CN110261684B - Liquid crystal dielectric testing device adopting double-ridge waveguide method - Google Patents
Liquid crystal dielectric testing device adopting double-ridge waveguide method Download PDFInfo
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- CN110261684B CN110261684B CN201910377410.0A CN201910377410A CN110261684B CN 110261684 B CN110261684 B CN 110261684B CN 201910377410 A CN201910377410 A CN 201910377410A CN 110261684 B CN110261684 B CN 110261684B
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 40
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000012360 testing method Methods 0.000 title claims abstract description 14
- -1 polytetrafluoroethylene Polymers 0.000 claims abstract description 21
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims abstract description 21
- 239000004810 polytetrafluoroethylene Substances 0.000 claims abstract description 21
- 230000005540 biological transmission Effects 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims abstract description 13
- 230000008878 coupling Effects 0.000 claims abstract description 10
- 238000010168 coupling process Methods 0.000 claims abstract description 10
- 238000005859 coupling reaction Methods 0.000 claims abstract description 10
- 239000002184 metal Substances 0.000 claims description 23
- 239000004020 conductor Substances 0.000 claims description 7
- 239000004576 sand Substances 0.000 claims description 6
- 238000005516 engineering process Methods 0.000 claims description 4
- 230000005684 electric field Effects 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims description 2
- 239000004809 Teflon Substances 0.000 claims 1
- 229920006362 Teflon® Polymers 0.000 claims 1
- 238000004364 calculation method Methods 0.000 claims 1
- 230000005291 magnetic effect Effects 0.000 abstract description 9
- 238000005259 measurement Methods 0.000 abstract description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000003848 UV Light-Curing Methods 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
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- 230000005292 diamagnetic effect Effects 0.000 description 1
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- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002159 nanocrystal Substances 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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Abstract
The invention discloses a liquid crystal dielectric testing device adopting a double-ridge waveguide method, which comprises a waveguide cavity, a vector network analyzer, a coaxial transmission line, a ridge waveguide coaxial converter, a coupling hole, a double-ridge waveguide cavity end plate, a polytetrafluoroethylene tube and a connecting hole, wherein the ridge waveguide coaxial converter is fixed on the upper surface of the waveguide cavity, the ridge waveguide coaxial converter is connected with the coaxial transmission line, the coupling hole is formed between the double-ridge waveguide cavity end plates, the polytetrafluoroethylene tube is inserted into the vertical central axis of the waveguide cavity, and the connecting hole is formed in the waveguide cavity. The ridge waveguide is used for measuring the change of dielectric parameters of the liquid crystal material under the action of the applied magnetic field, the liquid crystal sample testing device has the advantages of small volume, cost saving, high reliability, wide frequency band and wide tunable range, and the testing device not only is convenient for replacing the liquid crystal sample and realizes the rapid test of the broadband, but also provides the accurate measurement of the low-loss liquid crystal material.
Description
Technical Field
The invention relates to the field of microwave technical test, in particular to a liquid crystal dielectric test device adopting a double-ridge waveguide method.
Background
Most liquid crystal materials are diamagnetic substances, which mainly result from the fact that benzene rings exist in almost all liquid crystal molecules, and from the molecular perspective, when a magnetic field is perpendicular to the benzene rings, current increases in the benzene rings, which results in increasing energy in the benzene rings, and on the other hand, when the magnetic field is parallel to the rings, no induced current exists on the benzene rings, so that the energy of the liquid crystal molecules cannot continue to increase. Therefore, according to the principle that the lower the energy is, the more stable the liquid crystal molecules are, the liquid crystal molecules are always aligned parallel to the magnetic field under the action of the magnetic field, and thus the liquid crystal molecules are deflected.
Over the years, several techniques for measuring dielectric properties of materials, particularly resonant cavity methods, have been proposed, which have high measurement accuracy and are widely used with low loss. Generally, a single rectangular waveguide structure cannot measure a wide frequency band, and a plurality of rectangular waveguides with different sizes are needed to be measured, so that the method is not practical and convenient. Therefore, the dielectric property of the liquid crystal under the action of the magnetic field is tested by adopting a double-ridge waveguide method. The method can obviously improve the working bandwidth of the resonant cavity by about 80%.
The dielectric properties of nanocrystals at microwave frequencies were studied using resonant and non-resonant methods. Resonant methods are often the method of choice to meet the requirements of high precision testing, especially for low loss materials, compared to non-resonant methods which typically provide broadband measurements. In addition, the resonant cavity method is easier to load with different liquid crystal samples.
At present, the electrical performance of the ridge waveguide coaxial converter in China is not as good as that in abroad, and the main reason is that the quality of the material and the production process in China are insufficient. However, with the rapid development of economy and technology, the requirement for localization of components is raised, and the performance of the waveguide coaxial converter needs to be improved on the basis of the existing conditions.
Disclosure of Invention
The present invention is directed to a liquid crystal dielectric testing device using a double-ridge waveguide method, so as to solve the problems of the background art.
In order to achieve the purpose, the invention provides the following technical scheme: the utility model provides a double-ridge waveguide method liquid crystal dielectric testing arrangement, includes waveguide cavity, vector network analyzer, coaxial transmission line, the coaxial converter of ridge waveguide, coupling hole, double-ridge waveguide chamber end plate, polytetrafluoroethylene pipe and connecting hole, the coaxial converter of ridge waveguide is respectively connected at the both ends of waveguide cavity, be connected with coaxial transmission line on the coaxial converter of ridge waveguide, the one end of coaxial transmission line is connected on the volume network analyzer, double-ridge waveguide chamber end plate alternates in the inside of waveguide cavity, form the coupling hole between the double-ridge waveguide chamber end plate, the polytetrafluoroethylene pipe alternates inside the vertical axis department of waveguide cavity, the connecting hole sets up on the waveguide cavity.
Preferably, the ridge waveguide coaxial converter comprises a ridge waveguide lower cavity, a groove, a waveguide ridge, two metal through holes, a ridge waveguide upper cavity, two metal flanges, a flange connector, an SMA connector, two inner conductors and an adjusting screw rod, wherein the upper surface of the ridge waveguide lower cavity is provided with the groove, the two grooves are formed in the groove, the waveguide ridge is arranged between the grooves, the metal through holes are formed in the tail end of the waveguide ridge, the ridge waveguide upper cavity is arranged above the ridge waveguide lower cavity, the metal flanges are arranged on the ridge waveguide upper surface, the flange connector is arranged above the metal flanges and connected with the metal flanges through screws, the SMA connector is arranged on the flange connector upper surface, the inner conductors are arranged on the lower surface of the flange connector, and the adjusting screw rod is inserted into the metal through holes.
Preferably, the sample inside the polytetrafluoroethylene tube is an E or CB or K liquid crystal material.
Preferably, the resonant frequency of the cavity in the cavity state is ω0When added to the liquid crystal sample, the resonant frequency is omegasThen, the deviation Δ ω ═ ω of the resonant frequency of the cavity due to the external perturbation0-ωsAnd due to the sample volume and cavity volume V of the devices/VcLess than or equal to 1: 1182, the inner field of the cavity outside the sample can be assumed to be unchanged, a thin-wall polytetrafluoroethylene tube is adopted to load the liquid crystal sample, and the effect of the polytetrafluoroethylene tube is considered, so that the perturbation formula can be rewritten as follows:
wherein, VsAnd VcRepresenting the liquid crystal sample volume and the volume of the cavity, respectively, E0 is the electric field of the cavity without disturbance.
Preferably, the strong static magnetic field is in the range of 0.5T to 1T.
Preferably, the method for calculating the complex dielectric constant of the liquid crystal material adopts a multimode technology, adopts 6 frequency points within 5-22 GHz, and adopts a TE mode1，0,2n-1(n＝1,2,3...6)。
Compared with the prior art, the invention has the beneficial effects that: the liquid crystal dielectric testing device adopting the double-ridge waveguide method comprises the following steps: the invention adopts a split structure and a progressive design of double ridge heights in a waveguide cavity, improves the overall performance of the converter, and simultaneously adopts a double ridge waveguide mode to measure, so that the bandwidth is improved by 80%.
Drawings
FIG. 1 is a schematic diagram of a double-ridge waveguide liquid crystal dielectric parameter measuring device according to the present invention;
FIG. 2 is a schematic diagram of the internal cross-sectional structure of a double-ridge waveguide cavity according to the present invention;
FIG. 3 is a schematic cross-sectional view of a ridge waveguide cavity coupling hole according to the present invention;
fig. 4 is a structural diagram of a ridge waveguide coaxial converter according to the present invention.
In the figure: 1. the device comprises a waveguide cavity, 2, a vector network analyzer, 3, a coaxial transmission line, 4, a ridge waveguide coaxial converter, 41, a ridge waveguide lower cavity, 42, a groove, 43, a waveguide ridge, 44, a metal through hole, 45, a ridge waveguide upper cavity, 46, a metal flange, 47, a flange connector, 48, an SMA joint, 49, an inner conductor, 410, an adjusting screw rod, 5, a coupling hole, 6, a double-ridge waveguide cavity end plate, 7, a polytetrafluoroethylene tube, 8 and a connecting hole.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-4, the present invention provides a technical solution: the utility model provides a double-ridge waveguide method liquid crystal dielectric testing arrangement, includes waveguide cavity 1, vector network analyzer 2, coaxial transmission line 3, ridge waveguide coaxial converter 4, coupling hole 5, double-ridge waveguide cavity end plate 6, polytetrafluoroethylene pipe 7 and connecting hole 8, ridge waveguide coaxial converter 4 is respectively connected at the both ends of waveguide cavity 1 cavity, be connected with coaxial transmission line 3 on the ridge waveguide coaxial converter 4, the one end of coaxial transmission line 3 is connected on the volume network analyzer 2, double-ridge waveguide cavity end plate 6 alternates in waveguide cavity 1's inside, form coupling hole 5 between double-ridge waveguide cavity end plate 6, polytetrafluoroethylene pipe 7 alternates inside the vertical axis department of waveguide cavity 1, connecting hole 8 sets up on waveguide cavity 1.
Further, the ridge waveguide coaxial converter 4 comprises a ridge waveguide lower cavity 41, a groove 42, a waveguide ridge 43, a metal through hole 44, a ridge waveguide upper cavity 45, two metal flanges 46, a flange connector 47, an SMA connector 48, an inner conductor 49 and an adjusting screw 410, wherein the upper surface of the ridge waveguide lower cavity 41 is provided with the groove 42, the groove 42 is provided with the two grooves, the waveguide ridge 43 is arranged between the grooves 42, the tail end of the waveguide ridge 43 is provided with the metal through hole 44, the ridge waveguide upper cavity 45 is arranged above the ridge waveguide lower cavity 41, the upper surface of the ridge waveguide upper cavity 45 is provided with the metal flange 46, the flange connector 47 is arranged above the metal flange 46, the flange connector 47 is connected with the metal flange 46 through a screw, the SMA connector 48 is arranged on the upper surface of the flange connector 47, the inner conductor 49 is arranged on the lower surface of the flange connector 47, the adjusting screw 410 is inserted in the metal through hole 44.
Further, the sample inside the polytetrafluoroethylene tube 7 was an E7 or 5CB or K15 liquid crystal material.
Further, the resonant frequency of the cavity in the cavity state is ω0When added to the liquid crystal sample, the resonant frequency is omegasThen, the deviation Δ ω ═ ω of the resonant frequency of the cavity due to the external perturbation0-ωsAnd due to the sample volume and cavity volume V of the devices/VcLess than or equal to 1: 1182, it can be assumed that the sample is out of the sampleThe internal field of the cavity is unchanged, a thin-wall polytetrafluoroethylene tube is adopted to load a liquid crystal sample, and the action of the polytetrafluoroethylene tube is considered, so that the perturbation formula can be rewritten as follows:
wherein, VsAnd VcRepresenting the liquid crystal sample volume and the volume of the cavity, respectively, E0 is the electric field of the cavity without disturbance.
Further, the strong static magnetic field ranges from 0.5T to 1T.
