CN110487425A - A kind of wavefront sensing methods and its device based on defocus type light-field camera - Google Patents
A kind of wavefront sensing methods and its device based on defocus type light-field camera Download PDFInfo
- Publication number
- CN110487425A CN110487425A CN201910789006.4A CN201910789006A CN110487425A CN 110487425 A CN110487425 A CN 110487425A CN 201910789006 A CN201910789006 A CN 201910789006A CN 110487425 A CN110487425 A CN 110487425A
- Authority
- CN
- China
- Prior art keywords
- wavefront
- measured
- microlens array
- aperture
- sub
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 26
- 230000011218 segmentation Effects 0.000 claims abstract description 3
- 239000011159 matrix material Substances 0.000 claims description 28
- 230000004075 alteration Effects 0.000 claims description 27
- 230000003287 optical effect Effects 0.000 claims description 21
- 238000001514 detection method Methods 0.000 claims description 9
- 238000011084 recovery Methods 0.000 claims description 8
- 238000012545 processing Methods 0.000 claims description 5
- 230000008521 reorganization Effects 0.000 claims 2
- 238000005259 measurement Methods 0.000 abstract description 20
- 230000000007 visual effect Effects 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 13
- 230000003044 adaptive effect Effects 0.000 description 8
- 230000006798 recombination Effects 0.000 description 6
- 238000005215 recombination Methods 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 210000001747 pupil Anatomy 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 239000003550 marker Substances 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 101000911390 Homo sapiens Coagulation factor VIII Proteins 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 102000057593 human F8 Human genes 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 230000008447 perception Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 229940047431 recombinate Drugs 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J2009/002—Wavefront phase distribution
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention discloses a kind of Wavefront detecting devices of defocus type light-field camera, comprising: convergent lens, for assembling the wavefront to be measured；Microlens array is split for being formed by hot spot to the convergent lens convergence wavefront to be measured；Ccd detector, for receiving microlens array to the spot array information formed after hot spot segmentation, the microlens array is equal to the lenticule unit focal length at a distance from the ccd detector；It is defocusing amount f that the microlens array, which is located at the focal length of the convergent lens,defcousPlace；The defocusing amount is fdefcous=rnf, n are the pixel number of ccd detector corresponding to a lenticule unit in microlens array, and f is the focal length of lenticule unit, and r indicates the lenticule unit number that the hot spot of equivalent sub-aperture occupies.The invention also discloses a kind of wavefront sensing methods based on defocus type light-field camera.Through the invention can visual field, dynamic range, measurement accuracy to Wavefront detecting optimize.
Description
Technical field
The present invention relates to wavefront sensing art, in particular to a kind of wavefront sensing methods and its device.
Background technique
The novel optical technology that adaptive optics grows up as recent decades utilizes opto-electronic device real-time measurement
The dynamic error of wavefront, and calculated and controlled by the computer system of high speed, carry out active device to wavefront real-time
Correction.Adaptive optics makes optical system have automatic adaptation change of external conditions, the ability of good working state is kept, in height
Resolution imaging and laser transmission field have important application.
Wavefront sensor is the important component of adaptive optics system, and wherein adaptive optical technique mainly passes through survey
The first derivative (slope) or second dervative (curvature) for measuring wavefront distortion carry out wavefront sensing.Shack-Hartmann sensor is mesh
Preceding most widely used Wavefront sensor, it divides incident wavefront using microlens array, measures the flat of corrugated in each sub-aperture
Equal slope, and then restore wave front aberration out.Shack-Hartmann sensor is with compact-sized, the efficiency of light energy utilization is high and can work
In a variety of advantages such as continuous or pulse target, but simultaneously on that there is also dynamic ranges is smaller, weak light detection scarce capacity and be difficult to
The defects of adjusting the spatial resolution of wavefront measurement.A kind of rectangular pyramid Wavefront sensor is proposed in Ragazzoni in 1996,
Basic principle is that light beam focuses on tetragonous conical point light splitting afterwards, passes through the strength difference meter on test surface between four sub- pupil images
Calculate wavefront slope local.Rectangular pyramid Wavefront sensor has the spatial resolution higher than Hartmann sensor, when closed-loop corrected
Sensitivity and weak light detection ability it is also more prominent.
In addition it is proposed in Zelanian Clare and Lane in 2003 and a kind of microlens array is placed on object lens back focal plane
And the method for combining CCD photoelectric detector to carry out Wavefront detecting.However wavefront sensing methods in the prior art exist because micro-
There are certain size (the usually several times of diffraction limit) and the measurement accuracy of light-field camera Wavefront sensor to be believed in mirror aperture
The restriction of number saturated phenomenon, and lead to that more rough wavefront measurement can only be carried out, and make defocus type Wavefront sensor adaptive
The problem of answering the application in optical technology to be subject to certain restrictions.
