CN110261684A - A kind of double ridged waveguide method liquid crystal dielectric test device - Google Patents
A kind of double ridged waveguide method liquid crystal dielectric test device Download PDFInfo
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- CN110261684A CN110261684A CN201910377410.0A CN201910377410A CN110261684A CN 110261684 A CN110261684 A CN 110261684A CN 201910377410 A CN201910377410 A CN 201910377410A CN 110261684 A CN110261684 A CN 110261684A
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 24
- 238000012360 testing method Methods 0.000 title claims abstract description 18
- 230000008878 coupling Effects 0.000 claims abstract description 24
- 238000010168 coupling process Methods 0.000 claims abstract description 24
- 238000005859 coupling reaction Methods 0.000 claims abstract description 24
- 239000000463 material Substances 0.000 claims abstract description 17
- 230000005540 biological transmission Effects 0.000 claims abstract description 13
- 239000007788 liquid Substances 0.000 claims abstract description 12
- 230000005291 magnetic effect Effects 0.000 claims abstract description 11
- 239000002184 metal Substances 0.000 claims description 23
- 238000005516 engineering process Methods 0.000 claims description 7
- 238000004364 calculation method Methods 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 4
- 230000005684 electric field Effects 0.000 claims description 3
- 239000004576 sand Substances 0.000 claims description 3
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims 1
- 239000005977 Ethylene Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 10
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 5
- 229940058401 polytetrafluoroethylene Drugs 0.000 description 5
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 5
- 239000004810 polytetrafluoroethylene Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- -1 polytetrafluoroethylene Polymers 0.000 description 2
- 238000009774 resonance method Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 241000233855 Orchidaceae Species 0.000 description 1
- 150000001336 alkenes Chemical class 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005292 diamagnetic effect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002159 nanocrystal Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses a kind of double ridged waveguide method liquid crystal dielectric test devices, including wave-guide cavity wave, vector network analyzer, coaxial transmission line, ridge ripple guiding coaxial converter, coupling aperture, double ridged waveguide chamber end plate, polyfluortetraethylene pipe and connecting hole, the wave-guide cavity wave upper surface is fixed with ridge ripple guiding coaxial converter, coaxial transmission line is connected on the ridge ripple guiding coaxial converter, coupling aperture is formed between the double ridged waveguide chamber end plate, inside the polyfluortetraethylene pipe is interspersed at the vertical central axes of wave-guide cavity wave, the connecting hole is arranged on wave-guide cavity wave.The variation of double ridged waveguide method liquid crystal dielectric test device ridge waveguide measurement liquid crystal material dielectric parameter in the case where adding magnetic fields, with the small in size cost-saved of the sample for testing liquid crystal, high reliablity, frequency band is wider, tunable range is big, the test equipment is not only convenient for changing liquid crystalline sample, realizes that broadband is quickly tested, and provide the accurate measurement to low-loss liquid crystal material.
Description
Technical field
The present invention relates to microwave technology testing field, specially a kind of double ridged waveguide method liquid crystal dielectric test device.
Background technique
Most of liquid crystal materials are diamagnetic substances, mostly come from almost all of liquid crystal molecule and all exist among these
Phenyl ring, we are from molecule angle, and when magnetic field is perpendicular to phenyl ring, electric current can increase in phenyl ring, cause in phenyl ring
Energy is increasing, on the other hand, when magnetic field is parallel with ring, just makes the energy of liquid crystal molecule on phenyl ring without induced current
It will not continue to increase.Therefore, according to the more lower more stable principle of energy, liquid crystal molecule will be always parallel under the influence of a magnetic field
Magnetic field alignment, thus liquid crystal molecule can deflect.
For many years, there has been proposed the technologies of several measurement dielectric material performances, the especially method of resonant cavity, in low damage
Measurement accuracy is higher in the case where consumption and is widely used.General single Rectangular Waveguide Structure is unable to measure broadband,
Desired measurement must need the rectangular waveguide of multiple and different sizes, very impracticable also inconvenient.Therefore this patent is using double ridges
The method of waveguide tests dielectric properties of the liquid crystal under magnetic fields.This method can significantly improve the work belt of resonant cavity
Width improves 80% or so.
The dielectric property of nanocrystal at microwave frequencies is had studied with the resonance method and disresonance method.Broadband is provided with usual
The anharmonic method of slight of measurement is compared, and resonance method is usually the prefered method for meeting high precision measurement requirement, especially to low damage
Consumption material.In addition, Resonant-cavity Method is easier to load different liquid crystalline samples.
For the electric property of domestic ridge ripple guiding coaxial converter not as good as the excellent of foreign countries, main cause is exactly domestic at present
Material quality and production technology are insufficient.But along with economic and science and technology fast development, the production domesticization of component is mentioned
Requirement is gone out, this just needs to improve the performance of waveguide coaxial converter on existing conditioned basic.
