CN117290146A - Processing method and device for misjudgment of solid state disk faults - Google Patents
Processing method and device for misjudgment of solid state disk faults Download PDFInfo
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- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
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Abstract
A processing method and device aiming at solid state disk fault misjudgment relate to the field of data storage. Responding to detection operation of a user on the read data of the solid state disk, and judging whether the solid state disk has an error of abnormal reading; if the solid state disk is in error of abnormal reading, acquiring a first temperature of the solid state disk; acquiring the low-energy temperature corresponding to the solid state disk with the error of abnormal reading from a preset database; judging whether the first temperature is higher than the low-energy temperature; if the first temperature is higher than the low-energy temperature, the first working frequency of the solid state disk is adjusted to be the second working frequency according to a preset rule until the first temperature is changed to be the second temperature; judging whether the solid state disk at the second temperature has an error of abnormal reading; and if the solid state disk at the second temperature has an abnormal reading error, the solid state disk is recorded as a fault solid state disk. According to the technical scheme, the problem that the storage block is misjudged as the fault solid state disk due to temperature influence is solved.
Description
Technical Field
The present disclosure relates to the field of data storage, and in particular, to a method and an apparatus for processing misjudgment of a solid state disk failure.
Background
In a solid state disk (Solid state drive, SSD), a memory block (block) is a basic unit for storing data. In solid state drives, data is organized into blocks, each block containing a number of consecutive data bytes. The block size may vary among different solid state disks, but is typically between 512 bytes and 4 KB. These blocks are then organized into larger units, such as pages or sectors (sectors), for data reading.
When judging whether the data of the block in the solid state disk is abnormal or not, firstly acquiring the solid state disk and performing data reading operation, judging whether the abnormal error occurs or not, recording that the storage block is a fault solid state disk if the abnormal error occurs, and normally ending the operation if the abnormal error does not occur.
However, the above method does not consider the influence of the actual temperature of the solid state disk on the performance of the solid state disk, and if the actual temperature has a large influence on the performance of the solid state disk, an abnormal error may occur in the solid state disk, and in this case, only the above method is used, the solid state disk is misjudged as a failed solid state disk due to the influence of the temperature, so a processing method and a device for misjudging the failure of the solid state disk are needed.
Disclosure of Invention
The application provides a processing method and a processing device for misjudgment of a solid state disk fault, which solve the problem that a storage block is misjudged as a fault solid state disk due to temperature influence.
In a first aspect of the present application, a method for processing misjudgment of a solid state disk fault is provided, where the method is applied to a server, and the method specifically includes the following steps: responding to detection operation of a user on the read data of the solid state disk, and judging whether the solid state disk has an error of abnormal reading; if the solid state disk is in error of abnormal reading, acquiring a first temperature of the solid state disk; the first temperature is the current temperature of the solid state disk; acquiring a low-energy temperature corresponding to the solid state disk with the error of abnormal reading from a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at the non-low-energy temperature; judging whether the first temperature is higher than the low-energy temperature; if the first temperature is higher than the low-energy temperature, the first working frequency of the solid state disk is adjusted to be the second working frequency according to a preset rule until the first temperature is changed to be the second temperature, and the second working frequency is smaller than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at the first temperature, and the second working frequency is the working frequency corresponding to the solid state disk at the second temperature; judging whether the solid state disk at the second temperature has an error of abnormal reading; and if the solid state disk at the second temperature has an abnormal reading error, the solid state disk is recorded as a fault solid state disk.
By adopting the technical scheme, after detecting that the solid state disk has the abnormal reading error, whether the current temperature of the solid state disk is the low-energy temperature or not is detected, if so, the temperature of the solid state disk is adjusted to be the non-low-energy temperature by reducing the working frequency of the hard disk, at the moment, whether the solid state disk has the abnormal reading error or not is detected again, if the solid state disk still has the abnormal reading error, the solid state disk is judged to be the failed solid state disk, and further, the accuracy of judging the failed solid state disk is increased by eliminating the influence of the temperature on the judgment of the failed solid state disk.
Optionally, before the low-energy temperature corresponding to the solid state disk is obtained in the preset database, the method further includes building the preset database, and specifically includes: acquiring a plurality of reading performances of the solid state disk at a plurality of temperatures, wherein the plurality of reading performances comprise a first reading performance and a second reading performance, and the first reading performance and the second reading performance are the reading performances corresponding to any two different temperatures of the plurality of reading performances; judging whether the first reading performance is smaller than the second reading performance; if the first reading performance is smaller than the second reading performance, taking the temperature corresponding to the first reading performance as the low-energy temperature of the solid state disk; and storing the corresponding relation between the solid state disk and the low-energy temperature in a preset database.
By adopting the technical scheme, the low-energy temperature corresponding to the solid state disk can be obtained by testing the reading performance of the solid state disk at different temperatures. And compared with the reading rate of the solid state disk at other temperatures, the reading rate of the solid state disk at low-energy temperature can generate a fault phenomenon, namely the reading rate of the solid state disk at low-energy temperature is far lower than the reading rate of the solid state disk at other temperatures, at the moment, the temperature of which the reading rate is far lower than the reading rate of the solid state disk at other temperatures can be used as a low-energy temperature value range interval of the solid state disk, and the corresponding relation between the solid state disk and the low-energy temperature value range interval is built in a preset database. When errors of abnormal reading of the solid state disk occur, the low-energy temperature corresponding to the solid state disk can be obtained rapidly according to the solid state disk.
