee: Chongqing Medical and Pharmaceutical College
Current assignee: Chongqing Medical and Pharmaceutical College
Priority date: 2019-09-11
Filing date: 2019-09-11
Publication date: 2021-09-03
Anticipated expiration: 2039-09-11
Also published as: CN110488045A

Abstract

The application relates to the technical field of mechanical microscopes, and discloses anti-drop probe loading equipment which comprises a loading body, wherein tweezers are rotatably connected to the side part of the top surface of the loading body; the mounting body is provided with a mounting groove, the mounting groove extends along the length direction of the tweezers, an accommodating body is arranged in the mounting groove, the top of the accommodating body is provided with an accommodating groove, and the accommodating groove extends along the length direction of the tweezers and is positioned below the clamping ends of the tweezers; a plurality of fixing units for fixing the probes are arranged in the accommodating groove, and the bottom of each fixing unit is connected with a supporting column; the bottom of the accommodating body is provided with an adjusting unit for adjusting the height of the supporting columns, and the adjusting unit is connected with the bottoms of all the supporting columns. The scheme can prevent the probe from falling off in the moving and installing processes, and has a good protection effect on the probe.

Description

Anti-falling probe loading equipment

Technical Field

The invention belongs to the technical field of mechanical microscopes.

Background

An atomic force microscope is an analytical instrument that can be used to study the surface structure of solid materials, including insulators, by detecting the very weak interatomic interaction force between the surface of a sample to be measured and a miniature force sensitive element to study the surface structure and properties of the material. One end of a rectangular part (namely, a micro cantilever) which is extremely sensitive to weak force is fixed, and a micro needle point at the other end is close to a sample, so that the micro needle point interacts with the sample, and the acting force causes the rectangular part (namely, the micro cantilever) to deform or change the motion state.

The nanometer resolution of the atomic force microscope depends on a fine probe, and the probe is a precise product and is expensive to manufacture. Since different types of probes are required to be used for different types of tests, the atomic force microscope often needs to replace the probes during the use process to meet the corresponding test requirements. During the needle changing process, the probe to be changed needs to be taken out, and the replaced probe needs to be put into the probe rack. The probe is very small and light, so that the difficulty of installing the probe is increased, the influence of the skill of manual operation on the operation of an operator in the process of clamping the probe by the tweezers to install or disassemble is very large, the probe is easy to fall off due to unstable holding, the probe is damaged or even fails, the waste of resources and funds is caused, the operation of the machine table needs to be suspended by the operator, the atomic force microscope machine table is detected and maintained, and the time cost is additionally increased.

Disclosure of Invention

The invention aims to provide anti-falling probe loading equipment to solve the problem that probes are easy to fall off in the process of loading the probes on a probe rack in the background technology to cause damage of the probes.

In order to achieve the above object, a basic aspect of the present invention provides an anti-drop probe loading apparatus, including a loading body, a forceps rotatably connected to a side portion of a top surface of the loading body; the mounting body is provided with a mounting groove, the mounting groove extends along the length direction of the tweezers, an accommodating body is detachably connected in the mounting groove, the top of the accommodating body is provided with an accommodating groove, and the accommodating groove extends along the length direction of the tweezers and is positioned below the clamping ends of the tweezers; a plurality of fixing units for fixing the probes are arranged in the accommodating groove, and the bottom of each fixing unit is connected with a supporting column; the bottom of the accommodating body is provided with an adjusting unit for adjusting the height of the supporting columns, and the adjusting unit is connected with the bottoms of all the supporting columns.

The principle and the beneficial effect of the basic scheme are as follows:

the holding body of this scheme can dismantle the connection in the mounting groove for no matter need take off the probe on the probe frame, still remove the probe and install on the probe frame, the homoenergetic is suitable for, and can play good guard action, the probability that greatly reduced probe drops to the probe.

In the process of taking the probe down, the accommodating body is taken out and moved to the position near the probe rack, and then the probe is fixed and taken down through the fixing unit; in the probe installation, get up the probe centre gripping through tweezers earlier, rethread tweezers fix the probe transfer to the fixed unit on the container body in, adjust the height of bracing piece through the regulating unit at last for fixed unit stretches out holding tank certain distance, so that installs the probe. In the whole process, the fixing unit always keeps the limiting effect on the probe, the probe is prevented from falling off, the probe is well protected, the probability of falling off of the probe is reduced, and the problem that the probe easily falls off in the installation process is solved. And operating personnel can adjust the height of support column according to the operation demand to adjust the position of fixed unit direction of height, let fixed unit hold in the holding tank or stretch out the holding tank, so that operating personnel installs the probe or takes off the probe.

