CN110071691B - Method for evaluating a solar module with failed reliability and corresponding device - Google Patents
Method for evaluating a solar module with failed reliability and corresponding device Download PDFInfo
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- CN110071691B CN110071691B CN201910423877.4A CN201910423877A CN110071691B CN 110071691 B CN110071691 B CN 110071691B CN 201910423877 A CN201910423877 A CN 201910423877A CN 110071691 B CN110071691 B CN 110071691B
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- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000012360 testing method Methods 0.000 claims abstract description 83
- 238000002347 injection Methods 0.000 claims abstract description 15
- 239000007924 injection Substances 0.000 claims abstract description 15
- 239000002002 slurry Substances 0.000 claims abstract description 11
- 239000000463 material Substances 0.000 claims abstract description 6
- 230000005611 electricity Effects 0.000 claims abstract description 3
- 239000005022 packaging material Substances 0.000 claims description 14
- 238000004321 preservation Methods 0.000 claims description 4
- 238000003475 lamination Methods 0.000 claims description 3
- 239000011521 glass Substances 0.000 description 6
- 238000010030 laminating Methods 0.000 description 5
- 101000760175 Homo sapiens Zinc finger protein 35 Proteins 0.000 description 3
- 102100024672 Zinc finger protein 35 Human genes 0.000 description 3
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 3
- 239000005038 ethylene vinyl acetate Substances 0.000 description 3
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 3
- 239000002313 adhesive film Substances 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000002161 passivation Methods 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 1
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 1
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- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
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- SJWPTBFNZAZFSH-UHFFFAOYSA-N pmpp Chemical compound C1CCSC2=NC=NC3=C2N=CN3CCCN2C(=O)N(C)C(=O)C1=C2 SJWPTBFNZAZFSH-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to a method for analyzing a solar module with failed reliability, comprising the following steps: (1) placing the failure assembly in a high-temperature and dark-light environment and keeping the electricity injection for a preset time; (2) performing the EL test and the power test again to obtain a processed EL test result and a processed power test result; (3) comparing the processed EL test result with the EL test result in the initial state, comparing the processed power test result with the power test result in the initial state, and if the processed EL test result is in a first preset range relative to the EL test result in the initial state and the processed power test result is in a second preset range relative to the power test result in the initial state, analyzing the failure component as the failure of the battery piece; and analyzing the failure component as the failure caused by the encapsulating material or the contact of the battery plate slurry according to other comparison results. The invention also provides a corresponding device.
Description
Technical Field
The invention relates to the technical field of photovoltaics, in particular to a method and a corresponding device for analyzing a solar module with failed reliability.
Background
The back passivation solar cell (PERC) and the back passivation solar module become mainstream products in the photovoltaic field, reliability test (high temperature and high humidity test, DH1000 for short; wet freezing test, HF10 for short; high and low temperature cycle test, TC200 for short) is always an important point of industry attention, and failure modes and failure rules of products in different environments and different stress conditions can be known through the product reliability test. The internal reasons of the failed products and the weak links of the products can be found out through analyzing the failed products, so that corresponding measures can be taken to improve the reliability level of the products, and the reliability life of the products is ensured.
In the testing process, a solar panel assembly with reliability failure is inevitable, and after the solar panel assembly is subjected to reliability testing failure, failure mechanisms cannot be analyzed, because the solar panel assembly is laminated and packaged, a complete cell cannot be peeled off, and then the cell and a packaging material are subjected to decomposition analysis. Therefore, the industry has been troubling failure analysis of solar modules, and there is no suitable method for distinguishing whether a failed solar module is a solar cell or a module packaging material.
