CN110299338A - A kind of inner prop external circular type two-region composite welding structure and hybrid bonded method - Google Patents
A kind of inner prop external circular type two-region composite welding structure and hybrid bonded method Download PDFInfo
- Publication number
- CN110299338A CN110299338A CN201910502021.6A CN201910502021A CN110299338A CN 110299338 A CN110299338 A CN 110299338A CN 201910502021 A CN201910502021 A CN 201910502021A CN 110299338 A CN110299338 A CN 110299338A
- Authority
- CN
- China
- Prior art keywords
- photoresist
- metal
- circular type
- inner prop
- external circular
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/1147—Manufacturing methods using a lift-off mask
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/116—Manufacturing methods by patterning a pre-deposited material
- H01L2224/1162—Manufacturing methods by patterning a pre-deposited material using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/118—Post-treatment of the bump connector
- H01L2224/11848—Thermal treatments, e.g. annealing, controlled cooling
- H01L2224/11849—Reflowing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/1301—Shape
- H01L2224/13012—Shape in top view
- H01L2224/13014—Shape in top view being circular or elliptic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/1301—Shape
- H01L2224/13016—Shape in side view
- H01L2224/13018—Shape in side view comprising protrusions or indentations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/1302—Disposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/13109—Indium [In] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/13111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/13116—Lead [Pb] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/13139—Silver [Ag] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/13144—Gold [Au] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/13147—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/812—Applying energy for connecting
- H01L2224/81201—Compression bonding
- H01L2224/81203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Abstract
The invention discloses a kind of inner prop external circular type two-region composite welding structures, including kernel column and outer collarette, the kernel column using can cold welding at room temperature metal or metal system, the outer collarette uses high-temperature solder metal or metal system, a kind of hybrid bonded method based on above-mentioned welding spot structure is also disclosed, includes the following steps: that (1) provides the wafer (substrate) for having inner prop external circular type two-region composite welding structure;(2) multiple chips are bonded on wafer (substrate) in advance one by one by way of room temperature/low temperature pressing;(3) the multiple chips being bonded in advance are subjected to primary whole thermocompression bonding.The present invention thoroughly avoids conventional multi-chip to single wafer (substrate) eutectic bonding technique because being bonded failure caused by heating repeatedly, substantially increase the efficiency of technique entirety, the technology difficulty in chip fabrication process is effectively reduced, process costs are greatly saved.
Description
Technical field
The present invention relates to technical field of manufacturing semiconductors, specifically a kind of inner prop external circular type two-region composite welding structure and mixed
Close bonding method.
Background technique
Currently, common multi-chip to single wafer or multi-chip to the bonding techniques of single substrate usually only with
A kind of combination of brazing metal, common solder combinations include Jin-tin, Yin-tin, copper-tin, tin-lead etc., and the bonding temperature needed is logical
Often between 200 DEG C~350 DEG C.
Excessively high bonding temperature may be such that in the bonding process of multi-chip to wafer (substrate), wafer or
Person's substrate by heating-cooling repeatedly, cause chip risen repeatedly-cooling after fail or the repeatedly heated rear surface of solder generates
Severe oxidation, which is eventually led to, to be bonded.
Summary of the invention
The purpose of the present invention is to overcome the deficiency in the prior art, provide a kind of inner prop external circular type two-region composite welding structure and
Hybrid bonded method.
In order to achieve the above objectives, The technical solution adopted by the invention is as follows:
A kind of inner prop external circular type two-region composite welding structure, including kernel column and outer collarette, the kernel column uses can room
The metal or metal system of the lower cold welding of temperature, the outer collarette use high-temperature solder metal or metal system.
Preferably, can at room temperature cold welding metal be indium or tin;Can at room temperature cold welding metal system be gold-indium, indium-indium
Or any one in Jin-tin.
Preferably, high-temperature solder metal is gold or tin, and high-temperature solder metal system is Jin-tin, Yin-tin, copper-tin or tin-
Any one in lead.