Optionally, the fixing unit includes a fixing seat fixed on the top of the support column and a limiting block located above the fixing seat, a fixing groove is formed in the fixing seat, the fixing groove is located below the clamping end of the tweezers, the width of the fixing groove is matched with the width of the probe, and the depth of the fixing groove is greater than the thickness of the probe; the two sides of the top of the fixed seat are provided with first magnets; the limiting block is in a convex shape, and the convex part of the limiting block is matched with the fixing groove; and second magnets matched with the first magnets are arranged on two sides of the bottom of the limiting block.

Through the inter attraction effect of first magnet and second magnet, can make the fixed slot of fixing base and the bulge of stopper carry on spacingly to the probe jointly, the bulge and the probe rectangle portion of stopper offset to fix, spacing the probe, prevent that the probe from droing at the removal in-process.

Optionally, a first cushion pad is arranged in the fixing groove.

The first cushion pad can play the effect of buffering to the probe, prevents that the probe from damaging because of rubbing with the fixing base in landing and installation.

Optionally, the protruding portion of the stopper is provided with a second cushion pad.

The second cushion can play the effect of buffering to the probe, prevents that the probe from damaging because of rubbing with the stopper in the installation.

Optionally, the centre line of the fixation slot and the centre line of the forceps are located on the same vertical plane.

The central line of fixed slot and the central line of tweezers are located same vertical face, guarantee that after tweezers centre gripping probe, can let in the probe more accurately landing fixed slot.

Optionally, the adjusting unit includes a movable cavity arranged in the accommodating body, the movable cavity is located below the accommodating groove, a sliding plate is connected in the movable cavity in a sliding manner, and the bottom of the supporting column penetrates through the movable cavity and is fixedly connected with the sliding plate; the slide bottom is equipped with the locating lever, and the body and seted up a plurality of locating hole are worn out to the locating lever bottom, and one of them locating hole fit has the locating pin.

Through the mutual cooperation of slide, locating lever, locating pin, the height of adjustable support column to the spacing and the installation needs of adaptation probe.

Optionally, an extension plate is arranged at one end of the accommodating body away from the forceps, a buckle for fixing the extension plate is arranged at the side part of the loading body, and a clamping end of the buckle presses the top surface of the extension plate.

The extension plate is pressed through the arrangement of the extension plate and the hasp, the accommodating body can be kept in a stable state in the installation groove, and the accommodating body is prevented from falling out in the process that an operator clamps the probe by using tweezers.

Optionally, the extension panel extends outside an edge of the load carrier.

The extension plate extends to the outer side of the edge part of the containing body, so that an operator can conveniently hold the extension plate to take out the containing body.

Optionally, a lifting plate is arranged at one end of the extension plate, which is far away from the accommodating body.

When the probe rack is installed, the lifting plate can be convenient for an operator to take out the accommodating body, and can be stably placed on the flat surface below the installation position of the probe rack in the process of installing the probe, so that the effect of assisting and enhancing the stability in the process of installing the probe is maintained, and the installation difficulty of the operator is reduced.

The lifting plate can facilitate the operator to take the accommodating body out of the mounting groove.

Optionally, the mounting body is provided with at least two limiting rods, and the limiting rods contact with the outer wall of the forceps before the probe is clamped.

The front limiting rod for clamping the probe is contacted with the outer wall of the tweezers, so that the central line of the tweezers is always kept unchanged, and the probe can more accurately slide into the fixing groove.

Drawings

FIG. 1 is a schematic structural view of an anti-drop probe loading apparatus according to embodiment 1 of the present invention;

FIG. 2 is an enlarged view of A in FIG. 1;

FIG. 3 is a longitudinal cross-sectional view of the receiving body of FIG. 2;

FIG. 4 is a schematic structural view after the probe slides off the fixing groove;

FIG. 5 is an enlarged view of B in FIG. 4;

FIG. 6 is a schematic view of the structure of the container after removal;

FIG. 7 is a schematic view of the structure of the accommodating body with the probe moving out of the accommodating groove;

FIG. 8 is a cross-sectional view of C-C of FIG. 7;

FIG. 9 is a schematic structural view of an anti-drop probe loading apparatus according to embodiment 2 of the present invention;

FIG. 10 is a schematic structural view of an anti-drop probe loading apparatus according to embodiment 3 of the present invention;

fig. 11 is a schematic structural view of an anti-drop probe loading apparatus according to embodiment 4 of the present invention.

