CN113765480B - Photovoltaic module hot spot testing method and photovoltaic module hot spot testing device - Google Patents
Photovoltaic module hot spot testing method and photovoltaic module hot spot testing device Download PDFInfo
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
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Abstract
The embodiment of the application provides a photovoltaic module hot spot testing method and a photovoltaic module hot spot testing device, wherein the photovoltaic module hot spot testing method comprises the following steps: providing a photovoltaic assembly, wherein the photovoltaic assembly comprises N battery pieces; carrying out chip selection processing, and selecting M battery chips from the N battery chips as battery chips to be detected, wherein M is smaller than N; shielding the battery piece to be tested at different shielding ratios respectively, and testing to obtain the most severe shielding ratio which is the shielding ratio corresponding to the tested battery piece to be tested when the hot spot temperature is the highest; carrying out a hot spot experiment on the battery piece to be tested, wherein the hot spot experiment comprises the following steps: providing an inverter, electrically connecting the inverter with the photovoltaic module, shielding the battery pieces to be detected according to the most severe shielding proportion corresponding to each battery piece to be detected, and acquiring the highest temperature value of each battery piece to be detected in the preset time under the operation state of the inverter as the hot spot temperature. The embodiment of the application is at least beneficial to improving the matching degree of the test method and the practical application.
Description
Technical Field
The embodiment of the application relates to the field of photovoltaics, in particular to a photovoltaic hot spot testing method and a photovoltaic module hot spot testing device.
Background
With the rapid development of the solar photovoltaic industry and the rapid increase of the installation capacity of the photovoltaic module, the safety and reliability of the operation of the photovoltaic module are more and more emphasized. In the process of failure analysis of the photovoltaic module, the phenomenon of hot spots of the solar cell is found to be caused due to uneven illumination on the surface of the photovoltaic module caused by the self-factors of the solar cell, namely the solar cell is shielded by various static or dynamic shadows and the like.
The photovoltaic module is composed of a plurality of solar cells, when hot spots occur on part of the solar cells, the problems of local burning, welding spot melting, grid line damage, packaging material aging and the like of the photovoltaic module can be caused, and even the whole photovoltaic module is scrapped, so that a hot spot testing method of the photovoltaic module is necessary to be provided.
The existing photovoltaic module hot spot testing method is to acquire the temperature of a hot spot of a photovoltaic module in a short-circuit mode, however, the problem that the testing situation is not matched with the actual using situation exists in the mode, the temperature of the hot spot acquired in the short-circuit mode of the photovoltaic module is too high, even the photovoltaic module fails after being tested, and the reference significance of the acquired temperature of the hot spot is not large.
Disclosure of Invention
The embodiment of the application provides a hot spot testing method and a hot spot testing device for a photovoltaic module, which are beneficial to improving the matching degree of the hot spot testing method and the actual use condition, the performance of the photovoltaic module cannot be influenced by testing, and the hot spot temperature obtained by testing has higher reference value.
According to some embodiments of the present application, in one aspect, the present application provides a hot spot testing method for a photovoltaic module, including: providing a photovoltaic assembly, wherein the photovoltaic assembly comprises N battery pieces, and N is a positive integer greater than 1; carrying out chip selection processing, and selecting M battery chips from the N battery chips as battery chips to be detected, wherein M is smaller than N; shielding the battery piece to be tested at different shielding ratios respectively, and testing to obtain the most severe shielding ratio which is the shielding ratio corresponding to the tested battery piece to be tested when the hot spot temperature is the highest; carrying out a hot spot experiment on the battery piece to be tested, wherein the hot spot experiment comprises the following steps: providing an inverter, electrically connecting the inverter with the photovoltaic module, shielding the battery pieces to be detected according to the most severe shielding proportion corresponding to each battery piece to be detected, and acquiring the highest temperature value of each battery piece to be detected in a preset time under the running state of the inverter as the hot spot temperature.
In addition, the step of testing and obtaining the most severe shielding proportion comprises the following steps of: providing an inverter having an input and an output, the input of the inverter being electrically connected to the photovoltaic module; providing a test electrical appliance, and electrically connecting the test electrical appliance with the output end of the inverter; sequentially reducing the shielding proportion of the battery piece to be tested from 100% shielding by a preset gradient and respectively testing the battery piece to be tested in the running state of the inverter, and if hot spots appear on the battery piece to be tested, respectively recording the temperature of the hot spots at different shielding proportions; and selecting the shielding proportion when the hot spot temperature is highest as the most severe shielding proportion corresponding to the battery piece to be detected.
In addition, if the battery piece to be detected does not have hot spots, the photovoltaic module is in short circuit connection, the shielding proportion of the battery piece to be detected is gradually decreased by a preset gradient according to shielding from 100%, the hot spot temperatures of the battery piece to be detected under different shielding proportion conditions are respectively recorded, and the shielding proportion when the hot spot temperature is highest is selected as the most severe shielding proportion corresponding to the battery piece to be detected.
In addition, before recording the hot spot temperature, the method further comprises the following steps: and judging the temperature of the battery piece to be detected, and if the temperature fluctuation of the battery piece to be detected is within 10 ℃, selecting the highest value of the temperature of the battery piece to be detected within a first preset time as the hot spot temperature of the battery piece to be detected.
