CN110187842A - Across warm area data guard method, device and computer equipment based on solid state hard disk - Google Patents
Across warm area data guard method, device and computer equipment based on solid state hard disk Download PDFInfo
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3037—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a memory, e.g. virtual memory, cache
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0602—Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
- G06F3/0614—Improving the reliability of storage systems
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- G06—COMPUTING; CALCULATING OR COUNTING
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- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
- G06F3/0629—Configuration or reconfiguration of storage systems
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- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0628—Interfaces specially adapted for storage systems making use of a particular technique
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/06—Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
- G06F3/0601—Interfaces specially adapted for storage systems
- G06F3/0668—Interfaces specially adapted for storage systems adopting a particular infrastructure
- G06F3/0671—In-line storage system
- G06F3/0673—Single storage device
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Abstract
This application involves a kind of across warm area data guard method, device, computer equipment and storage medium based on solid state hard disk, wherein this method comprises: adding up the data writing within the scope of low temperature threshold inside SSD；When the data writing within the scope of the accumulative low temperature threshold reaches preset threshold value, high temperature restricting signal is set to very；When high temperature restricting signal is set to true, judge whether current NAND temperature is higher than high temperature threshold value；If current NAND temperature is higher than high temperature threshold value, the NAND temperature is controlled by starting strong speed limit module.The scene that the present invention passes through identification low temperature write-in, when subsequent high temperature is read, by applying strong speed limit strategy, NAND surface temperature is effectively controlled, so that the writing, reading temperature gap of data greatly reduces the probability of corrupted data in controllable range.
Description
Technical field
The present invention relates to solid state hard disk technical fields, more particularly to a kind of across warm area data protection based on solid state hard disk
Method, apparatus, computer equipment and storage medium.
Background technique
Currently, SSD (solid state hard disk) has been widely used in various occasions, since it is adapted in performance, power consumption, environment
The outstanding index of property etc., just gradually replaces traditional hard disk.
Wherein, due to the device property of NAND, with the variation of temperature, the reliability of data under different application scene
There are great differences.Typically, the normal working temperature range of NAND needs to guarantee NAND within this temperature range in 0-70 degree
It works.For example, when data are written at low temperature (T1) in NAND, and when (T2) reads data at high temperature, if T1/T2
Temperature spread is larger, will lead to data can not error correction, and then user data is caused to damage.
In existing SSD product, traditional Thermal control strategy needs the demand of choosing comprehensively temperature and performance,
So general activation threshold value is higher, and rate limitation is not tight.Therefore, under the scene that similar low temperature write-in, high temperature are read,
Still remain the risk of loss of data.
Summary of the invention
Based on this, it is necessary to which in view of the above technical problems, NAND surface temperature and then reality can effectively be controlled by providing one kind
Across the warm area data guard method based on solid state hard disk, device, computer equipment and the storage for now reducing corrupted data probability are situated between
Matter.
A kind of across warm area data guard method based on solid state hard disk, which comprises
Add up the data writing within the scope of low temperature threshold inside SSD；
When the data writing within the scope of the accumulative low temperature threshold reaches preset threshold value, by high temperature restricting signal
It is set to true；
When the high temperature restricting signal is true, judge whether current NAND temperature is higher than high temperature threshold value；
If current NAND temperature is higher than high temperature threshold value, the NAND temperature is controlled by starting strong speed limit module.
The step of data writing within the scope of the SSD internal statistical low temperature threshold is also in one of the embodiments,
Include:
Judge whether high temperature restricting signal is true；
If the high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
If current SSD internal temperature is lower than the low temperature threshold, persistently cumulative data writing；
If current SSD internal temperature reaches the low temperature threshold, stop cumulative data writing.
If reaching the low temperature threshold in the current SSD internal temperature in one of the embodiments, stop accumulative
After the step of data writing further include:
Judge whether the cumulative data writing reaches preset threshold value；
If the cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
If the cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
Judge go back after the step of whether current NAND temperature is higher than high temperature threshold value described in one of the embodiments,
Include:
If current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature and restores threshold value；
If current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
A kind of across warm area data protecting device based on solid state hard disk, described device include:
Data accumulation module, data write-in of the data accumulation module for adding up within the scope of low temperature threshold inside SSD
Amount；
Signal mark module, the signal mark module are used for when the data write-in within the scope of the accumulative low temperature threshold
When amount reaches preset threshold value, high temperature restricting signal is set to very；
First judgment module, the first judgment module are used for when high temperature restricting signal is true, judge current NAND temperature
Whether degree is higher than high temperature threshold value；
Speed limit module passes through the strong limit of starting if the speed limit module is used for current NAND temperature and is higher than high temperature threshold value
Fast module controls the NAND temperature.