Disclosure of Invention
The main objective of the present invention is to provide a simple and effective method for analyzing a solar module with failed reliability and a corresponding device, which can save materials, consume less time, and solve the above problems and disadvantages
In order to achieve the above purpose, the technical scheme of the method for analyzing the solar module with failed reliability adopted by the invention is as follows:
the method comprises the following steps:
(1) placing the failure assembly in a high-temperature and dark-light environment and keeping the electricity injection for a preset time;
(2) performing EL test and power test to obtain processed EL test results and power test results;
(3) obtaining an EL test result and a power test result of the failed component before the reliability failure as an initial state, comparing the processed EL test result with the EL test result of the initial state, and comparing the processed power test result with the power test result of the initial state,
if the processed EL test result is in a first preset range relative to the EL test result in the initial state and the processed power test result is in a second preset range relative to the power test result in the initial state, analyzing the failure component as a battery piece failure;
and if other comparison results show that the failed component is failure caused by packaging materials or contact of battery plate slurry.
Preferably, in the high-temperature and dark-light environment of step (1), the surface temperature of the failed component is 85-130 ℃.
Preferably, the surface temperature of the failed component is 110-130 ℃.
Preferably, the preset time in the step (1) is 4-24 h.
Preferably, the electrical injection conditions in step (1) are as follows: the current is 5A-10A, and the solar panel is electrified in the positive direction.
Preferably, the current of the electric injection is 5.9A-6A.
Preferably, in the step (1), the surface of the failed component is wrapped with a laminated pad for heat preservation and shading.
Preferably, in the step (3), the failed component analyzed as the cell failure satisfies the verification step:
and (3) carrying out an exposure test on the failed component analyzed to be failed, and then carrying out a power test to obtain a power test result after exposure, wherein the power test result after exposure is in a third preset range relative to the power test result after treatment in the step (2), so as to prove that the failed component has a recovered and stable power test result.
Preferably, in the step (3), the failed component analyzed as being caused by the packaging material or caused by the contact of the battery plate slurry is continuously judged, whether the surface of the battery plate of the failed component has moisture or not is observed,
if so, judging that the failure component is failure of the packaging material;
if not, judging that the failure component is failure caused by battery slurry contact.
The invention also provides a device based on the method, and the device comprises the following steps:
a lamination station for placing the failed component and providing a high temperature environment;
a laminate mat for wrapping the failure assembly to provide a dim light environment;
a DC power supply device for providing electrical injection to the failed component.
Drawings
Fig. 1 is a corresponding EL test chart.
Fig. 2 is a schematic flow chart of the method provided by the present invention.
Fig. 3 is a schematic structural diagram of the apparatus provided by the present invention.
Reference numerals
1 laminating station
2 laminated pad
3 failure component
4 DC power supply device
5 cover plate
Detailed Description
In order to clearly understand the technical contents of the present invention, the following examples are given in detail.
The invention relates to a method for analyzing a solar module with failed reliability, which is characterized in that the solar module is subjected to high temperature and electric injection treatment, if an EL test and a power test of the failed module are both stably recovered to be normal (initial states), the failed module is judged to be a battery piece failure, and the failure is unrelated to a packaging material of a photovoltaic module. The misjudgment of technicians is avoided, an accurate direction is provided for the technicians to find the failure problem, the failure analysis time and cost are saved, and the trouble of separating the battery piece from the packaging material is avoided.
The method for analyzing the solar module with the failed reliability specifically comprises the following steps:
s0: sorting out solar modules which fail in the reliability test, cleaning front glass for standby, and knowing corresponding EL test results and power test results of the failed modules before the reliability test, wherein the corresponding EL test results and power test results are used as EL test results and power test results of the failed modules in the initial state;
s1: placing the glass surface of the failed component on the table top of a laminating machine in a downward mode to perform electric injection in a high-temperature and dark-light environment;
s2: performing EL test and power test to obtain processed EL test results and power test results;
s3: comparing the results, and judging whether the failure component is a battery piece failure or other failures;
s4: and verifying the failed component analyzed as the failed battery piece.
In step S0:
the sorted failure components must not contact hair and plastic, preventing the melting from adhering to the surface after high temperature treatment.
Step S1 specifically includes:
horizontally placing the glass surface of the failed component on the table board of a laminating machine in a downward mode, then paving a laminated sheet (playing a role in heat preservation) on the back surface of the failed component or wrapping the failed component by using a laminated pad, and connecting the positive electrode and the negative electrode of the failed component into the positive electrode and the negative electrode of a direct-current power supply box;
setting the electric injection current to be 6A-10A and 5A-9A, setting the table top of the laminating machine to be at 150 ℃, for example, introducing constant forward current of 6A or 9A, and monitoring the actual temperature of the primary failure component and the condition of the introduced current for 1h, wherein the temperature of the surface of the actual failure component is 85-130 ℃ and 110-130 ℃, when the forward current of 6A is introduced, the actual test is monitored for 5.9A-6A, and the power supply power is about 600W at most;
wait for 4h, take out, cool to 30 ℃.
In step S2:
the EL test can use a full-automatic EL tester, an infrared camera with resolution ratio is used for shooting images, and component defects are obtained and judged; the power test may use a component tester to measure the relevant electrical performance parameters.
In step S3:
if the EL and the power can be recovered to the initial state and are stabilized in the initial state, the failure component is the failure caused by the battery plate;
if the EL or the power can not be recovered to the initial state, the failure component is failure caused by packaging materials or battery slurry contact, the problem of battery body attenuation is at least quickly eliminated, the battery process comparison is not needed any more, and the failure direction is reduced to two, namely, the battery slurry contact problem or the packaging material problem.
The packaging material comprises a frame, glass, an EVA (ethylene vinyl acetate) adhesive film and a back plate, wherein the EVA adhesive film is the most important material, the solar module is easy to generate fatal defects due to improper use, and initial sample sending is required to be tested and verified to be available, so that the influence of the material is easy to lock quickly.
If the packaging material fails, water vapor generally enters the surface of the solar cell, and then whether the water vapor enters the surface of the solar cell or not is observed, so that judgment can be made.
And after the packaging material is removed from failure, only the battery slurry is left to contact, so that the batteries with different slurries can be quickly selected for verification once, and the conclusion can be obtained by repeated tests.
Step S4 specifically includes:
in order to confirm whether the power of the failed component is in a stable state, the failed component is placed in an outdoor environment for exposure for 60kwh, then the power difference value of the actual power of the failed component after exposure to the sun and the initial state is tested, and if the power difference value is within an acceptance range, the power of the failed component can be recovered to the initial state and is stable.
As shown in fig. 3, the present invention also provides a corresponding apparatus, comprising a lamination station 1 for placing the failed component and providing a high temperature environment; the laminated pad 2 is used for wrapping the failure component 3 to provide a dark light environment and avoid the influence of other indoor light sources; a dc power supply device 4 for providing electrical injection to the failed component and a cover plate 5. In particular, the device can accommodate large size solar modules, e.g., 1650 × 992 × 35mm and 1960 × 992 × 40 mm.
Wherein, the laminated pad is high temperature resistant, and is spread on the solar cell panel or wraps the failure component to play the roles of heat preservation and light shielding.
Example 1
S0: sorting out failure components with power attenuation more than 5% after DH1000 and HF10 tests, cleaning front glass for standby, and taking corresponding EL test results and power test results of the failure components before DH1000 and HF10 tests as EL test results and power test results of the initial state of the failure components;
s1: placing the glass surface of the failed component on the table top of a laminating machine in a downward mode to perform electric injection in a high-temperature and dark-light environment;
s2: performing EL test and power test to obtain processed EL test results and power test results;
s3: compared with the results, the power level of the initial state can be recovered, and the EL test shows that the battery piece which is originally darkened and blackened also recovers the normal light-emitting state;
s4: after outdoor insolation, the power does not decrease.
The above steps are shown in fig. 2, and thus, it can be clearly determined that the above failed component is a cell failure in combination with the steps of S3 and S4, and the failure can be recovered and stabilized.
Table 1 below is a record of experimental data for the entire process described above, and fig. 1 is a corresponding EL plot.
The results in table 1 and fig. 1 show that the solar module with power (PMPP) decreased by 8.5% after DH1000 was tested and left standing for 6 days, the partially blackened cell was treated by electro-injection to recover power to 309.6W, the originally darkened or blackened cell recovered to emit light, and the left standing process and the outdoor exposure process were both stable.
The method provided by the invention can find out the failure reason of the solar component in a short time, and the solar component can be recovered as before through the methods of electric injection and high temperature, so that the use is not influenced, and the consumable material is saved.
In this specification, the invention has been described with reference to specific embodiments thereof. It will, however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of the invention. The specification and drawings are, accordingly, to be regarded in an illustrative rather than a restrictive sense.
Claims (9)
1. A method for analyzing a solar module for reliability failure, the method comprising:
(1) placing the failure assembly in a high-temperature and dark-light environment and keeping the electricity injection for a preset time;
(2) performing EL test and power test to obtain processed EL test results and power test results;
(3) obtaining an EL test result and a power test result of the failed component before the reliability failure as an initial state, comparing the processed EL test result with the EL test result of the initial state, and comparing the processed power test result with the power test result of the initial state,
if the processed EL test result is in a first preset range relative to the EL test result in the initial state and the processed power test result is in a second preset range relative to the power test result in the initial state, analyzing the failure component as a battery piece failure;
and if other comparison results show that the failed component is failure caused by packaging materials or contact of battery plate slurry.
2. The method for analyzing a solar module with a reliability failure according to claim 1, wherein the surface temperature of the failed module in the high-temperature and dark-light environment of the step (1) is 85 ℃ to 130 ℃.
3. The method of claim 2, wherein the surface temperature of the failed module is between 110 ℃ and 130 ℃.
4. The method for analyzing a solar module with reliability failure according to claim 1, wherein the predetermined time in the step (1) is 4-24 h.
5. The method for analyzing a solar module with reliability failure according to claim 1, wherein the electrical injection condition in the step (1) is: the current is 5A-10A, and the solar panel is electrified in the positive direction.
6. The method of claim 5, wherein the electrically injected current is between 5.9A and 6A.
7. The method for analyzing a solar module with reliability failure as claimed in claim 1, wherein in the step (1), the surface of the failed module is wrapped with a laminated pad for heat preservation and shading.
8. The method for analyzing the solar module with reliability failure as claimed in claim 1, wherein in the step (3), the failed module analyzed as being caused by the encapsulating material or the contact of the slurry of the cell is continuously judged, and whether moisture exists on the surface of the cell of the failed module is observed,
if so, judging that the failure component is failure of the packaging material;
if not, judging that the failure component is failure caused by battery slurry contact.
9. An apparatus based on the method of any one of claims 1 to 8, wherein the apparatus comprises:
a lamination station for placing the failed component and providing a high temperature environment;
a laminate mat for wrapping the failure assembly to provide a dim light environment;
a DC power supply device for providing electrical injection to the failed component.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910423877.4A CN110071691B (en) | 2019-05-21 | 2019-05-21 | Method for evaluating a solar module with failed reliability and corresponding device |
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| CN201910423877.4A CN110071691B (en) | 2019-05-21 | 2019-05-21 | Method for evaluating a solar module with failed reliability and corresponding device |
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| CN110071691A CN110071691A (en) | 2019-07-30 |
| CN110071691B true CN110071691B (en) | 2020-05-08 |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011152445A1 (en) * | 2010-06-04 | 2011-12-08 | 株式会社アイテス | Electroluminescence inspection device for solar panel and electroluminescence inspection method |
| CN104485875A (en) * | 2014-12-17 | 2015-04-01 | 常州天合光能有限公司 | Failure analysis method for judging failed photovoltaic component and photovoltaic component structure using failure analysis method |
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- 2019-05-21 CN CN201910423877.4A patent/CN110071691B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011152445A1 (en) * | 2010-06-04 | 2011-12-08 | 株式会社アイテス | Electroluminescence inspection device for solar panel and electroluminescence inspection method |
| CN104485875A (en) * | 2014-12-17 | 2015-04-01 | 常州天合光能有限公司 | Failure analysis method for judging failed photovoltaic component and photovoltaic component structure using failure analysis method |
Non-Patent Citations (1)
| Title |
|---|
| 晶体硅光伏组件EL检测出的黑片缺陷失效分析;龚海丹 等.;《太阳能》;20160122(第12期);全文 * |
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