CN110440955A - A kind of thermal resistance conditioning module Response Time Test System - Google Patents
A kind of thermal resistance conditioning module Response Time Test System Download PDFInfo
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- CN110440955A CN110440955A CN201910743718.2A CN201910743718A CN110440955A CN 110440955 A CN110440955 A CN 110440955A CN 201910743718 A CN201910743718 A CN 201910743718A CN 110440955 A CN110440955 A CN 110440955A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/007—Testing
Abstract
The invention discloses kind of a thermal resistance conditioning module Response Time Test Systems, the preposition processing module including generating test signal for thermal resistance conditioning module；It further include oscillograph；The preposition processing module includes RTD conditioned signal circuit, signal amplifying return circuit；RTD conditioned signal circuit includes the end V+ of RTD conditioning module and I+ terminates the moved end into switching switch 1, and the end V- and the end I- of RTD conditioning module are connected after resistance R1, resistance R2 are in parallel, and 2 non-moving ends of switching switch 1 are separately connected resistance R1, resistance R2；Signal amplifying return circuit includes the moved end of the anode access switching switch 2 of current source, the cathode of current source is connected after resistance R3, resistance R4 are in parallel, 2 non-moving ends of switching switch 2 are separately connected resistance R3, resistance R4；The channel 1CH1 of oscillograph connects current source the two poles of the earth；Switch switch 1, switching 2 synchronism switching of switch.Current source voltage value is set and is higher than oscillograph Ripple Noise, the channel 2CH2 of oscillograph obtains the output signal of thermal resistance conditioning module.
Description
Technical field
The present invention relates to technical field of nuclear power, and in particular to the thermal resistance Response Time Test System of nuclear power station-service.
Background technique
The definition of thermal resistance response time: thermal resistance conditioning module input signal changes to thermal resistance conditioning module and stablizes output
For the response time of thermal resistance conditioning module；Conventional thermal resistance response time test method connects thermoelectricity using oscilloprobe
Hinder conditioning module input and output test the response time, it is popular for, be exactly with oscillograph acquisition thermal resistance input terminal, survey
At the time of determining input end signal and change, while with the output end of oscillograph acquisition thermal resistance, observes corresponding output and change
At the time of, 2 moment are subtracted each other, the response time can be obtained.
And for the thermal resistance conditioning module of npp safety grade DCS platform, use conventional oscillograph directly to adopt
When collecting input terminal and output end signal, then have the following problems:
1, the thermal resistance of npp safety grade DCS platform is generally PT100 sensor, and resistance range is 100-230 Ω,
Corresponding temperature range is 0-500 degree, and thermal resistance exciting current is therefore 200uA, input voltage range 20mV-50mV are adjusted
Managing module is 200uA to the output drive electric current of thermal resistance, and in test, the voltage signal for needing to simulate 20mV-50mV is made
It accesses for input source to thermal resistance conditioning module, but the Ripple Noise of oscilloprobe is up to tens mV, therefore directly by oscillography
Device probe is linked on input terminal, then can not go out change point respectively, and oscillograph is caused to be difficult to determine rising for thermal resistance response time
Point.
2, due to the thermal resistance conditioning module of npp safety grade DCS platform, usually high-speed ADC sampling output, heat
The output area of resistance conditioning module is the current signal of 4mA-20mA, since output signal is by hardware circuit and software filtering sheet
It is in the influence of reason, each temperature change, output signal point therefore is caused to be exported after 2-3 sections of fluctuating changes
Thermal resistance conditioning module output loading both end voltage value has 3 sections of voltage values, and (referring to attached drawing 1) is that is, thermal resistance conditioning module acquires
To after signal, since software and hardware filtering causes output that input signal variation is followed there are 3 sections of outputs, needed using oscillograph test true
The final stage waveform for determining resistance thermometry output is response time terminal, is adopted since the test response time needs to be repeated several times
Collection, be then averaged, therefore during multi collect, it has been found that due to thermal resistance software deal with relationship cause it is defeated
Waveform is regularly changing out, may cause second from the bottom section smaller with the voltage difference of final stage, and oscillograph is equally difficult to determine
Thermal resistance response time terminal, refering to what is shown in Fig. 1, the second segment voltage value of its output will connect very much with third time voltage value
Closely, accordingly, it is difficult to identify final stable output point.