Summary of the invention
The purpose of the present invention is to provide a kind of double ridged waveguide method liquid crystal dielectric test devices, to solve above-mentioned background technique
The problem of proposition.
To achieve the above object, the invention provides the following technical scheme: a kind of double ridged waveguide method liquid crystal dielectric test device,
Including wave-guide cavity wave, vector network analyzer, coaxial transmission line, ridge ripple guiding coaxial converter, coupling aperture, double ridged waveguide chamber end
Plate, polyfluortetraethylene pipe and connecting hole, the wave-guide cavity wave upper surface are fixed with ridge ripple guiding coaxial converter, and the ridge waveguide is same
It is connected with coaxial transmission line on axis converter, in one end amount of being connected to network analyzer of the coaxial transmission line, double ridges
Waveguide cavity end plate is interspersed in the inside of wave-guide cavity wave, and coupling aperture, the polytetrafluoroethyl-ne are formed between the double ridged waveguide chamber end plate
Inside alkene pipe is interspersed at the vertical central axes of wave-guide cavity wave, the connecting hole is arranged on wave-guide cavity wave.
Preferably, the ridge ripple guiding coaxial converter includes ridge waveguide lower chamber, groove, wave guide ridge, metal throuth hole, ridge ripple
Lead upper cavity, metal flange, flange coupling connector, sub-miniature A connector, inner conductor and adjusting screw rod, the upper table of the ridge waveguide lower chamber
Face setting is fluted, and there are two groove settings, wave guide ridge is provided between the groove, the end of the wave guide ridge is provided with
The top of ridge waveguide upper cavity, the setting of ridge waveguide upper cavity upper surface is arranged in metal throuth hole, the ridge waveguide upper cavity
There is metal flange, flange coupling connector is provided with above the metal flange, the flange coupling connector passes through screw and metal method
Orchid is connected, and the flange coupling connector upper surface is provided with sub-miniature A connector, and the lower surface of the flange coupling connector is provided with interior lead
Body, the adjusting screw rod are inserted in metal throuth hole.
Preferably, the sample inside the polyfluortetraethylene pipe is E or CB or K liquid crystal material.
Preferably, the resonance frequency of the cavity state lower chamber is ω0, its resonance frequency is when waiting addition liquid crystalline sample
ωs, then the deviation delta ω=ω for the resonance frequency that cavity is generated due to additional perturbation object0-ωs, and due to the sample of the present apparatus
Volume and cavity volume Vs/Vc≤ 1: 1182, it can be assumed that the cavity internal field outside sample is constant, using thin-walled polyfluortetraethylene pipe
Liquid crystalline sample is loaded, and considers the effect of polyfluortetraethylene pipe, then Perturbation Formulas can be rewritten are as follows:
Wherein, VsAnd VcThe volume for respectively representing liquid crystalline sample volume and cavity, the electric field of chamber when E0 is undisturbed.
Preferably, the strong static magnetic field range is 0.5T~1T.
Preferably, Multimodal technology is used in the complex dielectric permittivity calculation method of the liquid crystal material, is adopted in 5~22GHz
With 6 frequency points, mode used is TE1,0,2n-1(n=1,2,3...6).
Compared with prior art, the beneficial effects of the present invention are: the double ridged waveguide method liquid crystal dielectric test device: using
The progressive design of double ridge height in split type structure and waveguide cavity, improves the overall performance of converter, while using double
The mode of ridge waveguide measures, so that bandwidth improves 80%, in addition the present invention is being added with ridge waveguide measurement liquid crystal material
The variation of dielectric parameter under magnetic fields, have test liquid crystal sample small in size cost-saved, high reliablity, frequency band compared with
Width, tunable range is big, which is not only convenient for changing liquid crystalline sample, realizes that broadband is quickly tested, and provides pair
The accurate measurement of low-loss liquid crystal material.
Detailed description of the invention
Fig. 1 is double ridged waveguide liquid crystal dielectric parameter measuring apparatus schematic diagram of the present invention；
Fig. 2 is the intracavitary portion's cross section structure schematic diagram of double ridged waveguide of the present invention；
Fig. 3 is ridge ripple guide cavity coupling aperture cross section structure schematic diagram of the present invention；
Fig. 4 is ridge ripple guiding coaxial converter structural schematic diagram of the present invention.
