CN108844639B - The test circuit and method of electrical readout non-refrigerated infrared detector - Google Patents
The test circuit and method of electrical readout non-refrigerated infrared detector Download PDFInfo
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- CN108844639B CN108844639B CN201810324887.8A CN201810324887A CN108844639B CN 108844639 B CN108844639 B CN 108844639B CN 201810324887 A CN201810324887 A CN 201810324887A CN 108844639 B CN108844639 B CN 108844639B
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- 238000012360 testing method Methods 0.000 title claims abstract description 75
- 238000000034 method Methods 0.000 title claims abstract description 17
- 230000004044 response Effects 0.000 claims abstract description 28
- 230000003321 amplification Effects 0.000 claims abstract description 21
- 238000003199 nucleic acid amplification method Methods 0.000 claims abstract description 21
- 238000005259 measurement Methods 0.000 claims abstract description 12
- 238000010998 test method Methods 0.000 claims description 12
- 230000005855 radiation Effects 0.000 claims description 9
- 230000007613 environmental effect Effects 0.000 claims 1
- 230000006872 improvement Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 4
- 230000005457 Black-body radiation Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- 238000013461 design Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
- G01J5/24—Use of specially adapted circuits, e.g. bridge circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Abstract
The invention discloses a kind of test circuit of electrical readout non-refrigerated infrared detector and methods, and testing circuit includes: sample to be tested, fixed resistance, variable resistance, voltage source, voltage amplification module, voltmeter and voltage oscilloscope.Wherein using sample to be tested as measurement arm, two fixed resistances as ratio arms, variable resistance as arm is compared, Wheatstone bridge is constituted；Electric bridge is by voltage fed, and voltmeter is connected in parallel on on the measurement concatenated ratio arms of arm, and output end voltage is shown after the amplification of voltage amplification module by voltage oscilloscope.Test circuit and method of the invention can measure response time, thermal conductivity and the thermal capacitance for obtaining electrical readout non-refrigerated infrared detector, with circuit feature simple, easy to operate, vdiverse in function, measurement accuracy is high.
Description
Technical field
The present invention relates to non-refrigerated infrared detector technical fields, particularly relate to a kind of electrical readout uncooled ir
The test circuit and method of detector.
Background technique
Non-refrigerated infrared detector obtains large-scale application in fields such as military affairs, electric power, fire-fighting, medical treatment.Currently,
Non-refrigerated infrared detector can be divided into electrical readout according to imaging mechanism and light reads two classes.Wherein, electrical readout is using in structure
The thermal sensitive effect of sensing element converts the thermal energy that infra-red radiation generates to after electrical signal and reads imaging.Accurately survey
The performance parameter for measuring Uncooled infrared detector device pixel grade, there is overall merit electrical readout non-refrigerated infrared detector performance
Significance especially grasps thermal conductivity, thermal capacitance and the response time of the single pixel of device, helps to fully understand pixel, and
Its structure design and craft is assisted to optimize.
The main stream approach for obtaining electrical readout non-refrigerated infrared detector thermal conductivity and thermal capacitance is using theoretical calculation and emulation mould
The quasi- method combined, but can not reaction member actual numerical value.There are mainly two types of the traditional measurement methods of thermal response time:
One, using mechanical chopper periodic modulation black body radiation, two, measured with pulsed infrared laser light source.Mechanical chopper is due to this
There are mechanical delays for the chopping process of body, and very big interference can be caused to thermal response time measurement；Simultaneously by black body radiation to device
The amount of radiation of part pixel be chopped into device modulation after also have large change so that by machinery copped wave method measure thermal response when
Between there are precision problem, it is larger to the measurement interference of the response time of Millisecond.And test needed for pulsed infrared laser light method is set
Standby to be not easy to obtain, high-precision pulsed infrared laser light source device is sufficiently expensive, and common research unit and company are difficult to bear.This
When outer use machinery copped wave method and pulsed laser deposition calorimetric response time, self-heating effect of the device under operating current can ring heat
Measurement between seasonable interferes.
Summary of the invention
In order to overcome drawbacks described above, the present invention provides a kind of test circuit of electrical readout non-refrigerated infrared detector and sides
Method.
The present invention is to solve technical solution used by its technical problem:
A kind of test circuit of electrical readout non-refrigerated infrared detector, sample to be tested including non-refrigerated infrared detector,
First fixed resistance, the second fixed resistance, variable resistance, voltage source, voltage amplification module, voltmeter and voltage oscilloscope, with
The sample to be tested is as test arm, and first fixed resistance and the second fixed resistance are as ratio arms, the variable resistance
As arm is compared, Wheatstone bridge is constituted；The Wheatstone bridge is by the voltage fed, and the voltmeter is connected in parallel on and institute
It states on the concatenated ratio arms of test arm i.e. sample to be tested i.e. the first fixed resistance, the output end voltage of the Wheatstone bridge is through institute
It is shown after stating the amplification of voltage amplification module by the voltage oscilloscope.
As a further improvement of the present invention, the voltage amplification module includes that prime operational amplifier and rear class operation are put
Big device, the voltage amplification module is using the measurement arm of Wheatstone bridge and compares the both end voltage of arm as inputting, wherein measuring
The output end of arm is connected with the non-inverting input terminal of the prime operational amplifier, and the one of the output end of the prime operational amplifier
Branch is directly fed back to the inverting input terminal of the prime operational amplifier, another branch of the prime operational amplifier
After connecting with the 4th resistance, the rear class operational amplifier inverting input terminal is accessed；The rear class operational amplifier it is same mutually defeated
It is connected to enter end output of arm with compared with, the output end of the rear class operational amplifier fed back to after connecting with the 4th resistance it is described after
The inverting input terminal of grade operational amplifier.
As a further improvement of the present invention, the sample to be tested is thermosensitive resistance type, PN junction diode type, thermocouple type
One of with thermoelectric type.
As a further improvement of the present invention, the voltage source is high-precision signal generator.
Originally it returns and a kind of test method of test circuit based on above-mentioned electrical readout non-refrigerated infrared detector is provided, adopt
Thermal conductivity test is carried out to the sample to be tested with the test circuit of the electrical readout non-refrigerated infrared detector, thermal response time is surveyed
Examination and thermal capacitance test.
As a further improvement of the present invention, the thermal conductivity test includes the following steps:
Step 1, signal generator provides a constant voltage source for test circuit；
Step 2, after circuit work read-out voltage table registration, and according to first fixed resistance in parallel with voltmeter
Resistance value calculates the electric current for flowing through sample to be tested；
Step 3, the amplitude of adjustment signal generator output voltage repeatedly makes sample to be tested work under operating current；
Step 4, both end voltage when sample to be tested works normally is calculated, the voltage temperature coefficient in conjunction with infrared device is anti-
Push away the temperature for obtaining sample to be tested work；
Step 5, according to this operating temperature and environment temperature, the thermal conductivity of non-refrigerated infrared detector is calculated.
As a further improvement of the present invention, the thermal response time test includes the following steps:
Step 1, signal generator first provides a constant voltage source for test circuit；
Step 2, the variable resistance on arm is compared in adjusting keeps two output terminal potentials of electric bridge equal；
Step 3, adjustment signal generator generates a cycle square-wave voltage and gives test circuit power supply；
Step 4, variation and the amplification of two output end voltages of electric bridge are read with voltage amplifier module, and by voltage oscilloscope
It shows.
As a further improvement of the present invention, the thermal capacitance test method is indirectly testing method, tests the sample to be tested
Thermal conductivity and thermal response time, further according to formula: thermal capacitance=thermal conductivity × thermal response time, calculate obtain.
The beneficial effects of the present invention are: the test circuit of the electrical readout non-refrigerated infrared detector and method are based on infrared device
The self-heating effect of part can be controlled more preferably to the factor for having tested interference without considering extraneous radiation, test operability
Height, precision are also high.Test circuit of the invention is simple and easy to do, and compared with conventional test methodologies, application apparatus is simple, experimental implementation
Simply, sample can be loaded and is accurately controlled, required test equipment is easy to obtain, and test equipment selects conventional electrical
Equipment controls testing cost well, while measuring accuracy is also higher, can realize essence to the thermal response time of millisecond magnitude
Really measurement, practicability are very high.
Detailed description of the invention
Fig. 1 is the test circuit diagram of electrical readout non-refrigerated infrared detector of the present invention.
In conjunction with attached drawing, make the following instructions:
S_01 --- Wheatstone bridge；S_02 --- voltage amplification module；
VCC --- voltage source；R1 --- the first fixed resistance；
R2 --- the second fixed resistance；R3 --- third fixed resistance；
R4 --- the 4th fixed resistance；D --- sample to be tested；
R5 --- variable resistance；U1 --- prime operational amplifier；
U2 --- rear class operational amplifier；U3 --- voltage oscilloscope；
U4 --- voltmeter.
Specific embodiment
Below in conjunction with attached drawing, elaborate to a preferred embodiment of the invention.But protection scope of the present invention is not
Be limited to following embodiments, i.e., in every case with simple equivalence changes made by scope of the present invention patent and description with repair
Decorations, all still belong within the invention patent covering scope.
It refering to fig. 1, is a kind of test circuit of electrical readout non-refrigerated infrared detector of the present invention, including non-brake method
The sample to be tested D of infrared detector, the first fixed resistance R1, the second fixed resistance R2, variable resistance R5, voltage source VCC, voltage
Amplification module S_02, voltmeter U4 and voltage oscilloscope U3, using the sample to be tested D as test arm, the described first fixed electricity
R1 and the second fixed resistance R2 is hindered as ratio arms, and the variable resistance R5 constitutes Wheatstone bridge S_01 as arm is compared；Institute
It states Wheatstone bridge S_01 to be powered by the voltage source VCC, the voltmeter U4 is connected in parallel on and the test arm i.e. sample to be tested D
On concatenated ratio arms i.e. the first fixed resistance R1, the output end voltage of the Wheatstone bridge S_01 is through the voltage amplification mould
It is shown after block S_02 amplification by the voltage oscilloscope U3.
The voltage amplification module S_02 includes prime operational amplifier U1 and rear class operational amplifier U2, and the voltage is put
Big module S_02 is using the measurement arm of Wheatstone bridge and compares the both end voltage of arm as input, wherein measure arm output end and
The non-inverting input terminal of the prime operational amplifier U1 is connected, and a branch of the output end of the prime operational amplifier U1 is straight
The reversed inverting input terminal for being fed to the prime operational amplifier U1, another article of branch of the prime operational amplifier U1 and
After four resistance R4 series connection, the rear class operational amplifier U2 inverting input terminal is accessed；The same phase of the rear class operational amplifier U2
The output of input terminal arm compared with is connected, and the output end of the rear class operational amplifier U2 is fed back to after connecting with the 4th resistance R3
The inverting input terminal of the rear class operational amplifier U2.
Wherein, the sample to be tested be thermosensitive resistance type, PN junction diode type, thermocouple type and thermoelectric type wherein it
One, the voltage source is high-precision signal generator.
A kind of test method of the test circuit based on above-mentioned electrical readout non-refrigerated infrared detector, is read using the electricity
The test circuit of non-refrigerated infrared detector carries out thermal conductivity test, thermal response time test and thermal capacitance survey to the sample to be tested out
Examination.
Thermal conductivity test, i.e. I-V method of testing, test philosophy: infrared device sample device after absorbing extraneous infra-red radiation
Part own temperature can increase, and the voltage at infrared device sample to be measured both ends can reduce with the raising of device own temperature.I
With the relationship between temperature to quantify infrared device both end voltage and device of voltage temperature coefficient this concept itself.I-V
Method of testing around this principle, loads a current offset, since the self-heating effect of infrared device can generate on sample to be tested
Heat, this heat rise the temperature of sample itself, are eventually held in a temperature, by measuring pixel both ends at this time
Voltage obtains the temperature T of sample at this time further according to TCV.By sample operating temperature and environment temperature Ts, in conjunction with thermal conductivity definitionThe thermal conductivity of device is calculated.
Thermal conductivity test includes the following steps:
Step 1, signal generator provides a constant voltage source for test circuit；
Step 2, after circuit work read-out voltage table U4 registration, and it is fixed electric according in parallel with voltmeter U4 first
The resistance value for hindering R1, calculates the electric current for flowing through sample to be tested (D)；
Step 3, the amplitude of adjustment signal generator output voltage repeatedly makes sample to be tested work under operating current；
Step 4, both end voltage when sample to be tested works normally is calculated, counter is pushed away in conjunction with the TCV curve of infrared device
The temperature of sample to be tested work out；
Step 5, according to this operating temperature and environment temperature, the thermal conductivity of non-refrigerated infrared detector is calculated.
Thermal response time test philosophy: when infrared device sample to be measured is placed in the room temperature environment of complete darkness, environment
Radiation and target emanation and itself extraneous heat radiation is simply ignored, at this time equation of heat balance are as follows:Wherein c is thermal capacitance, and I, V are the voltage and current on sample to be tested, and G is sample to be tested and ring
Thermal conductivity between border.Show that R1 both end voltage is V according to voltmeter (U4)1, therefore electric current on sampleSample to be tested both ends
Voltage V=VCC-V1.We assume that the product of IV changes less during the experiment；Then peer-to-peer both sides integrate:Wherein, Q is integral of the IV to the time.It is defined according to thermal response time: the temperature of infrared detector
From initial temperature to the 1-e of final temperature-1The time spent in when=63%, i.e. thermal response time size are
The thermal response time test includes the following steps:
Step 1, signal generator first provides a constant voltage source for test circuit；
Step 2, the variable resistance on arm is compared in adjusting keeps two output terminal potentials of electric bridge equal；
Step 3, adjustment signal generator generates a cycle square-wave voltage and gives test circuit power supply；
Step 4, variation and the amplification of two output end voltages of electric bridge are read with voltage amplifier module, and by voltage oscilloscope
It shows.
Thermal capacitance test method, the test method are indirectly testing method.By the thermal conductivity parameter and thermal response time tested out,
Further according to formula: thermal capacitance is calculated in thermal capacitance=thermal conductivity * thermal response time.
The principle of test method of the invention is the self-heating effect based on infrared device, can without considering extraneous radiation
More preferably to control to the factor for having tested interference, experiment operability is high, and precision is also high.The test circuit of this patent is easy easily
Row, compared with above-mentioned conventional test methodologies, application apparatus is simple, and experimental implementation is simple, can load to sample and accurately be controlled
System, required test equipment are easy to obtain, and test equipment selects conventional electrical equipment, controls testing cost well, together
When measuring accuracy it is also higher, precise measurement can be realized to the thermal response time of millisecond magnitude, practicability is very high.
Claims (8)
1. a kind of test circuit of electrical readout non-refrigerated infrared detector, it is characterised in that: including non-refrigerated infrared detector
Sample to be tested (D), the first fixed resistance (R1), the second fixed resistance (R2), variable resistance (R5), voltage source (VCC), voltage are put
Big module (S_02), voltmeter (U4) and voltage oscilloscope (U3), using the sample to be tested (D) as test arm, described first
Fixed resistance (R1) and the second fixed resistance (R2) are used as ratio arms, the variable resistance (R5) as arm is compared, constitute favour this
Energization bridge (S_01)；The Wheatstone bridge (S_01) by the voltage source (VCC) power, the voltmeter (U4) be connected in parallel on
On the test arm, that is, sample to be tested (D) i.e. the first fixed resistance of concatenated ratio arms (R1), the Wheatstone bridge (S_01)
Output end voltage through the voltage amplification module (S_02) amplification after by the voltage oscilloscope (U3) show；Wherein,
Thermal conductivity test when: by make test circuit work after read-out voltage table (U4) registration, and according to voltmeter (U4) simultaneously
The resistance value of the first fixed resistance (R1) of connection, calculates the electric current for flowing through sample to be tested (D)；Adjustment signal generator exports repeatedly
The amplitude of voltage makes sample to be tested work under operating circuit；Both end voltage when sample to be tested work is calculated, in conjunction with infrared
The voltage temperature coefficient of device pushes away the temperature for obtaining sample to be tested work repeatedly；According to this operating temperature and environment temperature, meter
Calculate the thermal conductivity of non-refrigerated infrared detector；
When geo-thermal response test: when infrared device sample to be measured is placed in the room temperature environment of complete darkness, environmental radiation and target
It radiates and itself is simply ignored extraneous heat radiation, at this time equation of heat balance are as follows:
Wherein c is thermal capacitance, and I, V are the voltage and current on sample to be tested, thermal conductivity of the G between sample to be tested and environment；According to voltage
Table (U4) show that R1 both end voltage is V1, therefore electric current on sampleSample to be tested both end voltage V=VCC-V1；
Signal generator first provides a constant voltage source for test circuit；The variable resistance on arm is compared in adjusting makes the two of electric bridge
A output terminal potential is equal；Adjustment signal generator generates a cycle square-wave voltage and gives test circuit power supply；With voltage amplifier
Module reads the variation of two output end voltages of electric bridge and amplification, and is shown by voltage oscilloscope；According to thermal response time
Definition: 1-e of the temperature of infrared detector from initial temperature to final temperature-1The time spent in when=63%；
When thermal capacitance calculates: according to the thermal conductivity and thermal response time for testing the sample to be tested, further according to formula: thermal capacitance=thermal conductivity ×
Thermal response time calculates and obtains thermal capacitance.