Summary of the invention
The purpose of the present invention is to provide a kind of thermal resistance conditioning module Response Time Test System, which is primarily solved
Input signal is obtained using oscillograph and changes moment point.
The specific technical proposal of the invention is: a kind of thermal resistance conditioning module Response Time Test System, including be thermoelectricity
Hinder the preposition processing module that conditioning module generates test signal；It further include oscillograph；
The preposition processing module includes RTD conditioned signal circuit, signal amplifying return circuit；
RTD conditioned signal circuit includes RTD conditioning module (thermal resistance conditioning module), resistance R1, resistance R2, switching switch
The end V+ of 1, RTD conditioning module and I+ terminate the moved end into switching switch 1, and connection RTD improves mould after resistance R1, resistance R2 are in parallel
2 non-moving ends at the end V- and the end I- of block, switching switch 1 are separately connected resistance R1, resistance R2；
Signal amplifying return circuit includes current source, resistance R3, resistance R4, switching switch 2；The anode access switching of current source is opened
2 moved end is closed, the cathode of current source is connected after resistance R3, resistance R4 are in parallel, 2 non-moving ends of switching switch 2 are separately connected electricity
Hinder R3, resistance R4；
The channel 1CH1 of oscillograph connects current source the two poles of the earth；Switch switch 1, switching 2 synchronism switching of switch.
Current source voltage value is set and is higher than oscillograph Ripple Noise, the channel 2CH2 of oscillograph obtains thermal resistance conditioning module
Output signal.
In the above scheme, since test object of the invention is that the thermal resistance that input reference signal is mV grades improves mould
Block, in order to solve the problems, such as that oscillograph directly acquires identification difficulty brought by the signal of thermal resistance conditioning module input terminal, therefore,
The present invention constitutes signal amplifying return circuit provided with current source, resistance R3, resistance R4, in RTD on the basis of original tests circuit
In conditioning module, RTD conditioning module accesses 24V power supply from outside, is then simulation real work for RTD conditioned signal circuit
When state, the end V+, I+ export 200uA electric current, in this context, load R1, R2 then be simulation 2 limit ranges
Value, to solve the problems, such as that oscillograph Ripple Noise is big, then it is contemplated that the resistance value of R1, R2 are increased, thus amplified signal,
But since the end V+, I+ exports 200uA, even if increasing the resistance value of R1, R2, caused voltage increase effect is also unobvious, simultaneously
It does so and does not also meet practical production status.Therefore, the present invention can in signal amplifying return circuit provided with signal amplifying return circuit
R1, R2 identical with practical production status resistance value is arranged, resistance R3, R4 can also be allowed to match respectively with R1, R2, in this base
On plinth, we need to only adjust current source, so that and the voltage value in its circuit increases, meanwhile, switching switch 1, switching switch 2 are same
Step switching, then the voltage change that we acquire signal amplifying return circuit can be considered that voltage change has occurred in RTD conditioned signal circuit
Change, can thus be relatively easy to distinguish the variation moment from oscillograph, in response the starting point of time test.The present invention
Above scheme general thought are as follows: then it is apparent to acquire signal using 2 switch synchronization actions for equivalent amplified signal method
The signal intensity state of its signal circuit is equally considered as the signal intensity state in RTD conditioned signal circuit, thus effectively by circuit
Find the response time test starting point.
Preferred scheme are as follows: the resistance value of resistance R1 is more than or less than resistance R2 resistance value, and the resistance value of resistance R1 is equal to resistance R3
The resistance value of resistance value, resistance R2 is equal to resistance R4 resistance value.
Preferred scheme are as follows: the switching switch 1 is 1 or 2 electronic switch chips with switching switch 2
The end V+ and the end I+ of the 1A termination RTD conditioning module of SN74CBTLV16292GR, electronic switch chip SN74CBTLV16292GR,
The anode of the 2A termination current source of electronic switch chip SN74CBTLV16292GR, electronic switch chip SN74CBTLV16292GR
1B1 terminating resistor R1, electronic switch chip SN74CBTLV16292GR 1B2 terminating resistor R2, electronic switch chip
The 2B2 terminating resistor R4 of 2B1 the terminating resistor R3, electronic switch chip SN74CBTLV16292GR of SN74CBTLV16292GR.
