CN110440955B - Response time test system for thermal resistance conditioning module - Google Patents
Response time test system for thermal resistance conditioning module Download PDFInfo
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- CN110440955B CN110440955B CN201910743718.2A CN201910743718A CN110440955B CN 110440955 B CN110440955 B CN 110440955B CN 201910743718 A CN201910743718 A CN 201910743718A CN 110440955 B CN110440955 B CN 110440955B
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Abstract
The invention discloses a response time testing system of a thermal resistance conditioning module, which comprises a preprocessing module for generating a testing signal for the thermal resistance conditioning module; the device also comprises an oscilloscope; the pre-processing module comprises an RTD conditioning signal loop and a signal amplification loop; the RTD conditioning signal loop comprises a V + end and an I + end of the RTD conditioning module, which are connected into a movable end of the switch 1, a resistor R1 and a resistor R2 are connected in parallel and then connected with the V-end and the I-end of the RTD conditioning module, and 2 immovable ends of the switch 1 are respectively connected with a resistor R1 and a resistor R2; the signal amplification loop comprises a positive electrode of a current source, a movable end of a change-over switch 2 is connected with the positive electrode of the current source, a resistor R3 and a resistor R4 are connected in parallel and then connected with a negative electrode of the current source, and 2 immovable ends of the change-over switch 2 are respectively connected with a resistor R3 and a resistor R4; a channel 1CH1 of the oscilloscope is connected with two poles of a current source; the selector switch 1 and the selector switch 2 are switched synchronously. And setting the voltage value of the current source to be higher than the ripple noise of the oscilloscope, and acquiring an output signal of the thermal resistance conditioning module by a channel 2CH2 of the oscilloscope.
Description
Technical Field
The invention relates to the technical field of nuclear power, in particular to a thermal resistance response time testing system for a nuclear power plant.
Background
Thermal resistance response time definition: the response time of the thermal resistance conditioning module is changed from the input signal of the thermal resistance conditioning module to the stable output of the thermal resistance conditioning module; in a conventional thermal resistance response time testing method, an oscilloscope probe is connected with an input and output test response time of a thermal resistance conditioning module, in a popular way, an oscilloscope is used for collecting the input end of a thermal resistance, the time when a signal at the input end changes is measured, meanwhile, the oscilloscope is used for collecting the output end of the thermal resistance, the corresponding time when the output changes is observed, and 2 times are subtracted, so that the response time can be obtained.
For the thermal resistance conditioning module for the nuclear power plant safety level DCS platform, when a conventional oscilloscope is adopted to directly collect signals of an input end and an output end, the following problems exist:
1. the thermal resistor for the safety-level DCS platform of the nuclear power plant is generally a PT100 sensor, the resistance range is 100-230 omega, the corresponding temperature range is 0-500 ℃, the excitation current of the thermal resistor is 200uA, and the input voltage range is 20mV-50mV, so that the output excitation current of the conditioning module to the thermal resistor is 200uA, during testing, a voltage signal of 20mV-50mV needs to be simulated as an input source to be connected to the conditioning module of the thermal resistor, but the ripple noise of the oscilloscope probe is up to dozens of mV, so that the oscilloscope probe is directly connected to the input end, the change points cannot be respectively generated, and the oscilloscope is difficult to judge the starting point of the response time of the thermal resistor.
2. Because the thermal resistance conditioning module for the safety level DCS platform of the nuclear power plant is generally high-speed ADC sampling output, the output range of the thermal resistance conditioning module is 4mA-20mA current signals, because the output signals are influenced by the processing of a hardware circuit and software filtering, the output signals are output after 2-3 sections of fluctuation change in each temperature change, so that the voltage values at two ends of the output load of the thermal resistance conditioning module have 3 sections of voltage values, (refer to figure 1), namely, after the thermal resistance conditioning module collects the signals, the output has 3 sections of output along with the change of the input signals due to the software and hardware filtering, the final section of waveform output by the thermal resistance module is determined as a response time terminal by using an oscilloscope for testing, because the testing response time needs to be repeatedly collected for many times and then the average value is taken, in the process of multiple collection, it is found that the voltage difference between the last segment and the last segment is small due to the regular change of the output waveform caused by the software processing relationship of the thermal resistor, and the oscilloscope is also difficult to judge the end point of the response time of the thermal resistor, and as shown in fig. 1, the voltage value of the second segment and the third segment output by the oscilloscope are very close to each other, so that the final stable output point is difficult to identify.
