CN110133000A - A kind of full microscope visual imaging surface detecting machine - Google Patents
A kind of full microscope visual imaging surface detecting machine Download PDFInfo
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- CN110133000A CN110133000A CN201910386998.6A CN201910386998A CN110133000A CN 110133000 A CN110133000 A CN 110133000A CN 201910386998 A CN201910386998 A CN 201910386998A CN 110133000 A CN110133000 A CN 110133000A
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- 238000003384 imaging method Methods 0.000 title claims abstract description 21
- 230000000007 visual effect Effects 0.000 title claims abstract description 18
- 238000001514 detection method Methods 0.000 claims abstract description 27
- 238000012545 processing Methods 0.000 claims abstract description 23
- 230000003287 optical effect Effects 0.000 claims abstract description 13
- 238000001000 micrograph Methods 0.000 claims abstract description 3
- 238000005286 illumination Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 abstract description 9
- 238000012360 testing method Methods 0.000 abstract description 4
- 239000011521 glass Substances 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000010191 image analysis Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000000399 optical microscopy Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/342—Sorting according to other particular properties according to optical properties, e.g. colour
- B07C5/3422—Sorting according to other particular properties according to optical properties, e.g. colour using video scanning devices, e.g. TV-cameras
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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Abstract
The invention discloses a kind of full microscope visual imaging surface detecting machines, including object, and optical imagery module, optical imagery module uses microscope, it is additionally provided with the image capture module for acquiring microscopy image, image capture module is connected with Image Acquisition and digital processing module and intelligent workstation in turn, Image Acquisition and digital processing module are sent to intelligent workstation after going forward side by side digitized processing from acquisition image in image capture module, intelligent workstation drive connection has intelligent execution module, intelligent workstation is for comparing the image of capture with the standard picture prestored, and the image of capture is judged, when judging result is unqualified, intelligent workstation drives intelligent execution module, object is taken away.The surface defect and size, shape for realizing automatic detection object, avoid the testing result error to vary with each individual, reduce detection classification error, improve effectiveness of classification and productivity.
Description
Technical field
The present invention relates to visual imaging automatic measurement technique fields, specifically, be a kind of full microscope vision at
Image surface detection machine.
Background technique
Glass lens in the prior art, optical filter visual detection equipment in, generally use camera to glass lens
Etc. being detected, by camera shooting, and the image of shooting is analyzed, obtain the testing result to glass lens.Due to taking the photograph
As head pixel limitation and, different operators varies with each individual for the testing result of defect, therefore leads to detection error
It is larger, and detection accuracy is not high.
Summary of the invention
The purpose of the present invention is to provide a kind of full microscope visual imaging surface detecting machines, for solving existing skill
The problem that detection error is larger and detection accuracy is not high in the appearance detection of the eyeglass of glass and other materials in art.
The present invention is achieved through the following technical solutions:
A kind of full microscope visual imaging surface detecting machine, including object, and for carrying out figure to the object
As the optical imagery module of acquisition, the optical imagery module uses microscope, is additionally provided with aobvious for acquiring the microscope
The image capture module of diagram picture, described image capture module are connected with Image Acquisition and digital processing module, and described image is adopted
Collection is connected with intelligent workstation with digital processing module, and described image acquisition is used to capture from described image with digital processing module
Acquisition image goes forward side by side and is sent to the intelligent workstation after digitized is handled in module, and the intelligent workstation drive connection has
Intelligent execution module, the intelligent workstation are used to compare the image of capture with the standard picture prestored, and to capture
Image judged, when judging result is unqualified, the intelligent workstation driving intelligent execution module, by the target
Object is taken away.
Camera in conjunction with optical microscopy, is automatically detected the appearance and size of object by detection machine, due to
Microscope can amplify imaging to object with high magnification numbe, thus can be carried out with the clearer appearance to object at
Picture, image capture module pass through the interface with data acquisition and digital processing module by capturing microscopical display image
The image of capture is transferred to Image Acquisition and digital processing module, carries out image analysis and digitized processing, and by intelligent work
Make station and carry out image comparison and analysis, realizing can exception on high-precision detection object, chipping, scuffing, dark dirty etc.
Defect.When analyzing the existing defects that result is object, intelligent workstation drives intelligent execution module by defective target
Object is taken away, is sorted, meanwhile, the information of defective object and defect information are recorded, so that staff counts
According to tracking and subsequent analysis work.