Preferred scheme are as follows: further include programmable power supply DC3, it is same that programmable power supply controls switching switch 1, switching switch 2 simultaneously
Step switching.
Preferred scheme are as follows: further include programmable power supply DC3, programmable power supply meets electronic switch chip SN74CBTLV16292GR
The end S, the programmable power supply end synchronously control 1A be connected 1B1 when, the end 2A be connected 2B1, the programmable power supply end synchronously control 1A be connected 1B2
When, the end 2A be connected 2B2.
Preferred scheme are as follows: the resistance value that the resistance value of above-mentioned resistance R1 is 100 Ω, the resistance value of resistance R2 is 230 Ω, resistance R3
Resistance value for 100 Ω, resistance R4 is 230 Ω.
Preferably, the invention also includes the postpositive disposal module that the output signal to thermal resistance conditioning module is improved,
The postpositive disposal module includes voltage comparator, threshold signal source, the input termination thermal resistance conditioning of voltage comparator
The output end of module, another input termination threshold signal source, the channel 2CH2 of the output termination oscillograph of voltage comparator.
The problem of for also describing output in background of invention, the problem of due to thermal resistance conditioning module itself,
Thermal resistance conditioning module is to meet required precision, needs to carry out restriction to the frequency acquisition in channel, general frequency acquisition is about
Beam causes thermal resistance conditioning module output waveform to be divided into multistage and is exported in 20Hz~50Hz, therefore module output waveform has
Standby multiple rising or fallings, therefore terminal is difficult to accurately demarcate when module response time automatic test；Specifically,
After one-shot change, output signal is to need just obtain final value by jumping three times, and test the response time for it
When, it needs to jump third time therein and extract, at the time of finding third time jump, and due to third time jump and second
Variation between secondary jump, which will appear, changes small situation, and therefore, some testing times can be by third time jumping moment and second
Secondary jumping moment is obscured, and causes test to be made mistakes, therefore in order to solve this problem, and the present invention is thought using the design of comparable output
Think, that is, the end value for calculating third time jump in advance is set threshold voltage, compared using voltage comparator, as long as it is electric
Pressure reaches threshold value, then starting voltage comparator will export a signal to indicate that final stabilization moment point reaches, that is, by oscillography
The channel of another moment point stable for identification of device connects the output end of voltage comparator, is obtained with so highly stable
Stablize moment point, therefore the invention also includes the postpositive disposal module that the output signal to thermal resistance conditioning module is improved,
The postpositive disposal module includes voltage comparator, threshold signal source, the input termination thermal resistance conditioning of voltage comparator
The output end of module, another input termination threshold signal source, the output of voltage comparator terminate oscillograph.
Due to the input terminal of thermal resistance conditioning module output end connection high-precision low latency voltage comparator, believed by threshold value
Number source matches the output voltage of thermal resistance conditioning module, when thermal resistance conditioning module output voltage is arranged higher than threshold signal source
Voltage when, voltage comparator export high level, be otherwise low；The signal of voltage comparator output is that response time test is whole
Point can solve thermal resistance output signal multistage, and difference hour between multi-segment signal, unrecognized problem.
The output end of thermal resistance conditioning module is loaded with a load resistance R6.
Above-mentioned voltage comparator is TLV1702.
DC1 threshold signal source selects voltage for 1.2V.
The present invention is directed to improve thermal resistance response time measuring accuracy and the degree of automation, obtained by automatic test means
Whether response time big data meets design requirement, mould so as to analysis and summary thermal resistance conditioning module DYNAMIC DISTRIBUTION situation out
Block input is amplified by the starting point voltage difference that actual measurement and equivalent mode test the response time；Module output is compared by voltage
The mode of device output low and high level triggers response time terminal, output waveform multistage is solved the problems, such as, to realize that oscillograph is automatic
Change test thermal resistance conditioning module response time function.The system mainly passes through amplification starting point voltage and reduction output ladder is real
Existing oscillograph automatic test function.The preposition processing module of test signal is generated for thermal resistance conditioning module for realizing amplification
Starting point voltage, the postpositive disposal module improved the output signal of thermal resistance conditioning module export rank for realizing reduction
Ladder.