Summary of the invention
The present invention is directed to solve at least some of the technical problems in related technologies.A mesh of the invention
Be to provide a kind of high measurement accuracy, structure be simple, agree with adaptive optics development trend based on defocus type light-field camera
Wavefront detecting device.
For this purpose, a second object of the present invention is to provide a kind of big visual field, Larger Dynamic range, high measurement accuracy, structure letters
The wavefront sensing methods of defocus type light-field camera that is single, agreeing with adaptive optics development trend.
The technical scheme adopted by the invention is that:
In a first aspect, the present invention provides a kind of Wavefront detecting device based on defocus type light-field camera, comprising:
Convergent lens, for assembling the wavefront to be measured；
Microlens array is split for being formed by hot spot to the convergent lens convergence wavefront to be measured；
Ccd detector, for receiving microlens array to the spot array information formed after hot spot segmentation, the lenticule
Array is equal to the lenticule unit focal length at a distance from the ccd detector；
It is defocusing amount f that the microlens array, which is located at the focal length of the convergent lens,defcousPlace；The defocusing amount
For fdefcous=rnf, n are the pixel number of ccd detector corresponding to a lenticule unit in microlens array, and f is
The focal length of lenticule unit, r indicate the lenticule unit number that the hot spot of equivalent sub-aperture occupies.
It further, further include optical match system, the optical match system is set to convergent lens input terminal, and being used for will
Wavefront to be measured is matched to convergent lens.
It further, further include processing module, the processing module is used to recombinate the spot array equivalent to obtain
Sub-aperture image, after the centroid offset that tested wavefront is calculated by equivalent sub-aperture image, using restructuring matrix calculate to
Each rank Zernike aberration coefficients of wavefront are surveyed, to obtain the phase distribution of wavefront to be measured.
Further, further include each rank Zernike aberration coefficients derivation algorithm for calculating wavefront to be measured:
(1) it by detection device before the wave incoming wave of ideal plane, recombinates equivalent sub-aperture image and calculates in each sub-aperture later
Centroid position S0x,S0y；
(2) assume that wavefront to be measured can be completely represented by preceding k rank Zernike aberration, k rank Zernike picture before being sequentially generated
Input of the difference as Wavefront detecting device, recombination Wavefront detecting device are equivalent sub-aperture image, are calculated in each sub-aperture
Centroid position and the centroid offset Δ S fashionable relative to plane wavekx(n)=Skx(n)-S0x(n), Δ Sky(n)=Sky(n)-
S0y(n)；
(3) centroid offset of each rank Zernike aberration obtained in step (2) is arranged according to the form of formula (1), is obtained
To recovery matrix D2n×k。
(4) generalized inverse matrix for calculating recovery matrix, obtains restructuring matrix D+；
(5) when wavefront to be measured is incident on light-field camera Wavefront sensor, by ccd image according to side described in step 2
Formula recon subaperture image simultaneously calculates centroid offset, obtains vector
G=[Δ Sx(1),ΔSy(1),ΔSx(2),ΔSy(2),…ΔSx(n),ΔSy(n)]T (2)
(6) each rank Zernike aberration coefficients for including in wavefront to be measured can pass through A=D+G is acquired.
Further, the F number of the lenticule member is the integral multiple of the F number of the convergent lens.
Further, the ccd detector Pixel Dimensions and the aperture of single lenticule member match.
Further, the aperture of the lenticule unit is the integral multiple of the ccd detector Pixel Dimensions.
Further, the focal length of each lenticule unit in the microlens array is equal, and the lenticule unit is filled out
The factor is filled greater than 99%, and transmitance is greater than 99%, and the microlens array is equal to lenticule list at a distance from the ccd detector
First focal length.
Further, the microlens array is refraction type microlens array or reflective microlens array or binary diffraction
Element.
Second aspect, the present invention provide a kind of wavefront sensing methods of defocus type light-field camera, comprising:
Wavefront to be measured is assembled using convergent lens；
It wavefront to be measured is assembled to the convergent lens using microlens array is formed by hot spot and be split and form light
Spot array, the microlens array include multiple lenticule units；
Using ccd detector, the spot array optical signal is received；
The defocusing amount of the convergent lens and the lens array is fdefcous=rnf, n are one in microlens array
The pixel number of ccd detector corresponding to a lenticule unit, f are the focal length of lenticule unit, and r indicates the light of equivalent sub-aperture
The lenticule unit number that spot occupies.
Further, further includes:
The optical signal of the spot array is received by the ccd detector, and is recombinated to obtain equivalent sub-aperture image,
After the centroid offset for calculating wavefront to be measured by equivalent sub-aperture image, each rank of wavefront to be measured is calculated using restructuring matrix
Zernike aberration coefficients, to obtain the phase distribution of wavefront to be measured.