Detailed Description

The following is further detailed by way of specific embodiments:

reference numerals in the drawings of the specification include: tweezers 1, loading body 2, mounting groove 3, accommodate body 4, holding tank 5, support column 6, first magnet 7, second magnet 8, stopper 9, fixing base 10, slide 11, activity chamber 12, locating lever 13, locating hole 14, locating pin 15, probe 16, carry and draw board 17, hasp 18, fixed slot 19, extension board 20, gag lever post 21, cutting 22, prevent falling frame 23.

Example 1

The anti-drop probe loading device is mainly composed of tweezers 1, a loading body 2, an accommodating body 4, a supporting column 6, a fixing unit and an adjusting unit, and is shown in the attached

drawings

1, 2 and 3. The length of the tweezers is 110mm, the height of the holding end of the tweezers 1 is 0.4-1.2mm, one end of the tweezers 1 is rotatably connected with the left part of the top surface of the carrier 2, and the holding end of the tweezers 1 is used for holding the rectangular part of the probe 16.

A cover (not shown) is fitted on the top of the carrier 2 to protect the tweezers 1 and other components during storage. At least two limiting rods 21 (not shown in the figure) are welded on the top surface of the loading body 2, and the two limiting rods 21 are welded on the top surface of the loading body 2, are respectively positioned at two sides of the tweezers 1, are in contact with the outer walls of the tweezers 1, and play a role in positioning the tweezers 1.

An installation groove 3 is opened to the right part of the top surface of the loading body 2, and the installation groove 3 extends along the length direction of the tweezers 1. The containing body 4 is placed in the mounting groove 3, and the containing body 4 can be taken out from the mounting groove 3. The top of the accommodating body 4 is provided with an accommodating groove 5, the accommodating groove 5 extends along the length direction of the tweezers 1 and is positioned right below the clamping end of the tweezers 1, so that the probe 16 can smoothly slide into the accommodating groove from the clamping end of the tweezers 1; the length of the probe 16 is 3mm and the length of the accommodating groove 5 is preferably 4-5mm so that the accommodating groove 5 can completely accommodate the probe 16.

A plurality of fixing units are arranged in the accommodating groove and used for fixing and limiting the probes 16 and preventing the probes 16 from falling off in the transferring process; the number of the fixing units is preferably two and distributed along the length direction of the accommodating tank 5, and the two fixing units are arranged in the middle of the accommodating tank 5 or in the right part of the accommodating tank, so that the probe can be well supported. The fixing unit mainly comprises a fixing seat 10, a limiting block 9, a first magnet 7, a second magnet 8, a first buffer pad, a second buffer pad and the like. Fixing base 10 is located holding tank 5, and fixed slot 19 is seted up at the middle part of fixing base 10, and fixed slot 19 is located tweezers 1 exposed core under, and the central line of fixed slot 19 and tweezers 1's central line are located same vertical face for probe 16 can be smoothly from tweezers 1's exposed core landing to in the fixed slot 19 in holding tank 5. The width of the fixed groove 19 is matched with the width of the probe 16, and the depth of the fixed groove 19 is greater than the thickness of the probe 16; a first cushion pad is installed in the fixing groove 19, and preferably, some lines may be formed on the upper surface of the first cushion pad to enhance the anti-slip performance, thereby further reducing the possibility that the probe 16 slips off the fixing groove 19. The top surfaces of the left part and the right part of the fixed seat 10 are fixedly connected with a first magnet 7; the limiting block 9 is in a convex shape, the convex part of the limiting block 9 is positioned in the middle of the bottom surface of the limiting block 9, and the convex part of the limiting block 9 is matched with the fixing groove 19 and can tightly abut against the rectangular part of the probe 16; a second cushion pad is fixedly arranged on the bottom surface of the protruding part of the limiting block 9, and the bottom surface of the second cushion pad is processed with grains to enhance the anti-skid performance and further reduce the possibility of the probe 16 slipping. The left side and the right side of the bottom of the limiting block 9 are both fixedly provided with a second magnet 8 matched with the first magnet 7.