Optionally, adjusting the first operating frequency of the solid state disk to the second operating frequency according to a preset rule until the first temperature is changed to the second temperature, specifically including: the first working frequency of the solid state disk is adjusted to be the second working frequency, and the first temperature is changed to be the second temperature within a first preset time period; wherein, in the preset time period, the change rate of the second working frequency and the preset time period are normally distributed.
Through the technical scheme, the time period required by changing any first temperature into the second temperature can be made to be close to the preset time period by controlling the change rate of the second working frequency, namely, the change rate of the second working frequency and the preset time period are required to meet normal distribution.
Optionally, adjusting the first operating frequency of the solid state disk to the second operating frequency according to a preset rule specifically includes: the second operating frequency is calculated according to the following formula:
P 2 ＝β*P 1 *(T 2 /T 1 )
wherein P is 2 And P1 is the first working frequency, beta is a heat dissipation factor, T1 is the first temperature, and T2 is the second temperature of the solid state disk.
By adopting the technical scheme, the method and the device adopt the formula P 2 ＝β*P 1 *(T 2 /T 1 ) The second operating frequency may be calculated. Since the temperature of the hard disk is continuously changed, the second operating frequency needs to be changed along with the change of the temperature of the hard disk, when the change rate of the temperature of the hard disk is increased, the change rate of the second operating frequency is also increased, and vice versa,therefore, the heat dissipation speed of the solid state disk can be increased by changing the change rate of the second working frequency, that is, the preset time period required for adjusting the solid state disk from different temperatures to the second temperature is approximately the same by changing the change rate of the second working frequency.
Optionally, the heat dissipation factor is a factor affecting heat dissipation of the solid state disk, including a solid state disk material factor, a heat conducting medium factor, and a working environment temperature.
By adopting the technical scheme, the calculation of the heat dissipation factor needs to consider various heat dissipation factors affecting the solid state disk, including but not limited to: solid state disk material factors, heat conducting medium factors, working environment temperature and the like. By introducing these heat dissipation factors, the impact of the heat dissipation factors on the calculation errors can be reduced.
Optionally, the current temperature of the solid state disk is greater than the operating environment temperature.
Through the technical scheme, in the actual cooling process, as long as the solid state disk is still in an operating state, the ambient temperature is not higher than the current temperature of the solid state disk, so that the computing rationality can be ensured by ensuring that the current temperature of the solid state disk is higher than the working ambient temperature.
Optionally, if the solid state disk at the second temperature has no error of abnormal reading, the solid state disk is recorded as a non-fault solid state disk.
Through the technical scheme, when the temperature factor no longer affects the abnormal reading errors of the solid state disk, the abnormal reading errors still occur in the solid state disk, and at the moment, the abnormal errors of the solid state disk are confirmed to be data damage and data loss caused by the storage unit faults, so that the solid state disk is marked as a fault solid state disk.
In a second aspect of the present application, a processing apparatus for misjudging a solid state disk failure is provided, where the apparatus is a server, and the server includes a response module, an obtaining module, a judging module, and an output module, where,
the response module is used for responding to the detection operation of the user on the read data of the solid state disk and judging whether the solid state disk has an error of abnormal reading or not.
The acquisition module is used for acquiring a first temperature of the solid state disk if an error of abnormal reading occurs in the solid state disk; the first temperature is the current temperature of the solid state disk; and acquiring the low-energy temperature corresponding to the solid state disk with the error of abnormal reading from a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at the non-low-energy temperature.
The judging module is used for judging whether the first temperature is higher than the low-energy temperature or not; if the first temperature is higher than the low-energy temperature, the first working frequency of the solid state disk is adjusted to be a second working frequency according to a preset rule until the first temperature is changed to be the second temperature, and the second working frequency is smaller than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at the first temperature, and the second working frequency is the working frequency corresponding to the solid state disk at the second temperature; and judging whether the solid state disk at the second temperature has an error of abnormal reading or not.
The output module is used for marking the solid state disk as a fault solid state disk if the solid state disk at the second temperature has an abnormal reading error, and the test module is used for performing performance test on a plurality of test nodes according to a preset test mode and specifically comprises the following steps: performing performance test on the plurality of test nodes according to a preset test sequence, wherein any one of the plurality of test nodes corresponds to a preset test frequency; the preset test method further comprises preset test times, and one test node corresponds to one preset test time.
Optionally, the acquiring module is configured to construct a preset database before acquiring the low-energy temperature corresponding to the solid state disk in the preset database, and acquire multiple read performances of the solid state disk at multiple temperatures, where the multiple read performances include a first read performance and a second read performance, and the first read performance and the second read performance are read performances corresponding to any two different temperatures of the multiple read performances; judging whether the first reading performance is smaller than the second reading performance; if the first reading performance is smaller than the second reading performance, taking the temperature corresponding to the first reading performance as the low-energy temperature of the solid state disk; and storing the corresponding relation between the solid state disk and the low-energy temperature in a preset database.