Further, further includes:
Each rank Zernike aberration coefficients that wavefront to be measured is calculated using restructuring matrix, to obtain the phase of wavefront to be measured
Bit distribution specifically includes sub-step:
(1) ideal plane wave is inputted into light-field camera Wavefront sensor, recombinates equivalent sub-aperture image and calculates each son later
Centroid position S in aperture0x,S0y；
(2) assume that wavefront to be measured can be completely represented by preceding k rank Zernike aberration, k rank Zernike picture before being sequentially generated
Input of the difference as light-field camera Wavefront sensor, recombination light-field camera image are equivalent sub-aperture image, calculate each sub-aperture
Centroid position and the centroid offset Δ S fashionable relative to plane wave in diameterkx(n)=Skx(n)-S0x(n), Δ Sky(n)=
Sky(n)-S0y(n)；
(3) centroid offset of each rank Zernike aberration obtained in step (2) is arranged according to the form of formula (1), is obtained
To recovery matrix D2n×k；
(4) generalized inverse matrix for calculating recovery matrix, obtains restructuring matrix D+；
(5) when wavefront to be measured is incident on light-field camera Wavefront sensor, by ccd image according to side described in step 2
Formula recon subaperture image simultaneously calculates centroid offset, obtains vector
G=[Δ Sx(1),ΔSy(1),ΔSx(2),ΔSy(2),…ΔSx(n),ΔSy(n)]T (2)
(6) each rank Zernike aberration coefficients for including in wavefront to be measured can pass through A=D+G is acquired.
The beneficial effects of the present invention are:
The present invention overcomes and exists in the prior art because of lenticule by using the mode technological means of microlens array defocus
Aperture has certain size (the usually several times of diffraction limit) and the measurement accuracy of light-field camera Wavefront sensor by signal
The restriction of saturated phenomenon, and lead to the technical issues of can only carrying out more rough wavefront measurement, it realizes simple with structure
Optical system carries out the measurement of big visual field, Larger Dynamic range, high measurement accuracy to wavefront.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of the wavefront sensing methods based on defocus type light-field camera of the present invention；
Fig. 2 is a kind of cross-sectional view of the wavefront sensing methods based on defocus type light-field camera of the present invention；
Fig. 3 is a kind of structural representation of the data recombination of the wavefront sensing methods based on defocus type light-field camera of the present invention
Figure；
Fig. 4 is that a kind of microlens array defocusing amount of the wavefront sensing methods based on defocus type light-field camera of the present invention calculates
Structural schematic diagram；
Fig. 5 A is the detection figure for inputting wavefront to be measured；
Fig. 5 B is the distribution schematic diagram for inputting the Zernike multinomial coefficient of wavefront to be measured；
Fig. 6 A is the detection figure that existing light-field camera reconstructs wavefront to be measured；
Fig. 6 B is the Zernike multinomial of existing light-field camera wavefront reconstruction Zernike multinomial coefficient and wavefront to be measured
The comparison diagram distribution schematic diagram of coefficient；
Fig. 7 A is the detection figure that defocus type light-field camera reconstructs wavefront to be measured；
Fig. 7 B is that defocus type light-field camera wavefront reconstruction Zernike multinomial coefficient and the Zernike of wavefront to be measured are multinomial
The distribution schematic diagram of the comparison diagram of formula coefficient.
Specific embodiment
It should be noted that in the absence of conflict, the features in the embodiments and the embodiments of the present application can phase
Mutually combination.
F number: the i.e. inverse of relative aperture.
Referring to Fig. 1, Fig. 1 is a kind of structural representation of the Wavefront detecting device based on defocus type light-field camera of the present invention
Figure.It specifically includes optical match system 1, convergent lens 2, microlens array 3, ccd detector 4.
In the output end of optical match system 1, one convergent lens 2, and the output face and convergence of optical match system 1 are set
The front focal plane of lens 2 coincides；One microlens array 3 is set near the back focal plane of convergent lens 2, and there are certain defocus
Amount, sets in the output end of microlens array 3 to a ccd detector 4, for receiving optical signal.Wherein microlens array 3 includes pressing
Multiple identical lenticule units of certain periodic arrangement in approximately the same plane.