Compared with prior art, the present invention having the following advantages and benefits: above-mentioned thermal resistance conditioning module response
The test of oscillograph automated execution resistance thermometry response time can be used in time test system, solves current oscilloscope measurement
The bottleneck of time, automatic test could more easily realize the quantization of test data, reach verifying thermal resistance conditioning module and ring
Meet the effect of design requirement between seasonable.
Detailed description of the invention
Attached drawing described herein is used to provide to further understand the embodiment of the present invention, constitutes one of the application
Point, do not constitute the restriction to the embodiment of the present invention.In the accompanying drawings:
Fig. 1 is thermal resistance conditioning module output signal schematic diagram of the present invention.
Fig. 2 is design schematic diagram of the invention.
Fig. 3 is implementing circuit figure of the present invention.
Fig. 4 is the delay figure of electronic switch chip SN74CBTLV16292GR.
Fig. 5 is the delay figure of voltage comparator.
The response time signal graph of Fig. 6 oscillograph.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention is made below with reference to embodiment
Further to be described in detail, exemplary embodiment of the invention and its explanation for explaining only the invention, are not intended as to this
The restriction of invention.
Embodiment 1
As shown in Fig. 2-Fig. 6:
As shown in Fig. 2, a kind of thermal resistance conditioning module Response Time Test System, including generated for thermal resistance conditioning module
Test the preposition processing module of signal；It further include oscillograph；
The preposition processing module includes RTD conditioned signal circuit, signal amplifying return circuit；
RTD conditioned signal circuit includes RTD conditioning module, resistance R1, resistance R2, switching switch 1, the V of RTD conditioning module
+ end and I+ terminate the moved end into switching switch 1, and the end V- and the end I- of RTD conditioning module are connected after resistance R1, resistance R2 are in parallel,
2 non-moving ends of switching switch 1 are separately connected resistance R1, resistance R2；
Signal amplifying return circuit includes current source, resistance R3, resistance R4, switching switch 2；The anode access switching of current source is opened
2 moved end is closed, the cathode of current source is connected after resistance R3, resistance R4 are in parallel, 2 non-moving ends of switching switch 2 are separately connected electricity
Hinder R3, resistance R4；
The channel 1CH1 of oscillograph connects current source the two poles of the earth；Switch switch 1, switching 2 synchronism switching of switch.
Current source voltage value is set and is higher than oscillograph Ripple Noise, the channel 2CH2 of oscillograph obtains thermal resistance conditioning module
Output signal.
In the above scheme, since object of the invention is the thermal resistance conditioning module that input reference signal is mV grades, it is
It solves the problems, such as that oscillograph directly acquires and identifies difficulty, therefore, this hair brought by the signal of thermal resistance conditioning module input terminal
It is bright to constitute signal amplifying return circuit provided with current source, resistance R3, resistance R4 on the basis of original tests circuit, it is improved in RTD
In module, external access 24V power supply is then the state simulated in actual work, V+, I+ for RTD conditioned signal circuit
The electric current of end output 200uA, in this context, load R1, R2 are then 2 limit range values of simulation, to solve oscillograph line
The big problem of wave noise, then it is contemplated that the resistance value of R1, R2 are increased, thus amplified signal, but, since the end V+, I+ is defeated
200uA out, even if increasing the resistance value of R1, R2, it is also unobvious that caused voltage increases effect, while doing so and also not meeting reality
Border production status.Therefore, the present invention is provided with signal amplifying return circuit, in signal amplifying return circuit, can be set and actual production
State resistance value identical R1, R2, can also allow resistance R3, R4 to match respectively with R1, R2, and on this basis, we only need to adjust
Current source, so that the voltage value in its circuit increases, meanwhile, switching switch 1, switching 2 synchronism switching of switch, then we
The voltage change of acquisition signal amplifying return circuit can be considered that voltage change has occurred in RTD conditioned signal circuit, thus can be from
It is relatively easy to distinguish the variation moment in oscillograph, in response the starting point of time test.Above scheme of the invention it is total
Body thinking are as follows: then equivalent amplified signal method acquires the apparent circuit of signal using 2 switch synchronization actions, its signal is returned
The signal intensity state on road is equally considered as the signal intensity state in RTD conditioned signal circuit, to effectively find the response time
The starting point of test.