Optionally, the judging module is configured to adjust the first operating frequency of the solid state disk to the second operating frequency according to a preset rule until the first temperature is changed to the second temperature, and specifically includes: the first working frequency of the solid state disk is adjusted to be the second working frequency, and the first temperature is changed to be the second temperature within a first preset time period; wherein, in the preset time period, the change rate of the second working frequency and the preset time period are normally distributed.
Optionally, the judging module is configured to adjust the first operating frequency of the solid state disk to the second operating frequency according to a preset rule, and specifically includes: the second operating frequency is calculated according to the following formula:
P 2 ＝β*P 1 *(T 2 /T 1 )
wherein P is 2 And P1 is the first working frequency, beta is a heat dissipation factor, T1 is the first temperature, and T2 is the second temperature of the solid state disk.
Optionally, the output module is configured to record the solid state disk as a non-failure solid state disk if no error of abnormal reading occurs in the solid state disk at the second temperature.
In a third aspect of the present application there is provided an electronic device comprising a processor, a memory for storing instructions, a user interface and a network interface for communicating to other devices, the processor being for executing the instructions stored in the memory to cause the electronic device to perform a method as claimed in any one of the preceding claims.
In a fourth aspect of the present application, a computer readable storage medium is provided, the computer readable storage medium storing a computer program for performing a method according to any one of the above by a processor.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1. after detecting that the solid state disk has an abnormal reading error, whether the solid state disk has the abnormal reading error is detected, if so, the temperature of the solid state disk is adjusted to be a non-low energy temperature by detecting whether the current temperature of the solid state disk is a low energy temperature or not, and if so, the solid state disk is judged to be the failed solid state disk, and if so, the accuracy of judging the failed solid state disk is increased by eliminating the influence of the temperature on the judgment of the failed solid state disk.
2. The low-energy temperature corresponding to the solid state disk can be obtained by testing the reading performance of the solid state disk at different temperatures. And compared with the reading rate of the solid state disk at other temperatures, the reading rate of the solid state disk at low-energy temperature can generate a fault phenomenon, namely the reading rate of the solid state disk at low-energy temperature is far lower than the reading rate of the solid state disk at other temperatures, at the moment, the temperature of which the reading rate is far lower than the reading rate of the solid state disk at other temperatures can be used as a low-energy temperature value range interval of the solid state disk, and the corresponding relation between the solid state disk and the low-energy temperature value range interval is built in a preset database. When errors of abnormal reading of the solid state disk occur, the low-energy temperature corresponding to the solid state disk can be obtained rapidly according to the solid state disk.
3. By formula P 2 ＝β*P 1 *(T 2 /T 1 ) The second operating frequency may be calculated. The temperature of the hard disk is continuously changed, so that the second working frequency needs to be changed along with the change of the temperature of the hard disk, when the change rate of the temperature of the hard disk is increased, the change rate of the second working frequency is also increased, and vice versa, so that the heat dissipation speed of the solid state disk can be increased by changing the change rate of the second working frequency, that is, the preset time period required by the solid state disk for adjusting from different temperatures to the second temperature can be controlled by changing the change rate of the second working frequency is approximately the same.
Drawings
Fig. 1 is a schematic flow chart of a method for processing misjudgment of a solid state disk fault according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a processing device for misjudging a solid state disk fault according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Reference numerals illustrate: 21. a response module; 22. an acquisition module; 23. a judging module; 24. an output module; 300. an electronic device; 301. a processor; 302. a memory; 303. a user interface; 304. a network interface; 305. a communication bus.
Detailed Description
In order to make those skilled in the art better understand the technical solutions in the present specification, the technical solutions in the embodiments of the present specification will be clearly and completely described below with reference to the drawings in the embodiments of the present specification, and it is obvious that the described embodiments are only some embodiments of the present application, but not all embodiments.
The terminology used in the following embodiments of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of this application, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates to the contrary. It should also be understood that the term "and/or" as used in this application refers to and encompasses any or all possible combinations of one or more of the listed items.
The terms "first," "second," and the like, are used below for descriptive purposes only and are not to be construed as implying or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature, and in the description of embodiments of the present application, unless otherwise indicated, the meaning of "a plurality" is two or more.
In order to make the technical scheme of the present invention better understood by those skilled in the art, the present invention will be further described in detail with reference to the accompanying drawings.
When judging whether the data of the blocks in the solid state disk are abnormal or not, firstly, the solid state disk acquires the available storage blocks in the solid state disk, performs data reading operation, meanwhile, judges whether abnormal errors occur or not, records that the storage blocks are the faulty solid state disk if the abnormal errors occur, and normally ends the operation if the abnormal errors do not occur. However, the above method does not consider the influence of the actual temperature of the solid state disk on the performance of the solid state disk, and if the actual temperature has a large influence on the performance of the solid state disk, an abnormal error may occur in the solid state disk, and in this case, only the above method is used, and the solid state disk is misjudged as a failed solid state disk due to the temperature influence, so a processing method and a device for misjudging the solid state disk failure are needed, and by changing the temperature, the temperature influence is reduced to misjudge the failed solid state disk.