Optical match system 1 is used to carry out premodulated to wavefront to be measured, is such as directional light and incidence by wavefront modification to be measured
To convergent lens 2.The F number (i.e. the inverse of relative aperture) and the F number of convergent lens 2 of microlens array 3 match, micro- to guarantee
The aliasing of pixel made full use of and do not generate data, the distance between ccd detector 4 and microlens array 3 are equal under lens
The focal length of above-mentioned lenticule.Wavefront distortion to be measured is formed on microlens array 3 by optical match system 1 and convergent lens 2
The hot spot of certain area, microlens array 3 are split hot spot and are imaged as spot array on ccd detector 4.By right
The image that ccd detector 4 receives, which carries out recombination, can be obtained equivalent sub-aperture image, calculate the centroid offset of tested wavefront
Afterwards, it is calculated using restructuring matrix
Referring to Fig. 2, Fig. 2 is the cross-sectional view of the Wavefront detecting device based on defocus type light-field camera.Pass through convergent lens 2
Front focal plane point A light, successively pass through convergent lens 2 and microlens array 3, and expose to CCD detection after reflecting
On device 4, and illuminate the pixel on ccd detector 4.Wherein no matter how the incident direction of light changes, and is existed by the light of A point
The direction of propagation after lenticule reflects is parallel to each other.The pixel illuminated on ccd detector 4 and corresponding microlens array
The relative position of 3 lenticule unit is fixed.
In other change embodiments, the structure that other lenses can be designed according to the difference of application scenarios replaces convergent lens
2, to obtain the wavefront sensing visual field of higher wavefront measurement sensitivity or bigger.It such as can in big visual field adaptive optical technique
Increase detection viewing field using lens group；Or shorten system dimension using telephoto lens structure.
Micro- transmission lens array 3 is refraction type microlens array in the present embodiment, in other change embodiments, can be taken
Realize that other element arrays of microlens array function, such as reflective microlens array utilize binary diffraction element.
In other change embodiments, object-image conjugate system can be added between microlens array 3 and ccd detector 4, so as to
The spatial resolution of wavefront sensing is neatly adjusted, and reduces the assembly difficulty of light-field camera.
Referring to Fig. 3, Fig. 3 is the structural representation of the data recombination of the Wavefront detecting device based on defocus type light-field camera
Figure.It is illustrated in conjunction with multiple lenticule units of microlens array 3, by No. 1 in the pupil image of each lenticule unit
Pixel is reassembled as piece image according to putting in order for lenticule unit in microlens array 3, and reconstructed picture indicates one at entrance pupil
The light wave in region is determined in the hot spot of focal plane, is equivalent to the sub-aperture image of Hartmann sensor.
It illustrates and is described further with the process to data recombination below, it is assumed that microlens array 3 is one 300 rows 400 column
Lens array, i.e. microlens array 3 includes 1.2w lenticule unit, and each lenticule unit and 30*30 pixel
It is oppositely arranged.It can extract 30 × 30 sub-aperture images, every sub-aperture image is 300 × 400 pixels, the sub-aperture of centric angle
We are exactly the pixel value for extracting each lenticule center in order to diameter image, and it is new to be combined into a width again in order
300 × 400 image is exactly sub-aperture image.
It is further that we extract the pixel value of No. 1 pixel of the lenticule unit of (0,0) position, that is, sub-aperture
The pixel value of image (0,0) position, the pixel value of No. 1 pixel of the lenticule unit of (0,1) position are exactly sub-aperture image
The pixel value of (0,1) position, is sequentially analogized with this, the pixel value of No. 1 pixel until having extracted all lenticule units.With
This analogizes, and carries out pixel value extraction in all lenticule units to residual pixel to generate the sub-aperture figure of residual pixel
Picture.
The centroid offset of incident wavefront to be measured can be calculated using centroid algorithm, and then is recovered wavefront to be measured and included
Phase information.
Referring to Fig. 4, Fig. 4 is a kind of microlens array of the wavefront sensing methods based on defocus type light-field camera of the present invention
The structural schematic diagram that defocusing amount calculates.The wavefront measurement precision of light-field camera is generally by the lenticule unit in microlens array 3
Aperture determine, the aperture of lenticule unit is smaller, then slope measurement precision is higher.However, the aperture of lenticule unit is usual
For hundred micron dimensions, the facula area on 2 back focal plane of convergent lens is much smaller than the size of lenticule member unit, and light-field camera can not
Accurate perception centroid offset.Therefore by the way that microlens array 3 is placed in the back focal plane of convergent lens 2 after, to expand hot spot
Area.I.e. by introducing a defocusing amount, so that the size of facula area and lenticule member unit on 2 back focal plane of convergent lens
Match, it is preferred that the aperture of lenticule unit is the integral multiple of the ccd detector Pixel Dimensions, to make light-field camera
Centroid offset can accurately be perceived.
And the setting principle of defocusing amount is to guarantee that facula area of the equivalent sub-aperture on microlens array is greater than lenticule
The aperture of unit can specifically be expressed as fdefcous=rnf, wherein n is the CCD pixel number under single lenticule, and f is micro-
The focal length of lens, r indicate the lenticule unit number that the hot spot of equivalent sub-aperture occupies, and common value range is 2~4.