Embodiment 2
On the basis of above-described embodiment 1, as shown in Figure 1, also describing asking for output in background of invention
Topic, the problem of due to thermal resistance conditioning module itself, after one-shot change, output signal is to need by jump three times
When can obtain final value, and test the response time, needs to jump third time therein and extract, find third time and jump
At the time of change, and change small situation since the variation between third time jump and second of jump will appear, some surveys
Examination number can obscure third time jumping moment and second of jumping moment, cause test to be made mistakes, therefore in order to solve this problem,
The present invention is using the comparable design philosophy exported, that is, and the end value for calculating third time jump in advance sets threshold voltage,
Using voltage comparator, to compare, as long as its voltage reaches threshold value, starting voltage comparator will export a signal to indicate
Final stabilization moment point reaches, that is, the channel of another moment point stable for identification of oscillograph is connect voltage comparator
Output end is obtained with highly stable stabilization moment point, as shown in Fig. 2, therefore the invention also includes to thermal resistance in this way
The postpositive disposal module that the output signal of conditioning module is improved, the postpositive disposal module include voltage comparator, threshold value
Signal source, the output end of an input termination thermal resistance conditioning module of voltage comparator, another input termination threshold signal
The output in source, voltage comparator terminates oscillograph.
Due to the input terminal of thermal resistance conditioning module output end connection high-precision low latency voltage comparator, believed by threshold value
Number source matches the output voltage of thermal resistance conditioning module, when thermal resistance conditioning module output voltage is arranged higher than threshold signal source
Voltage when, voltage comparator export high level, be otherwise low；The signal of voltage comparator output is that response time test is whole
Point can solve thermal resistance output signal multistage, and difference hour between multi-segment signal, unrecognized problem.
Embodiment 3
On the basis of above-mentioned any embodiment, it would be desirable to type selecting is carried out to switching switch 1 and switching switch 2,
As shown in figure 4, example switches switch 1 and the switching selection of switch 2 uses 12 according to summary of the invention and schematic diagram requirement
Road high speed 2 selects 1 switch SN74CBTLV16292GR, controls 12 way switch for mono signal and executes closure disconnection movement.In order to protect
The switching switch 1 demonstrate,proved in principle is synchronous with the switching switching of switch 2, and the application measures SN74CBTLV16292GR chip 1A and 2A
Switch that the response time is poor, and when test, SN74CBTLV16292GR chip 1A and 2A access current source, and current source setting output is permanent
Stream 20mA, DC2 and DC3 access 5V voltage, and using the voltage waveform at the oscillograph CH1 measurement both ends R4, oscillograph CH2 measures R2
The voltage waveform at both ends, arbitrarily along triggering, triggering level 3.5V adds oscillograph delay time measurement function, passes through setting CH1
Switch J1 controls SN74CBTLV16292GR and executes switch conduction movement, measures the delay time of two voltage waveforms of R2/R4, surveys
Test result is as shown in figure 4, as shown in Figure 4, the response time difference in two channels electronic switch chip SN74CBTLV16292GR is real
Surveying is ns rank, and opposite ms grades of thermal resistance conditioning module can be ignored.
Embodiment 4
On the basis of above-mentioned any embodiment, as shown in figure 5, voltage comparator uses TLV1702, input offset electricity
300uV is pressed, design thermal resistance output connects the voltage of voltage range 2V-10V after load, and the delay time of voltage comparator is
780ns, the far smaller than response time of thermal resistance conditioning module, the selection of chip meet design requirement；All resistance uses
High Precision Low Temperature floats resistance.In Fig. 5, Y1=1.2V indicates the voltage in its threshold signal source, when voltage comparator connects thermal resistance
When the input voltage of conditioning module output end changes from small to big, the corresponding output of voltage comparator will will appear level and be got higher by low
Process, when output be high level when be delay time test terminal, test results are shown in figure 5, wherein C1 be input voltage
Signal, C2 are voltage comparator output valve, and when C1 reaches 1.2V, voltage comparator output valve C2 becomes high level, voltage ratio
Delay time compared with device is that reach 1.2V be starting point for input, and output high level is terminal.