The bottom surface of the fixing seat 10 of each fixing unit is welded with one supporting column 6, the bottom of the accommodating body 4 is provided with an adjusting unit for adjusting the height of the supporting column 6, and the adjusting unit is connected with the bottoms of all the supporting columns 6. The adjusting unit mainly comprises a movable cavity 12, a sliding plate 11, a positioning rod 13, a positioning pin 15 and other components, wherein the movable cavity 12 is arranged at the bottom of the accommodating body 4 and is positioned below the accommodating groove 5, the sliding plate 11 is vertically and slidably connected in the movable cavity 12, and the bottom of the supporting column 6 penetrates through the movable cavity 12 and is fixedly connected (preferably welded) with the sliding plate 11; the bottom of the sliding plate 11 is fixedly connected (preferably welded) with a positioning rod 13, the bottom of the positioning rod 13 penetrates through the accommodating body 4 and is provided with a plurality of positioning holes 14, the number of the positioning holes 14 is preferably three, and a positioning pin 15 is matched in one positioning hole 14. Preferably, a pressure spring is fixed at the bottom of the sliding plate 11, and one end of the pressure spring, which is far away from the sliding plate 11, is fixed in the movable cavity 12 or can abut against the movable cavity 12, so that after the positioning pin 15 is inserted into the positioning hole 14, the pressure spring can play a certain supporting role on the sliding plate 11, and the stability of the positioning pin 13 is enhanced.

An extension plate is welded at the right end of the accommodating body 4, the extension plate extends out of the right side of the loading body 2 and is welded with a pull plate 17, a buckle 18 is installed on one side face of the right part of the loading body 2, and the clamping end of the buckle 18 is pressed on the top face of the extension plate and is used for fixing the extension plate, so that the accommodating body 4 is fixed and the accommodating body 4 is prevented from sliding out of the installation groove 3. Specifically, the structure of the hasp 18 comprises a mounting plate, wherein an L-shaped clamping rod is rotatably connected to the mounting plate, the clamping rod is connected with a torsion spring, and the other end of the torsion spring is fixed to the mounting plate. During operation, under the effect of torsional spring, the supporting rod is pressed at the top surface of loading body 2, and the exposed core of supporting rod just can press the top surface at the extension board, fixes the extension board.

When the probe needs to be installed, the initial state is as follows: the limiting block 9 is positioned by matching the second magnet 8 with the first magnet 7, the clamping end of the tweezers 1 is positioned above the accommodating body 4, the tweezers are positioned between the two limiting rods 21, and the hasps 18 are pressed on the extending plate to fix the accommodating body 4 in the mounting groove 3; the cover body covers the carrier 2 and protects the entire carrier 2 and the components in the carrier 2. At this moment, fixing base 10 holds in holding tank 5, and the distance of fixed slot 19 bottom distance holding tank 5 bottom on fixing base 10 is greater than the height of probe 16 point portion for when probe 16 landing to fixed slot 19, no matter probe 16 point portion is up or down, probe 16 point portion all can not contact with holding tank 5 bottom, avoids damaging probe 16 point portion.

During operation, take off the lid earlier, reuse operating means (like other tweezers 1) and take out stopper 9 from holding tank 5, locating pin 15 inserts in locating hole 14 of locating lever 13 the top this moment, and fixing base 10 is located holding tank 5 completely.

Then, the tweezers 1 are rotated to make the holding ends of the tweezers 1 gradually far away from the top surface of the loading body 2 and perpendicular to the top surface of the loading body 2, and then rotated from the perpendicular state to far away from the top surface of the loading body 2 until the rotating ends of the tweezers 1 are parallel to and abut against the top surface of the loading body 2 again, as shown in fig. 4. At this time, the operator can grip the rectangular portion of the probe 16 with the gripping end of the forceps 1. After the probe is clamped, the operator moves the loading body to a flat workbench, then slowly rotates the tweezers to enable the clamping ends of the tweezers to gradually rotate back to the loading body, the tweezers enter between the two positioning rods (of course, the operator can also turn over the loading body 2 to enable the loading body 2 to be positioned above the tweezers 1, hold the tweezers 1 with one hand and clamp the rectangular part of the probe 16 by using the clamping ends of the tweezers 1. after the probe 16 is clamped, the operator holds the loading body 2 with the other hand and turns over the loading body 2 again to enable the loading body 2 to be positioned below the tweezers 1 again, and the loading body 2 is placed on the flat workbench).

At this time, the fixing groove 19 is located below the holding end of the tweezers 1, the probe 16 is located just above the fixing groove 19, and the holding end of the tweezers 1 is slightly released, so that the probe 16 slides into the fixing groove 19 in the accommodating groove 5 along the holding end of the tweezers 1. At this time, if the probe 16 is not correctly dropped into the fixing groove 19, the position of the probe 16 can be adjusted by using an operation tool (such as other tweezers 1), and since this process is completed in the housing groove 5, there is no case where the probe 16 is dropped.