In this embodiment, the defocusing amount being calculated according to the method described above can guarantee that the hot spot in equivalent sub-aperture covers
Multiple lenticule units are covered, the measurement accuracy of wave front detector is improved.
The process of tested wavefront is restored using the present invention are as follows:
(1) ideal plane wave is inputted into wave front detector, recombinates equivalent sub-aperture image and calculates each sub-aperture endoplasm later
Heart position；
(2) assume that wavefront to be measured can be completely represented by preceding k rank Zernike aberration, k rank Zernike picture before being sequentially generated
The received spot array computing with words of wave front detector is equivalent sub-aperture image, meter by input of the difference as wave front detector
Calculate the centroid position and the centroid offset Δ S fashionable relative to plane wave in each sub-aperturekx(n)=Skx(n)-S0x(n),
ΔSky(n)=Sky(n)-S0y(n)；
(3) centroid offset of each rank Zernike aberration obtained in step (2) is arranged according to the form of formula (1), is obtained
To recovery matrix D.
(4) generalized inverse matrix for calculating recovery matrix D, obtains restructuring matrix；
(5) when the wavefront to be measured containing distortion is incident on light-field camera Wavefront sensor, by ccd image according to step
(2) mode recon subaperture image in simultaneously calculates centroid offset, obtains vector
G=[Δ Sx(1),ΔSy(1),ΔSx(2),ΔSy(2),…ΔSx(n),ΔSy(n)]T (2)
(6) each rank Zernike aberration coefficients for including in wavefront to be measured can pass through A=D+G is acquired.
The present invention utilizes the combination of convergent lens, microlens array and ccd detector, by optimization design optical texture,
Solve the low defect of existing light-field camera Wavefront sensor poor linearity, wavefront measurement precision, it is big to construct a kind of visual field,
Dynamic range is big, and measurement accuracy is high, the simple Wavefront sensor of structure.
Abscissa and ordinate at this to following each figures do parsing explanation.Wherein Fig. 5 A, Fig. 6 A, the left side in Fig. 7 A are vertical
Coordinate and bottom abscissa are used to indicate the space coordinate of wavefront, i.e. coordinate (0, the 0) center that is expressed as wavefront.Its right side
Ordinate then indicates Zernike multinomial coefficient.And shown in 5B, Fig. 6 B, Fig. 7 B, ordinate indicates Zernike system of polynomials
Number, abscissa indicate Zernike polynomial order.
Also referring to Fig. 5 A-5B, wherein Fig. 5 A is the schematic diagram for inputting wavefront to be measured, and Fig. 5 B is the corresponding input of Fig. 5 A
The Zernike multinomial coefficient of wavefront wavefront to be measured.
A-6B referring to Figure 6 together, wherein Fig. 6 A is the schematic diagram of existing light-field camera wavefront reconstruction result, and Fig. 6 B is figure
The comparison diagram of the Zernike multinomial coefficient of the Zernike multinomial coefficient and wavefront to be measured of the corresponding wavefront reconstruction result of 6A.
Circle marker is the Zernike multinomial coefficient of wavefront to be measured, and prismatic mark is the Zernike system of polynomials of wavefront reconstruction result
Number.Wavefront is detected and reconstructed with existing light-field camera, reconstruction result is as shown in Figure 6A.As shown in Figure 6B, with existing light
Field camera, which carries out the resulting Zernike multinomial coefficient of wavefront reconstruction and inputs wavefront Zernike multinomial coefficient to be measured, to be existed
Larger gap, residual error are about 0.4 λ, low measurement accuracy.
A-7B referring to Figure 7 together, wherein Fig. 7 A is the wavefront weight of the Wavefront detecting device based on defocus type light-field camera
The schematic diagram of structure result, Fig. 7 B are the Zernike multinomial coefficient and wavefront to be measured of the corresponding wavefront reconstruction result of Fig. 7 A
The comparison diagram of Zernike multinomial coefficient.Circle marker is the Zernike multinomial coefficient of wavefront to be measured, and rectangular mark is wave
The Zernike multinomial coefficient of preceding reconstruction result.As shown in Figure 7 B, it is resulting to carry out wavefront reconstruction for defocus row light-field camera
Zernike multinomial coefficient and input wavefront Zernike multinomial coefficient to be measured coincide substantially, and residual error is respectively less than 0.005 λ,
Its measurement accuracy is higher.Wavefront sensing methods i.e. provided by the present invention based on defocus type light-field camera and existing wavefront are visited
Survey method compares in measurement accuracy, and there are apparent effect of optimization.
The present invention also provides a kind of Wavefront detectings based on defocus type light-field camera corresponding with above-mentioned Wavefront detecting device
Method, for detecting wavefront to be measured.The method receives the optical signal of the spot array by the ccd detector, lays equal stress on
Group is to obtain equivalent sub-aperture image, after the centroid offset that wavefront to be measured is calculated by equivalent sub-aperture image, utilizes weight
Structure matrix calculates each rank Zernike aberration coefficients of wavefront to be measured, to obtain the phase distribution of wavefront to be measured.
