CN110187001A - A kind of defect detecting device and detection method using surface magnetic conductance technology - Google Patents

A kind of defect detecting device and detection method using surface magnetic conductance technology Download PDF

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Publication number
CN110187001A
CN110187001A CN201910427705.4A CN201910427705A CN110187001A CN 110187001 A CN110187001 A CN 110187001A CN 201910427705 A CN201910427705 A CN 201910427705A CN 110187001 A CN110187001 A CN 110187001A
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defect
magnetic
detected
magneto sensor
detecting device
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CN110187001B (en
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卢永雄
阮鸥
陆智明
王康
黄威
王子豪
赵琴
关江浩
凌威
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TOMATO TECHNOLOGY (WUHAN) Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields

Abstract

The present invention is suitable for technical field of nondestructive testing, a kind of defect detecting device and detection method using surface magnetic conductance technology is provided, the defect detecting device includes magnetic bridge, one block of magnet is respectively set below the magnetic bridge both ends, this contrary placement of two pieces of magnet polarities is fixed with magneto sensor below one of magnet.The present invention can distinguish upper surface overlap and etch pit, be conducive to exclude interference of the overlap to detection signal;In addition combined with Magnetic Flux Leakage Inspecting technology, defect can be further discriminated between in upper surface or lower surface, can determine the position of defect, more accurately assess the remaining life of storage tank;In addition, can determine the depth of defect in terms of defect quantitative;Test problems in addition, more acurrate for the detection of defect pattern, while when pockmark is too many are also resolved, and by surface magnetic conductance technology the data obtained, can detecte out the voids and pits of upper surface.