Disclosure of Invention
The invention aims to provide a response time testing system of a thermal resistance conditioning module, which mainly solves the problem that an oscilloscope is adopted to obtain the time point of the change of an input signal.
The specific technical scheme of the invention is as follows: a thermal resistance conditioning module response time test system comprises a pre-processing module for generating a test signal for a thermal resistance conditioning module; the device also comprises an oscilloscope;
the pre-processing module comprises an RTD conditioning signal loop and a signal amplification loop;
the RTD conditioning signal loop comprises an RTD conditioning module (a thermal resistance conditioning module), a resistor R1, a resistor R2 and a change-over switch 1, wherein a V + end and an I + end of the RTD conditioning module are connected into a moving end of the change-over switch 1, the resistor R1 and the resistor R2 are connected in parallel and then connected with the V-end and the I-end of the RTD conditioning module, and 2 fixed ends of the change-over switch 1 are respectively connected with the resistor R1 and the resistor R2;
the signal amplification loop comprises a current source, a resistor R3, a resistor R4 and a change-over switch 2; the positive pole of the current source is connected to the moving end of the change-over switch 2, the resistor R3 and the resistor R4 are connected in parallel and then connected with the negative pole of the current source, and 2 fixed ends of the change-over switch 2 are respectively connected with the resistor R3 and the resistor R4;
a channel 1CH1 of the oscilloscope is connected with two poles of a current source; the selector switch 1 and the selector switch 2 are switched synchronously.
And setting the voltage value of the current source to be higher than the ripple noise of the oscilloscope, and acquiring an output signal of the thermal resistance conditioning module by a channel 2CH2 of the oscilloscope.
In the above scheme, because the test object of the invention is a thermal resistance conditioning module with an input signal range of mV level, and in order to solve the problem of identification difficulty caused by direct acquisition of signals at the input end of the thermal resistance conditioning module by an oscilloscope, the invention sets a current source, a resistor R3 and a resistor R4 to form a signal amplification loop on the basis of the original test circuit, in the RTD conditioning module, a 24V power supply is connected from the outside, for the RTD conditioning signal loop, the state during actual working is simulated, and the V + and I + ends output 200uA currents, under the background, loading R1 and R2 simulates 2 limit range values, and in order to solve the problem of large noise of the oscilloscope, it is easy to think that the resistance values of R1 and R2 are increased to amplify signals, but even if the V + and I + ends output 200uA, R1, R2 are increased, The voltage increase effect caused by the resistance value of R2 is not significant, and it does not meet the actual production conditions. Therefore, the invention is provided with a signal amplification loop, in the signal amplification loop, R1 and R2 with the same resistance value as the actual production state can be arranged, and the resistors R3 and R4 can be respectively matched with R1 and R2, on the basis, only a current source needs to be regulated, so that the voltage value of the loop is increased, and meanwhile, the change switch 1 and the change switch 2 are synchronously switched, so that the voltage change of the signal amplification loop collected by people can be regarded as the voltage change of the RTD conditioning signal loop, and the change moment can be easily distinguished from an oscilloscope and used as the starting point of a response time test. The general idea of the scheme of the invention is as follows: the equivalent signal amplification method comprises the steps of utilizing 2 switches to synchronously act, then collecting a loop with an obvious signal, and regarding the signal change state of the signal loop as the signal change state of an RTD conditioning signal loop, thereby effectively finding out the starting point of a response time test.
The preferable scheme is as follows: the resistance of the resistor R1 is greater than or less than the resistance of the resistor R2, the resistance of the resistor R1 is equal to the resistance of the resistor R3, and the resistance of the resistor R2 is equal to the resistance of the resistor R4.