Referring to fig. 1, a flow chart of a processing method for misjudging a solid state disk fault according to an embodiment of the present invention is shown, and the method is applied to a server, and the flow chart mainly includes the following steps: s101 to S107.
Step S101, responding to detection operation of a user on the read data of the solid state disk, and judging whether the solid state disk has an error of abnormal reading.
Specifically, the server receives an instruction that a user generates to the solid state disk through the user equipment, and through the instruction, the solid state disk detects whether an abnormal error occurs in a self reading operation, namely, an abnormal reading error, and the abnormal reading error includes but is not limited to: data corruption and data loss due to memory cell failure, data corruption and data loss due to temperature causes. It should be noted that, the solid state disk can only detect whether an abnormal error occurs in the reading operation, but cannot directly determine whether the abnormal error of the solid state disk is caused by a temperature cause. If the abnormal error of the solid state disk is data damage and data loss caused by temperature reasons, the solid state disk can be recovered to normal operation when the temperature is recovered to a normal range, however, if the abnormal error of the solid state disk is data damage and data loss caused by storage unit faults, the solid state disk cannot be normally operated even if the temperature is recovered to normal.
Step S102, if an error of abnormal reading occurs in the solid state disk, acquiring a first temperature of the solid state disk; the first temperature is the current temperature of the solid state disk.
Specifically, if the detection operation is used to determine that an error occurs in the solid state disk due to abnormal reading when the data is read, it is required to determine whether the error is data damage and data loss caused by a temperature cause, and at this time, the current temperature of the solid state disk, that is, the first temperature, needs to be obtained. The first temperature may be obtained by a temperature sensor, or may be obtained by a hardware monitoring tool, for example, the first temperature of the solid state disk may be obtained by hwifefo, and the method for obtaining the first temperature of the solid state disk is not limited herein.
Step S103, obtaining the low-energy temperature corresponding to the solid state disk with the error of abnormal reading in a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at the non-low-energy temperature.
Specifically, when the low-energy temperature of the solid state disk is the temperature, the reading rate of the solid state disk is obviously reduced, the corresponding relation between the solid state disk and the low-energy temperature is stored in a preset database, for example, different labels are set for different hard disks, then the corresponding relation between the labels and the low-energy temperature is set in the preset database, and then the low-energy temperature corresponding to the solid state disk can be obtained in the database only by obtaining the labels of the solid state disk with abnormal reading errors through the corresponding relation. The read rate, i.e. the read performance, of a solid state disk at low energy temperatures is lower than the read rate at other temperatures.
In a possible implementation manner, before step S103, the method further includes: a preset database is constructed, a plurality of reading performances of the solid state disk at a plurality of temperatures are obtained, the plurality of reading performances comprise a first reading performance and a second reading performance, and the first reading performance and the second reading performance are the reading performances corresponding to any two different temperatures of the plurality of reading performances; judging whether the first reading performance is smaller than the second reading performance; if the first reading performance is smaller than the second reading performance, taking the temperature corresponding to the first reading performance as the low-energy temperature of the solid state disk; and storing the corresponding relation between the solid state disk and the low-energy temperature in a preset database.
Specifically, the value range of the low-energy temperature of the solid state disk can be a continuous interval, and the low-energy temperature corresponding to the solid state disk can be obtained by testing the reading performance of the solid state disk at different temperatures. And compared with the reading rate of the solid state disk at other temperatures, the reading rate of the solid state disk at low-energy temperature can generate a fault phenomenon, namely the reading rate of the solid state disk at low-energy temperature is far lower than the reading rate of the solid state disk at other temperatures, at the moment, the temperature of which the reading rate is far lower than the reading rate of the solid state disk at other temperatures can be used as a low-energy temperature value range interval of the solid state disk, and the corresponding relation between the solid state disk and the low-energy temperature value range interval is built in a preset database.
For example, a plurality of temperature nodes may be set, and then the reading rate of the solid state disk of each temperature node is recorded, for example, every 5 ° interval, the reading rate of the solid state disk is recorded at 50 ° to 90 °, when the reading rate at 75 °, 80 °, 85 ° and 90 ° is found to be far lower than the reading rate at other temperatures, the temperature interval [75 °,90 ° ] is taken as the low-energy temperature value range interval of the solid state disk; the temperature of the solid state disk can be increased from 50 degrees to 90 degrees by slowly changing the solid state disk, the change of the reading speed of the solid state disk is recorded simultaneously in the heating process, and the low-energy temperature value range of the solid state disk can be recorded at the moment.
Step S104, judging whether the first temperature is higher than the low energy temperature.
Specifically, whether the first temperature is higher than the low-energy temperature or not is judged, namely whether the first temperature is in a low-energy temperature value range section corresponding to the solid state disk with the error of abnormal reading is judged.
Step 105, if the first temperature is greater than the low energy temperature, adjusting the first working frequency of the solid state disk to a second working frequency according to a preset rule until the first temperature is changed to the second temperature, wherein the second working frequency is smaller than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at the first temperature, and the second working frequency is the reason that the error of reading abnormality occurs to the working frequency corresponding to the solid state disk at the second temperature may be caused by the temperature reason.