In addition, the selecting process includes: exposing the photovoltaic assembly to a preset light source so that the deviation of the initial temperature of the photovoltaic assembly and the room temperature is within a first preset threshold value; sequentially shielding each cell, and acquiring an I-V characteristic curve of the photovoltaic module during the period of shielding each cell; and acquiring M battery pieces with the minimum parallel resistance as the battery pieces to be detected based on the I-V characteristic curve, wherein M is a positive integer less than or equal to M.
In addition, if the photovoltaic module is a double-sided module and at least part of the area of part of the cell is fixedly shielded, the selecting process further comprises: and selecting at least one battery piece with part of area fixedly shielded as the battery piece to be detected.
In addition, the selecting process further includes: and acquiring the cell with the maximum parallel resistance as a reference cell based on the I-V characteristic curve, wherein the reference cell is used for performing comparative analysis with the cell to be detected.
In addition, the method for controlling the deviation of the initial temperature of the photovoltaic module from the room temperature within the first preset threshold value comprises the following steps: providing at least one transient simulator to adjust the initial temperature of the photovoltaic module to a preset temperature, the deviation of the preset temperature from room temperature being within the first preset threshold; providing at least one steady state simulator to bring the initial temperature fluctuation of the photovoltaic module within a second preset threshold.
In addition, at least 1 of the m cell pieces is positioned at the edge of the photovoltaic module.
In addition, the acquiring a maximum temperature value of each battery piece to be tested in a preset time in the running state of the inverter as a hotspot temperature includes: continuously irradiating the cell to be detected for at least 1 hour by using a light source with preset illumination intensity according to the most severe shielding proportion until the temperature fluctuation of the cell to be detected is within 10 ℃, and selecting the highest value of the temperature of the cell to be detected within a second preset time as the hot spot temperature of the cell to be detected.
In addition, during the hot spot experiment, at least the following steps are included: carrying out appearance detection, I-V test, insulation test or leakage current test on the photovoltaic module to judge whether the photovoltaic module meets the test conditions; if the photovoltaic module meets the test condition, recording the hot spot temperature of the battery piece to be tested; and if the photovoltaic module does not meet the test conditions, terminating the hot spot experiment and recording the current hot spot temperature and the abnormal test result of the battery piece to be tested.
According to some embodiments of the present application, another aspect of the embodiments of the present application further provides a photovoltaic module hot spot testing apparatus, including: the temperature detection device is used for detecting the hot spot temperature of a battery piece to be detected in the photovoltaic module; an inverter for electrical connection with the photovoltaic assembly during a hot spot experiment; and the shielding device is used for shielding the battery piece to be detected in different shielding proportions.
In addition, the power of the inverter is greater than or equal to 10/13 of the total power of the photovoltaic module.
In addition, still include: the monitoring module is electrically connected with the photovoltaic assembly and used for detecting the temperature and the electrical performance of the photovoltaic assembly, and the monitoring module is also electrically connected with the temperature detection device and used for recording the temperature of the battery piece to be detected by the temperature detection device.
In addition, still include: a steady state simulator for providing a light source of a preset illumination intensity.
The technical scheme provided by the embodiment of the application has at least the following advantages: the method comprises the steps of carrying out piece selection processing on N battery pieces of a photovoltaic assembly to select needed M battery pieces as battery pieces to be tested, obtaining the most severe shielding proportion of the battery pieces to be tested, shielding the battery pieces to be tested according to the most severe shielding proportion in the process of carrying out hot spot experiments on the photovoltaic assembly, electrically connecting the photovoltaic assembly and an inverter, obtaining the temperature highest value of the battery pieces to be tested in preset time as hot spot temperature, connecting the photovoltaic assembly and the inverter to simulate the actual use situation, enabling the obtained hot spot temperature to be more consistent with the actual application situation, and testing the actual performance of the photovoltaic assembly, so that the obtained hot spot temperature has a higher reference value.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
Fig. 1 is an I-V characteristic curve of a photovoltaic module provided in an embodiment of the present application;
fig. 2 is a schematic diagram of a hot spot temperature of a photovoltaic module according to an embodiment of the present disclosure;
fig. 3 is a comparison graph of hot spot temperatures of a photovoltaic module provided in an embodiment of the present application;
fig. 4 is a flowchart of a hot spot testing method for a photovoltaic module according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a hot spot testing apparatus for a photovoltaic module according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a part of a hot spot testing apparatus for a photovoltaic module according to an embodiment of the present application.
Detailed Description
The background art can know that the current photovoltaic module hot spot test method does not match the actual use situation, specifically refer to table one, and it should be noted that the following table is the hot spot temperature obtained by performing a hot spot experiment on a photovoltaic module by using a test method for short-circuiting the photovoltaic module on batteries of different specifications, and the photovoltaic module to be tested is shielded by 30% and placed in an environment box, the temperature of the environment box is kept within a range of 50 +/-5 ℃, the photovoltaic module is continuously irradiated by continuous illumination of 1000KWh/m2, the cell slice in the table can refer to cutting a cell into several cells when the cell is cut, and the number of a single string of cells can refer to how many cells constitute a string of cells.