It is to be illustrated to preferable implementation of the invention, but the invention is not limited to the implementation above
Example, those skilled in the art can also make various equivalent variations on the premise of without prejudice to spirit of the invention or replace
It changes, these equivalent deformations or replacement are all included in the scope defined by the claims of the present application.
Claims (10)
1. a kind of Wavefront detecting device of defocus type light-field camera characterized by comprising
Convergent lens, for assembling wavefront to be measured；
Microlens array is split for being formed by hot spot to the convergent lens convergence wavefront to be measured, described micro-
Lens array includes multiple lenticule units；
Ccd detector, for receiving the microlens array to the spot array information formed after hot spot segmentation, the lenticule
Array is equal to the lenticule unit focal length at a distance from the ccd detector；
It is defocusing amount f that the microlens array, which is located at the focal length of the convergent lens,defcousPlace；The defocusing amount is
fdefcous=rnf, n are the pixel number of ccd detector corresponding to a lenticule unit in microlens array, and f is micro-
The focal length of lens unit, r indicate the lenticule unit number that the hot spot of equivalent sub-aperture occupies.
2. Wavefront detecting device according to claim 1, which is characterized in that further include optical match system, the optics
Matching system is set to convergent lens input terminal, for wavefront to be measured to be matched to the convergent lens.
3. Wavefront detecting device according to claim 1, which is characterized in that it further include processing module, the processing module
For the spot array computing with words to be obtained to equivalent sub-aperture image, tested wave is calculated by equivalent sub-aperture image
After preceding centroid offset, each rank Zernike aberration coefficients of wavefront to be measured are calculated, using restructuring matrix to obtain wavefront to be measured
Phase distribution.
4. Wavefront detecting device according to claim 3, which is characterized in that
The processing module calculates each rank Zernike aberration coefficients of wavefront to be measured by following algorithm:
P1: it by detection device before the wave incoming wave of ideal plane, recombinates equivalent sub-aperture image and calculates mass center in each sub-aperture later
Position S0x,S0y；
P2: assuming that wavefront to be measured can be completely represented by preceding k rank Zernike aberration, k rank Zernike aberration is made before being sequentially generated
It is equivalent sub-aperture image, meter by the received spot array computing with words of Wavefront detecting device for the input of Wavefront detecting device
Calculate the centroid position and the centroid offset Δ S fashionable relative to plane wave in each sub-aperturekx(n)=Skx(n)-S0x(n),
ΔSky(n)=Sky(n)-S0y(n)；
P3: the centroid offset of each rank Zernike aberration obtained in step P2 is arranged according to the form of formula (1), is answered
Original matrix D2n×k；
P4: recovery matrix D is calculated2n×kGeneralized inverse matrix, obtain restructuring matrix D+；
P5: when wavefront to be measured is incident on Wavefront detecting device, by spot array computing with words sub-aperture image and mass center is calculated
Offset obtains vector
G=[Δ Sx(1),ΔSy(1),ΔSx(2),ΔSy(2),…ΔSx(n),ΔSy(n)]T (2)
P6: each rank Zernike aberration coefficients for including in wavefront to be measured can pass through A=D+G is acquired.
5. Wavefront detecting device according to claim 1, which is characterized in that the F number of the lenticule unit is less than described
The F number of convergent lens.
6. Wavefront detecting device according to claim 1, which is characterized in that the aperture of the lenticule unit is described
The integral multiple of ccd detector Pixel Dimensions.
7. Wavefront detecting device according to claim 1, which is characterized in that each lenticule list in the microlens array
The focal length of member is equal, and the fill factor of the lenticule unit is greater than 99%, and transmitance is greater than 99%.
8. a kind of wavefront sensing methods based on defocus type light-field camera, comprising:
Wavefront to be measured is assembled using convergent lens；
It wavefront to be measured is assembled to the convergent lens using microlens array is formed by hot spot and be split and form hot spot battle array
Column, the microlens array includes multiple lenticule units；
Using ccd detector, the microlens array of the ccd detector is placed in the focal plane of the microlens array
Place, to receive the spot array optical signal；
The defocusing amount of the convergent lens and the lens array is fdefcous=rnf, n are micro- for one in microlens array
The pixel number of ccd detector corresponding to lens unit, f are the focal length of lenticule unit, and r indicates that the hot spot of equivalent sub-aperture accounts for
According to lenticule unit number.