Further, the optical imagery module is optics/electron microscope, and the optics/electron microscope is provided with
For connecting the interface of display or computer by camera.
Further, the optics/electron microscope is combined using array, and the surface image for the object is adopted
Collection, and collection result is transferred to by the intelligent workstation by described image capture module, intelligent workstation uses image pair
Than the Surface testing that algorithm realizes the object.
Further, the optics/electron microscope be also reserved with TCP/IP interface for being connect with other equipment and
I/O serial ports.
It further, further include for providing the light source of illumination to the object, the light source uses LED circular lamp.
Further, the LED circular lamp is that LED circular lamp is adjusted in brightness.
Further, described image capture module is camera, optics described in the capture focus face of the camera at
As the image display area of module.
Further, described image acquisition uses PC machine with digital processing module, and the PC machine and described image capture mould
Block is connected by I/O serial ports, for receiving the image of image capture module intake, and is digitized.
Further, the intelligent grabbing module is automatic loading and unloading device.
Further, the automatic loading and unloading device is manipulator.
Compared with prior art, the present invention have the following advantages that and the utility model has the advantages that
(1) of the invention, the preposition microscope of camera can by the input to the amplified imaging of object as camera
It realizes the detection of the appearances such as stain, sags and crests, the scratch on the objects such as glass lens, optical filter, realizes appearance and scale
The detection of size, improves detection accuracy；When detecting unqualified object, taken away automatically by automatic loading and unloading device, it is real
Automatic detection and loading and unloading and classification are showed, and relevant information have been saved, has been convenient for analyzing.
(2) present invention realizes the surface defect and size, shape of automatic detection object, avoids the inspection to vary with each individual
Resultant error is surveyed, detection classification error is reduced, improves effectiveness of classification and productivity.
(3) microscope is combined using array, and micro- device uses the micro objective from 2 times of-NX, and adds intelligent work
The algorithmic system stood carries out the detection to glass surface, improves detection speed and detection yield.
Detailed description of the invention
Fig. 1 is the structural block diagram of the first embodiment of the invention；
Fig. 2 is the structural block diagram of embodiment in the present invention second.
Specific embodiment
The present invention is described in further detail below with reference to embodiment, embodiments of the present invention are not limited thereto.
Embodiment 1:
In conjunction with shown in attached drawing 1, a kind of full microscope visual imaging surface detecting machine, including object, and for institute
The optical imagery module that object carries out Image Acquisition is stated, the optical imagery module uses microscope, is additionally provided with for adopting
Collect the image capture module of the microscopy image, described image capture module is connected with Image Acquisition and digital processing mould
Block, described image acquisition are connected with intelligent workstation with digital processing module, and described image acquisition is used for digital processing module
The intelligent workstation, the intelligence work are sent to after going forward side by side digitized processing from acquisition image in described image capture module
Making station drive connection has intelligent execution module, and the intelligent workstation is used to carry out the image of capture with the standard picture prestored
Comparison, and the image of capture is judged, when judging result is unqualified, the intelligent workstation driving intelligence executes mould
Block takes the object away.
Camera in conjunction with optical microscopy, is automatically detected the appearance and size of object by detection machine, due to
Microscope can amplify imaging to object with high magnification numbe, thus can be carried out with the clearer appearance to object at
Picture, image capture module pass through the interface with data acquisition and digital processing module by capturing microscopical display image
The image of capture is transferred to Image Acquisition and digital processing module, carries out image analysis and digitized processing, and by intelligent work
Make station and carry out image comparison and analysis, realizing can exception on high-precision detection object, chipping, scuffing, dark dirty etc.
Defect.When analyzing the existing defects that result is object, intelligent workstation drives intelligent execution module by defective target
Object is taken away, is sorted, meanwhile, the information of defective object and defect information are recorded, so that staff counts
According to tracking and subsequent analysis work.Embodiment 2:
On the basis of embodiment 1, in conjunction with shown in attached drawing 2, the optical imagery module is optics/electron microscope, the light
/ electron microscope is provided with the interface for connecting display or computer by camera.Further, the optics/electricity
Sub- microscope is combined using array, and the surface image for the object acquires, and will by described image capture module
Collection result is transferred to the intelligent workstation, and intelligent workstation realizes the surface inspection of the object using image comparison algorithm
It surveys.
Optics/electron microscope is combined using array, and micro- device uses the micro objective from 2 times of-NX, and adds intelligence
The algorithmic system of energy work station carries out the detection to glass surface, improves detection speed, detection accuracy and detection yield.
Further, the optics/electron microscope be also reserved with TCP/IP interface for being connect with other equipment and
I/O serial ports has efficient image file management and printing function, cooperates with computer, can have accurate measuring function.
It further, further include for providing the light source of illumination to the object, the light source uses LED circular lamp.
Further, the LED circular lamp is that LED circular lamp is adjusted in brightness, and three-dimensional imaging is clear.
Further, described image capture module is camera, optics described in the capture focus face of the camera at
As the image display area of module.
Further, described image acquisition uses PC machine with digital processing module, and the PC machine and described image capture mould
Block is connected by I/O serial ports, for receiving the image of image capture module intake, and is digitized.
Further, the intelligent grabbing module is automatic loading and unloading device.
Further, the automatic loading and unloading device is manipulator.
The above is only presently preferred embodiments of the present invention, not does limitation in any form to the present invention, it is all according to
According to technical spirit any simple modification to the above embodiments of the invention, equivalent variations, protection of the invention is each fallen within
Within the scope of.
Claims (10)
1. a kind of full microscope visual imaging surface detecting machine, which is characterized in that including object, and for described
Object carries out the optical imagery module of Image Acquisition, and the optical imagery module uses microscope, is additionally provided with for acquiring
The image capture module of the microscopy image, described image capture module are connected with Image Acquisition and digital processing mould
Block, described image acquisition are connected with intelligent workstation with digital processing module, and described image acquisition is used for digital processing module
The intelligent workstation, the intelligence work are sent to after going forward side by side digitized processing from acquisition image in described image capture module
Making station drive connection has intelligent execution module, and the intelligent workstation is used to carry out the image of capture with the standard picture prestored
Comparison, and the image of capture is judged, when judging result is unqualified, the intelligent workstation driving intelligence executes mould
Block takes the object away.
2. a kind of full microscope visual imaging surface detecting machine according to claim 1, which is characterized in that the light
Image-forming module be optics/electron microscope, the optics/electron microscope be provided with for by camera connection display or
The interface of computer.
3. a kind of full microscope visual imaging surface detecting machine according to claim 2, which is characterized in that the light
/ electron microscope is combined using array, and the surface image for the object acquires, and captures mould by described image
Collection result is transferred to the intelligent workstation by block, and intelligent workstation realizes the table of the object using image comparison algorithm
Face detection.
4. a kind of full microscope visual imaging surface detecting machine according to claim 2 or 3, which is characterized in that institute
It states optics/electron microscope and is also reserved with TCP/IP interface and I/O serial ports for connecting with other equipment.
5. a kind of full microscope visual imaging surface detecting machine according to claim 1, which is characterized in that further include
For providing the light source of illumination to the object, the light source uses LED circular lamp.
6. a kind of full microscope visual imaging surface detecting machine according to claim 5, which is characterized in that described
LED circular lamp is that LED circular lamp is adjusted in brightness.
7. a kind of full microscope visual imaging surface detecting machine according to claim 1, feature exist
In described image capture module is camera, the figure of optical imagery module described in the capture focus face of the camera
As display area.
8. a kind of full microscope visual imaging surface detecting machine according to claim 1, which is characterized in that the figure
PC machine is used with digital processing module as acquiring, the PC machine is connect with described image capture module by I/O serial ports, for connecing
The image of image capture module intake is received, and is digitized.
9. a kind of full microscope visual imaging surface detecting machine according to claim 1, which is characterized in that the intelligence
Energy handling module is automatic loading and unloading device.