Description

A kind of defect detecting device and detection method using surface magnetic conductance technology
Technical field
The invention belongs to technical field of nondestructive testing more particularly to a kind of defect detecting devices using surface magnetic conductance technology And detection method.
Background technique
Magnetic Flux Leakage Inspecting is a kind of fast, easily scanning technique.In daily life and production, often visible its is applied to storage The detection such as tank, pipeline.This kind of special equipment such as storage tank, pipeline, because containing has corrosive raw material etc., or in high temperature height Longtime running in the extreme conditions such as high humidity is pressed, so being easier the defects of corroding.These big and small corrosion are lacked Sunken testing and evaluation is the necessary means for ensureing its safe operation.Magnetic Flux Leakage Inspecting technology because of its fast, easily feature, It is widely used in the testing and evaluation of special equipment.
Magnetic Flux Leakage Inspecting technology at present, there are the following problems:
1, some position existing defects nearby are only able to detect, indistinguishable defect is etch pit or overlap.
2, Magnetic Flux Leakage Inspecting technology does not have the function of distinguishing defect specific location, is mainly shown as indistinguishable defect upper The problem of surface or lower surface, while being more difficult to carry out accurate quantification to depth of defect.And commenting for storage tank remaining life Estimate, requires to know now defective corrosion rate.And the corrosion rate of upper and lower surface defect is different greatly.On it cannot distinguish between In the case where following table planar defect, the remaining life of storage tank cannot be accurately assessed, owner can not draft more suitable repairing Scheme.The thus differentiation of upper and lower surface defect, it is extremely important to residual life evaluation.
3, Magnetic Flux Leakage Inspecting technology can not determine defect pattern.Non-locality (Non- of the Magnetic Flux Leakage Inspecting because of magnetic flux leakage Localized), the physical imperfection of a very little, is reflected in magnetic leakage signal, it may be possible to a bigger defect, thus The practical pattern of bad determining defect.
4, voids and pits (pockmark) cannot be distinguished in Magnetic Flux Leakage Inspecting technology.When voids and pits occurs in upper surface, because of leakage The non-locality of magnetic signal, the pitted skin of large area become an entirety, and Magnetic Flux Leakage Inspecting technology cannot be distinguished.
Summary of the invention
In view of the above problems, the purpose of the present invention is to provide a kind of defect detecting device using surface magnetic conductance technology and Detection method, it is intended to solve the problems, such as that above-mentioned Magnetic Flux Leakage Inspecting technology exists.
On the one hand, the defect detecting device using surface magnetic conductance technology includes magnetic bridge, each below the magnetic bridge both ends One block of magnet is set, this contrary placement of two pieces of magnet polarities is fixed with magneto sensor below one of magnet.
Further, Magnetic Flux Leakage Inspecting sensor is provided between two blocks of magnet.
On the other hand, the defect inspection method using surface magnetic conductance technology, the method use such as claim 1 or Defect detecting device described in 2 realizes that the method includes the following steps:
Operational deficiencies detection device is scanned in subject surface to be detected, in scanning process keep defect detecting device with it is to be checked It is constant to survey the certain lift-off value of object;
During the scanning process, if the signal value of magneto sensor output becomes smaller, it is to be checked to determine that current magneto sensor corresponds to It surveys object upper surface location and etch pit occurs, if the signal value of magneto sensor output becomes larger, determine current magneto sensor There is overlap in corresponding object upper surface location to be detected.
Further, the method also includes following step:
During the scanning process, if Magnetic Flux Leakage Inspecting sensor has detected magnetic leakage signal, current Magnetic Flux Leakage Inspecting is sensed here Device corresponds to object's position to be detected and is known as leakage field position, and operational deficiencies detection device makes magneto sensor pass through the leakage field position, If the signal value of magneto sensor output is constant, judge that etch pit occurs in current object leakage field to be detected position lower surface.
The beneficial effects of the present invention are: firstly, the signal value variation that the present invention is exported according to magneto sensor can be distinguished Surface overlap and etch pit are conducive to exclude interference of the overlap to detection signal, reduce erroneous detection;In addition, in conjunction with Magnetic Flux Leakage Inspecting skill Art can further discriminate between defect in upper surface or lower surface, can determine the position of defect, more accurately assess the surplus of storage tank The remaining service life provides more accurately repair scheme for owner;In addition, in upper surface, defect is than shallower feelings in terms of defect quantitative Under condition, by the way of curve matching or interpolation, the depth of defect can be determined, the phase quantitative as a kind of pair of magnetic leakage signal Mutually verification;In addition, it is more acurrate for the detection of defect pattern, because of signal more localization obtained by the magnetic conductance technology of surface, energy More accurately obtain the pattern of defect;Test problems when pockmark is too many simultaneously are also resolved, and pass through surface magnetic conductance technology The data obtained can detecte out the voids and pits of upper surface.
Detailed description of the invention
Fig. 1 is the detection schematic diagram of defect detecting device provided in an embodiment of the present invention;
Fig. 2 is relational graph of the different lift-off values to the signal value of spherical simulated defect;
Fig. 3 be under different plate thickness signal value with the relational graph away from defect distance change;
Fig. 4 be under different depth of defect signal value with the relational graph away from defect distance change.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
In order to illustrate technical solutions according to the invention, the following is a description of specific embodiments.
The embodiment of the invention provides a kind of defect detecting devices using surface magnetic conductance technology first, as shown in Figure 1, being Convenient for explanation, only parts related to embodiments of the present invention are shown in figure.The defect detecting device includes magnetic bridge 101, Respectively one block of magnet 102 of setting, this two pieces of 102 polar orientations of magnet are placed on the contrary below 101 both ends of magnetic bridge, one of magnetic The lower section of iron 102 is fixed with magneto sensor 103.
This defect detecting device is a kind of instrument of magnetic conductance (magnetic permeance) for measuring magnetic loop.Magnetic conductance is The parameter for characterizing the magnetic conduction ability an of magnetic circuit is the physical quantity for measuring object magnetic conduction ability, is the inherent characteristic of magnetic circuit, magnetic circuit Once fixed, its magnetic conductance is exactly fixed value under identical environment.Similar with the concept of conductance, magnetic conductance numerically uses magnetic resistance It is reciprocal indicate, organization is prosperous (Henry), unit symbol H.Substantially, magnetic conductance is leading for the specific magnetic circuit of characterization The physical quantity of magnetic energy power.Surface magnetic conductance (surface permeance) is then to be directed to the magnetic conductance of a specific surface region. It this specific region can size with very little, depending on the magneto sensor for measurement.The present embodiment is designed according to this principle A kind of defect detecting device using detection magnetic loop magnetic conductance, then by circuit magnetic conductance, learns surface defect in turn.
Shown in Fig. 1, which is surface magnetic conductance detection technique typical case magnetic circuit and the multiplexing signal of Magnetic Flux Leakage Inspecting magnetic circuit, is also showed that The defects detection principle of the present embodiment.The plate of lower section is object to be detected, magnetic bridge, magnet, magneto sensor and to be detected right Pictograph is at a magnetic loop.In the present embodiment, the magnetic bridge generally uses the ingot iron of high magnetic permeability to make.The two of magnetic bridge End disposes two blocks of magnet respectively, can be electromagnet, is also possible to permanent magnet, and the present embodiment illustrates for using permanent magnet.But Be, in the installation of magnet, the magnet polarities at both ends must on the contrary, be adsorbed on the pole S of the magnet of one end under magnetic bridge, The pole N of other end of magnet is adsorbed under magnetic bridge.Then, below the fixed magnet at one end of a magneto sensor.Specifically Fixed form the present embodiment does not limit, the mode of fixed magneto sensor is fairly simple, passes through fixed bracket, fixed branch Frame can be magnetic metal, be also possible to nonmagnetic plastics, metal etc..
In detection in use, operational deficiencies detection device is scanned in subject surface to be detected, first have to keep defects detection Lift-off value between device and object to be detected is constant, and the lift-off value is the vertical range of magneto sensor and object to be detected. When magneto sensor is close to object to be detected (in diagram to be detected object be iron plate) below, defect detecting device and to be checked It surveys object and constitutes one high magnetic conductance circuit, a large amount of magnetic flux passes through in magneto sensor and iron plate to be detected.Because of magneto sensor Just in the loop, so the magnetic flux or magnetic field strength in magnetic loop, the number that magneto sensor generally exports can be read out immediately According to being magnetic induction intensity signal value, unit is tesla T.
In scanning process, when not having defect below magneto sensor, the magnetic line of force come out from magnet is relatively uniform And iron plate to be detected is stably entered, magneto sensor output at this time is a normal signal value.During scanning traveling, When there is etch pit immediately below the magneto sensor, because for the regional area that this etch pit occurs, magnet and to be detected The distance between iron plate increases, and magnetic conductance reduces, and magnetic resistance increases, thus magnetic flux is reduced, and the output signal value of magneto sensor is just reduced, Therefore become smaller according to the signal value of magneto sensor output, an etch pit can be recognized.Similarly on the contrary, if magneto sensor just There is overlap in lower section, and magnetic conductance increases at this time, and local flux amount also increases, and magneto sensor output signal value becomes larger, it can be determined that There is overlap.And utilize Magnetic Flux Leakage Inspecting technology and bad differentiation overlap and etch pit.Using surface magnetic conductance technology of the invention, Overlap and etch pit can be identified well.Later period further passes through simple process, identifies with can be convenient, marks and reports It accuses, including tracer signal value size, extrapolates corrosion pit depth, record etch pit position range etc., carried out for owner next The processing of step.As it can be seen that the present apparatus can distinguish overlap and etch pit using surface magnetic conductance technology.
If etch pit appears in the lower surface of iron plate to be detected.In this case, because on magnet and iron plate to be detected The distance between surface does not change, thus the not too big variation of its magnetic conductance, therefore the magnetic that magneto sensor is experienced There is no changing, the output signal value of such magneto sensor does not also change flux.So going out in the lower surface of bottom plate to be detected When existing etch pit, magneto sensor output is not changed.At this time, it may be necessary to be known further combined with Magnetic Flux Leakage Inspecting technology Not.Magnetic Flux Leakage Inspecting technology is the prior art, and principle is no longer specific here to be introduced.Magnetic Flux Leakage Inspecting is to utilize Magnetic Flux Leakage Inspecting sensor Detection magnetic leakage signal judge that current location whether there is defect, but can only determine whether defective, and specific indicated range is big Small, defect can not all be detected in upper and lower surface, depth of defect etc..
Present apparatus combination Magnetic Flux Leakage Inspecting technology needs that Magnetic Flux Leakage Inspecting sensor 104 is arranged between two blocks of magnet.It is scanning In the process, if Magnetic Flux Leakage Inspecting sensor has detected magnetic leakage signal, define here current Magnetic Flux Leakage Inspecting sensor it is corresponding to Test object position is leakage field position, and operational deficiencies detection device makes magneto sensor by the leakage field position, if magnetosensitive is first The signal value of part output is constant, then judges that etch pit occurs in current object leakage field to be detected position lower surface.If by leakage Magnetic potential magneto sensor output signal value changed, that must defect it is consistent with aforementioned judgment method in upper surface, root It is etch pit or overlap according to the determination of signal value size variation.
Certainly, it is defined since the upper and lower surface of iron plate to be detected is the direction with respect to defect detecting device, direction lacks The one side for falling into detection device is upper surface.So if can will be lacked when determining whether iron plate lower surface to be detected is defective The another side that sunken detection device is placed into iron plate to be detected can be detected following table planar defect.If defect detecting device is inconvenient to put It sets at the lower surface of iron plate to be detected, the defect of lower surface can only be judged using aforementioned Magnetic Flux Leakage Inspecting technology.
The validity of surface magnetic conductance technology is proved below by finite element simulation calculation.
Fig. 2 be calculate magneto sensor in different lift-off value (magneto sensor are from iron plate vertical range to be detected) to mould The detection signal magnitude of quasi- defect.Calculating is divided into three kinds of situations: simulated defect in upper surface, simulated defect in lower surface, and There is no the case where simulated defect.A variety of situations are into calculating, and herein, selecting iron plate to be detected is the Q235 iron plate of 14mm thickness, iron Illustrate for the spherical hole defect that board defect is 20% plate thickness, diameter is 20mm." upper surface defect-lower surface lacks in diagram Fall into " what is indicated is the difference that simulated defect signal value obtained by upper surface subtracts simulated defect signal value obtained by lower surface;" on What surface defect-zero defect " indicated is the difference that simulated defect signal value obtained by upper surface subtracts no simulated defect signal value Value.
From figure 2 it can be seen that two curves are completely coincident, this illustrates main signal from upper surface defect, following table , which there is zero defect in face not, influences the size of signal value, therefore can identify whether upper surface is defective by magnetic conductance detection technique. In addition, lift-off value is lower, i.e., for magneto sensor closer to iron plate to be detected, the signal value of the same defect is bigger, easier to obtain Obtain relatively good signal.This rule is similar with the rule of " lift-off value-signal strength " of Magnetic Flux Leakage Inspecting.
Fig. 3 is influence of the iron plate to be detected to the depth detection of etch pit of different-thickness, and horizontal axis indicates magnetosensitive in diagram Element and simulated defect central horizontal offset distance, the longitudinal axis are the magnetic induction intensity signal value size of magneto sensor output.Herein Four kinds of different thickness iron plates are calculated, are 8mm, 10mm, 12mm and 20mm respectively.Simulated defect is all diameter 10mm, depth The flat blind hole of 2mm.From curve obtained as can be seen that four curves are almost overlapped, illustrate iron plate thickness to be detected not shadow substantially It rings quantitative to the depth of defect.The depth absolute value and plate thickness of defect do not have direct relationship.This is actually conducive to defect Depth quantitative detection.
In addition, the bottom plate to be detected of same thickness, magneto sensor are different to the signal value of the defect output of different depth.Figure This conclusion can be clearly confirmed that in 4.During Fig. 4 is calculated, using the iron plate to be detected of 20mm, simulated defect is artificial flat-bottom hole, Diameter is 15mm, and depth is 2mm, 4mm, 8mm and 16mm respectively, and horizontal axis indicates edema with the heart involved in magneto sensor and simulated defect in diagram Flat offset distance, the longitudinal axis are the magnetic induction intensity signal value size of magneto sensor output.It can be seen that come, magneto sensor output Signal value size and depth of defect are not linear relationship.This respect, can be using curve matching or the mode of interpolation method Depth of defect is determined, in particular, can accurately pass through curve matching when depth of defect is shallower (such as less than 8mm) Or interpolation method is calculated depth of defect.For curve matching, general fashion is, under same lift-off value, by magnetosensitive member The center that part is successively directed at multiple known different depth defects carries out defects detection, i.e. the diagram position horizontal axis 0mm, thus Under available same lift-off value, the corresponding relationship of different depth of defect and corresponding signal value, which is in abscissa Series of discrete point is presented as in depth of defect, the coordinate system that ordinate is signal value, these discrete points are fitted to a company When then detecting, according to the signal value size specifically detected, it is deep can to find corresponding defect from full curve for continuous curve Degree.For interpolation method, general fashion is after having obtained series of discrete point in the manner described above, when detection, directly according to specific The signal value size detected determines two adjacent discrete points on the vertical scale, then determines the two discrete points in horizontal seat The value put on, i.e. depth value select a numerical value as the corresponding defect of currently detected signal value between the two depth values Depth.For interpolation method there are many different specific interpolation methods, the prior art has disclosure, seldom repeats here.
It can be seen from figure 4 that when depth of defect 2mm and 4mm, the gap of signal value or obvious, defect depth When spending 4mm and 8mm, the gap of signal value can also be embodied, if defect is greater than 8mm, the variation of signal value is just less Obviously, when therefore depth of defect is shallower, specific depth of defect can be calculated according to signal value size.
In addition, magneto sensor can be made very small, the magnetic flux in the onesize range of element thus can detecte.Institute With in principle, spatial resolution can accomplish very little, fundamentally depend primarily on the size of magneto sensor.At present Level, the size of magneto sensor can be a square millimeter magnitude, this just greatly improves the inspection to the surface topography of defect Survey and reappear ability.Fig. 3 and Fig. 4 scans resulting signal value sectional drawing along blemish surface, also illustrates signal section and lacks Fall into the corresponding relationship of section.Therefore, magneto-dependent sensor size is smaller, and gained signal gets over localization, so according to the change of signal value Change situation, can accurately more obtain the pattern of defect;Therefore test problems when pockmark is too many are also resolved, and pass through surface Signal value obtained by magnetic conductance technology, can detecte out the voids and pits of upper surface, this is the function that Magnetic Flux Leakage Inspecting technology is difficult to realize Energy.
Finally it is emphasized that the present embodiment defect detecting device can be realized individually using surface magnetic conductance technology to corruption Etch pit, overlap differentiation, can also realize determining defect depth and more acurrate progress defect Shape measure.In addition, may be used also To combine Magnetic Flux Leakage Inspecting technology to carry out the differentiation of upper and lower surface defect.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.