Specifically, if the first temperature is within the low-energy temperature range corresponding to the solid state disk with the abnormal reading error, the abnormal reading error of the solid state disk may be caused by a temperature cause. At this time, the working frequency of the solid state disk needs to be adjusted, and the first temperature of the solid state disk is adjusted to be out of the value range of the low-energy temperature, namely, to be non-low-energy temperature, namely, to be the second temperature by adjusting the working frequency of the solid state disk.
In one possible implementation, step S105 further includes: the first working frequency of the solid state disk is adjusted to be the second working frequency, and the first temperature is changed to be the second temperature within a first preset time period; wherein, in the preset time period, the change rate of the second working frequency and the preset time period are normally distributed.
Specifically, by controlling the rate of change of the second operating frequency, the time period required for changing any first temperature to the second temperature can be made to approach the preset time period, that is, the rate of change of the second operating frequency and the preset time period should satisfy the normal distribution.
By way of example, assuming that the temperature of the hard disk 1 needs to be adjusted from 85 ° to 65 °, and the temperature of the hard disk 2 needs to be adjusted from 89 ° to 63 °, the time required for the temperature of the hard disk 1 to be adjusted from 85 ° to 65 ° can be made approximately the same as the temperature of the hard disk 2 to be adjusted from 89 ° to 63 ° by controlling the rate of change of the second operating frequency. Through a large number of calculations, the value of the change rate of the working frequency and the preset time period required by the hard disk temperature adjustment can be ensured to be normally distributed.
In one possible implementation, step S105 further includes: the second operating frequency is calculated according to the following formula:
P 2 ＝β*P 1 *(T 2 /T 1 )
wherein P is 2 And P1 is the first working frequency, beta is a heat dissipation factor, T1 is the first temperature, and T2 is the second temperature of the solid state disk.
Specifically, the formula P can be used 2 ＝β*P 1 *(T 2 /T 1 ) Calculating the value of a second operating frequency to be controlled in the process of changing the first temperature to the second temperature, wherein P 2 For a second operating frequency, P 1 For the first working frequency, beta is a heat dissipation factor, T 1 At a first temperature, T 2 In order to make the solid state disk at the second temperature, the second operating frequency needs to be changed along with the change of the hard disk temperature because the hard disk temperature is continuously changed, and when the change rate of the hard disk temperature is increased, the change rate of the second operating frequency is also increased, and vice versa, so that the heat dissipation speed of the solid state disk can be increased by changing the change rate of the second operating frequency, that is, the preset time period required for adjusting the solid state disk from different temperatures to the second temperature can be controlled by changing the change rate of the second operating frequency is approximately the same.
In one possible implementation, step S105 further includes: the heat dissipation factor is a factor influencing heat dissipation of the solid state disk and comprises a solid state disk material factor, a heat conducting medium factor and a working environment temperature.
Specifically, the heat dissipation factor needs to be calculated in consideration of various heat dissipation factors affecting the solid state disk, including but not limited to: solid state disk material factors, heat conducting medium factors, working environment temperature and the like. Assuming that we only consider these three factors to calculate the heat dissipation factor, we can calculate by the formula β=m×n (a/(l×Δt)), where m is a solid state disk material factor, n is a heat conducting medium factor, a is a heat dissipation surface area of the hard disk, L is a length of a heat conduction path, and Δt is a difference between a current temperature of the solid state disk and a working environment temperature. For convenience of explanation, only three heat dissipation factors are used for calculation, because these three factors are sufficient to reduce the error caused by the heat dissipation factors to a degree suitable for actual calculation, but in the actual calculation process, the heat dissipation factors may be calculated in consideration of more factors, and the more the factors are considered, the smaller the influence of the heat dissipation factors on the error of actual calculation, so the calculation of the heat dissipation factors is not limited by this embodiment.
In one possible implementation, step S106 further includes: the current temperature of the solid state disk is greater than the working environment temperature.
Specifically, in the process of calculating the heat dissipation factor, in order to ensure the rationality of calculation, it is required to ensure that the current temperature of the solid state disk is greater than the working environment temperature, that is, the difference Δt between the solid state disk and the current temperature is greater than 0, and in the process of actually cooling, as long as the solid state disk is still in an operating state, the environment temperature is not higher than the current temperature of the solid state disk.
And S106, judging whether the solid state disk at the second temperature has an error of abnormal reading.
Specifically, when the current temperature of the solid state disk is adjusted from the first temperature to the second temperature, the temperature factor no longer affects the error of the abnormal reading of the solid state disk, so that it is required to determine whether the error of the abnormal reading of the solid state disk occurs at the second temperature.
And step S107, if the solid state disk at the second temperature has an abnormal reading error, the solid state disk is recorded as a fault solid state disk.
Specifically, when the temperature factor no longer affects the abnormal reading error of the solid state disk, the abnormal reading error still occurs in the solid state disk, and at the moment, the abnormal error of the solid state disk is confirmed to be data damage and data loss caused by the fault of the storage unit, so that the solid state disk is marked as a fault solid state disk.