Furthermore, a multi-mode technology is adopted in the method for calculating the complex dielectric constant of the liquid crystal material, 6 frequency points are adopted within 5-22 GHz, and the adopted mode is TE1，0,2n-1(n＝1,2,3...6)。
Furthermore, a small hole is drilled in the center of the waveguide to insert the polytetrafluoroethylene tube 7 into the small hole, liquid crystal materials can be automatically adsorbed into the thin-wall polytetrafluoroethylene tube 7 under the action of capillary force, then the two ends of the thin-wall polytetrafluoroethylene tube are sealed by UV curing adhesive, two ridge waveguide coaxial converters 4 are respectively connected with the two ends of the cavity and are connected with the coaxial transmission line 3 and the vector network analyzer 2 through the SMA connector 48, S parameters of the cavity are checked in a transmission mode, the arrangement state of liquid crystal molecules in the polytetrafluoroethylene tube 7 can be changed by changing an external magnetic field and turning over the ridge waveguide cavity, and dielectric parameters of the parallel state and the vertical state of the liquid crystal molecules are respectively measured
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes in the embodiments and/or modifications of the invention can be made, and equivalents and modifications of some features of the invention can be made without departing from the spirit and scope of the invention.
Claims (1)
1. The utility model provides a two ridge waveguide method liquid crystal dielectric testing arrangement, includes waveguide cavity (1), vector network analyzer (2), coaxial transmission line (3), ridge waveguide coaxial converter (4), coupling hole (5), two ridge waveguide cavity end plate (6), polytetrafluoroethylene pipe (7) and connecting hole (8), its characterized in that: the two ends of the cavity of the waveguide cavity (1) are respectively connected with a ridge waveguide coaxial converter (4), the ridge waveguide coaxial converter (4) is connected with a coaxial transmission line (3), one end of the coaxial transmission line (3) is connected to the vector network analyzer (2), the double ridge waveguide cavity end plates (6) are inserted in the waveguide cavity (1), a coupling hole (5) is formed between the double ridge waveguide cavity end plates (6), the polytetrafluoroethylene tube (7) is inserted in the vertical central axis of the waveguide cavity (1), and the connecting hole (8) is formed in the waveguide cavity (1);
the ridge waveguide coaxial converter (4) comprises a ridge waveguide lower cavity (41), grooves (42), waveguide ridges (43), metal through holes (44), a ridge waveguide upper cavity (45), metal flanges (46), flange connectors (47), SMA joints (48), an inner conductor (49) and adjusting screws (410), wherein the grooves (42) are formed in the upper surface of the ridge waveguide lower cavity (41), two grooves (42) are formed in the upper surface of the ridge waveguide lower cavity, the waveguide ridges (43) are arranged between the grooves (42), the metal through holes (44) are formed in the tail ends of the waveguide ridges (43), the ridge waveguide upper cavity (45) is placed above the ridge waveguide lower cavity (41), the metal flanges (46) are arranged on the upper surface of the ridge waveguide upper cavity (45), the flange connectors (47) are arranged above the metal flanges (46), and the flange connectors (47) are connected with the metal flanges (46) through screws, an SMA joint (48) is arranged on the upper surface of the flange connector (47), an inner conductor (49) is arranged on the lower surface of the flange connector (47), and the adjusting screw rod (410) is inserted into the metal through hole (44);
the sample inside the polytetrafluoroethylene tube (7) was a liquid crystal material E7 or 5CB or K15;
the resonant frequency of the cavity in the cavity state is omega0When added to the liquid crystal sample, the resonant frequency is omegasThen, the deviation Δ ω ═ ω of the resonant frequency of the cavity due to the external perturbation0-ωsAnd due to the sample volume and cavity volume V of the devices/VcLess than or equal to 1: 1182, assuming that the field in the cavity outside the sample is unchanged, and loading liquid crystal by adopting a thin-wall polytetrafluoroethylene tubeFor the sample, and considering the effect of the teflon tube, the perturbation formula can be rewritten as:
wherein, VsAnd VcRepresenting the volume of the liquid crystal sample and the volume of the cavity, respectively, E0 is the electric field of the cavity without disturbance;
the complex dielectric constant calculation method of the liquid crystal material adopts a multimode technology, adopts 6 frequency points within 5-22 GHz, and adopts a TE mode1，0,2n-1(n＝1,2,3...6)。
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| CN111123187B (en) * | 2020-01-21 | 2022-01-11 | 中北大学 | Magneto-resistive chip calibration test system and method based on double ridge waveguides |
| CN113125858B (en) * | 2021-04-20 | 2022-03-08 | 电子科技大学 | Single fiber dielectric constant testing device and method with double-ridge structure |
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