CN1448726A - An arrangement for electrical magnetic medium electromagnetic quantity temperature variation testing using ridge waveguide - Google Patents
An arrangement for electrical magnetic medium electromagnetic quantity temperature variation testing using ridge waveguide Download PDFInfo
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Abstract
The measurement equipment consists of vector network analyzer, temperature control system, TRL correcting part and ridged waveguide transmission system. The ridged waveguide transmission system consists of two coaxial converting joints connected to the ridged waveguide, two heat-dissipating ridged waveguides, two heat-isolating ridged waveguides, ridged waveguide heating seat, measured ridged waveguide and ridged waveguide temperature measuring seat. By using ridged waveguide as transmission line, the present invention has the features of relatively wide measurement frequency range, easy-to-make correcting part, measured specimen and transmission line. The present invention is especially suitable for measuring electromagnetic parameters of electromagnetic medium in different temperature and wide frequency band.
Description
Technical field:
The invention belongs to electronic technology field, particularly the technical field of measurement and test of the complex permittivity of microwave electromagnetic medium and complex permeability.
Background technology:
Electromagnetic medium has purposes widely at aspects such as television broadcasting, Radar Technology, microwave dark room and electron devices, aspect military technology, a lot of use is arranged also.In order to adapt to the requirement that electromagnetic medium uses in different temperatures and broadband, the temperature characterisitic of electromagnetic parameter (being complex permittivity and complex permeability) of measuring them is more and more important.
About the method for microwave electromagnetic medium electromagnetic parameter temperature variation testing, the main at present network parameter method that adopts.The principle of work of network parameter method is that sample and sensor thereof are considered as single port or two-port network, utilize time domain method, transmission/reflectometry, many thickness method, polymorphic method, free space method, by measuring this network parameter---scattering parameter or complex reflection coefficient calculate the electromagnetic parameter of dielectric material in view of the above.
At present, the 87051C of testing software of U.S. Agilent company adopts the electromagnetic parameter of network parameter method test material, and China has also developed corresponding detection system and software.In the temperature variation testing to electromagnetic parameter, document " D.Lemaire; D.Cros; H.Jallageas; P.Guillon; " 800 ℃ of in centimeter of from-160 ℃ of up to of Material characterisation and millimeter wavelength frequencyband "; Conference on Preci sion Electromagnetic Measurements, Jun 17-201996, Sponsored by IEEE p 72-73 0589-1485 In English "; it is to adopt the free space method, and the test macro block diagram of free space method is as shown in Figure 1.Its principle of work is: utilize electromagnetic horn 1 and point focusing lens 2, electromagnetic wave focused on measured medium 3 places, promptly locate for confocal of two antennas, test the scattering parameter of medium, calculate the electromagnetic parameter of measured material by these scattering parameters.But when carrying out temperature variation testing with this method, to darkroom environment requirement height, heating power is big, and test accuracy is low.
What document " A.P.Gregory; S.Etzel; R.N.Clarke; " Precise measurements ondielectric reference liquids over the temperature range (5-50) ℃ of usingcoaxial line methods "; Precision Electromagnetic Measurements Digest; 2000 Conference on, 2000 " adopted is coaxial method of testing, and it is to make transmission line with coaxial cable.Its principle of work is: measured material is filled in the coaxial cable, with vector network analyzer test the scattering parameter of this section specimen, calculate the electromagnetic parameter of measured material by these scattering parameters.The coaxial cable sectional view as shown in Figure 2, but, because the inner wire 5 of coaxial cable needs dielectric support, common Supporting Media non-refractory, and it also requires inner wire 5, outer conductor 4 concentric, therefore, calibrating device, transmission line and the specimen that making can be used for working under the hot environment be difficulty very, and promptly this method is unsuitable for working under the hot environment.