9. wavefront sensing methods according to claim 8, which is characterized in that further include:
The optical signal of the spot array is received by the ccd detector, and is recombinated to obtain equivalent sub-aperture image, is passed through
After equivalent sub-aperture image calculates the centroid offset of wavefront to be measured, each rank of wavefront to be measured is calculated using restructuring matrix
Zernike aberration coefficients, to obtain the phase distribution of wavefront to be measured.
10. wavefront sensing methods according to claim 9, which is characterized in that further include:
Each rank Zernike aberration coefficients of wavefront to be measured are calculated using restructuring matrix, to obtain the phase distribution of wavefront to be measured, tool
Body includes sub-step:
P1: ideal plane wave is inputted into defocus type light-field camera, and is recombinated to obtain equivalent sub-aperture image, each sub-aperture is calculated
Interior centroid position S0x,S0y；
P2: assuming that wavefront to be measured can be completely represented by preceding k rank Zernike aberration, k rank Zernike aberration is made before being sequentially generated
For the input of defocus type light-field camera, it is equivalent sub-aperture image that ccd detector, which is received image reorganization, calculates each sub-aperture
Interior centroid position and the centroid offset Δ S fashionable relative to plane wavekx(n)=Skx(n)-S0x(n), Δ Sky(n)=Sky
(n)-S0y(n)；
P3: the centroid offset of each rank Zernike aberration obtained in step (2) is arranged according to the form of formula (1), is answered
Original matrix D2n×k:
P4: the generalized inverse matrix of recovery matrix D is calculated, restructuring matrix D is obtained+；
P5: when wavefront to be measured is incident on defocus type light-field camera, simultaneously by the received image reorganization sub-aperture image of ccd detector
Centroid offset is calculated, vector is obtained
G=[Δ Sx(1),ΔSy(1),ΔSx(2),ΔSy(2),…ΔSx(n),ΔSy(n)]T(2)；
P6: each rank Zernike aberration coefficients for including in wavefront to be measured can pass through A=D+G is acquired.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910789006.4A CN110487425A (en) | 2019-08-26 | 2019-08-26 | A kind of wavefront sensing methods and its device based on defocus type light-field camera |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910789006.4A CN110487425A (en) | 2019-08-26 | 2019-08-26 | A kind of wavefront sensing methods and its device based on defocus type light-field camera |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110487425A true CN110487425A (en) | 2019-11-22 |
Family
ID=68553865
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910789006.4A Pending CN110487425A (en) | 2019-08-26 | 2019-08-26 | A kind of wavefront sensing methods and its device based on defocus type light-field camera |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110487425A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113188671A (en) * | 2021-04-27 | 2021-07-30 | 浙江大学 | Wavefront detection method based on cross iteration automatic position correction |
| CN113419247A (en) * | 2020-03-03 | 2021-09-21 | 华为技术有限公司 | Laser detection system |
| CN114323310A (en) * | 2021-12-28 | 2022-04-12 | 中国科学院光电技术研究所 | High-resolution Hartmann wavefront sensor |
| CN115980989A (en) * | 2023-01-09 | 2023-04-18 | 南开大学 | Single-frame quantitative phase tomography system and method based on microlens array |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030063257A1 (en) * | 2001-10-03 | 2003-04-03 | Vasyl Molebny | Method of measurement of wave aberrations of an eye and device for performing the same |
| CN101261161A (en) * | 2008-04-16 | 2008-09-10 | 中国科学院上海光学精密机械研究所 | Great dynamic range hartmann wavefront sensor and its test method |
| CN102721476A (en) * | 2012-05-30 | 2012-10-10 | 中国科学院光电技术研究所 | Large-caliber high-speed infrared laser measurement device based on PSD (phase-sensitive detector) array |
| CN103033260A (en) * | 2012-12-14 | 2013-04-10 | 中国科学院国家天文台南京天文光学技术研究所 | Wave surface separation and defocusing based phase retrieval wavefront analyzer and analytical method thereof |
| CN104198159A (en) * | 2014-07-31 | 2014-12-10 | 中国科学院长春光学精密机械与物理研究所 | Detection device and method for wave aberration of high-numerical aperture objective lens |
| CN106482838A (en) * | 2016-09-30 | 2017-03-08 | 中国科学院光电技术研究所 | A kind of Wavefront sensor based on auto-adapted fitting |
| CN106546326A (en) * | 2016-09-28 | 2017-03-29 | 中国科学院长春光学精密机械与物理研究所 | The wavefront sensing methods of multinomial pattern in Hartman wavefront detector sub-aperture |