2. the test circuit of electrical readout non-refrigerated infrared detector according to claim 1, it is characterised in that: the voltage
Amplification module (S_02) includes prime operational amplifier (U1) and rear class operational amplifier (U2), the voltage amplification module (S_
02) using the measurement arm of Wheatstone bridge and compare the both end voltage of arm as input, wherein the output end of measurement arm with it is described before
The non-inverting input terminal of grade operational amplifier (U1) is connected, and a branch of the output end of the prime operational amplifier (U1) is direct
Feed back the inverting input terminal of the prime operational amplifier (U1), another branch of the prime operational amplifier (U1) with
After the series connection of 4th resistance (R4), rear class operational amplifier (U2) inverting input terminal is accessed；The rear class operational amplifier
(U2) output of non-inverting input terminal arm compared with is connected, the output end and the 4th resistance of the rear class operational amplifier (U2)
(R3) inverting input terminal of the rear class operational amplifier (U2) is fed back to after connecting.
3. the test circuit of electrical readout non-refrigerated infrared detector according to claim 1, it is characterised in that: described to be measured
Sample is one of thermosensitive resistance type, PN junction diode type, thermocouple type and thermoelectric type.
4. the test circuit of electrical readout non-refrigerated infrared detector according to claim 1, it is characterised in that: the voltage
Source is high-precision signal generator.
5. a kind of test of the test circuit based on electrical readout non-refrigerated infrared detector of any of claims 1-4
Method, which is characterized in that heat is carried out to the sample to be tested using the test circuit of the electrical readout non-refrigerated infrared detector
Lead test, thermal response time test and thermal capacitance test.
6. test method according to claim 5, which is characterized in that the thermal conductivity test includes the following steps:
Step 1, signal generator provides a constant voltage source for test circuit；
Step 2, after circuit work read-out voltage table (U4) registration, and it is fixed electric according in parallel with voltmeter (U4) first
The resistance value for hindering (R1), calculates the electric current for flowing through sample to be tested (D)；
Step 3, the amplitude of adjustment signal generator output voltage repeatedly makes sample to be tested work under operating current；
Step 4, both end voltage when sample to be tested works normally is calculated, counter is pushed away in conjunction with the voltage temperature coefficient of infrared device
The temperature of sample to be tested work out；
Step 5, according to this operating temperature and environment temperature, the thermal conductivity of non-refrigerated infrared detector is calculated.
7. test method according to claim 5 or 6, which is characterized in that the thermal response time test includes following step
It is rapid:
Step 1, signal generator first provides a constant voltage source for test circuit；
Step 2, the variable resistance on arm is compared in adjusting keeps two output terminal potentials of electric bridge equal；
Step 3, adjustment signal generator generates a cycle square-wave voltage and gives test circuit power supply；
Step 4, variation and the amplification of two output end voltages of electric bridge are read with voltage amplifier module, and are shown by voltage oscilloscope
Out.
8. test method according to claim 7, which is characterized in that the thermal capacitance test method is indirectly testing method, is surveyed
The thermal conductivity and thermal response time for trying the sample to be tested, further according to formula: thermal capacitance=thermal conductivity × thermal response time is calculated and is obtained.
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| CN110346052B (en) * | 2019-06-13 | 2020-05-05 | 无锡物联网创新中心有限公司 | MEMS non-refrigeration infrared detector thermal parameter testing circuit and testing method |
| CN110440955B (en) * | 2019-08-13 | 2021-04-13 | 中核控制系统工程有限公司 | Response time test system for thermal resistance conditioning module |
| CN113075154A (en) * | 2021-03-31 | 2021-07-06 | 江苏国电南自海吉科技有限公司 | Non-dispersive infrared gas concentration detection device and detection method based on platinum resistor |
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| US20020166968A1 (en) * | 2001-05-11 | 2002-11-14 | Bradley Martin G. | Apparatus and method of measuring bolometric resistance changes in an uncooled and thermally unstabilized focal plane array over a wide temperature range |
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| US5756878A (en) * | 1995-01-24 | 1998-05-26 | Yamatake-Honeywell Co., Ltd. | Thermal conductivity measuring device |
| CN101493432A (en) * | 2009-03-10 | 2009-07-29 | 中国计量科学研究院 | Method for measuring thermal conductivity coefficient of solid material |
| CN103175862A (en) * | 2013-02-28 | 2013-06-26 | 江苏大学 | Device for measuring liquid heat conductivity coefficient based on transient dual-hot-wire method |
| CN104422712A (en) * | 2013-08-23 | 2015-03-18 | 热电子Led有限公司 | Thermal conductivity detector comprising a sealed cavity |
| CN105841836A (en) * | 2016-03-18 | 2016-08-10 | 南京邮电大学 | Novel transient temperature sensor |
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