By " X-band is inhaled ripple temperature variation testing system " of University of Electronic Science and Technology development, it is made up of dispel the heat rectangular waveguide 8, two heat insulation rectangular waveguides 9, rectangular waveguide heated seats 10, rectangular waveguide measured piece 11, rectangular waveguide thermometric seat 12, temperature control systems 13 of the coaxial X-over 7, two to rectangular waveguide of vector network analyzer 6, two.Its test macro block diagram as shown in Figure 3.The principle of work of this system is: carry out the alternating temperature calibration at measured piece 6 places with the TRL calibrating device that can be used for high temperature earlier, insert specimen then, record the scattering parameter of sample under the different temperatures, by calculating the electromagnetic parameter that just can obtain material.The characteristics of this system are to adopt rectangular waveguide, its sectional view as shown in Figure 4, rectangular waveguide does not exist dielectric support problem and internal and external conductor concentric problem with coaxial comparing, easily realize can be used for calibrating device, transmission line and the specimen of high temperature, but because rectangular waveguide single mode operation frequency band is narrow, so this system testing frequency band is narrow, and when being used for the low-frequency range test, volume is big, and sample is difficult for making.
Known to the inventor, the temperature variation testing of existing magnetic medium electromagnetic parameter can not be taken into account following requirement: (1) easily makes specimen, transmission line and the calibrating device that can be used for high temperature; (2) wide test frequency scope; (3) do not need the darkroom environment; (4) moderate heating power.
Summary of the invention:
Task of the present invention provide a kind of can be under hot environment and broadband in carry out the device of temperature variation testing accurately and rapidly to the electromagnetic parameter of electromagnetic medium.
Composition of the present invention comprises vector network analyzer (6), and temperature control system (13), TRL calibrating device is characterized in that it also comprises the ridge waveguide transmission system.Described ridge waveguide transmission system is made up of two coaxial X-over 14, two heat radiation ridge waveguides 15, two heat insulation ridge waveguides 16, ridge waveguide heated seats 17, ridge waveguide measured piece 18, ridge waveguide thermometric seat 19 and temperature control systems 13 to ridge waveguide.Vector network analyzer 6 and coaxial to pressing the connection of coaxial cable connected mode between the X-over 14 of ridge waveguide; Coaxial X-over 14 and heat radiation ridge waveguide 15, heat radiation ridge waveguide 15 and heat insulation ridge waveguide 16, heat insulation ridge waveguide 16 and ridge waveguide heated seats 17, ridge waveguide heated seats 17 and ridge waveguide measured piece 18, ridge waveguide measured piece 18 and ridge waveguide thermometric seat 19, ridge waveguide thermometric seat 19 and heat insulation ridge waveguide 16, heat insulation ridge waveguide 16 and heat radiation ridge waveguide 15, the heat radiation ridge waveguide 15 that arrives ridge waveguide arrives between the X-over 14 of ridge waveguide with coaxial, after all being the location, tommy hole that utilizes on the ridge waveguide wall, fastening with screw.As shown in Figure 6.
Essence of the present invention is to adopt ridge waveguide for the rectangular waveguide in the band prior art " X-band is inhaled ripple temperature variation testing system ", adopt the network parameter method, utilize the bandwidth that ridge waveguide has, the characteristics that are easy to be produced on calibrating device, transmission line and the specimen of working under the hot environment, design wide band ridge waveguide transmission system, calibrating device and the temperature control system of high temperature test of being applicable to and set up proving installation, the magnetic medium electromagnetic parameter is carried out temperature variation testing.
Formation of apparatus of the present invention and test job principle thereof are:
The first step is made ridge waveguide transmission system and calibrating device
In order to protect testing tool, and make specimen can arrive the temperature that requires, need heat radiation ridge waveguide 15 and heat insulation ridge waveguide 16.The present invention adopts the method for directly heating and thermometric to carry out temperature control according to testing needs, need be by the heated seats 17 and the thermometric seat 19 of ridge waveguide making.At first design the wide band ridge waveguide transmission system that is applicable to high temperature test.This ridge waveguide transmission system comprises: coaxial X-over 14 to ridge waveguide, heat radiation ridge waveguide 15, heat insulation ridge waveguide 16, the heated seats 17 of ridge waveguide and the thermometric seat 19 of ridge waveguide.When guaranteeing that the sample test district can reach required temperature spot, the outer temperature of radiating area still is a room temperature.This method of testing adopts existing TRL collimation technique to calibrate, and according to requirement and the temperature requirement of existing TRL collimation technique to calibrating device, selects for use corresponding material can be used for the ridge waveguide TRL calibrating device of high temperature.Ridge waveguide TRL calibrating device under the at present existing normal temperature.The method for making of temperature control system 13 is identical with temperature control system 13 in " X-band inhale ripple temperature variation testing system ".
Second step, the temperature variation testing of sample
Measured material is made into the sample that is built in the ridge waveguide, and promptly measured piece 18.That utilizes that the first step finishes forms proving installation of the present invention by ridge waveguide transmission system, calibrating device and temperature control system, as shown in Figure 6.Utilize temperature control system 13 to heat, carry out thermometric, carry out temperature control with digital PID control by thermometric degree seat by heated seats 17.Microwave signal is produced by vector network analyzer 6; Through coaxial X-over 14, heat radiation ridge waveguide 15, heat insulation ridge waveguide 16, ridge waveguide heated seats 17 to ridge waveguide; Enter measured piece 18, after reflection and transmission; Reflected signal is through ridge waveguide heated seats 17, heat insulation ridge waveguide 16, heat radiation ridge waveguide 15, coaxial X-over 14 to ridge waveguide, and vector network analyzer 6 receives reflected signal; Transmission signal is through ridge waveguide thermometric seat 19, heat insulation ridge waveguide 16, heat radiation ridge waveguide 15, coaxial X-over 14 to ridge waveguide, and vector network analyzer 6 receives transmission signal, as shown in Figure 7.Replace measured piece 18 with the ridge waveguide TRL calibrating device that can be used in high temperature, after calibration under the different temperatures, measured piece 18 is changed to sample, records its scattering parameter in different temperature points to test macro.
The 3rd step, the calculating of sample electromagnetic parameter
Transmission/reflectometry test philosophy according to commonly used in the existing network parametric method carries out the calculating of electromagnetic parameter.After the filled media, its physical model as shown in Figure 7 in transmission line.The transmission line of filled media is as the scattering parameter S of one section network
11(ω), S
21(ω), equation is arranged:
Wherein
Γ is the complex refglection coefficient at inputting interface place when specimen 18 is endless, and T is an electromagnetic wave by thickness d is the plural transmission coefficient of limited specimen 18, and ω is the angular frequency of microwave signal.
By formula (2) and specimen thickness d, determine Λ by formula (4):
Can get at last:
ε in the formula
rBe the complex permittivity of detected materials, μ
rBe the complex permeability of detected materials, λ
cBe the cutoff wavelength of transmission line, λ
0Be free space wavelength.According to second step, the scattering parameter S of the filled media transmission line that will under different temperatures, record
11(ω), S
21(ω), the cutoff wavelength λ of ridge waveguide
cWith sample thickness d, substitution (1)～(6) formula can obtain the temperature variation testing result of the electromagnetic parameter of measured material.
Need to prove that the present invention is fit to the temperature variation testing of various magnetic medium electromagnetic parameters, i.e. the present invention can carry out electromagnetic parameter testing to various electromagnetic mediums in different temperatures.It both had been applicable to high temperature test, also was applicable to the room temperature test.If with the contrive equipment sealing, be put in the low temperature environment, can carry out the low-temperature test of magnetic medium electromagnetic parameter.
In sum, innovation of the present invention is: make the TRL calibrating device and the temperature control system of ridge waveguide test macro and ridge waveguide, form the temperature variation testing system.Measured material is made into the sample that is built in the ridge waveguide, finishes the temperature variation testing of magnetic medium electromagnetic parameter in the broadband.
Characteristics of the present invention:
The present invention utilizes ridge waveguide to make and can be used in heat insulation and dissipation transmission system high temperature test, that possess heating and temp sensing function; Utilize the TRL calibration method to carry out the alternating temperature calibration of test macro.Because the present invention has adopted the ridge waveguide transmission line, it had both guaranteed to have the test frequency of broad, had taken into account the characteristics that calibrating device, specimen and transmission line are convenient to make again.The sectional view of ridge waveguide is compared with rectangular waveguide as shown in Figure 5, and the die worker widens as frequency band; Compare with coaxial, ridge waveguide does not exist dielectric support problem and internal and external conductor concentric problem, is convenient to make the calibrating device and the specimen that can be used for high temperature (be particularly related to and be higher than 250 ℃); And adopting ridge waveguide to compare with the free space method does not need the darkroom, and heating power is moderate.
The present invention is fit to the temperature variation testing and the room temperature test of the electromagnetic parameter of various electromagnetic mediums.The broadband of microwave electromagnetic medium, temperature variation testing data have great importance for using electromagnetic medium more exactly, for the research of material electromagnetic property provides valuable data.
Description of drawings: Fig. 1 free space method test pattern
Wherein, the 1st, electromagnetic horn, the 2nd, condenser lens, the 3rd, measured medium; Fig. 2 coaxial transmission line cross-sectional view
Wherein, the 4th, coaxial outer conductor, the 5th, coaxial inner conductor; Fig. 3 rectangular waveguide temperature variation testing synoptic diagram
Wherein, the 6th, vector network analyzer, the 7th, coaxial X-over, the 8th, heat radiation rectangular waveguide, the 9th, heat insulation rectangular waveguide, the 10th, rectangular waveguide heated seats, the 11st, rectangular waveguide measured piece, the 12nd, rectangular waveguide thermometric seat, the 13rd, temperature control system to rectangular waveguide; Fig. 4 rectangular waveguide transmission line cross-sectional view Fig. 5 ridge waveguide transmission line cross-sectional view Fig. 6 ridge waveguide temperature variation testing system diagram
Wherein, the 6th, vector network analyzer, the 14th, coaxial X-over, the 15th, heat radiation ridge waveguide, the 16th, heat insulation ridge waveguide, the 17th, ridge waveguide heated seats, the 18th, ridge waveguide measured piece, the 19th, ridge waveguide thermometric seat, the 13rd, temperature control system to ridge waveguide; Fig. 7 transmission/reflection method for measuring electromagnetic parameter schematic diagram
Wherein, the 18th, sample, d are the thickness of sample, L=0, L=d are respectively two end faces of sample, Z
OBe the characteristic impedance of defeated line, Z
SBe the characteristic impedance of test agent, V
1, I
1Be respectively the electric current and voltage of incoming signal, V
2, I
2Be respectively voltage of signals electric current in the test agent, V
3, I
3Be respectively the electric current and voltage of transmission signal, V
JOBe the voltage of reflected signal.
Microwave signal is entered by input end, to specimen L=0 place, after the process sample comes back reflective and transmission, reflected signal turns back to input end, and transmission signal enters output terminal, by vector network analyzer 6 detected reflectance signal and transmission signal, just can obtain the scattering parameter [S] of sample, it comprises S
11(ω), S
21(ω), just can calculate the electromagnetic parameter of material by formula (1)～(6).
Embodiment:
The test frequency scope of embodiment of the invention temperature changing test device is 2～18GHz, and its operating temperature range is room temperature～300 ℃.
The present embodiment device is by being divided into test macro two sections of 2～4.8GHz, 4.8～18GHz, make two test macros (2～4.8GHz and 4.8～18GHz): according to the methods below respectively earlier according to the wide band ridge waveguide transmission system that is applicable to high temperature test of invention scheme first step design, adopt existing TRL collimation technique to calibrate, according to requirement, select for use low-expansion alloy 4J36 to make the ridge waveguide transmission system and the TRL calibrating device that can be used for this temperature range according to the temperature requirement of room temperature～300 ℃ to calibrating device;
(2～4.8GHz and 4.8～18GHz) carries out alternating temperature TRL calibration, in sample built-in test system, the sample scattering parameter is carried out temperature variation testing to assemble two test macros then;
At last, calculate, just can obtain the electromagnetic parameter of sample under different temperatures according to top described method of the 3rd step.
Claims (2)
1. one kind is carried out the device of magnetic medium electromagnetic parameter temperature variation testing with ridge waveguide, and it comprises vector network analyzer (6), and temperature control system (13), TRL calibrating device is characterized in that it also comprises the ridge waveguide transmission system.
2. according to claim 1ly a kind ofly carry out the device of magnetic medium electromagnetic parameter temperature variation testing, it is characterized in that described ridge waveguide transmission system is made up of two coaxial X-overs to ridge waveguide (14), two heat radiation ridge waveguides (15), two heat insulation ridge waveguides (16), ridge waveguide heated seats (17), ridge waveguide measured piece (18), ridge waveguide thermometric seats (19) with ridge waveguide; Coaxial to ridge waveguide X-over (14) and vector network analyzer (6) between press the connection of coaxial cable connected mode; Connected mode between coaxial X-over (14), heat radiation ridge waveguide (15), heat insulation ridge waveguide (16), ridge waveguide heated seats (17), ridge waveguide measured piece (18), ridge waveguide thermometric seat (19) and ridge waveguide thermometric seat (19) and the heat insulation ridge waveguide (16) to ridge waveguide, after all being the location, tommy hole that utilizes on the ridge waveguide wall, fastening with screw.
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293389A (en) * | 2013-05-23 | 2013-09-11 | 长沙三瑞传感技术有限公司 | High-temperature testing system for electromagnetic parameters of materials |
| CN104391181A (en) * | 2014-11-27 | 2015-03-04 | 电子科技大学 | High temperature calibration device for testing microwave dielectric material and calibration method thereof |
| CN105929346A (en) * | 2016-07-08 | 2016-09-07 | 兰州大学 | Non-contact vector network high-temperature thin film permeability testing device and measuring method thereof |
| CN106772172A (en) * | 2016-10-25 | 2017-05-31 | 中国电子科技集团公司第十三研究所 | In the method for designing of piece high/low temperature S parameter TRL calibrating devices |
| CN107167668A (en) * | 2017-05-25 | 2017-09-15 | 中国电子科技集团公司第十三研究所 | 1 40GHz is in piece S parameter measuring method |
| CN109782200A (en) * | 2018-12-20 | 2019-05-21 | 中国科学院高能物理研究所 | A kind of material measuring electromagnetic parameters method |
| CN109917209A (en) * | 2019-03-29 | 2019-06-21 | 北京环境特性研究所 | Homogeneous material electromagnetic parameter coaxial transmission line measuring device under a kind of hot conditions |
| CN110261684A (en) * | 2019-05-07 | 2019-09-20 | 电子科技大学 | A kind of double ridged waveguide method liquid crystal dielectric test device |
| CN112198468A (en) * | 2020-09-11 | 2021-01-08 | 中国科学院金属研究所 | Waveguide method microwave dielectric material ultralow temperature complex electromagnetic parameter testing device |
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2002
- 2002-04-04 CN CN 02113559 patent/CN1207571C/en not_active Expired - Fee Related
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103293389A (en) * | 2013-05-23 | 2013-09-11 | 长沙三瑞传感技术有限公司 | High-temperature testing system for electromagnetic parameters of materials |
| CN103293389B (en) * | 2013-05-23 | 2015-08-05 | 长沙三瑞传感技术有限公司 | Material electromagnetic parameter high-temperature test system |
| CN104391181A (en) * | 2014-11-27 | 2015-03-04 | 电子科技大学 | High temperature calibration device for testing microwave dielectric material and calibration method thereof |
| CN105929346A (en) * | 2016-07-08 | 2016-09-07 | 兰州大学 | Non-contact vector network high-temperature thin film permeability testing device and measuring method thereof |
| CN106772172B (en) * | 2016-10-25 | 2019-05-14 | 中国电子科技集团公司第十三研究所 | In the design method of piece high/low temperature S parameter TRL calibration component |
| CN106772172A (en) * | 2016-10-25 | 2017-05-31 | 中国电子科技集团公司第十三研究所 | In the method for designing of piece high/low temperature S parameter TRL calibrating devices |
| CN107167668A (en) * | 2017-05-25 | 2017-09-15 | 中国电子科技集团公司第十三研究所 | 1 40GHz is in piece S parameter measuring method |
| CN109782200A (en) * | 2018-12-20 | 2019-05-21 | 中国科学院高能物理研究所 | A kind of material measuring electromagnetic parameters method |
| CN109782200B (en) * | 2018-12-20 | 2021-04-27 | 中国科学院高能物理研究所 | Material electromagnetic parameter measuring method |
| CN109917209A (en) * | 2019-03-29 | 2019-06-21 | 北京环境特性研究所 | Homogeneous material electromagnetic parameter coaxial transmission line measuring device under a kind of hot conditions |
| CN110261684A (en) * | 2019-05-07 | 2019-09-20 | 电子科技大学 | A kind of double ridged waveguide method liquid crystal dielectric test device |
| CN110261684B (en) * | 2019-05-07 | 2022-04-05 | 电子科技大学 | Liquid crystal dielectric testing device adopting double-ridge waveguide method |
| CN112198468A (en) * | 2020-09-11 | 2021-01-08 | 中国科学院金属研究所 | Waveguide method microwave dielectric material ultralow temperature complex electromagnetic parameter testing device |
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