In a possible implementation manner, after step S107, the method further includes: and if the solid state disk at the second temperature has no error of abnormal reading, marking the solid state disk as a non-fault solid state disk.
Specifically, when the temperature factor no longer affects the error of the abnormal reading of the solid state disk, if the abnormal reading error of the solid state disk does not occur, it is indicated that the abnormal error of the solid state disk is data damage and data loss caused by the temperature, and the solid state disk can normally operate, so that the solid state disk is marked as a non-fault solid state disk.
By adopting the method, the beneficial effects which can be achieved include at least one of the following:
1. after detecting that the solid state disk has an abnormal reading error, whether the solid state disk has the abnormal reading error is detected, if so, the temperature of the solid state disk is adjusted to be a non-low energy temperature by detecting whether the current temperature of the solid state disk is a low energy temperature or not, and if so, the solid state disk is judged to be the failed solid state disk, and if so, the accuracy of judging the failed solid state disk is increased by eliminating the influence of the temperature on the judgment of the failed solid state disk.
2. The low-energy temperature corresponding to the solid state disk can be obtained by testing the reading performance of the solid state disk at different temperatures. And compared with the reading rate of the solid state disk at other temperatures, the reading rate of the solid state disk at low-energy temperature can generate a fault phenomenon, namely the reading rate of the solid state disk at low-energy temperature is far lower than the reading rate of the solid state disk at other temperatures, at the moment, the temperature of which the reading rate is far lower than the reading rate of the solid state disk at other temperatures can be used as a low-energy temperature value range interval of the solid state disk, and the corresponding relation between the solid state disk and the low-energy temperature value range interval is built in a preset database. When errors of abnormal reading of the solid state disk occur, the low-energy temperature corresponding to the solid state disk can be obtained rapidly according to the solid state disk.
3. By formula P 2 ＝β*P 1 *(T 2 /T 1 ) The second operating frequency may be calculated. Since the temperature of the hard disk is continuously changed, the second operating frequency needs to be changed along with the change of the temperature of the hard disk, when the change rate of the temperature of the hard disk is increased, the change rate of the second operating frequency is also increased, and vice versa, so that the solid state can be increased by changing the change rate of the second operating frequency The heat dissipation speed of the solid state disk can be controlled by changing the change rate of the second working frequency, and the preset time period required by adjusting the solid state disk from different temperatures to the second temperature is approximately the same.
Referring to fig. 2, a processing apparatus for misjudging a solid state disk fault according to an embodiment of the present invention is a server, where the server includes a response module 21, an obtaining module 22, a judging module 23 and an output module 24,
the response module 21 is configured to determine whether an error of reading abnormality occurs in the solid state disk in response to a detection operation of the read data of the solid state disk by the user.
The obtaining module 22 is configured to obtain a first temperature of the solid state disk if an error of abnormal reading occurs in the solid state disk; the first temperature is the current temperature of the solid state disk; and acquiring the low-energy temperature corresponding to the solid state disk with the error of abnormal reading from a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at the non-low-energy temperature.
A judging module 23, configured to judge whether the first temperature is greater than the low energy temperature; if the first temperature is higher than the low-energy temperature, the first working frequency of the solid state disk is adjusted to be a second working frequency according to a preset rule until the first temperature is changed to be the second temperature, and the second working frequency is smaller than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at the first temperature, and the second working frequency is the working frequency corresponding to the solid state disk at the second temperature; and judging whether the solid state disk at the second temperature has an error of abnormal reading or not.
The output module 24 is configured to record the solid state disk as a failed solid state disk if an error of abnormal reading occurs in the solid state disk at the second temperature, and the test module is configured to perform performance test on the plurality of test nodes according to a preset test mode, and specifically includes: performing performance test on the plurality of test nodes according to a preset test sequence, wherein any one of the plurality of test nodes corresponds to a preset test frequency; the preset test method further comprises preset test times, and one test node corresponds to one preset test time.
In a possible implementation manner, the obtaining module 22 is configured to construct a preset database before obtaining the low-energy temperature corresponding to the solid state disk in the preset database, and obtain a plurality of read performances of the solid state disk at a plurality of temperatures, where the plurality of read performances includes a first read performance and a second read performance, and the first read performance and the second read performance are read performances corresponding to any two different temperatures of the plurality of read performances; judging whether the first reading performance is smaller than the second reading performance; if the first reading performance is smaller than the second reading performance, taking the temperature corresponding to the first reading performance as the low-energy temperature of the solid state disk; and storing the corresponding relation between the solid state disk and the low-energy temperature in a preset database.
In a possible implementation manner, the determining module 23 is configured to adjust the first operating frequency of the solid state disk to the second operating frequency according to a preset rule until the first temperature changes to the second temperature, and specifically includes: the first working frequency of the solid state disk is adjusted to be the second working frequency, and the first temperature is changed to be the second temperature within a first preset time period; wherein, in the preset time period, the change rate of the second working frequency and the preset time period are normally distributed.
In a possible implementation manner, the determining module 23 is configured to adjust the first operating frequency of the solid state disk to the second operating frequency according to a preset rule, and specifically includes: the second operating frequency is calculated according to the following formula:
P 2 ＝β*P 1 *(T 2 /T 1 )
wherein P is 2 And P1 is the first working frequency, beta is a heat dissipation factor, T1 is the first temperature, and T2 is the second temperature of the solid state disk.
In one possible implementation, the output module 24 is configured to record the solid state disk as a non-failed solid state disk if no error occurs in reading the solid state disk at the second temperature.
The application also discloses an electronic device comprising a processor, a memory, a user interface and a network interface, the memory being for storing instructions, the user interface and the network interface being for communicating to other devices, the processor being for executing the instructions stored in the memory to cause the electronic device to perform a method as described in any one of the above.
It should be noted that: in the device provided in the above embodiment, when implementing the functions thereof, only the division of the above functional modules is used as an example, in practical application, the above functional allocation may be implemented by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules, so as to implement all or part of the functions described above. In addition, the embodiments of the apparatus and the method provided in the foregoing embodiments belong to the same concept, and specific implementation processes of the embodiments of the method are detailed in the method embodiments, which are not repeated herein.
The application also discloses electronic equipment. Referring to fig. 3, fig. 3 is a schematic structural diagram of an electronic device according to the disclosure in an embodiment of the present application. The electronic device 300 may include: at least one processor 301, a memory 302, a user interface 303, at least one network interface 304, at least one communication bus 305.
Wherein a communication bus 305 is used to enable connected communications between these components.
The user interface 303 may include a Display screen (Display), a Camera (Camera), and the optional user interface 303 may further include a standard wired interface, and a wireless interface.
The network interface 304 may include a standard wired interface, a wireless interface (e.g., WI-FI interface), among others.
Wherein the processor 301 may include one or more processing cores. The processor 301 utilizes various interfaces and lines to connect various portions of the overall solid state disk, perform various functions of the solid state disk and process data by executing or executing instructions, programs, code sets, or instruction sets stored in the memory 302, and invoking data stored in the memory 302. Alternatively, the processor 301 may be implemented in hardware in at least one of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), programmable logic array (Programmable Logic Array, PLA). The processor 301 may integrate one or a combination of several of a central processing unit (Central Processing Unit, CPU), an image processor (Graphics Processing Unit, GPU), and a modem etc. The CPU mainly processes an operating system, a user interface, an application program and the like; the GPU is used for rendering and drawing the content required to be displayed by the display screen; the modem is used to handle wireless communications. It will be appreciated that the modem may not be integrated into the processor 301 and may be implemented by a single chip.
The Memory 302 may include a random access Memory (Random Access Memory, RAM) or a Read-Only Memory (Read-Only Memory). Optionally, the memory 302 includes a non-transitory computer readable medium (non-transitory computer-readable storage medium). Memory 302 may be used to store instructions, programs, code, sets of codes, or sets of instructions. The memory 302 may include a stored program area and a stored data area, wherein the stored program area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playing function, an image playing function, etc.), instructions for implementing the above-described various method embodiments, etc.; the storage data area may store data or the like involved in the above respective method embodiments. The memory 302 may also be at least one memory device located remotely from the aforementioned processor 301. Referring to fig. 3, a memory 302, which is a computer storage medium, may include an operating system, a network communication module, a user interface module, and a processing application for misjudging a solid state disk failure.
In the electronic device 300 shown in fig. 3, the user interface 303 is mainly used for providing an input interface for a user, and acquiring data input by the user; and the processor 301 may be configured to invoke the processing application stored in the memory 302 for false positives of solid state disk failures, which when executed by the one or more processors 301, causes the electronic device 300 to perform the method as described in one or more of the embodiments above. It should be noted that, for simplicity of description, the foregoing method embodiments are all expressed as a series of action combinations, but it should be understood by those skilled in the art that the present application is not limited by the order of actions described, as some steps may be performed in other order or simultaneously in accordance with the present application. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily required in the present application.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
In the several embodiments provided herein, it should be understood that the disclosed apparatus may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, such as a division of units, merely a division of logic functions, and there may be additional divisions in actual implementation, such as multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some service interface, device or unit indirect coupling or communication connection, electrical or otherwise.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable memory. Based on such understanding, the technical solution of the present application may be essentially or a part contributing to the prior art or all or part of the technical solution may be embodied in the form of a software product stored in a memory, including several instructions for causing a computer device (which may be a personal computer, a solid state disk, or a network device, etc.) to perform all or part of the steps of the methods of the embodiments of the present application. And the aforementioned memory includes: various media capable of storing program codes, such as a U disk, a mobile hard disk, a magnetic disk or an optical disk.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, produces a flow or function in accordance with embodiments of the present application, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in or transmitted from one computer-readable storage medium to another, for example, by wired (e.g., coaxial cable, optical fiber, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) means from one website, computer, solid state disk, or data center. The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device such as a solid state disk, a data center, or the like, that contains one or more integration of available media. The usable medium may be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid state disk), etc.
Those of ordinary skill in the art will appreciate that implementing all or part of the above-described method embodiments may be accomplished by a computer program to instruct related hardware, the program may be stored in a computer readable storage medium, and the program may include the above-described method embodiments when executed. And the aforementioned storage medium includes: ROM or random access memory RAM, magnetic or optical disk, etc.
The above embodiments are merely for illustrating the technical solution of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. The method for processing the misjudgment of the solid state disk faults is characterized by being applied to a server and comprising the following steps:
responding to detection operation of a user on read data of the solid state disk, and judging whether the solid state disk has an error of abnormal reading; if the solid state disk is in the error of abnormal reading, acquiring a first temperature of the solid state disk; the first temperature is the current temperature of the solid state disk;
Acquiring a low-energy temperature corresponding to the solid state disk with the abnormal reading error in a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at a non-low-energy temperature;
judging whether the first temperature is higher than the low-energy temperature;
if the first temperature is higher than the low-energy temperature, adjusting the first working frequency of the solid state disk to a second working frequency according to a preset rule until the first temperature is changed to a second temperature, wherein the second working frequency is lower than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at a first temperature, and the second working frequency is the working frequency corresponding to the solid state disk at a second temperature;
judging whether the solid state disk at the second temperature has the error of the abnormal reading;
and if the solid state disk at the second temperature has the error of abnormal reading, marking the solid state disk as a fault solid state disk.
2. The method of claim 1, wherein before the obtaining the low energy temperature corresponding to the solid state disk in the preset database, the method further includes constructing the preset database, and specifically includes:
Acquiring a plurality of reading performances of the solid state disk at a plurality of temperatures, wherein the plurality of reading performances comprise a first reading performance and a second reading performance, and the first reading performance and the second reading performance are the reading performances corresponding to any two different temperatures of the plurality of reading performances;
judging whether the first reading performance is smaller than the second reading performance;
if the first reading performance is smaller than the second reading performance, taking the temperature corresponding to the first reading performance as the low-energy temperature of the solid state disk;
and storing the corresponding relation between the solid state disk and the low-energy temperature in the preset database.
3. The method of claim 1, wherein the adjusting the first operating frequency of the solid state disk to the second operating frequency according to the preset rule until the first temperature changes to the second temperature specifically includes:
the first working frequency of the solid state disk is adjusted to be a second working frequency, and the first temperature is changed to be the second temperature within a first preset time period; and in the preset time period, the change rate of the second working frequency and the preset time period are normally distributed.
4. The method of claim 1, wherein the adjusting the first operating frequency of the solid state disk to the second operating frequency according to the preset rule specifically includes:
calculating the second operating frequency according to the formula:
P 2 ＝β*P 1 *(T 2 /T 1 )
wherein P is 2 And for the second working frequency, P1 is the first working frequency, beta is a heat dissipation factor, T1 is the first temperature, and T2 is the second temperature of the solid state disk.
5. The method of claim 4, wherein the heat dissipation factor is a factor affecting heat dissipation of the solid state disk, and includes a solid state disk material factor, a heat conducting medium factor, and a working environment temperature.
6. The method of claim 5, wherein the current temperature of the solid state disk is greater than the operating environment temperature.
7. The method according to claim 1, wherein the method further comprises:
and if the solid state disk at the second temperature has no error of abnormal reading, marking the solid state disk as a non-fault solid state disk.
8. A processing device for misjudgment of solid state disk faults is characterized in that the device is a server, the server comprises a response module (21), an acquisition module (22), a judgment module (23) and an output module (24), wherein,
The response module (21) is used for responding to the detection operation of a user on the read data of the solid state disk and judging whether the solid state disk has an error of abnormal reading;
the obtaining module (22) is configured to obtain a first temperature of the solid state disk if the solid state disk has an error of the abnormal reading; the first temperature is the current temperature of the solid state disk; the method comprises the steps that a low-energy temperature corresponding to a solid state disk is obtained from a preset database, wherein the preset database is used for storing the corresponding relation between the solid state disk and the low-energy temperature, and the reading performance of the solid state disk at the low-energy temperature is lower than that of the solid state disk at a non-low-energy temperature; the judging module (23) is used for judging whether the first temperature is greater than the low-energy temperature; if the first temperature is higher than the low-energy temperature, adjusting the first working frequency of the solid state disk to a second working frequency according to a preset rule until the first temperature is changed to a second temperature, wherein the second working frequency is lower than the first working frequency; the first working frequency is the working frequency corresponding to the solid state disk at a first temperature, and the second working frequency is the working frequency corresponding to the solid state disk at a second temperature; judging whether the solid state disk at the second temperature has the error of the reading abnormality or not;
And the output module (24) is used for marking the solid state disk as a fault solid state disk if the solid state disk at the second temperature has the error of abnormal reading.
9. An electronic device comprising a processor (301), a memory (302), a user interface (303), a network interface (304) and a communication bus (305), the memory (302) being adapted to store instructions, the user interface (303) and the network interface (304) being adapted to communicate to other devices, the processor (301) being adapted to execute the instructions stored in the memory (302) to cause the electronic device (300) to perform the method according to any one of claims 1 to 7.
10. A computer readable storage medium storing instructions which, when executed, perform the method of any one of claims 1 to 7.
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