After the probe 16 is dropped into the fixing groove 19, the rectangular portion thereof is fitted into the fixing groove 19. At this time, as shown in fig. 4, the holding end of the tweezers 1 is rotated out of the loading body 2, the operation tool (such as other tweezers 1) is used to replace the limit block 9 into the accommodating groove 5, and the second magnet 8 is attracted to the first magnet 7 and the protrusion of the limit block 9 is inserted into the fixing groove 19 and abuts against the rectangular portion of the probe 16, as shown in fig. 5, the top surface and the bottom surface of the rectangular portion of the probe 16 are both abutted against each other, and the side portion is limited by the fixing groove 19, so that the limit and the fixation of the probe 16 are realized. At this time, the tip of the probe 16 is exposed outside the fixing seat 10 and does not contact with the accommodating groove 5, the fixing seat 10 and the like, so that the tip of the probe 16 is ensured to be clean; and the head part (namely, the part for installation and connection) of the probe 16 is also exposed out of the fixed seat 10, so that an operator can conveniently install the probe 16 on the probe 16 rack.

Subsequently, as shown in fig. 6, 7 and 8, the operator opens the buckle 18, removes the entire accommodating body 4 from the mounting groove 3 by the pulling plate 17, and keeps the accommodating body 4 in a vertical state, and since the probe 16 is fixed by the two fixing units at this time, the falling-off does not occur. At this moment, take off locating pin 15 and with locating lever 13 towards the direction promotion that is close to holding tank 5, locating lever 13 promotes the bracing piece through slide 11 and moves outside holding tank 5, lets fixing base 10 part roll-off holding tank 5, exposes the head of probe 16 outside holding tank 5 to insert locating pin 15 in the suitable locating hole 14 in position, make locating pin 15 hug closely the body 4 bottom surfaces that hold, realize locating lever 13's location. At this time, the head of the probe 16 is exposed outside the accommodating groove 5, which facilitates the operator to mount the probe 16 on the probe holder.

After the installation is completed, the stopper 9 is removed, and the accommodating body 4 is slightly moved to remove the probe 16 from the fixing groove 19, at which time the probe 16 is completely separated from the loading device. Finally, the fixing seat 10 is returned to the receiving groove 5 by moving the positioning rod 13, the receiving body 4 is returned to the mounting groove 3, and the extending plate 20 is pressed again by the buckle 18.

If the probe 16 needs to be taken off from the probe 16 rack, the accommodating body 4 is taken out and moved to the vicinity of the probe 16 rack, and then the probe 16 is fixed and the probe 16 is taken off by the fixing unit, and the taking out and using of the accommodating body 4 and the using of the fixing unit are described in detail in the foregoing installation process of the probe 16, and will not be described again here.

This scheme of adoption, probe 16 can transfer to fixed unit relatively fast after the centre gripping is got up and fix, and utilize whole accommodate body 4 to remove as bearing, thereby ensure probe 16 at the removal process, can not drop in the installation, compare this kind of mode that adopts the direct centre gripping of tweezers 1 in prior art, fixed effect to probe 16 is more stable and difficult for dropping, the harmful effects that the human factor caused to the installation of probe 16 has been reduced, very important progress meaning has, and whole operation process and equipment structure are not complicated, general operating personnel all can directly go to the hand.

Example 2

The difference between this embodiment and embodiment 1 is that, in this embodiment, as shown in fig. 9, the left and right sides of the fixing seat 10 are inclined toward the fixing groove 19, and the first magnet 7 is fixedly mounted on the side of the fixing seat 10 in an inclined state. Correspondingly, the two sides of the bottom surface of the limiting block 9 are also obliquely arranged towards the protruding part, and the second magnets 8 are fixedly arranged on the two sides of the limiting block 9 and matched with the first magnets 7.

With such an arrangement, the probe 16 can fall into the fixing groove 19 more accurately, and even if the probe 16 initially slides down to the top surface of the first magnet 7, the probe 16 can also slide down into the fixing groove 19 along the top surface of the first magnet 7, which is arranged obliquely, so as to fix the probe 16 subsequently.

Example 3

The present embodiment is different from embodiment 1 in that: in this embodiment, as shown in fig. 10, the two sides of the limiting block 9 are both provided with the inserting strips 22, and the inserting strips 22 are located at the outer side of the second magnet 8; the both sides of fixing base 10 are seted up and are put relative and matched with joint groove with cutting 22, and cutting 22 joint is in the joint inslot.

By the design, the stability of connection between the limiting block 9 and the fixing seat 10 can be enhanced, and the stability of the probe 16 is further enhanced.

Example 4

The present embodiment is different from embodiment 1 in that: in this embodiment, as shown in fig. 11, a supporting rod is fixedly connected to a side of one of the fixed seats 10 close to the extending plate 20 (a side close to the extending plate 20), an end of the supporting rod is fixedly connected to an anti-drop frame 23, and an opening of the anti-drop frame 23 faces to the fixing groove 19 of the fixed seat 10, so as to prevent the probe 16 from directly falling to the ground due to unstable fixation. Preferably, a buffering cotton is disposed on a surface of the drop-preventing frame 23 facing the opening to protect the tip of the probe 16. The distance from the falling-prevention frame 23 to the fixing base 10 is preferably set so as not to affect the falling of the probe 16 into the fixing groove 19.

With such a design, when an operator takes off the probe 16 or installs the probe 16, if the fixing effect of the fixing unit is reduced due to human factors to cause the probe 16 to fall off, the probe 16 can fall into the falling-off prevention frame 23, thereby protecting the probe 16.

The foregoing is merely an example of the present invention and common general knowledge of known specific structures and features of the embodiments is not described herein in any greater detail. It should be noted that, for those skilled in the art, without departing from the structure of the present invention, several changes and modifications can be made, which should also be regarded as the protection scope of the present invention, and these will not affect the effect of the implementation of the present invention and the practicability of the patent. The scope of the claims of the present application shall be determined by the contents of the claims, and the description of the embodiments and the like in the specification shall be used to explain the contents of the claims.

Claims

1. Anti-drop type probe loading apparatus, its characterized in that: comprises a loading body, wherein the side part of the top surface of the loading body is rotationally connected with tweezers; the mounting body is provided with a mounting groove, the mounting groove extends along the length direction of the tweezers, an accommodating body is detachably connected in the mounting groove, the top of the accommodating body is provided with an accommodating groove, and the accommodating groove extends along the length direction of the tweezers and is positioned below the clamping ends of the tweezers; a plurality of fixing units for fixing the probes are arranged in the accommodating groove, and the bottom of each fixing unit is connected with a supporting column; the fixed unit comprises a fixed seat fixed at the top of the supporting column and a limiting block positioned above the fixed seat, the fixed seat is provided with a fixed groove, the fixed groove is positioned below the clamping end of the tweezers, the width of the fixed groove is matched with that of the probe, and the depth of the fixed groove is greater than the thickness of the probe; the two sides of the top of the fixed seat are provided with first magnets; the limiting block is in a convex shape, and a convex part of the limiting block is matched with the fixing groove and can be abutted against the probe; and second magnets matched with the first magnets are arranged on two sides of the bottom of the limiting block.

2. The drop-off prevention type probe loading apparatus according to claim 1, wherein: a first buffer cushion is arranged in the fixing groove.

3. The drop-off prevention type probe loading apparatus according to claim 1, wherein: and a second cushion pad is arranged on the projecting part of the limiting block.

4. The drop-off prevention type probe loading apparatus according to claim 1, wherein: the central line of the fixing groove and the central line of the tweezers are positioned on the same vertical surface.

5. The drop-off prevention type probe loading apparatus according to claim 1, wherein: the adjusting unit comprises a movable cavity arranged in the accommodating body, the movable cavity is positioned below the accommodating tank, a sliding plate is connected in the movable cavity in a sliding manner, and the bottom of the supporting column penetrates into the movable cavity and is fixedly connected with the sliding plate; the slide bottom is equipped with the locating lever, and the body and seted up a plurality of locating hole are worn out to the locating lever bottom, and one of them locating hole fit has the locating pin.

6. The drop-off prevention type probe loading apparatus according to claim 1, wherein: the one end that the body kept away from the tweezers is equipped with the extension board, and loader side is equipped with the hasp that is used for fixed extension board, and the exposed core of hasp is pressed at the top surface of extension board.

7. The drop-off prevention type probe loading apparatus according to claim 6, wherein: the extension panel extends outside an edge of the package carrier.

8. The drop-off prevention type probe loading apparatus according to claim 7, wherein: and one end of the extension plate, which is far away from the accommodating body, is provided with a lifting plate.

9. The drop-off prevention type probe loading apparatus according to claim 1, wherein: the probe clamping device is characterized in that at least two limiting rods are arranged on the loading body, and the limiting rods are in contact with the outer wall of the tweezers before the probe is clamped.