The present invention discloses the preparation methods of above-mentioned inner prop external circular type two-region composite welding structure, including walk as follows
It is rapid:
(1) in crystal column surface coating photoresist, photoresist with a thickness of 5~50 μm;
(2) step (1) is coated with the wafer of photoresist successively through exposure and development and after baking processing, obtained photoetching
Glue pattern is in the pattern that crystal column surface is in inverted trapezoidal;
(3) by the way of vapor deposition or sputtering, the metal of cold welding or metal system step (2) will can be deposited at room temperature
Photoetching offset plate figure surface, photoresist opening ground the metal of cold welding or metal system can deposit to wafer table at room temperature
Face, deposition with a thickness of 3~50 μm, and be less than photoresist thickness;
(4) use wet process metal lift-off material, by step (3) photoresist surface can cold welding at room temperature metal or metal
System removal, then photoresist is removed, form welding column inner core;
(5) formed the crystal column surface coating photoresist of welding column inner core in step (4), photoresist with a thickness of 5~
50μm;
(6) step (5) is coated with the wafer of photoresist successively through exposure and development and after baking processing, obtained photoetching
Glue pattern is in the pattern that crystal column surface and welding column inner core surface are in inverted trapezoidal;
(7) by the way of vapor deposition or sputtering or plating, high-temperature solder metal or metal system are deposited into step
(6) photoetching offset plate figure surface deposits to crystal column surface in the local high-temperature solder metal or metal system of photoresist opening;
(8) wet process metal lift-off material is used, by the high-temperature solder metal or metal system on step (7) photoresist surface
Removal, then photoresist is removed, form welding column peripheral structure;
(9) wafer of step (8) is flowed back at a temperature of 150~250 DEG C, make can cold welding at room temperature metal or metallic object
It is that surface forms protrusion, obtains inner prop external circular type two-region composite welding structure.
Further, the step (2) and (6) exposure light source using visible light, 436nm wavelength light, 365nm wavelength light,
One or more mixing of 405nm wavelength light, 248nm wavelength light or 193nm wavelength light, the mode of exposure can be used projection,
Contact or proximity, developer solution use alkaline solution or organic solvent.
Further, the mode that the step (4) and step (8) remove photoresist is impregnated using reagent;Or/and use reagent
When impregnating photoresist dissolution removal, completed by the way of high pressure wet-chemical spray gun or ultrasonic vibration auxiliary.
It is another object of the present invention to protect the mixing based on above-mentioned inner prop external circular type two-region composite welding structure
Bonding method includes the following steps:
(1) wafer for having inner prop external circular type two-region composite welding structure is provided;
(2) high-precision flip-chip bonder is used, multiple chips are bonded in advance one by one in such a way that low temperature presses
On wafer, pre- bonding temperature≤100 DEG C, pre- bonding pressure is 100~4000N;
(3) the multiple chips being bonded in advance are carried out by primary whole thermocompression bonding, bonding temperature by wafer bonding machine
It is 200~450 DEG C, bonding pressure is 4~100KN.
Compared with prior art, the advantages and positive effects of the present invention are as follows:
It is possible, firstly, to complete the pre- bonding in multi-chip to single wafer (substrate) at low temperature, it is then transferred into wafer
Bonder last time high temperature completes the final high temperature bonding of multiple chips;Thoroughly avoid conventional multi-chip to single wafer (substrate)
Eutectic bonding technique is because being bonded failure caused by heating repeatedly.
Secondly, the pre- bonding process under low temperature efficiently avoids each chip in the welding process of Xiang Jingyuan (substrate)
One by one the tediously long time needed for heating-temperature-fall period, substantially increase the production efficiency of technique entirety.
Again, it the metal system (gold-indium, indium-indium etc.) of cold welding and common high temperature can be welded at room temperature using one group
Material system (Jin-tin, Yin-tin, copper-tin, tin-lead, tin etc.) combines, and forms combined type welding spot structure, combined type solder joint
Cold welding mode can be used at room temperature, the pre- bonding of multi-chip to single wafer (substrate) is completed, after being then bonded in advance again
Chip be put into wafer bonding machine and apply temperature and pressure, to complete final bonding.
Finally, being avoided in such a way that cold welding material metal system and room temperature are bonded in advance
Metal-Direct-Bonding (direct bonded metal conjunction) or hybrid bonded (HybirdBonding) work of semiconductor
Before skill, the rigors processed and polished to chip bonding face effectively reduce the technology difficulty in chip fabrication process, significantly
Process costs are saved.
Detailed description of the invention
Fig. 1 inner prop external circular type of the present invention two-region composite welding structure front view;
Fig. 2 inner prop external circular type of the present invention two-region composite welding structure top view;
The corresponding composite welding structure preparation process flow diagrammatic cross-section of the embodiment of the present invention of Fig. 3~8.
The corresponding hybrid bonded method and process process profile diagram of the embodiment of the present invention of Fig. 9~10.
Fig. 1-2 mark meaning is as follows: 1- kernel column, the outer collarette of 2-.
Specific embodiment
It elaborates below to specific embodiments of the present invention.
A kind of inner prop external circular type two-region composite welding structure, as shown in Figs. 1-2, including kernel column 1 and outer collarette 2, it is described
Kernel column 1 uses indium metal, and the outer collarette 2 uses gold-tin alloy.
The preparation method of above-mentioned inner prop external circular type two-region composite welding structure, includes the following steps:
(1) in crystal column surface coating photoresist, photoresist with a thickness of 25 μm;
(2) wafer that step (1) is coated with photoresist is successively handled with baking through exposure and development, obtained photoresist
Figure is in the pattern that crystal column surface is in inverted trapezoidal;As shown in Figure 3;
(3) it adopts vapor deposition method, indium metal is deposited to the photoetching offset plate figure surface of step (2), and open in photoresist
Mouthful local indium metal deposit to crystal column surface, deposition with a thickness of 20 μm;As shown in Figure 4;
(4) wet process metal lift-off material is used, the indium metal on step (3) photoresist surface is removed, then photoresist is gone
It removes, forms welding column inner core;As shown in Figure 5;
(5) formed the crystal column surface coating photoresist of welding column inner core in step (4), photoresist with a thickness of 25
μm;
(6) wafer that step (5) is coated with photoresist is successively handled with baking through exposure and development, obtained photoresist
Figure is in the pattern that crystal column surface and welding column inner core surface are in inverted trapezoidal;As shown in Figure 6;
(7) it adopts vapor deposition method, gold-tin alloy is deposited into step (6) photoetching offset plate figure surface, and open in photoresist
The local gold-tin alloy of mouth deposits to crystal column surface;As shown in Figure 7;
(8) wet process metal lift-off material is used, the gold-tin alloy on step (7) photoresist surface is removed, then photoetching
Glue removal, forms welding column peripheral structure;As shown in Figure 8;
(9) wafer of step (8) is flowed back at a temperature of 200 DEG C, indium metal surface forms protrusion, obtains inner prop external circular type
Two-region composite welding structure.
The light source of the step (2) and (6) exposure uses high-pressure sodium lamp mixed wavelengths light source, and the mode of exposure is using close
Formula, developer solution use 2.38% tetramethylammonium hydroxide.
When the step (4) and step (8) impregnate dissolution removal photoresist using 85 DEG C of nmp solution, and with ultrasound shake
The mode for swinging auxiliary is completed.
Based on the hybrid bonded method of above-mentioned inner prop external circular type two-region composite welding structure, include the following steps:
(1) wafer for having above-mentioned inner prop external circular type two-region composite welding structure is provided;
(2) high-precision flip-chip bonder is used, multiple chips are bonded to wafer in advance one by one by way of pressing
On, 25 DEG C of pre- bonding temperature, pre- bonding pressure is 1000N;As shown in Figure 9;
(3) the multiple chips being bonded in advance are subjected to primary whole thermocompression bonding through wafer bonding machine, bonding temperature is
350 DEG C, bonding pressure 70KN, as shown in Figure 10;.
Remarks: vapor deposition is using ei-5z high vacuum evaporation filming equipment (Japanese ULVAC) or U.S.'s pellet vacuum Explorer
The thickness of evaporating and coating equipment, photoresist film is measured with DektakXT step instrument, and proximity printing uses Germany's SUSS exposure machine
MA6/MA8/MA150e/MA200, high-precision flip-chip bonder use the FC150/FC300/FC NEO/ of SET company, France
ACCuRA100/ACCuRA Plus, wafer bonding machine use the XB8 type or XBC200 type of SUSS.
The present invention is based on the welding spot structures of inside and outside ring type, and multiple chips are led to the direct pressure welding of excessive pressure one by one at room temperature
Onto wafer, pre- bonding is completed, then the multiple chips being bonded in advance are carried out by primary whole hot pressing key using the big pressure of high temperature
It closes, cold pressing and hot pressing wafer bond techniques is combined, thoroughly avoid conventional multi-chip to single wafer (substrate) eutectic bonding work
Skill substantially increases the efficiency of technique entirety, effectively reduces chip fabrication process because being bonded failure caused by heating repeatedly
In technology difficulty, process costs are greatly saved.
Above-described embodiment is only more excellent embodiment of the invention, is implemented according to the technical essence of the invention to above
Any simple modification, modification and the alternate variation that example is made, belong in the range of technical solution of the present invention.
Claims (7)
1. a kind of inner prop external circular type two-region composite welding structure, which is characterized in that including kernel column and outer collarette, the kernel column
Using can cold welding at room temperature metal or metal system, the outer collarette uses high-temperature solder metal or metal system.
2. a kind of inner prop external circular type two-region according to claim 1 composite welding structure, which is characterized in that can be cold at room temperature
The metal of weldering is indium or tin;Can at room temperature cold welding metal system be gold-indium, indium-indium or Jin-tin in any one.
3. a kind of inner prop external circular type two-region according to claim 1 composite welding structure, which is characterized in that high-temperature solder gold
Belonging to is gold or tin, and high-temperature solder metal system is any one in Jin-tin, Yin-tin, copper-tin or tin-lead.
4. the preparation method of the inner prop external circular type two-region composite welding structure as described in claims 1 to 3 any one, feature
It is, includes the following steps:
(1) in crystal column surface coating photoresist, photoresist with a thickness of 5~50 μm;
(2) step (1) is coated with the wafer of photoresist successively through exposure and development and after baking processing, obtained photoresist figure
Shape is in the pattern that crystal column surface is in inverted trapezoidal;
(3) by the way of vapor deposition or sputtering, the metal of cold welding or metal system the light of step (2) will can be deposited at room temperature
Photoresist patterned surface the metal of cold welding or metal system can deposit to crystal column surface at room temperature on the ground of photoresist opening, sink
It is long-pending with a thickness of 3~50 μm, and be less than the thickness of photoresist;
(4) use wet process metal lift-off material, by step (3) photoresist surface can cold welding at room temperature metal or metal system
Removal, then photoresist is removed, form welding column inner core;
(5) formed the crystal column surface coating photoresist of welding column inner core in step (4), photoresist with a thickness of 5~50 μm;
(6) step (5) is coated with the wafer of photoresist successively through exposure and development and after baking processing, obtained photoresist figure
Shape is in the pattern that crystal column surface and welding column inner core surface are in inverted trapezoidal;
(7) by the way of vapor deposition or sputtering or plating, high-temperature solder metal or metal system are deposited into step (6) light
Photoresist patterned surface deposits to crystal column surface in the local high-temperature solder metal or metal system of photoresist opening;
(8) use wet process metal lift-off material, by step (7) photoresist surface high-temperature solder metal or metal system go
It removes, then photoresist is removed, form welding column peripheral structure;
(9) wafer of step (8) is flowed back at a temperature of 150~250 DEG C, making can the metal of cold welding or metal system table at room temperature
Face forms protrusion, obtains inner prop external circular type two-region composite welding structure.
5. a kind of preparation method of inner prop external circular type two-region according to claim 4 composite welding structure, which is characterized in that
The light source of the step (2) and (6) exposure uses visible light, 436nm wavelength light, 365nm wavelength light, 405nm wavelength light,
Projection, contact or close can be used in one or more mixing of 248nm wavelength light or 193nm wavelength light, the mode of exposure
Formula, developer solution use alkaline solution or organic solvent.
6. a kind of preparation method of inner prop external circular type two-region according to claim 5 composite welding structure, which is characterized in that
The mode that the step (4) and step (8) remove photoresist is impregnated using reagent;Or/and it is impregnated with reagent photoetching peptization
When solution removal, completed by the way of high pressure wet-chemical spray gun or ultrasonic vibration auxiliary.
7. a kind of based on the hybrid bonded of inner prop external circular type two-region composite welding structure described in claims 1 to 3 any one
Method, which comprises the steps of:
(1) wafer for having inner prop external circular type two-region composite welding structure is provided;
(2) high-precision flip-chip bonder is used, multiple chips are bonded to wafer in such a way that low temperature presses in advance one by one
On, pre- bonding temperature≤100 DEG C, pre- bonding pressure is 100~4000N;
(3) the multiple chips being bonded in advance are carried out by primary whole thermocompression bonding, bonding temperature 200 by wafer bonding machine
~450 DEG C, bonding pressure is 4~100KN.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910502021.6A CN110299338B (en) | 2019-06-11 | 2019-06-11 | Inner column outer ring type double-area composite welding spot structure and hybrid bonding method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910502021.6A CN110299338B (en) | 2019-06-11 | 2019-06-11 | Inner column outer ring type double-area composite welding spot structure and hybrid bonding method |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110299338A true CN110299338A (en) | 2019-10-01 |
CN110299338B CN110299338B (en) | 2020-09-11 |
Family
ID=68027831
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910502021.6A Expired - Fee Related CN110299338B (en) | 2019-06-11 | 2019-06-11 | Inner column outer ring type double-area composite welding spot structure and hybrid bonding method |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110299338B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113200513A (en) * | 2021-04-29 | 2021-08-03 | 中山大学南昌研究院 | Method for packaging height-controllable capacitive accelerometer |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101123233A (en) * | 2006-08-10 | 2008-02-13 | 索尼株式会社 | Electronic device and method of manufacturing the same |
CN101798054A (en) * | 2010-05-10 | 2010-08-11 | 北京广微积电科技有限公司 | Wafer-level vacuum encapsulating method for micro-electromechanical device |
CN101989587A (en) * | 2009-07-30 | 2011-03-23 | 全懋精密科技股份有限公司 | Electrical connection structure of circuit board and circuit board device |
JP2014033067A (en) * | 2012-08-03 | 2014-02-20 | Fujitsu Ltd | Semiconductor chip, semiconductor device, and method of manufacturing semiconductor device |
CN105006440A (en) * | 2015-06-24 | 2015-10-28 | 武汉新芯集成电路制造有限公司 | Vacuum-bonding atmospheric-pressurization hybrid bonding method |
CN206135593U (en) * | 2016-10-25 | 2017-04-26 | 浙江万冠电机有限公司 | Joint connection structure of electric machine with aluminium winding |
-
2019
- 2019-06-11 CN CN201910502021.6A patent/CN110299338B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101123233A (en) * | 2006-08-10 | 2008-02-13 | 索尼株式会社 | Electronic device and method of manufacturing the same |
CN101989587A (en) * | 2009-07-30 | 2011-03-23 | 全懋精密科技股份有限公司 | Electrical connection structure of circuit board and circuit board device |
CN101798054A (en) * | 2010-05-10 | 2010-08-11 | 北京广微积电科技有限公司 | Wafer-level vacuum encapsulating method for micro-electromechanical device |
JP2014033067A (en) * | 2012-08-03 | 2014-02-20 | Fujitsu Ltd | Semiconductor chip, semiconductor device, and method of manufacturing semiconductor device |
CN105006440A (en) * | 2015-06-24 | 2015-10-28 | 武汉新芯集成电路制造有限公司 | Vacuum-bonding atmospheric-pressurization hybrid bonding method |
CN206135593U (en) * | 2016-10-25 | 2017-04-26 | 浙江万冠电机有限公司 | Joint connection structure of electric machine with aluminium winding |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113200513A (en) * | 2021-04-29 | 2021-08-03 | 中山大学南昌研究院 | Method for packaging height-controllable capacitive accelerometer |
CN113200513B (en) * | 2021-04-29 | 2023-11-24 | 中山大学南昌研究院 | Method for packaging highly controllable capacitive accelerometer |
Also Published As
Publication number | Publication date |
---|---|
CN110299338B (en) | 2020-09-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI284947B (en) | Method of wafer level package using elastomeric electroplating mask | |
US20030157792A1 (en) | Bump manufacturing method | |
CN101226908A (en) | Projection structure with ring-shaped support and manufacturing method thereof | |
CN101587872B (en) | Semiconductor device, method for mounting semiconductor device, and mounting structure of semiconductor device | |
TW200400572A (en) | New under bump metallurgy structural design for high reliability bumped packages | |
CN103681277B (en) | A kind of wet etching method in multiple layer metal patterning process | |
CN104241511B (en) | Method for manufacturing high-brightness flip ultraviolet LED chips | |
WO2022214058A1 (en) | Metal bump structure and manufacturing method | |
CN110299338A (en) | A kind of inner prop external circular type two-region composite welding structure and hybrid bonded method | |
TW201448287A (en) | Electronic device array and method of transfer-bonding electronic devices | |
TWI230425B (en) | Bumping process for light emitting diode | |
WO2021217607A1 (en) | Bonding method, display backplate and display backplate manufacturing system | |
TW201322379A (en) | Conductive structure and method for forming the same | |
CN101110398A (en) | Flip chip and its manufacturing method | |
CN111668125B (en) | Wafer tin ball printing process | |
CN101078890B (en) | Method for eliminating air bubble from photoresist and stud bump making method | |
JPH07249631A (en) | Manufacture of solder bumps and solder ball and manufacture of semiconductor device | |
TWI223425B (en) | Method for mounting passive component on wafer | |
TWI284376B (en) | Bump manufacturing method | |
CN210040201U (en) | High-reliability wafer-level packaging structure of image sensor | |
CN114050110A (en) | Multilayer stacking bonding method for wafer | |
CN101286464A (en) | Metallic projection forming method on metallic layer beneath projection | |
TW418470B (en) | Method for forming solder bumps on flip chips and devices formed | |
CN105633034B (en) | Semiconductor crystal wafer bump structure | |
CN105633033B (en) | The forming method of semiconductor crystal wafer bump structure |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200911 |