The preferable scheme is as follows: the change-over switch 1 and the change-over switch 2 are 1 or 2 electronic switch chips SN74CBTLV16292GR, 1A of the electronic switch chip SN74CBTLV16292GR is connected with the V + end and the I + end of the RTD conditioning module in a terminating mode, 2A of the electronic switch chip SN74CBTLV16292GR is connected with the positive electrode of the current source in a terminating mode, 1B1 of the electronic switch chip SN74CBTLV16292GR is connected with the resistor R1 in a terminating mode, 1B2 of the electronic switch chip SN74CBTLV16292GR is connected with the resistor R2 in a terminating mode, 2B1 of the electronic switch chip SN74CBTLV16292GR is connected with the resistor R3 in a terminating mode, and 2B2 of the electronic switch chip SN74 CB16292 GR is connected with.
The preferable scheme is as follows: the device also comprises a programmable power supply DC3, wherein the programmable power supply controls the change-over switch 1 and the change-over switch 2 to be synchronously switched.
The preferable scheme is as follows: the system also comprises a programmable power supply DC3, wherein the programmable power supply is connected with the S end of the electronic switch chip SN74CBTLV16292GR, the 2A end is conducted with 2B1 when the 1A end of the programmable power supply is synchronously controlled to be conducted with 1B1, and the 2A end is conducted with 2B2 when the 1A end of the programmable power supply is synchronously controlled to be conducted with 1B 2.
The preferable scheme is as follows: the resistance of the resistor R1 is 100 Ω, the resistance of the resistor R2 is 230 Ω, the resistance of the resistor R3 is 100 Ω, and the resistance of the resistor R4 is 230 Ω.
Preferably, the invention further comprises a post-processing module for conditioning the output signal of the thermal resistance conditioning module, wherein the post-processing module comprises a voltage comparator and a threshold signal source, one input end of the voltage comparator is connected with the output end of the thermal resistance conditioning module, the other input end of the voltage comparator is connected with the threshold signal source, and the output end of the voltage comparator is connected with a channel 2CH2 of the oscilloscope.
For the problem of the thermal resistance conditioning module, in order to meet the precision requirement, the thermal resistance conditioning module needs to limit and restrict the acquisition frequency of a channel, generally, the acquisition frequency is restricted to 20 Hz-50 Hz, so that the output waveform of the thermal resistance conditioning module is divided into multiple sections for output, and the output waveform of the module has multiple rising edges or falling edges, so that the terminal point is difficult to accurately calibrate during the automatic test of the response time of the module; specifically, after one change, the output signal of the oscilloscope needs to pass through three jumps to obtain a final value, when a response time is tested, the third jump needs to be extracted to find the time of the third jump, and because the change between the third jump and the second jump is small, some test times can confuse the time of the third jump and the time of the second jump to cause test errors, therefore, in order to solve the problem, the invention adopts the design idea of comparable output, namely, the final value of the third jump is calculated in advance, a threshold voltage is set, a voltage comparator is adopted for comparison, as long as the voltage reaches the threshold value, the voltage comparator outputs a signal to mark the arrival of a final stable time point, namely, another channel of the oscilloscope used for identifying the stable time point is connected with the output end of the voltage comparator, therefore, the invention also comprises a post-processing module for conditioning the output signal of the thermal resistance conditioning module, wherein the post-processing module comprises a voltage comparator and a threshold signal source, one input end of the voltage comparator is connected with the output end of the thermal resistance conditioning module, the other input end of the voltage comparator is connected with the threshold signal source, and the output end of the voltage comparator is connected with an oscilloscope.
The output end of the thermal resistance conditioning module is connected with the input end of the high-precision low-delay voltage comparator, the output voltage of the thermal resistance conditioning module is matched through the threshold signal source, when the output voltage of the thermal resistance conditioning module is higher than the voltage set by the threshold signal source, the voltage comparator outputs high level, otherwise, the output voltage is low; the signal output by the voltage comparator is a response time testing terminal, and the problem that the signals output by the thermal resistor are multi-segment, and cannot be identified when the difference between the multi-segment signals is small can be solved.
The output end of the thermal resistance conditioning module is loaded with a load resistor R6.
The voltage comparator is TLV 1702.
The DC1 threshold signal source selection voltage is 1.2V.
The invention aims to improve the testing precision and the automation degree of the response time of the thermal resistor, and the big data of the response time is obtained by an automatic testing means so as to analyze and summarize whether the dynamic distribution condition of the thermal resistor conditioning module meets the design requirement or not, and the module input amplifies the voltage difference of the starting point of the response time test in an actual measurement and equivalent mode; the module output triggers a response time terminal in a mode of outputting high and low levels through the voltage comparator, and the problem of multiple sections of output waveforms is solved, so that the response time function of the thermal resistance conditioning module for the automatic test of the oscilloscope is realized. The system realizes the automatic test function of the oscilloscope by amplifying the starting voltage and reducing the output steps. The front processing module for generating the test signal for the thermal resistance conditioning module is used for amplifying the starting point voltage, and the rear processing module for conditioning the output signal of the thermal resistance conditioning module is used for reducing the output steps.
Compared with the prior art, the invention has the following advantages and beneficial effects: according to the thermal resistance conditioning module response time testing system, the oscilloscope can be used for automatically executing the thermal resistance module response time test, the bottleneck of the current oscilloscope measuring time is solved, the quantization of test data can be more conveniently realized through the automatic test, and the effect of verifying that the thermal resistance conditioning module response time meets the design requirements is achieved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a schematic diagram of the output signal of the thermal resistance conditioning module of the present invention.
Fig. 2 is a schematic diagram of the design of the present invention.
Fig. 3 is a circuit diagram of an embodiment of the present invention.
Fig. 4 is a time-delay diagram of the electronic switch chip SN74CBTLV16292 GR.
Fig. 5 is a delay diagram of the voltage comparator.
FIG. 6 is a response time signal diagram of an oscilloscope.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following examples, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not to be construed as limiting the present invention.
Example 1
As shown in fig. 2-6:
as shown in fig. 2, a thermal resistance conditioning module response time test system includes a pre-processing module that generates a test signal for a thermal resistance conditioning module; the device also comprises an oscilloscope;
the pre-processing module comprises an RTD conditioning signal loop and a signal amplification loop;
the RTD conditioning signal loop comprises an RTD conditioning module, a resistor R1, a resistor R2 and a change-over switch 1, wherein a V + end and an I + end of the RTD conditioning module are connected into a movable end of the change-over switch 1, the resistor R1 and the resistor R2 are connected in parallel and then connected with a V-end and an I-end of the RTD conditioning module, and 2 immovable ends of the change-over switch 1 are respectively connected with the resistor R1 and the resistor R2;
the signal amplification loop comprises a current source, a resistor R3, a resistor R4 and a change-over switch 2; the positive pole of the current source is connected to the moving end of the change-over switch 2, the resistor R3 and the resistor R4 are connected in parallel and then connected with the negative pole of the current source, and 2 fixed ends of the change-over switch 2 are respectively connected with the resistor R3 and the resistor R4;
a channel 1CH1 of the oscilloscope is connected with two poles of a current source; the selector switch 1 and the selector switch 2 are switched synchronously.
And setting the voltage value of the current source to be higher than the ripple noise of the oscilloscope, and acquiring an output signal of the thermal resistance conditioning module by a channel 2CH2 of the oscilloscope.
In the above scheme, because the invention is directed to a thermal resistance conditioning module with mV-level input signal range, and in order to solve the problem of difficulty in identification caused by direct acquisition of signals at the input end of the thermal resistance conditioning module by an oscilloscope, the invention sets a current source, a resistor R3 and a resistor R4 to form a signal amplification loop on the basis of an original test circuit, in an RTD conditioning module, a 24V power supply is externally connected, for the RTD conditioning signal loop, the state during actual operation is simulated, and the V + and I + ends output 200uA of current, under the background, loading R1 and R2 simulates 2 limit range values, in order to solve the problem of large ripple noise of the oscilloscope, it is easy to think that the resistance values of R1 and R2 are increased to amplify the signals, but even if the resistance values of R1 and R2 are increased, the voltage increase effect caused by the output 200uA of the V + and I + ends is not obvious, at the same time, this does not correspond to the actual production state. Therefore, the invention is provided with a signal amplification loop, in the signal amplification loop, R1 and R2 with the same resistance value as the actual production state can be arranged, and the resistors R3 and R4 can be respectively matched with R1 and R2, on the basis, only a current source needs to be regulated, so that the voltage value of the loop is increased, and meanwhile, the change switch 1 and the change switch 2 are synchronously switched, so that the voltage change of the signal amplification loop collected by people can be regarded as the voltage change of the RTD conditioning signal loop, and the change moment can be easily distinguished from an oscilloscope and used as the starting point of a response time test. The general idea of the scheme of the invention is as follows: the equivalent signal amplification method comprises the steps of utilizing 2 switches to synchronously act, then collecting a loop with an obvious signal, and regarding the signal change state of the signal loop as the signal change state of an RTD conditioning signal loop, thereby effectively finding out the starting point of a response time test.
Example 2
On the basis of the foregoing embodiment 1, as shown in fig. 1, regarding the background art of the present invention, the problem of output is also described, because of the problem of the thermal resistance conditioning module itself, after a change, the output signal of the thermal resistance conditioning module needs to go through three jumps to obtain a final value, and when a response time is tested, the third jump needs to be extracted to find the time of the third jump, and because the change between the third jump and the second jump is small, some test times may confuse the third jump time with the second jump time to cause a test error, therefore, in order to solve the problem, the present invention adopts the design idea of comparable output, that is, the final value of the third jump is estimated in advance, a threshold voltage is set, a voltage comparator is used to compare as long as the voltage reaches the threshold, the voltage comparator outputs a signal to mark the final stable time point, that is, another channel of the oscilloscope used for identifying the stable time point is connected with the output end of the voltage comparator, so that the stable time point can be obtained, as shown in fig. 2.
The output end of the thermal resistance conditioning module is connected with the input end of the high-precision low-delay voltage comparator, the output voltage of the thermal resistance conditioning module is matched through the threshold signal source, when the output voltage of the thermal resistance conditioning module is higher than the voltage set by the threshold signal source, the voltage comparator outputs high level, otherwise, the output voltage is low; the signal output by the voltage comparator is a response time testing terminal, and the problem that the signals output by the thermal resistor are multi-segment, and cannot be identified when the difference between the multi-segment signals is small can be solved.
Example 3
On the basis of any of the above embodiments, we need to select the type of the switch 1 and the switch 2,
as shown in fig. 4, the example diverter switch 1 and diverter switch 2 select to use a 12-way high speed 1-out-of-2 switch SN74CBTLV16292GR that performs a close-open action for a single signal controlled 12-way switch as required by the summary and schematic. In order to ensure the switching synchronization of the switch 1 and the switch 2 in principle, the application measures the response time difference of the SN74CBTLV16292GR chips 1A and 2A, during testing, the SN74CBTLV16292GR chips 1A and 2A are both connected to a current source, the current source is set to output a constant current of 20mA, the DC2 and the DC3 are both connected to a voltage of 5V, an oscilloscope CH1 is used to measure the voltage waveform of two ends of the R4, an oscilloscope CH2 is used to measure the voltage waveform of two ends of the R2, any edge trigger of the CH1 is set, a trigger level of 3.5V is set, an oscilloscope delay time measuring function is added, the SN74CBTLV16292GR is controlled by a switch J1 to perform a switch conducting action, the delay time of two voltage waveforms of the R2/R4 is measured, the test result is shown in fig. 4, it can be known from fig. 4 that the response time difference of two channels of the SN74CBTLV162 16292GR is actually.
Example 4
On the basis of any of the above embodiments, as shown in fig. 5, the voltage comparator uses TLV1702, the offset voltage is 300uV, the voltage of the voltage range of 2V-10V after the thermal resistor is designed to output the load, the delay time of the voltage comparator is 780ns, which is much shorter than the response time of the thermal resistor conditioning module, and the chip is selected to meet the design requirements; all resistors adopt high-precision low-temperature drift resistors. In fig. 5, Y1 is 1.2V, which represents the voltage of the threshold signal source, when the input voltage of the voltage comparator connected to the output terminal of the thermal resistance conditioning module changes from small to large, the corresponding output of the voltage comparator will have a process of changing from low to high, and when the output is high, the test result is the end point of the delay time test, as shown in fig. 5, where C1 is the input voltage signal, C2 is the output value of the voltage comparator, and when C1 reaches 1.2V, the output value C2 of the voltage comparator changes to high, the delay time of the voltage comparator is the start point when the input reaches 1.2V, and the output high level is the end point.
As can be seen from fig. 5, C1 is the voltage input, C2 is the output of the rear end of the comparator, when the voltage comparator input reaches 1.2V, the rear end of the comparator outputs a high level almost immediately, and the difference between the input time and the output time is negligible relative to the response time of the thermal resistance conditioning module.
Example 5
Based on the above embodiment, we build a specific circuit, as shown in fig. 3, build a test environment by referring to the parameter values of fig. 3, measure waveforms at both ends of R4 with an oscilloscope CH1, measure waveforms at both ends of a resistor R5 with an oscilloscope CH2, control a J1 switch to open and close with a DO output channel, operate once at an action frequency of 1S, and measure the delay time of the whole test environment with an oscilloscope delay time measurement function.
When the test is carried out, the test paper is put into practical use,
in the figure, the switch 1 and the switch 2 use electronic switches, and the signals for controlling the switches are the same, so that the consistency of the actions of the switch 1 and the switch 2 is high, and the effect of small time difference of the actions of the two switches is achieved;
the voltage comparator has short selection delay and small input offset voltage, so that the test error is reduced;
the response time test of the thermal resistance conditioning module comprises the following steps:
1) building a test environment according to the figure 3, wherein an oscilloscope probe CH1 is connected with the voltage at two ends of the R4, and an oscilloscope probe CH2 is connected with the output end of the voltage comparator;
2) according to the resistance values of the input range R1 and R2 of the thermal resistance conditioning module and the value of the output channel load R6 of the thermal resistance conditioning module, the power supply VCC is adjusted, when the thermal resistance conditioning module inputs R1, the voltage comparison output level is low level, and when the thermal resistance conditioning module inputs R2, the output level of the voltage comparator is high level;
3) r3 and R1 are resistors with the same type, R4 and R2 are resistors with the same type, and the current source is adjusted to output a 20mA current signal;
4) the default initial state of the control change-over switch 1 and the default initial state of the change-over switch 2 are connected with R1/R3, the control signal is adjusted to connect the switch 1 and the switch 2 with R2/R4, at the moment, the oscillograph probe 1 acquires signal waveforms at two ends of the R4 and signals with obvious rising edges, the oscillograph probe 2 acquires the voltage comparator output waveforms which are also signals with obvious rising edges,
5) setting an oscilloscope according to the result of the step 4), selecting a rising edge-rising edge by adopting an oscilloscope delay time calculation formula, selecting a probe 1 as a trigger source, setting 10% of a high level as a trigger level, and automatically capturing and calculating delay time in an oscilloscope standard mode, wherein the trigger mode is rising edge trigger;
6) and setting a control signal of the program-controlled power supply multiple control switch, and testing and recording the maximum response time value of the thermal resistance conditioning module.
The programmable power supply is used for controlling the electronic switch to be switched off and switched on, the action frequency is 1S, the delay time of the whole test environment is measured by using the delay time measuring function of the oscilloscope, and the test result is shown in figure 6; in fig. 6, the number of times of switching count is 10, the response time is the rising edge time of the oscilloscope channel CH2(D2) — the rising edge time of the oscilloscope channel CH1(D1), the current response time is 74.50ms, the minimum response time value is 95.86ms, the maximum response time value is 136.46ms, and the average response time is 117.32ms within 10 times of switching count.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A thermal resistance conditioning module response time test system is characterized in that: the device comprises a pre-processing module for generating a test signal for a thermal resistance conditioning module; the device also comprises an oscilloscope;
the pre-processing module comprises an RTD conditioning signal loop and a signal amplification loop;
the RTD conditioning signal loop comprises an RTD conditioning module, a resistor R1, a resistor R2 and a change-over switch 1, wherein a V + end and an I + end of the RTD conditioning module are connected into a movable end of the change-over switch 1, the resistor R1 and the resistor R2 are connected in parallel and then connected with a V-end and an I-end of the RTD conditioning module, and 2 immovable ends of the change-over switch 1 are respectively connected with the resistor R1 and the resistor R2;
the signal amplification loop comprises a current source, a resistor R3, a resistor R4 and a change-over switch 2; the positive pole of the current source is connected to the moving end of the change-over switch 2, the resistor R3 and the resistor R4 are connected in parallel and then connected with the negative pole of the current source, and 2 fixed ends of the change-over switch 2 are respectively connected with the resistor R3 and the resistor R4;
a channel 1CH1 of the oscilloscope is connected with two poles of a current source; the selector switch 1 and the selector switch 2 are switched synchronously;
and setting the voltage value of the current source to be higher than the ripple noise of the oscilloscope, and acquiring an output signal of the thermal resistance conditioning module by a channel 2CH2 of the oscilloscope.
2. The system of claim 1, wherein the resistance of the resistor R1 is greater than or less than the resistance of the resistor R2, the resistance of the resistor R1 is equal to the resistance of the resistor R3, and the resistance of the resistor R2 is equal to the resistance of the resistor R4.
3. The system for testing the response time of the thermal resistance conditioning module as claimed in claim 1, wherein the switch 1 and the switch 2 are 1 or 2 electronic switch chips SN74CBTLV16292GR, 1A of the electronic switch chip SN74CBTLV16292GR is connected to V + end and I + end of the RTD conditioning module, 2A of the electronic switch chip SN74CBTLV16292GR is connected to the positive electrode of the current source, 1B1 of the electronic switch chip SN74CBTLV16292GR is connected to the resistor R1, 1B2 of the electronic switch chip SN74CBTLV16292GR is connected to the resistor R2, 2B1 of the electronic switch chip SN74 cb16292 GR is connected to the resistor R3, and 2B2 of the electronic switch chip SN74CBTLV16292 162 16292GR is connected to the resistor R4.
4. The system for testing the response time of the thermal resistance conditioning module according to claim 1, further comprising a programmable power supply DC3, wherein the programmable power supply controls the switch 1 and the switch 2 to switch synchronously.
5. The system for testing the response time of the thermal resistance conditioning module according to claim 3, further comprising a programmable power supply DC3 connected to the S terminal of the electronic switch chip SN74CBTLV16292GR, wherein the programmable power supply synchronously controls the conduction of the 1A terminal 1B1 and the conduction of the 2A terminal 2B1, and the programmable power supply synchronously controls the conduction of the 1A terminal 1B2 and the conduction of the 2A terminal 2B 2.
6. The system as claimed in claim 1, wherein the resistor R1 has a resistance of 100 Ω, the resistor R2 has a resistance of 230 Ω, the resistor R3 has a resistance of 100 Ω, and the resistor R4 has a resistance of 230 Ω.
7. The system for testing the response time of the thermal resistance conditioning module according to claim 1, further comprising a post-processing module for conditioning an output signal of the thermal resistance conditioning module, wherein the post-processing module comprises a voltage comparator and a threshold signal source, one input end of the voltage comparator is connected with the output end of the thermal resistance conditioning module, the other input end of the voltage comparator is connected with the threshold signal source, and the output end of the voltage comparator is connected with a channel 2CH2 of the oscilloscope.
8. A thermal resistance conditioning module response time test system according to claim 7, wherein the output of the thermal resistance conditioning module is loaded with a load resistor R6.
9. The system of claim 7, wherein the voltage comparator is a TLV 1702.
10. The system of claim 7, wherein the DC1 threshold signal source selection voltage is 1.2V.
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| CN114076901B (en) * | 2021-11-15 | 2022-10-21 | 四川九洲电器集团有限责任公司 | Automatic testing system and method for output ripples of power supply module |
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