CN112151107B - SSD Critical burning field testing method and device based on asynchronous events - Google Patents

SSD Critical burning field testing method and device based on asynchronous events Download PDF

Info

Publication number
CN112151107B
CN112151107B CN202011041592.3A CN202011041592A CN112151107B CN 112151107 B CN112151107 B CN 112151107B CN 202011041592 A CN202011041592 A CN 202011041592A CN 112151107 B CN112151107 B CN 112151107B
Authority
CN
China
Prior art keywords
ssd
critical
field
asynchronous event
cleared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202011041592.3A
Other languages
Chinese (zh)
Other versions
CN112151107A (en
Inventor
罗发治
杨荣
倪永俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Union Memory Information System Co Ltd
Original Assignee
Shenzhen Union Memory Information System Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Union Memory Information System Co Ltd filed Critical Shenzhen Union Memory Information System Co Ltd
Priority to CN202011041592.3A priority Critical patent/CN112151107B/en
Publication of CN112151107A publication Critical patent/CN112151107A/en
Application granted granted Critical
Publication of CN112151107B publication Critical patent/CN112151107B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016Apparatus features

Landscapes

  • Debugging And Monitoring (AREA)

Abstract

The application relates to a method and a device for testing a Critical warming field of an SSD based on asynchronous events, a computer device and a storage medium, wherein the method comprises the following steps: setting the high-temperature threshold of the SSD to be 0 ℃ and storing; reading and judging whether a Critical Warning field of the SSD is set to be 02h or not; issuing an asynchronous event request command to the SSD; determining whether the SSD has correctly responded to an asynchronous event of a Composite Temperature exception; resetting and storing the high-temperature threshold value of the SSD to a value before leaving a factory; and resetting hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if not, ending the script error reporting test. The invention can quickly and efficiently verify whether the SSD can correctly set the Critical Warning field to a corresponding value after the Composite Temperature exception occurs.