The data accumulation module is also used in one of the embodiments:
Judge whether high temperature restricting signal is true；
If the high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
If current SSD internal temperature is lower than the low temperature threshold, persistently cumulative data writing；
If current SSD internal temperature reaches the low temperature threshold, stop cumulative data writing.
The data accumulation module is also used in one of the embodiments:
Judge whether the cumulative data writing reaches preset threshold value；
If the cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
If the cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
Described device further includes the second judgment module in one of the embodiments, and second judgment module is used for:
If current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature and restores threshold value；
If current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
A kind of computer equipment can be run on a memory and on a processor including memory, processor and storage
The step of computer program, the processor realizes above-mentioned any one method when executing the computer program.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor
The step of above-mentioned any one method is realized when row.
Above-mentioned across warm area data guard method, device, computer equipment and storage medium based on solid state hard disk, passes through
Add up the data writing within the scope of low temperature threshold inside SSD；Data writing within the scope of the accumulative low temperature threshold
When reaching preset threshold value, high temperature restricting signal is set to very；When high temperature restricting signal is set to true, current NAND temperature is judged
Whether high temperature threshold value is higher than；If current NAND temperature is higher than high temperature threshold value, by starting described in strong speed limit module control
NAND temperature.The present invention passes through the speed limit plan that application is strong when subsequent high temperature is read by the scene of identification low temperature write-in
Slightly, NAND surface temperature is effectively controlled, so that the writing, reading temperature gap of data is in controllable range, significantly
Reduce the probability of corrupted data.
Detailed description of the invention
Fig. 1 is the time changing curve figure that NAND temperature is run with host in across warm area test process in traditional technology；
Fig. 2 is that the temperature in traditional technology inside SSD inhibits model curve figure；
Fig. 3 is the flow diagram across warm area data guard method based on solid state hard disk in one embodiment；
Fig. 4 is the flow diagram across warm area data guard method based on solid state hard disk in another embodiment；
Fig. 5 is the flow diagram across warm area data guard method based on solid state hard disk in further embodiment；
Fig. 6 is the flow diagram across warm area data guard method based on solid state hard disk in another embodiment；
Fig. 7 is the temperature suppression curve figure that SSD is varied with temperature in one embodiment；
Fig. 8 is the flow chart for monitoring low temperature writing in one embodiment and triggering high temperature restricting signal；
Fig. 9 is that the flow chart across warm area performance constraints is directed in one embodiment；
Figure 10 is the structural block diagram across warm area data protecting device based on solid state hard disk in one embodiment；
Figure 11 is the structural block diagram across warm area data protecting device based on solid state hard disk in another embodiment；
Figure 12 is the internal structure chart of computer equipment in one embodiment.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, and
It is not used in restriction the application.
As shown in Figure 1, in across warm area test process NAND temperature with host workload, the variation of time it is bent
Line specifically includes following several stages:
Disk: being placed in incubator by stand at low temperature at this time, and incubator environment temperature is set as lower value, such as -2 degree, waits
The temperature of disk is stablized.
Data are written in low temperature: host sends write order, and disk is filled up data, and during this, the temperature of NAND can be higher than ring
Border temperature, but it is whole lower than CROSS_TEMP_T_LOW threshold value.
Temperature rise period: after completing data write-in, incubator begins to warm to high temperature, such as 70 degree, stands a period of time, waits
Disk temperature is stablized.
High temperature is read the stage: host sends read command, reads overall data and compares.At this time since SSD is in work shape
State, NAND temperature are higher than CROSS_TEMP_T_HIGH threshold value.
Since the write-in of data, reading gap are far longer than (CROSS_TEMP_T_HIGH-CROSS_TEMP_T_LOW),
So there are certain probability Fail.
As shown in Fig. 2, inhibiting model curve figure for the temperature inside tradition SSD.In this model, it is not relevant for data and writes
Fashionable temperature, and only monitor disk Current Temperatures.When disk Current Temperatures are higher than THERMAL_THROTTLING_TH, in triggering
Portion's reduction of speed mechanism.When disk temperature be lower than certain threshold value, such as: when THERMAL_THROTTLING_TH -3, performance recovery.Due to
The temperature of the presence of this mechanism, disk can be put between THERMAL_THROTTLING_TH -3 to THERMAL_THROTTLING_TH
It is dynamic.Typically, due to compatibility requirement, the temperature of THERMAL_THROTTLING_TH is above CROSS_TEMP_T_HIGH
, while performance and temperature control in order to balance, it will not be too strong to the inhibition of speed.Under this policy, if data are written
Shi Wendu be lower than CROSS_TEMP_T_LOW, subsequent reads access according to when, then will appear the situation of across warm area reading data, and then lead
Certain probability data is caused to malfunction.
The present invention is based on above-mentioned technical problem, detection host datas at certain temperature threshold value (CROSS_TEMP_T_LOW)
Write-in triggers high temperature restricting signal when accumulative data write-in is more than threshold value (CROSS_TEMP_HOST_WRITE)
(cross_temp_fc_flag).When subsequent host reads data, if temperature is more than threshold value (CROSS_TEMP_T_HIGH)
And high temperature restricting signal (cross_temp_fc_flag) be TRUE when, reduce response of host speed, thereby reduce NAND temperature
Degree.A possibility that being written and read the difference of temperature by control data, across warm area corrupted data can be effectively reduced.
In one embodiment, as shown in figure 3, providing a kind of across warm area data guard method based on solid state hard disk,
This method comprises:
Step 302, add up the data writing within the scope of low temperature threshold inside SSD；
Step 304, when the data writing within the scope of accumulative low temperature threshold reaches preset threshold value, by high temperature speed limit
Signal is set to very；
Step 306, when high temperature restricting signal is set to true, judge whether current NAND temperature is higher than high temperature threshold value；
Step 308, if current NAND temperature is higher than high temperature threshold value, NAND temperature is controlled by starting strong speed limit module
Degree.
Specifically, the temperature suppression curve figure varied with temperature in conjunction with reference Fig. 7 for SSD in the present embodiment, specifically includes
Following steps:
1, SSD internal control is lower than the accumulative writing of CROSS_TEMP_T_LOW
2, accumulative writing of the SSD internal temperature lower than CROSS_TEMP_T_LOW reaches certain threshold value, then is arranged
Cross_temp_fc_flag is TRUE
3, it in operational process behind, if the temperature of NAND is higher than CROSS_TEMP_T_HIGH, can carry out in advance
Strong speed limit controls NAND surface temperature near CROSS_TEMP_T_HIGH.
The present embodiment can effectively identify the scene that low temperature write-in data are read under high temperature condition, and pass through speed control,
Effectively inhibit NAND surface temperature.
In the present embodiment, by adding up the data writing within the scope of low temperature threshold inside SSD；When accumulative low temperature threshold
When data writing within the scope of value reaches preset threshold value, high temperature restricting signal is set to very；When high temperature restricting signal is set to
When true, judge whether current NAND temperature is higher than high temperature threshold value；If current NAND temperature is higher than high temperature threshold value, strong by starting
Strong speed limit module controls NAND temperature.The present invention passes through application when subsequent high temperature is read by the scene of identification low temperature write-in
Strong speed limit strategy, effectively controls NAND surface temperature, so that the writing, reading temperature gap of data is controllable
In range, the probability of corrupted data is greatly reduced.
In one embodiment, as shown in figure 4, providing a kind of across warm area data guard method based on solid state hard disk,
The step of data writing in this method within the scope of SSD internal statistical low temperature threshold further include:
Step 402, judge whether high temperature restricting signal is true；
Step 404, if high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
Step 406, if current SSD internal temperature is lower than low temperature threshold, lasting cumulative data writing；
Step 408, if current SSD internal temperature reaches low temperature threshold, stop cumulative data writing.
In one embodiment, as shown in figure 5, providing a kind of across warm area data guard method based on solid state hard disk,
If this method is after the step of current SSD internal temperature reaches low temperature threshold, stops cumulative data writing further include:
Step 502, judge whether cumulative data writing reaches preset threshold value；
Step 504, if cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
Step 506, if cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
It specifically, is the process for monitoring low temperature writing in the present embodiment and triggering high temperature restricting signal in conjunction with reference Fig. 8
Figure, specifically includes the following steps:
1, system electrification.
2, judge whether cross_temp_fc_flag is TRUE.
If 3, cross_temp_fc_flag is not TRUE, judge whether Current Temperatures are lower than CROSS_TEMP_T_
LOW。
4, if Current Temperatures lower than the host writing that persistently adds up if CROSS_TEMP_T_LOW.
5, judge whether accumulative writing is greater than CROSS_TEMP_HOST_WRITE.
If 6, adding up writing is greater than CROSS_TEMP_HOST_WRITE, cross_temp_fc_flag, which is arranged, is
TRUE。
In the present embodiment, by monitoring low temperature writing, high temperature restricting signal is triggered to realize through speed control, is had
Effect inhibits NAND surface temperature.
In one embodiment, as shown in fig. 6, providing a kind of across warm area data guard method based on solid state hard disk,
This method is after judging the step of whether current NAND temperature is higher than high temperature threshold value further include:
Step 602, if current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature recovery
Threshold value；
Step 604, if current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
Specifically, it is to be directed to the flow chart across warm area performance constraints in the present embodiment in conjunction with reference Fig. 9, specifically includes following
Step:
1, system electrification.
2, judge whether cross_temp_fc_flag is TRUE.
If 3, cross_temp_fc_flag is TRUE, judge whether Current Temperatures are higher than CROSS_TEMP_T_HIGH.
If 4, Current Temperatures are higher than CROSS_TEMP_T_HIGH, start strong speed limit mode, controls the surface NAND temperature
Degree.
If 5, Current Temperatures are lower than CROSS_TEMP_T_HIGH, further judge whether Current Temperatures are lower than CROSS_
TEMP_T_HIGH-3；If so, restorability.
In the present embodiment, it realizes when subsequent high temperature is read, by applying strong speed limit strategy, effectively controls
NAND surface temperature, so that the writing, reading temperature gap of data greatly reduces corrupted data in controllable range
Probability.
It should be understood that although each step in the flow chart of Fig. 3-6 is successively shown according to the instruction of arrow,
These steps are not that the inevitable sequence according to arrow instruction successively executes.Unless expressly stating otherwise herein, these steps
Execution there is no stringent sequences to limit, these steps can execute in other order.Moreover, at least one in Fig. 3-6
Part steps may include that perhaps these sub-steps of multiple stages or stage are not necessarily in synchronization to multiple sub-steps
Completion is executed, but can be executed at different times, the execution sequence in these sub-steps or stage is also not necessarily successively
It carries out, but can be at least part of the sub-step or stage of other steps or other steps in turn or alternately
It executes.
In one embodiment, as shown in Figure 10, a kind of across warm area data protecting device based on solid state hard disk is provided
1000, which includes:
Data accumulation module 1001, for adding up the data writing within the scope of low temperature threshold inside SSD；
Signal mark module 1002, for reaching preset threshold value when the data writing within the scope of accumulative low temperature threshold
When, high temperature restricting signal is set to very；
First judgment module 1003, for judging whether current NAND temperature is higher than height when high temperature restricting signal is true
Warm threshold value；
Speed limit module 1004, if being higher than high temperature threshold value for current NAND temperature, by starting strong speed limit module control
NAND temperature processed.
In one embodiment, which is also used to:
Judge whether high temperature restricting signal is true；
If high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
If current SSD internal temperature is lower than low temperature threshold, persistently cumulative data writing；
If current SSD internal temperature reaches low temperature threshold, stop cumulative data writing.
In one embodiment, which is also used to:
Judge whether cumulative data writing reaches preset threshold value；
If cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
If cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
In one embodiment, as shown in figure 11, a kind of across warm area data protecting device based on solid state hard disk is provided
1000, the device include further include the second judgment module 1005, be used for:
If current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature and restores threshold value；
If current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
It may refer to about the specific restriction based on solid state hard disk across warm area data protecting device above for being based on
The restriction across warm area data guard method of solid state hard disk, details are not described herein.
In one embodiment, a kind of computer equipment is provided, internal structure chart is shown in Fig.12.The calculating
Machine equipment includes processor, memory and the network interface connected by device bus.Wherein, the processing of the computer equipment
Device is for providing calculating and control ability.The memory of the computer equipment includes non-volatile memory medium, built-in storage.It should
Non-volatile memory medium is stored with operating device, computer program and database.The built-in storage is non-volatile memories Jie
The operation of operating device and computer program in matter provides environment.The network interface of the computer equipment is used for and external end
End passes through network connection communication.To realize a kind of across warm area number based on solid state hard disk when the computer program is executed by processor
According to guard method.
It will be understood by those skilled in the art that structure shown in Figure 12, only part relevant to application scheme
The block diagram of structure, does not constitute the restriction for the computer equipment being applied thereon to application scheme, and specific computer is set
Standby may include perhaps combining certain components or with different component layouts than more or fewer components as shown in the figure.
In one embodiment, a kind of computer equipment is provided, including memory, processor and storage are on a memory
And the computer program that can be run on a processor, processor are realized when executing computer program in above each embodiment of the method
The step of.
In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated
The step in above each embodiment of the method is realized when machine program is executed by processor.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer
In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein,
To any reference of memory, storage, database or other media used in each embodiment provided herein,
Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM
(PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include
Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms,
Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing
Type SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application
Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. a kind of across warm area data guard method based on solid state hard disk, which comprises
Add up the data writing within the scope of low temperature threshold inside SSD；
When the data writing within the scope of the accumulative low temperature threshold reaches preset threshold value, high temperature restricting signal is set to
Very；
When the high temperature restricting signal is true, judge whether current NAND temperature is higher than high temperature threshold value；
If current NAND temperature is higher than high temperature threshold value, the NAND temperature is controlled by starting strong speed limit module.
2. across the warm area data guard method according to claim 1 based on solid state hard disk, which is characterized in that the SSD
The step of data writing within the scope of internal statistical low temperature threshold further include:
Judge whether high temperature restricting signal is true；
If the high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
If current SSD internal temperature is lower than the low temperature threshold, persistently cumulative data writing；
If current SSD internal temperature reaches the low temperature threshold, stop cumulative data writing.
3. across the warm area data guard method according to claim 2 based on solid state hard disk, which is characterized in that if described
After the step of current SSD internal temperature reaches the low temperature threshold, then stops cumulative data writing further include:
Judge whether the cumulative data writing reaches preset threshold value；
If the cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
If the cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
4. across the warm area data guard method according to claim 1-3 based on solid state hard disk, which is characterized in that
It is described judge the step of whether current NAND temperature is higher than high temperature threshold value after further include:
If current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature and restores threshold value；
If current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
5. a kind of across warm area data protecting device based on solid state hard disk, which is characterized in that described device includes:
Data accumulation module, the data accumulation module is for adding up the data writing within the scope of low temperature threshold inside SSD；
Signal mark module, the signal mark module are used to reach when the data writing within the scope of the accumulative low temperature threshold
When to preset threshold value, high temperature restricting signal is set to very；
First judgment module, the first judgment module are used for when the high temperature restricting signal is true, judge current NAND temperature
Whether degree is higher than high temperature threshold value；
Speed limit module, if the speed limit module is used for current NAND temperature and is higher than high temperature threshold value, by starting strong speed limit mould
Block controls the NAND temperature.
6. across the warm area data protecting device according to claim 5 based on solid state hard disk, which is characterized in that the data
Accumulation module is also used to:
Judge whether high temperature restricting signal is true；
If the high temperature restricting signal is not very, to judge whether current SSD internal temperature is lower than low temperature threshold；
If current SSD internal temperature is lower than the low temperature threshold, persistently cumulative data writing；
If current SSD internal temperature reaches the low temperature threshold, stop cumulative data writing.
7. across the warm area data protecting device according to claim 6 based on solid state hard disk, which is characterized in that the data
Accumulation module is also used to:
Judge whether the cumulative data writing reaches preset threshold value；
If the cumulative data writing reaches preset threshold value, high temperature restricting signal is set to very；
If the cumulative data writing is not up to preset threshold value, normal operating condition is maintained.
8. according to described in any item across the warm area data protecting devices based on solid state hard disk of claim 5-7, which is characterized in that
Described device further includes the second judgment module, and second judgment module is used for:
If current NAND temperature is lower than high temperature threshold value, judge whether current NAND temperature is lower than high temperature and restores threshold value；
If current NAND temperature restores threshold value lower than high temperature, restore normal operating condition.
9. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, which is characterized in that the processor realizes any one of claims 1 to 4 institute when executing the computer program
The step of stating method.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of method described in any one of Claims 1-4 is realized when being executed by processor.
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