As shown in Figure 5, C1 is voltage input, and C2 is the output of comparator rear end, when voltage comparator input reaches 1.2V,
Comparator rear end almost immediately exports high level, and the input thermal resistance conditioning module response time opposite with the output time difference can neglect
Slightly disregard.
Embodiment 5
On the basis of the above embodiments, we have built specific circuit, as shown in figure 3, the parameter value referring to Fig. 3 is taken
Test environment is built, oscillograph CH1 measures the waveform at the both ends R4, and oscillograph CH2 is measured the waveform at the both ends resistance R5, exported using DO
Channel controls J1 switch and disconnects closure, and operating frequency 1S is primary, is entirely tested using oscillograph delay time measurement functional measurement
The delay time of environment.
When test,
Switch 1 and switch 2 use electronic switch in figure, and the signal of control switch is same signal, make switch 1 and switch
The consistency of 2 movements is high, achievees the effect that the time difference of two switch motions is small；
Voltage comparator selection delay is short, and input offset voltage is small, reduces test error with this；
Above-mentioned thermal resistance conditioning module response time test comprising the steps of:
1) test environment, the voltage at the both ends oscilloprobe CH1 connection R4, oscilloprobe CH2 connection are built according to Fig. 3
Voltage comparator output end；
2) it is loaded according to thermal resistance conditioning module input range R1 and R2 resistance value and thermal resistance conditioning module output channel
The value of R6 adjusts power supply VCC, and when thermal resistance conditioning module inputs R1, it is low level that voltage, which compares output level, works as thermal resistance
When conditioning module inputs R2, voltage comparator output level is high level；
3) R3 and R1 is with model resistance, and R4 and R2 are to adjust current source with model resistance and export 20mA current signal；
4) control switching switch 1 and switching switch 2 are defaulted original state and are connect with R1/R3, and adjusting control signal makes switch 1
It is connect with switch 2 with R2/R4, oscilloprobe 1, which acquires the both ends R4 signal waveform, at this time apparent rising edge signal, oscillograph
2 collection voltages comparator output waveforms of popping one's head in are similarly apparent rising edge signal,
5) oscillograph is arranged according to the result of step 4), using oscillograph delay time calculation formula, selected on rising edge-
Edge is risen, trigger source selection probe 1 triggers mode as rising edge triggering, and the 10% of high level, oscillograph standard is arranged in triggering level
Mode captures the computing relay time automatically；
6) the control signal of the multiple control switch of programmable power supply is set, when test record thermal resistance conditioning module peak response
Between be worth.
Closure is disconnected using programmable power supply control electronic switch, operating frequency 1S is primary, surveys using oscillograph delay time
Amount functional measurement entirely tests the delay time of environment, and test results are shown in figure 6；In Fig. 6, toggle count number 10 is rung
Between seasonable=and channel oscilloscope CH2 (D2) rising time-channel oscilloscope CH1 (D1) rising time, the current response time
For 74.50ms, in toggle count number 10 times, Best-case Response Time value is 95.86ms, and maximum response time value is
136.46ms average response time 117.32ms.
Above-described specific embodiment has carried out further the purpose of the present invention, technical scheme and beneficial effects
It is described in detail, it should be understood that being not intended to limit the present invention the foregoing is merely a specific embodiment of the invention
Protection scope, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should all include
Within protection scope of the present invention.
Claims (10)
1. a kind of thermal resistance conditioning module Response Time Test System, it is characterised in that: including being generated for thermal resistance conditioning module
Test the preposition processing module of signal；It further include oscillograph；
The preposition processing module includes RTD conditioned signal circuit, signal amplifying return circuit；
RTD conditioned signal circuit includes RTD conditioning module, resistance R1, resistance R2, switching switch 1, the end V+ of RTD conditioning module
The moved end into switching switch 1 is terminated with I+, the end V- and the end I- of RTD conditioning module, switching are connected after resistance R1, resistance R2 are in parallel
2 non-moving ends of switch 1 are separately connected resistance R1, resistance R2；
Signal amplifying return circuit includes current source, resistance R3, resistance R4, switching switch 2；The anode access switching switch 2 of current source
Moved end, the cathode of current source is connected after resistance R3, resistance R4 are in parallel, 2 non-moving ends of switching switch 2 are separately connected resistance
R3, resistance R4；
The channel 1CH1 of oscillograph connects current source the two poles of the earth；Switch switch 1, switching 2 synchronism switching of switch.