Description

SSD Critical Warning field testing method and device based on asynchronous events
Technical Field
The invention relates to the technical field of solid state disk testing, in particular to a method and a device for testing a Critical Warning field of an SSD based on an asynchronous event, computer equipment and a storage medium.
Background
Currently, when checking SMART (Self-Monitoring and Reporting Technology, hereinafter referred to as SMART) information of a PCIe NVMe SSD (hereinafter referred to as SSD), it is usually concerned whether a value of a Critical Warning field of the SMART information is not 0, and if so, it indicates that an abnormal condition occurs in the SSD in the current power-on cycle, and a corresponding asynchronous event is reported to the host. According to the NVMe 1.3 protocol, there are 5 exceptions that result in the value of the Critical Warning field in the SMART message of the SSD being not 0, and the 5 exceptions are:
when the Available spark of the SSD is lower than the threshold set by the SSD, the value of the Critical turning field is set to 1h. The Critical Warning field is set to a value of 02h when the Composite Temperature of the SSD is above its set high Temperature threshold or below its low Temperature threshold. When a SSD appears in Media and Data Integrity Errors, the value of the Critical Warning field will be set to 04h. When the SSD becomes read-only (which typically occurs when the lifetime of the SSD has been exhausted), the value of the Critical Warning field would be set to 08h. When a power-down protection device (which is usually a power-down protection capacitor and is generally only available in enterprise-level SSDs) of an SSD fails, the value of the Critical Warning field is set to 10h.
In addition, the value of the Critical Warning field according to the NVMe 1.3 protocol only represents the state in the current power-on cycle, and the value is not always fixed, in other words, after the SSD is reset or re-powered on by hardware, the value is cleared unless any of the above exceptions occurs again after the hardware is reset or re-powered on. Of the above 5 exceptions, composite Temperature exception and Media and Data Integrity Errors exception are two of the most common exceptions that cause the Critical Warning field to be non-0, and according to NVMe 1.3 protocol, when the two exceptions occur, the former triggers SSD to report asynchronous events of Temperature exception to the host, and the latter triggers SSD to report asynchronous events of reliability degradation to the host.
At present, in order to verify whether the Critical Warning field of the SSD is correctly set to a corresponding value after the two most common anomalies occur, for the Composite Temperature anomaly, a method generally adopted is to place the SSD in a high-Temperature environment and perform a long-time read-write test on the SSD, so that the Composite Temperature is increased and exceeds a set high-Temperature threshold (usually, the threshold is set to about 70-85 ℃ by the SSD firmware before leaving the factory), read whether the Critical Warning field is set to 02h, stop reading and writing, restart the test platform after the SSD Temperature is reduced to below the set Temperature threshold, read whether the Critical Warning field is cleared again, but this test method cannot verify whether the SSD correctly reports the anomalous event of the Temperature anomaly to the host when the Critical Warning field is 02h. For Media and Data Integrity Errors, the method usually adopted is to perform long-time high-frequency abnormal power failure and read-write comparison test on the SSD, when the Media and Data Integrity Errors occur, the value of the Critical Warning field is set to 10 hours, then the power failure and read-write test is stopped, the test platform is restarted, and whether the Critical Warning field is cleared or not is read again, but the test method cannot verify whether the SSD correctly reports the abnormal event of reliability reduction to the host when the Critical Warning field is 10 hours, and the test method needs longer test time and is not beneficial to quick verification.
Disclosure of Invention
Therefore, in order to solve the technical problem, it is necessary to provide an SSD Critical rounding field testing method and apparatus based on asynchronous events, which can intercept an existing mirrored solid state disk before the notebook leaves a factory, a computer device, and a storage medium.
An SSD Critical burning field testing method based on asynchronous events, the method comprising:
setting the high-temperature threshold of the SSD to be 0 ℃ and storing;
reading and judging whether a Critical Warning field of the SSD is set to be 02h or not;
if the Critical waiting field of the SSD is set to 02h, issuing an asynchronous event request command to the SSD;
judging whether the SSD correctly responds to the asynchronous event of the Composite Temperature exception or not;
if the SSD has correctly responded to the asynchronous event of the Composite Temperature exception, resetting the high-Temperature threshold value of the SSD to a value before leaving a factory and storing the value;
and resetting hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if not, ending the script error reporting test.