| CN210893429U (en) * | 2019-08-26 | 2020-06-30 | 中国人民解放军国防科技大学 | Defocusing type light field camera wavefront sensor |
-
2019
- 2019-08-26 CN CN201910789006.4A patent/CN110487425A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030063257A1 (en) * | 2001-10-03 | 2003-04-03 | Vasyl Molebny | Method of measurement of wave aberrations of an eye and device for performing the same |
| CN101261161A (en) * | 2008-04-16 | 2008-09-10 | 中国科学院上海光学精密机械研究所 | Great dynamic range hartmann wavefront sensor and its test method |
| CN102721476A (en) * | 2012-05-30 | 2012-10-10 | 中国科学院光电技术研究所 | Large-caliber high-speed infrared laser measurement device based on PSD (phase-sensitive detector) array |
| CN103033260A (en) * | 2012-12-14 | 2013-04-10 | 中国科学院国家天文台南京天文光学技术研究所 | Wave surface separation and defocusing based phase retrieval wavefront analyzer and analytical method thereof |
| CN104198159A (en) * | 2014-07-31 | 2014-12-10 | 中国科学院长春光学精密机械与物理研究所 | Detection device and method for wave aberration of high-numerical aperture objective lens |
| CN106546326A (en) * | 2016-09-28 | 2017-03-29 | 中国科学院长春光学精密机械与物理研究所 | The wavefront sensing methods of multinomial pattern in Hartman wavefront detector sub-aperture |
| CN106482838A (en) * | 2016-09-30 | 2017-03-08 | 中国科学院光电技术研究所 | A kind of Wavefront sensor based on auto-adapted fitting |
| CN210893429U (en) * | 2019-08-26 | 2020-06-30 | 中国人民解放军国防科技大学 | Defocusing type light field camera wavefront sensor |
Non-Patent Citations (1)
| Title |
|---|
| 何宇龙等: "《动态调制型光场相机波前传感器的数值仿真》", 《光学学报》, vol. 39, no. 7, 10 July 2019 (2019-07-10), pages 1 - 2 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113419247A (en) * | 2020-03-03 | 2021-09-21 | 华为技术有限公司 | Laser detection system |
| CN113188671A (en) * | 2021-04-27 | 2021-07-30 | 浙江大学 | Wavefront detection method based on cross iteration automatic position correction |
| CN114323310A (en) * | 2021-12-28 | 2022-04-12 | 中国科学院光电技术研究所 | High-resolution Hartmann wavefront sensor |
| CN114323310B (en) * | 2021-12-28 | 2023-05-26 | 中国科学院光电技术研究所 | High-resolution Hartmann wavefront sensor |
| CN115980989A (en) * | 2023-01-09 | 2023-04-18 | 南开大学 | Single-frame quantitative phase tomography system and method based on microlens array |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110487425A (en) | A kind of wavefront sensing methods and its device based on defocus type light-field camera | |
| CN111220361B (en) | Method for measuring focal length of micro-lens array | |
| WO2014164550A2 (en) | System and methods for calibration of an array camera | |
| US5287165A (en) | High sensitivity-wide dynamic range optical tilt sensor | |
| JP2013186201A (en) | Imaging apparatus | |
| CN102735431B (en) | Method for measuring sight line stabilizing accuracy of photoelectric sight-stabilizing system | |
| CN111458045A (en) | Large-view-field wavefront detection method based on focal plane Hartmann wavefront sensor | |
| CN110631716B (en) | Compact Hartmann wavefront sensor | |
| CN104320598A (en) | Aberration-free image reconstruction method based on CCD array pixel response function frequency domain calibration | |
| JP2015055544A (en) | Wavefront measurement instrument, wavefront measurement method, method of manufacturing optical element, and assembly adjustment device of optical system | |
| CN106526839B (en) | A kind of pattern-based synchronization is without wavefront adaptive optics system | |
| CN108873321A (en) | Ultra-thin high resolution flat imaging detection system based on interference | |
| CN105589210A (en) | Digital synthetic aperture imaging method based on pupil modulation | |
| CN103226243B (en) | A kind of method and system correcting ADAPTIVE OPTICS SYSTEMS non-co-path error | |
| CN107147858A (en) | Image processing apparatus and its control method | |
| CN101001309A (en) | Imaging system and method | |
| CN105203213A (en) | Method for calculating restoring voltage of composite wave-front sensing self-adaptation optical system | |
| CN102914373A (en) | Hartmann wave-front sensor based on micro-cylindrical lens array | |
| NL2010457A (en) | Hartmann wavefront measuring instrument adapted for non-uniform light illumination. | |
| CN104501972B (en) | A kind of compound Shack Hartmann wave front sensor | |
| CN210893429U (en) | Defocusing type light field camera wavefront sensor | |
| CN102288392A (en) | Two-dimensional Ronchi grating-based freeform surface spectacle lens focal power measuring device | |
| CN102928196A (en) | Detection method and device for free-form surface lens | |
| CN112097923B (en) | Simple wavefront measurement method for optical element | |
| CN110248179A (en) | Camera pupil aberration correcting method based on light field coding |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |