CN110160965B - Device and method for detecting residual birefringence of BGO crystal - Google Patents
Device and method for detecting residual birefringence of BGO crystal Download PDFInfo
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Abstract
The invention discloses a device for detecting residual birefringence of a BGO crystal, which comprises a light source, a polarizer, an 1/4 wave plate, an optical fine tuning frame (a fine tuning frame for short) with horizontal rotation and side rolling rotation functions, a polarization analyzer and a computer. The invention also discloses a method for detecting the residual birefringence of the BGO crystal, which comprises the steps of firstly obtaining the polarization state obtained by directly injecting circularly polarized light generated by a polarizer into a polarization analyzer; then, placing the BGO crystal to be detected on a fine tuning frame, injecting circularly polarized light generated by the polarizer into a polarization analyzer after passing through the BGO crystal to be detected to obtain a corresponding polarization state, and adjusting the fine tuning frame to enable the obtained polarization state to be consistent with the polarization state of the BGO crystal not to be detected; adjusting the horizontal rotation and the side rolling rotation of the fine adjustment frame to obtain a rotation angle and a corresponding polarization state; from which the residual birefringence is calculated. The technical scheme can directly calculate the residual tiny birefringence of the BGO crystal by detecting the polarization state of the output light.
Description
Technical Field
The invention belongs to the field of crystal optics, and particularly relates to a device and a method for detecting residual birefringence of isotropic crystal Bismuth Germanate (BGO).
Background
Bismuth Germanate (BGO) is an important isotropic optical crystal which theoretically has only one refractive index noHowever, due to thermal effects during crystal manufacturing and processing and mechanical stresses during optical cold working, residual stresses are generated, resulting in residual birefringence in the crystal, and ultimately BGO becomes an anisotropic crystal.
Since residual birefringence is randomly generated during the hot and cold working processes, residual birefringence is also non-uniform in magnitude, which has many adverse effects on the use of BGO crystals. Especially when BGO is used as an electro-optic crystal, it is equivalent to a random initial voltage, which seriously affects the measurement accuracy. Therefore, it is an important task to detect the residual birefringence of a BGO crystal in order to ensure crystal quality. However, how to use a simple device to realize the detection of the residual birefringence of the BGO crystal does not have a method and a corresponding device at present, and the present invention is proposed to solve the technical difficulty.
With regard to the measurement of birefringence, several patents and methods have been proposed, summarized as follows:
(1) measurement of the birefringence of the fiber. Related patents are CN 85100420B: single mode fiber birefringence measurement method (shanghai university of transportation), CN 201510504703: a single mode fiber linear birefringence measurement device and method based on polarization control (China mining university), CN 201510428064: a single-mode fiber linear birefringence measurement device and method (China mining university). These methods, however, have a natural drawback in that the birefringence of the optical fiber is a quantity related to the state of placement of the optical fiber, and these methods and devices are not suitable for the detection of crystal birefringence. Furthermore, patent CN 201210251508: the dynamic fiber birefringence measurement instrument is not an optical fiber but a textile fiber, but is limited to a fiber sample.
(2) Relevant patents to Hayntz instruments Inc: CN 1739007A: measurement of out-of-plane birefringence; CN 02825033: calibrating the precision of the birefringence measurement system; CN200380101656.2 birefringence measurement method of large sample; CN 200580036436. These patents are different from the present invention in that their application objects are large flat samples; secondly, the measurement methods are different, and the two beams of light are used as light sources and output of the two beams of light is detected simultaneously. As is well known, the birefringence phenomenon is a phenomenon in which one light beam passes through a birefringent material and is split into two light beams. Therefore, by measuring the birefringence, the degree of separation (or the spatial distance) between the two output beams can be directly measured. This approach is effective for conventional larger birefringent materials. However, in the case of BGO, which is an originally isotropic material and has only a very small residual birefringence, the two output beams are difficult to separate, and therefore, the method proposed in the above patent is not feasible at all. New methods need to be found. Furthermore, patent CN 96201855.4: the basic idea of a vertical birefringence measurement instrument (Zhejiang university) is to measure light and dark stripes of output light, which requires a large rotation angle of incident light, otherwise the light and dark stripes are not distinguished. The invention is different from the above methods in that a beam of light is injected, the polarization state of one beam of light is detected, and the two beams of light are not distinguished, or the detection is carried out under the condition of no bright and dark stripes. Therefore, the present invention is not inspired by these patents.
(3) Patent CN 201210088188: a polarization and birefringence measurement system (institute of optoelectronics and technology, Chinese academy of sciences). Although a beam of light is adopted for irradiation, the detection technology adopts three wave plates and an image acquisition card to image emergent light on the acquisition card, and polarization and birefringence information is obtained through image processing and analysis. The function of the image acquisition card is to acquire the light intensity distribution of the output light, which is a little more detailed than the aforementioned patent, and does not relate to the measurement of the polarization state.
(4) Related patents proposed by the Shanghai ray apparatus of the Chinese academy of sciences include CN 201210193165: a linear birefringence measurement device and measurement method; and CN 201310250980: linear birefringence measurement device and measurement method.
The invention patent CN201210193165 has several similarities with the present invention, all of which are single beam injection, and the injected polarization states are all circularly polarized light. The difference between the invention and it is: (1) the measurement principle is different. The patent rotates the crystal 45 degrees around the beam axis, and because the light injected into the crystal is circularly polarized light, the effect of the rotation around the axis is not obvious, so that the tiny residual birefringence of BGO cannot be measured; according to the invention, a horizontal rotating crystal is adopted, the incidence angle is changed, and birefringence information is obtained by detecting the change of polarization state output when different incidence angles are injected; (2) the detection method is different: the patent uses a Wollaston lens to divide an output beam into two sub-beams, and then the two sub-beams are respectively received by a double-quadrant detector. Thus, the invention should not be considered as "naturally occurring".
The invention patent CN201310250980 is obviously different from the invention patent. The invention adopts a reflective detection structure, namely a light source and a light detector are positioned at the same side of a sample. In each of the other patents, the sample is placed between a light source and a detector, and transmitted light is detected; while this invention detects reflected light, it requires two sets of detection cells. Therefore, the idea of the invention does not come from the invention.
(5) Invention patent CN 201310019042: stress and birefringence measuring instrument and measuring method (Qinghua university) based on cross-polarized solid laser. This patent measures the birefringence of a sample by placing the sample to be measured in the oscillation loop (resonant cavity) of a laser and measuring the beat frequency of the laser output light (two frequencies of light) due to birefringence. Therefore, the present invention is not derived from its elicitation.
(6) Invention patent CN 201510549341.9: an apparatus for measuring micro linear birefringence by cascade of elasto-optical modulation and electro-optical modulation (university of north and middle). The invention has several similarities with the invention, both of which use a beam of light to detect the transmitted light. However, the difference is also large, in particular: (1) the light injected into the sample is linearly polarized light and passes through an elastic light modulator (phase modulation); (2) on the receiving side, the received light firstly passes through an electro-optical modulator and then reaches a light detector; (3) the sample was stationary. The invention is different from the method, the injected light is circularly polarized light, and phase modulation is not needed; in the measuring process, the sample is rotated by a small angle (the incident angle is changed); the detection end does not need an electro-optic modulator and is directly measured by a polarization analyzer.
The above summarizes several prior patents related to birefringence measurement. The present invention is different from them. In view of practical application, the crystal has a small angle of departure from normal incidence, and the residual birefringence of BGO is small and a random quantity, so that the light output from the crystal cannot be split into two beams or is difficult to split into two beams due to the change of angle, and therefore the effect of this small birefringence cannot be measured with either the two-beam scheme or the bright-dark scheme. Secondly, all solutions require a large angle of rotation, whether rotating the incident light source or rotating the sample in order to change the incident angle of the incident light. In practice, all of the above solutions cannot measure the effect of residual birefringence in the case of a crystal beam path at small angles from normal incidence. Moreover, all the schemes are too complex in structure and are not suitable for being used in the production process. In summary, it is a technical problem to be solved by the present invention to find a new measuring device and method using modern scientific instruments, simple structure and operation method.
Disclosure of Invention
The invention aims to provide a device and a method for detecting residual birefringence of a BGO crystal, which can directly calculate residual micro birefringence of the BGO crystal through detection of polarization state of output light.
In order to achieve the above purpose, the solution of the invention is:
a device for detecting residual birefringence of BGO crystal comprises a light source, a polarizer, 1/4 wave plates, an optical fine tuning frame with horizontal rotation and side rolling rotation functions, a polarization analyzer and a computer, wherein the polarizer is arranged at the output end of the light source, converts light generated by the light source into linearly polarized light, then sends the linearly polarized light into a 1/4 wave plate to be converted into circularly polarized light, and directly projects the circularly polarized light onto the polarization analyzer to obtain a corresponding polarization state and send the corresponding polarization state into the computer, the circularly polarized light is projected onto the polarization analyzer after passing through the BGO crystal to be detected on the optical fine tuning frame, a changed polarization state track is obtained by rotating the optical fine tuning frame and sent into the computer, and the computer calculates the residual birefringence of the BGO crystal to be detected according to the received polarization state.
The optical fine adjustment frame adopts an electric fine adjustment frame and further comprises a driving circuit of the electric fine adjustment frame, and the computer adjusts the rotation angle of the electric fine adjustment frame through the driving circuit.
A method of an apparatus for detecting residual birefringence of a BGO crystal, as described above, comprising the steps of:
and 4, sending the obtained track data into a computer, and calculating the residual birefringence according to the following formula:
wherein s is1outAnd s3outTwo stokes parameters for each recorded polarization state respectively; k is a radical of0The wavenumber of light in vacuum; l is the length of the BGO crystal to be detected; delta is the angle of rotation from the starting angle; epsiloneThe dielectric constant corresponding to the residual birefringence,
nethe magnitude of the residual birefringence; n isoIs the refractive index when the BGO crystal is free of residual birefringence.
In the above step 4, k0By k0Calculated at 2 pi/λ, where λ is the wavelength of light in vacuum.
In step 4, Δ ═ Δ is introduced into the equation for calculating residual birefringence to reduce errors0+ θ, where Δ is the angle corresponding to each rotation of the optical fine tuning stage, Δ0The starting angle existing due to lack of strict alignment at the time of initial alignment, θ is an angle deviating from the starting angle, thereby obtaining:
wherein s is found1out0, which satisfies Δ0When + θ is 0, since the slip angle θ is known, the start angle Δ can be found0Then the residual birefringence n is determinede。
By adopting the scheme, the residual micro birefringence of the BGO crystal can be directly calculated by detecting the polarization state of the output light. Since the residual birefringence is very small, the principle of splitting a beam of input light into two birefringent light paths cannot be used to measure the small birefringence. The invention can measure the residual birefringence of the BGO crystal and other isotropic media, and compared with other methods for measuring the birefringence, the structure of the invention has simpler structure and lower cost.
Drawings
FIG. 1 is a schematic diagram of a first embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a second embodiment of the present invention;
FIG. 3 is a schematic representation of the change in coordinate system when varying the angle of incidence of a BGO crystal;
FIG. 4 shows the polarization state of the output light of the BGO crystal measured in the first embodiment;
the figure is the projection of a Bolgah sphere on an equatorial plane, and the (a), (b), (c) and (d) are the output polarization states of 4 different BGO crystals respectively;
FIG. 5 shows BGO crystal output light s measured in example 11outA curve varying with the angle of incidence Δ;
wherein, (a), (b), (c) and (d) respectively correspond to 4 different BGO crystals.
Detailed Description
The present invention providesA device for detecting residual birefringence of BGO crystal comprises a light source, a polarizer, 1/4 wave plates, an optical fine tuning frame (fine tuning frame for short) with horizontal rotation and side rolling rotation functions, a polarization analyzer and a computer, wherein light generated by the light source generates circularly polarized light through the polarizer, and the circularly polarized light is directly injected into the polarization analyzer to obtain a polarization state; and then the BGO crystal to be detected is placed on the fine tuning frame, at the moment, the polarization analyzer can obtain a polarization state again, the fine tuning frame is adjusted to ensure that the polarization state obtained after the BGO crystal is added is consistent with the polarization state obtained before the BGO crystal is added, then the fine tuning frame is rotated horizontally and laterally step by step according to the scales of the fine tuning frame, the rotation angle and the corresponding polarization state of each rotation are recorded, the obtained relation data of the polarization state and the rotation angle is input into a computer, and the following two formulas are utilized for calculation: firstly
②
Calculating residual birefringence; wherein s is1outAnd s3outTwo stokes parameters for each recorded polarization state (4 stokes parameters by definition, of which there are only two independently); k is a radical of0For the wave number of light in vacuum, the formula k can be used0Calculated as 2 pi/λ, where λ is the wavelength of light in vacuum; l is the length of the BGO crystal; delta is the angle of rotation from the starting angle; epsiloneThe dielectric constant corresponding to the residual birefringence,
nethe magnitude of the residual birefringence; n isoIs the refractive index when BGO is absent residual birefringence.
Since circularly polarized light is difficult to align, Δ ═ Δ may be introduced into the above calculation formula to reduce errors0+ θ, where (Δ is the deviation angle for each rotation of the fine adjustment frame, Δ0The starting angle existing due to lack of strict alignment at the time of initial alignment, and theta is an angle deviating from the starting angleDegree; according to formulas (i) and (ii), the following can be obtained:
find s1outA characteristic point of 0, where Δ should be satisfied0When + θ is 0, since the slip angle θ is known, the start angle Δ can be found0Then the residual birefringence n is determinede。
As a preferred scheme, the polarization analyzer is directly connected with the data acquisition card, the data acquisition card is directly connected with the computer, the data acquisition card acquires real-time data, the computer calculates the residual birefringence in real time, and the whole data acquisition and calculation process is automatically finished; the structure of fig. 2 works more efficiently than the way in which fig. 1 processes data off-line. In addition, the fine adjustment frame can adopt an electric fine adjustment frame, the polarization analyzer is directly connected with the data acquisition card, the data acquisition card is directly connected with the computer, the data acquisition card acquires real-time data, and the computer calculates residual birefringence in real time; the computer controls the electric fine adjustment frame in real time through the feedback system, self calibration and automatic measurement are achieved, and measurement accuracy is improved.
The technical solution and the advantages of the present invention will be described in detail with reference to the following embodiments.
Example 1
As shown in fig. 1, the device comprises a light source 1, a polarizer 2, an 1/4 wave plate 3, a precision fine tuning frame 4, a BGO crystal to be tested 5, a polarization analyzer 6 and a computer 7.
The principle for realizing BGO crystal residual birefringence detection is as follows:
for BGO crystals,. epsilon.in the ideal case where there is no residual birefringence1＝ε2＝ε3＝εo＝no 2，ε4、ε5、ε6Are all 0 and are isotropic media. When considering residual birefringence, BGO becomes a symmetric anisotropic material with a permittivity tensor of:
due to the initial value of the main refractive index
Large and the residual birefringence is small, so the relative change of the main refractive index is not large and can be ignored; while the elements on the minor diagonal are due to epsilon4、ε5、ε6All theoretical values of (a) are 0, so any minor variation is not negligible. It is these slight changes that cause BGO to become an anisotropic medium. With the anisotropic medium, when incident light is incident in the direction of the crystal optical axis, the output polarization state does not change, whereas when incident light is not incident in the direction of the optical axis (the incident angle changes), the polarization state of the output light will change. The residual birefringence vector problem is studied next.
The wave vector of the light passing direction in the transformer is assumed to be in a coordinate system of a natural crystal axis of the anisotropic material
For ease of analysis, we will establish a wave vector
As a new z-axis (optical axis) coordinate system, the dielectric tensor ε of the BGO crystal having residual birefringence is requiredrAnd (5) carrying out coordinate transformation. And then its birefringence vector is determined.
As shown in fig. 3, the transformation of the three-dimensional coordinate system from the coordinate system X, Y, Z to the coordinate system X 'Y' Z 'can be regarded as that the coordinate system X, Y, Z is firstly rotated counterclockwise by an angle θ around the 001 direction (Z axis) of the crystal, and then rotated by an angle γ around the Y' axis, where θ is-pi/4 + Δ, and Δ is a deviation angle from the optical axis direction introduced by alignment error when light enters the BGO crystal (Δ is 0 at normal incidence, and hereinafter referred to as an incident angle Δ). In the same way, γ ═ pi/2 + δ, i.e., rotation around Y', also has a certain error. Through complicated derivation, the dielectric tensor of the BGO crystal is:
to confirm the existence of residual birefringence and the mathematical relationship, we first consider that there is no error in the rotation around the z-axis, i.e., θ ═ pi/4 and γ ═ pi/2 + δ, which can be obtained through complicated derivation, when the dielectric tensor of the BGO crystal is:
rewrite equation (3) to a quaternion, i.e.:
it can be seen from the formula (4) that the dielectric constant quaternion is absent
The directional component indicates that the BGO crystal has no optical activity. A large number of experiments show that the polarization state of emergent light only surrounds s of Bolga sphere2Shaft (
Axis) is rotated, can be known as about s1Shaft (
Axis) is negligible, so:
considering that equation (5) is independent of the incident angle δ, the following relationship can be obtained by simplification:
equation (4) can now be:
for BGO crystals, as described above
This condition was substituted for formula (6) to obtain:
ε6≈0(8)
the residual birefringence is thus calibrated, but in general, in the specific experiments, the rotation about the Y' axis is not subject to errors, but only to errors about the z axis, i.e., θ ═ pi/4 + Δ, γ ═ pi/2, so cos γ ═ 0, sin γ ═ 1 is substituted into equation (3) to yield:
as was previously demonstrated herein, it is possible to,
ε4＝ε5＝εe，ε 60, this is independent of the state of crystal placement, then:
consider the substitution of θ ═ pi/4 + Δ to simplify to:
in formula (12)
Representing the effect of residual birefringence of a BGO crystal, the output polarization state winds around s on the Poincare sphere as the angle of incidence Δ changes2The shaft rotates.
Further, since there is a simple correspondence between refractive index and dielectric constant, namely:
Er＝N 2(13)
do not provide Er＝εo+ErIn the formula
N＝no+NrThen:
in this way, it can be seen that,
due to the fact that
Then
The residual birefringence vector is:
equation (16) shows that the residual birefringence vector is oriented in the direction s2 and not only in magnitude with respect to the crystal residual εeRelated to, and in the direction of light transmission of the crystalIt is related.
Then, in the known s1On the premise of f (Δ), ε can be obtained separatelyeAnd
the basic idea of residual birefringence measurement is to rotate the BGO crystal intentionally by a small angle around the (0,0,1) direction, observe the change in the polarization state of the output light, and finally solve the magnitude of residual birefringence of the BGO crystal according to equation (19).
An experimental system is shown in fig. 1, and 4 pieces of BGO crystals (numbered 1,2,3, and 4 from left to right) in the same batch are tested in the experimental process, so that the incident angle changes from 0 to 2.5 °, and the change of the polarization state of the obtained output light is shown in fig. 4.
It can be seen from FIG. 4 that the residual birefringence of the different crystals is different, and s is measured for this batch of BGO crystals1The relationship between the value of (d) and the incident angle Δ is shown in FIG. 5. from FIG. 5, it can be seen that the initial polarization states of different crystals are different, and therefore s of 4 crystals is1Are different from each other, and finally the residual birefringence n of the different crystals in Table 1 is obtained according to equation (17)eThe value of (c).
TABLE 1 residual Birefringence of different crystals
| Crystal numbering | |
| 1 | 2.1×10-3 |
| 2 | 3.2×10-3 |
| 3 | 2.3×10-3 |
| 4 | 3.8×10-3 |
As can be seen from Table 1, the residual birefringence values of this batch of BGO crystals are (2.1-3.8) × 10-3In the meantime.
Example 2
As shown in fig. 2, the device comprises a light source 1, a polarizer 2, an 1/4 wave plate 3, an electric fine tuning frame, a BGO crystal 5 to be tested, a polarization analyzer 6, a computer 7, a data acquisition card 8 and a driving circuit 9 of the electric fine tuning frame.