In one embodiment, after the step of resetting the SSD and determining whether the Critical Warning field of the SSD is cleared, the method further includes:
if the Critical waiting field of the SSD is cleared, issuing a Write Uncoretable command to the SSD;
reading and judging whether the Critical warming field of the SSD is set to be 10h or not;
if the Critical waiting field of the SSD is set to 10h, issuing an asynchronous event request command to the SSD;
judging whether the SSD correctly responds to the asynchronous event of Media and Data Integrity Errors abnormality or not;
if the SSD has correctly responded to the asynchronous event of Media and Data Integrity Errors abnormity, performing hardware reset on the SSD;
and judging whether the Critical Warning field of the SSD is cleared or not, if not, ending the script error reporting test, and if so, passing the test.
In one embodiment, after the step of reading and interpreting whether the Critical Warning field of the SSD has been set to 02h, the method further comprises:
and if the Critical Warning field of the SSD is not set to 02h, ending the script error reporting test.
In one embodiment, after the step of reading and determining whether the Critical Warning field of the SSD has been set to 10h, the method further includes:
and if the Critical Warning field of the SSD is not set to 10h, the script error reporting test is finished.
An asynchronous event based SSD Critical rounding field testing apparatus, the apparatus comprising:
the device comprises a first setting module, a second setting module and a control module, wherein the first setting module is used for setting the high-temperature threshold of the SSD to be 0 ℃ and storing the high-temperature threshold;
the first judgment module is used for reading and judging whether the Critical Warning field of the SSD is set to be 02h or not;
the first command module is used for issuing an asynchronous event request command to the SSD if the Critical waiting field of the SSD is set to 02h;
a second determining module, configured to determine whether the SSD correctly responds to an asynchronous event with a Composite Temperature exception;
the second setting module is used for resetting and storing the high-Temperature threshold of the SSD to a value before leaving a factory if the SSD correctly responds to the asynchronous event of the Composite Temperature exception;
and the third judgment module is used for resetting the hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if the Critical Warning field of the SSD is not cleared, the script error reporting test is finished.
In one embodiment, the apparatus further comprises:
the second command module is used for issuing a Write unorderable command to the SSD if the Critical waiting field of the SSD is cleared;
a fourth judging module, configured to read and judge whether a Critical Warning field of the SSD has been set to 10h;
a third command module, configured to issue an asynchronous event request command to the SSD if a Critical Warning field of the SSD is set to 10h;
a fifth determining module, configured to determine whether the SSD correctly responds to an asynchronous event that the Media and Data Integrity Errors are abnormal;
a hardware reset module, configured to perform hardware reset on the SSD if the SSD correctly responds to an asynchronous event of a Media and Data Integrity Errors exception;
a sixth judging module, configured to judge whether a Critical Warning field of the SSD is cleared, where if the Critical Warning field is not cleared, the script fault reporting test is ended, and if the Critical Warning field is cleared, the test passes.
In one embodiment, the first determining module is further configured to:
and if the Critical Warning field of the SSD is not set to 02h, ending the script error reporting test.
In one embodiment, the fourth determining module is further configured to:
and if the Critical Warning field of the SSD is not set to 10h, the script error reporting test is finished.
A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of any of the above methods when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of any of the methods described above.
The SSD Critical warming field testing method, the device, the computer equipment and the storage medium based on the asynchronous event are characterized in that the high-temperature threshold of the SSD is set to be 0 ℃ and stored; reading and judging whether a Critical Warning field of the SSD is set to be 02h or not; if the Critical waiting field of the SSD is set to 02h, issuing an asynchronous event request command to the SSD; determining whether the SSD has correctly responded to an asynchronous event of a Composite Temperature exception; if the SSD has correctly responded to the asynchronous event of the Composite Temperature exception, resetting the high-Temperature threshold value of the SSD to a value before leaving a factory and storing the value; and performing hardware reset on the SSD and judging whether the Critical burning field of the SSD is cleared or not, and if not, finishing the script error reporting test. The method can quickly and efficiently verify whether the SSD can correctly set the Critical Warning field as a corresponding value and correctly respond to the corresponding asynchronous event to the host after the Composite Temperature exception occurs, and the test method needs shorter test time and is suitable for a test scene of quick verification.
Drawings
FIG. 1 is a flow diagram illustrating a SSD Critical rounding field test method based on asynchronous events in one embodiment;
FIG. 2 is a flowchart illustrating a SSD Critical rounding field test method based on asynchronous events in another embodiment;
FIG. 3 is a flowchart illustrating a SSD Critical rounding field test method based on asynchronous events in yet another embodiment;
FIG. 4 is a block diagram of an exemplary SSD Critical rounding field test apparatus based on asynchronous events;
FIG. 5 is a block diagram of an SSD Critical rounding field test device based on asynchronous events in another embodiment;
FIG. 6 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In one embodiment, as shown in fig. 1, there is provided an SSD Critical rounding field test method based on asynchronous events, the method comprising:
step 102, setting the high-temperature threshold of the SSD to be 0 ℃ and storing;
step 104, reading and judging whether the Critical turning field of the SSD is set to 02h;
step 106, if the Critical waiting field of the SSD is set to 02h, an asynchronous event request command is issued to the SSD;
step 108, judging whether the SSD correctly responds to the asynchronous event with Composite Temperature exception;
step 110, if the SSD has correctly responded to the asynchronous event of the Composite Temperature exception, resetting the high-Temperature threshold of the SSD to a value before leaving the factory and storing the value;
and step 112, resetting the hardware of the SSD, judging whether the Critical Warning field of the SSD is cleared or not, and if not, ending the script error reporting test.
At present, in order to verify whether the Critical Warning field of the SSD is correctly set to a corresponding value after the SSD has the most common abnormality of the Composite Temperature in the SMART information, for the Composite Temperature abnormality, a method generally adopted is to place the SSD in a high-Temperature environment and perform a long-time read-write test on the SSD, so that the Composite Temperature rises and exceeds a set high-Temperature threshold (usually, the threshold is set to about 70-85 ℃ by the SSD firmware before leaving factory), then read whether the Critical Warning field is set to 02h, then stop reading and writing, restart the test platform after the SSD Temperature falls below the set Temperature threshold, read again whether the Critical Warning field is cleared, but this test method cannot verify whether the Critical Warning field is correctly reported to the host SSD when the Critical Warning field is 02h; and the test method needs longer test time, which is not beneficial to quick verification.
Based on this, in the embodiment, a test script is written by using DriveMaster software of unlink corporation, and the Critical Warning and the corresponding asynchronous event function of the SSD are verified by using an error injection method, that is, the Composite Temperature of the SSD is immediately higher than 0 ℃ by greatly reducing the high Temperature threshold of the SSD to 0 ℃, so that the value of the Critical Warning field is triggered to change from 00h to 02h, and whether the SSD correctly reports the asynchronous event with Composite Temperature abnormality to the host is read.
In one embodiment, after the step of reading and interpreting whether the Critical Warning field of the SSD has been set to 02h, the method further comprises: if the Critical Warning field of the SSD is not set to 02h, the script error reporting test is finished.
In particular, reference may be made to the script test flow diagram shown in FIG. 3. Firstly, setting the high-temperature threshold of the SSD to be 0 ℃ and storing; and reading whether the Critical Warning of the SSD is set to 02h or not, if not, reporting an error by the script, and ending the test. Then, an asynchronous event request command is issued to the SSD; and reading whether the SSD correctly responds to the asynchronous event of the Composite Temperature exception or not, if not, reporting an error by the script, and finishing the test. Then resetting the high-temperature threshold value of the SSD to a value before factory shipment and storing the value; a hardware reset is performed on the SSD. And finally, reading whether the Critical Warning of the SSD is cleared or not, if not, reporting an error by the script, and ending the test.
In the embodiment, the high temperature threshold of the SSD is set to 0 ℃ and stored; reading and judging whether a Critical Warning field of the SSD is set to be 02h or not; if the Critical waiting field of the SSD is set to 02h, issuing an asynchronous event request command to the SSD; determining whether the SSD has correctly responded to an asynchronous event of a Composite Temperature exception; if the SSD has correctly responded to the asynchronous event of the Composite Temperature exception, resetting the high-Temperature threshold value of the SSD to a value before leaving a factory and storing the value; and resetting hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if not, ending the script error reporting test. According to the scheme, whether the SSD can correctly set the Critical Warning field to the corresponding value and whether the corresponding asynchronous event is correctly responded to the host after the Composite Temperature exception occurs can be quickly and efficiently verified, the testing time required by the testing method is short, and the testing method is suitable for a testing scene of quick verification.
In one embodiment, as shown in fig. 2, a method for testing a Critical Warning field of an SSD based on an asynchronous event is provided, where the method further includes, after the steps of resetting the SSD and determining whether the Critical Warning field of the SSD has been cleared:
step 202, if the Critical waiting field of the SSD is cleared, issuing a Write Uncoretable command to the SSD;
step 204, reading and judging whether the Critical warming field of the SSD is set to be 10h;
step 206, if the Critical waiting field of the SSD is set to 10h, an asynchronous event request command is issued to the SSD;
step 208, determining whether SSD has responded correctly to the asynchronous event of Media and Data Integrity Errors;
step 210, if the SSD has correctly responded to the asynchronous event of Media and Data Integrity Errors, performing hardware reset on the SSD;
step 212, determining whether the Critical Warning field of the SSD has been cleared, if not, ending the script error reporting test, and if cleared, passing the test.
At present, in order to verify whether a Critical Warning field of an SSD is correctly set to a corresponding value after the SSD has a most common abnormality of Media and Data Integrity Errors in SMART information, for the Media and Data Integrity Errors, a method is usually adopted to perform a long-time and high-frequency abnormal power-down and read-write comparison test on the SSD, when the Media and Data Integrity Errors occur, the value of the Critical Warning field is set to 10h, then the power-down and read-write test is stopped, a test platform is restarted, and whether the Critical Warning field is cleared again is read, but the test method cannot verify whether the Critical Warning field is cleared for 10h, the abnormal event of reliability degradation of the SSD is correctly reported to a host, and the test time required by the test method is long, which is not favorable for fast verification.
Based on this, in the embodiment, a method for testing the Critical event field of the SSD based on the asynchronous event includes writing a test script by using DriveMaster software of unlink corporation, verifying the Critical event field of the SSD and the corresponding asynchronous event function by using an error-injection method, that is, reducing the high Temperature threshold of the SSD to 0 ℃ so that the Composite event field of the SSD can exceed 0 ℃ immediately, thereby triggering the value of the Critical event field to change from 00h to 02h, and reading whether the SSD has correctly reported the asynchronous event with Composite event exception to the host.
In addition, the script also marks a certain area of the SSD as an invalid area by issuing a Write Uncoretable command, and issues a read command to read the invalid area to trigger the SSD to have Media and Data Integrity Errors exception, thereby triggering the value of the Critical Warneng field to change from 00h to 10h, and reading whether the SSD has correctly reported an asynchronous event of reliability reduction to the host.
In a specific embodiment, the test environment for implementing the test method is as follows:
hardware requirements: the computer to be tested: associate think centre M8600t-N000 desktop computers. For the computer to be tested, the suggested ThinkCentre M8600t-N000 desktop computer is preferably used as the computer to be tested in this embodiment. SSD to be tested: an SSD that supports PCIe and NVMe protocols. Software requirements: operating the system: windows 10 operating system; testing software: ulink DriveMaster 2015NVMe; testing the script: self-written DriveMaster test script.
The implementation flow of the test script can be shown with reference to fig. 3, and includes the following implementation steps:
1. the high temperature threshold of the SSD is set to 0 ℃ and saved.
2. And reading whether the Critical Warning of the SSD is set to 02h or not, if not, reporting an error by the script, and ending the test.
3. An asynchronous event request command is issued to the SSD.
4. And reading whether the SSD correctly responds to the asynchronous event of the Composite Temperature exception or not, if not, reporting an error by the script, and finishing the test.
5. And resetting the high-temperature threshold value of the SSD to a value before factory shipment and storing the high-temperature threshold value.
6. A hardware reset is performed on the SSD.
7. And reading whether the Critical Warning of the SSD is cleared or not, if not, reporting an error by the script, and ending the test.
8. And issuing a Write Uncoretable command to a certain area of the SSD.
9. The read command is issued to the SSD to read the region.
10. And reading whether the Critical Warning of the SSD is set to be 10h or not, if not, reporting an error by the script, and ending the test.
11. An asynchronous event request command is issued to the SSD.
12. And reading whether the SSD correctly responds to the asynchronous event of the Media and Data Integrity Errors, if not, reporting an error by the script, and ending the test.
13. A hardware reset is performed on the SSD.
14. And reading whether the 'Critical Warning' of the SSD is cleared or not, if not, reporting an error by the script, and ending the test.