Claims (4)

1. a kind of defect detecting device using surface magnetic conductance technology, which is characterized in that the defect detecting device includes magnetic bridge, One block of magnet, this contrary placement of two pieces of magnet polarities, the lower section of one of magnet are respectively set below the magnetic bridge both ends It is fixed with magneto sensor.
2. as described in claim 1 use surface magnetic conductance technology defect detecting device, which is characterized in that two blocks of magnet it Between be provided with Magnetic Flux Leakage Inspecting sensor.
3. a kind of defect inspection method using surface magnetic conductance technology, which is characterized in that the method use such as claim 1 or Defect detecting device described in 2 realizes that the method includes the following steps:
Operational deficiencies detection device is scanned in subject surface to be detected, in scanning process keep defect detecting device with it is to be detected right As certain lift-off value is constant;
During the scanning process, if the signal value of magneto sensor output becomes smaller, it is to be detected right to determine that current magneto sensor corresponds to As etch pit occurs in upper surface location, if the signal value of magneto sensor output becomes larger, determine that current magneto sensor is corresponding There is overlap in object upper surface location to be detected.
4. using the defect inspection method of surface magnetic conductance technology as claimed in claim 3, which is characterized in that the method also includes Following step:
During the scanning process, if Magnetic Flux Leakage Inspecting sensor has detected magnetic leakage signal, current Magnetic Flux Leakage Inspecting sensor pair here Object's position to be detected is answered to be known as leakage field position, operational deficiencies detection device makes magneto sensor by the leakage field position, if The signal value of magneto sensor output is constant, then judges that etch pit occurs in current object leakage field to be detected position lower surface.
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CN111044605A (en) * 2019-12-13 2020-04-21 清华大学 Method and device for magnetic flux leakage detection lift-off compensation and defect depth analysis
CN112179977A (en) * 2020-09-28 2021-01-05 广东省特种设备检测研究院茂名检测院 Surface morphology measuring and deducting method in pipeline weld flux leakage detection
JP2021162360A (en) * 2020-03-30 2021-10-11 Jfeスチール株式会社 Method and device for inspection

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