In embodiment 2, the light source 1, the polarizer 2 and the 1/4 wave plate 3 constitute a circular polarized light generator, the circular polarized light enters into the BGO crystal 5 to be measured, the BGO crystal is placed on the rotatable electric fine tuning frame and rotates along with the fine tuning frame, the light output by the BGO is received by the polarization analyzer 6 to the polarization state of the light output from the BGO, then the measured data is directly sent to the computer 7 through the data acquisition card 8, after the data processing by the computer, the result is fed back to the driving circuit 9 of the electric fine tuning frame, so that the electric fine tuning frame further rotates until the measurement requirement is reached. The full-automatic feedback system can further improve the measurement precision and save time.
The above embodiments are only for illustrating the technical idea of the present invention, and the protection scope of the present invention is not limited thereby, and any modifications made on the basis of the technical scheme according to the technical idea of the present invention fall within the protection scope of the present invention.
Claims (4)
1. A method for detecting the residual birefringence of a BGO crystal is realized based on a device for detecting the residual birefringence of the BGO crystal, and is characterized in that: the device comprises a light source, a polarizer, an 1/4 wave plate, an optical fine tuning frame with horizontal rotation and side rolling rotation functions, a polarization analyzer and a computer, wherein the polarizer is arranged at the output end of the light source, converts light generated by the light source into linearly polarized light, then sends the linearly polarized light into a 1/4 wave plate to be converted into circularly polarized light, and then directly projects the circularly polarized light onto the polarization analyzer to obtain a corresponding polarization state and sends the corresponding polarization state into the computer, the circularly polarized light is projected onto the polarization analyzer after passing through a BGO crystal to be detected arranged on the optical fine tuning frame, a changed polarization state track is obtained by rotating the optical fine tuning frame and sent into the computer, and the computer calculates the residual birefringence of the BGO crystal to be detected according to the received polarization state;
the method comprises the following steps:
step 1, firstly, obtaining a polarization state obtained by directly injecting circularly polarized light generated by a polarizer into a polarization analyzer;
step 2, placing the BGO crystal to be detected on a fine tuning frame, injecting circularly polarized light generated by a polarizer into a polarization analyzer after passing through the BGO crystal to be detected to obtain a corresponding polarization state, and adjusting the fine tuning frame to enable the obtained polarization state to be consistent with the polarization state in the step 1;
step 3, adjusting horizontal rotation and side rolling rotation of the fine adjustment frame to obtain a rotation angle and a corresponding polarization state, and acquiring a track of the polarization state changing along with the rotation angle;
and 4, sending the obtained track data into a computer, and calculating the residual birefringence according to the following formula:
wherein s is1outAnd s3outTwo stokes parameters for each recorded polarization state respectively; k is a radical of0Is a light in vacuumThe wave number of (d); l is the length of the BGO crystal to be detected; delta is the angle of rotation from the starting angle; epsiloneThe dielectric constant corresponding to the residual birefringence,
nethe magnitude of the residual birefringence; n isoIs the refractive index when the BGO crystal is free of residual birefringence.
2. The method of claim 1, wherein: the optical fine adjustment frame adopts an electric fine adjustment frame and further comprises a driving circuit of the electric fine adjustment frame, and the computer adjusts the rotation angle of the electric fine adjustment frame through the driving circuit.
3. The method of claim 1, wherein: in said step 4, k0By k0Calculated at 2 pi/λ, where λ is the wavelength of light in vacuum.
4. The method of claim 1, wherein: in step 4, Δ ═ Δ is introduced into the equation for calculating residual birefringence to reduce errors0+ θ, where Δ is the angle corresponding to each rotation of the optical fine tuning stage, Δ0The starting angle existing due to lack of strict alignment at the time of initial alignment, θ is an angle deviating from the starting angle, thereby obtaining:
wherein s is found1out0, which satisfies Δ0When + θ is 0, the starting angle Δ can be found since the slip angle θ is known0Then the residual birefringence n is determinede。
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| CN110160965A (en) | 2019-08-23 |
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