As can be seen from the above table, when the photovoltaic module is short-circuited, the hot spot temperature of the photovoltaic module exceeds 200 ℃ in part, however 200 ℃ exceeds the limit tolerance temperature of most organic materials, therefore, the problem of failure of the organic material backboard and the like of the photovoltaic module can be caused, the original purpose of hot spot test can not be achieved, namely, the highest hot spot temperature of the photovoltaic module can not be obtained through the hot spot test, and then the risk analysis and the corresponding material selection analysis can be carried out on the obtained hot spot temperature, the short circuit mode of the photovoltaic module does not accord with the actual working state of the photovoltaic module, the temperature of the hot spot obtained by the short circuit mode of the photovoltaic module is too high, and the adhesive film, the back plate, the welding strip and the like with better performance need to be selected to bear the high temperature, the method has little reference significance for selecting adhesive films, back plates, welding strips and the like of actual photovoltaic module products.
The embodiment of the application provides a photovoltaic module hot spot testing method and a photovoltaic module hot spot testing device.
Embodiments of the present application will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that in the examples of the present application, numerous technical details are set forth in order to provide a better understanding of the present application. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments.
The hot spot testing method provided by the application comprises the following steps: a photovoltaic module is provided, and the photovoltaic module comprises N battery pieces, wherein N is a positive integer larger than 1.
Specifically, the photovoltaic module may be composed of a plurality of cell strings, and each cell string is composed of a plurality of cells, and the total output power of the photovoltaic module may be controlled by controlling the total number of the cells, it can be understood that the larger the total number of the cells is, the larger the total output power of the corresponding photovoltaic module may be.
The hot spot testing method for the photovoltaic module further comprises the following steps: and carrying out chip selection processing, and selecting M battery chips from the N battery chips as battery chips to be detected, wherein M is smaller than N.
In some embodiments, the selecting process may include: the photovoltaic module is exposed under a preset light source, so that the deviation between the initial temperature of the photovoltaic module and the room temperature is within a first preset threshold value, and the influence of the temperature difference between the room temperature and the photovoltaic module on subsequent film selection processing is avoided.
In some embodiments, the method of controlling the deviation of the initial temperature of the photovoltaic module from the room temperature within a first preset threshold may comprise: providing at least one transient simulator to adjust the initial temperature of the photovoltaic module to a preset temperature, wherein the deviation between the preset temperature and the room temperature is in a first preset rangeSetting a threshold value; providing at least one steady state simulator to make the initial temperature fluctuation of the photovoltaic module within a second preset threshold value, passing through the transient simulator and the steady state simulator to expose the photovoltaic module to 10000W/m2Under the light source of (1).
Specifically, the temperature of the photovoltaic module is adjusted to be close to the room temperature through the transient simulator, so that the temperature difference between the room temperature and the photovoltaic module is avoided, and the subsequent film selection processing is prevented from being influenced; the initial temperature fluctuation of the photovoltaic module is stabilized within the second preset threshold value through the steady-state simulator, so that the initial temperature of the photovoltaic module in the film selection process is controlled to be relatively stable, the influence of the initial temperature of the photovoltaic module on film selection processing is reduced, and the reliability of the to-be-detected cell selected by subsequent film selection processing is improved.
In some embodiments, the room temperature may be 25 ℃, the first preset threshold may be 4 ℃, the second preset threshold may be 10 ℃, and the sizes of the first preset threshold and the second preset threshold may be flexibly set according to actual requirements.
In some embodiments, the selecting process may further include: sequentially shielding each cell, and acquiring an I-V characteristic curve of the photovoltaic module during the period of shielding each cell; and acquiring M battery pieces with the minimum parallel resistance as battery pieces to be detected based on the I-V characteristic curve, wherein M is a positive integer less than or equal to M.
In some embodiments, the entire cell can be shielded during the film selection process, so as to obtain the I-V characteristic curve of the photovoltaic module.
In some embodiments, 3 battery pieces with the minimum parallel resistance can be selected as the battery pieces to be tested, and the selected 3 battery pieces to be tested are tested subsequently, so that the test result of the 3 battery pieces can reduce the accidental performance of the test, and the reliability of the test data is improved.
Referring to fig. 1, fig. 1 is an I-V characteristic curve when different cells of the photovoltaic module are completely shielded, and it can be understood that the cell with the smallest parallel resistance is the cell with the highest inflection point current in the figure, and therefore the hot spot temperature corresponding to the cell with the smallest parallel resistance is relatively higher.
The I-V characteristic curve with the voltage of 10V and the current exceeding 2.5A corresponds to a curve without shielding the photovoltaic module, the rest I-V characteristic curves are I-V characteristic curves drawn when different battery pieces are shielded respectively, a first inflection point A corresponding to the I-V characteristic curve drawn by shielding the battery pieces is caused by shielding the battery pieces, and a second inflection point B is caused by opening of a bypass diode of the photovoltaic module.
It should be noted that the number of the I-V characteristic curves of the photovoltaic module is the same as the number of the cells, and one I-V characteristic curve of the photovoltaic module can be obtained by sequentially shielding each cell.
In some embodiments, at least 1 of the m obtained cell pieces may be located at the edge of the photovoltaic module, and it is understood that the cell pieces located at the edge of the photovoltaic module are more likely to be shielded, and therefore, the hot spot is more likely to occur, so that the comprehensiveness of the sheet selection process may be improved by selecting at least one cell piece located at the edge of the photovoltaic module.
In some embodiments, the selecting process may further include: and acquiring a battery piece with the maximum parallel resistance as a reference battery piece based on the I-V characteristic curve, wherein the reference battery piece is used for comparing and analyzing with the battery piece to be detected.
The battery piece with the maximum parallel resistance, namely the battery piece with the lowest inflection point current can improve the comprehensiveness of the selection of the reference battery piece, and can be used for comparative analysis with the battery piece to be detected.
In some embodiments, the photovoltaic module is a double-sided module, and at least part of the area of the partial cell is fixedly shielded due to the installation of the photovoltaic module or the arrangement of the junction box. In this case, the selecting process further includes: and selecting at least one battery piece with a part of area fixedly shielded as a battery piece to be detected.
It can be understood that, in the photovoltaic module, there may also be a part of permanent shielding caused by the module design, for example, the support, the frame, and the like of the photovoltaic module cause a part of the cell to be permanently shielded, so that selecting the part of the permanently shielded cell as the cell to be tested can improve the comprehensiveness of the selection process.
The hot spot testing method for the photovoltaic module further comprises the following steps: and respectively shielding the battery piece to be tested at different shielding ratios, and testing to obtain the most severe shielding ratio which is the shielding ratio corresponding to the tested battery piece to be tested when the hot spot temperature is the highest.
In some embodiments, the battery pieces to be tested are respectively shielded at different shielding ratios, and the step of obtaining the most severe shielding ratio by the test may include: providing an inverter, wherein the inverter is provided with an input end and an output end, and the input end of the inverter is electrically connected with the photovoltaic module; providing a testing electric appliance, and electrically connecting the testing electric appliance with the output end of the inverter; sequentially reducing the shielding proportion of the battery piece to be tested from 100% shielding by a preset gradient, respectively testing the battery piece to be tested in the running state of the inverter, and respectively recording the temperature of hot spots when the battery piece to be tested has the hot spots at different shielding proportions; and selecting the shielding proportion when the hot spot temperature is highest as the most severe shielding proportion corresponding to the battery piece to be detected.
It can be understood that the inverter and the photovoltaic module are kept to work normally in the testing process, direct current is provided for the inverter through the photovoltaic module, the direct current is converted into alternating current of daily electricity consumption through the inverter and is provided for the testing electrical appliance, whether the inverter and the photovoltaic module operate normally can be judged by detecting the operation state of the testing electrical appliance, different electrical appliances can be selected by the testing electrical appliance according to actual testing conditions, in some embodiments, the testing electrical appliance is not provided, and only the normal operation of the inverter and the photovoltaic module is required to be ensured.
The selected battery piece is sequentially decreased by preset gradient according to shielding from 100%, if the battery piece to be tested has hot spots, the corresponding hot spot temperature is recorded, and the preset gradient can be adjusted according to actual requirements, for example: and sequentially reducing the shielding proportion by 5% or 10% gradient, and selecting the most severe shielding proportion of the battery piece to be detected by comparing the hot spot temperatures corresponding to different shielding proportions.
It should be understood that the most severe shielding ratio mentioned above refers to the shielding ratio corresponding to the same cell when the hot spot temperature is the highest, and belongs to the common term in the hot spot testing process, and is relative to the relatively severe shielding ratio in the shielding ratio selected in the testing process, and is not absolute.
In some embodiments, the photovoltaic module is a double-sided photovoltaic module, and the shielding modes and shielding proportions of the two opposite sides need to be the same, it can be understood that the shielding modes and shielding proportions of the two opposite sides need to be the same, that is, the two opposite sides of the photovoltaic module are shielded in the same shielding proportion and the same shielding mode, and the reliability of the test data is improved by controlling the variable.
In some embodiments, when the most severe shielding proportion is tested, the steady-state simulator is used for continuously irradiating the photovoltaic module so as to ensure the normal operation of the photovoltaic module.
In some embodiments, before recording the hot spot temperature, further comprising: and judging the temperature of the battery piece to be detected, and if the temperature fluctuation of the battery piece to be detected is within 10 ℃, selecting the highest value of the temperature of the battery piece to be detected within a first preset time as the hot spot temperature of the battery piece to be detected.
The shielding proportion of the battery piece is selected by acquiring the relatively stable temperature of the battery piece, and the accuracy of the acquired most severe shielding proportion can be improved.
In other embodiments, selecting the most severe shutter ratio may further comprise: setting a preset time, taking the set preset time as 10 minutes as an example, monitoring the temperature of the photovoltaic module, which is the highest value of the temperature of a certain shielding proportion within 10 minutes after the photovoltaic module starts to work, as the hot spot temperature of the shielding proportion, selecting the shielding proportion corresponding to the highest hot spot temperature as the most severe shielding proportion by comparing the hot spot temperatures of different shielding proportions within 10 minutes, and reducing the time for obtaining the most severe shielding proportion by setting the preset time, thereby reducing the time required for carrying out the whole photovoltaic module hot spot test method.
In some embodiments, the method for adjusting the shielding ratio can adopt an opaque cover plate to sequentially cover the cells of the photovoltaic module at different shielding ratios, and in other embodiments, other shielding modes can be adopted, and only the shielding ratio of the cells can be adjusted.
In some embodiments, the chip selection process may not generate hot spots by connecting the inverter to simulate normal use of the selected battery chips. At the moment, the photovoltaic module can be in short circuit connection, the shielding proportion of the battery piece to be detected is gradually decreased according to the shielding from 100% in sequence by a preset gradient, the hot spot temperatures of the battery piece to be detected under the conditions of different shielding proportions are respectively recorded, and the shielding proportion when the hot spot temperature is highest is selected as the most severe shielding proportion corresponding to the battery piece to be detected.
Specifically, through with photovoltaic module short circuit connection to it is higher to shelter from the temperature that the battery piece was obtained with different sheltering from the proportion to the battery piece respectively, and changes the hot spot that appears. Therefore, for the cell without hot spots, the most severe shielding proportion can be obtained by short-circuiting the photovoltaic module.
Referring to fig. 2, fig. 2 shows that the temperature of the hot spot is respectively measured by different shielding ratios for a certain battery piece to be tested after the inverter is connected, wherein the temperature is between 54.5 and 78 ℃ when the battery piece to be tested is shielded by 70% shielding ratio, and the temperature is between 53.4 and 66.8 ℃ when the battery piece to be tested is shielded by 90% shielding ratio, as can be seen from fig. 2, the temperature of the hot spot is lower when the battery piece to be tested is electrically connected with the inverter.
The hot spot testing method for the photovoltaic module further comprises the following steps: carrying out a hot spot experiment on the battery piece to be tested, wherein the hot spot experiment comprises the following steps: providing an inverter, electrically connecting the inverter with the photovoltaic module, shielding the battery pieces to be detected according to the most severe shielding proportion corresponding to each battery piece to be detected, and acquiring the highest temperature value of each battery piece to be detected in the preset time under the operation state of the inverter as the hot spot temperature.
In some embodiments, after the battery piece to be tested and the most severe shielding proportion are selected, the selected battery piece to be tested is shielded in the most severe shielding proportion, and a thermocouple is pasted at the part, which is not shielded, of the battery piece to be tested, the thermocouple can detect the hot spot temperature of the battery piece to be tested, and the thermocouple can be tightly attached to the part, which is not shielded, of the battery piece to be tested, so that the problem that the accuracy of test data is influenced due to the fact that air exists between the thermocouple and the battery piece to be tested can be solved.
In other embodiments, the temperature of the battery piece to be tested can be detected in other manners, for example, in a manner of adopting a thermal imager, and only the purpose of accurately testing the temperature of the battery piece to be tested is needed.
In some embodiments, the intensity of the light source and the ambient temperature of the photovoltaic cell, such as 1000W/m, are also controlled during the hot spot test2The photovoltaic module can be placed in the environmental box, and the temperature of the environmental box can be controlled within a proper range by adjusting the temperature of the environmental box, for example, the temperature of the environmental box is controlled within 35 ± 5 ℃ or 40 ± 5 ℃, and the temperature of the environmental box can be specifically adjusted according to the actual requirement of the photovoltaic module.
In some embodiments, the photovoltaic module is a double-sided module, and the illumination intensity during the hot spot test needs to meet the requirement of international standard IEC61215-1:2021 on the stress irradiance of the double-sided module.
In some embodiments, the method for obtaining the highest hot spot temperature corresponding to each battery piece to be tested may include: keeping the battery piece to be detected continuously irradiating for at least 1 hour by a light source with preset illumination intensity in the most severe shielding proportion until the hot spot temperature fluctuation of the battery piece to be detected is within 10 ℃, and selecting the highest value of the temperature of the battery piece to be detected within the first preset time as the hot spot temperature of the battery piece to be detected.
It can be understood that, because the photovoltaic module is working ceaselessly, and the photovoltaic module is exchanging heat with the outside ceaselessly, so the temperature of the photovoltaic module fluctuates ceaselessly, the fluctuation of the temperature of the photovoltaic module tends to be stable by a method of irradiating continuously for at least 1 hour, when the fluctuation of the temperature of the photovoltaic module is within 10 ℃, the temperature of the photovoltaic module is considered to be relatively stable, the temperature of the photovoltaic module starts to be recorded continuously at the moment, the highest value of the temperature of the battery piece to be detected within the first preset time is selected as the hot spot temperature of the battery piece to be detected, and the reliability of the recorded data can be improved by recording the relatively stable temperature of the photovoltaic module.
In some embodiments, the temperature of the photovoltaic module is continuously increased after 1 hour of continuous irradiation, and the time of the hot spot test can be prolonged to 3 hours, so that the fluctuation of the temperature of the photovoltaic module tends to be stable.
In some embodiments, the first preset time may be 5 minutes, 10 minutes, 12 minutes, or the like, and the first preset time may be adjusted according to actual needs.
In some embodiments, the photovoltaic module is composed of a plurality of battery strings, each battery string includes a plurality of battery pieces, the battery pieces to be tested are located on different battery strings, the battery pieces to be tested on different battery strings can be simultaneously subjected to shielding test, the battery pieces to be tested located on different battery strings have small mutual influence, and the battery pieces to be tested of different battery strings can be simultaneously tested for reducing test time.
In some embodiments, during the hot spot experiment, at least: carrying out appearance detection, I-V test, insulation test or leakage current test on the photovoltaic module to judge whether the photovoltaic module meets the test conditions; if the photovoltaic module meets the test conditions, recording the hot spot temperature of the battery piece to be tested; and if the photovoltaic module does not meet the test conditions, terminating the hot spot experiment and recording the current hot spot temperature and the abnormal test result of the battery piece to be tested.
It can be understood that during the hot spot experiment, the photovoltaic module needs to ensure normal operation and good working performance of the photovoltaic module, so that the reliability of recorded data is improved.
It should be noted that the appearance detection, the I-V test, the insulation test or the leakage current test need to meet the test requirements of the international standard IEC61215-1:2021 file on the photovoltaic module.
In some embodiments, the I-V performance, the insulation performance, the leakage current performance or the like of the photovoltaic module can be detected through the monitoring module, the monitoring module can send an alarm when detecting an abnormality to terminate a hot spot experiment, the monitoring module can also be used for detecting whether the inverter is in a normal working state or not to ensure the normal operation of the hot spot experiment, and the monitoring module can also be used for recording the hot spot temperature of the battery piece to be tested in the hot spot test process.
Referring to fig. 3, fig. 3 is a summary table diagram of tests on 15 groups of photovoltaic modules with different specifications, where L1 is the hot spot temperature tested for short-circuit connection of the photovoltaic module, and L2 is the hot spot temperature tested for electrical connection of the photovoltaic module and the inverter, it can be seen that the hot spot temperature tested for electrical connection of the photovoltaic module and the inverter is much lower than the temperature tested for short-circuit connection of the photovoltaic module, and the electrical connection of the photovoltaic module and the inverter is more suitable for practical applications.
In some embodiments, the 15 groups of photovoltaic modules may be grouped according to the size, model and number of the photovoltaic modules, for example, the first group may be 158mm by 158mm in size, the ion implantation type is N type, and the total number of the cells is 78; the second group can be 158mm by 158mm in size, the ion implantation type is P type, and the total number of the battery pieces is 78; the third group can be 163mm in size, the ion implantation type is P-type, the total number of the battery pieces is 78 pieces, and the like.
The method for electrically connecting the inverter with the photovoltaic module and testing the hot spot of the photovoltaic module can be more beneficial to evaluating the tolerance of the organic material used by the photovoltaic module under the actual condition.
In some embodiments, the hot spot test is performed indoors, and is influenced by indoor space, the test can be performed by matching 1-2 photovoltaic modules with the inverter to be electrically connected, and the reliability of test data can be improved by adjusting the number of the photovoltaic modules and the type of the inverter.
Referring to fig. 4, fig. 4 is a flowchart of a hot spot testing method for a photovoltaic module, including: providing a photovoltaic module; selecting the slices; the method comprises the steps of obtaining the most severe shielding proportion, electrically connecting the photovoltaic module with the inverter and carrying out hot spot test, and obtaining the hot spot temperature of the inverter in the running state by electrically connecting the photovoltaic module with the inverter, so that the hot spot condition of the photovoltaic module can be obtained under the condition of being more matched with actual use.
This application embodiment is through carrying out the wafer selection to photovoltaic module and handling in order to select the battery piece that awaits measuring, wait to await measuring the battery piece in order to obtain the most severe proportion of sheltering from through the test, and shelter from the battery piece that awaits measuring with the most severe proportion of sheltering from, through being connected photovoltaic module and the battery piece that awaits measuring electricity and acquire the hot spot temperature under the inverter running state, thereby can obtain photovoltaic module's hot spot condition under the condition that more matches the in-service use, and the test procedure can not lead to the fact the influence to photovoltaic module's performance, the hot spot temperature of acquireing has more referential meaning.
Fig. 5 is a schematic view of a photovoltaic module hot spot testing apparatus, fig. 6 is a schematic view of a connection between a temperature detection device and a battery piece to be tested, and referring to fig. 5 and fig. 6, an embodiment of the present application further provides a photovoltaic module hot spot testing apparatus, including: the temperature detection device 101, the temperature detection device 101 is used for detecting the hot spot temperature of the battery piece 105 to be detected; an inverter 102, the inverter 102 being for electrical connection with the photovoltaic module 104 during a hot spot experiment; the shielding device 103 is used for shielding the cell 105 to be detected of the photovoltaic module 104 according to different shielding proportions by the shielding device 103.
Specifically, in some embodiments, the temperature detecting device 101 may include: and the thermocouple is attached to the cell 105 to be tested so as to test the hot spot temperature of the cell 105 to be tested.
In some embodiments, the photovoltaic module 104 includes opposite front and back surfaces, the front surface of the photovoltaic module 104 may be a light receiving surface, the shielding device 103 may be located on the front surface of the photovoltaic module 104 and shield the cell 105 to be tested, and the temperature detecting device 101 may be located on the back surface of the photovoltaic module 104 and electrically connected to the cell 105 to be tested on the back surface of the photovoltaic module 104.
The thermocouple is attached to the cell 105 to be tested, so that the influence of air on the test temperature can be reduced, and the hot spot temperature of the test is more accurate.
The temperature detection device 101 may also be another device capable of detecting temperature, and only needs to achieve the purpose of accurately detecting the hot spot temperature of the photovoltaic module.
In some embodiments, the power of the inverter 102 may be equal to or greater than 10/13 of the total power of the pv module 104, it is understood that the total power of the pv module 104 is the sum of the power of the cells, and since the pv module 104 will not operate at the highest load power at all times, the total power of the pv module 104 may be at most 1.3 times the power of the inverter 102, and accordingly, the power specification of the inverter 102 may be at least 10/13 of the total power of the pv module 104.
In some embodiments, inverter 102 is also electrically connected to powered device 106 to ensure proper operation of inverter 102.
It should be noted that, in the present application, the electric device 106 is not limited, and only the normal operation of the inverter 102 needs to be ensured.
The shielding device 103 may be an opaque cover plate, and the shielding ratio of the battery piece 105 to be detected is adjusted by adjusting the area of the battery piece 105 to be detected covered by the opaque cover plate, so as to obtain the highest hot spot temperature of the photovoltaic module 104. The shielding device 103 may also be other opaque devices, and only needs to achieve the purpose of blocking light from irradiating the cell 105 to be tested.
In some embodiments, the photovoltaic module hot spot testing apparatus may further include: and the steady state simulator is used for providing a light source with preset illumination intensity.
The relative stabilization of the test temperature of the photovoltaic module 104 may be achieved by the steady state simulator providing a light source of a preset illumination intensity.
In some embodiments, the photovoltaic module hot spot testing apparatus may further include: an environmental chamber 107, the environmental chamber 107 being used to carry the photovoltaic module 104, and in some embodiments a steady state simulator may be placed on top of the environmental chamber 107 to provide a light source of a preset illumination intensity.
In some embodiments, the photovoltaic module 104 hot spot testing apparatus may further include: a monitoring module; the monitoring module is electrically connected with the photovoltaic assembly 104 and used for detecting the temperature and the electrical performance of the photovoltaic assembly 104, and is also electrically connected with the temperature detection device 101 and used for recording the hot spot temperature of the battery piece 105 to be detected, which is detected by the temperature detection device 101.
The monitoring module can be by tester, record appearance and monitor composition to realize the function of measuring, record and monitoring, this application is not restricted monitoring module, only need reach the function of measuring, record and monitoring can.
Through being connected monitoring module and temperature-detecting device 101 electricity to can begin the record when the temperature is the highest and tends to stability in photovoltaic module 104 hot spot test process, monitoring module can also detect photovoltaic module's electrical properties, for example I-V performance, insulating properties or leakage current performance etc. when monitoring module detects unusually, then can send out the police dispatch newspaper, in order to terminate the hot spot experiment, and in some embodiments, monitoring module can also be used for detecting whether inverter 102 is in normal operating condition, thereby guarantees the normal clear of hot spot experiment.
The photovoltaic module hot spot testing device is provided, the photovoltaic module 104 is electrically connected with the inverter 102, the inverter 102 is controlled to normally work to simulate normal use of the photovoltaic module 104, the hot spot temperature of the photovoltaic module 104 can be obtained by shielding the battery piece 105 to be tested of the photovoltaic module 104, the hot spot temperature of the photovoltaic module 104 is obtained under the condition close to practical application, and the photovoltaic module 104 cannot be influenced in the testing process.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the present application, and that various changes in form and details may be made therein without departing from the spirit and scope of the present application in practice. Various changes and modifications may be effected therein by one skilled in the art without departing from the spirit and scope of the application, and it is intended that the scope of the application be limited only by the claims appended hereto.
Claims (14)
1. A hot spot testing method for a photovoltaic module is characterized by comprising the following steps:
providing a photovoltaic assembly, wherein the photovoltaic assembly comprises N battery pieces, and N is a positive integer greater than 1;
carrying out chip selection processing, and selecting M battery chips from the N battery chips as battery chips to be detected, wherein M is smaller than N;
shielding the battery piece to be tested at different shielding ratios respectively, and testing to obtain the most severe shielding ratio which is the shielding ratio corresponding to the tested battery piece to be tested when the hot spot temperature is the highest;
carrying out a hot spot experiment on the battery piece to be tested, wherein the hot spot experiment comprises the following steps: providing an inverter, electrically connecting the inverter with the photovoltaic module, shielding the battery pieces to be detected according to the most severe shielding proportion corresponding to each battery piece to be detected, and acquiring the highest temperature value of each battery piece to be detected in a preset time under the operating state of the inverter as a hot spot temperature;
the step of testing and obtaining the most severe shielding proportion comprises the following steps of:
providing an inverter having an input and an output, the input of the inverter being electrically connected to the photovoltaic module;
providing a test electrical appliance, and electrically connecting the test electrical appliance with the output end of the inverter;
sequentially reducing the shielding proportion of the battery piece to be tested from 100% shielding by a preset gradient and respectively testing the battery piece to be tested in the running state of the inverter, and if hot spots appear on the battery piece to be tested, respectively recording the temperature of the hot spots at different shielding proportions;
and selecting the shielding proportion when the hot spot temperature is highest as the most severe shielding proportion corresponding to the battery piece to be detected.
2. The hot spot testing method of the photovoltaic module according to claim 1, wherein if no hot spot occurs in the cell to be tested, the photovoltaic module is short-circuited, the shielding ratio of the cell to be tested is gradually decreased from 100% shielding by a preset gradient, hot spot temperatures of the cell to be tested under different shielding ratio conditions are respectively recorded, and the shielding ratio at the highest hot spot temperature is selected as the most severe shielding ratio corresponding to the cell to be tested.
3. The photovoltaic module hot spot test method of claim 1, wherein prior to recording the hot spot temperature, further comprising: and judging the temperature of the battery piece to be detected, and if the temperature fluctuation of the battery piece to be detected is within 10 ℃, selecting the highest value of the temperature of the battery piece to be detected within a first preset time as the hot spot temperature of the battery piece to be detected.
4. The photovoltaic module hot spot test method according to claim 1, wherein the selecting process comprises:
exposing the photovoltaic assembly to a preset light source so that the deviation of the initial temperature of the photovoltaic assembly and the room temperature is within a first preset threshold value;
sequentially shielding each cell, and acquiring an I-V characteristic curve of the photovoltaic module during the period of shielding each cell;
and acquiring M battery pieces with the minimum parallel resistance as the battery pieces to be detected based on the I-V characteristic curve, wherein M is a positive integer less than or equal to M.
5. The hot spot testing method of a photovoltaic module according to claim 4, wherein if the photovoltaic module is a double-sided module and at least a part of the area of a part of the cell is fixedly shielded, the selecting process further comprises: and selecting at least one battery piece with part of area fixedly shielded as the battery piece to be detected.
6. The photovoltaic module hot spot test method of claim 4, wherein the selecting process further comprises: and acquiring the cell with the maximum parallel resistance as a reference cell based on the I-V characteristic curve, wherein the reference cell is used for performing comparative analysis with the cell to be detected.
7. The photovoltaic module hot spot test method according to claim 4, wherein the method of controlling the deviation of the initial temperature of the photovoltaic module from room temperature to be within the first preset threshold value comprises:
providing at least one transient simulator to adjust the initial temperature of the photovoltaic module to a preset temperature, the deviation of the preset temperature from room temperature being within the first preset threshold;
providing at least one steady state simulator to bring the initial temperature fluctuation of the photovoltaic module within a second preset threshold.
8. The hot spot testing method of a photovoltaic module according to claim 4, wherein at least 1 of m of said cells is located at an edge of said photovoltaic module.
9. The photovoltaic module hot spot test method according to claim 1, wherein the obtaining of the maximum temperature value of each to-be-tested battery piece in a preset time in the inverter operation state as the hot spot temperature comprises: continuously irradiating the cell to be detected for at least 1 hour by using a light source with preset illumination intensity according to the most severe shielding proportion until the temperature fluctuation of the cell to be detected is within 10 ℃, and selecting the highest value of the temperature of the cell to be detected within a second preset time as the hot spot temperature of the cell to be detected.
10. The photovoltaic module hot spot test method according to claim 1, further comprising, during the hot spot test, at least: carrying out appearance detection, I-V test, insulation test or leakage current test on the photovoltaic module to judge whether the photovoltaic module meets the test conditions; if the photovoltaic module meets the test condition, recording the hot spot temperature of the battery piece to be tested; and if the photovoltaic module does not meet the test conditions, terminating the hot spot experiment and recording the current hot spot temperature and the abnormal test result of the battery piece to be tested.
11. A photovoltaic module hot spot testing device for implementing the photovoltaic module hot spot testing method according to any one of claims 1 to 10, comprising:
the temperature detection device is used for detecting the hot spot temperature of a battery piece to be detected in the photovoltaic module;
an inverter for electrical connection with the photovoltaic assembly during a hot spot experiment;
and the shielding device is used for shielding the battery piece to be detected in different shielding proportions.
12. The device for testing hot spots of a photovoltaic module as claimed in claim 11 wherein the power of said inverter is equal to or greater than 10/13 of the total power of said photovoltaic module.
13. The photovoltaic module hot spot testing apparatus of claim 11, further comprising: the monitoring module is electrically connected with the photovoltaic assembly and used for detecting the temperature and the electrical performance of the photovoltaic assembly, and the monitoring module is also electrically connected with the temperature detection device and used for recording the temperature of the battery piece to be detected by the temperature detection device.
14. The photovoltaic module hot spot testing apparatus of claim 11, further comprising: a steady state simulator for providing a light source of a preset illumination intensity.
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