Current source voltage value is set and is higher than oscillograph Ripple Noise, the channel 2CH2 of oscillograph obtains the defeated of thermal resistance conditioning module
Signal out.
2. a kind of thermal resistance conditioning module Response Time Test System according to claim 1, which is characterized in that resistance R1
Resistance value be more than or less than resistance R2 resistance value, the resistance value of resistance R1 is equal to resistance R3 resistance value, and the resistance value of resistance R2 is equal to resistance R4
Resistance value.
3. a kind of thermal resistance conditioning module Response Time Test System according to claim 1, which is characterized in that described to cut
Changing switch 1 and switching switch 2 is 1 or 2 electronic switch chip SN74CBTLV16292GR, electronic switch chip
The end V+ and the end I+ of the 1A termination RTD conditioning module of SN74CBTLV16292GR, electronic switch chip SN74CBTLV16292GR
2A termination current source anode, the 1B1 terminating resistor R1 of electronic switch chip SN74CBTLV16292GR, electronic switch chip
The 2B1 terminating resistor R3 of 1B2 the terminating resistor R2, electronic switch chip SN74CBTLV16292GR of SN74CBTLV16292GR,
The 2B2 terminating resistor R4 of electronic switch chip SN74CBTLV16292GR.
4. a kind of thermal resistance conditioning module Response Time Test System according to claim 1, which is characterized in that further include
Programmable power supply DC3, programmable power supply control switching switch 1, switching 2 synchronism switching of switch simultaneously.
5. a kind of thermal resistance conditioning module Response Time Test System according to claim 3, which is characterized in that further include
Programmable power supply DC3, programmable power supply connect the end S of electronic switch chip SN74CBTLV16292GR, the end programmable power supply synchronously control 1A
Be connected 1B1 when, the end 2A be connected 2B1, the programmable power supply end synchronously control 1A be connected 1B2 when, the end 2A be connected 2B2.
6. a kind of thermal resistance conditioning module Response Time Test System according to claim 1, which is characterized in that above-mentioned electricity
The resistance value for hindering R1 is 100 Ω, the resistance value of resistance R2 is 230 Ω, the resistance value of resistance R3 is 100 Ω, the resistance value of resistance R4 is 230
Ω。
7. a kind of thermal resistance conditioning module Response Time Test System according to claim 1, which is characterized in that further include
To the postpositive disposal module that the output signal of thermal resistance conditioning module is improved, the postpositive disposal module includes that voltage compares
Device, threshold signal source, the output end of an input termination thermal resistance conditioning module of voltage comparator, another input termination threshold
Value signal source, the channel 2CH2 of the output termination oscillograph of voltage comparator.
8. a kind of thermal resistance conditioning module Response Time Test System according to claim 7, which is characterized in that thermal resistance
The output end of conditioning module is loaded with a load resistance R6.
9. a kind of thermal resistance conditioning module Response Time Test System according to claim 7, which is characterized in that above-mentioned electricity
Pressure comparator is TLV1702.
10. a kind of thermal resistance conditioning module Response Time Test System according to claim 7, which is characterized in that DC1 threshold
Value signal source selects voltage for 1.2V.
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| CN111443687A (en) * | 2020-04-03 | 2020-07-24 | 西安热工研究院有限公司 | Method for testing response time of power plant decentralized control system |
| CN112255994A (en) * | 2020-10-13 | 2021-01-22 | 浙江中控技术股份有限公司 | Real-time response test method and device for control system |
| CN114076901A (en) * | 2021-11-15 | 2022-02-22 | 四川九洲电器集团有限责任公司 | Automatic testing system and method for power module output ripple |
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| CN114167839A (en) * | 2021-12-03 | 2022-03-11 | 中国核动力研究设计院 | Nuclear power plant DCS response time testing device and method |
| CN114167839B (en) * | 2021-12-03 | 2024-01-26 | 中国核动力研究设计院 | Nuclear power plant DCS system response time testing device and method |
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