In this embodiment, the above method can quickly and efficiently verify whether the SSD can correctly set its Critical Warning field to a corresponding value and correctly respond to the host with a corresponding asynchronous event after a Composite Temperature exception and a Media and Data Integrity Errors exception occur.
It should be understood that although the various steps in the flow charts of fig. 1-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-3 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performing the sub-steps or stages is not necessarily sequential, but may be performed alternately or alternatingly with other steps or at least some of the sub-steps or stages of other steps.
In one embodiment, as shown in fig. 4, there is provided an SSD Critical rounding field test apparatus 400 based on asynchronous events, the apparatus comprising:
a first setting module 401, configured to set and store a high temperature threshold of the SSD to 0 ℃;
a first determining module 402, configured to read and judge whether a Critical Warning field of the SSD is set to 02h;
a first command module 403, configured to issue an asynchronous event request command to the SSD if a Critical Warning field of the SSD is set to 02h;
a second determining module 404, configured to determine whether the SSD has correctly responded to an asynchronous event with a Composite Temperature exception;
a second setting module 405, configured to reset and store the high Temperature threshold of the SSD to a value before leaving a factory if the SSD correctly responds to the Composite Temperature abnormal asynchronous event;
a third determining module 406, configured to perform hardware reset on the SSD, determine whether a Critical Warning field of the SSD has been cleared, and if not, end the script error reporting test.
In one embodiment, as shown in fig. 5, there is provided an SSD Critical rounding field test apparatus 400 based on asynchronous events, the apparatus further comprising:
a second command module 407, configured to issue a Write unorderable command to the SSD if the Critical Warning field of the SSD is cleared;
a fourth determining module 408, configured to read and determine whether the Critical Warning field of the SSD has been set to 10h;
a third command module 409, configured to issue an asynchronous event request command to the SSD if the Critical walking field of the SSD is set to 10h;
a fifth determining module 410, configured to determine whether the SSD correctly responds to an asynchronous event of Media and Data Integrity Errors abnormality;
a hardware reset module 411, configured to perform hardware reset on the SSD if the SSD correctly responds to an asynchronous event of a Media and Data Integrity Errors exception;
a sixth determining module 412, configured to determine whether the Critical Warning field of the SSD has been cleared, where if the Critical Warning field of the SSD has not been cleared, the script error reporting test is ended, and if the Critical Warning field of the SSD has been cleared, the test passes.
In one embodiment, the first determining module 402 is further configured to:
and if the Critical Warning field of the SSD is not set to 02h, ending the script error reporting test.
In one embodiment, the fourth determining module 408 is further configured to:
and if the Critical burning field of the SSD is not set to be 10h, the script error reporting test is finished.
For specific limitations of the SSD Critical turning field testing apparatus based on the asynchronous event, refer to the above limitations of the SSD Critical turning field testing method based on the asynchronous event, which are not described herein again.
In one embodiment, a computer device is provided, the internal structure of which may be as shown in FIG. 6. The computer apparatus includes a processor, a memory, and a network interface connected by a device bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The nonvolatile storage medium stores an operating device, a computer program, and a database. The internal memory provides an environment for the operation device in the nonvolatile storage medium and the execution of the computer program. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement an asynchronous event based SSD Critical rounding field testing method.
Those skilled in the art will appreciate that the architecture shown in fig. 6 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the above method embodiments when executing the computer program.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the above respective method embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous Link DRAM (SLDRAM), rambus (Rambus) direct RAM (RDRAM), direct Rambus Dynamic RAM (DRDRAM), and Rambus Dynamic RAM (RDRAM), among others.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. An SSD Critical rounding field test method based on asynchronous events, characterized in that the method comprises:
setting the high-temperature threshold of the SSD to be 0 ℃ and storing;
reading and judging whether a Critical Warning field of the SSD is set to be 02h or not;
if the Critical waiting field of the SSD is set to 02h, issuing an asynchronous event request command to the SSD;
judging whether the SSD correctly responds to the asynchronous event of the Composite Temperature exception or not;
if the SSD has correctly responded to the asynchronous event of the Composite Temperature exception, resetting the high-Temperature threshold value of the SSD to a value before leaving a factory and storing the value;
and resetting hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if not, ending the script error reporting test.
2. The asynchronous event-based SSD Critical turning field testing method according to claim 1, further comprising, after said steps of resetting hardware of said SSD and determining whether said Critical turning field of said SSD has been cleared:
if the Critical burning field of the SSD is cleared, issuing a Write Uncorestable command to the SSD;
reading and judging whether the Critical warming field of the SSD is set to be 10h or not;
if the Critical waiting field of the SSD is set to 10h, issuing an asynchronous event request command to the SSD;
judging whether the SSD correctly responds to the asynchronous event of Media and Data Integrity Errors abnormality or not;
if the SSD has correctly responded to the asynchronous event of Media and Data Integrity Errors abnormity, performing hardware reset on the SSD;
and judging whether the Critical Warning field of the SSD is cleared or not, if not, ending the script error reporting test, and if so, passing the test.
3. The asynchronous event-based SSD Critical turning field testing method according to claim 2, further comprising, after said step of reading and interpreting whether the Critical turning field of the SSD has been set to 02 h:
and if the Critical Warning field of the SSD is not set to 02h, ending the script error reporting test.
4. The asynchronous event based testing method for the Critical burning field of the SSD according to claim 3, further comprising after the step of reading and judging whether the Critical burning field of the SSD has been set to 10 h:
and if the Critical Warning field of the SSD is not set to 10h, the script error reporting test is finished.
5. An apparatus for SSD Critical rounding field testing based on asynchronous events, the apparatus comprising:
the device comprises a first setting module, a second setting module and a control module, wherein the first setting module is used for setting the high-temperature threshold of the SSD to be 0 ℃ and storing the high-temperature threshold;
the first judgment module is used for reading and judging whether the Critical Warning field of the SSD is set to be 02h or not;
the first command module is used for issuing an asynchronous event request command to the SSD if the Critical waiting field of the SSD is set to 02h;
a second determining module, configured to determine whether the SSD correctly responds to an asynchronous event with a Composite Temperature exception;
the second setting module is used for resetting and storing the high-Temperature threshold of the SSD to a value before leaving a factory if the SSD correctly responds to the asynchronous event of the Composite Temperature exception;
and the third judgment module is used for resetting the hardware of the SSD and judging whether the Critical Warning field of the SSD is cleared or not, and if the Critical Warning field of the SSD is not cleared, the script error reporting test is finished.
6. The asynchronous event based SSD Critical rounding field testing apparatus of claim 5, characterized in that the apparatus further comprises:
the second command module is used for issuing a Write unorderable command to the SSD if the Critical waiting field of the SSD is cleared;
a fourth judging module, configured to read and judge whether a Critical Warning field of the SSD has been set to 10h;
a third command module, configured to issue an asynchronous event request command to the SSD if a Critical walking field of the SSD is set to 10h;
a fifth determining module, configured to determine whether the SSD correctly responds to an asynchronous event that the Media and Data Integrity Errors are abnormal;
a hardware reset module, configured to perform a hardware reset on the SSD if the SSD has correctly responded to an asynchronous event of a Media and Data Integrity Errors exception;
a sixth judging module, configured to judge whether a Critical Warning field of the SSD is cleared, where if the Critical Warning field is not cleared, the script fault reporting test is ended, and if the Critical Warning field is cleared, the test passes.
7. The asynchronous event-based SSD Critical rounding field testing device of claim 6, wherein said first determining module is further configured to:
and if the Critical Warning field of the SSD is not set to 02h, ending the script error reporting test.
8. The asynchronous event-based SSD Critical rounding field testing device of claim 7, wherein said fourth determining module is further configured to:
and if the Critical Warning field of the SSD is not set to 10h, the script error reporting test is finished.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method of any of claims 1 to 4 are implemented when the computer program is executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 4.
CN202011041592.3A 2020-09-28 2020-09-28 SSD Critical burning field testing method and device based on asynchronous events Active CN112151107B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011041592.3A CN112151107B (en) 2020-09-28 2020-09-28 SSD Critical burning field testing method and device based on asynchronous events