In figure: 1, wave-guide cavity wave, 2, vector network analyzer, 3, coaxial transmission line, 4, ridge ripple guiding coaxial converter, 41,
Ridge waveguide lower chamber, 42, groove, 43, wave guide ridge, 44, metal throuth hole, 45, ridge waveguide upper cavity, 46, metal flange, 47, method
Blue connector, 48, sub-miniature A connector, 49, inner conductor, 410, adjusting screw rod, 5, coupling aperture, 6, double ridged waveguide chamber end plate, 7, polytetrafluoro
Ethylene tube, 8, connecting hole.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
Fig. 1-4 is please referred to, the present invention provides a kind of technical solution: a kind of double ridged waveguide method liquid crystal dielectric test device, packet
Include wave-guide cavity wave 1, vector network analyzer 2, coaxial transmission line 3, ridge ripple guiding coaxial converter 4, coupling aperture 5, double ridged waveguide chamber
End plate 6, polyfluortetraethylene pipe 7 and connecting hole 8,1 upper surface of wave-guide cavity wave is fixed with ridge ripple guiding coaxial converter 4, described
Coaxial transmission line 3, one end amount of being connected to network analyzer 2 of the coaxial transmission line 3 are connected on ridge ripple guiding coaxial converter 4
On, the double ridged waveguide chamber end plate 6 is interspersed in the inside of wave-guide cavity wave 1, forms coupling aperture between the double ridged waveguide chamber end plate 6
5, inside the polyfluortetraethylene pipe 7 is interspersed at the vertical central axes of wave-guide cavity wave 1, the connecting hole 8 is arranged in wave-guide cavity wave 1
On.
Further, the ridge ripple guiding coaxial converter 4 includes ridge waveguide lower chamber 41, groove 42, wave guide ridge 43, metal
Through-hole 44, ridge waveguide upper cavity 45, metal flange 46, flange coupling connector 47, sub-miniature A connector 48, inner conductor 49 and adjusting screw rod
410, the upper surface setting fluted 42 of the ridge waveguide lower chamber 41, and there are two the settings of groove 42, between the groove 42
It is provided with wave guide ridge 43, the end of the wave guide ridge 43 is provided with metal throuth hole 44, and the ridge waveguide upper cavity 45 is arranged in ridge
The top of waveguide upper cavity 41,45 upper surface of ridge waveguide upper cavity are provided with metal flange 46, the metal flange 46
Top is provided with flange coupling connector 47, and the flange coupling connector 47 is connected by screw with metal flange 46, and the flange connects
It connects 47 upper surface of device and is provided with sub-miniature A connector 48, the lower surface of the flange coupling connector 47 is provided with inner conductor 49, the adjusting spiral shell
Bar 410 is inserted in metal throuth hole 44.
Further, the sample inside the polyfluortetraethylene pipe 7 is E7 or 5CB or K15 liquid crystal material.
Further, the resonance frequency of the cavity state lower chamber is ω0, wait its resonance frequency when liquid crystalline sample is added
For ωs, then the deviation delta ω=ω for the resonance frequency that cavity is generated due to additional perturbation object0-ωs, and due to the sample of the present apparatus
This volume and cavity volume Vs/Vc≤ 1: 1182, it can be assumed that the cavity internal field outside sample is constant, using thin-walled polytetrafluoroethylene (PTFE)
Pipe loads liquid crystalline sample, and considers the effect of polyfluortetraethylene pipe, then Perturbation Formulas can be rewritten are as follows:
Wherein, VsAnd VcThe volume for respectively representing liquid crystalline sample volume and cavity, the electric field of chamber when E0 is undisturbed.
Further, the strong static magnetic field range is 0.5T~1T.
Further, Multimodal technology is used in the complex dielectric permittivity calculation method of the liquid crystal material, in 5~22GHz
Using 6 frequency points, mode used is TE1,0,2n-1(n=1,2,3...6).
Further, polyfluortetraethylene pipe 7 is inserted by drilling out an aperture at waveguide core, due to capillary
Then the effect of power, liquid crystal material can be sealed at both ends with UV solidification glue with automatic absorbing into thin-walled polyfluortetraethylene pipe 7,
Respectively there is a ridge ripple guiding coaxial converter to connect 4 at the both ends of cavity to connect and by sub-miniature A connector 48 and coaxial transmission line 3 and vector net
Network analyzer 2 is connected, we check its S parameter in a transmission mode, and by changing externally-applied magnetic field and overturning ridge waveguide
Cavity so as to change the ordered state of liquid crystal molecule in polytetrafluoroethylene (PTFE) 7, and respectively measurement liquid crystal molecules parallel state and
The dielectric parameter of plumbness
Although the present invention is described in detail referring to the foregoing embodiments, for those skilled in the art,
It is still possible to modify the technical solutions described in the foregoing embodiments, or part of technical characteristic is carried out etc.
With replacement, all within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should be included in this
Within the protection scope of invention.
Claims (6)
1. a kind of double ridged waveguide method liquid crystal dielectric test device, including wave-guide cavity wave (1), vector network analyzer (2), coaxial biography
Defeated line (3), ridge ripple guiding coaxial converter (4), coupling aperture (5), double ridged waveguide chamber end plate (6), polyfluortetraethylene pipe (7) and connection
Hole (8), it is characterised in that: wave-guide cavity wave (1) upper surface is fixed with ridge ripple guiding coaxial converter (4), and the ridge waveguide is same
It is connected on axis converter (4) coaxial transmission line (3), one end amount of being connected to network analyzer (2) of the coaxial transmission line (3)
On, the double ridged waveguide chamber end plate (6) is interspersed in the inside of wave-guide cavity wave (1), is formed between the double ridged waveguide chamber end plate (6)
Coupling aperture (5), inside the polyfluortetraethylene pipe (7) is interspersed at the vertical central axes of wave-guide cavity wave (1), the connecting hole (8)
It is arranged on wave-guide cavity wave (1).
2. a kind of double ridged waveguide method liquid crystal dielectric test device according to claim 1, it is characterised in that: the ridge waveguide
Coaxial converter (4) includes ridge waveguide lower chamber (41), groove (42), wave guide ridge (43), metal throuth hole (44), ridge waveguide epicoele
Body (45), metal flange (46), flange coupling connector (47), sub-miniature A connector (48), inner conductor (49) and adjusting screw rod (410), it is described
Fluted (42) are arranged in the upper surface of ridge waveguide lower chamber (41), and there are two groove (42) settings, between the groove (42)
It is provided with wave guide ridge (43), the end of the wave guide ridge (43) is provided with metal throuth hole (44), the ridge waveguide upper cavity (45)
Top in ridge waveguide upper cavity (41) is set, and ridge waveguide upper cavity (45) upper surface is provided with metal flange (46), institute
It states and is provided with above metal flange (46) flange coupling connector (47), the flange coupling connector (47) passes through screw and metal flange
(46) it is connected, flange coupling connector (47) upper surface is provided with sub-miniature A connector (48), the following table of the flange coupling connector (47)
Face is provided with inner conductor (49), and the adjusting screw rod (410) is inserted in metal throuth hole (44).
3. a kind of double ridged waveguide method liquid crystal dielectric test device according to claim 1, it is characterised in that: the polytetrafluoro
The internal sample of ethylene tube (7) is E7 or 5CB or K15 liquid crystal material.
4. a kind of complex dielectric permittivity calculation method of liquid crystal material is got with above-mentioned double ridged waveguide method liquid crystal dielectric test device,
It is characterized by: the resonance frequency of the cavity state lower chamber is ω0, waiting its resonance frequency when liquid crystalline sample is added is ωs,
Deviation delta ω=the ω for the resonance frequency that then cavity is generated due to additional perturbation object0-ωs, and due to the sample volume of the present apparatus
With cavity volume Vs/Vc≤ 1: 1182, it can be assumed that the cavity internal field outside sample is constant, is loaded using thin-walled polyfluortetraethylene pipe
Liquid crystalline sample, and consider the effect of polyfluortetraethylene pipe, then Perturbation Formulas can be rewritten are as follows:
Wherein, VsAnd VcThe volume for respectively representing liquid crystalline sample volume and cavity, the electric field of chamber when E0 is undisturbed.
5. a kind of complex dielectric permittivity calculation method of liquid crystal material according to claim 4, it is characterised in that: described strong quiet
Magnetic field range is 0.5T~1T.
6. a kind of complex dielectric permittivity calculation method of liquid crystal material according to claim 4, it is characterised in that: the liquid crystal
Multimodal technology is used in the complex dielectric permittivity calculation method of material, 6 frequency points are used in 5~22GHz, and mode used is
TE1,0,2n-1(n=1,2,3...6).
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| CN201910377410.0A CN110261684B (en) | 2019-05-07 | 2019-05-07 | Liquid crystal dielectric testing device adopting double-ridge waveguide method |
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| CN201910377410.0A CN110261684B (en) | 2019-05-07 | 2019-05-07 | Liquid crystal dielectric testing device adopting double-ridge waveguide method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111123187A (en) * | 2020-01-21 | 2020-05-08 | 中北大学 | Magneto-resistive chip calibration test system and method based on double ridge waveguides |
| CN113125858A (en) * | 2021-04-20 | 2021-07-16 | 电子科技大学 | Single fiber dielectric constant testing device and method with double-ridge structure |
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| CN113125858B (en) * | 2021-04-20 | 2022-03-08 | 电子科技大学 | Single fiber dielectric constant testing device and method with double-ridge structure |
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