10. a kind of full microscope visual imaging surface detecting machine according to claim 9, which is characterized in that described
Automatic loading and unloading device is manipulator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910386998.6A CN110133000A (en) | 2019-05-10 | 2019-05-10 | A kind of full microscope visual imaging surface detecting machine |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910386998.6A CN110133000A (en) | 2019-05-10 | 2019-05-10 | A kind of full microscope visual imaging surface detecting machine |
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| CN110133000A true CN110133000A (en) | 2019-08-16 |
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| CN201910386998.6A Pending CN110133000A (en) | 2019-05-10 | 2019-05-10 | A kind of full microscope visual imaging surface detecting machine |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763495A (en) * | 2020-12-24 | 2021-05-07 | 苏州赛众自动化科技有限公司 | Mobile phone battery size and appearance defect detection system and detection method |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024565A (en) * | 2005-07-13 | 2007-02-01 | Hitachi Kokusai Electric Inc | Appearance inspection method and device |
| CN101206180A (en) * | 2006-12-20 | 2008-06-25 | 鸿富锦精密工业（深圳）有限公司 | Lens module detecting device and detecting method |
| CN201302555Y (en) * | 2008-10-31 | 2009-09-02 | 东莞康视达自动化科技有限公司 | Micro surface blemish full-automatic ultraviolet optic detecting system |
| CN201697882U (en) * | 2010-06-03 | 2011-01-05 | 成都精密光学工程研究中心 | Device for detecting subsurface defects of optical elements |
| CN103728309A (en) * | 2013-11-27 | 2014-04-16 | 周俊雄 | Visual detection equipment of circuit board |
| CN104655641A (en) * | 2015-01-31 | 2015-05-27 | 华南理工大学 | High-precision full-automatic FPC (Flexible Printed Circuit) defect detecting device and detecting process |
| CN104890936A (en) * | 2015-05-22 | 2015-09-09 | 广州达意隆包装机械股份有限公司 | Feeding system and method for block-shaped food |
| CN106338524A (en) * | 2016-08-23 | 2017-01-18 | 中国科学院自动化研究所 | Microscopic scanning imaging acquisition device for vertical optical element surface damage and method thereof |
| CN109406527A (en) * | 2018-09-06 | 2019-03-01 | 华南理工大学 | A kind of miniature video camera module group lens subtle appearance defect detecting system and method |
| CN109407299A (en) * | 2018-12-21 | 2019-03-01 | 北方工业大学 | A kind of intelligent optical micro image collection equipment |
| CN210376186U (en) * | 2019-05-10 | 2020-04-21 | 邱凯旋 | Full-automatic microscope visual imaging surface detection machine |
-
2019
- 2019-05-10 CN CN201910386998.6A patent/CN110133000A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007024565A (en) * | 2005-07-13 | 2007-02-01 | Hitachi Kokusai Electric Inc | Appearance inspection method and device |
| CN101206180A (en) * | 2006-12-20 | 2008-06-25 | 鸿富锦精密工业（深圳）有限公司 | Lens module detecting device and detecting method |
| CN201302555Y (en) * | 2008-10-31 | 2009-09-02 | 东莞康视达自动化科技有限公司 | Micro surface blemish full-automatic ultraviolet optic detecting system |
| CN201697882U (en) * | 2010-06-03 | 2011-01-05 | 成都精密光学工程研究中心 | Device for detecting subsurface defects of optical elements |
| CN103728309A (en) * | 2013-11-27 | 2014-04-16 | 周俊雄 | Visual detection equipment of circuit board |
| CN104655641A (en) * | 2015-01-31 | 2015-05-27 | 华南理工大学 | High-precision full-automatic FPC (Flexible Printed Circuit) defect detecting device and detecting process |
| CN104890936A (en) * | 2015-05-22 | 2015-09-09 | 广州达意隆包装机械股份有限公司 | Feeding system and method for block-shaped food |
| CN106338524A (en) * | 2016-08-23 | 2017-01-18 | 中国科学院自动化研究所 | Microscopic scanning imaging acquisition device for vertical optical element surface damage and method thereof |
| CN109406527A (en) * | 2018-09-06 | 2019-03-01 | 华南理工大学 | A kind of miniature video camera module group lens subtle appearance defect detecting system and method |
| CN109407299A (en) * | 2018-12-21 | 2019-03-01 | 北方工业大学 | A kind of intelligent optical micro image collection equipment |
| CN210376186U (en) * | 2019-05-10 | 2020-04-21 | 邱凯旋 | Full-automatic microscope visual imaging surface detection machine |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763495A (en) * | 2020-12-24 | 2021-05-07 | 苏州赛众自动化科技有限公司 | Mobile phone battery size and appearance defect detection system and detection method |
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