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011041592.3A CN112151107B (en) 2020-09-28 2020-09-28 SSD Critical burning field testing method and device based on asynchronous events

Publications (2)

Publication Number Publication Date
CN112151107A CN112151107A (en) 2020-12-29
CN112151107B true CN112151107B (en) 2023-03-21

Family

ID=73895871

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011041592.3A Active CN112151107B (en) 2020-09-28 2020-09-28 SSD Critical burning field testing method and device based on asynchronous events

Country Status (1)

Country Link
CN (1) CN112151107B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197995A (en) * 2012-01-04 2013-07-10 百度在线网络技术(北京)有限公司 Hard disk fault detection method and device
CN104346236A (en) * 2013-08-06 2015-02-11 慧荣科技股份有限公司 Data storage device and data maintenance method thereof
CN109815086A (en) * 2019-01-02 2019-05-28 郑州云海信息技术有限公司 A kind of method and system for testing SSD reliability
CN110088721A (en) * 2017-03-13 2019-08-02 西部数据技术公司 For arbitrating the storage system and method that carry out thermal throttle via order

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197995A (en) * 2012-01-04 2013-07-10 百度在线网络技术(北京)有限公司 Hard disk fault detection method and device
CN104346236A (en) * 2013-08-06 2015-02-11 慧荣科技股份有限公司 Data storage device and data maintenance method thereof
CN110088721A (en) * 2017-03-13 2019-08-02 西部数据技术公司 For arbitrating the storage system and method that carry out thermal throttle via order
CN109815086A (en) * 2019-01-02 2019-05-28 郑州云海信息技术有限公司 A kind of method and system for testing SSD reliability

Also Published As

Publication number Publication date
CN112151107A (en) 2020-12-29

Similar Documents

Publication Publication Date Title
CN110289027B (en) Solid state disk based storage particle overheating protection method and device
US7356744B2 (en) Method and system for optimizing testing of memory stores
CN110187842B (en) Cross-temperature-zone data protection method and device based on solid state disk and computer equipment
CN117711477A (en) Abnormal disc returning identification method and device based on solid state disc and computer equipment
CN112151107B (en) SSD Critical burning field testing method and device based on asynchronous events
CN117093427A (en) PCIE equipment state detection method, system, electronic equipment and medium
CN113835944B (en) Test method and device for rapidly judging link rate of solid state disk and computer equipment
CN111985010A (en) Interception verification method and device for notebook hard disk, computer equipment and storage medium
CN110826114B (en) User data testing method and device based on SSD after safe erasure
CN109976939B (en) Data processing method and device
CN114356653A (en) Power-down protection method and device for industrial control firewall
CN114496052A (en) Method and device for testing permission mode function of SSD (solid State drive) in non-operation power state
CN114328024A (en) PCIe function level reset implementation method and device, computer equipment and storage medium
CN110275596B (en) Solid state disk-based power-on initialization acceleration method and device and computer equipment
CN113094221A (en) Fault injection method and device, computer equipment and readable storage medium
KR20130032151A (en) Flash memory device capable of verifying reliability using bypass path, and system and method of verifying reliability using that device
CN114185620B (en) Method and device for realizing acceleration of SSD firmware loading, computer equipment and storage medium
CN114327007B (en) Method and device for realizing resetting of NVM (non-volatile memory) subsystem, computer equipment and storage medium
CN112562774B (en) Storage device mounting method and device, computer device and storage medium
CN114780320A (en) Test verification method and device for statistics of SMART data write-in quantity of solid state disk
CN112596679B (en) RAID implementation method and device of solid state disk, computer equipment and storage medium
CN114416607A (en) SSD power-down protection implementation method and device, computer equipment and storage medium
CN117785559A (en) SP data storage recovery method and device applied to SSD TCG module
CN113050887A (en) Flash partition data processing method and device, computer equipment and storage medium
CN114996068A (en) Error information function testing method and device based on solid state disk and computer equipment

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant